A small disturbance primary frequency modulation qualified rate test method, medium and system

Abstract

The present invention discloses a small disturbance primary frequency modulation qualified rate test method, medium and system, and the method comprises the steps of: 1) extracting the small disturbance frequency data of the primary frequency modulation of the unit; 2) randomly selecting a group of small disturbance frequency data from the small disturbance frequency data of the primary frequency modulation of the unit, and generating a small disturbance test signal of the primary frequency modulation; 3) obtaining the power response data of the small disturbance test primary frequency modulation and calculating the contribution power rate according to the small disturbance test signal of the primary frequency modulation; 4) repeating steps 2)-3) after a certain interval, collecting and obtaining the contribution power rate data set, and obtaining the small disturbance primary frequency modulation qualified rate according to the contribution power rate data set. The present invention is simple to operate as a whole, can solve the problem that the qualified rate of the next frequency modulation under small disturbance is difficult to test, and provides basic data for comprehensively evaluating and improving the performance of the next frequency modulation under small disturbance.

Description

Technical Field

[0001] The present invention mainly relates to the technical field of primary frequency modulation testing, and in particular to a small-disturbance primary frequency modulation qualified rate testing method, medium and system. Background Art

[0002] At present, the power grid's assessment and management of the primary frequency regulation performance of generator sets includes small disturbance assessment items. Its assessment power formula stipulates that the small disturbance primary frequency regulation pass rate has an important impact on the assessment results. At present, conventional primary frequency regulation tests only consider the primary frequency regulation performance of units under large disturbances. In addition, conventional test signals use step curves and power grid frequency accident curves, which cannot reflect the random and small fluctuation characteristics of the power grid frequency during small primary frequency disturbances.

[0003] Since conventional primary frequency regulation tests do not consider testing the primary frequency regulation small disturbance pass rate, how to design and implement the test method for the primary frequency regulation small disturbance pass rate is of great significance for fully understanding the primary frequency regulation performance of the generator set under the corresponding evaluation system and further guiding the improvement of the primary frequency regulation performance of the generator set. Summary of the invention

[0004] The technical problem to be solved by the present invention is: in view of the technical problems existing in the prior art, the present invention provides a simple and easy-to-operate small-disturbance primary frequency modulation qualified rate testing method, medium and system.

[0005] In order to solve the above technical problems, the technical solution proposed by the present invention is:

[0006] A small disturbance primary frequency modulation pass rate test method comprises the following steps:

[0007] 1) Extract the frequency data of small disturbance of primary frequency modulation of the unit;

[0008] 2) Randomly select a group of small disturbance frequency data from the primary frequency modulation small disturbance frequency data of the unit to generate a primary frequency modulation small disturbance test signal;

[0009] 3) According to the primary frequency modulation small disturbance test signal, obtain the primary frequency modulation power response data of the small disturbance test and calculate the contribution power rate;

[0010] 4) Repeat steps 2)-3) after a certain time interval to collect a contribution power rate data set, and obtain a small disturbance primary frequency modulation pass rate based on the contribution power rate data set.

[0011] Preferably, the specific process of step 1) is: extracting the frequency data of the small disturbance of the primary frequency modulation of the unit within a certain period of time X={X i}(i=1~n),X i is the frequency data of small disturbances in the i-th time period; X i ={fi,j}(j=1~m),f i,j Yes X i The frequency of small disturbances in the jth continuous time interval; f i,j Satisfy f err1 <|f i,j -f * |≤f err2 , where f * is the rated frequency, f * =50Hz, f err1 、f err2 are the lower and upper limits of the small disturbance frequency threshold respectively; X i The time interval Δt between adjacent elements is equal.

[0012] Preferably, the primary frequency modulation small disturbance frequency data is extracted from a generator set data acquisition device, wherein the generator set data acquisition device includes a distributed control system and a synchronous vector measurement device.

