Focusing method of microscopic imaging device, microscopic imaging device and storage medium

Abstract

The application provides a focusing method of a microscopic imaging device, the microscopic imaging device, a system and a computer readable storage medium. The method comprises the following steps: obtaining a target curve function, the target curve function is used to indicate the corresponding relationship between the horizontal displacement information of the microscopic imaging device on a preset plane and the distance between the microscopic imaging device and a target object, and the preset plane is parallel to the plane where the target object is located; determining target horizontal displacement information of the microscopic imaging device on the preset plane; determining the target distance between the microscopic imaging device and the target object corresponding to the target horizontal displacement information based on the target curve function; determining the target position of the microscopic imaging device according to the target horizontal displacement information and the target distance; and obtaining an image taken by the microscopic imaging device at the target position. The application can improve the focusing real-time performance and accuracy of microscopic imaging.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of automatic control, and in particular to a focusing method of a microscopic imaging device, the microscopic imaging device, the system and the computer readable storage medium. BACKGROUND

[0002] The depth of field of the lens in the microscopic imaging system is very small, and the distance from the lens to the product needs to be strictly controlled within the preset distance threshold. When different products in a product line are imaged, the height of the image acquisition device needs to be adjusted in real time. At present, most image acquisition devices cannot focus in real time, and there is a delay, which leads to insufficient image clarity. SUMMARY

[0003] The main purpose of the present application is to provide a focusing method of a microscopic imaging device, the microscopic imaging device, the system and the computer readable storage medium, which aims to improve the accuracy of focusing of the microscopic imaging device.

[0004] In a first aspect, the present application provides a focusing method of a microscopic imaging device, which comprises the following steps:

[0005] Obtaining a target curve function, the target curve function is used to indicate the corresponding relationship between the horizontal displacement information of the microscopic imaging device on a preset plane and the distance between the microscopic imaging device and a target object, and the preset plane is parallel to the plane where the target object is located;

[0006] Determining the target horizontal displacement information of the microscopic imaging device on the preset plane;

[0007] Based on the target curve function, determining the target distance between the microscopic imaging device and the target object corresponding to the target horizontal displacement information;

[0008] According to the target horizontal displacement information and the target distance, determining the target position of the microscopic imaging device, and obtaining the image taken by the microscopic imaging device at the target position.

[0009] In a second aspect, the present application further provides a microscopic imaging device, which is provided with a ranging device; the microscopic imaging device is used to acquire images; the ranging device is used to measure the distance between the microscopic imaging device and a target object; so as to determine the target position of the microscopic imaging device, thereby being able to acquire the image taken by the microscopic imaging device at the target position.

[0010] In a third aspect, the present application also provides a microscopic imaging system, comprising a microscopic imaging device, a processor, a memory, and a computer program stored in the memory and executable by the processor, wherein the computer program, when executed by the processor, implements the steps of the focusing method of the microscopic imaging device as described above.

[0011] In a fourth aspect, the present application also provides a computer readable storage medium, having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the focusing method of the microscopic imaging device as described above.

[0012] The present application provides a focusing method of a microscopic imaging device, a microscopic imaging device, a microscopic imaging system, and a computer readable storage medium. The present application obtains a target curve function, the target curve function being used to indicate a corresponding relationship between horizontal displacement information of a microscopic imaging device on a preset plane and a target distance between the microscopic imaging device and a target object, the preset plane being parallel to a plane on which the target object is located; determines target horizontal displacement information of the microscopic imaging device on the preset plane; determines, based on the target curve function, a target distance between the microscopic imaging device and the target object corresponding to the target horizontal displacement information; determines a target position of the microscopic imaging device according to the target horizontal displacement information and the target distance; and obtains an image captured by the microscopic imaging device at the target position. The target distance between the microscopic imaging device and the target object can be determined during movement of the microscopic imaging device according to the target horizontal displacement information, so that the position of the microscopic imaging device can be adjusted in advance, the microscopic imaging device can capture an image at the target position, the focusing accuracy of the microscopic imaging device is effectively improved, and the situation that an image captured due to a focusing delay is not clear is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0013] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0014] Figure 1 A flowchart of a focusing method of a microscopic imaging device provided by the embodiments of the present application is shown in the figure.

