Rice grain quality measuring device

Abstract

The present invention provides a compact measuring device capable of measuring whiteness and glossiness in a short time and in a simple manner. The measuring device comprises: a workbench (20) on which a sample disc (10) carrying rice grains is placed; a gloss meter (30) for irradiating the surface of the rice grains in the sample disc placed on the workbench with light for glossiness measurement and receiving the reflected light to measure the glossiness of the rice grains; and a whiteness meter (40) for also irradiating the sample disc placed on the workbench with light for glossiness measurement and receiving the reflected light from the rice grains in the sample disc through the sample disc to measure the whiteness of the rice grains.

Description

Technical Field

[0001] The present invention relates to a device capable of measuring the whiteness and gloss of rice grains. Background Art

[0002] The quality of polished rice in the Japanese market is generally evaluated based on whiteness, but for long-grain polished rice in overseas markets, whiteness and gloss are used as quality evaluation criteria.

[0003] As devices for measuring whiteness, for example, the brown rice whiteness meter and polished rice whiteness meter described in Non-Patent Document 1 are commercially available. Furthermore, Patent Document 1 discloses a polished rice whiteness measuring device. As devices for measuring gloss, the grain gloss measuring devices described in Patent Documents 2 and 3 are known. Both these devices for measuring whiteness and gloss illuminate polished rice and measure the reflected light.

[0004] Prior art literature

[0005] Patent Literature

[0006] Patent Document 1: Japanese Patent Application Laid-Open No. 1-142441

[0007] Patent Document 2: Japanese Patent Application Publication No. 2019-211280

[0008] Patent Document 3: U.S. Patent Application Publication No. 2016 / 0320311

[0009] Non-patent literature

[0010] Non-Patent Document 1: Kate Science Research Institute Co., Ltd. homepage<https: / / www.kett.co.jp / wp-content / uploads / 2018 / 09 / c300_catalog_rev0201.pdf> Summary of the Invention

[0011] Problems to be solved by the invention

[0012] Conventionally, measuring the whiteness and glossiness of polished rice required two devices: a whiteness measuring device and a gloss measuring device. This required space for both devices, and the need for separate measurements also added to the time it took to complete the measurements.

[0013] An object of the present invention is to provide a compact measuring device capable of measuring whiteness and glossiness values ​​in a short time.

[0014] Solutions to Problems

[0015] To achieve the above-mentioned object, the rice grain quality measuring device of the present invention is characterized by comprising: a workbench on which a sample disk containing rice grains is placed; a gloss measuring device for irradiating the surface of the rice grains in the sample disk placed on the workbench with light for gloss measurement and receiving the reflected light to thereby measure the gloss of the rice grains; and a whiteness measuring device for irradiating the rice grains in the sample disk placed on the workbench with light for whiteness measurement and receiving the reflected light from the rice grains to thereby measure the whiteness of the rice grains.

[0016] For example, the gloss meter is placed above the workbench, and the whiteness meter is placed below the workbench. In this case, the whiteness meter is configured to irradiate light for whiteness measurement from the lower surface of a sample disc placed on the workbench through the sample disc, and receive light reflected from rice grains in the sample disc through the sample disc.

[0017] A sample disc can be used that has a gloss sample area with a single layer of rice grains for gloss measurement and a whiteness sample area filled with multiple layers of rice grains for whiteness measurement. In this case, the whiteness sample area is preferably made of a material that transmits light used for whiteness measurement.

[0018] A turntable can be used as the workbench. In this case, the turntable can be configured to include an opening in the whiteness area for placing a sample disc or a window for transmitting whiteness measurement light, and one or more reference plates can be positioned on the lower surface of the workbench. In this configuration, as the turntable rotates, the sample disc and one or more reference plates are sequentially positioned at positions where they are illuminated by the whiteness measurement light.

[0019] For example, the gloss measurement sample area of ​​the sample disk is placed at the rotation center of the turntable.

[0020] The gloss measuring device may include: a first light source for irradiating rice grains on a sample disk placed on a table with light of a first wavelength from obliquely above; a second light source for irradiating the rice grains on the sample disk with light of a second wavelength from above; a camera for capturing an image of the sample disk using the light of the first and second wavelengths emitted from the sample disk; and a gloss calculation unit. In this case, the gloss calculation unit generates an image of the rice grains on the sample disk using the light of the first and second wavelengths from the images captured by the camera, and calculates the gloss value of the rice grains on the sample disk based on the two images.