[0013] Preferably, the specific process of step 2) is:

[0014] 2.1) In X = {X i}(i=1~n) Randomly select a set of small disturbance frequency data X i ={f i,j}(j=1~m) and generate a frequency modulated small disturbance test signal;

[0015] 2.2) The generated f sim The analog signal is converted into 4-20 mA and sent to the distributed control system and synchronous vector measurement device in real time. sim As a FM frequency test signal.

[0016] Preferably, in step 2.1), the function expression for generating a single frequency modulation small disturbance test signal is:

[0017]

[0018] Among them, f sim is a single frequency modulated small disturbance test signal; t is the current duration of generating a single frequency modulated small disturbance test signal.

[0019] Preferably, the specific process of step 3) is:

[0020] 3.1) Read the primary frequency modulation frequency test signal data set F recorded in the synchronous vector measurement device = {f sim，k}(k=1~N) and active power data set P={P k}(k=1~N), where f sim，kis the kth primary frequency modulation small disturbance test signal recorded by the synchronous vector measurement device during the process of continuously generating the primary frequency modulation small disturbance test signal in step 2.1), P k Yes sim，k The active power signal recorded by the synchronous vector measurement device at the corresponding time point;

[0021] 3.2) According to the primary frequency modulation test signal data set F = {f sim，k}(k=1~N) and active power data set P={P k}(k=1~N), calculate the contribution power rate k.

[0022] Preferably, in step 3.2), the functional expression of the contribution power rate k is:

[0023]

[0024] In the formula, H i is the actual contribution of primary frequency modulation; H e is the theoretical contribution of primary frequency modulation;

[0025] Actual contribution of primary frequency modulation H i The function expression is:

[0026]

[0027] Where P0 is the initial load of the unit before generating a small frequency modulation test signal;

[0028] Theoretical contribution of primary frequency modulation H e The function expression is:

[0029]

[0030] Where ΔP(x) is the unit speed inequality function, ΔP(f sim,k ) indicates that the input is f sim,k The output of the speed inequality function.

[0031] Preferably, the specific process of step 4) is:

[0032] 4.1) Repeat steps 2) to 3) after a certain period of random intervals to collect the contribution power rate data set K = {k l}(l=1~M);

[0033] 4.2) Count the number of qualified times N of contribution power rate in K K , the statistical rule is when k l ≥k * , N K Add 1; where k * is the qualified threshold of contribution power rate;

[0034] 4.3) Calculate the pass rate of small disturbance primary frequency modulation

[0035] The present invention also discloses a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps of the method described above are executed.

[0036] The present invention further discloses a small disturbance primary frequency modulation qualified rate test system, comprising a memory and a processor, wherein a computer program is stored in the memory, and when the computer program is run by the processor, the steps of the method described above are executed.

[0037] Compared with the prior art, the advantages of the present invention are:

[0038] The present invention extracts the frequency data of the small disturbance of the primary frequency modulation of the unit, and generates a small disturbance test signal of the primary frequency modulation, thereby obtaining the power response data of the small disturbance test primary frequency modulation and calculating the contribution power rate, and obtains the contribution power rate data set by collecting to obtain the qualified rate of the small disturbance primary frequency modulation; the above method is simple to operate as a whole, and can solve the problem that the qualified rate of the next frequency modulation under small disturbance is difficult to test, and provide basic data for comprehensively evaluating and improving the performance of the next frequency modulation under small disturbance. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] Figure 1 The present invention is a flow chart of the testing method in an embodiment.

[0040] Figure 2 The X curve diagram (X1-X2) of the twenty-one small disturbance frequency data in the present invention is shown in FIG. 21 ). DETAILED DESCRIPTION

[0041] The present invention is further described below in conjunction with the accompanying drawings and specific embodiments.