[0015] Figure 2 A structural diagram of a microscopic imaging device provided by the embodiments of the present application is shown in the figure.

[0016] Figure 3 A schematic block diagram of a microscopic imaging system provided by the embodiments of the present application is shown in the figure. DETAILED DESCRIPTION

[0017] The technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of the present application.

[0018] The flow chart shown in the drawings is only an example and does not necessarily include all the contents and operations / steps, nor does it have to be executed in the order described. For example, some operations / steps can be further decomposed, combined or partially merged, so that the actual execution order can be changed according to the actual situation.

[0019] The embodiments of the present application provide a focusing method of a microscopic imaging device, a microscopic imaging device, a microscopic imaging system and a computer readable storage medium. The focusing method of the microscopic imaging system can be applied to the microscopic imaging device and / or the microscopic imaging system.

[0020] Some embodiments of the present application will be described in detail below with reference to the drawings. The following embodiments and features in the embodiments can be combined with each other without conflict.

[0021] Please refer to Figure 1 , Figure 1 A flow chart of a focusing method of a microscopic imaging device provided by the embodiments of the present application is shown.

[0022] As Figure 1 shown, the focusing method of the microscopic imaging device includes steps S101 to S104.

[0023] Step S101, obtaining a target curve function, the target curve function is used to indicate the corresponding relationship between the horizontal displacement information of the microscopic imaging device on a preset plane and the distance between the microscopic imaging device and a target object, and the preset plane is parallel to the plane where the target object is located.

[0024] For example, the target curve function can include one of a linear function, a logarithmic curve function, a parabolic function or other curve functions, which are not limited by the present application. It can be understood that the target curve function is used to indicate the corresponding relationship between the horizontal displacement information of the microscopic imaging device on a preset plane and the distance between the microscopic imaging device and a target object, and the preset plane is parallel to the plane where the target object is located.

[0025] For example, the horizontal displacement information of the microscopic imaging device on the preset plane is represented by x, and the distance between the microscopic imaging device and the target object is represented by z. When the target curve function is a linear function, the target curve function can be, for example, z=ax, where a is a constant.

[0026] For example, the target object can be placed on a horizontal plane, and the plane on which the microscopic imaging device moves is parallel to the plane on which the target object is placed, so that the microscopic imaging device can take a picture of the target object.

[0027] For example, in a pipeline scene, a plurality of objects are placed on a horizontal plane, and the microscopic imaging device is perpendicular to the horizontal plane and can move horizontally on a preset plane parallel to the horizontal plane, so that the microscopic imaging device can take a picture of the object.

[0028] In step S102, the target horizontal displacement information of the microscopic imaging device on the preset plane is determined.

[0029] For example, the microscopic imaging device can move horizontally on the preset plane to take a picture of an adjacent object, for example, after completing the picture taking of the current object, the microscopic imaging device is horizontally displaced by 10 mm to the next object and takes a picture of the object.

[0030] It can be understood that during the movement, the microscopic imaging device generally moves horizontally, and before reaching the corresponding position of the object, the distance between the microscopic imaging device and the object can be pre-adjusted to adjust the focus of the microscopic imaging device, so that the adjustment of the focus is completed when the microscopic imaging device reaches the corresponding position of the object, thereby avoiding the delay of the picture taking and improving the accuracy of the focus.

[0031] In some embodiments, determining the target horizontal displacement information of the microscopic imaging device on the preset plane comprises: determining the target horizontal displacement information in response to input information of a user.

