Method and device for processing jump fault of fuel cell inspection system and electronic equipment

Abstract

The application provides a fuel cell inspection system jump fault processing method, device and electronic equipment. The fuel cell inspection system jump fault processing method comprises the following steps: acquiring the voltage of each piece of fuel cell to obtain a plurality of single-piece voltages; comparing each single-piece voltage with an average voltage to determine whether a first condition is met; acquiring the multiple voltage values of the single piece meeting the first condition, and determining whether at least one voltage value in the multiple voltage values meets a second condition; if at least one voltage value in the multiple voltage values meets the second condition, the jump fault of the inspection is determined; the single piece of the jump fault of the inspection is shielded, and the average single-piece voltage of the fuel cell is assigned to the single piece of the jump fault of the inspection as the voltage of the single piece of the jump fault of the inspection, wherein the average single-piece voltage is the average value of the voltages of the other single pieces except the single piece of the fault. The purpose of reducing the maintenance cycle and reducing the maintenance cost is achieved.

Description

TECHNICAL FIELD

[0001] The present application belongs to the field of new energy technology, and particularly relates to a fuel cell inspection system jump fault processing method and device and electronic equipment. BACKGROUND

[0002] One of the common faults of the hydrogen fuel cell vehicle is the voltage inspection system fault of the fuel cell, and the common voltage inspection system fault is the jump fault, which causes the system to misreport a single low fault, and further affects the power output of the engine, reduces the performance of the engine, increases the fault rate of the vehicle, and reduces the reliability of the vehicle. The existing technology adopts a technical solution of replacing the voltage inspection system module for the misreporting single low fault caused by the jump fault, so that there are problems of long period and high cost. SUMMARY

[0003] In view of the problems in the prior art, the present application provides a fuel cell inspection system jump fault processing method and device and electronic equipment, which at least partially solves the problems of long maintenance period and high cost in the prior art.

[0004] In a first aspect, the present application provides a fuel cell inspection system jump fault processing method, which comprises the following steps:

[0005] Obtaining the voltage of each piece of the fuel cell to obtain a plurality of single voltages;

[0006] Comparing each single voltage with the average voltage to determine whether the first condition is met, and the average voltage is the average value of all single voltages of the fuel cell;

[0007] Obtaining the multiple voltage values of the single piece meeting the first condition, and determining whether at least one voltage value in the multiple voltage values meets the second condition;

[0008] If at least one voltage value in the multiple voltage values meets the second condition, it is determined that the inspection jump fault occurs;

[0009] Shielding the single piece with the inspection jump fault, and assigning the average single voltage of the fuel cell to the single piece with the inspection jump fault as the voltage of the single piece with the inspection jump fault, and the average single voltage is the average value of the voltages of the other single pieces except the fault single piece.

[0010] Optionally, the first condition is Vave-V N ave is the average voltage of the fuel cell, V N is the single voltage of the fuel cell, and A is a set value.

[0011] Optionally, 50mv

[0012] Optionally, the second condition is Vave-V i < B, V i For a single piece of the single unit satisfying the first condition, B is a set value.

[0013] Optionally, 0mv < B < 30mv.

[0014] Optionally, the obtaining of the multiple voltage values of the single piece satisfying the first condition comprises:

[0015] checking multiple detection values of the fuel cell inspection system to obtain multiple inspection voltages;

[0016] obtaining the multiple voltage values of the single piece satisfying the first condition from the multiple inspection voltages.

[0017] Optionally, the multiple detection values are any five detection values.

[0018] In a second aspect, the embodiments of the present disclosure further provide a processing device for a fuel cell inspection system jump fault, comprising:

[0019] a voltage obtaining module, configured to obtain a voltage of each piece of the fuel cell to obtain multiple single piece voltages;

[0020] a voltage comparison module, configured to compare each single piece voltage with an average voltage to determine whether the first condition is satisfied, the average voltage being an average value of all single piece voltages of the fuel cell;

[0021] an inspection module, configured to obtain multiple voltage values of the single piece satisfying the first condition, and determine whether at least one voltage value in the multiple voltage values satisfies the second condition;

[0022] a determination module, configured to determine that the inspection jump fault exists when at least one voltage value in the multiple voltage values satisfies the second condition;

[0023] an inspection jump fault processing module, configured to shield the single piece of the inspection jump fault, and assign an average single piece voltage of the fuel cell to the single piece of the inspection jump fault as a voltage of the single piece of the inspection jump fault, the average single piece voltage being an average value of voltages of other single pieces except the single piece of the fault.