[0042] like Figure 1 As shown, the embodiment of the present invention provides a small disturbance primary frequency modulation pass rate test method, comprising the steps of:

[0043] 1) Extract the frequency data of small disturbance of primary frequency modulation of the unit;

[0044] 2) Randomly select a group of small disturbance frequency data from the primary frequency modulation small disturbance frequency data of the unit to generate a primary frequency modulation small disturbance test signal;

[0045] 3) According to the primary frequency modulation small disturbance test signal, obtain the primary frequency modulation power response data of the small disturbance test and calculate the contribution power rate;

[0046] 4) Repeat steps 2)-3) after a certain time interval to collect a contribution power rate data set, and obtain a small disturbance primary frequency modulation pass rate based on the contribution power rate data set.

[0047] The present invention extracts the frequency data of the small disturbance of the primary frequency modulation of the unit, and generates a small disturbance test signal of the primary frequency modulation, thereby obtaining the power response data of the small disturbance test primary frequency modulation and calculating the contribution power rate, and obtains the contribution power rate data set by collecting to obtain the qualified rate of the small disturbance primary frequency modulation; the above method is simple to operate as a whole, and can solve the problem that the qualified rate of the next frequency modulation under small disturbance is difficult to test, and provide basic data for comprehensively evaluating and improving the performance of the next frequency modulation under small disturbance.

[0048] In a specific embodiment, step 1) specifically includes: extracting the small disturbance frequency data of the primary frequency modulation of the unit within a certain time period from the data acquisition device of the generator set (such as a distributed control system, a synchronous vector measurement device, etc.) X={X i}(i=1~n),X i is the frequency data of small disturbances in the i-th time period; X i ={f i,j}(j=1~m),f i,j Yes X i The frequency of small disturbances in the jth continuous time interval; f i,j Satisfy f err1 <|f i,j -f * |≤f err2 , where f * is the rated frequency, f * =50Hz, f err1 、f err2 are the lower and upper limits of the small disturbance frequency threshold, respectively, and f err1 =0.033Hz, f err2 =0.08Hz;X i The time interval Δt between adjacent elements is equal.

[0049] Specifically, if the frequency data of the small disturbance of the primary frequency regulation of 21 groups of units within 24 hours are extracted from the distributed control system, X = {X i}(i=1~21);f i,j Satisfy 0.033<|f i,j -50|≤0.08;X i In the time interval Δt=1s, the extracted unit small disturbance frequency data X curve is as follows Figure 2 shown.

[0050] In a specific embodiment, the specific process of step 2) is:

[0051] 2.1) In X = {X i}(i=1~n) Randomly select a set of small disturbance frequency data X i ={f i,j}(j=1~m) and generate a frequency modulated small disturbance test signal. The function expression for generating a frequency modulated small disturbance test signal is:

[0052]

[0053] Among them, f sim is a single frequency modulated small disturbance test signal; t is the current duration of generating a single frequency modulated small disturbance test signal.

[0054] 2.2) The generated f sim Converted into 4-20mA analog signal and sent to the distributed control system and synchronous vector measurement device in real time; the f sim As a FM frequency test signal.

[0055] In a specific embodiment, the specific process of step 3) is:

[0056] 3.1) Read the primary frequency modulation frequency test signal data set F recorded in the synchronous vector measurement device = {f sim，k}(k=1~N) and active power data set P={P k}(k=1~N), where f sim，k is the kth primary frequency modulation small disturbance test signal recorded by the synchronous vector measurement device during the process of continuously generating the primary frequency modulation small disturbance test signal in step 2.1), P k Yes sim，k The active power signal recorded by the synchronous vector measurement device at the corresponding time point;

[0057] 3.2) Calculate the contribution rate of electricity based on F and P. The function expression of the contribution rate of electricity k is:

[0058]

[0059] In the formula, H i is the actual contribution of primary frequency modulation; H e is the theoretical contribution of primary frequency modulation;

[0060] Actual contribution of primary frequency modulation H i The function expression is:

[0061]

[0062] Where P0 is the initial load of the unit before generating a small frequency modulation test signal;

[0063] Theoretical contribution of primary frequency modulation H e The function expression is:

[0064]

[0065] Where ΔP(x) is the unit speed inequality function, ΔP(f sim,k ) indicates that the input is f sim,k The output of the speed inequality function.

