Electrical stimulation cell test device

Abstract

The application relates to an electric stimulation cell test device. The electric stimulation cell test device comprises a cell culture dish body, a dish rack, a dish cover and a test spring, the dish rack is used for accommodating the cell culture dish body, the dish cover is arranged on the cell culture dish body, and the cell culture dish body is used for accommodating a culture medium; the cell culture dish body comprises a bottom plate and a plurality of side walls arranged around the bottom plate, an electrode clamping groove is arranged on each side wall, and the electrode clamping groove is used for clamping a test electrode; the test spring is connected with the test electrode and an electric field generator, and is used for performing an electric stimulation test on the culture medium by the test electrode under the condition that the electric field generator supplies power to the test electrode through the test spring. In the application, the side walls of the cell culture dish body are provided with the electrode clamping grooves for clamping the test electrode, and the test spring is in contact connection with the test electrode, so that the test electrode can be conveniently disassembled and replaced at any time, and the demand of different test electrodes can be met under the same test condition.

Description

Technical Field

[0001] The present application relates to the technical field of medical equipment, and in particular to an electrical stimulation cell test device. Background Art

[0002] Electric field or current therapy is currently widely used in the treatment of various diseases. Accordingly, research on the mechanisms of electric field therapy is also ongoing, especially research on the principles at the cellular level. For experiments on electric field stimulation of cells, such as electric field cell experiments for tumor treatment, Novocure's Inovitro system can be used. The system uses special culture dishes and an adapted temperature-adjustable incubator to achieve functions such as electric field loading and temperature control. However, the electrodes used in existing electric field test devices are basically fixed and cannot be replaced, which cannot meet the needs of testing different electrode materials under the same experimental conditions. Summary of the Invention

[0003] Based on this, it is necessary to provide an electrical stimulation cell test device that can update and replace electrodes to address the above technical problems.

[0004] In a first aspect, the present application provides an electrical stimulation cell test device, comprising a cell culture dish body, a dish rack, a dish cover, and a test spring, wherein the dish rack is used to accommodate the cell culture dish body, the dish cover is arranged on the cell culture dish body, and the cell culture dish body is used to accommodate culture medium;

[0005] The cell culture dish body comprises a bottom plate and a plurality of side walls arranged around the bottom plate, each of the side walls is provided with an electrode slot, and the electrode slot is used to clamp the test electrode;

[0006] The test spring is connected to the test electrode and the electric field generator, and is used for applying electrical stimulation to the culture medium by the test electrode when the electric field generator supplies power to the test electrode through the test spring to perform an electrical stimulation test.

[0007] In one embodiment, the cell culture dish body includes a fixing frame, which includes a first fixing plate and a second fixing plate; the fixing frame is arranged at the angle between two adjacent side walls; the electrode slot is formed between the first fixing plate and one of the two adjacent side walls, and the electrode slot is formed between the second fixing plate and the other of the two adjacent side walls.

[0008] In one embodiment, the cell culture dish body further includes a through hole, which is opened on each of the side walls, wherein the lowest position of the through hole is higher than the position of the bottom plate.

[0009] In one embodiment, the side walls form a polyhedron around the bottom plate, and the total number of the side walls is an even number greater than or equal to 4.

[0010] In one embodiment, a first wire groove is provided at the bottom of the dish rack, and a second wire groove is provided on the side wall of the dish rack, for connecting the lead connected to the test spring to the electric field generator through the first wire groove and the second wire groove.

[0011] In one embodiment, a spring sheet slot is provided on the dish holder for fixing the test spring.

[0012] In one embodiment, the electrical stimulation cell test device further comprises a heat sink, which is disposed below the dish rack and is used to control the temperature of the culture medium.

[0013] In one embodiment, the heat dissipation rack includes a receiving cavity and a third wire groove corresponding to each of the dish racks, and the third wire groove is provided at the bottom of the heat dissipation rack;

[0014] The accommodating cavity is used to accommodate a cooling fan;

[0015] The third wire slot is used to connect the lead wire connected to the cooling fan to an external circuit.

[0016] In one embodiment, the heat dissipation rack includes an inlet and an outlet for controlling the temperature of the culture medium by controlling the temperature and flow rate of the cooling liquid flowing through the inlet and the outlet.

