Automated sampler track system with magnetic coupling for linear motion

Abstract

Systems and methods for preventing the release of metal particles from an autosampler that might otherwise be detected within a sample during sample analysis are described. In an exemplary embodiment, an autosampler system includes, but is not limited to, a sample probe support structure; a z-axis support; an outer shuttle coupled with an outer surface of the z-axis support; and an inner shuttle linearly movable within an interior volume of the z-axis support, the inner shuttle being magnetically coupled with the outer shuttle to transfer linear motion of the inner shuttle to the outer shuttle.

Description

[0001] Cross-reference to related applications

[0002] This application claims the benefit of U.S. Provisional Application No. 62 / 992,334, filed March 20, 2020, entitled “AUTOSAMPLER RAIL SYSTEM WITH MAGNETIC COUPPLING FOR LINEAR MOTION,” pursuant to 35 U.S.C., 119(e). U.S. Provisional Application No. 62 / 992,334 is incorporated herein by reference in its entirety. Background Technology

[0003] In many laboratory settings, it is often necessary to analyze large quantities of chemical or biochemical samples located in a single sample container. To simplify these processes, the handling of samples has been mechanized. This mechanized sampling is commonly referred to as automated sampling and is performed using automated sampling devices or autosamplers. Summary of the Invention

[0004] An automated sampler system is described that prevents metal particles from being released from the automated sampler, which would otherwise be detected within the sample during sample analysis. System embodiments include, but are not limited to, a sample probe support structure configured to hold a sample probe for transferring a fluid sample through the sample probe; a z-axis support member coupled to the sample probe support structure; an outer shuttle coupled to the outer surface of the z-axis support member and coupled to the sample probe support structure; and an inner shuttle linearly movable within the internal volume of the z-axis support member, the inner shuttle being magnetically coupled to the outer shuttle to transfer the linear motion of the inner shuttle to the outer shuttle, thereby providing linear motion to the sample probe support structure.

[0005] In one aspect, the automated sampler system includes, but is not limited to, a sample probe support structure configured to hold a sample probe for transferring a fluid sample through the sample probe; a z-axis support coupled to the sample probe support structure; an outer shuttle coupled to the z-axis support and the sample probe support structure, the outer shuttle including at least one first magnet; and an inner shuttle linearly movable within an internal volume of the z-axis support, the inner shuttle including at least one second magnet, the inner shuttle being magnetically coupled to the outer shuttle via magnetic interaction between the first and second magnets, thereby transferring the linear motion of the inner shuttle to the outer shuttle to provide linear motion of the sample probe support structure, wherein the z-axis support includes a tube having a portion disposed between the outer and inner shuttles, the tube defining an internal volume through which the inner shuttle passes during linear motion.

[0006] This summary is provided to introduce a selection of concepts in a simplified form, which will be further described in the detailed description below. This summary is not intended to identify key or essential features of the claimed subject matter, nor is it intended to be used as an aid in determining the scope of the claimed subject matter. Attached Figure Description

[0007] This detailed description is illustrated with reference to the accompanying drawings. The use of the same reference numerals in different instances of the description and drawings may refer to similar or identical items.

[0008] Figure 1A This is an isometric view of an autosampler probe track system for preventing the release of metal particles from the autosampler, which would otherwise be detected in the sample during sample analysis, according to an exemplary embodiment of the present disclosure.

[0009] Figure 1B yes Figure 1A An isometric view of the autosampler probe track system, in which the support arm of the autosampler is transitioned to a lower position along the z-axis.

[0010] Figure 1C yes Figure 1A An isometric view of the autosampler probe track system, in which the support arm is rotated about the z-axis.

[0011] Figure 2 yes Figure 1A A partial cross-sectional side view of the automatic sampler probe track system.

[0012] Figure 3 yes Figure 1A A partial isometric view of the inner shuttle of the automatic sampler probe track system.

[0013] Figure 4 yes Figure 1A A partial cross-sectional isometric view of the autosampler probe track system, showing the magnet supported by the inner shuttle in relation to the magnet supported by the outer shuttle.