[0066] In a specific embodiment, the specific process of step 4) is:

[0067] 4.1) Repeat steps 2 to 3) at random intervals to collect the contribution power rate data set K = {k l}(l=1~M);

[0068] 4.2) Count the number of qualified times N of contribution power rate in K K , the statistical rule is when k l ≥k * , N K Add 1; where k * is the qualified threshold value of contribution power rate. In this embodiment, k * =0.5;

[0069] 4.3) Calculate the pass rate of small disturbance primary frequency modulation Thus obtaining the test results.

[0070] Specifically, as in step 4.1), steps 2 to 3) are repeated 40 times to collect the contribution power rate data set K = {k l}(l=1~40), as shown in the following table;

[0071] Power and electricity rate data set

[0072] <![CDATA[k1]]> <![CDATA[k2]]> <![CDATA[k3]]> <![CDATA[k4]]> <![CDATA[k5]]> <![CDATA[k6]]> <![CDATA[k7]]> <![CDATA[k8]]> <![CDATA[k9]]> <![CDATA[k 10 ]]> 0.726 0.762 0.451 0.765 0.653 0.439 0.511 0.619 0.783 0.786 <![CDATA[k 11 ]]> <![CDATA[k 12 ]]> <![CDATA[k 13 ]]> <![CDATA[k 14 ]]> <![CDATA[k 15 ]]> <![CDATA[k 16 ]]> <![CDATA[k 17 ]]> <![CDATA[k 18 ]]> <![CDATA[k 19 ]]> <![CDATA[k 20 <!-- 4 -->]]> 0.463 0.788 0.783 0.594 0.720 0.457 0.569 0.766 0.717 0.784 <![CDATA[k 21 ]]> <![CDATA[k 22 ]]> <![CDATA[k 23 ]]> <![CDATA[k 24 ]]> <![CDATA[k 25 ]]> <![CDATA[k 26 ]]> <![CDATA[k 27 ]]> <![CDATA[k 28 ]]> <![CDATA[k 29 ]]> <![CDATA[k 30 ]]> 0.662 0.414 0.740 0.774 0.671 0.703 0.697 0.557 0.662 0.468 <![CDATA[k 31 ]]> <![CDATA[k 32 ]]> <![CDATA[k 33 ]]> <![CDATA[k 34 ]]> <![CDATA[k 35 ]]> <![CDATA[k 36 ]]> <![CDATA[k 37 ]]> <![CDATA[k 38 ]]> <![CDATA[k 39 ]]> <![CDATA[k 40 ]]> 0.682 0.413 0.511 0.418 0.439 0.729 0.678 0.527 0.780 0.414

[0073] Count the number of qualified times N of contribution power rate in K K , the statistical rule is when k l N ≥ 0.5 K Add 1, and we get N K =30; Calculate the pass rate of small disturbance frequency modulation

[0074] The present invention also discloses a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the above method are executed. The present invention further discloses a small disturbance primary frequency modulation pass rate test system, including a memory and a processor, on which a computer program is stored, and when the computer program is executed by the processor, the steps of the above method are executed. The medium and the test system of the present invention correspond to the above test method and also have the advantages described in the above test method.

[0075] As shown in the present disclosure and claims, unless the context clearly indicates an exception, the words "a", "an", "a kind" and / or "the" do not specifically refer to the singular, but may also include the plural. The words "first", "second" and similar words used in the present disclosure do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, words such as "include" or "comprise" mean that the elements or objects appearing before the word include the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Words such as "connect" or "connected" and similar words are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect.

[0076] The above are only preferred embodiments of the present invention, and the protection scope of the present invention is not limited to the above embodiments. All technical solutions under the concept of the present invention belong to the protection scope of the present invention. It should be pointed out that for ordinary technicians in this technical field, some improvements and modifications without departing from the principle of the present invention should be regarded as the protection scope of the present invention.

