A flat panel automatic test equipment and test method
By designing an automatic testing device for parallel plate capacitors, employing serial and parallel testing methods, and utilizing an independent three-dimensional motion probe mechanism and fixtures, the problems of low testing efficiency and high cost of existing equipment are solved, achieving efficient and low-cost testing of parallel plate capacitors.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- JIANGSU EEEST ADVANCED TECH CO LTD
- Filing Date
- 2022-08-16
- Publication Date
- 2026-05-19
AI Technical Summary
Existing parallel plate capacitor testing equipment is inadequate in terms of testing efficiency and cost, making it difficult to meet the needs of small-batch, multi-variety and large-volume production. Furthermore, existing equipment is expensive and has low testing efficiency.
Design an automatic testing device for planar capacitors, which uses serial and parallel methods to test the hole electrode parameters of planar capacitors. By utilizing two independent three-dimensional motion probe mechanisms and planar capacitor fixtures, flexible parameter testing can be achieved, improving testing efficiency and reducing costs.
It enables flexible testing of parallel plate capacitors, suitable for both small-batch, multi-variety and large-volume production, significantly improving testing efficiency and reducing equipment costs.
Smart Images
Figure CN115290943B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to an automatic testing device and method for flat plate capacitors. Background Technology
[0002] Parallel plate capacitors are mainly used in plugs, sockets, or connectors with filtering functions. They typically consist of a multilayer ceramic capacitor plate with multiple metallized through-hole electrodes (metal rings formed by metallized holes and horizontal metallized flanges). The outer edge of the parallel plate capacitor is also metallized and is usually connected to the ground of the plug, socket, or connector. Soldered pins or flexible socket components are installed in the through-hole electrodes.
[0003] Before installing pins or sockets, four parameters of the parallel plate capacitor must be tested: withstand voltage, insulation resistance, capacitance, and loss between adjacent hole electrodes and between the hole electrodes and the metallized portion around the outer edge defined as ground. The withstand voltage and insulation resistance tests each require a certain amount of time, and testing multiple electrodes takes a considerable amount of time in total. Because parallel plate capacitors typically come in many varieties, numbering in the hundreds or thousands, with most types produced in small quantities and a few in large quantities, actual production testing requires a testing device that can meet the flexible testing needs of parallel plate capacitors with small production volumes and many varieties (in which case the testing speed does not need to be too fast), as well as the batch measurement needs of large production volumes requiring faster testing speeds, while minimizing the cost of the testing equipment.
[0004] Existing technology employs a single-sided arrangement of two flying probes, both positioned on the same plane. Each probe can move in the X, Y, and Z directions and advances at a certain angle to contact a test point on the parallel plate capacitor. The independent movement of these two probes allows for the independent contact of all the through-hole electrodes of the parallel plate capacitor, testing four parameters: withstand voltage, insulation resistance, capacitance, and loss between all through-hole electrodes and between all through-hole electrodes and the metallized portion surrounding the capacitor. The probe system does not need to be replaced when changing products. This method meets the requirements of the wide variety of parallel plate capacitors and the need for flexible testing. However, each withstand voltage and insulation resistance test requires a relatively long waiting time, resulting in extremely low overall testing efficiency and failing to meet the high efficiency requirements for batch testing of parallel plate capacitors. Furthermore, this testing equipment is relatively expensive, failing to meet the requirement of low cost. Summary of the Invention
[0005] The purpose of this invention is to overcome the shortcomings of the existing technology and provide an automatic testing device for parallel plate capacitors. It can be used in a serial manner to test four parameters between all the hole electrodes on the parallel plate capacitor and between all the hole electrodes and ground in sequence, which is more flexible. Alternatively, it can be used in a parallel manner to test, which greatly improves efficiency and is suitable for testing large batches of parallel plate capacitors with a small variety of products.
[0006] To achieve the above objectives, the technical solution of the present invention is to design an automatic testing device for a flat plate capacitor, including two probe mechanisms and a flat plate capacitor clamp located between the two probe mechanisms. The probe mechanisms arranged above and below the flat plate capacitor clamp each include a probe or a probe card with several probes.