[0021] The whiteness measuring device is constructed, for example, to include: a third light source, which is arranged at the bottom of the workbench and irradiates the rice grains in the sample disk with the third light for whiteness measurement; a light receiving unit, which is arranged below the workbench and receives reflected light of the third light for whiteness measurement from the rice grains in the sample disk; and a whiteness calculating unit, which calculates the whiteness based on the light intensity received by the light receiving unit.

[0022] In this case, the whiteness calculation unit may be configured to calculate the whiteness based on the received light intensity when the rice grains on the sample disk are irradiated with whiteness measurement light and the received light intensity when a reference plate is placed instead of the rice grains on the sample disk.

[0023] Alternatively, the gloss calculation unit may calculate the area of ​​the milky white rice grains contained in the sample disk's rice grain image by performing predetermined processing on the image of the rice grains on the sample disk under light of the second wavelength. The whiteness calculation unit includes a correction unit that corrects the whiteness based on the area of ​​the milky white rice grains calculated by the gloss calculation unit.

[0024] As an example, the sample disk may be provided with a whiteness sample area in the center and a gloss sample area having a depth less than that of the whiteness sample area provided so as to surround the outer periphery of the whiteness sample area. Figure 9 That kind of structure.

[0025] The sample tray can also be formed into an integrated structure with the workbench.

[0026] Effects of the Invention

[0027] According to the present invention, a compact measuring device capable of measuring whiteness and glossiness in a short time can be provided. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 This is a cross-sectional view of the rice grain quality measuring device according to the first embodiment of the present invention, taken along a plane including the rotation axis.

[0029] Figure 2 This is a cross-sectional view taken along a plane including the rotation axis of the configuration in which the second light source 32 of the rice grain quality measuring apparatus according to the first embodiment of the present invention is arranged above the sample disk 10 .

[0030] Figure 3 (a) is a cross-sectional view of the sample disk 10 according to the first embodiment, and (b) is a plan view.

[0031] Figure 4 This is a plan view of the table 20 on which the sample disk 10 is placed in the rice grain quality measuring apparatus according to the first embodiment.

[0032] Figure 5 This is a cross-sectional view of the rice grain quality measuring device according to the first embodiment, taken at a position crossing the whiteness measurement area 12 and the gloss measurement area 11 .

[0033] Figure 6 This is a flowchart showing the measurement operation of the rice grain quality measuring device according to the first embodiment.

[0034] Figure 7(a) is a cross-sectional view of a sample disc 110a equipped with a reference plate according to Embodiment 2, (b) is a cross-sectional view of a sample disc 110b for whiteness measurement, and (c) is a cross-sectional view of a sample disc 110c for gloss measurement.

[0035] Figure 8 (a) is a cross-sectional view of a sample disk 111a for gloss measurement provided with a reference plate according to the second embodiment, and (b) is a cross-sectional view of a sample disk 110b for whiteness measurement.

[0036] Figure 9 (a) is a cross-sectional view of a sample disk 110a including a reference plate according to Embodiment 2, (b) is a cross-sectional view of a sample disk 110b including both a whiteness measurement area 12 and a gloss measurement area 11, and (c) is a perspective view of the sample disk 110b.

[0037] Figure 10 This is a flowchart showing the measurement operation of the rice grain quality measuring device according to the third embodiment.

[0038] Figure 11 This is a cross-sectional view of the rice grain quality measuring device according to the fourth embodiment, taken at a position crossing the whiteness measurement area 12 and the gloss measurement area 11 .

[0039] Figure 12 This is a block diagram of a rice polishing device according to a fifth embodiment. DETAILED DESCRIPTION

[0040] Hereinafter, a rice grain quality measuring device according to one embodiment of the present invention will be described using the drawings.

[0041] <<Implementation Method 1>>

[0042] Hereinafter, the rice grain quality measuring device according to the first embodiment will be described.

[0043] like Figure 1 As shown, the rice grain quality measuring apparatus of this embodiment includes a table 20 on which a sample pan 10 carrying rice grains is placed, a gloss measuring device 30 , and a whiteness measuring device 40 .

[0044] By adopting a configuration in which both the gloss measuring device 30 and the whiteness measuring device 40 are provided in one device, it is possible to provide a compact rice grain quality measuring device that can measure both gloss and whiteness in a short time using one device.

[0045] In this embodiment, if Figure 1 As shown in FIG. 1 , a configuration in which the gloss meter 30 is arranged above the workbench 20 and the whiteness meter 40 is arranged below the workbench 20 will be described.

