A method, device and system for determining element information

Abstract

The application discloses a kind of element information determination method, determination device and determination system.Element information determination method, determination device and determination system are disclosed in the application.Based on the first substance and the second substance contact electrification produces radiation, the corresponding contact electrification interface spectrum can be obtained by collecting the radiation, the kind of element that the first substance and the second substance can exist at contact interface can be determined by the spectrum, so as to determine the composition of the first substance and the second substance;At the same time, since the first substance and the second substance only contact, the material state of the first substance and the second substance is not changed, and other energy is not applied to the first substance and the second substance, so that nondestructive testing is realized when the element is detected, without destroying the structure and electronic state information of the substance, and the original structure of the tested substance is completely protected.Therefore, the method is simple, low in cost and easy to operate, and has strong operability, greatly reducing the requirement for operators.

Description

[0001] The present application claims priority to the Chinese patent application No. 202111110956.3, filed on September 18, 2021, and entitled "A method for characterizing the elemental composition, valence state and electronic state of a material surface", the entire contents of which are incorporated herein by reference. TECHNICAL FIELD

[0002] The present application relates to the technical field of material determination, and in particular to a method, device and system for determining elemental information. BACKGROUND

[0003] Currently, the main methods for determining elemental information include atomic absorption spectroscopy, atomic emission spectroscopy, X-ray fluorescence spectroscopy, and X-ray energy spectrum analysis. Among them, atomic absorption spectroscopy and atomic emission spectroscopy can detect the elemental composition of a material, but they need to change the material into a gaseous state for detection. In most cases, changing the state of the material will destroy important information such as the original valence state and electronic state, causing damage to the material itself. X-ray fluorescence spectroscopy and X-ray energy spectrum analysis are non-destructive analysis methods, but due to the influence of the atomic nucleus scattering cross section, they cannot detect light elements such as hydrogen. In addition, X-ray detection requires a high-voltage X-ray source and appropriate X-ray protection measures, which is costly and complex. SUMMARY

[0004] The present application provides a method, device and system for determining elemental information, which can determine elemental information non-destructively.

[0005] In a first aspect, the present application provides a method for determining elemental information, comprising:

[0006] When a first material and a second material come into contact and produce radiation, obtaining a contact-induced interfacial spectrum corresponding to the radiation;

[0007] According to the contact-induced interfacial spectrum, determining the types of elements present in the contact interface of the first material and the second material.

[0008] In a second aspect, the present application provides a device for determining elemental information, comprising:

[0009] A memory for storing program instructions;

[0010] A processor for calling the program instructions stored in the memory and executing the above-mentioned determination method according to the obtained program.

[0011] In a third aspect, the embodiments of the present application provide a system for determining element information, comprising the determining device and a radiation detection device.

[0012] The radiation detection device is configured to receive the radiation and determine a contact-induced electric interface spectrum when the first substance and the second substance are in contact and generate the radiation, and send the contact-induced electric interface spectrum to the determining device.

[0013] The determining device is configured to determine the element information at the contact interface of the first substance and the second substance according to the received contact-induced electric interface spectrum.

[0014] The present application has the following advantages:

[0015] The embodiments of the present application provide a method, a device and a system for determining element information. The radiation generated by the contact-induced electricity of the first substance and the second substance can be collected to obtain a corresponding contact-induced electric interface spectrum. The types of elements possibly existing at the contact interface of the first substance and the second substance can be determined through the spectrum, so as to determine the components of the first substance and the second substance. Meanwhile, since the first substance and the second substance are only in contact, the substance states of the first substance and the second substance are not changed, and no other energy is applied to the first substance and the second substance, so that the non-destructive detection is realized when the element is detected, and the structure and the electronic state of the substance are not damaged, and the original structure of the tested substance is completely protected. Therefore, the method has the advantages of simple sample preparation, low cost, simple operation and strong operability, and greatly reduces the requirements for the operator. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 A flowchart of the method for determining element information provided in the embodiments of the present application;

