Display module, test method thereof and display device

Abstract

Embodiments of the present application provide a display module, a test method thereof and a display device. The display module comprises a control circuit, a driving circuit and a display panel; the display panel comprises a test component, a test control circuit and a gate driving circuit; the driving circuit, the test component, the test control circuit and the gate driving circuit are connected in sequence; the control circuit is connected with the test control circuit, and is configured to control the test control circuit to be turned on based on a received first selection signal, so as to enable communication between the test component and the gate driving circuit; or control the test control circuit to be turned off based on a received second selection signal, so as to disable communication between the test component and the gate driving circuit. According to the embodiments of the present application, only by adding the auxiliary test circuit of the control circuit and the test control circuit, it can be determined whether the driving circuit is abnormal or the display panel itself is abnormal, the test time can be shortened, and the labor cost can be reduced.

Description

Technical Field

[0001] This application relates to the field of display technology, and more specifically, to a display module and its testing method, and a display device. Background Technology

[0002] With the development of display technology, GOA (Gate on Array) technology is an advanced technology that integrates the gate driving circuit within the display panel. Because it eliminates the need for a gate driving chip, GOA-based display panels offer advantages such as narrow bezels and low cost. However, GOA technology has also encountered several problems during its development, such as reliability issues: under high-reliability conditions, during signal transmission, abnormalities in the TFTs (Thin Film Transistors) within the GOA circuit can prevent the driving voltage from being applied correctly, thus affecting the display.

[0003] For testing purposes, an ET (Electrical test) Pad structure is set inside the display panel to perform ET tests. However, during the ET test, it was found that if the signal obtained from the ET Pad is abnormal, it is impossible to further determine whether the problem lies with the IC (driver circuit) that drives the GOA circuit or with the GOA circuit itself. Summary of the Invention

[0004] This application addresses the shortcomings of existing methods by proposing a display module, its testing method, and a display device to solve the technical problem that existing ET testing cannot further determine whether the problem lies with the IC driving the GOA circuit or with the GOA circuit itself.

[0005] In a first aspect, embodiments of this application provide a display module, including: a control circuit, a driving circuit, and a display panel; the display panel includes a test component, a test control circuit, and a gate driving circuit;

[0006] The drive circuit, test components, test control circuit, and gate drive circuit are connected in sequence;

[0007] A control circuit, connected to a test control circuit, is used to control the test control circuit to turn on based on a received first selection signal, so that the test component and the gate drive circuit are connected; or, based on a received second selection signal, control the test control circuit to turn off, so that the test component and the gate drive circuit are disconnected.

[0008] One possible implementation includes a timing controller;

[0009] A timing controller, connected to a control circuit, is used to output a first selection signal or a second selection signal to the control circuit.

[0010] A control circuit, connected to a test control circuit, is used to receive a first selection signal or a second selection signal, and based on the first selection signal, output a first control signal to the test control circuit, or based on the second selection signal, output a second control signal to the test control circuit; the first control signal is used to control the test control circuit to be turned on, and the second control signal is used to control the test control circuit to be turned off.

[0011] In one possible implementation, the control circuit includes a first switch module and a second switch module;

[0012] The control terminals of the first and second switch modules are connected, and are also connected to the timing controller.

[0013] The first terminal of the first switch module is connected to the first signal terminal, and the first terminal of the second switch module is connected to the second signal terminal. The first signal terminal is used to receive the first control signal, and the second signal terminal is used to receive the second control signal.

[0014] The second terminal of the first switch module is connected to the second terminal of the second switch module, and is connected to the test control circuit.

[0015] In one possible implementation, the first switching module includes a first transistor, and the second switching module includes a second transistor;

[0016] The control electrode of the first transistor and the control electrode of the second transistor are connected together and connected to the timing controller.

[0017] The first terminal of the first transistor is connected to the first signal terminal, and the first terminal of the second transistor is connected to the second signal terminal;

[0018] The second terminal of the first transistor is connected to the second terminal of the second transistor, and is connected to the test control circuit.

[0019] In one possible implementation, the test components include several test pads; the test control circuit includes several third switch modules.