[0032] For example, the horizontal movement speed of the microscopic imaging device can be preset, and the target horizontal displacement information can also be preset. The target horizontal displacement information can be determined by input information input by a worker in advance. Specifically, the movement of the microscopic imaging device can be realized by a servo motor, and the worker can input control information to the servo motor to enable the servo motor to control the horizontal movement of the microscopic imaging device.

[0033] Exemplarily, the target horizontal displacement information can be used to indicate a distance that the microscopic imaging device needs to horizontally displace, and the target horizontal displacement information and the target curve function can be used to predict an optimal position of the microscopic imaging device for photographing at a position where the target object is located, the optimal position being used to indicate an optimal focusing position of the microscopic imaging device for photographing the target object.

[0034] In step S103, the target distance of the microscopic imaging device from the target object corresponding to the target horizontal displacement information is determined based on the target curve function.

[0035] Exemplarily, the target horizontal displacement information can be input into the target curve function to obtain the target distance of the microscopic imaging device from the target object.

[0036] For example, the target curve function is z=ax, if a is 2, and the target distance can be 10 mm when the horizontal displacement information is 5 mm, that is, the microscopic imaging device needs to be located at a position 10 mm away from the target object to complete photographing. After the target distance is calculated, the height of the microscopic imaging device can be adjusted during the horizontal movement of the microscopic imaging device, for example, the adjustment can be started when the microscopic imaging device moves to 3 mm, so that the microscopic imaging device is already 10 mm away from the plane where the target object is located before moving to 5 mm, thereby completing the pre-adjustment. When the microscopic imaging device is located above the target object, photographing can be performed without further adjusting the distance between the microscopic imaging device and the target object.

[0037] In step S104, the target position of the microscopic imaging device is determined according to the target horizontal displacement information and the target distance, and an image photographed by the microscopic imaging device at the target position is obtained.

[0038] Exemplarily, the target position of the microscopic imaging device can be determined according to the target horizontal displacement information and the target distance, and an image photographed by the microscopic imaging device at the target position is obtained.

[0039] Exemplarily, the target horizontal displacement information is used to indicate the horizontal movement distance of the microscopic imaging device, and the target distance is used to indicate the distance between the microscopic imaging device and the plane where the target object is located. It can be understood that the distance between the microscopic imaging device and the plane where the target object is located is too large or too small, which will cause the image photographed by the microscopic imaging device to be out of focus. Therefore, the accuracy of focusing of the microscopic imaging device can be improved by determining the target distance.

[0040] And the distance between the micro-imaging device and the plane where the target object is located can be adjusted to the target distance during the horizontal movement of the micro-imaging device, so that after the micro-imaging device completes the horizontal movement, the distance between the micro-imaging device and the plane where the target object is located has already been the target distance, and there is no need to adjust the distance between the micro-imaging device and the target object again at this time, thereby improving the real-time focusing of the micro-imaging device and avoiding the occurrence of a delay.

[0041] Specifically, the micro-imaging device can be controlled by an x-axis servo motor and a z-axis servo motor. It can be understood that the x-axis servo motor is used to control the horizontal movement of the micro-imaging device, and the z-axis servo motor is used to control the distance between the micro-imaging device and the plane where the target object is located. In the above embodiment, the x-axis servo motor controls the horizontal movement of the micro-imaging device according to the target horizontal displacement information, and because the target distance is determined based on the target curve function, during the process in which the x-axis servo motor controls the horizontal movement of the micro-imaging device according to the target horizontal displacement information, the z-axis servo motor can adjust the distance between the micro-imaging device and the plane where the target object is located to the target distance, so that after the x-axis servo motor completes the control of the horizontal movement of the micro-imaging device, the z-axis servo motor does not need to adjust the distance again, that is, when the x-axis servo motor completes the control of the horizontal movement of the micro-imaging device, the micro-imaging device has already been at the target position, and the image captured by the micro-imaging device at the target position can be obtained, thereby improving the real-time focusing and accuracy of the micro-imaging device.

