A test fixture suitable for strip-mounted diodes

Abstract

The present invention discloses a test fixture suitable for strip-mounted diodes, including a guide rail, an electrode fixing block, a material stop pin, a first transmission mechanism, a diode electrode positioning column, a second transmission mechanism, a test electrode positioning column, a third transmission mechanism and a power source; the electrode fixing block is fixed with a positive test electrode and a negative test electrode located directly below the diode electrode to be tested, and the positive test electrode and the negative test electrode are both connected to a diode tester; a vertical guide rail groove is provided on the guide rail, the material stop pin passes through the guide rail and rests on the diode to be tested, the material stop pin is connected to the first transmission mechanism, the diode electrode positioning column is connected to the second transmission mechanism, the test electrode positioning column is connected to the third transmission mechanism, and the first transmission mechanism, the second transmission mechanism, and the third transmission mechanism are all driven by a power source. The present invention replaces manual measurement of diode parameters, does not require manual intervention, has good measurement consistency, and has low operator work intensity.

Description

Technical Field

[0001] The invention relates to the field of diode testing, in particular to a testing tool suitable for strip-mounted TO / ITO packaged diodes. Background Art

[0002] At present, in order to ensure that the electrical properties of diode products fully meet the shipping standards, the TO / ITO packaged diodes in strips are tested manually before shipment. Each diode is taken out from the strip, measured with an aging socket, and then reloaded into the tube. This method requires manual intervention, has poor measurement consistency, and has high workload for operators. Summary of the invention

[0003] In view of the defects of the prior art, the present invention provides a test method suitable for strip-mounted diodes, which replaces manual measurement of diode parameters, does not require human intervention, has good measurement consistency, and reduces the workload of operators.

[0004] In order to solve the technical problem, the technical solution adopted by the present invention is: a test tool suitable for strip-mounted diodes, including a guide rail, an electrode fixing block, a material stop pin, a first transmission mechanism, a diode electrode positioning column, a second transmission mechanism, a test electrode positioning column, a third transmission mechanism and a power source; a positive test electrode and a negative test electrode are fixed on the electrode fixing block, the positive test electrode and the negative test electrode are located directly below the electrode of the diode to be tested, and the positive test electrode and the negative test electrode are both connected to a diode tester through a wire; a vertical guide rail groove is opened on the guide rail for the diode to be tested to pass through, the material stop pin passes through the guide rail and rests on the diode to be tested, the material stop pin is connected to the first transmission mechanism, and the diode electrode positioning column is connected to the third transmission mechanism. The first transmission mechanism, the second transmission mechanism, and the third transmission mechanism are all driven by a power source. When not testing, the stop pin presses the diode to be tested so that the diode to be tested cannot slide along the guide rail groove. When the test starts, the power source drives the stop pin to release the diode to be tested through the first transmission mechanism, so that the diode to be tested slides downward along the guide rail groove. At the same time, the power source drives the diode electrode positioning column and the test electrode positioning column to move through the second transmission mechanism and the third transmission mechanism. The diode electrode positioning column and the test electrode positioning column push the diode electrode and the test electrode, so that the diode electrode contacts the test electrode to achieve electrical connection, generate a test signal and transmit it to the diode tester.

[0005] Furthermore, the stop pin includes a front stop pin and a rear stop pin respectively located on both sides of the guide rail, the front stop pin includes a first front stop pin and a second front stop pin, from the height direction, the first front stop pin is the highest, the rear stop pin is located in the middle, and the second front stop pin is the lowest, when not tested, the front stop pin is in an extended state, and the rear stop pin is in a retracted state.