[0020] Several test pads are connected to the drive circuit;

[0021] Several test pads are connected one-to-one with several third switch modules;

[0022] Several third-switch modules are connected to the gate drive circuit.

[0023] In one possible implementation, the third switching module includes a third transistor;

[0024] The first terminal of the third transistor is connected to the test pad, the second terminal of the third transistor is connected to the gate drive circuit, and the control terminal of the third transistor is connected to the control circuit.

[0025] In one possible implementation, the display panel includes a display area and a peripheral area; the gate drive circuit is located in the peripheral area and includes multiple cascaded GOA circuits;

[0026] The test components and test control circuits are all located in the peripheral area.

[0027] Secondly, embodiments of this application provide a display device, including: a display module as described in the first aspect.

[0028] Thirdly, embodiments of this application provide a testing method for a display module as described in the first aspect, including:

[0029] In the first detection mode, a first selection signal is received, and the test control circuit is turned on based on the first selection signal so that the test component and the gate drive circuit are connected to test the drive circuit and the display panel.

[0030] In the second detection mode, a second selection signal is received, and the test control circuit is turned off based on the second selection signal to disconnect the test component and the gate drive circuit so as to test the drive circuit.

[0031] In one possible implementation, the test control circuit is turned on based on a first selection signal, including:

[0032] Based on the first selection signal, the control circuit outputs a first control signal to the test control circuit, and the first control signal is used to control the test control circuit to turn on.

[0033] In one possible implementation, the test control circuit is turned off based on the second selection signal, including:

[0034] Based on the second selection signal, the control circuit outputs a second control signal to the test control circuit, which is used to control the test control circuit to turn off.

[0035] The beneficial technical effects of the technical solutions provided in this application include:

[0036] The display module provided in this application embodiment adds a control circuit and a test control circuit. The test control circuit is connected between the test component and the gate driving circuit, and the control circuit is connected to the test control circuit. When a second selection signal is received, the test control circuit is turned off, disconnecting the test component and the gate driving circuit. At this time, the driving circuit and the test component are connected. By detecting whether the signal of the test component is abnormal, it can be determined whether the driving circuit is abnormal. If the driving circuit is determined to be normal, when a first selection signal is received, the test control circuit is turned on, connecting the test component and the gate driving circuit. At this time, the driving circuit, the test component, and the gate driving circuit are connected sequentially. By determining whether the signal of the test component is abnormal, it can be determined whether the gate driving circuit is abnormal, i.e., whether the display panel itself is abnormal.

[0037] This application embodiment can determine whether the problem lies in the drive circuit or the display panel itself by simply adding a control circuit and an auxiliary test circuit for the test control circuit. This eliminates the need to replace the drive circuit, shortens the test time, reduces labor costs, greatly improves the testability of the display panel when it malfunctions, and makes testing more convenient.

[0038] Additional aspects and advantages of this application will be set forth in part in the description which follows, and will become apparent from the description or may be learned by practice of this application. Attached Figure Description

[0039] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the following description of the embodiments taken in conjunction with the accompanying drawings, wherein:

[0040] Figure 1 This is a schematic diagram of the structure of a display module in the prior art;

[0041] Figure 2 This is a schematic diagram of the structure of a display module provided in an embodiment of this application;

[0042] Figure 3 A schematic diagram of the circuit principle of a control circuit provided in an embodiment of this application;

[0043] Figure 4 A flowchart illustrating a testing method for a display module provided in an embodiment of this application;

[0044] Figure 5 This is a flowchart illustrating another testing method for a display module provided in an embodiment of this application.

[0045] Figure label:

[0046] 10-Control circuit, 20-Drive circuit, 30-Display panel, 31-Test component, 32-Test control circuit, 33-Gate drive circuit, 40-Timing controller;

[0047] 11-First switch module, 12-Second switch module. Detailed Implementation

[0048] This application is described in detail below. Examples of embodiments of this application are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar components or components having the same or similar functions throughout. Furthermore, detailed descriptions of known technologies that are unnecessary for the features of this application are omitted. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain this application, and should not be construed as limiting this application.