[0042] In some embodiments, the focusing method of the micro-imaging device further includes: obtaining historical horizontal displacement information of the micro-imaging device on the preset plane, and historical distances between the micro-imaging device and the target object corresponding to the historical horizontal displacement information; based on a linear and nonlinear fitting prediction algorithm, linearly fitting or nonlinearly fitting the historical horizontal displacement information and the historical distances corresponding to the historical horizontal displacement information to obtain a target curve function.

[0043] For example, the linear and nonlinear fitting prediction algorithm can be, for example, a least squares method. Specifically, after the historical horizontal displacement information and the corresponding historical distances are determined, the linear and nonlinear fitting prediction algorithm can select linear fitting or nonlinear fitting to be used for the historical horizontal displacement information and the corresponding historical distances to obtain the target curve function. It can be understood that the linear and nonlinear fitting prediction algorithm can also include a linear fitting algorithm and a nonlinear fitting algorithm.

[0044] For example, the generation of the target curve function can be performed to enable the determination of the target distance based on the target curve function.

[0045] Exemplarily, the historical horizontal displacement information of the microscopic imaging device on the preset plane and the corresponding historical distance from the target object are acquired. It can be understood that the historical horizontal displacement information and the historical distance can be acquired during the test of the microscopic imaging device, or can be historical horizontal displacement information and historical distance information acquired when the microscopic imaging device captures other objects and / or the last time of capturing.

[0046] Exemplarily, after the historical horizontal displacement information and the historical distance are acquired, linear fitting or nonlinear fitting calculation can be performed on the historical horizontal displacement information and the historical distance based on linear and nonlinear fitting prediction algorithms, so as to obtain the target curve function. It can be understood that whether to use linear fitting or nonlinear fitting can be determined according to specific parameters or expressions, which is not limited by the present application. Linear fitting or nonlinear fitting can also be performed by using a preset curve equation. The historical horizontal displacement information and the historical distance are substituted into the preset curve equation, and the rationality of the curve equation is verified to determine the target curve function.

[0047] Exemplarily, when performing linear fitting or nonlinear fitting calculation on the historical horizontal displacement information and the historical distance, the historical distance corresponding to each historical horizontal displacement information can be determined, and a binary tuple can be constructed according to each historical horizontal displacement information and the corresponding historical distance. The binary tuple is calculated by linear fitting or nonlinear fitting to obtain the target curve function. For example, the historical horizontal displacement information includes x1, x2, x3, and the historical distance includes z1, z2, z3, which are one-to-one corresponding. The constructed binary tuple can be, for example, (x1, z1), so as to determine the target curve function according to the binary tuple.

[0048] In some other embodiments, the number of binary tuples can be determined, and linear fitting or nonlinear fitting calculation is performed on each binary tuple in turn when the number of binary tuples is greater than or equal to a preset number threshold, so as to determine the target curve function.

[0049] In some embodiments, before the linear and nonlinear fitting prediction algorithm is used to linearly fit or nonlinearly fit the historical horizontal displacement information and the historical distance corresponding to the historical horizontal displacement information to obtain a target curve function, the method further comprises: obtaining a historical position determined according to the historical horizontal displacement information and the historical distance corresponding to the historical horizontal displacement information, and a historical image captured by the microscopic imaging device at the historical position; if the definition of the historical image meets a preset focusing condition, determining the historical horizontal displacement information corresponding to the historical image as first horizontal displacement information, and the historical distance corresponding to the historical image as first historical distance; and the linear and nonlinear fitting prediction algorithm is used to linearly fit the first horizontal displacement information and the first historical distance to obtain the target curve function.

[0050] For example, the historical horizontal displacement information and the historical distance can be screened to improve the calculation accuracy of the target curve function. For example, whether the historical horizontal displacement information and the historical distance meet the linear fitting or nonlinear fitting condition can be determined by the historical position determined according to the historical horizontal displacement information and the historical distance, and the image captured by the microscopic imaging device at the historical position.