[0014] Figure 5 It has a related driving system Figure 1A A partial cross-sectional side view of the automatic sampler probe track system.

[0015] Figure 6 yes Figure 1A A top view of the automatic sampler probe track system.

[0016] Figure 7 yes Figure 1A An isometric view of the support arm of the automatic sampler probe track system.

[0017] Figure 8This is based on exemplary embodiments of the present disclosure. Figure 1A Partial isometric view of the outer shuttle of the automatic sampler probe track system. Detailed Implementation

[0018] Overview

[0019] An automated sampling device or autosampler may support a sample probe relative to a vertically oriented rod that moves the sample probe along or across one or more directions of movement. For example, the sample probe may be coupled to a vertically movable portion of the rod via a probe support arm or other means to move the probe vertically to position it into or remove it from a sample container (e.g., a tube or other container), rinsing container, standard chemical container, diluent container, etc., located on the platform of the autosampler. In other cases, the rod may be rotated to facilitate movement of the probe about a horizontal plane to position the probe above other sample containers and other containers located on the platform.

[0020] An autosampler may include metallic mechanical or structural components that move relative to each other to facilitate one or more movements of the probe. As these components begin to wear (e.g., through interactions based on repeated friction), metal particles can be released onto the autosampler platform and into containers positioned around the probe arm. For example, metal particles can be deposited directly into the sample container, onto the probe, or into other containers used during sample preparation (e.g., rinsing containers, standard chemical containers, diluent containers, etc.), thereby introducing contaminants into the sample or other fluids. Such contaminants can be detected by analytical instruments and can introduce errors into analytical measurements of the sample and other fluids by providing unreliable or inaccurate data about the composition of the fluids introduced for probe analysis. Furthermore, the metallic mechanical or structural components may be exposed to irritating chemicals, such as corrosive acids, present on the autosampler platform, which can accelerate the release of metal particles during normal operation of the autosampler.

[0021] Therefore, systems and methods for preventing the release of metal particles from an autosampler, which could otherwise be detected within the sample during analysis, are disclosed. In one aspect, a system includes an inner shuttle magnetically coupled to an outer shuttle configured to support a sample probe. The inner shuttle is encapsulated within a tube formed or coated with a chemically inert material (e.g., a fluoropolymer), and the outer shuttle is also formed or coated with the same material, such that no metal features are exposed to the external environment during operation of the autosampler. The inner shuttle moves within the tube, and this movement is transmitted via magnetic coupling to the outer shuttle, which in turn is transmitted to the probe support structure. In one embodiment, the tube defines surface features (e.g., splines) on its outer surface, while the outer shuttle has corresponding features on its inner surface. The surface features of the tube and the outer shuttle interact to transmit rotational motion of the tube to the outer shuttle, which in turn is transmitted to the probe support structure. The autosampler facilitates multiple planes of motion of the sample probe without the risk of metal particles being exposed to sample containers and other containers located on the platform of the autosampler.

[0022] Exemplary Implementation

[0023] refer to Figures 1A to 8 This illustration shows an autosampler probe track system (“System 100”) according to exemplary embodiments of the present disclosure for preventing the release of metal particles from an autosampler that might otherwise be detected within the sample during sample analysis. System 100 typically includes a probe support arm 102, an outer shuttle 104, an inner shuttle 106, and a z-axis support 108. One or more portions of System 100 may be formed or coated with a chemically inert material to prevent metal components from being exposed to the external environment of System 100, thereby preventing the introduction of metal contaminants into the sample container or other fluid containers adjacent to the autosampler. In an embodiment, the probe support arm 102, the outer shuttle 104, and the z-axis support each include a structure formed or coated with a chemically inert material, such as a fluoropolymer, for example, polytetrafluoroethylene (PTFE). In an embodiment, all outer surfaces of System 100 include a chemically inert material to prevent corrosion or other material breakdown of System 100 when exposed to a sample present on the platform or otherwise exposed to the external environment.