[0049] It will be understood by those skilled in the art that, unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains. It should also be understood that terms such as those defined in general dictionaries should be understood to have the same meaning as in the context of the prior art, and should not be interpreted in an idealized or overly formal sense unless specifically defined as herein.

[0050] Those skilled in the art will understand that, unless specifically stated otherwise, the singular forms “a,” “an,” “the,” and “the” used herein may also include the plural forms. It should be further understood that the term “comprising” as used in this application means the presence of the stated features, integers, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof. It should be understood that when we say an element is “connected” or “coupled” to another element, it can be directly connected or coupled to the other element, or there may be intermediate elements. Furthermore, “connected” or “coupled” as used herein can include wireless connections or wireless coupling. The term “and / or” as used herein includes all or any units and all combinations of one or more associated listed items.

[0051] like Figure 1 The image shows a standard ET circuit design for a display panel. Figure 1The diagram shows the GOA circuits located on the left and right sides of the display area of ​​the display panel. The left GOA circuit includes multiple cascaded GOA units (the diagram shows the first-level GOA unit GOA L1, the second-level GOA unit GOA L2, the (n-1)th-level GOA unit GOA Ln-1, and the nth-level GOA unit GOALn, where n is a positive integer, specifically equal to the number of rows on the display panel); the right GOA circuit also includes multiple cascaded GOA units (the diagram shows the first-level GOA unit GOA R1, the second-level GOA unit GOA R2, the (n-1)th-level GOA unit GOARn-1, and the nth-level GOA unit GOA). Rn, where n is a positive integer (specifically equal to the number of rows on the display panel), both the left and right GOA circuits need to be driven by IC circuits bound to the display panel. Specifically, the IC circuits output the following signals to the left GOA circuit: frame trigger signal STVL and clock signal CLKL. The IC circuits output the following signals to the right GOA circuit: frame trigger signal STVR and clock signal CLKR. The frame trigger signals STVL and STVR are the GOA start signals, and also the trigger signals for row driving.

[0052] During ET testing, an ET Pad is installed within the display panel. Specifically, the ET Pad structure mainly consists of measurable blocks that can be connected to various signal traces. These blocks facilitate testing with oscilloscope probes. By testing the signal on the ET Pad, it can be determined whether there are any abnormalities in the signals applied to the display panel. Figure 1 As shown, ET Pad includes ET Pad1 (e.g. Figure 1 The gray box indicating the received frame trigger signal STVL), ET Pad2 (such as...) Figure 1 The gray box indicating the receiving clock signal CLKL), ET Pad3 (such as...) Figure 1 The gray box indicating the received frame trigger signal STVR) and ET Pad4 (such as Figure 1 (The gray box indicating the receiving clock signal CLKR).

[0053] However, during the ET test, it was found that if the signal obtained from the ET Pad was abnormal, since the same signal lines of the display panel and the IC circuit are directly connected, that is, the IC circuit is directly connected to the GOA circuit through the ET Pad, it is impossible to further determine whether the IC circuit or the GOA circuit itself is abnormal (i.e., the display panel itself is abnormal).

[0054] Currently, in related technologies, to further determine whether the problem lies with the IC circuit or the display panel itself, the IC circuit is typically replaced. However, replacing the IC circuit requires re-bonding the new IC circuit, which not only affects testing time but also increases labor costs.

[0055] The display module, testing method, and display device provided in this application aim to solve the technical problem of existing technologies that use IC circuit replacement to determine whether the problem is with the IC circuit or the display panel itself. However, the method of replacing the IC circuit requires re-bonding the new IC circuit, which not only affects the testing time but also increases labor costs.

[0056] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments.

[0057] This application provides a display module, such as... Figure 2 As shown, the display module includes: a control circuit 10, a driving circuit 20, and a display panel 30; the display panel 30 includes a test component 31, a test control circuit 32, and a gate driving circuit 33.