[0024] In a third aspect, the embodiments of the present disclosure further provide an electronic device, comprising:

[0025] at least one processor; and

[0026] a memory in communication with the at least one processor; wherein

[0027] The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to execute the processing method for jump fault of the fuel cell inspection system according to any one of the first aspect.

[0028] In a fourth aspect, the embodiments of the present disclosure further provide a computer readable storage medium storing computer instructions for causing a computer to execute the processing method for jump fault of the fuel cell inspection system according to any one of the first aspect.

[0029] The present application provides a processing method, device and electronic equipment for jump fault of a fuel cell inspection system, wherein the processing method for jump fault of the fuel cell inspection system judges whether a voltage inspection system fault is an inspection jump fault, and if the fault is an inspection jump fault, the faulty single piece is shielded, and the average single piece voltage of the fuel cell is assigned to the faulty single piece as the voltage of the faulty single piece, so that the false single low caused by the fault of the voltage inspection system itself is shielded, the engine and the voltage inspection system module are avoided from being replaced, the maintenance cycle is reduced, and the maintenance cost is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0030] The above and other objects, features and advantages of the present disclosure will become more apparent from the following detailed description taken in conjunction with the accompanying drawings, in which like reference characters refer to like parts throughout the figures, and in which:

[0031] Figure 1 A flow chart of a processing method for jump fault of a fuel cell inspection system according to an embodiment of the present disclosure is provided.

[0032] Figure 2 A principle block diagram of a processing device for jump fault of a fuel cell inspection system according to an embodiment of the present disclosure is provided.

[0033] Figure 3 A principle block diagram of an electronic equipment according to an embodiment of the present disclosure is provided. DETAILED DESCRIPTION

[0034] The embodiments of the present disclosure will be described in detail below with reference to the accompanying drawings.

[0035] It should be apparent that the following describes embodiments of the present disclosure by way of specific examples, and that the other advantages and features of the present disclosure can be apparent from this description to those skilled in the art. Obviously, the described embodiments are only a part of the embodiments of the present disclosure, and are not all the embodiments. The present disclosure can also be implemented or applied by other different specific embodiments, and the details in the specification can be modified or changed based on different views and applications without departing from the spirit of the present disclosure. It should be noted that the following embodiments and features in the embodiments can be combined with each other without conflict. Based on the embodiments in the present disclosure, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present disclosure.

[0036] It should be noted that various aspects of embodiments within the scope of the appended claims are described below. It should be apparent that the aspects described herein can be implemented in a wide variety of forms and that any particular structure and / or function described herein is merely illustrative. Based on the teachings herein one skilled in the art will appreciate that one or more aspects described herein can be implemented independently of any other aspects and that non-dependent aspects can be implemented in conjunction with each other in any way. For example, a device can be implemented and / or a method practiced using any number of the aspects set forth herein. In addition, an apparatus can be implemented and / or a method can be practiced using other structure and / or functionality in addition to or other than one or more of the aspects set forth herein.

[0037] It should also be noted that the drawings provided in the following embodiments are only schematically illustrating the basic concept of the present disclosure, and only the components related to the present disclosure are shown in the drawings, not drawn according to the number, shape and size of the components in actual implementation, and the shape, number and proportion of each component in actual implementation can be arbitrarily changed, and the layout pattern of the components can be more complex.

[0038] In addition, in the following description, specific details are provided in order to facilitate a thorough understanding of the examples. However, one skilled in the art will understand that the aspects described can be practiced without these specific details.

[0039] Average voltage: average single cell voltage of the fuel cell stack.

[0040] Jumping fault: phenomenon of fluctuation of voltage of a single cell or several single cells.

[0041] Single low: phenomenon that the voltage of a single cell or individual cell in the fuel cell stack is significantly lower than the average voltage.

[0042] Single high: phenomenon that the voltage of a single cell or individual cell in the fuel cell stack is significantly higher than the average voltage.