[0046] The gloss meter 30 irradiates the surface of the rice grains on the sample disk 10 with light for gloss measurement, and measures the gloss of the rice grains by receiving the reflected light. Specifically, the gloss meter 30 is configured to include: a first light source 31 that emits light of a first wavelength; a second light source 32 that emits light of a second wavelength; and a camera 33 that photographs the sample disk using light of the first wavelength and the second wavelength. The first light source 31 is arranged at a position that irradiates the rice grains on the sample disk 10 placed on the workbench with light of the first wavelength from obliquely above. The camera 33 is arranged at a position that receives reflected light of the first wavelength reflected by the rice grains on the sample disk 10. The second light source 32 irradiates light of the second wavelength from above the rice grains on the sample disk 10. The position of the second light source 32 can be arranged at any position as long as the reflected light of the second wavelength reflected by the rice grains is received by the camera 33. For example, the second light source 32 can be as follows Figure 1 It can be arranged at a position opposite to the first light source 31 across the sample disk 10, or it ... Figure 2 As shown, the camera 33 is positioned directly above the sample disk 10 and irradiates the sample disk 10 with light of the second wavelength along the normal direction of the principal plane of the sample disk 10. The camera 33 receives reflected light of the first wavelength and reflected light of the second wavelength from the rice grains on the sample disk 10 and photographs the rice grains. It should be noted that an optical element (e.g., a polarizing plate) may be positioned in front of the camera 33 to prevent the entry of scattered light of the first wavelength caused by the rice grains.

[0047] The gloss calculation unit 34 separates the image captured by the camera 33 according to wavelength to generate an image of the rice grains on the sample disk 10 based on the first wavelength of light and an image of the rice grains on the sample disk 10 based on the second wavelength of light. The gloss calculation unit 34 processes the two images to calculate the gloss value of the rice grains on the sample disk 10.

[0048] The first wavelength light and the second wavelength light are preferably different wavelengths. For example, red light can be used as the first wavelength light, and blue light can be used as the second wavelength light.

[0049] The whiteness measuring device 40 irradiates the rice grains on the sample disk 10 with a third light for measuring whiteness, and receives the reflected light from the rice grains on the sample disk 10 via the sample disk 10, thereby measuring the whiteness of the rice grains. Specifically, the whiteness measuring device 40 is configured to include: third light sources 41a and 41b for irradiating the rice grains on the sample disk 10 with the third light for measuring whiteness; a light receiving unit 42 for receiving the reflected light of the third light for measuring whiteness of the rice grains on the sample disk 10; and a whiteness calculating unit 43 for calculating the whiteness based on the light intensity received by the light receiving unit 42. Figure 1 In this way, the whiteness measuring device 40 is arranged at the lower part of the workbench 20, but it can also be arranged at the upper part of the workbench 20. Figure 1In the example, there are two third light sources 41a and 41b, each of which emits third light (for example, blue light) at an angle of about 45 degrees relative to the normal line of the lower surface of the sample disk 10. Figure 1 In the example of FIG, the light receiving unit 42 is arranged in the normal direction of the lower surface of the sample disc 10 .

[0050] The whiteness calculation method of the whiteness calculation unit 43 can be any calculation method. For example, it can be configured to calculate the whiteness by comparing the light intensity of the light receiving unit 42 when the third light source 41a, 41b is irradiated from the third light source 41a, 41b to the rice grains on the sample disk 10 for whiteness measurement with the light intensity when a reference plate is arranged instead of the rice grains on the sample disk 10.

[0051] Thus, in this embodiment, gloss measurement and whiteness measurement can be performed using a single measuring device, but the preferred sample forms for gloss measurement and whiteness measurement are different. Figure 3 As shown in (a), for gloss measurement, rice grains 15 are preferably arranged in a single layer (one grain in thickness) on sample disk 10, evenly tilted (with their long axes approximately parallel to the principal plane of table 20), and the abdominal portions of rice grains 15 arranged on sample disk 10 are irradiated with light of the first wavelength and the second wavelength, and the reflected light is received. On the other hand, for whiteness measurement, rice grains 15 are preferably packed in multiple layers in sample disk 10 to densely arrange the rice grains, eliminate gaps, and perform stable measurement.

[0052] Therefore, if Figure 3 As shown in Figures (a) and (b), a sample disk 10 can be used that includes a gloss sample area 11 with a layer of rice grains 15 arranged therein for gloss measurement, and a whiteness sample area 12 filled with multiple layers of rice grains for whiteness measurement. Since whiteness sample area 12 is irradiated with the third light for whiteness measurement from bottom surface 10a of sample disk 11, bottom surface 10a is made of a material that transmits the third light.