[0006] Furthermore, the first transmission mechanism includes a stop pin connecting block, a stop pin seat guide shaft, a first return spring, a stop pin seat, a stop pin seat transmission shaft and a stop pin seat pushing cam, the stop pin seat pushing cam is fixed on the output shaft of the power source, one end of the stop pin seat transmission shaft is closely tangent to the stop pin seat pushing cam, the other end of the stop pin seat transmission shaft is connected to the stop pin seat, one end of the stop pin connecting block is connected to the stop pin seat, the other end of the stop pin connecting block is connected to the stop pin, the stop pin guide shaft passes through the stop pin connecting block and the guide rail, and the first return spring is compressed between the stop pin connecting block and the end of the stop pin seat guide shaft.

[0007] The second transmission mechanism includes a diode electrode push seat, a diode electrode push seat transmission shaft, a diode electrode push seat pushing cam, a diode electrode push seat guide shaft, and a second reset spring. The diode electrode push seat pushing cam is fixed on the power source output shaft, one end of the diode electrode push seat transmission shaft is closely tangent to the diode electrode push seat pushing cam, the other end of the diode positioning tube transmission shaft is connected to the diode electrode push seat, the diode electrode positioning column is fixed on the diode electrode push seat, the diode electrode push seat guide shaft passes through a protrusion integrally formed on the diode electrode push seat, and the second reset spring is compressed between the protrusion and the end of the diode electrode push seat guide shaft.

[0008] The third transmission mechanism includes a test electrode pushing seat, a test electrode pushing seat transmission shaft, a test electrode pushing seat pushing cam, a test electrode pushing seat guide shaft, and a third reset spring. The test electrode pushing seat pushing cam is fixed on the power source output shaft, one end of the test electrode pushing seat transmission shaft is closely tangent to the test electrode pushing seat pushing cam, the other end of the test electrode pushing seat transmission shaft is connected to the test electrode pushing seat, the test electrode positioning column is fixed on the test electrode pushing seat, the test electrode pushing seat guide shaft passes through a protrusion integrally formed on the test electrode pushing seat, and the third reset spring is compressed between the protrusion and the end of the test electrode pushing seat guide shaft.

[0009] A positioning grating is arranged at the output end of the power source, a photoelectric switch is arranged at the set position of the positioning grating, and the photoelectric switch is connected to the controller.

[0010] There are two positive test electrodes and two negative test electrodes. The two positive test electrodes are arranged in parallel and separated by a certain gap. The two negative test electrodes are arranged under the positive test electrode in the same way. There are two test electrode positioning columns, one is located in the gap between the positive test electrode and the negative test electrode, and the other is located on the inner side of the positive test electrode and the negative test electrode.

[0011] The test electrode positioning column and the diode electrode positioning column are located at the same height. In the initial or test state, the test electrode positioning column is in a retracted state, and the diode electrode positioning column is in an ejected state. The test position is between the test electrode positioning column and the diode electrode positioning column. In the initial state, there is no diode in the test position and the test cannot be performed. In the test state, the diode slides to the test position. Due to the action of the test electrode positioning column and the diode electrode positioning column, the test electrode contacts the diode electrode, and an electrical connection can be achieved for testing.

[0012] The test electrode positioning column and the diode electrode positioning column are both made of insulating materials.

[0013] A shock-absorbing spring is arranged between the positioning pin and the guide rail.

[0014] Beneficial effects of the present invention: The present invention controls the diode to be tested to slide in the guide groove through the first transmission mechanism, controls the position of the diode electrode through the second transmission mechanism, and controls the position of the test electrode through the third transmission mechanism. Through the cooperation of the above transmission mechanisms, the diode to be tested slides to the test position, and the test electrode contacts the diode electrode to achieve electrical connection, thereby performing the test. The device operates automatically, replaces manual measurement of diode parameters, does not require manual intervention, has good measurement consistency, and has low operator workload. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a structural schematic diagram of the present invention;

[0016] Figure 2 It is a side schematic diagram of the transmission mechanism of the present invention;

[0017] Figure 3 It is a partial schematic diagram of the second transmission mechanism and the third transmission mechanism;

[0018] Figure 4 It is a partial schematic diagram of the electrode fixing block and the positive test electrode and the negative test electrode;