[0007] Each probe mechanism includes a drive transmission mechanism for driving the three-dimensional movement of the probe or probe card. The probe or probe card is connected to the transmission mechanism in the drive transmission mechanism. The flat plate capacitor fixture is provided with a flat plate capacitor fixing slot. The center of the bottom of the fixing slot has an opening to facilitate the probe of the probe mechanism below the flat plate capacitor fixture to test the flat plate capacitor. Two probe mechanisms distributed on both sides of the flat plate capacitor, capable of independent three-dimensional movement, are used. For testing small batches and multiple varieties of flat plate capacitors, each probe mechanism is equipped with one probe, which contacts multiple hole electrodes on one side of the flat plate capacitor at different times. The two probes are arranged on both sides of the two sides of the flat plate capacitor, with the probe tips facing one side of the flat plate capacitor. Each time, they simultaneously contact the different through-hole electrodes on their respective sides. The probe or probe card can move in three directions: X-axis, Y-axis, and Z-axis, to achieve precise reaching of the hole electrode for testing.
[0008] A further technical solution is that the probe tips in the probe mechanisms arranged vertically on both sides of the parallel plate capacitor clamp are all oriented towards the parallel plate capacitor; the parallel plate capacitor clamp is positioned vertically between the two probe mechanisms. The upper surface of the parallel plate capacitor faces the upper probe, and the tip of the upper probe faces downward.
[0009] A further technical solution is that the automatic testing equipment for parallel plate capacitors also includes four testing mechanisms: a withstand voltage testing mechanism, an insulation resistance testing mechanism, a capacitance testing mechanism, and a loss testing mechanism, which are set on one side of the probe mechanism; all probes are connected to the aforementioned four testing mechanisms through selector switches.
[0010] A further technical solution is that the side wall of the fixing slot is provided with metal elastic contacts that make elastic contact with the metallized outer periphery of the parallel plate capacitor; the surface of the parallel plate capacitor fixture is provided with test points connected to the metal elastic contacts.
[0011] The probe card is equipped with probes for contacting the on-hole electrodes of the flat plate capacitor or for contacting the test points on the flat plate capacitor fixture.
[0012] The test point is set on the upper or lower surface of the flat plate capacitor clamp; the fixing groove is consistent with the lateral shape of the capacitor, and the bottom wall of the groove has an opening smaller than the size of the capacitor;
[0013] The probe includes a tip and a cylindrical end. The tip is shaped to fit the electrode to be tested. The size of the tip is smaller than that of the cylindrical end, which is also smaller than the size of the electrode of the parallel plate capacitor. The cylindrical end is larger than the size of the electrode of the parallel plate capacitor. The parallel plate capacitor is fixed in a fixture groove. The groove has steps around its perimeter (the steps are formed by openings that extend through the bottom of the groove along its length). Only a small portion of the parallel plate capacitor near its edge is supported by the steps, with most of its bottom surface exposed to the probe below. The probe tip groove faces upwards. The probe includes a tip and a cylindrical end. The cylindrical end is truncated cone-shaped, and the tip is cylindrical. The diameter of the tip is smaller than that of the cylindrical end and smaller than the diameter of the circular hole of the electrode of the parallel plate capacitor. The diameter of the cylindrical end is larger than the diameter of the circular hole of the electrode of the parallel plate capacitor. The probe used can be a tapered probe with a slightly rounded tip. When the probe tip size is smaller than the diameter of the circular hole of the plate capacitor electrode, while the diameter of the rear part of the probe's tapered body is larger than the diameter of the circular hole, when this probe contacts the circular hole electrode, as long as the tip is within the circular hole's range, the edge of the probe's tapered body will make good contact with the hole wall and the metallized ring of the horizontal flange at the top and bottom of the hole. This contact does not damage the metallized hole wall or the metallized ring. Moreover, one probe tapered body size can accommodate different hole diameters for various circular hole electrodes. A metal elastic contact is connected to a test point on the fixture surface. The corresponding probe can achieve an electrical connection with the outer periphery of the plate capacitor's metallization, i.e., a connection to ground, by contacting this test point. This test point can be optionally placed on any surface of the fixture.