[0053] As the workbench 20, Figure 4 and Figure 5As shown, it is preferable to use a turntable equipped with a motor 23 as a driving source. The turntable 20 is provided with an opening 20a for placing the whiteness area 12 of the sample disk 10 or a window for transmitting the third light for whiteness measurement. One or more reference plates 21, 22 may also be arranged on the lower surface of the turntable 20. The opening 20a for placing the whiteness area 12 and the reference plates 21, 22 are arranged on concentric circles with the rotation axis 24 of the turntable 20 as the center. In this way, by having two or more reference plates 21, 22 of different colors, whiteness can be determined with high precision. In addition, the whiteness of the device of this embodiment can also be calibrated with high precision before shipment. For example, a white reference plate 21 for whiteness measurement and a brown reference plate 22 for brown color measurement can be fixed to the lower surface of the turntable 20. As the white reference plate 21 and the brown reference plate 22, resin plates whose whiteness has been determined in advance are used. It should be noted that a reference plate 21 of another color, such as gray, may be used instead of the brown reference plate 22. In addition, three or more reference plates may be used to further improve the calibration accuracy.

[0054] In this configuration, as the turntable rotates, the sample disk and one or more reference plates 21, 22 are sequentially positioned at positions illuminated by blue light from third light sources 41a, 41b, and the intensity of their reflected light is detected by light receiving unit 42. This allows for highly accurate measurement of the whiteness of the sample.

[0055] It should be noted that in Figure 4 and Figure 5 In the structure, the gloss measurement sample area 11 of the sample disk 10 is placed on the rotation center (rotation axis 24) of the turntable 20. Therefore, as the turntable 20 rotates, the gloss value can be measured by irradiating the first wavelength and the second wavelength light from the entire circumference.

[0056] <Measurement of Gloss and Whiteness>

[0057] use Figure 6 The operation of each part when the gloss and whiteness of rice grains are measured by the rice grain quality measuring device of Embodiment 1 will be described with reference to the flowchart of FIG.

[0058] (Step 101)

[0059] First, in Figure 3 In the gloss measurement area 11 of the sample disk 10 of (a) and (b), a layer of rice grains 15 is arranged in a laid-down state. On the other hand, in the whiteness measurement area 12, multiple layers of rice grains are filled, as shown in FIG. Figure 4 In this way, it is mounted on the turntable 20 .

[0060] (Step 102)

[0061] The turntable 20 is continuously rotated at a predetermined rotation speed by the motor 23 .

[0062] (Step 103)

[0063] Next, the first and second light sources 31 and 32 irradiate the rice grains 15 in the gloss measurement area 11 at the center of the sample disk 10 on the rotating turntable 20 with the first and second wavelengths of light, and the camera 33 captures images of the first and second wavelengths of light.

[0064] (Step 104)

[0065] The gloss calculation unit 34 measures the gloss value by processing the image from the camera 33 .

[0066] Various methods can be used to calculate the gloss value, including the following method. First light source 31 is positioned across sample disk 10 from camera 33, so camera 33 captures light reflected from rice grains placed on sample disk 10, which have been irradiated with light of the first wavelength. Camera 33 also captures light reflected from the surrounding areas of rice grains placed on sample disk 10 (e.g., the edges of sample disk 10, the workbench, etc.) with the first wavelength. Second light source 32, on the other hand, is positioned above sample disk 10, so that light reflected from the rice grains of the irradiated second wavelength reaches camera 33.

[0067] The gloss calculation unit 34 binarizes the image of the first wavelength of light captured by the camera 33 using a predetermined appropriate threshold value, thereby extracting an image of the reflected light of the first wavelength. The reflected light of the first wavelength is light reflected from the smooth surface of the belly of the rice grain. However, since the camera 33 also captures reflected light from surrounding components, the reflected light image is a combination of the glossy area of ​​the rice grain and the smooth surface area surrounding the rice grain (such as the edge of the sample disk 10 and the workbench).

[0068] Meanwhile, the gloss calculation unit 34 binarizes the image of the second wavelength light captured by the camera 33 using a predetermined appropriate threshold value, thereby removing reflected light from areas other than the rice grains and extracting an image of the reflected light from the rice grains. Since the second light source 32 is positioned above the sample disk 10, the reflected light of the second wavelength light captured by the camera 33 is light reflected from the surface and interior of the rice grains. The binarized image of the second wavelength light is an image of the area containing the rice grains (the grain area).

[0069] The gloss calculation unit 34 calculates the area (S0) of the binarized image (grain region) of the second wavelength. Furthermore, the gloss calculation unit 34 calculates the area of ​​the overlapping region between the binarized image of the first wavelength and the binarized image of the second wavelength to extract the glossy region within the grain region and calculates its area (S2). The gloss value is calculated by calculating the ratio (S2 / S0) of the area of ​​the glossy region (S2) to the area of ​​the grain region (S0).