[0019] Figure 5 is a partial schematic diagram of a cam drive mechanism;

[0020] Figure 6 This is a schematic diagram of an ITO packaged diode;

[0021] In the figure: 1. Main bracket fixing plate; 2. Guide rail; 3. Positive test electrode; 4. Negative test electrode; 5. Electrode fixing seat; 6. Cam drive device; 7. Stepper motor; 8. Origin positioning grating; 9. Photoelectric switch; 10. Programmable controller; 11. Diode tester; 12. Touch screen; 13. Switching power supply; 14. Stepper electrode driver; 15. First front stop pin; 16. Second front stop pin; 17. Rear stop pin; 18. Strip-packed TO / IT to be tested O packaged diode; 19. material stop pin connecting block; 20. material stop pin seat guide shaft; 21. guide shaft; 22. material stop pin seat; 23. material stop pin seat transmission shaft; 24. material stop pin seat push cam; 25. diode electrode push seat; 26. diode electrode push seat transmission shaft; 27. diode electrode push seat push cam; 28. test electrode push seat; 29. ​​test electrode push seat transmission shaft; 30. test electrode push seat push cam; 31, material receiving tube, 32. diode electrode positioning column; 33. test electrode positioning column; 34. ITO packaged diode; 35. diode positive electrode; 36. diode negative electrode. DETAILED DESCRIPTION

[0022] The present invention is further described below in conjunction with the accompanying drawings and specific embodiments.

[0023] Example 1

[0024] This embodiment discloses a test fixture suitable for strip-mounted diodes. This test fixture is suitable for strip-mounted diodes, especially strip-mounted diodes in TO / ITO packages, such as Figure 6 As shown, the ITO-packaged diode 34 includes a diode positive electrode 35 and a diode negative electrode 36 . The test tool utilizes the diode positive electrode 35 and the diode negative electrode 36 to test the electrical performance of the diode.

[0025] like Figure 1 As shown, the test fixture described in this embodiment includes a main support fixing plate 1, a guide rail vertically arranged along the main support fixing plate 1, an electrode fixing block 5, a material stop pin, a first transmission mechanism, a diode electrode positioning column 32, a second transmission mechanism, a test electrode positioning column 33, a third transmission mechanism and a power source. In this embodiment, the power source is a stepper motor 7, and the first transmission mechanism, the second transmission mechanism, and the third transmission mechanism use a cam driving mechanism 6 driven by the stepper motor 7. The electrode fixing block 5 and the cam driving mechanism 6 are both located on the main support fixing plate 1.

[0026] like Figure 1 , 4As shown, the positive electrode test electrode 3 and the negative electrode test electrode 4 are fixed on the electrode fixing block 5, and the positive electrode test electrode 3 and the negative electrode test electrode 4 are located directly below the diode electrode to be tested, and the positive electrode test electrode 3 and the negative electrode test electrode 4 are connected to the diode tester 11 through a wire to form a Kelvin test circuit. In this embodiment, the positive electrode test electrode 3 and the negative electrode test electrode 4 are both provided with two pieces, and the two pieces of positive electrode test electrodes 3 are arranged in parallel and separated by a certain gap, and the two pieces of negative electrode test electrodes 4 are arranged under the positive electrode test electrode 3 in the same way. The positive electrode test electrode 3 and the negative electrode test electrode 4 use highly elastic beryllium copper material, which can be deformed under the action of the test electrode positioning column 33 and fully contact the diode electrode. Specifically, the positive electrode test electrode 3 and the negative electrode test electrode 4 are both provided with a bending portion, which contacts or moves away from the test diode electrode under the drive of the second transmission mechanism, realizes electrical connection when in contact, and is transmitted to the diode tester 11 through a wire, which is convenient for testing.