[0024] The probe support arm 102 includes a probe support 110 that holds a sample probe and associated tubing for drawing fluid from or introducing fluid into sample containers positioned on a platform of an automated sampler system adjacent to the system 100. The probe support arm 102 is coupled to an outer shuttle 104 (e.g., via friction-fit interlock, via snap-fit ​​connection, etc.), wherein each of the probe support arm 102 and the outer shuttle 104 defines an orifice into which an upper portion 112 of a z-axis support 108 is fitted to connect the probe support arm 102 and the outer shuttle 104 to the z-axis support 108. For example, the upper portion 112 of the z-axis support 108 includes a generally circular shape corresponding to a generally circular opening in each of the probe support arm 102 and the outer shuttle 104. While a generally circular shape is shown, other shapes may be used in the system 100, including but not limited to rectangular, triangular, irregular shapes, etc. The probe support arm 102 can be held in place relative to the z-axis support 108 by frictional engagement between corresponding structures and by magnetic coupling between the outer shuttle 104 and the inner shuttle 106 positioned within the z-axis support. In an embodiment, the probe support arm 102 and the outer shuttle 104, or multiple portions thereof, can be formed as a single structure.

[0025] System 100 controls the positioning of the sample probe held by probe support arm 102 through controlled positioning of outer shuttle 104 and rotation of z-axis support 108. For example, Figure 1B The movement of the outer shuttle 104 along the z-axis support 108 (e.g., along the z-axis 114) is shown, which in turn moves the probe support arm 102 via the interaction between the outer shuttle 104 and the inner shuttle 106. Figure 1C The rotational movement of the probe support arm 102 is shown by the rotation of the z-axis support 108, which is further described herein.

[0026] refer to Figure 2 The diagram shows a cross-section of a system 100 according to an exemplary embodiment of the present disclosure. A z-axis support 108 is shown as an outer tube 200 having a defined internal volume 202, through which an inner shuttle 106 is configured to influence the vertical movement of the outer shuttle 104. The system 100 can move the inner shuttle 106 within the tube 200 via various mechanisms, including but not limited to linear actuators with push rods (e.g., pneumatic actuators), splined screws, or combinations thereof. In the exemplary embodiment, the system 100 is shown having a splined screw track 204 (e.g., as in...). Figure 2-5(As seen in the image). The splined screw track 204 includes a threaded screw 206 positioned along the z-axis 114, with a structural track 208 positioned around a portion of the screw 206. The structural track 208 is fixedly mounted to a base, while the screw 206 is rotatably coupled within the tube 200. For example, the system 100 may include a first actuator (e.g., Figure 5 The pulley actuator 500 shown causes rotational movement of the screw 206 within the tube 200. The inner shuttle 106 includes corresponding threads on its inner surface to engage with the threads of the screw 206. As the screw 206 is rotatably driven, the inner shuttle 106 moves vertically within the tube 200 along the z-axis 114 via the interaction between the corresponding threads (e.g., through the internal volume 202). Alternatively or additionally, the system 100 includes a pneumatic actuator to vertically actuate the inner shuttle 106 within the internal volume 202. In an embodiment, the inner shuttle 106 defines one or more orifices corresponding to the shape of the structural track 208, such that the structural track 208 passes through the orifices of the inner shuttle 106 as the inner shuttle 106 moves within the tube 200. For example, the inner shuttle 106 in… Figure 3 In an exemplary embodiment, it is shown to have 'C'-shaped apertures to conform to the 'C'-shaped structure track 208.