[0070] In this embodiment, while rotating turntable 20 360 degrees, light is irradiated from first light source 31 and second light source 32 onto the rice grains in gloss measurement area 11 of sample disk 10. The gloss values ​​are calculated for each rotation angle of 360 degrees, and then the average value is determined. Thus, even if the arrangement of the rice grains in gloss measurement area 11 of sample disk 10 is uneven, calculating the average gloss value at each angle allows for highly accurate gloss value calculation without being affected by the uneven arrangement.

[0071] After the gloss value is calculated, the first light source 31 and the second light source 32 are turned off. At this time, the rotation of the turntable 20 may be stopped as needed.

[0072] (Step 105)

[0073] When the turntable 20 is stopped, the motor 23 restarts the rotation of the turntable 20. The turntable 20 is thereby continuously rotated at a predetermined rotation speed.

[0074] (Step 106)

[0075] When the white reference plate 21 placed on the turntable 20 reaches the illumination area of ​​the third light sources 41a and 41b of the whiteness measuring device 40 as the turntable 20 rotates, the whiteness measuring device 40 begins detecting the light intensity by acquiring output data from the light receiving unit 42 that receives the reflected light from the white reference plate 21 illuminated with blue light by the third light sources 41a and 41b. The light receiving unit 42 continues acquiring output data until the white reference plate 21 leaves the illumination area of ​​the third light sources 41a and 41b.

[0076] When the whiteness measuring device 40 detects that the rotation angle of the turntable 20 has reached a predetermined angle range, for example, it determines that the irradiation area of ​​the third light sources 41 a and 41 b has been reached and can start acquiring output data from the light receiving unit 42 .

[0077] (Step 107)

[0078] As the turntable 20 rotates, the brown reference plate 22 enters the illumination area of ​​the third light sources 41a and 41b. The whiteness measuring device 40 begins detecting the light intensity by acquiring output data from the light receiving unit 42, which receives the reflected light from the brown reference plate 22 illuminated with blue light by the third light sources 41a and 41b. The light receiving unit 42 continues acquiring output data until the brown reference plate 22 exits the illumination area of ​​the third light sources 41a and 41b.

[0079] (Step 108)

[0080] As turntable 20 rotates, when the bottom surface of whiteness measurement area 12 of sample disk 10 reaches the illumination area of ​​third light sources 41a and 41b, whiteness measurement device 40 begins acquiring output data from light receiving unit 42, which receives light reflected from rice grains in whiteness measurement area 12 illuminated by blue light from third light sources 41a and 41b, thereby detecting the light intensity. Light receiving unit 42 continues acquiring output data until the bottom surface of whiteness measurement area 12 exits the illumination area of ​​third light sources 41a and 41b.

[0081] (Step 109)

[0082] The whiteness calculation unit 43 calculates the whiteness based on the average (time average) of the light intensities of the individual reflected lights received in steps 106, 107, and 108. The whiteness calculation method may be any method. For example, a method may be used in which the whiteness is calculated based on the amount of reflected light from the sample rice grains received in step 108, using a predetermined relationship between the amount of reflected light and the whiteness, and the calculated whiteness is corrected based on the amount of reflected light from the reference plate calculated in steps 104 and 106. Alternatively, the amount of light irradiated from the third light sources 41a and 41b onto the sample in step 108 may be controlled based on the amount of reflected light from the reference plate calculated in steps 104 and 106.

[0083] (Step 110)

[0084] The glossiness value and whiteness obtained in steps 104 and 109 are displayed on the display unit 51 .

[0085] As described above, according to this embodiment, the whiteness and glossiness of rice grains can be measured by a single compact measuring device.

[0086] Furthermore, there is no need to switch the sample on the sample disk 10 between the gloss value and the whiteness during measurement, nor is there any need to switch the reference plate 21 and the sample disk 10. Therefore, the gloss value and whiteness can be measured easily and quickly.

[0087] Moreover, in this embodiment, the gloss value and whiteness can be measured separately while the turntable 20 is rotated, thereby eliminating the influence of the uneven arrangement of the rice grains on the sample disk 10. Since calibration based on the reference plate is automatically performed for each measurement, the gloss value and whiteness can be measured with high precision.

[0088] It should be noted that in the above-mentioned measurement operation, the whiteness is measured after the gloss value is measured. However, the gloss value and the whiteness may be measured simultaneously by irradiating light from the upper and lower measuring devices 30 and 40 .