[0027] A vertical guide rail groove is provided on the guide rail 2 for the diode to be tested to pass through. The width and depth of the guide rail groove are designed according to the size of the TO / ITO packaged diode, so that the TO / ITO diode can fall freely in the guide rail groove. A material receiving tube 31 is provided below the guide rail 2. A material stop pin passes through the guide rail and abuts against the diode to be tested. The material stop pin is connected to the first transmission mechanism, and the first transmission mechanism controls the material stop pin to press or release the diode to be tested. In this embodiment, the material stop pin includes a front material stop pin and a rear material stop pin 17 respectively located on both sides of the guide rail. The front material stop pin includes a first front material stop pin 15 and a second front material stop pin 16. From the height direction, the first front material stop pin 15 has the highest height, the rear material stop pin 17 is located in the middle, and the second front material stop pin 16 has the lowest height. When not tested, the front material stop pin is in an extended state, and the rear material stop pin is in a retracted state. The diodes to be tested in different states are blocked by setting the front material stop pin and the rear material stop pin of different heights.

[0028] The diode electrode positioning column 32 is connected to the second transmission mechanism. The diode electrode positioning column 32 is used to prevent the test electrode from contacting the diode electrode and causing the diode test electrode to deform.

[0029] The second transmission mechanism drives the diode electrode positioning column 32 to move, and the test electrode positioning column 33 is connected to the third transmission mechanism, and the third transmission mechanism drives the test electrode positioning column 33 to move. The first transmission mechanism, the second transmission mechanism, and the third transmission mechanism are all driven by the stepping motor 7.

[0030] When not testing, the stop pin presses the diode to be tested so that the diode to be tested cannot slide along the guide rail groove. When testing starts, the stepper motor 7 drives the stop pin to release the diode to be tested through the first transmission mechanism, so that the diode to be tested slides downward along the guide rail groove. At the same time, the stepper motor 7 drives the diode electrode positioning column 32 and the test electrode positioning column 33 to move through the second transmission mechanism and the third transmission mechanism. The diode electrode positioning column 32 and the test electrode positioning column 33 push the diode electrode and the test electrode, so that the diode electrode contacts the test electrode to achieve electrical connection, generate a test signal and transmit it to the diode tester.

[0031] like Figure 2 As shown, the first transmission mechanism includes a stopper pin connecting block 19, a stopper pin seat guide shaft 20, and a first return spring (due to positional relationship, Figure 2 The stopper pin seat 22 is connected to the stopper pin seat 22, and the other end of the stopper pin seat drive shaft 23 is connected to the stopper pin seat 22. The stopper pin connecting block 19 is connected to the stopper pin seat 22, and the other end of the stopper pin connecting block 19 is connected to the stopper pin. The stopper pin guide shaft 20 passes through the stopper pin connecting block and the guide rail 2, and the first reset spring is compressed between the stopper pin connecting block 19 and the end of the stopper pin seat guide shaft 20.

[0032] like Figure 2 , 3 As shown, the second transmission mechanism includes a diode electrode push seat 25, a diode electrode push seat transmission shaft 26, a diode electrode push seat pushing cam 27, a diode electrode push seat guide shaft 21, and a second reset spring. The diode electrode push seat pushing cam 27 is fixed on the output shaft of the stepper motor 7. One end of the diode electrode push seat transmission shaft 26 is closely tangent to the diode electrode push seat pushing cam 27. The other end of the diode positioning tube transmission shaft 26 is connected to the diode electrode push seat 25. The diode electrode positioning column 32 is fixed on the diode electrode push seat 25. The diode electrode push seat guide shaft 21 passes through a protrusion integrally formed on the diode electrode push seat 25. The second reset spring is compressed between the protrusion and the end of the diode electrode push seat guide shaft 21.