[0058] The driving circuit 20, the test component 31, the test control circuit 32, and the gate driving circuit 33 are connected in sequence;

[0059] The control circuit 10, connected to the test control circuit 32, is used to control the test control circuit 32 to turn on based on a received first selection signal, so that the test component 31 and the gate drive circuit 33 are connected; or, based on a received second selection signal, control the test control circuit 32 to turn off, so that the test component 31 and the gate drive circuit 33 are disconnected.

[0060] The display module provided in this embodiment adds a control circuit 10 and a test control circuit 32. The test control circuit 32 is connected between the test component 31 and the gate driving circuit 33, and the control circuit 10 is connected to the test control circuit 32. When a second selection signal is received, the test control circuit 32 is turned off, so that the test component 31 and the gate driving circuit 33 are disconnected. At this time, the driving circuit 20 and the test component 31 are connected. By detecting whether the signal of the test component 31 is abnormal, it can be determined whether the driving circuit 20 is abnormal. If the driving circuit is determined to be normal, when a first selection signal is received, the test control circuit 32 is turned on, so that the test component 31 and the gate driving circuit 33 are connected. At this time, the driving circuit 20, the test component 31, and the gate driving circuit 33 are connected in sequence. By detecting whether the signal of the test component 31 is abnormal, it can be determined whether the gate driving circuit 33 is abnormal, and thus whether the display panel itself is abnormal.

[0061] This application embodiment can determine whether the problem lies with the drive circuit 20 or the display panel 30 itself simply by adding a control circuit 10 and a test control circuit 32. This eliminates the need to replace the drive circuit, shortens the testing time, reduces labor costs, greatly improves the testability of the display panel when it malfunctions, and makes testing more convenient.

[0062] In one possible implementation, such as Figure 2 As shown, the display module includes a timing controller 40;

[0063] The timing controller 40 is connected to the control circuit 10 and is used to output a first selection signal or a second selection signal to the control circuit 10.

[0064] The control circuit 10 is connected to the test control circuit 32 and is used to receive a first selection signal or a second selection signal, and output a first control signal to the test control circuit 32 based on the first selection signal, or output a second control signal to the test control circuit 32 based on the second selection signal; the first control signal is used to control the test control circuit 32 to be turned on, and the second control signal is used to control the test control circuit 32 to be turned off.

[0065] The display module provided in this application embodiment outputs a selection signal through a timing controller, so that the control circuit 10 outputs a control signal to the test control circuit to control the on / off state of the test control circuit, thereby determining whether there is an abnormality in the drive circuit or the display panel itself. It can automatically control whether there is an abnormality in the test drive circuit or the display panel itself, without the need to add a new controller. The test is simple and convenient, further reducing costs.

[0066] In one possible implementation, such as Figure 3As shown, the control circuit 10 includes a first switch module 11 and a second switch module 12.

[0067] The control terminal of the first switch module 11 is connected to the control terminal of the second switch module 12, and is connected to the timing controller 40 through the input terminal Vg.

[0068] The first terminal of the first switch module 11 is connected to the first signal terminal VGH, and the first terminal of the second switch module 12 is connected to the second signal terminal VGL. The first signal terminal VGH is used to receive the first control signal, and the second signal terminal VGL is used to receive the second control signal.

[0069] The second end of the first switch module 11 is connected to the second end of the second switch module 12, and is connected to the test control circuit 32 through the output terminal Output.

[0070] For example, such as Figure 3 As shown, the first switch module 11 includes a first transistor T1, and the second switch module 12 includes a second transistor T2;

[0071] The control electrode of the first transistor T1 is connected to the control electrode of the second transistor T2, and is connected to the timing controller 40 through the input terminal Vg.

[0072] The first terminal of the first transistor T1 is connected to the first signal terminal VGH, and the first terminal of the second transistor T2 is connected to the second signal terminal VGL.

[0073] The second terminal of the first transistor T1 is connected to the second terminal of the second transistor T2, and is connected to the test control circuit 32 through the output terminal Output.

[0074] Optionally, the first transistor T1 is an N-type transistor and the second transistor T2 is a P-type transistor.