[0089] It should be noted that the sample disk 10 and the turntable 20 may also be formed into an integrated structure.

[0090] In addition, in this embodiment, when measuring the whiteness, the reflected light is measured while the turntable 20 is rotated. However, if the reference plate 21, the reference plate 22, and the whiteness measurement area 12 of the sample disk 10 reach the irradiation area of ​​the third light source 41a, 41b, the turntable 20 can also be temporarily stopped to measure the reflected light.

[0091] <<Implementation Method 2>>

[0092] As a second embodiment, an example of a sample disk shape different from that of the first embodiment will be described.

[0093] The sample disc 10 of the first embodiment is an integrated sample disc having both the gloss measurement area 11 and the whiteness measurement area 12, but it may also be a sample disc having a gloss measurement area 11 and a whiteness measurement area 12. Figure 7 (b) and (c) are separated into two sample disks 110b and 110c. Alternatively, Figure 7 As in (a), the reference plate 21 is placed on the bottom surface of the reference sample disk 110 a and the arrangement is switched with the sample disk 110 b to measure the amount of light reflected by the reference plate 21 .

[0094] In addition, you can also Figure 8 As in (a), a reference plate 21 is placed on the bottom surface of the sample disk 110a for gloss measurement. In this case, the sample disk 110b for whiteness measurement is Figure 7 By using the same structure as (b) Figure 8 The sample disks 110a and 110b of (a) and (b) can be used as both the sample disk 110a and the reference plate 21 for gloss measurement. Figure 7 The number of sample disks can be reduced compared to the previous case.

[0095] In addition, if Figure 9 (b) shows a cross-sectional view, Figure 9As shown in the perspective view of (c), the sample disk 112b may also be configured such that a whiteness sample area 12 is provided in the center and a gloss sample area 11 having a depth shallower than that of the whiteness sample area 12 is provided around the periphery of the whiteness sample area 12. In this case, the reference plate 21 may also be configured such as Figure 7 (a) is similarly arranged on the bottom surface of the sample disk 110a.

[0096] When using the above Figure 8 、 Figure 9 In the case of a sample disk, a worktable 20 is used in which both an area irradiated with light for gloss measurement and an area irradiated with light for whiteness measurement are arranged on the central axis. Specifically, an opening or window is provided in the center of the worktable 20, and the sample disk and reference plate 21 are placed thereon. This structure allows simultaneous irradiation of the sample disk 112b from upper and lower measuring devices 30 and 40, allowing simultaneous measurement of gloss value and whiteness.

[0097] <<Implementation Method 3>>

[0098] In the third embodiment, a correction unit 43a (see FIG. 1 ) is used to correct the whiteness measured by the whiteness measuring device 40 obtained in the first embodiment using the value obtained by the gloss measuring device 30. Figure 1 ) is described. When milky white rice grains are mixed in the rice grains, the light reflectivity of the milky white rice grains is high, so there is a tendency for the amount of reflected light detected by the light receiving unit 42 of the whiteness measuring device 50 to increase. Therefore, the whiteness calculated in step 109 is larger than the accurate whiteness. Moreover, the tendency for the whiteness to increase depends on the area occupied by the milky white rice grains in the area of ​​the sample (rice grains) on the sample disk 10. Therefore, in this embodiment, the whiteness calculation unit 43 is provided with a correction unit 43a that corrects the calculated whiteness based on the area of ​​the milky white rice grains. The area of ​​the milky white rice grains is calculated by performing predetermined processing on the image of the rice grains on the sample disk 10 based on the light of the second wavelength captured by the camera 33 of the gloss calculation unit 34.

[0099] The rice grain quality measuring device of the third embodiment has the same structure as that of the first embodiment.

[0100] use Figure 10 The specific processing is described with reference to the flowchart of FIG.

[0101] First, the same as in the first embodiment Figure 6 Steps 101 to 109 are used to calculate the whiteness W.

[0102] (Step 901)

[0103] Next, gloss calculation unit 34 binarizes the image of the rice grains on sample disk 10 captured in embodiment 102 using the second wavelength of light, using a pre-determined threshold value. This threshold value is greater than the threshold value used in step 103 to remove reflected light from areas not containing rice grains. Milky-white rice grains have a higher reflectivity than ordinary rice grains, resulting in a brighter image of the rice grains on sample disk 10 captured using the second wavelength of light. Therefore, gloss calculation unit 34 binarizes the image using the pre-determined threshold value to clearly detect the milky-white portion. Gloss calculation unit 34 calculates the area of ​​the milky-white rice grain image in the binarized image (S1).