[0017] Figure 2 A schematic diagram of the contact-induced electric interface spectrum provided in the embodiments of the present application;

[0018] Figure 3 A schematic diagram of the contact-induced electric photon radiation provided in the embodiments of the present application;

[0019] Figure 4 A schematic diagram of the electronic transition path provided in the embodiments of the present application;

[0020] Figure 5 A schematic diagram of the energy level provided in the embodiments of the present application;

[0021] Figure 6 A comparison diagram of the characteristic peaks in different spectra provided in the embodiments of the present application;

[0022] Figure 7 Fig. 1 is a structural schematic diagram of an element information determination device provided in an embodiment of the present application;

[0023] Figure 8 Fig. 2 is a structural schematic diagram of an element information determination system provided in an embodiment of the present application. DETAILED DESCRIPTION

[0024] The specific embodiments of the element information determination method, the element information determination device and the element information determination system provided in the embodiments of the present application will be described in detail below with reference to the accompanying drawings. It should be noted that the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0025] The element information determination method provided in the embodiments of the present application can include the following steps. Figure 1

[0026] S101, when a first substance and a second substance are in contact and produce radiation, obtaining a contact electrodynamic interface spectrum corresponding to the radiation;

[0027] In the obtained contact electrodynamic interface spectrum, the abscissa can be wavelength, and the ordinate can be intensity, as shown in Fig. 1. Figure 2 Figure 2 In the formula, "wavelength" represents wavelength, and "intensity" represents intensity.

[0028] S102, determining the type of element existing in the first substance and the second substance at the contact interface of the first substance and the second substance according to the contact electrodynamic interface spectrum.

[0029] Based on the radiation produced by the contact electrodynamic of the first substance and the second substance, the corresponding contact electrodynamic interface spectrum can be obtained by collecting the radiation, and the type of element possibly existing at the contact interface of the first substance and the second substance can be determined through the spectrum, so as to determine the composition of the first substance and the second substance.

[0030] It should be emphasized here that the embodiments of the present application are directed to the element information existing at the contact interface of the substance, rather than the element information inside the substance or on the whole substance, so that effective research means can be provided for the performance research of the contact interface of the substance.

[0031] ​​And, since the first substance and the second substance are only in contact, the substance state of the first substance and the second substance is not changed, and no other energy acts on the first substance and the second substance, so that the nondestructive detection is realized when the element detection is performed, the information such as the structure and the electronic state of the tested substance is not damaged, and the original structure of the tested substance is completely protected.

[0032] Therefore, the method has simple sample preparation, low cost, simple operation and strong operability, and greatly reduces the requirement on the operator.

[0033] It should be noted that the determination method is not affected by the atomic nucleus scattering cross section like X-rays, and cannot detect light elements such as hydrogen. The determination method can detect any element, including light elements such as hydrogen. Therefore, the range of elements that can be detected by the determination method is wider.

[0034] Optionally, in the embodiment of the present application, the first substance is a solid, a liquid or a gas.

[0035] The second substance is a solid, a liquid or a gas.

[0036] That is, in the embodiment of the present application, the contact interface can be a solid-solid interface, a solid-liquid interface, a solid-gas interface, a liquid-liquid interface, a liquid-gas interface, and a gas-gas interface.

[0037] Optionally, in the embodiment of the present application, the first substance and the second substance can be the same substance or different substances, which can be set according to actual needs, and are not limited herein.

[0038] Optionally, in the embodiment of the present application, the radiation includes at least one of the following: photon radiation, Auger radiation, X-ray radiation and electron radiation.

[0039] It should be noted that when the first substance and the second substance are in contact, the types of radiation generated can include multiple types, and among the multiple types of radiation, the intensity of one type of radiation is relatively strong, and the intensity of the other types of radiation is relatively weak, so that the contact interface spectrum obtained is the spectrum of the type of radiation with relatively strong intensity.