[0051] Specifically, if the image captured by the microscopic imaging device at the historical position meets the preset focusing condition, the historical horizontal displacement information is determined as the first horizontal displacement information, and the historical distance is determined as the first historical distance, and the linear and nonlinear fitting prediction algorithm is used to linearly fit or nonlinearly fit the first horizontal displacement information and the first historical distance to determine the target curve function. Wherein, whether the image captured by the microscopic imaging device at the historical position meets the preset focusing condition can be determined by manual review and / or image definition review. Specifically, if the definition of the image captured by the microscopic imaging device at the historical position is less than the preset image definition, it can be considered that the image captured by the microscopic imaging device at the historical position does not meet the preset focusing condition; otherwise, it can be considered that the image captured by the microscopic imaging device at the historical position meets the preset focusing condition.

[0052] It can be understood that if the image captured by the microscopic imaging device at the historical position does not meet the preset focusing condition, the historical horizontal displacement information corresponding to the historical position is determined as the second horizontal displacement information, and the historical distance corresponding to the historical position is determined as the second historical distance. When linear fitting or nonlinear fitting calculation is performed, the second horizontal displacement information and the second historical distance are excluded, that is, the second horizontal displacement information and the second historical distance are not linearly fitted or nonlinearly fitted, so as to avoid affecting the fitting result.

[0053] By screening the historical horizontal displacement information and the historical distance, the accuracy of the target curve function determination can be improved, and the accuracy of the target distance determination can be improved, so as to improve the focusing accuracy of the microscopic imaging device.

[0054] In some embodiments, the microscopic imaging device is provided with a distance measuring device, and the method further comprises: when the microscopic imaging device is located at the target position, acquiring a first distance between the microscopic imaging device and the target object by the distance measuring device; and determining the target distance between the microscopic imaging device and the target object corresponding to the target horizontal displacement information based on the target curve function, comprises: obtaining a second distance according to the target curve function and the target horizontal displacement information; and determining the target distance according to the first distance and the second distance.

[0055] Exemplarily, the distance obtained by the target curve function can be verified by the distance measuring device to adjust the distance between the microscopic imaging device and the target object, so as to improve the focusing accuracy of the microscopic imaging device.

[0056] Exemplarily, when the microscopic imaging device is located at the target position, a first distance between the microscopic imaging device and the target object measured by the distance measuring device can be acquired; and a second distance obtained by the target curve function and the target horizontal displacement information can be acquired, so as to determine the target distance by the first distance and the second distance. It can be understood that errors may exist in the calculation by the target curve function, and the distance measuring device can be used for verification.

[0057] In some embodiments, the determination of the target distance according to the first distance and the second distance comprises: calculating an absolute value of the difference between the first distance and the second distance; and determining the first distance as the target distance or the second distance as the target distance according to the absolute value.

[0058] Exemplarily, the difference between the first distance and the second distance is determined by difference calculation, and the absolute value of the difference is taken, so as to determine the first distance as the target distance, in which case the second distance obtained by the target curve function is too large to be used; or to determine the second distance as the target distance, in which case the second distance obtained by the target function can be used.

[0059] In some embodiments, the determination of the target distance according to the first distance and the second distance comprises: if the absolute value is less than a preset threshold, the first distance is determined as the target distance; and if the absolute value is greater than or equal to the preset threshold, the second distance is determined as the target distance.

[0060] Exemplarily, a threshold can be preset to determine whether the second distance determined by the target curve function can be used. Specifically, if the absolute value is less than the preset threshold, the first distance is determined as the target distance, that is, the second distance determined by the target curve function cannot be used; if the absolute value is greater than or equal to the preset threshold, the second distance can be determined as the target distance.

[0061] Exemplarily, the first distance measured by the distance measuring device is calibrated, which can effectively improve the focusing accuracy of the microscopic imaging device.