[0104] (Step 902)

[0105] The gloss calculation unit 34 calculates a ratio X (= S1 / S0 ) between the area ( S1 ) of the milky white rice grain image and the area ( S0 ) of the grain region in step 103 .

[0106] (Step 903)

[0107] The gloss calculation unit uses the ratio X obtained in step 902 to correct the whiteness W calculated in step 109 using a predetermined formula to obtain a corrected whiteness W′.

[0108] As described above, the device of this embodiment measures both the gloss value and the whiteness, and therefore can correct the whiteness based on the value of the image during the calculation of the gloss value, thereby calculating the whiteness with high accuracy.

[0109] <<Implementation Method 4>>

[0110] In the above-mentioned embodiments 1 to 3, the gloss meter 30 is arranged above the workbench 20 and the whiteness meter 40 is arranged below the workbench 20. However, both the gloss meter 30 and the whiteness meter 40 may be arranged above the workbench 20 or below the workbench 20. For example, Figure 11 As shown, when both gloss meter 30 and whiteness meter 40 are arranged above workbench 20, whiteness meter 40 is configured to irradiate light from above the rice grains on sample disk 10, and the reflected light is received by light receiving unit 42 arranged above sample disk 10. In this case, a transparent plate is preferably placed on the rice grains in whiteness measurement area 12 of sample disk 10 in advance to make the upper surface of the rice grains flat.

[0111] By placing both the gloss meter 30 and the whiteness meter 40 above the workbench 20, the third light emitted from the third light source of the whiteness meter 40 does not pass through the bottom surface of the sample disk 10 but instead illuminates the surface of the rice grain sample, with the reflected light being directly received by the light receiving unit 42. This provides the advantage of being able to receive the reflected light without being affected by the bottom surface of the sample disk 10.

[0112] In the present embodiment, one or both of the first light source 31 and the second light source 32 of the gloss measuring device 30 may also be used as the third light sources 41 a and 41 b of the whiteness measuring device 40 .

[0113] <<Implementation Method 5>>

[0114] As embodiment 5, use Figure 12 A rice polishing device using the rice grain quality measuring device according to any one of the first to fourth embodiments will be described. Figure 12 The rice polishing device comprises: a rice polishing machine 201 and a rice milling machine 202; and a rice grain quality measuring device 1 connected to the rice polishing machine 201 and the rice milling machine 202 respectively.

[0115] After being polished for a predetermined time in the rice polishing machine 201, a portion of rice grains is loaded as a sample into the rice grain quality measuring device 1, where their whiteness and glossiness are measured. The measured values ​​are output from the rice grain quality measuring device 1 to the rice polishing control unit of the rice polishing machine 201. If the received measured values ​​do not meet the target whiteness and / or glossiness values, the rice polishing control unit controls various components to further polish the rice. If the target values ​​are met, the rice polishing control unit completes the polishing and loads the polished rice grains into the rice mill 202.

[0116] The rice milling machine 202 transfers a portion of rice grains, after a specified period of milling, as a sample into the rice grain quality measuring device 1, where their whiteness and gloss are measured. The measured values ​​are output from the rice grain quality measuring device 1 to the rice milling control unit of the rice milling machine 202. If the received measured values ​​do not meet the target whiteness and / or gloss values, the rice milling control unit controls the various components to further mill the rice. If the target values ​​are met, the rice milling is terminated and the polished rice grains are discharged.

[0117] Thus, the rice polishing apparatus of this embodiment can be controlled based on the whiteness and / or glossiness value measured by the rice grain quality measuring apparatus 1, thereby automatically controlling the rice polishing process. Furthermore, when the rice grain quality measuring apparatus 1 of the third embodiment is used, the highly accurate calibrated whiteness value can be used for control, thereby improving the accuracy of rice polishing control.

[0118] Description of reference numerals:

[0119] 10…sample plate, 10a…bottom surface, 11…gloss measurement area, 12…whiteness measurement area, 15…rice grains, 20…workbench, 20a…opening, 23…motor, 30…gloss meter, 31…first light source, 32…second light source, 33…camera, 34…gloss calculation unit, 40…whiteness meter, 41a, 41b…third light source, 42…light receiving unit, 43…whiteness calculation unit, 43a…calibration unit, 51…display unit, 201…rice polishing machine, 202…rice whitening machine.