[0040] For example, when the first substance and the second substance are in contact, it is assumed that the types of radiation generated include photon radiation and Auger radiation, and the intensity of the photon radiation is greater than that of the Auger radiation. At this time, the corresponding contact interface spectrum obtained is a photon spectrum (which can be referred to as a spectrum).

[0041] The photon radiation in the tribocharging process has the characteristic of atomic spectral line, which is different from the air breakdown spectrum and the continuous spectrum caused by friction heating or fluorescence, so it can be called tribocharging interface spectroscopy. On this basis, the spectroscopy containing Auger radiation, X-ray and even electron emission can be called tribocharging interface spectroscopy.

[0042] The principle of radiation generated in contact is described below.

[0043] When two substances (denoted as substance 1 and substance 2) are in contact at the contact interface, atoms A in substance 1 and atoms B in substance 2 are close due to contact. When the two atoms are in the repulsive force region, the potential barrier between them will be reduced due to the strong overlap of the electron wave function. During this period, some electrons will be temporarily in an excited state.

[0044] If the energy level of the excited state in atom A is close to that of another excited state in atom B, the electron can transfer to the excited state of the other atom (such as from atom A to atom B) through energy resonance, so that one of the substances is positively charged and the other is negatively charged, as shown in FIG. 1. Figure 3

[0045] Then, the electron transferred from atom A to atom B can jump to a lower energy level in atom B, and this jump process can be accompanied by energy loss and emitted in the form of photon radiation, Auger radiation, X-ray and / or electron emission, as shown in FIG. 2. Figure 4

[0046] In FIG. 3, the vacuum level represents the vacuum energy level, and the molecular orbit represents the molecular orbit. In FIG. 4 and FIG. 5, Figure 4 Figure 3 Figure 4 represents the energy radiated outward, such as photons, Auger electrons, X-rays or electrons.

[0047] Therefore, the corresponding spectrum (i.e., the tribocharging interface spectrum) can be obtained by using the emitted radiation, and based on the spectrum, the element distribution of the substance at the contact interface can be determined.

[0048] Optionally, in the embodiment of the present application, it further comprises:

[0049] When the first substance is an unknown substance, the second substance is a known substance, and it is determined that the determined type of the element includes the type of the element in the known substance, the known substance is replaced, and a new tribocharging interface spectrum is obtained;

[0050] ​​​​​determine the element species existing at the contact interface of the unknown substance based on the new contact electrification interface spectrum;

[0051] The new contact electrification interface spectrum is a spectrum obtained when the unknown substance contacts the replaced known substance and generates radiation.

[0052] Since the element determined based on the first spectrum may exist in the contact interface of the first substance or the contact interface of the second substance, the element species existing at the contact interface of the unknown substance can be further determined through the above process, so that the composition of the unknown substance can be more accurately determined.

[0053] The following is an example.

[0054] Suppose the first substance is an unknown substance, the second substance is metal gold, and suppose that the element species existing in the spectrum obtained when the two substances contact include: carbon element (i.e. C), hydrogen element (i.e. H), oxygen element (i.e. O), and gold element (i.e. Au), then:

[0055] It can be determined that the elements that may exist in the contact interface of the first substance include C, H, O and Au, and although the unknown substance is in contact with Au, it does not mean that the unknown substance does not contain Au at the contact interface, so further determination is needed:

[0056] At this time, the second substance can be replaced with metal copper (i.e. Cu), and the unknown substance continues to contact Cu, and a corresponding spectrum (as a new spectrum) is obtained;

[0057] If the element species determined from the new spectrum includes C, H, O and Cu, it can be concluded that the unknown substance does not include Au at the contact interface;

[0058] Therefore, based on the above analysis process, it can be determined that the element species existing at the contact interface of the unknown substance includes C, H and O.

[0059] Of course, the above mentioned is the case where one of the first substance and the second substance is a known substance, if the first substance and the second substance are both unknown substances, the first substance and the second substance can be respectively contacted with a known substance to generate electricity, so as to respectively determine the element species existing at the contact interface of the first substance and the second substance.