[0075] In specific implementations, the first transistor T1 and the second transistor T2 can be thin-film transistors (TFTs), metal-oxide-semiconductor field-effect transistors (MOSs), or other types of transistors, without limitation here. In specific implementations, the first terminal of these transistors can be either the source or the drain, and the second terminal can be either the drain or the source. Their functions can be interchanged depending on the transistor type and the input signal, without specific distinction here.

[0076] In a specific example, such as Figure 2 and Figure 3As shown, the first transistor T1 is an NMOS transistor, and the second transistor T2 is a PMOS transistor. The signal at the input terminal Vg is output by the timing controller 40. When the signal at the input terminal Vg is high (i.e., the timing controller 40 outputs the first selection signal), the first transistor T1 is turned on, the second transistor T2 is turned off, and the output terminal Output is high, outputting to the test control circuit 32. This ensures that the control electrodes of the transistors (e.g., TFT transistors) in the test control circuit 32 are all loaded with a high level. When the signal at the input terminal Vg is low (i.e., the timing controller 40 outputs the second selection signal), the second transistor T2 is turned on, the first transistor T1 is turned off, and the output terminal Output is low, outputting to the test control circuit 32. This ensures that the control electrodes of the transistors (e.g., TFT transistors) in the test control circuit 32 are all loaded with a low level. The timing controller 40 can select the detection mode through the first transistor T1 and the second transistor T2.

[0077] In one possible implementation, test component 31 includes several test pads (ET Pads, such as...). Figure 2 The gray boxes representing the received frame trigger signal STVL, the received clock signal CLKL, the received frame trigger signal STVR, and the received clock signal CLKR are shown in the image. The specific setup of the test pads is similar to existing technologies and will not be described in detail here. The test control circuit 32 includes several third switch modules (such as...). Figure 2 (Several transistors in the circuit); several test pads are connected to the drive circuit 20; several test pads are connected to several third switch modules in a one-to-one correspondence; several third switch modules are connected to the gate drive circuit 33.

[0078] In one possible implementation, such as Figure 2 As shown, the third switching module includes a third transistor T3 (e.g., Figure 2 (The transistor in the middle); the first terminal of the third transistor T3 is connected to the test pad, the second terminal of the third transistor T3 is connected to the gate drive circuit 33, and the control terminal of the third transistor T3 is connected to the control circuit 10.

[0079] The control terminal of the third transistor T3 is connected to the output terminal Output in the control circuit 10 to receive the control signal output by the control circuit 10.

[0080] Optionally, the third transistor T3 can be either an N-type transistor or a P-type transistor, as will be understood by those skilled in the art. Figure 2 or Figure 3The circuit connection shown is only an example of the display module provided in this application embodiment. When the type of each transistor changes, the connection method of each component in the display module provided in this application embodiment can be adjusted accordingly. The adjusted connection method still falls within the protection scope of this application embodiment.

[0081] In a specific implementation, the third transistor T3 can be a thin-film transistor (TFT) or a metal-oxide-semiconductor field-effect transistor (MOS), without limitation. In a specific implementation, the first terminal of these transistors can be either the source or the drain, and the second terminal can be either the drain or the source. Depending on the transistor type and the input signal, their functions can be interchanged, without specific distinction here.

[0082] In one possible implementation, such as Figure 2 As shown, the display panel 30 includes a display area and a peripheral area; the gate drive circuit 33 is located in the peripheral area and includes multiple cascaded GOA units (such as...). Figure 2 The gate drive circuit 33 is configured in a manner similar to that of the prior art, and will not be described in detail here; the test component 31 and the test control circuit 32 are both located in the peripheral area of ​​the display panel 30.

[0083] Optionally, the gate driving circuit 33 may be located on one or both sides of the display area, which is not limited in this application. Figure 2 The gate drive circuit 33 is located on both sides of the display area.

[0084] In a specific application scenario, combined with Figures 2-5 As shown, the basic process of the display module's automatic control detection mode is as follows: Figure 4 As shown. When the display module is subjected to oscilloscope ET testing, the tester can select one of two testing modes as needed.

[0085] like Figure 2 and Figure 3 As shown, the example uses the first transistor T1 as an N-type transistor, the second transistor T2 as a P-type transistor, and the third transistor T3 as an N-type transistor.