[0033] like Figure 2 , 3As shown, the third transmission mechanism includes a test electrode pushing seat 28, a test electrode pushing seat transmission shaft 29, a test electrode pushing seat pushing cam 30, a test electrode pushing seat guide shaft 21, and a third reset spring. The test electrode pushing seat pushing cam 30 is fixed on the output shaft of the stepper motor 7. One end of the test electrode pushing seat transmission shaft 29 is closely tangent to the test electrode pushing seat pushing cam 30. The other end of the test electrode pushing seat transmission shaft 29 is connected to the test electrode pushing seat 28. The test electrode positioning column 33 is fixed on the test electrode pushing seat 28. The test electrode pushing seat guide shaft 21 passes through a protrusion integrally formed on the test electrode pushing seat 28. The third reset spring is compressed between the protrusion and the end of the test electrode pushing seat guide shaft 21.

[0034] In this embodiment, the second transmission mechanism and the third transmission mechanism share a set of guide shafts 21, that is, the diode electrode pushing seat 25 and the test electrode pushing seat 28 are both connected to the guide shaft 21 through an integrally formed protrusion, and the second return spring and the third return spring are also arranged on the guide shaft 21.

[0035] In this embodiment, an origin positioning grating 8 is provided at the output end of the stepping motor, and a photoelectric switch 9 is provided at the set position of the origin positioning grating 8, and the photoelectric switch 9 is connected to the controller 10. The origin positioning grating 8 converts the position signal into an electrical signal by blocking the optical path of the photoelectric switch 9, and is connected to the programmable controller 10 through a signal line.

[0036] The test electrode positioning post 33 and the diode electrode positioning post 32 are located at the same height. In the initial or test state, the test electrode positioning post 33 is in a retracted state, and the diode electrode positioning post 32 is in an ejected state. The test position is between the test electrode positioning post 33 and the diode electrode positioning post 32. In the initial state, there is no diode in the test position and the test cannot be performed. In the test state, the diode slides to the test position. Due to the action of the test electrode positioning post and the diode electrode positioning post, the test electrode contacts the diode electrode, and an electrical connection can be achieved for testing.

[0037] In this embodiment, there are two test electrode positioning posts 33 , one is located in the gap between the positive test electrode 3 and the negative test electrode 4 , and the other is located inside the positive test electrode 3 and the negative test electrode 4 .

[0038] The test electrode positioning column 33 and the diode electrode positioning column 32 are both made of insulating materials.

[0039] In order to reduce the impact of the positioning pin on the diode to be tested, a shock-absorbing spring is provided between the positioning pin and the guide rail.

[0040] like Figure 1As shown, the control part of the test device includes a diode tester 11, a controller 10, a stepper motor driver 14, a touch screen 12 and a power supply 13. The diode tester 11 is connected to the positive test electrode 3 and the negative test electrode 4, and is used to receive the test signal to form a Kelvin circuit for testing. The controller 10 is connected to the diode tester 11 and the stepper motor driver 14, and is used to send a control signal. The stepper motor driver 14 is connected to the stepper motor 7 and is used to drive the stepper motor 7 to work. The touch screen 12 is connected to the controller 10 and is used to interact with the controller 10. The power supply 13 supplies power to each component.

[0041] The testing method of the testing tool described in this embodiment is:

[0042] Step 1. First, place the whole strip of TO / ITO diode 18 to be tested on the feed port of the guide groove, and the TO / ITO diode 18 falls freely in the guide groove until it stops falling after falling to the first front stop pin 15. At this time, the front stop pins 15 and 16 are in an extended state, the rear stop pin 17 is in a retracted state, the diode electrode positioning column 32 is in an ejected state, and the test electrode positioning column 33 is in a retracted state. Then the test electrode (positive and negative) is in a side pressure state, the stop pin seat push cam 24 and the test electrode push seat push cam 27 are both in the cam concave point, and the diode electrode push seat push cam 30 is in the cam convex point.

[0043] Step 2. Click the run button on the touch screen 12, and the programmable controller 10 drives the stepper motor 7 to rotate through the stepper motor driver 14. At this time, the stop pin seat pushes the cam 24 to move toward the convex point, pushing the stop pin seat transmission shaft 23 to move forward, driving the positioning pin seat 22 to lift the front stop pins 15 and 16, and at the same time press down the rear stop pin 17.