[0014] A further technical solution involves a probe mechanism arranged both above and below the flat-plate capacitor holder, each including a single probe. All probes are connected to the withstand voltage testing mechanism, insulation resistance testing mechanism, capacitance testing mechanism, and loss testing mechanism via selector switches. With these connections, the equipment can test withstand voltage performance, insulation resistance values, capacitance, and loss.
[0015] Another technical solution is that the probe mechanisms arranged on the upper and lower sides of the flat plate capacitor clamp each include a probe card with several probes.
[0016] A further technical solution involves connecting each probe card to a multi-channel test lead, which is then connected to the common terminal of several high-voltage relays. The normally closed terminals of the high-voltage relays are connected to the capacity and loss test leads, while their normally open terminals are connected to the high-voltage test leads. Each capacity and loss test lead is connected to both the capacity and loss testing mechanisms. Each withstand voltage and insulation resistance test lead is connected to both the withstand voltage and insulation resistance testing mechanisms. With these connections, the equipment can test withstand voltage performance, insulation resistance values, capacity, and loss.
[0017] A further technical solution is that each probe card is connected to a multi-channel test line, and the multi-channel test line is connected to multiple connection terminals on one side of a high-voltage multi-channel matrix composed of high-voltage relays. The other side of the high-voltage multi-channel matrix is provided with two channels. One channel is connected to the withstand voltage test mechanism and the insulation resistance test mechanism, and the other channel is connected to the capacity test mechanism and the loss test mechanism.
[0018] The present invention also provides a method for testing parallel plate capacitors using an automatic testing device, comprising the following steps performed sequentially:
[0019] The plate capacitor clamp moves the plate capacitor between the upper and lower probes of the two probe mechanisms. The upper probe presses down at different times to make contact with all the hole electrodes on the upper surface of the plate capacitor in stages, and the lower probe rises at different times to make contact with all the hole electrodes on the lower surface of the plate capacitor in stages. This completes the sequential testing of four parameters: withstand voltage, insulation resistance, capacitance, and loss between all the hole electrodes on the plate capacitor and between all the hole electrodes and ground.
[0020] The method for testing the withstand voltage, insulation resistance, capacitance, and loss parameters between adjacent through-hole electrodes is as follows: the upper probe is pressed down while the lower probe rises; wherein, when the upper probe and the lower probe move simultaneously, the two hole electrodes that come into contact are adjacent but misaligned;
[0021] Both probes can be used to contact the via electrodes or the test points on the parallel plate capacitor fixture. Thus, using the aforementioned probe device and parallel plate capacitor fixture, the four parameters mentioned above can be tested sequentially and in a serial manner between all via electrodes on the parallel plate capacitor, and between all via electrodes and ground (the outer perimeter of the metallization). This method is flexible, but the testing efficiency is low. For the withstand voltage and insulation resistance tests between each via electrode and the metallized side of the parallel plate capacitor edge (which serves as ground), the test points to ground are contacted by probes on the corresponding surfaces, depending on whether they are located on the upper or lower surface of the fixture.
[0022] The present invention also provides a method for testing a parallel plate capacitor using an automatic testing device for parallel plate capacitors, comprising the following steps performed in sequence: a parallel plate capacitor clamp moves the parallel plate capacitor between two probe cards of two probe mechanisms; one probe card on one probe mechanism simultaneously contacts a portion of the multiple hole electrodes on one side of the parallel plate capacitor; and another probe card on the other probe mechanism simultaneously contacts the remaining hole electrodes on the other side of the parallel plate capacitor.
[0023] One of the probe mechanisms has a probe card with a test point for contacting the plate capacitor connected to the metal elastic contact to ground.