[0017] In one embodiment, a positioning hole is provided at the bottom of the dish rack, and a positioning column is provided at the top of the heat dissipation rack, for fixing the dish rack and the heat dissipation rack through the positioning hole and the positioning column.

[0018] The above-mentioned electrical stimulation cell test device includes a cell culture dish body, a dish rack, a dish cover and a test spring, the dish rack is used to accommodate the cell culture dish body, the dish cover is arranged on the cell culture dish body, and the cell culture dish body is used to accommodate the culture medium; the cell culture dish body includes a base plate and a plurality of side walls arranged around the base plate, each side wall is provided with an electrode slot, and the electrode slot is used to clamp the test electrode; the test spring is connected to the test electrode and the electric field generator, and is used for the test electrode to apply electrical stimulation to the culture medium to perform an electrical stimulation test when the electric field generator supplies power to the test electrode through the test spring. In this application, since the electrode slot is provided on the side wall of the cell culture dish body to clamp the test electrode, and the test spring is in contact with the test electrode, the test electrode can be conveniently disassembled and replaced at any time, and the needs of different test electrodes can be met under the same test conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 is a first structural schematic diagram of an electrical stimulation cell test device in one embodiment;

[0020] Figure 2 A schematic structural diagram of a test spring in one embodiment;

[0021] Figure 3 A schematic diagram of the shape of a cell culture dish body in one embodiment;

[0022] Figure 4 This is a schematic structural diagram of a cell culture dish body in one embodiment;

[0023] Figure 5 This is a schematic structural diagram of a cell culture dish body in one embodiment;

[0024] Figure 6 This is a schematic diagram of a first structure of a dish rack in one embodiment;

[0025] Figure 7 A schematic diagram of a connection of a lead wire connected to a test spring in one embodiment;

[0026] Figure 8 is a first structural schematic diagram of a heat dissipation frame in one embodiment;

[0027] Figure 9 A second structural schematic diagram of a heat dissipation frame in one embodiment;

[0028] Figure 10 A schematic diagram of a heat dissipation fan interface connection in one embodiment;

[0029] Figure 11 A second structural schematic diagram of an electrical stimulation cell test device in one embodiment;

[0030] Figure 12 Schematic diagram of a process for controlling the temperature of a culture medium in one embodiment;

[0031] Figure 13 is a schematic diagram of an electrical stimulation test in one embodiment;

[0032] Figure 14 A schematic diagram of a temperature-voltage curve in one embodiment;

[0033] Figure 15 FIG. 1 is a schematic diagram of a temperature-power curve in an embodiment.

[0034] Description of reference numerals:

[0035] 100. Electrical stimulation cell test device; 10. Cell culture dish; 20. Dish rack;

[0036] 30. Test spring; 101. Bottom plate; 102. Side wall;

[0037] 103. Electrode slot; 104. Test electrode; 105. Fixing bracket;

[0038] 1051, first fixing plate; 1052, second fixing plate; 106, through hole;

[0039] 40. Dish cover; 201. First wire slot; 202. Second wire slot;

[0040] 203, spring sheet slot; 50, heat dissipation frame; 501 accommodating cavity;

[0041] 502, cooling fan; 503, inlet and outlet; 504, coolant;

[0042] 505, positioning column; 506, third line slot; 107, culture medium. DETAILED DESCRIPTION

[0043] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0044] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0045] In this application, the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly specify the number of technical features indicated. Therefore, a feature specified as "first" or "second" may explicitly or implicitly include at least one of such features. In the description of this application, "plurality" means at least two, for example, two, three, etc., unless otherwise specifically defined.

[0046] In this application, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection, electrical connection; direct connection, or indirect connection through an intermediate medium; internal communication between two elements, or interaction between two elements, unless otherwise specified. Those skilled in the art will understand the specific meanings of the above terms in this application based on specific circumstances.

[0047] In this application, unless otherwise expressly specified or limited, when a first feature is "above" or "below" a second feature, it may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Furthermore, when a first feature is "above," "above," or "above" a second feature, it may mean that the first feature is directly above or diagonally above the second feature, or simply means that the first feature is at a higher level than the second feature. When a first feature is "below," "below," or "below" a second feature, it may mean that the first feature is directly below or diagonally below the second feature, or simply means that the first feature is at a lower level than the second feature.