[0062] The focusing method of the microscopic imaging system provided by the above embodiment can improve the focusing accuracy and real-time performance of the microscopic imaging device, thereby reducing the delay and the situation of poor focusing.

[0063] Please refer to Figure 2 , Figure 2 A microscopic imaging device 100 is provided for the present application, and the distance measuring device 110 is arranged on the microscopic imaging device. It can be understood that the microscopic imaging device 100 is used for photographing images, and the distance measuring device 110 can be used for measuring the distance between the microscopic imaging device and the target object, so as to determine the target position of the microscopic imaging device or adjust the position of the microscopic imaging device, so as to enable the focusing accuracy of the image photographed by the microscopic imaging device at the target position to be high.

[0064] Exemplarily, the distance measuring device can be composed of a distance measuring emitting part and a distance measuring receiving part. The distance measuring emitting part emits laser and the distance measuring receiving part receives reflected laser to complete the distance measuring operation.

[0065] Please refer to Figure 3 , Figure 3 A structural schematic block diagram of a microscopic imaging system is provided for the embodiments of the present application.

[0066] As Figure 3 shown, the microscopic imaging system includes a microscopic imaging device 100, and further includes a processor, a memory and a network interface connected through a system bus. The memory can include a non-volatile storage medium and an internal memory.

[0067] The non-volatile storage medium can store an operating system and a computer program. The computer program includes program instructions which, when executed, cause the processor to perform any one of the focusing methods of the microscopic imaging device.

[0068] The processor is configured to provide computing and control capabilities to support the operation of the entire computer device.

[0069] The internal memory provides an environment for the operation of the computer program in the non-volatile storage medium, which, when executed by the processor, causes the processor to perform any one of the focusing methods of the microscopic imaging device.

[0070] The network interface is configured to perform network communication, such as sending assigned tasks, etc. Those skilled in the art can understand that the structure shown in the figure is only a block diagram of part of the structure related to the scheme of the present application, and does not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific computer device can include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0071] It should be understood that the processor can be a central processing unit (CPU), and the processor can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor can be a microprocessor or the processor can also be any conventional processor, etc.

[0072] In one embodiment, the processor is configured to run a computer program stored in the memory to implement the following steps:

[0073] Obtain a target curve function, the target curve function being used to indicate a corresponding relationship between horizontal displacement information of a microscopic imaging device on a preset plane and a distance between the microscopic imaging device and a target object, the preset plane being parallel to a plane on which the target object is located;

[0074] Determine target horizontal displacement information of the microscopic imaging device on the preset plane;

[0075] Determine a target distance between the microscopic imaging device and the target object corresponding to the target horizontal displacement information based on the target curve function;

[0076] determine a target position of the microscopic imaging device according to the target horizontal displacement information and the target distance, and acquire an image captured by the microscopic imaging device at the target position.

[0077] In one embodiment, the processor, when implementing the focusing method of the microscopic imaging device, is further configured to implement:

[0078] acquire historical horizontal displacement information of the microscopic imaging device on the preset plane and historical distances of the microscopic imaging device and the target object corresponding to the historical horizontal displacement information;

[0079] linearly or nonlinearly fit the historical horizontal displacement information and the historical distances corresponding to the historical horizontal displacement information based on a linear and nonlinear fitting prediction algorithm to obtain a target curve function.

[0080] In one embodiment, before the processor linearly or nonlinearly fits the historical horizontal displacement information and the historical distances corresponding to the historical horizontal displacement information based on the linear and nonlinear fitting prediction algorithm to obtain the target curve function, the processor is further configured to implement:

[0081] acquire a historical position determined according to the historical horizontal displacement information and the historical distances corresponding to the historical horizontal displacement information and a historical image captured by the microscopic imaging device at the historical position;

[0082] if the definition of the historical image meets a preset focusing condition, determine that the horizontal displacement information corresponding to the historical image is first horizontal displacement information and the historical distance corresponding to the historical image is a first historical distance;

[0083] In one embodiment, when the processor linearly or nonlinearly fits the historical horizontal displacement information and the historical distances corresponding to the historical horizontal displacement information based on the linear and nonlinear fitting prediction algorithm to obtain the target curve function, the processor is further configured to implement:

[0084] linearly or nonlinearly fit the first horizontal displacement information and the first historical distance based on the linear and nonlinear fitting prediction algorithm to obtain the target curve function.