[0024] The steps of the pressure resistance test are as follows:
[0025] A probe on one side of the probe mechanism is used to apply voltage to a hole electrode by abutting one of the probes on the probe card. Other hole electrodes distributed around this hole electrode and the corresponding probes that have made contact are connected to the ground of the power supply inside the test device, thus completing the withstand voltage test between multiple adjacent hole electrodes at the same time.
[0026] After the withstand voltage test is completed, multiple probes that are internally connected to the power ground and contact the adjacent through-hole electrodes are connected to the series insulation resistance test mechanism to the ground. They are charged simultaneously in parallel for a certain period of time, and then the leakage current is quickly tested to obtain the insulation resistance parameters.
[0027] After the withstand voltage test and insulation resistance test are completed, the internal connection of the probe is automatically switched or manually switched to the capacity test mechanism and the loss test mechanism, so as to obtain the capacity and loss parameters between adjacent hole electrodes and between the hole electrodes and the metallized side of the plate capacitor.
[0028] By selecting another electrode and repeating the above method, the above tests can be completed for all electrode holes on all parallel plate capacitors. For testing large batches of parallel plate capacitors with a small variety, a probe mechanism is used to install a multi-probe card, which simultaneously contacts a portion of the multiple electrode holes on one side of the parallel plate capacitor. Another probe mechanism is used to install another probe card, which simultaneously contacts the remaining electrode holes on the other side of the parallel plate capacitor. One probe card facing the grounding test point of the fixture has probes specifically designed to contact the grounding test point of the parallel plate capacitor connected to the metal elastic contact on the fixture. All probes are controlled by switches inside the test device connected to the probes, determining whether to apply voltage, test leakage current, or test capacitance and loss. If the upper probe is used to apply voltage to one electrode hole, the other electrode holes distributed around this electrode hole are contacted by multiple probes on the lower probe card. These probes are connected to the ground of the applied power supply inside the test device, which ensures that the electrode holes around the voltage-applied electrode hole are simultaneously connected to the ground of the applied power supply, allowing multiple adjacent electrode holes to undergo withstand voltage tests simultaneously. This is a parallel withstand voltage test, which is much more efficient than the previously mentioned serial two-pin method. After the withstand voltage test, the internal connection of the probe connected to ground is switched to the leakage current testing device. It is charged simultaneously in parallel for a certain period, and then the leakage current is quickly measured to obtain the insulation resistance parameters. This method is several times more efficient than the previously mentioned serial two-pin method. After the withstand voltage and insulation resistance tests are completed, the internal connection of the probe is switched to the capacitance and loss testing device. This allows testing of the capacitance and loss parameters between adjacent via electrodes and between the via electrode and ground. Each probe is selectively connected to both the withstand voltage and insulation resistance testing devices, as well as the capacitance and loss testing devices. The equipment can test withstand voltage performance, insulation resistance values, capacitance, and loss.
[0029] In this invention, the flat plate capacitor fixture uses a flat plate with multiple stepped holes, each of which is used to place one flat plate capacitor. This allows the fixture to load multiple flat plate capacitors at once, thereby improving the automation level of the testing device and significantly reducing manual operation.
[0030] The drive transmission mechanism includes a drive mechanism and a transmission mechanism in three directions (X-axis, Y-axis, and Z-axis). The drive mechanism is a drive motor, and the transmission mechanism is a reducer connected to the drive motor. The output shaft of the reducer is fixedly connected to a lead screw and nut mechanism (these are existing technologies and will not be elaborated upon). The drive motor and reducer in the X-axis direction are fixedly connected to the base plate. A slider is fixedly connected to the nut of the lead screw and nut mechanism in the X-axis direction. The lower end of the slider is slidably connected to the base plate. The base plate has a groove for the slider to slide. The upper end of the slider is fixedly connected to a support plate for the Y-axis drive mechanism and transmission mechanism. The drive motor and reducer in the Y-axis direction are fixedly connected to the support plate in the Y-axis direction. The lead screw in the lead screw and nut mechanism in the Y-axis direction is perpendicular to the lead screw in the lead screw and nut mechanism in the X-axis direction. A slider is fixedly connected to the nut of the Y-axis lead screw nut mechanism. The lower end of the slider is slidably connected to the bearing plate in the Y-axis direction. The upper end of the slider is fixedly connected to the bearing plate of the Z-axis drive mechanism and transmission mechanism (the base plate and the bearing plate in the Y-axis direction are horizontally set, and the bearing plate in the Z-axis direction is vertically set). The drive motor and reducer in the Z-axis direction are fixedly connected to the bearing plate in the Z-axis direction. The lead screw in the Z-axis lead screw nut mechanism is perpendicular to the lead screw in the X-axis lead screw nut mechanism, and the lead screw in the Z-axis lead screw nut mechanism is also perpendicular to the lead screw in the Y-axis lead screw nut mechanism. A slider is fixedly connected to the nut of the Z-axis lead screw nut mechanism. One end of the slider is slidably connected to the bearing plate in the Z-axis direction, and the other end of the slider is fixedly connected to the drive plate (a probe or probe clip is set on the drive plate).