[0048] Electric field or current therapy has been widely used in the treatment of many diseases. Correspondingly, research on the mechanism of electric field therapy is also being carried out, especially research on the principles at the cellular level. For electric field stimulation cell experiments, such as tumor treatment electric field cell experiments, the commonly used equipment is Novocure's Inovitro system, which uses a special culture dish and an adapted temperature-adjustable incubator to achieve functions such as electric field loading and temperature control. Whether it is an existing current stimulation device or an electric field experimental device, both are obtained by spraying electrodes on the outside to obtain an electric stimulation cell experimental device. These devices have the following defects: the electrodes used are basically fixed and cannot be replaced, and cannot meet the needs of testing electrodes of different materials under the same experimental conditions; the electric field experimental device uses a special culture dish, which is not convenient for direct observation of cells; the electric field experimental device needs to be used with a special low-temperature incubator to control the temperature rise, which is expensive and the temperature control is not flexible enough. In order to solve the above technical problems, the present application proposes an electric stimulation cell experimental device.

[0049] Figure 1 FIG. 1 is a first structural diagram of an electrical stimulation cell test device according to an embodiment of the present invention. Figure 2As shown, the electrical stimulation cell test device 100 includes a cell culture dish body 10, a dish rack 20, a dish cover 40 and a test spring 30. The dish rack 20 is used to accommodate the cell culture dish body 10, and the dish cover 40 is covered on the cell culture dish body 10. The cell culture dish body 10 is used to accommodate culture medium; the cell culture dish body 10 includes a bottom plate 101 and a plurality of side walls arranged around the bottom plate 101, each side wall is provided with an electrode slot 103, and the electrode slot 103 is used to clamp a test electrode 104; the test spring 30 is connected to the test electrode 104 and the electric field generator, and is used for the test electrode 104 to apply electrical stimulation to the culture medium to perform an electrical stimulation test when the electric field generator supplies power to the test electrode 104 through the test spring 30.

[0050] In this embodiment, the shape of the electrical stimulation cell test device can be square, polygonal or circular, such as Figure 1 As shown, the cell culture dish body has a bottom plate 101 for accommodating culture medium. The top end of its sidewalls has a baffle extending outward. The baffles around the sides secure the cell culture dish body 10 within the cavity of the dish holder 20. The dish cover 40 is positioned over the cell culture dish body. Alternatively, a strong, grid-like bottom plate can be provided at the bottom end of the dish holder 20 to form a receiving cavity with the bottom plate, into which the cell culture dish body 10 can be placed directly.

[0051] Furthermore, the cell culture dish body 10 is provided with an electrode slot for securing a test electrode. A test spring 30 is placed between the cell culture dish body 10 and the dish rack 20. One end of the test spring 30 is in contact with the test electrode 104, and the other end is connected to the electric field generator by winding a lead or welding a lead. When the electric field generator supplies power to the test electrode 104 via the test spring 30, the test electrode 104 applies electrical stimulation to the culture medium to perform an electrical stimulation test, thereby generating an electric field between two opposing test electrodes 104. By alternating between test electrodes 104 in different directions, an electric field with real-time changing direction can be generated. Optionally, the same type of test electrodes 104 can be placed in all cell culture dish bodies 10, or different test electrodes 104 can be placed in different cell culture dish bodies 10.

[0052] Optionally, the cell culture dish body 10 may be made of transparent, biocompatible materials to facilitate direct observation of cells.

[0053] Optionally, the test electrode 104 may be made of different materials such as metal materials, insulating ceramic materials, etc., for example, a stainless steel electrode, a copper electrode, a platinum-iridium electrode, a high dielectric insulating ceramic electrode, etc.

[0054] Optionally, the dish rack 20 is made of a relatively strong insulating material, for example, resin or acrylic.

[0055] Optionally, the test spring 30 may be made of beryllium copper, which has good elasticity and a smooth transition curve with a protrusion in the middle.

[0056] Optionally, the dish cover 40 may be made of a transparent material to facilitate observation of cells.

[0057] In this embodiment, Figure 2 FIG. 1 is a schematic diagram of the structure of a test spring in an embodiment, as shown in FIG. Figure 2 As shown, the outwardly protruding portion of the test spring can be contacted and connected with the test electrode, a lead can be welded or wrapped around the lower end of the test spring, and the lead can be connected to the electric field generator. The embodiment of the present application only provides a possible structural form of a test spring and does not impose any specific restrictions on the structure of the test spring.