[0060] Optionally, in the embodiment of the present application, it further comprises:

[0061] According to the contact electrification interface spectrum, the valence state of the element existing at the contact interface of the first substance and the second substance is determined.

[0062] For example, in combination with the above-mentioned example in which the first substance is FEP and the second substance is acrylic, the characteristic peaks of 715nm and 844nm of the oxygen element are as follows: Figure 2

[0063] The characteristic peak of 715nm corresponds to the radiation generated when the electron jumps from 2s 2 2p 3 ( 2 D)3p 1 D energy level to 2s 2 2p 3 ( 2 D)3s 1 D energy level;

[0064] The characteristic peak of 844nm corresponds to the radiation generated when the electron jumps from 2s 2 2p 3 ( 4 S)3p 3 P energy level to 2s 2 2p 3 ( 4 S)3s 3 S energy level;

[0065] 2s 2 2p 3 ( 2 D)3p 1 D energy level corresponds to O + , and 2s 2 2p 3 ( 4 S)3s 3 S energy level corresponds to neutral O atom;

[0066] Since FEP only contains C and F (i.e. fluorine element), it can be inferred that the valence state of the oxygen element existing at the contact interface of acrylic is O+ and neutral O atom.

[0067] In this way, the valence state of the element existing in the first substance and the second substance at the contact interface can be determined, so that the composition of the first substance and the second substance at the contact interface can be further determined.

[0068] Optionally, in the embodiments of the present application, further comprising:

[0069] According to the contact electrification interface spectrum, the transition path of the electron between the first substance and the second substance at the contact interface and the corresponding energy level in the transition path are determined.

[0070] For example, in combination with the above-mentioned example in which the first substance is FEP and the second substance is acrylic, the characteristic peaks of 715nm and 844nm of the oxygen element are as follows: Figure 5 ​As shown, let's continue to take the example where the first material is FEP and the second material is acrylic;

[0071] Since the 2s 2 2p 4 ( 3 P)3d 2 The F energy level is closer to the n=3 energy level in the H atom, so electrons can transfer between these two energy levels;

[0072] Combine Figure 2 As shown in , a characteristic peak of 656 nm was detected, and the photon radiation generated by the transition from the n=3 energy level to the n=2 energy level is 656 nm. Therefore, by detecting the characteristic peak of 656 nm, it can be determined that an electron transition from the n=3 energy level to the n=2 energy level has occurred.

[0073] In addition, after FEP and acrylic come into contact, FEP is negatively charged at the contact interface, while acrylic is positively charged at the contact interface. 2 2p 4 ( 3 P)3d 2 The F energy level is close to the n=3 energy level in the H atom, so it can be determined that the electron jumps from the n=3 energy level to the 2s 2 2p 4 ( 3 P)3d 2 F energy level. Since the characteristic peak at 782nm was detected, the 2 2p 4 ( 3 P)3d 2 F level transition to 2s 2 2p 4 ( 3 P)3P 4 The photon radiation generated by the P energy level is 782nm, so it can be further determined that the electron is emitted from the 2s 2 2p 4 ( 3 P)3d 2 F level transition to 2s 2 2p 4 ( 3 P)3P 4 P energy level;

[0074] That is, the electron first jumps from the n=3 energy level to the 2s 2 2p 4 ( 3 P)3d 2 F level, and then jump to 2s 2 2p 4 ( 3 P)3P4 P energy level.

[0075] wherein, in Figure 5 Vacuum level, F represents fluorine, and H represents hydrogen.

[0076] In this way, the path and the corresponding energy level of the electron transition between the first substance and the second substance at the contact interface can be determined, and effective data reference for the research on the properties of the substances themselves is provided.