[0086] When the first detection mode is selected, the timing controller 40 outputs a first selection signal (e.g., high level) to the control circuit 10, causing the input terminal Vg in the control circuit 10 to be loaded with a high level. At this time, the first transistor T1 in the control circuit 10 is turned on, the second transistor T2 is turned off, and the output terminal Output outputs the first control signal (high level signal) of the first signal terminal VGH, thereby controlling the third transistor T3 in the test control circuit 32 to be turned on. The test component 31 is connected to the gate drive circuit 33, and the GOA signal output by the drive circuit is transmitted to the gate drive circuit 33 of the display panel 30 through the test control circuit 32. At this time, the ET Pad is tested by the oscilloscope probe (e.g., Figure 2 The electrical signals obtained by the gray boxes of the received frame trigger signal STVL, the received clock signal CLKL, the received frame trigger signal STVR, and the received clock signal CLKR are the electrical signals of the display panel 33 and the driving circuit 20. Specifically, the electrical signal can be a voltage signal. For example, by testing the ET Pad with an oscilloscope probe (the gray box indicating the Receive Frame Trigger Signal STVL), if the waveform of the voltage signal obtained by testing the ET Pad with the oscilloscope probe is the same as the preset voltage waveform of the Frame Trigger Signal STVL, then the voltage signal is normal. If the waveform of the voltage signal obtained by testing the ET Pad with the oscilloscope probe is different from the preset voltage waveform of the Frame Trigger Signal STVL, then the voltage signal is abnormal. Similarly, by testing the ET Pad with an oscilloscope probe (the gray box indicating the Receive Clock Signal CLKL), if the waveform of the voltage signal obtained by testing the ET Pad with the oscilloscope probe is the same as the preset voltage waveform of the Clock Signal CLKL, then the voltage signal is normal. If the waveform of the voltage signal obtained by testing the ET Pad with the oscilloscope probe is different from the preset voltage waveform of the Clock Signal CLKL, then the voltage signal is abnormal.

[0087] When the second detection mode is selected, the timing controller 40 outputs a second selection signal (e.g., low level) to the control circuit 10, causing the input terminal Vg in the control circuit 10 to be loaded with a low level. At this time, the first transistor T1 in the control circuit 10 is turned off, the second transistor T2 is turned on, and the output terminal Output outputs the second control signal (low level signal) of the second signal terminal VGL, thereby controlling the third transistor T3 in the test control circuit 32 to be turned off. The test component 31 is disconnected from the gate drive circuit 33, and the GOA signal output by the drive circuit can only be transmitted to the ET Pad (e.g., Figure 2 (STVL, CLKL, STVR, CLKR in the image), at this time, test the ET Pad (e.g., using oscilloscope probes) Figure 2The electrical signals obtained from STVL, CLKL, STVR, and CLKR are the electrical signals of the drive circuit 20. Specifically, these electrical signals can be voltage signals.

[0088] In practical applications, the second detection mode can be selected first, turning off the test control circuit and disconnecting the test component from the gate drive circuit. At this time, the drive circuit and test component are connected. By detecting whether the signal from the test component is abnormal, it can be determined whether the drive circuit is abnormal. If the drive circuit is determined to be normal, the first detection mode can then be selected, turning on the test control circuit and connecting the test component and the gate drive circuit. At this time, the drive circuit, test component, and gate drive circuit are connected sequentially. By determining whether the signal from the test component is abnormal, it can be determined whether the gate drive circuit is abnormal, i.e., whether the display panel itself is abnormal.

[0089] This application embodiment can determine whether the problem lies in the driving circuit or the display panel itself simply by adding a control circuit and a test control circuit. It eliminates the need to replace the driving circuit, thus shortening the testing time, reducing labor costs, greatly improving the testability of the display panel when it malfunctions, and making testing more convenient.

[0090] Based on the same inventive concept, this application provides a display device, including a display module as described in any of the optional implementations above. The display device can be any product or component with display functionality, such as a mobile phone, tablet computer, television, monitor, laptop computer, digital photo frame, or navigator. Implementation of this display device can refer to the embodiments of the display panel described above; repeated details will not be repeated.