[0058] like Figure 3 As shown, the side walls surround the bottom plate to form a polyhedron, and the total number of the side walls is an even number greater than or equal to 4. Specifically, the shape of the cell culture dish body can be a quadrilateral or a polygon with an even number greater than or equal to 4, for example, a quadrilateral, a hexagon, an octagon, a dodecagon, and other shapes. Correspondingly, the cavity of the dish rack for placing the cell culture dish body is also a corresponding polygon with an even number greater than or equal to 4.

[0059] In an embodiment of the present application, an electrical stimulation cell test device includes a cell culture dish body, a dish rack, a dish cover, and a test spring, wherein the dish rack is used to accommodate the cell culture dish body, the dish cover is provided on the cell culture dish body, and the cell culture dish body is used to accommodate the culture medium; the cell culture dish body includes a bottom plate and a plurality of side walls arranged around the bottom plate, each side wall is provided with an electrode slot, and the electrode slot is used to clamp the test electrode; the test spring is connected to the test electrode and the electric field generator, and is used to apply electrical stimulation to the culture medium to perform an electrical stimulation test when the electric field generator supplies power to the test electrode through the test spring. In the present application, since the electrode slot is provided on the side wall of the cell culture dish body to clamp the test electrode, and the test spring is in contact with the test electrode, the test electrode can be conveniently disassembled and replaced at any time, and the needs of different test electrodes can be met under the same test conditions.

[0060] Figure 4 This is a schematic structural diagram of a cell culture dish body in one embodiment. Figure 5 FIG. 1 is a schematic structural diagram of a cell culture dish body in another embodiment, as shown in FIG. Figure 4As shown, the cell culture dish body 10 includes a fixing frame 105, which includes a first fixing plate 1051 and a second fixing plate 1052; the fixing frame 105 is arranged at the angle between two adjacent side walls 102; an electrode card slot 103 is formed between the first fixing plate 1051 and one of the two adjacent side walls 102, and an electrode card slot 103 is formed between the second fixing plate 1052 and the other of the two adjacent side walls 102.

[0061] In this embodiment, if Figure 4 As shown, a quadrilateral culture dish body 10 is used as an example for introduction. A fixing frame 105 is provided at the angle between the two side walls 102 of the culture dish body 10. The fixing frame includes a first fixing plate 1051 and a second fixing plate 1052. The first fixing plate 1051 is provided in parallel with one of the side walls 102, and an electrode card slot is formed between the first fixing plate 1051 and the side wall 102. The second fixing plate 1052 is provided in parallel with the other side wall 102, and an electrode card slot 103 is formed between the first fixing plate 1051 and the side wall 102, and the test electrode is clamped in the electrode card slot 103. The fixing frame can be provided at the other three angles in the same manner. Optionally, the first fixing plate 1051 and the second fixing plate 1052 can be as follows Figure 4 The quadrilateral shape shown can also be any other shape, and the embodiment of the present application does not limit this.

[0062] Furthermore, if Figure 5 As shown, the cell culture dish body 10 further includes a through hole 106 , which is opened on each side wall 102 , wherein the lowest position of the through hole 106 is higher than the position of the bottom plate.

[0063] In this embodiment, if Figure 5 As shown, the side wall of the cell culture dish body 10 further includes a through hole 106 to facilitate the connection between the test spring and the test electrode 104. Since the cell culture dish body 10 is used to accommodate culture medium, the lowest position of the through hole 106 is higher than the position of the bottom plate.

[0064] Figure 6 FIG. 1 is a first structural diagram of a dish rack in one embodiment, as shown in FIG. Figure 6 As shown, a first wire groove 201 is provided at the bottom of the dish rack 20, and a second wire groove 202 is provided on the side wall of the dish rack 20, for connecting the lead connected to the test spring to the electric field generator through the first wire groove 201 and the second wire groove 202. Figure 7 As shown, the leads connected to the test spring are uniformly led out from the side and then connected to the electric field generator.

[0065] In this embodiment, a first wire groove 201 is provided at the bottom of the dish rack 20, and a second wire groove 202 is provided on the side wall of the dish rack 20. The lead connected to the test spring is led out from the first wire groove 201 of the dish rack 20 to the side, and is led out from the second wire groove 202 on the side wall to be connected to the electric field generator.