[0027] The outer shuttle 104 and inner shuttle 106 each include one or more magnets to magnetically couple the respective shuttles, such that when the inner shuttle 106 is driven along the z-axis 114 (e.g., via operation of the splined screw track 204 and the first actuator, via operation of a pneumatic actuator, etc.), the outer shuttle 104 follows a corresponding vertical movement along the outer surface of the z-axis support 108. For example, the inner shuttle 106 is shown having two magnets 210 positioned within an outer structure 212 of the inner shuttle 106. The outer structure 212 may include, but is not limited to, polyvinylidene fluoride (PVDF) material wound around the body structure 214 of the inner shuttle 106. In an embodiment, the body structure 214 defines corresponding threads that engage with the threaded screw 206. The magnets 210 are shown as circular or annular structures with a central aperture through which the structure of the splined screw track 204 can pass. For example, magnet 210 surrounds z-axis 114, and splined screw track 204 passes through the aperture of magnet 210. Inner shuttle 106 is shown having spacer structure 216 positioned between magnets 210. Outer structure 212 and body structure 214 can push each magnet 210 against spacer structure 216 to control the separation between magnets 210 so as to maintain a substantially uniform distance between magnets 210 during operation of system 100. Magnets 210 are aligned such that like magnetic poles face each other (e.g., the same magnetic pole is in contact with spacer structure 216). For example, Figure 2The diagram shows the north poles of each magnet 210 facing each other, with a spacer structure 216 positioned between them and the south poles oriented away from each other. Alternatively, the south poles of the magnets 210 may face each other, while the north poles are oriented away from each other.

[0028] The outer shuttle 104 includes corresponding magnets for interacting with the magnets 210 of the inner shuttle 106. For example, the outer shuttle 104 is shown having two corresponding magnets 218 held within the body structure 220. Similar to the inner shuttle 106, the outer shuttle 104 may include a spacer structure 222 positioned between the magnets 218 within the body structure 220. In one embodiment, the body structure 220 includes a top 224 coupled to a bottom 226, defining a cavity between the top 224 and the bottom 226 to accommodate the magnets 218 and the spacer structure 222. The top 224 and the bottom 226 may be secured together (e.g., snap-fit) to place the magnets 218 against the spacer structure 222. The magnets 218 are aligned such that like poles face each other, wherein the poles of magnets 218 having opposite poles face the poles of adjacent magnets 210 of the inner shuttle 106. For example, as Figure 2 As shown, the north pole of magnet 218 faces the south pole of magnet 210 (e.g., with tube 200 located therebetween), and the south pole of magnet 218 faces the north pole of magnet 210 (e.g., with tube 200 located therebetween). By facing opposite magnetic poles of magnets 210 and 218, the magnetic field couples the inner shuttle 106 to the outer shuttle 104, such that linear movement of the inner shuttle 106 causes a corresponding linear movement of the outer shuttle 104. Although system 100 is shown as having two magnets for each of the outer shuttle 104 and the inner shuttle 106, system 100 is not limited to two magnets and may include fewer or more magnets for each shuttle (e.g., depending on the desired attraction between the two magnets).

[0029] In one embodiment, tube 200 defines surface features on its outer surface to facilitate rotational movement of outer shuttle 104 as tube 200 rotates. For example, tube 200 is shown having a plurality of splines 300 oriented longitudinally along the outer surface of tube 200. Outer shuttle 104 includes corresponding features on its inner surface to mate with the surface features of tube 200. For example, outer shuttle 104 is shown having corresponding splines 302 with clearance fit between splines 300 of tube 200. The surface features of tube 200 and outer shuttle 104 interact to transmit rotational movement of tube 200 to outer shuttle 104, which in turn transmits it to probe support structure 102 to rotate probe support structure 102 about z-axis 114. In one embodiment, tube 200 is driven by a second actuator (e.g., Figure 5The operation of the pulley actuator 502 shown in the diagram rotates to cause rotational movement of the tube 200. For example, the system 100 may include a bushing 504 coupled between a fixed drive base 506 and a rotary drive structure 508. The rotary drive structure 508 is coupled to the pulley actuator 502 to rotate about the z-axis 114 when the pulley actuator 502 is in operation. The tube 200 is coupled to the rotary drive structure 508 to rotate accordingly when the pulley actuator 502 is in operation, which in turn rotates the outer shuttle 104 to rotate the probe support structure 102 through the interaction of corresponding surface features (e.g., splines 300 and 302).