[0085] In one embodiment, when the processor determines the target horizontal displacement information of the microscopic imaging device on the preset plane, the processor is further configured to implement:

[0086] acquire a horizontal moving speed of the microscopic imaging device and a target moving time;

[0087] determine the target horizontal displacement information according to the horizontal moving speed and the target moving time.

[0088] In one embodiment, the processor, when implementing the focusing method of the microscopic imaging device, is further configured to implement:

[0089] acquiring, by the distance measuring device, a first distance between the microscopic imaging device and the target object when the microscopic imaging device is located at the target position;

[0090] In one embodiment, the processor, when implementing the focusing method of the microscopic imaging device, is further configured to implement:

[0091] a second distance obtained according to the target curve function and the target horizontal displacement information;

[0092] determining the target distance according to the first distance and the second distance.

[0093] In one embodiment, the processor, when implementing the focusing method of the microscopic imaging device, is further configured to implement:

[0094] calculating an absolute value of a difference between the first distance and the second distance;

[0095] determining the first distance as the target distance or determining the second distance as the target distance according to the absolute value.

[0096] In one embodiment, the processor, when implementing the focusing method of the microscopic imaging device, is further configured to implement:

[0097] if the absolute value is less than a preset threshold, determining the first distance as the target distance;

[0098] if the absolute value is greater than or equal to the preset threshold, determining the second distance as the target distance.

[0099] It should be noted that, for the convenience and brevity of description, the above description of the focusing process of the image acquisition device can refer to the corresponding process in the focusing control method of the image acquisition system, which will not be described here.

[0100] The embodiments of the present application further provide a computer readable storage medium, which stores a computer program. The computer program includes program instructions. The method implemented by the program instructions can refer to the embodiments of the focusing method of the microscopic imaging device.

[0101] The computer readable storage medium can be an internal storage unit of the computer device, for example, a hard disk or a memory of the computer device. The computer readable storage medium can also be an external storage device of the computer device, for example, a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, and the like.

[0102] It should be understood that the terminology used herein in the specification and the appended claims is for the purpose of describing particular embodiments only and is not intended to be limiting, as the scope of the present application will be limited only by the appended claims. As used in this specification and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.

[0103] It should also be understood that the term "and / or" as used herein refers to and encompasses any and all possible combinations of one or more of the associated listed items, and that the term "at least one of" followed by a list of two or more items means any single one of the items in the list, and that the term "one or more of" followed by a list of two or more items means any single one or plurality of the items in the list. It should be further understood that the terms "comprise" "include" or "comprising" or "including" when used in this specification and in the following claims, specify the presence of stated features, integers, steps, operations, elements, or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, or groups thereof.

[0104] The above-mentioned sequence numbers of the embodiments of the present application are only for description, and do not represent advantages or disadvantages of the embodiments. The above describes only specific embodiments of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art can easily think of various equivalent modifications or replacements within the technical scope disclosed by the present application, and these modifications or replacements should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A focusing method of a microscopic imaging apparatus, characterized by, The micro-imaging device is provided with a distance measuring device, and the method comprises: obtaining a target curve function, the target curve function being used to indicate the corresponding relationship between the horizontal displacement information of the micro-imaging device on a preset plane and the distance between the micro-imaging device and a target object, the preset plane being parallel to the plane where the target object is located; determining the target horizontal displacement information of the micro-imaging device on the preset plane; based on the target curve function, determining the target distance between the micro-imaging device and the target object corresponding to the target horizontal displacement information; horizontally moving the micro-imaging device according to the target horizontal displacement information, and adjusting the height of the micro-imaging device according to the target distance during the horizontal movement of the micro-imaging device, so that the micro-imaging device reaches a target position; when the micro-imaging device is located at the target position, obtaining a first distance between the micro-imaging device and the target object through the distance measuring device; obtaining a second distance according to the target curve function and the target horizontal displacement information; when it is determined that the target distance meets the test condition according to the first distance and the second distance, obtaining an image taken by the micro-imaging device when the micro-imaging device is located at the target position.