[0031] The advantages and beneficial effects of this invention are as follows: it can be used in a serial manner to test the four parameters between all the hole electrodes on the plate capacitor and between all the hole electrodes and ground in sequence, which is more flexible; it can also be used in a parallel manner to test, which greatly improves efficiency and is suitable for testing large batches of plate capacitors with a small variety of products.
[0032] Two probe mechanisms, each capable of independent three-dimensional movement, are distributed on both sides of the parallel plate capacitor. For testing small batches and various types of parallel plate capacitors, each probe mechanism is equipped with one probe to make contact with multiple hole electrodes on one side of the parallel plate capacitor at different times. The two probes are arranged on both sides of the two sides of the parallel plate capacitor, with the probe tips facing one side of the parallel plate capacitor, and each time they simultaneously contact different through-hole electrodes on their respective sides.
[0033] Using the aforementioned probe device and parallel plate capacitor fixture, the four parameters mentioned above can be tested sequentially and in a serial manner, between all the hole electrodes on the parallel plate capacitor and between all the hole electrodes and ground (the outer periphery of the metallization). This method is very flexible, but the testing efficiency is relatively low.
[0034] The fixture for loading parallel plate capacitors can load multiple parallel plate capacitors at once, thereby increasing the automation level of the testing equipment and significantly reducing manual operation. Attached Figure Description
[0035] Figure 1 This is a schematic diagram of an embodiment of an automatic testing device for flat plate capacitors according to the present invention;
[0036] Figure 2 yes Figure 1 The main view;
[0037] Figure 3 yes Figure 1 Side view;
[0038] Figure 4 yes Figure 1 Top view;
[0039] Figure 5 This is a schematic diagram of Embodiment 2 of the present invention;
[0040] Figure 6 yes Figure 5 The main view;
[0041] Figure 7 yes Figure 5 Side view;
[0042] Figure 8 yes Figure 5 Top view;
[0043] Figure 9 This is the circuit schematic diagram of Method 1 in Embodiment 2 of the present invention;
[0044] Figure 10 This is a circuit diagram of Method 2 in Embodiment 2 of the present invention.
[0045] In the diagram: 1. Flat plate capacitor clamp; 2. Probe; 3. Drive transmission mechanism; 4. Probe card. Detailed Implementation
[0046] The specific embodiments of the present invention will be further described below with reference to the accompanying drawings and examples. The following examples are only used to more clearly illustrate the technical solutions of the present invention and should not be construed as limiting the scope of protection of the present invention.