[0044] At the same time, the diode electrode push seat pushes the cam 27 to move toward the concave point, and the diode electrode push seat 25 moves backward under the action of the second reset spring, and pushes the diode electrode push seat transmission shaft 26 to move backward, and the diode electrode push seat 25 retracts the diode electrode positioning column 32.

[0045] At the same time, the test electrode push seat pushes the cam 30 to move toward the convex point, pushing the test electrode push seat transmission shaft to move forward, driving the test electrode push seat 28 to lift the test electrodes, namely the positive test electrode 3 and the negative test electrode 4.

[0046] When the stop pin seat push cam 24 and the test electrode push seat push cam 30 rotate to the cam convex point, and the diode electrode push seat push cam 27 rotates to the cam concave point, the first front stop pin 15 and the second front stop pin 16 are in a fully open state, the rear stop pin 17 is in a closed state, the diode electrode positioning column 32 is in a retracted state, and the test electrode positioning column 33 is in an ejected state. At this time, the first diode to be tested has fallen to the rear stop pin 17 along the guide groove under the action of gravity. Since the upper and lower distance between the first front stop pin 15 and the rear stop pin 17 is the width of a TO / ITO product, the second product also falls to the position of the first front stop pin 15 at the same time.

[0047] The stepper motor 7 continues to move, and the stop pin seat pushes the cam 24 to move toward the concave point. The first front stop pin 15 and the second front stop pin 16 rebound under the pressure of the first reset spring, so that the first front stop pin 15 blocks the second product to be dropped to complete the positioning, and the first product to be tested continues to fall to the second front stop pin 16 to complete the positioning.

[0048] At the same time, the diode electrode pushing seat pushes the cam 27 to move toward the convex point, and the diode electrode pushing seat 25 moves forward under the push of the diode electrode pushing seat transmission shaft 26, so that the diode electrode positioning column 32 completes the positioning of the diode electrode. At the same time, the test electrode pushing seat pushes the cam 30 to move toward the concave point, and the test electrode seat 28 retracts under the pressure of the third reset spring to press the test electrode.

[0049] Step 3. At this time, the test electrode is in full contact with the test electrode of the first diode to be tested. In this process, the stepper motor 7 rotates one circle at this time, the first product to be tested reaches the second front stop pin 16 and is in full contact with the test electrode, and the second diode to be tested falls to the rear stop pin 17. The programmable controller 11 sends a test signal to the diode tester 11, triggering the diode tester 11 to perform the test. After the test is completed, the programmable controller 10 drives the stepper motor 7 to continue rotating through the stepper motor driver 14 to start the test of the next diode. After the test is completed, the product falls into the receiving tube 31 of the guide rail slot outlet, and the test is repeated until the test of the strip-packed TO / ITO diode to be tested is completed.

[0050] The present invention is an automatic tooling to replace manual measurement of diode parameters. The whole machine controls the stepping motor through a programmable controller to drive the cam to fall freely under the action of gravity, and automatically completes the measurement process. Compared with the measurement method of manually taking each diode out of the material strip, measuring it with an aging seat, and then reloading it into the material tube, this tooling does not require manual intervention during measurement, has good measurement consistency, and has low workload for operators.

[0051] The above description is only the basic principle and preferred embodiments of the present invention. Improvements and substitutions made by those skilled in the art based on the present invention belong to the protection scope of the present invention.