[0077] Optionally, in the embodiments of the present application, the method further comprises:

[0078] When the contact electrification interface spectrum corresponding to the contact between the first substance and the second substance is defined as a first spectrum, the contact interface between the first substance and the second substance is defined as a first interface, the contact electrification interface spectrum corresponding to the contact between the first substance and the third substance is defined as a second spectrum, the contact interface between the first substance and the third substance is defined as a second interface, and any element existing in both the first spectrum and the second spectrum is defined as a reference element, the size relationship between the content of the reference element at the first interface and at the second interface is determined according to the first spectrum and the second spectrum.

[0079] In this way, when the method is applied to the field of friction generators, the material selection for contact electrification can be theoretically provided with reference, so that the performance of the friction generator can be improved.

[0080] Optionally, in the embodiments of the present application, the size relationship between the content of the reference element at the first interface and at the second interface is determined according to the first spectrum and the second spectrum, and specifically comprises:

[0081] selecting any characteristic peak of the reference element existing in both the first spectrum and the second spectrum;

[0082] determining the first intensity of the characteristic peak in the first spectrum and the second intensity of the characteristic peak in the second spectrum;

[0083] determining the first slit width when the first spectrum is acquired and the second slit width when the second spectrum is acquired;

[0084] determining the intensity ratio of the characteristic peak corresponding to the first interface to the characteristic peak corresponding to the second interface according to the first intensity, the second intensity, the first slit width, and the second slit width;

[0085] determining the size relationship between the content of the reference element at the first interface and at the second interface according to the corresponding relationship between the intensity ratio and the element content determined in advance.

[0086] It should be noted that the experimental conditions are the same when the first substance and the second substance contact to generate radiation and when the first substance and the third substance contact to generate radiation, so as to avoid interference caused by experimental conditions.

[0087] Optionally, in the embodiment of the present application, when the hydrogen element exists in both the first spectrum and the second spectrum, the reference element is the hydrogen element.

[0088] The following is an example.

[0089] Taking the first substance as FEP, the second substance as acrylic, and the third substance as quartz as an example.

[0090] Under the same experimental conditions, the contact electrification interface spectrum corresponding to the contact between FEP and acrylic (denoted as the first spectrum) and the contact electrification interface spectrum corresponding to the contact between FEP and quartz (denoted as the second spectrum) are obtained, wherein the first spectrum and the second spectrum both include H atoms and both include a characteristic peak at 656 nm, and at this time, H can be taken as the reference element.

[0091] Combining Figure 6 As shown in the figure, two characteristic peaks are shown, which are the characteristic peak at 656 nm in the first spectrum (denoted as characteristic peak S1) and the characteristic peak at 656 nm in the second spectrum (denoted as characteristic peak S2); wherein, in Figure 6 In the figure, “wavelength” represents wavelength, and “intensity” represents intensity.

[0092] The intensity of characteristic peak S1 is 451355, the slit width during detection is 100 μm, the intensity of characteristic peak S2 is 19374, and the slit width during detection is 350 μm.

[0093] If the intensity of the slit width of 100 μm during detection is half of the intensity of the slit width of 350 μm, then the intensity ratio of characteristic peak S2 to characteristic peak S1 is about 2% (wherein 19374 / (451355*2)*100% = 2%).

[0094] If there is a certain corresponding relationship between the intensity ratio and the element content, the intensity ratio determined can be used to determine the size relationship of the content of H at the first interface (i.e., the contact interface between FEP and acrylic) and the second interface (i.e., the contact interface between FEP and quartz).

[0095] The corresponding relationship between the intensity ratio and the element content can be determined based on the following manner:

[0096] Taking the first substance as FEP, the second substance as acrylic, and the third substance as quartz as an example.