[0047] Example 1:
[0048] like Figures 1 to 4As shown, this invention is an automatic testing device for parallel-plate capacitors, comprising two probe mechanisms and a parallel-plate capacitor clamp 1 located between the two probe mechanisms. Each probe mechanism arranged vertically on the parallel-plate capacitor clamp 1 includes a probe 2. Each probe mechanism includes a drive transmission mechanism 3 for driving the three-dimensional movement of the probe 2, and the probe 2 is connected to the transmission mechanism in the drive transmission mechanism 3. The parallel-plate capacitor clamp 1 has a parallel-plate capacitor fixing groove, and the center of the bottom of the fixing groove has an opening to facilitate testing of the parallel-plate capacitor by the probe 2 of the probe mechanism below the parallel-plate capacitor clamp 1. The tips of the probes 2 in the vertically arranged probe mechanisms of the parallel-plate capacitor clamp 1 are all oriented towards the parallel-plate capacitor. The parallel-plate capacitor clamp 1 is located between the two probe mechanisms in terms of height. The automatic testing device for parallel-plate capacitors also includes four testing mechanisms located on one side of the probe mechanisms: a withstand voltage testing mechanism, an insulation resistance testing mechanism, a capacitance testing mechanism, and a loss testing mechanism; all probes 2 are connected to the aforementioned four testing mechanisms via selector switches. The sidewall of the fixed slot is provided with metal elastic contacts that elastically contact the metallized outer periphery of the parallel plate capacitor; the surface of the parallel plate capacitor fixture 1 is provided with test points connected to the metal elastic contacts; the test points are located on the upper or lower surface of the parallel plate capacitor fixture 1; the fixed slot is rectangular and its opening extends through the entire bottom of the fixed slot along its length; the probe 2 includes a tip and a column end, the column end is truncated cone-shaped, the tip is cylindrical, the diameter of the tip is smaller than that of the column end, the diameter of the tip is smaller than the diameter of the circular hole of the parallel plate capacitor electrode, and the diameter of the column end is larger than the diameter of the circular hole of the parallel plate capacitor electrode. The probe mechanisms arranged above and below the parallel plate capacitor fixture 1 each include one probe 2; all probes 2 are connected to the withstand voltage test mechanism, insulation resistance test mechanism, capacitance test mechanism, and loss test mechanism through a selector switch.
[0049] The method for testing parallel plate capacitors using an automatic testing device includes the following steps performed sequentially:
[0050] The flat plate capacitor clamp 1 moves the flat plate capacitor between the upper and lower probes 2 of the two probe mechanisms. The upper probe 2 is pressed down at different times to make contact with all the hole electrodes on the upper surface of the flat plate capacitor in stages, and the lower probe 2 is raised at different times to make contact with all the hole electrodes on the lower surface of the flat plate capacitor in stages. This completes the sequential testing of four parameters: withstand voltage, insulation resistance, capacitance, and loss between all the hole electrodes on the flat plate capacitor and between all the hole electrodes and ground.
[0051] The method for testing the withstand voltage, insulation resistance, capacitance, and loss parameters between adjacent through-hole electrodes is as follows: the upper probe is pressed down while the lower probe rises; wherein, when the upper probe and the lower probe move simultaneously, the two hole electrodes that come into contact are adjacent but misaligned;
[0052] Both probe mechanisms include a probe 2, and one of the probe mechanisms is also equipped with a probe for contacting the test point on the flat plate capacitor clamp 1.
[0053] Example 2:
[0054] The difference from Embodiment 1 is that, as Figures 5 to 10 As shown, the probe mechanisms arranged vertically on the flat plate capacitor clamp 1 each include a probe card 4 with several probes. Each probe mechanism includes a drive transmission mechanism 3 for driving the three-dimensional movement of the probe card 4. The probe card 4 is equipped with probes for contacting the electrodes on the flat plate capacitor and probes for contacting the test points on the flat plate capacitor clamp 1. Each probe card 4 is connected to a multi-channel test line, which is connected to the common terminal of several high-voltage relays. The normally closed terminal of the high-voltage relay is connected to the capacitance and loss test lines, and the normally open terminal is connected to the high-voltage test line. Each capacitance and loss test line is connected to the capacitance testing mechanism and the loss testing mechanism. Each withstand voltage and insulation resistance test line is connected to the withstand voltage testing mechanism and the insulation resistance testing mechanism. Each probe card 4 is connected to the multi-channel test line, which is connected to multiple connection terminals on one side of a high-voltage multi-channel matrix composed of high-voltage relays. The other side of the high-voltage multi-channel matrix has two channels: one channel connects to the withstand voltage testing mechanism and the insulation resistance testing mechanism, and the other channel connects to the capacitance testing mechanism and the loss testing mechanism.