Claims

1. A small disturbance primary frequency modulation pass rate test method, characterized in that: Includes steps: 1) Extract the frequency data of small disturbance of primary frequency regulation of the unit; 2) Randomly select a group of small disturbance frequency data from the primary frequency modulation small disturbance frequency data of the unit to generate a primary frequency modulation small disturbance test signal; 3) According to the primary frequency modulation small disturbance test signal, obtain the primary frequency modulation power response data of small disturbance test and calculate the contribution power rate; 4) Repeat steps 2)-3) after a certain interval to collect a contribution power rate data set, and obtain a small disturbance primary frequency modulation pass rate based on the contribution power rate data set; The specific process of step 1) is: extract the frequency data of the small disturbance of the primary frequency modulation of the unit within a certain period of time , It is i Frequency data of small disturbances within a time period; , yes Middle j The frequency of small disturbances in consecutive time intervals; satisfy ,in is the rated frequency, , , are the lower and upper limits of the small disturbance frequency threshold, respectively; The time interval between adjacent elements equal; The specific process of step 2) is as follows: 2.1) In Randomly select a set of small perturbation frequency data And generate a frequency modulated small disturbance test signal; 2.2) Generate Converted into 4-20mA analog signal and sent to the distributed control system and synchronous vector measurement device in real time. As a primary FM frequency test signal; In step 2.1), the function expression for generating a frequency modulated small disturbance test signal is: in, It is a frequency modulated small disturbance test signal; t is the current duration for generating a single frequency modulated small perturbation test signal.

2. The small disturbance primary frequency modulation qualified rate test method according to claim 1 is characterized in that: The primary frequency modulation small disturbance frequency data is extracted from the generator set data acquisition device, wherein the generator set data acquisition device includes a distributed control system and a synchronous vector measurement device.

3. The small disturbance primary frequency modulation qualified rate test method according to claim 1 is characterized in that: The specific process of step 3) is as follows: 3.1) Read the primary frequency modulation frequency test signal data set recorded in the synchronous vector measurement device and active power data sets , ,in It is the first recorded value of the synchronous vector measurement device during the process of continuously generating a frequency modulated small disturbance test signal in step 2.1). k A single frequency modulation small disturbance test signal, yes The active power signal recorded by the synchronous vector measurement device at the corresponding time point; 3.2) Test signal data set based on primary FM frequency and active power data sets , calculate the contribution rate k .

4. The small disturbance primary frequency modulation qualified rate test method according to claim 3 is characterized in that: In step 3.2), the contribution rate k The function expression is: In the formula, H i is the actual contribution of primary frequency modulation; H e is the theoretical contribution of primary frequency modulation; Actual contribution of primary frequency regulation H i The function expression is: In the formula, P 0 is the initial load of the unit before generating a small frequency modulation test signal; Theoretical contribution of primary frequency modulation H e The function expression is: In the formula, is the unit speed inequality function, Indicates that the input is The output of the speed inequality function.

5. The small disturbance primary frequency modulation qualified rate test method according to claim 4 is characterized in that: The specific process of step 4) is as follows: 4.1) Repeat steps 2) to 3) after a certain period of random intervals to collect the contribution power rate data set ; 4.2) Statistics K Number of qualified times of medium contribution power rate N K , the statistical rule is , N K Add 1; is the qualified threshold of contribution power rate; 4.3) Calculate the pass rate of small disturbance primary frequency modulation .

6. A computer-readable storage medium having a computer program stored thereon, characterized in that: The computer program executes the steps of the method according to any one of claims 1 to 5 when executed by a processor.

7. A small disturbance primary frequency modulation pass rate test system, comprising a memory and a processor, wherein a computer program is stored in the memory, characterized in that: The computer program executes the steps of the method according to any one of claims 1 to 5 when executed by a processor.

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