[0097] In this quartz sample, according to the results of China Quartz Glass Quality Supervision and Inspection Center, OH in 1g quartz - The content is 148.2×10 -6 g, equivalent to about 5×10 19 H atoms. According to the molecular formula of acrylic, 1 mol of acrylic contains 8×10 21 H atoms;

[0098] At this point, it can be determined that: at the interface, the ratio of H atoms in quartz and acrylic is about 2%;

[0099] Combined with the above-obtained intensity ratio of 2%, it can be determined that the intensity of the 656nm spectral line (i.e., the characteristic peak) is proportional to the content of H atoms at the interface;

[0100] That is, the greater the intensity of the characteristic peak, the higher the H content at the interface, and the smaller the intensity of the characteristic peak, the lower the H content at the interface.

[0101] Therefore, based on the above process, by comparing the intensity of the characteristic peaks, the relationship between the content of elements at different interfaces can be determined, providing a basis for the selection of materials for the friction generator.

[0102] For example, the intensity ratio of characteristic peak S1 to characteristic peak S2 is approximately 2%, meaning the intensity of the characteristic peak corresponding to the contact between FEP and acrylic is greater than the intensity of the characteristic peak corresponding to the contact between FEP and quartz. Therefore, acrylic has a higher content of H atoms at the interface, which allows more electrons to be transferred to FEP. If the application field of triboelectric generators desires greater charge transfer under the same external conditions, then choosing to rub acrylic and FEP can achieve better energy collection and energy conversion effects.

[0103] Based on the same inventive concept, an embodiment of the present invention provides a device for determining element information. The implementation principle of the determination device is similar to the implementation principle of the aforementioned method for determining element information. The specific implementation method of the determination device can be found in the specific embodiment of the aforementioned determination method, and the repeated parts will not be repeated.

[0104] Specifically, an embodiment of the present invention provides a device for determining element information, such as Figure 7 As shown, this may include:

[0105] Memory 701, used for storing program instructions;

[0106] The processor 702 is configured to call the program instructions stored in the memory 701 and execute the above-mentioned determination method provided in the embodiment of the present invention according to the obtained program.

[0107] Based on the same inventive concept, the embodiment of the present application provides a system for determining element information, which comprises the above-mentioned determining device 801 and a radiation detection device 802. Figure 8 As shown in the figure, the system comprises the above-mentioned determining device 801 provided by the embodiment of the present application and a radiation detection device 802.

[0108] The radiation detection device 802 is configured to receive radiation generated when the first substance and the second substance come into contact and determine a contact-induced electrical interface spectrum, and send the contact-induced electrical interface spectrum to the determining device 801.

[0109] The determining device 801 is configured to determine element information at the contact interface of the first substance and the second substance according to the received contact-induced electrical interface spectrum.

[0110] Optionally, in the embodiment of the present application, the specific structure of the radiation detection device is not limited herein, as long as the structure can detect the radiation generated when the first substance and the second substance come into contact and give the corresponding spectrum, which belongs to the protection scope of the embodiment of the present application.

[0111] It is emphasized that the above-mentioned technical solution provided by the embodiment of the present application has the following advantages:

[0112] The present application provides a method for characterizing the elemental composition, valence state and electronic state of the surface of a substance from the basic physics, which is not only non-destructive to the sample, does not destroy the material structure and electronic state information of the sample, but also has the advantages of simple sample preparation, low cost, simple operation and detection of light elements (such as hydrogen).

[0113] The present application uses the radiation spectrum information caused by electron transfer during the contact-induced electrification of two substances, and through comparison with standard spectrum lines, the following information can be obtained:

[0114] (1) the types of elements that may exist on the surface of the substance, which can identify elements as low as hydrogen in the periodic table;

[0115] (2) the valence state of the elements that may exist on the surface of the substance;

[0116] (3) the path of electron transition between substances and the corresponding energy level during contact-induced electrification;

[0117] (4) the content of elements at different interfaces can be quantitatively distinguished by comparing the peak intensities of the spectrum lines (i.e. the intensity ratio of the characteristic peaks mentioned in the foregoing content);

[0118] (5) the contact-induced electrification mechanism of the substance is studied, which promotes the selection and improvement of materials in the application field of the friction generator.