[0055] The method for testing a parallel plate capacitor using an automatic testing device includes the following steps performed in sequence: the parallel plate capacitor clamp 1 moves the parallel plate capacitor between the upper and lower probe cards 4 of the two probe mechanisms, one probe card 4 on one probe mechanism simultaneously contacts a portion of the multiple hole electrodes on one side of the parallel plate capacitor, and the other probe card 4 on the other probe mechanism simultaneously contacts the remaining hole electrodes on the other side of the parallel plate capacitor.
[0056] One of the probe mechanisms has a probe card 4 with a test point for contacting the flat plate capacitor connected to the metal elastic contact to ground.
[0057] The steps of the pressure resistance test are as follows:
[0058] The upper probe on the probe card 4 of the upper probe mechanism applies voltage to a hole electrode. Other hole electrodes distributed around this hole electrode contact the probes at the corresponding positions of the lower probe card 4. The selector switches connected to each probe of the upper probe card 4 corresponding to the aforementioned probe positions of the lower probe card 4 are turned off. The aforementioned probes of the lower probe card 4 are selectively connected to the ground of the power supply inside the test device, thus completing the withstand voltage test between multiple adjacent hole electrodes simultaneously.
[0059] After the withstand voltage test, the multiple probes that are internally connected to the power ground and contact the adjacent through-hole electrodes are switched from the internal power ground to the series insulation resistance test mechanism to ground. They are charged simultaneously in parallel for a certain period of time, and then the leakage current is quickly tested to obtain the insulation resistance parameters.
[0060] After the withstand voltage test and insulation resistance test are completed, the internal connection of the probe is switched to the capacity test mechanism and the loss test mechanism, so as to obtain the capacity and loss parameters between adjacent hole electrodes and between the hole electrodes and the metallized side of the plate capacitor.
[0061] For the dual-needle testing mode, each probe is selectively connected to the withstand voltage and insulation resistance testing devices, as well as the capacity and loss testing devices. For the multi-needle testing mode, there are two connection methods: Method 1: The multi-needle probe card 4 is connected to the multi-channel test leads. The multi-channel test leads are connected one by one to the common terminal of multiple high-voltage relays. The normally closed terminals of the high-voltage relays are connected one by one to the capacity and loss test leads, and the normally open terminals are connected one by one to the high-voltage test leads. Multiple capacity and loss test leads are connected to the multi-channel capacity and loss test meter. Multiple withstand voltage and insulation resistance test leads are connected to the multi-channel withstand voltage and insulation resistance testing device.
[0062] Method 2: The multi-pin probe card 4 is connected to the multi-channel test leads, which are connected to multiple terminals on one side of a high-voltage multi-channel matrix composed of high-voltage relays. The other side (intersecting side) of the high-voltage multi-channel matrix has two channels: one channel connects to withstand voltage and insulation resistance testing devices, and the other channel connects to capacity and loss testing instruments.
[0063] The above description is only a preferred embodiment of the present invention. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.