[0043] For ease of understanding, as shown in Figure 1 The embodiment discloses a processing method for jump fault of a fuel cell inspection system, including:

[0044] Obtain the voltage of each piece of the fuel cell to obtain a plurality of single-piece voltages;

[0045] The fuel cell includes a plurality of single pieces.

[0046] Compare each single-piece voltage with an average voltage to determine whether a first condition is met, the average voltage being an average of all single-piece voltages of the fuel cell;

[0047] Optionally, the first condition is Vave-V N >A, Vave is the average voltage of the fuel cell, V N is the single-piece voltage of the fuel cell, and A is a set value. 50mv

[0048] Obtain a plurality of voltage values of the single piece that meets the first condition, and determine whether at least one voltage value in the plurality of voltage values meets a second condition;

[0049] Optionally, the obtaining of the plurality of voltage values of the single piece that meets the first condition includes:

[0050] Check a plurality of detection values of the fuel cell inspection system to obtain a plurality of inspection voltages;

[0051] Obtain the plurality of voltage values of the single piece that meets the first condition from the plurality of inspection voltages.

[0052] Optionally, the plurality of detection values are any five detection values.

[0053] Optionally, the second condition is Vave-V i < B, V i is the single-piece unit that meets the first condition, and B is a set value. 0mv

[0054] If at least one voltage value in the plurality of voltage values meets the second condition, the jump fault of the inspection is determined;

[0055] Shield the single piece with the jump fault of the inspection, and assign the average single-piece voltage of the fuel cell to the single piece with the jump fault of the inspection as the voltage of the single piece with the jump fault of the inspection, the average single-piece voltage being an average of the voltages of the other single pieces except the single piece with the jump fault.

[0056] If the above conditions are not met, the cause of the fault of the fuel cell inspection system needs to be further investigated.

[0057] If Figure 2As shown, the embodiment also discloses a fuel cell inspection system jump fault processing device, comprising:

[0058] A voltage acquisition module is configured to acquire the voltage of each piece of the fuel cell to obtain a plurality of single-piece voltages.

[0059] A voltage comparison module is configured to compare each single-piece voltage with the average voltage to determine whether the first condition is met, wherein the average voltage is the average of all single-piece voltages of the fuel cell.

[0060] An inspection module is configured to acquire the multiple voltage values of the single piece that meets the first condition and determine whether at least one voltage value in the multiple voltage values meets the second condition.

[0061] A determination module is configured to determine that the fuel cell inspection jump fault exists when at least one voltage value in the multiple voltage values meets the second condition.

[0062] An inspection jump fault processing module is configured to shield the single piece of the inspection jump fault and assign the average single-piece voltage of the fuel cell to the single piece of the inspection jump fault as the voltage of the single piece of the inspection jump fault, wherein the average single-piece voltage is the average of the voltages of the other single pieces except the fault single piece.

[0063] The electronic device disclosed in the embodiment includes a memory and a processor. The memory is configured to store non-transitory computer-readable instructions. Specifically, the memory can include one or more computer program products, which can include various forms of computer-readable storage media, such as volatile memory and / or non-volatile memory. The volatile memory may, for example, include random access memory (RAM) and / or cache memory, etc. The non-volatile memory may, for example, include read-only memory (ROM), hard disk, flash memory, etc.

[0064] The processor can be a central processing unit (CPU) or other forms of processing units with data processing capability and / or instruction execution capability, and can control other components in the electronic device to perform desired functions. In one embodiment of the present disclosure, the processor is configured to run the computer-readable instructions stored in the memory, so that the electronic device performs all or part of the steps of the fuel cell inspection system jump fault processing method of the foregoing embodiments of the present disclosure.

[0065] Those skilled in the art should understand that, in order to solve the technical problem of how to obtain a good user experience effect, the embodiment can also include well-known structures such as communication buses, interfaces, etc., which should also be included in the protection scope of the present disclosure.

[0066] As Figure 3A structural schematic of an electronic device is provided according to an embodiment of the present disclosure. It shows a structural schematic of an electronic device suitable for implementing the electronic device in the embodiments of the present disclosure. Figure 3 The electronic device shown is merely an example and should not bring any limitation to the functions and use range of the embodiments of the present disclosure.