[0066] Furthermore, a spring sheet slot 203 is provided on the dish holder for fixing the test spring.

[0067] In this embodiment, if Figure 6 As shown, a spring sheet slot 203 is provided on the dish rack for fixing a test spring, and the test spring is connected to the test electrode of the cell culture dish body by elastic pressure connection.

[0068] Figure 8 FIG. 1 is a schematic diagram of a first structure of a heat dissipation frame in an embodiment. Figure 8 As shown, the electrical stimulation cell test device also includes a heat sink 50, which is disposed below the dish holder and is used to control the temperature of the culture medium. Positioning holes are provided at the bottom of the dish holder, and positioning posts 505 are provided at the top of the heat sink 50. The positioning holes and the posts 505 are used to secure the dish holder and the heat sink 50.

[0069] In this embodiment, as mentioned above Figure 8 As shown, a positioning hole is provided at the bottom of the dish rack, and a positioning post 505 is provided at the top of the heat sink 50. The dish rack and the heat sink 50 are fixed by the positioning hole and the positioning post 505. The heat sink 50 is set directly below the dish rack. The heat sink 50 is used to cool the culture medium set in the cell culture dish body, control the temperature of the culture medium, and achieve the purpose of constant temperature.

[0070] Optionally, the specific positions and numbers of the positioning holes at the bottom of the dish rack and the positioning posts 505 at the top of the heat dissipation rack 50 can be determined according to actual conditions, and the embodiment of the present application does not impose any limitation thereto.

[0071] Regarding the specific configuration of the heat dissipation rack, the present application provides the following two structural diagrams of the heat dissipation rack:

[0072] Figure 9 FIG. 1 is a second structural diagram of a heat dissipation frame in an embodiment, as shown in FIG. Figure 9 As shown, the heat dissipation rack 50 includes a receiving cavity 501 and a third wire groove 506 corresponding to each other. The third wire groove 506 is arranged at the bottom of the heat dissipation rack. The receiving cavity 501 is used to accommodate the heat dissipation fan 502; the third wire groove 506 is used to connect the leads connected to the heat dissipation fan 502 to the external circuit.

[0073] In this embodiment, if Figure 9As shown, the heat sink 50 includes a receiving cavity 501 corresponding to each dish rack, and the bottom of the heat sink 50 includes a third wire groove 506. The heat dissipation fan 502 is placed in the receiving cavity 501. The leads connected to the heat dissipation fan 502 are uniformly led out through the third wire groove 506 and connected to the external circuit after integration. When performing the electrical stimulation cell test, the heat dissipation fan 502 is used to cool down and control the temperature of the culture medium. Optionally, as Figure 10 As shown, the cooling fan is powered by a DC power supply.

[0074] Optionally, the lead connected to the heat dissipation fan 502 can be connected to an external circuit, or can be connected to an electric field generator, so as to control the temperature of the culture medium in the cell culture dish body through the electric field generator.

[0075] Furthermore, the cooling fan 502 is connected to the bottom plate, heat sink, heat dissipation gel, etc. of the cell culture dish body. When the cooling fan 502 is used for cooling, the power of the cooling fan 502 can be matched with the electric field heating power in the cell culture dish body. The electric field output and the heat dissipation output can be bound by calibration before the experiment. The temperature of the culture medium in the cell culture dish body can also be measured in real time during the experiment to adjust the power of the cooling fan 502.

[0076] Figure 11 FIG. 1 is a second structural diagram of an electrical stimulation cell test device according to an embodiment of the present invention. Figure 11 As shown, the heat dissipation rack 50 includes an inlet and outlet 503 for controlling the temperature of the culture medium 107 by controlling the temperature and flow rate of the cooling liquid 504 flowing through the inlet and outlet 503 .

[0077] In this embodiment, if Figure 11 As shown, the heat sink 50 includes an inlet and outlet 503, and a coolant 504 is filled in the heat sink 50. The cell culture dish body 10 is installed on the dish rack 20, and the dish rack 20 is placed as a whole on the heat sink 50. The culture medium 107 at the bottom of the cell culture dish body 10 is partially immersed in the coolant 504. By controlling the temperature and flow rate of the coolant 504 flowing through the inlet and outlet 503, the temperature of the culture medium 107 during the experiment is controlled, thereby achieving the purpose of constant temperature.