Claims
1. An automatic testing device for flat plate capacitors, characterized in that, It includes two probe mechanisms and a flat plate capacitor clamp located between the two probe mechanisms. The probe mechanisms arranged on both sides of the flat plate capacitor clamp each include a probe card with several probes. Each probe mechanism includes a drive transmission mechanism for driving the three-dimensional movement of the probe card, and the probe card is connected to the transmission mechanism in the drive transmission mechanism; the flat plate capacitor fixture is provided with a flat plate capacitor fixing slot, and the bottom center of the fixing slot is provided with an opening to facilitate the probe of the probe mechanism below the flat plate capacitor fixture to test the flat plate capacitor. The automatic testing equipment for parallel-plate capacitors includes the following steps performed sequentially: A parallel-plate capacitor holder moves the capacitor between two probe cards of two probe mechanisms; one probe card on one probe mechanism simultaneously contacts a portion of multiple hole electrodes on one side of the capacitor; another probe card on the other probe mechanism simultaneously contacts the remaining hole electrodes on the other side of the capacitor; wherein, one probe card on one probe mechanism is equipped with a probe for contacting a grounding test point on the holder, which is connected to a metal elastic contact on the side wall of the holder; the withstand voltage test steps are as follows: A probe on one side of the probe mechanism is used to apply voltage to a hole electrode by abutting one of the probes. Other hole electrodes distributed around this hole electrode and the corresponding probes that have made contact are connected to the ground of the power supply inside the test device, thus completing the withstand voltage test between multiple adjacent hole electrodes simultaneously. After the withstand voltage test, the internal connections of multiple probes connected to the power supply ground and in contact with adjacent through-hole electrodes are automatically switched or manually switched to multiple series leakage current test mechanisms and then to the power supply ground. They are charged simultaneously in parallel for a certain period of time, and then the leakage current is quickly tested to obtain multiple insulation resistance parameters. The probes connected to the voltage source and the probes connected to multiple grounds are automatically switched or manually switched to connect to multiple insulation resistance meters, which can also obtain multiple insulation resistance parameters. After the withstand voltage test and insulation resistance test, the internal connections of the probes are automatically switched or manually switched to the capacity test mechanism and the loss test mechanism to obtain the capacity and loss parameters between adjacent hole electrodes and between the hole electrodes and the metallized side of the plate capacitor. Select another hole electrode and repeat the above method to complete the above tests for all hole electrodes on all plate capacitors.
2. The automatic testing device for flat plate capacitors according to claim 1, characterized in that, Two probe mechanisms are arranged vertically on the upper and lower sides of the flat plate capacitor clamp, and the tips of the probes in the probe mechanisms arranged vertically on the flat plate capacitor clamp are all facing the flat plate capacitor; the flat plate capacitor clamp is located between the two probe mechanisms.
3. The automatic testing device for flat plate capacitors according to claim 1, characterized in that, The automatic testing equipment for flat plate capacitors also includes four testing mechanisms: a withstand voltage testing mechanism, an insulation resistance testing mechanism, a capacitance testing mechanism, and a loss testing mechanism, all located on one side of the probe mechanism.
4. The automatic testing device for flat plate capacitors according to claim 3, characterized in that, The sidewall of the fixed slot is provided with metal elastic contacts that make elastic contact with the metallized outer periphery of the flat plate capacitor; the surface of the flat plate capacitor fixture is provided with test points connected to the metal elastic contacts. The probe card is equipped with probes for contacting the electrodes on the plate capacitor or for contacting the test points on the plate capacitor fixture; the test points are located on the upper or lower surface of the plate capacitor fixture; the fixing groove is consistent with the lateral shape of the capacitor, and the bottom wall of the groove has an opening smaller than the size of the capacitor. The probe includes a needle tip and a needle post. The needle tip is shaped to fit the electrode to be tested. The size of the needle tip is smaller than that of the needle post and the size of the needle tip is smaller than that of the plate capacitor electrode. The size of the needle post is larger than that of the plate capacitor electrode.
5. The automatic testing device for flat plate capacitors according to claim 3, characterized in that, Each probe card is connected to a multi-channel test lead, which is connected to the common terminal of several high-voltage relays. The normally closed terminal of the high-voltage relay is connected to the capacity and loss test leads, and the normally open terminal is connected to the high-voltage test lead. Each capacity and loss test lead is connected to the capacity testing mechanism and the loss testing mechanism. Each withstand voltage and insulation resistance test lead is connected to the withstand voltage testing mechanism and the insulation resistance testing mechanism.
6. The automatic testing device for flat plate capacitors according to claim 3, characterized in that, Each probe card is connected to a multi-channel test lead, which is connected to multiple terminals on one side of a high-voltage multi-channel matrix composed of high-voltage relays. The other side of the high-voltage multi-channel matrix has two channels: one channel connects to the withstand voltage test mechanism and the insulation resistance test mechanism, and the other channel connects to the capacity test mechanism and the loss test mechanism.