Claims

1. A rice grain quality measuring device, characterized in that: The rice grain quality measuring device comprises: A sample plate comprising a gloss sample area in which rice grains are arranged in a layer horizontally and a whiteness sample area filled with multiple layers of rice grains; a turntable for placing the sample disc; a gloss measuring device for irradiating a surface of rice grains placed in the gloss sample area of ​​the sample disk on the turntable with gloss measuring light and receiving reflected light to measure the gloss of the rice grains; as well as a whiteness measuring device for irradiating rice grains placed in the whiteness sample area of ​​the sample disk on the turntable with light for whiteness measurement and receiving light reflected from the rice grains on the sample disk to measure the whiteness of the rice grains; The gloss measuring device irradiates the rice grains in the gloss sample area with the gloss measuring light while rotating the turntable, receives the reflected light, calculates the gloss value according to the rotation angle of the turntable, and then finds the average value. One or more reference plates are arranged on the lower surface of the turntable. As the turntable rotates, the sample disk and the one or more reference plates are sequentially arranged at positions where they are irradiated with the light for whiteness measurement. The gloss sample area of ​​the sample disk is placed at the rotation center of the turntable. The whiteness sample area and the reference plate are arranged on the same circle centered on the rotation axis of the turntable.

2. The rice grain quality measuring device according to claim 1, characterized in that The gloss meter is arranged above the turntable. The whiteness measuring device is disposed below the turntable, irradiates light for whiteness measurement from the lower surface of the sample disk placed on the turntable through the sample disk, and receives reflected light from rice grains in the sample disk through the sample disk.

3. The rice grain quality measuring device according to claim 2, characterized in that Regarding the whiteness sample area, the sample disk is made of a material that transmits the light for whiteness measurement.

4. The rice grain quality measuring device according to claim 3, characterized in that The turntable is provided with an opening for placing the whiteness sample area of ​​the sample disk or a window for transmitting the light for whiteness measurement.

5. The rice grain quality measuring device according to claim 4, characterized in that The whiteness measuring device sequentially irradiates the rice grains of the sample disk and the one or more reference plates passing a position irradiated with the whiteness measuring light while continuously rotating the turntable, and receives reflected light.

6. The rice grain quality measuring device according to claim 4, characterized in that When the sample disk and the one or more reference plates sequentially reach positions where they are irradiated with the whiteness measuring light, the whiteness measuring device stops the turntable, irradiates the whiteness measuring light, and receives reflected light.

7. The rice grain quality measuring device according to claim 3, wherein: The gloss measuring device sequentially irradiates the rice grains in the gloss sample area of ​​the sample disk with light for gloss measurement while continuously rotating the turntable, and receives reflected light.

8. The rice grain quality measuring device according to claim 3, wherein: The gloss meter includes: a first light source for irradiating the rice grains on the sample disk placed on the turntable with light of a first wavelength from obliquely above; and a second light source for irradiating the rice grains on the sample disk with light of a second wavelength from above. a camera that captures an image of the sample disk using the light of the first wavelength and the light of the second wavelength from the sample disk; and a gloss calculation unit, The gloss calculation unit generates an image of the rice grains on the sample disk using the first wavelength and an image of the rice grains on the sample disk using the second wavelength from the image captured by the camera, and calculates a gloss value of the rice grains on the sample disk based on the two images.

9. The rice grain quality measuring device according to claim 8, characterized in that The whiteness measuring device comprises: a third light source disposed below the turntable for irradiating the rice grains on the sample disk with a third light for whiteness measurement; a light receiving unit disposed below the turntable for receiving reflected light of the third light for whiteness measurement from the rice grains on the sample disk; and a whiteness calculation unit that calculates the whiteness based on the light intensity received by the light receiving unit.

10. The rice grain quality measuring device according to claim 9, wherein: The whiteness calculation unit calculates whiteness based on the received light intensity when the third light for whiteness measurement is irradiated onto the rice grains on the sample disk and the received light intensity when a reference plate is placed instead of the rice grains on the sample disk.

11. The rice grain quality measuring device according to claim 9, wherein The gloss calculation unit calculates the area of ​​the milky white rice grains included in the rice grains on the sample disk by performing predetermined processing on the image of the rice grains on the sample disk with the light of the second wavelength. The whiteness calculation unit includes a correction unit configured to correct the whiteness based on the area of ​​the milky white rice grains calculated by the gloss calculation unit.

12. The rice grain quality measuring device according to claim 2, wherein: The sample disk has the whiteness sample region provided at the center, and a gloss sample region having a shallower depth than the whiteness sample region provided so as to surround the outer periphery of the whiteness sample region.

13. The rice grain quality measuring device according to claim 1, wherein The sample tray is integrated with the turntable.

14. The rice grain quality measuring device according to claim 1, wherein The gloss meter and the whiteness meter are both arranged above the turntable.

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