[0078] In one embodiment, a flow chart of controlling the temperature of the culture medium using a cooling fan is shown below: Figure 12 As shown, the temperature in the culture dish is monitored in real time during the experiment. If the culture solution temperature is higher than the set temperature, the cooling fan starts to dissipate heat until the temperature drops below the set temperature.

[0079] like Figure 13As shown in the figure, the test electrode is powered by the electric field generator, and the test electrode applies electrical stimulation to the culture medium to conduct an electrical stimulation test. Before the test, the heating conditions of different test electrodes are measured, and the temperature rise of the culture medium corresponding to different voltages is measured as follows: Figure 14 As shown, the power of the cooling fan and the temperature rise of the corresponding culture medium are as follows Figure 15 As shown, according to Figure 14 The temperature rise-loading voltage curve shown in Figure 15 The temperature rise-power curve shown in the figure can be used to calibrate the experimental output voltage and the power of the cooling fan under fixed test conditions. The output is output in a gear system, and the output voltage of each gear corresponds to the different power of the cooling fan, thus realizing a simple coordinated temperature control solution.

[0080] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0081] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. An electrical stimulation cell test device, characterized in that: The electrical stimulation cell test device comprises a cell culture dish body, a dish rack, a dish cover and a test spring, wherein the dish rack is used to accommodate the cell culture dish body, the dish cover is arranged on the cell culture dish body, and the cell culture dish body is used to accommodate culture medium; The cell culture dish body comprises a bottom plate and a plurality of side walls arranged around the bottom plate, each of the side walls is provided with an electrode slot, and the electrode slot is used to clamp the test electrode; The test spring is connected to the test electrode and the electric field generator, and is used for applying electrical stimulation to the culture medium by the test electrode when the electric field generator supplies power to the test electrode through the test spring to perform an electrical stimulation test.

2. The electrical stimulation cell test device according to claim 1, characterized in that: The cell culture dish body includes a fixing frame, which includes a first fixing plate and a second fixing plate; the fixing frame is arranged at the angle between two adjacent side walls; the electrode slot is formed between the first fixing plate and one of the two adjacent side walls, and the electrode slot is formed between the second fixing plate and the other of the two adjacent side walls.

3. The electrical stimulation cell test device according to claim 1, characterized in that: The cell culture dish body further includes a through hole, which is opened on each of the side walls, wherein the lowest position of the through hole is higher than the position of the bottom plate.

4. The electrical stimulation cell test device according to any one of claims 1 to 3, characterized in that: The side walls form a polyhedron around the bottom plate, and the total number of the side walls is an even number greater than or equal to 4.

5. The electrical stimulation cell test device according to claim 1, characterized in that: A first wire groove is provided at the bottom of the dish rack, and a second wire groove is provided on the side wall of the dish rack, for connecting the lead connected to the test spring to the electric field generator through the first wire groove and the second wire groove.

6. The electrical stimulation cell test device according to claim 1, characterized in that: The dish rack is provided with a spring sheet slot for fixing the test spring.

7. The electrical stimulation cell test device according to claim 1, characterized in that: The electrical stimulation cell test device further comprises a heat dissipation rack, which is arranged below the dish rack and is used to control the temperature of the culture medium.

8. The electrical stimulation cell test device according to claim 7, characterized in that: The heat dissipation rack includes a receiving cavity and a third wire groove corresponding to the dish rack one by one, and the third wire groove is provided at the bottom of the heat dissipation rack; The accommodating cavity is used to accommodate a cooling fan; The third wire slot is used to connect the lead wire connected to the cooling fan to an external circuit.

9. The electrical stimulation cell test device according to claim 7, characterized in that: The heat dissipation rack includes an inlet and an outlet for controlling the temperature of the culture medium by controlling the temperature and flow rate of the cooling liquid flowing through the inlet and the outlet.

10. The electrical stimulation cell test device according to claim 8, characterized in that: The bottom of the dish rack is provided with a positioning hole, and the top of the heat dissipation rack is provided with a positioning column, which is used to fix the dish rack and the heat dissipation rack through the positioning hole and the positioning column.

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