[0091] The display device provided in this application has the same inventive concept and the same beneficial effects as the previous embodiments. For the contents not shown in detail in this display device, please refer to the previous embodiments, and they will not be repeated here.

[0092] Based on the same inventive concept, embodiments of this application provide a testing method for a display module as described in any of the optional implementations above, such as... Figure 4 As shown, the testing method for this display module includes:

[0093] S1: In the first detection mode, a first selection signal is received, and the test control circuit is turned on based on the first selection signal so that the test component and the gate drive circuit are connected to test the drive circuit and the display panel.

[0094] S2: In the second detection mode, a second selection signal is received, and the test control circuit is turned off based on the second selection signal to disconnect the test component from the gate drive circuit, so as to test the drive circuit. It should be understood that although the steps in the flowchart of the attached figures are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. The execution order of steps S1 and S2 can be interchanged.

[0095] Optionally, the second detection mode can be selected first, turning off the test control circuit and disconnecting the test component from the gate drive circuit. In this mode, the drive circuit and test component are connected. By detecting whether the signal from the test component is abnormal, it can be determined whether the drive circuit is abnormal. If the drive circuit is determined to be normal, the first detection mode can then be selected, turning on the test control circuit and connecting the test component and the gate drive circuit. In this mode, the drive circuit, test component, and gate drive circuit are sequentially connected. By determining whether the signal from the test component is abnormal, it can be determined whether the gate drive circuit is abnormal, i.e., whether the display panel itself is abnormal. This embodiment of the application, by simply adding a control circuit and a test control circuit, can determine whether the abnormality lies in the drive circuit or the display panel itself, without needing to replace the drive circuit. This shortens the testing time, reduces labor costs, greatly improves the testability of display panel abnormalities, and makes testing more convenient.

[0096] In one possible implementation, the test control circuit is turned on based on a first selection signal, including:

[0097] Based on the first selection signal, the control circuit outputs a first control signal to the test control circuit, and the first control signal is used to control the test control circuit to turn on.

[0098] In one possible implementation, the test control circuit is turned off based on the second selection signal, including:

[0099] Based on the second selection signal, the control circuit outputs a second control signal to the test control circuit, which is used to control the test control circuit to turn off.

[0100] By applying the embodiments of this application, at least the following beneficial effects can be achieved:

[0101] The display module provided in this application embodiment adds a control circuit and a test control circuit. The test control circuit is connected between the test component and the gate driving circuit, and the control circuit is connected to the test control circuit. When a second selection signal is received, the test control circuit is turned off, disconnecting the test component and the gate driving circuit. At this time, the driving circuit and the test component are connected. By detecting whether the signal of the test component is abnormal, it can be determined whether the driving circuit is abnormal. If the driving circuit is determined to be normal, when a first selection signal is received, the test control circuit is turned on, connecting the test component and the gate driving circuit. At this time, the driving circuit, the test component, and the gate driving circuit are connected sequentially. By determining whether the signal of the test component is abnormal, it can be determined whether the gate driving circuit is abnormal, i.e., whether the display panel itself is abnormal.

[0102] This application embodiment can determine whether the problem lies in the drive circuit or the display panel itself by simply adding a control circuit and an auxiliary test circuit for the test control circuit. This eliminates the need to replace the drive circuit, shortens the test time, reduces labor costs, greatly improves the testability of the display panel when it malfunctions, and makes testing more convenient.

[0103] Those skilled in the art will understand that the steps, measures, and solutions in the various operations, methods, and processes discussed in this application can be alternated, modified, combined, or deleted. Furthermore, other steps, measures, and solutions in the various operations, methods, and processes discussed in this application can also be alternated, modified, rearranged, decomposed, combined, or deleted. Furthermore, steps, measures, and solutions in the prior art that are similar to those disclosed in this application can also be alternated, modified, rearranged, decomposed, combined, or deleted.

[0104] In the description of this application, it should be understood that the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0105] The terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this application, unless otherwise stated, "a plurality of" means two or more.