[0067] As shown in Figure 3 The electronic device can include a processing device (e.g., a central processing unit, a graphics processing unit, etc.) that can perform various appropriate actions and processes according to programs stored in a read-only memory (ROM) or loaded from a storage device into a random access memory (RAM). In the RAM, various programs and data required for the operation of the electronic device are also stored. The processing device, the ROM, and the RAM are connected to each other through a bus. An input / output (I / O) interface is also connected to the bus.

[0068] Generally, the following devices can be connected to the I / O interface: input devices including, for example, sensors or visual information collection devices, etc.; output devices including, for example, display screens, etc.; storage devices including, for example, magnetic tapes, hard disks, etc.; and communication devices. The communication devices can allow the electronic device to communicate with other devices (such as edge computing devices) wirelessly or by wire to exchange data. Although Figure 3 The electronic device with various devices is shown, but it should be understood that it is not required to implement or have all the devices shown. More or fewer devices can be implemented or provided instead.

[0069] In particular, according to the embodiments of the present disclosure, the processes described above with reference to the flowcharts can be implemented as a computer software program. For example, the embodiments of the present disclosure include a computer program product comprising a computer program carried on a non-transitory computer readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network through the communication device, or installed from the storage device, or installed from the ROM. When the computer program is executed by the processing device, all or part of the steps of the processing method for the fuel cell inspection system jump failure of the fuel cell inspection system jump failure processing method of the embodiments of the present disclosure are performed.

[0070] The detailed description of the present embodiments can refer to the corresponding description in the foregoing embodiments, which will not be repeated here.

[0071] The computer readable storage medium according to the embodiments of the present disclosure has non-transitory computer readable instructions stored thereon. When the non-transitory computer readable instructions are run by a processor, all or part of the steps of the processing method for the fuel cell inspection system jump failure of the fuel cell inspection system jump failure processing method of the embodiments of the present disclosure are performed.

[0072] The computer-readable storage medium described above includes, but is not limited to, an optical storage medium (for example, a CD-ROM and a DVD), a magneto-optical storage medium (for example, an MO), a magnetic storage medium (for example, a magnetic tape or a moving hard disk), a medium having a built-in rewritable nonvolatile memory (for example, a memory card), and a medium having a built-in ROM (for example, a ROM cartridge).

[0073] For detailed description of the present embodiment, reference can be made to the corresponding description in the foregoing embodiments, which will not be repeated here.

[0074] The above describes the basic principles of the present disclosure in combination with specific embodiments, but it should be noted that the advantages, benefits, effects and the like mentioned in the present disclosure are only examples and are not limiting, and these advantages, benefits, effects and the like cannot be considered as necessary for each embodiment of the present disclosure. In addition, the specific details of the above disclosure are only for the purpose of example and for the purpose of understanding, and are not limiting, and the above details do not limit the present disclosure to be necessarily implemented with the above specific details.

[0075] In the present disclosure, the relationship terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between the entities or operations. The block diagrams of devices, apparatuses, equipment, systems involved in the present disclosure are only illustrative examples and are not intended to require or imply the connection, arrangement, configuration shown in the block diagram. As those skilled in the art will recognize, these devices, apparatuses, equipment, systems can be connected, arranged, configured in any manner. Words such as "include", "contain", "have" and the like are open-ended words, which mean "including but not limited to", and can be used interchangeably. The words "or" and "and" used herein mean the word "and / or", and can be used interchangeably unless the context clearly indicates otherwise. The word "such as" used herein means the phrase "such as but not limited to", and can be used interchangeably.

[0076] In addition, as used herein, "or" used in the list of items preceded by "at least one of" means a disjunctive list, such that, for example, a list of "at least one of A, B, or C" means A or B or C, or AB or AC or BC, or ABC (i.e., A and B and C). Furthermore, the word "example" does not mean that the described example is preferred or better than other examples.

[0077] It should also be noted that in the systems and methods of the present disclosure, each component or each step can be decomposed and / or recombined. These decompositions and / or recombinations should be considered as equivalents of the present disclosure.