[0030] The outer shuttle 104 can be mounted onto the z-axis support 108 by positioning the main structure 220 adjacent to the upper portion 112 of the z-axis support 108, wherein the end 228 of the receiving magnet 218 of the main structure 220 is positioned to correspond to the end 230 of the receiving magnet 210 of the main structure 214, to allow the interaction between the respective magnetic fields of the inner shuttle 106 and the outer shuttle 104 to magnetically couple the respective shuttles. When the outer shuttle 104 is positioned along the z-axis support 108, the surface features of the outer shuttle 104 and the surface features of the tube 200 (e.g., splines 302 and 300, respectively) can slide adjacent to each other until the magnet 218 is coupled to the magnet 210. In an embodiment, the system 100 includes a key structure to orient the probe support structure 102 along a predetermined direction when mounted on the z-axis support 108, so as to provide a specific position of the probe held by the probe support structure 102 for indexing purposes by rotation of the tube 200. For example, Figure 6 A tube 200 is shown defining a key structure 600 (e.g., a spline with a larger cross-sectional area than other splines 300), wherein an outer shuttle 104 defines a corresponding key structure 602 (e.g., for receiving the aperture of key structure 600). The probe support structure 102 and the outer shuttle 104 also include corresponding key structures to provide a desired orientation of the probe support structure 102 relative to the tube 200. For example, the outer shuttle 104 is shown as including key structure 604, wherein the probe support structure 102 includes a corresponding key structure 606 (e.g., for receiving the aperture of key structure 604). In an embodiment, the probe support structure 102 is removably coupled to the outer shuttle 104, such that different probe support structures 102 can be coupled to the outer shuttle 104. Alternatively or additionally, different outer shuttles may be positioned on the z-axis support 108 to introduce different types of probe support structures onto the z-axis support (e.g., to facilitate diaphragm puncture probes, etc.).

[0031] The probe support structure 102 and the outer shuttle 104 may include locking structures to secure the probe support structure 102 relative to the outer shuttle 104. For example, the outer shuttle 104 may be in... Figure 8The diagram shows a recess 800 defined on the outer surface 802 of the main structure 220, the recess 800 being sized and designed to receive a protrusion 804 positioned on the inner surface 806 of the probe support structure 102 (e.g., Figure 7 (As shown in the diagram). Alternatively or additionally, the probe support structure 102 may define a groove and the outer shuttle 104 may define a corresponding protrusion. During the mounting of the probe support structure 102 onto the outer shuttle 104, the protrusion 804 may engage with the groove 800 to provide a locking fit arrangement between the probe support structure 102 and the outer shuttle 104, so as to securely hold the probe support structure 102 relative to the outer shuttle 104 and the z-axis support 108. For example, the interaction between the groove 800 and the protrusion 804 can prevent the probe support structure 102 from being removed from the outer shuttle 104 by means of a vertical force that overcomes the purely frictional fit between the probe support structure 102 and the outer shuttle 104.

[0032] In one embodiment, the outer shuttle 104 may define a segment receiving the probe support structure 102 at its top. The probe support structure 102 may rest against these segments, which in turn provides a compliant fit with the tube 200 of the z-axis support 108 to provide a secure fit between the outer shuttle 104 and the z-axis support 108. For example, the outer shuttle 104 in Figure 8 The outer shuttle 104 is shown with multiple vertical cuts 808 through its top 810 to divide it into multiple segments 812. When the probe support structure 102 is introduced onto the outer shuttle 104, it can provide an inward force to the segments 812, which in turn pushes against a z-axis support (e.g., on the spline 300) to secure the outer shuttle 104 in place. Although... Figure 8 The top 810 is shown divided into four segments 812, but this disclosure is not limited to this arrangement. For example, the top 810 may be divided into fewer than four segments 812, more than four segments 812, segments 812 of equal size, segments of unequal size, etc.

[0033] in conclusion

[0034] Although the subject matter has been described in language specific to structural features and / or process operations, it will be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or actions described above. Rather, the specific features and actions described above are disclosed as exemplary forms for implementing the claims.