[0106] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal communication between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0107] In the description of this specification, specific features, structures, materials, or characteristics may be combined in any suitable manner in one or more embodiments or examples.

[0108] It should be understood that although the steps in the flowcharts of the accompanying figures are shown sequentially as indicated by the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the accompanying figures may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times, and their execution order is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.

[0109] The above description is only a partial embodiment of this application. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of this application, and these improvements and modifications should also be considered within the scope of protection of this application.

Claims

1. A display module, characterized in that, include: Control circuit, drive circuit, display panel and timing controller; the display panel includes test components, test control circuit and gate drive circuit; The driving circuit, the test component, the test control circuit, and the gate driving circuit are connected in sequence. The timing controller is used to output a first selection signal or a second selection signal to the control circuit; The control circuit is configured to receive the first selection signal or the second selection signal, and output a first control signal to the test control circuit based on the first selection signal, or output a second control signal to the test control circuit based on the second selection signal. The first control signal is used to control the test control circuit to be turned on, so that the test component and the gate drive circuit are connected; the second control signal is used to control the test control circuit to be turned off, so that the test component and the gate drive circuit are disconnected. The control circuit includes a first switch module and a second switch module; The control terminal of the first switch module is connected to the control terminal of the second switch module, and is also connected to the timing controller; The first terminal of the first switch module is connected to the first signal terminal, and the first terminal of the second switch module is connected to the second signal terminal. The first signal terminal is used to receive the first control signal, and the second signal terminal is used to receive the second control signal. The second terminal of the first switch module and the second terminal of the second switch module are connected, and are also connected to the test control circuit; When the test component and the gate drive circuit are disconnected, the drive circuit and the test component are connected. By detecting whether the signal of the test component is abnormal, it is determined whether the drive circuit is abnormal. If the driving circuit is determined to be normal, when the test component and the gate driving circuit are connected, the driving circuit, the test component and the gate driving circuit are connected in sequence. By detecting whether the signal of the test component is abnormal, it is determined whether the gate driving circuit is abnormal.

2. The display module according to claim 1, characterized in that, The first switching module includes a first transistor, and the second switching module includes a second transistor; The control electrode of the first transistor and the control electrode of the second transistor are connected, and are also connected to the timing controller; The first terminal of the first transistor is connected to the first signal terminal, and the first terminal of the second transistor is connected to the second signal terminal; The second terminals of the first transistor and the second transistor are connected and connected to the test control circuit.

3. The display module according to claim 1, characterized in that, The test assembly includes several test pads; the test control circuit includes several third switch modules. Several test pads are connected to the drive circuit; Several test pads are connected one-to-one with several third switch modules; Several third switch modules are connected to the gate drive circuit.

4. The display module according to claim 3, characterized in that, The third switching module includes a third transistor; The first electrode of the third transistor is connected to the test pad, the second electrode of the third transistor is connected to the gate drive circuit, and the control electrode of the third transistor is connected to the control circuit.

5. The display module according to claim 1, characterized in that, The display panel includes a display area and a peripheral area; the gate driving circuit is located in the peripheral area and includes multiple cascaded GOA circuits; Both the test components and the test control circuit are located in the surrounding area.

6. A display device, characterized in that, include: The display module as described in any one of claims 1 to 5.

7. A testing method for a display module as described in any one of claims 1 to 5, characterized in that, include: In the first detection mode, a first selection signal is received, and the test control circuit is turned on based on the first selection signal so that the test component and the gate driving circuit are connected to test the driving circuit and the display panel. In the second detection mode, a second selection signal is received, and the test control circuit is controlled to turn off based on the second selection signal, so as to disconnect the test component and the gate drive circuit for testing the drive circuit.

8. The testing method for the display module according to claim 7, characterized in that, The step of controlling the test control circuit to turn on based on the first selection signal includes: Based on the first selection signal, the control circuit outputs a first control signal to the test control circuit, and the first control signal is used to control the test control circuit to be turned on. And, the step of controlling the test control circuit to shut down based on the second selection signal includes: Based on the second selection signal, the control circuit outputs a second control signal to the test control circuit, and the second control signal is used to control the test control circuit to turn off.

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