2. The method of focusing a microscopy apparatus according to claim 1, wherein, The method further comprises: obtaining historical horizontal displacement information of the micro-imaging device on the preset plane and historical distances between the micro-imaging device and the target object corresponding to the historical horizontal displacement information; based on a linear and nonlinear fitting prediction algorithm, linearly fitting or nonlinearly fitting the historical horizontal displacement information and the historical distances corresponding to the historical horizontal displacement information to obtain a target curve function.

3. The method of focusing a microscope imaging apparatus as claimed in claim 2, wherein, Before the step of obtaining the target curve function by linearly fitting or nonlinearly fitting the historical horizontal displacement information and the historical distances corresponding to the historical horizontal displacement information based on the linear and nonlinear fitting prediction algorithm, the method further comprises: obtaining a historical position determined according to the historical horizontal displacement information and the historical distances corresponding to the historical horizontal displacement information, and a historical image taken by the micro-imaging device when the micro-imaging device is located at the historical position; if the definition of the historical image meets a preset focusing condition, determining that the horizontal displacement information corresponding to the historical image is first horizontal displacement information, and the historical distance corresponding to the historical image is a first historical distance; the step of obtaining the target curve function by linearly fitting or nonlinearly fitting the historical horizontal displacement information and the historical distances corresponding to the historical horizontal displacement information based on the linear and nonlinear fitting prediction algorithm comprises: obtaining the target curve function by linearly fitting or nonlinearly fitting the first horizontal displacement information and the first historical distance based on the linear and nonlinear fitting prediction algorithm.

4. The method of focusing a microscopic imaging apparatus according to any one of claims 1 to 3, wherein, The step of determining the target horizontal displacement information of the micro-imaging device on the preset plane comprises: determining the target horizontal displacement information in response to input information of a user.

5. The method of focusing a microscopy apparatus of claim 1, wherein, The step of determining the target distance according to the first distance and the second distance comprises: calculating the absolute value of the difference between the first distance and the second distance; The first distance is determined as the target distance or the second distance is determined as the target distance according to the absolute value.

6. The method of focusing a microscope imaging apparatus as claimed in claim 5, wherein, The determining the first distance as the target distance or the second distance as the target distance according to the absolute value comprises: If the absolute value is less than a preset threshold, the first distance is determined as the target distance; If the absolute value is greater than or equal to the preset threshold, the second distance is determined as the target distance.

7. A microscope imaging device, characterized in that The microscopic imaging device is provided with a distance measuring device. The microscopic imaging device is used for acquiring images, and the distance measuring device is used for measuring the distance between the microscopic imaging device and a target object, so that the target position of the microscopic imaging device can be determined, and the images taken by the microscopic imaging device at the target position can be acquired, thereby realizing the steps of the focusing method of the microscopic imaging device according to any one of claims 1 to 6.

8. A microscopy system, characterized in that, The microscopic imaging system comprises a microscopic imaging device, a processor, a memory, and a computer program stored on the memory and executable by the processor, wherein when the computer program is executed by the processor, the steps of the focusing method of the microscopic imaging device according to any one of claims 1 to 6 are realized.

9. A computer-readable storage medium, characterized in that, The computer readable storage medium stores a computer program, wherein when the computer program is executed by the processor, the steps of the focusing method of the microscopic imaging device according to any one of claims 1 to 6 are realized.

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