Claims

1. An automatic sampler system, comprising: A sample probe support structure configured to hold a sample probe for transferring a fluid sample through the sample probe; The z-axis support is connected to the sample probe support structure. An outer shuttle, connected to the outer surface of the z-axis support and to the sample probe support structure, includes one or more external magnets housed within the main body structure of the outer shuttle. The one or more external magnets include a first external magnet and a second external magnet vertically spaced apart from each other via an external spacer structure. The first magnetic poles of the first external magnet and the second external magnet are identical and are each resting against the external spacer structure. An inner shuttle includes one or more inner magnets housed within an outer structure of the inner shuttle. The one or more inner magnets include a first inner magnet and a second inner magnet vertically spaced apart from each other via an inner spacer structure. The second magnetic poles of the first inner magnet and the second inner magnet are identical and are respectively positioned against the inner spacer structure. Furthermore, the second magnetic pole of the first inner magnet and the first magnetic pole of the first outer magnet are identical. The inner shuttle is capable of linear movement within the internal volume of the z-axis support member, and one or more inner magnets of the inner shuttle are magnetically coupled to one or more outer magnets of the outer shuttle to transmit the linear motion of the inner shuttle to the outer shuttle, thereby providing linear motion of the sample probe support structure.

2. The automatic sampler system as described in claim 1, wherein, The z-axis support includes a tube extending along the z-axis support, the tube defining the internal volume, and the tube including a portion disposed between the outer shuttle and the inner shuttle.

3. The automatic sampler system as described in claim 2, wherein, The tube defines one or more surface features on its outer surface, and the outer shuttle defines one or more corresponding surface features on its inner surface, such that the rotational motion of the tube is transmitted to the outer shuttle through the interaction between the one or more surface features and the one or more corresponding surface features.

4. The automatic sampler system as described in claim 3, wherein, The one or more surface features include one or more splines.

5. The automatic sampler system as described in claim 3, wherein, The automatic sampler system also includes a drive system connected to the tube, which provides rotational motion of the tube when the drive system is in operation.

6. The automatic sampler system as described in claim 5, wherein, The automatic sampler system also includes a second drive system connected to the inner shuttle to provide linear movement of the inner shuttle within the internal volume of the tube.

7. The automatic sampler system as described in claim 2, wherein, The automatic sampler system also includes a drive system connected to the inner shuttle to provide linear movement of the inner shuttle within the internal volume of the tube.

8. The automatic sampler system as claimed in claim 1, wherein, At least a portion of each of the z-axis support, the outer shuttle, and the sample probe support structure comprises a chemically inert material.

9. The automatic sampler system as claimed in claim 1, wherein, The outer surface of the z-axis support defines a key structure, which is configured to engage with a corresponding key structure positioned on the inner surface of the outer shuttle.

10. The automatic sampler system as claimed in claim 9, wherein, The outer shuttle defines a second bond structure positioned on the outer surface of the outer shuttle, the second bond structure being configured to cooperate with a corresponding second bond structure positioned on the sample probe support structure to orient the sample probe support structure relative to the outer shuttle.

11. The automatic sampler system as claimed in claim 1, wherein, The outer shuttle defines at least two segments positioned at the top of the outer shuttle, and the sample probe support structure provides inward forces on the at least two segments to push the at least two segments against the z-axis support.

12. The automatic sampler system as claimed in claim 1, wherein, The outer shuttle defines a groove on its outer surface, and the sample probe support structure defines a protrusion on its inner surface, the protrusion being configured to be introduced into the groove.

13. The automatic sampler system as claimed in claim 1, wherein, The z-axis support includes a tube having a portion disposed between the outer shuttle and the inner shuttle, the tube defining an internal volume through which the inner shuttle passes during linear motion.

14. The automatic sampler system of claim 13, wherein, The automatic sampler system also includes a first drive system coupled to the inner shuttle to provide linear movement of the inner shuttle within the internal volume of the tube.

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