[0119] It will be apparent to those skilled in the art that various modifications and variations can be made to the present application without departing from the spirit or scope of the application. Thus, it is intended that the present application cover modifications and variations of this application provided they come within the scope of the appended claims and their equivalents.

Claims

1. A method of determining element information, characterized by, The method comprises the following steps: When the first substance and the second substance are in contact and radiation is generated, a contact-induced electric interface spectrum of the radiation is obtained; According to the contact-induced electric interface spectrum, the type of element present in the first substance and the second substance at the contact interface of the first substance and the second substance is determined; The type of element determined by the determination method includes a light element, and the light element includes a hydrogen element; the determination method does not destroy the substance state, substance structure and electronic state of the first substance and the second substance; The determination method is a non-destructive testing method; The determination method further comprises the following steps: When the contact-induced electric interface spectrum corresponding to the contact of the first substance and the second substance is defined as a first spectrum, the contact interface of the first substance and the second substance is defined as a first interface, the contact-induced electric interface spectrum corresponding to the contact of the first substance and a third substance is defined as a second spectrum, the contact interface of the first substance and the third substance is defined as a second interface, and any element present in both the first spectrum and the second spectrum is defined as a reference element, the content of the reference element at the first interface and at the second interface is determined according to the first spectrum and the second spectrum; According to the first spectrum and the second spectrum, the content of the reference element at the first interface and at the second interface is determined, which specifically comprises the following steps: Selecting any characteristic peak of the reference element present in both the first spectrum and the second spectrum; Determining the first intensity of the characteristic peak in the first spectrum and the second intensity of the characteristic peak in the second spectrum; Determining the first slit width when the first spectrum is obtained and the second slit width when the second spectrum is obtained; According to the first intensity, the second intensity, the first slit width and the second slit width, the intensity ratio of the characteristic peak corresponding to the first interface to the characteristic peak corresponding to the second interface is determined; According to the predetermined corresponding relationship between the intensity ratio and the content of the element, the content of the reference element at the first interface and at the second interface is determined.

2. The determination method of claim 1, wherein, Further comprising: According to the contact-induced electric interface spectrum, the valence state of the element present in the first substance and the second substance at the contact interface is determined.

3. The determination method of claim 1, wherein, Further comprising: According to the contact-induced electric interface spectrum, the transition path of electrons between the first substance and the second substance at the contact interface and the corresponding energy level in the transition path are determined.

4. The determination method of claim 1, wherein, When the hydrogen element is present in both the first spectrum and the second spectrum, the reference element is the hydrogen element.

5. The determination method of claim 1, wherein, Further comprising: When the first substance is an unknown substance, the second substance is a known substance, and it is determined that the type of element determined includes the type of element in the known substance, the known substance is replaced, and a new contact-induced electric interface spectrum is obtained; Based on the new contact-induced electric interface spectrum, the type of element present in the unknown substance at the contact interface is determined. The new contact electrification interface spectrum is a spectrum obtained when the unknown substance contacts the replaced known substance and generates radiation.

6. The determination method according to any one of claims 1 to 5, characterized in that, The radiation includes at least one of a photon radiation, an Auger radiation, an X-ray radiation, and an electron radiation.

7. The determination method according to any one of claims 1 to 5, characterized in that, The first substance is a solid, a liquid, or a gas. The second substance is a solid, a liquid, or a gas.

8. An element information determination apparatus characterized by comprising: The method comprises the following steps: a memory for storing program instructions; a processor for calling the program instructions stored in the memory to execute the determination method according to any one of claims 1-7.

9. An element information determination system characterized by comprising: The method comprises the following steps: The determination device and a radiation detection device according to claim 8; The radiation detection device is configured to receive the radiation and determine a corresponding contact electrification interface spectrum when the first substance and the second substance contact and generate radiation, and send the contact electrification interface spectrum to the determination device. The determination device is configured to determine element information at a contact interface of the first substance and the second substance according to the received contact electrification interface spectrum.

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