[0078] Various changes, modifications, and alterations to the techniques described herein can be made without departing from the teachings of the attached claims. Moreover, the scope of the claims of this disclosure is not limited to the particular aspects described above. In addition, where a process, machine, manufacture, composition of matter, means, method, or result containing procedural, business, and other steps is described, it is understood that the description is meant to encompass the specific implementation of the steps described, as well as the substitution of equivalent steps, or equivalent steps in the performance order. Accordingly, the attached claims are to be interpreted as embracing the specific aspects and embodiments described herein, as well as future modifications, changes, and alterations of the aspects and embodiments.

[0079] The above description of the disclosed aspects is given for illustrative purposes only and is not intended to limit the scope of the disclosure. The aspects are described in terms of "preferred" embodiments and various modifications, alterations, and permutations of these preferred embodiments. These descriptions are not exhaustive and are intended to provide further examples. Accordingly, other alternatives, modifications, and variations should be apparent to those skilled in the art.

[0080] The above description has been given for illustrative purposes only and is not intended to limit the embodiments of the disclosure. Although various example aspects and embodiments have been discussed above, those skilled in the art will recognize certain variations, modifications, changes, additions and sub-combinations of the aspects and embodiments.

Claims

1. A method for handling a jump fault of a fuel cell inspection system, characterized by, The method comprises the following steps: acquiring the voltage of each piece of fuel cell to obtain a plurality of single-piece voltages; comparing each single-piece voltage with an average voltage to determine whether a first condition is met, the average voltage being the average of all single-piece voltages of the fuel cell; acquiring a plurality of voltage values of the single piece meeting the first condition, comprising: checking a plurality of detection values of the fuel cell inspection system to obtain a plurality of inspection voltages, the plurality of detection values being any five detection values; In the multi-round inspection voltage, the single piece of multiple voltage values satisfying the first condition is obtained; the first condition is Vave-V N A, Vave is the average voltage of the fuel cell, V N is the single piece voltage of the fuel cell, A is the set value, 50mv determining whether at least one of the plurality of voltage values satisfies a second condition, the second condition being Vave-V i <B, V i for the single cell satisfying the first condition, B is a set value, 0mv < B < 30mv; determining that the inspection fluctuation fault exists if at least one voltage value in the plurality of voltage values meets a second condition; shielding the single piece with the inspection fluctuation fault and assigning the average single-piece voltage of the fuel cell to the single piece with the inspection fluctuation fault as the voltage of the single piece with the inspection fluctuation fault, the average single-piece voltage being the average of the voltages of the other single pieces except the single piece with the fault.

2. A fuel cell inspection system jump failure processing apparatus characterized by comprising: The method comprises the following steps: a voltage acquisition module for acquiring the voltage of each piece of fuel cell to obtain a plurality of single-piece voltages; a voltage comparison module for comparing each single-piece voltage with an average voltage to determine whether a first condition is met, the average voltage being the average of all single-piece voltages of the fuel cell; an inspection module for acquiring a plurality of voltage values of the single piece meeting the first condition, comprising: checking a plurality of detection values of the fuel cell inspection system to obtain a plurality of inspection voltages, the plurality of detection values being any five detection values; In the multi-round inspection voltage, the single piece of multiple voltage values satisfying the first condition is obtained; the first condition is Vave-V N A, Vave is the average voltage of the fuel cell, V N is the single piece voltage of the fuel cell, A is the set value, 50mv determining whether at least one of the plurality of voltage values satisfies a second condition, the second condition being Vave-V i <B, V i for the single cell satisfying the first condition, B is a set value, 0mv < B < 30mv; a determination module for determining that the inspection fluctuation fault exists if at least one voltage value in the plurality of voltage values meets a second condition; an inspection fluctuation fault processing module for shielding the single piece with the inspection fluctuation fault and assigning the average single-piece voltage of the fuel cell to the single piece with the inspection fluctuation fault as the voltage of the single piece with the inspection fluctuation fault, the average single-piece voltage being the average of the voltages of the other single pieces except the single piece with the fault.

3. An electronic device, comprising: The electronic device comprises: at least one processor; and a memory connected to the at least one processor in communication; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the fuel cell inspection system fluctuation fault processing method of claim 1.

4. A computer-readable storage medium, characterized in that, The computer readable storage medium stores computer instructions for causing a computer to perform the fuel cell inspection system fluctuation fault processing method of claim 1.

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