Claims

1. A test fixture suitable for strip-mounted diodes, characterized in that: It includes a guide rail, an electrode fixing block, a material stop pin, a first transmission mechanism, a diode electrode positioning column, a second transmission mechanism, a test electrode positioning column, a third transmission mechanism and a power source; a positive test electrode and a negative test electrode are fixed on the electrode fixing block, the positive test electrode and the negative test electrode are located directly below the diode electrode to be tested, and the positive test electrode and the negative test electrode are connected to the diode tester through a wire; a vertical guide rail groove is opened on the guide rail for the diode to be tested to pass through, the material stop pin passes through the guide rail and rests on the diode to be tested, the material stop pin is connected to the first transmission mechanism, the diode electrode positioning column is connected to the second transmission mechanism, the test electrode positioning column is connected to the third transmission mechanism, the first transmission mechanism, the second transmission mechanism, the third transmission mechanism, the fourth transmission mechanism, the fifth ... The three transmission mechanisms are all driven by a power source; when not testing, the stop pin presses the diode to be tested so that the diode to be tested cannot slide along the guide rail groove. When the test starts, the power source drives the stop pin to release the diode to be tested through the first transmission mechanism, so that the diode slides downward along the guide rail groove. At the same time, the power source drives the diode electrode positioning column and the test electrode positioning column to move through the second transmission mechanism and the third transmission mechanism. The diode electrode positioning column and the test electrode positioning column push the diode electrode and the test electrode, so that the diode electrode contacts the test electrode to achieve electrical connection, generate a test signal and transmit it to the diode tester; the stop pin includes a front stop pin and a rear stop pin respectively located on both sides of the guide rail, and the front stop pin includes a first front stop pin and a second front stop pin , from the height direction, the first front stop pin is the highest, the rear stop pin is in the middle, and the second front stop pin is the lowest. When not tested, the front stop pin is in an extended state and the rear stop pin is in a retracted state; the first transmission mechanism includes a stop pin connecting block, a stop pin guide shaft, a first return spring, a stop pin seat, a stop pin seat transmission shaft and a stop pin seat pushing cam, the stop pin seat pushing cam is fixed on the power source output shaft, one end of the stop pin seat transmission shaft is closely tangent to the stop pin seat pushing cam, the other end of the stop pin seat transmission shaft is connected to the stop pin seat, one end of the stop pin connecting block is connected to the stop pin seat, the other end of the stop pin connecting block is connected to the stop pin, the stop pin guide shaft passes through the stop pin connecting block and the guide rail, and the first return spring is compressed on the stop pin Between the connecting block and the end of the guide shaft of the material stop pin seat; the second transmission mechanism includes a diode electrode push seat, a diode electrode push seat transmission shaft, a diode electrode push seat push cam, a diode electrode push seat guide shaft, and a second reset spring. The diode electrode push seat push cam is fixed on the power source output shaft, one end of the diode electrode push seat transmission shaft is closely tangent to the diode electrode push seat push cam, the other end of the diode electrode push seat transmission shaft is connected to the diode electrode push seat, the diode electrode positioning column is fixed on the diode electrode push seat, the diode electrode push seat guide shaft passes through a protrusion integrally formed on the diode electrode push seat, and the second reset spring is compressed between the protrusion and the end of the diode electrode push seat guide shaft;The third transmission mechanism includes a test electrode push seat, a test electrode push seat transmission shaft, a test electrode push seat push cam, a test electrode push seat guide shaft, and a third reset spring. The test electrode push seat push cam is fixed on the power source output shaft. One end of the test electrode push seat transmission shaft is closely tangent to the test electrode push seat push cam. The other end of the test electrode push seat transmission shaft is connected to the test electrode push seat. The test electrode positioning column is fixed on the test electrode push seat. The test electrode push seat guide shaft passes through a protrusion integrally formed on the test electrode push seat. The third reset spring is compressed between the protrusion and the end of the test electrode push seat guide shaft. ; 2. The test fixture for strip-mounted diodes according to claim 1, characterized in that: A positioning grating is arranged at the output end of the power source, a photoelectric switch is arranged at the set position of the positioning grating, and the photoelectric switch is connected to the controller.

3. The testing tool for strip-mounted diodes according to claim 1, characterized in that: There are two positive test electrodes and two negative test electrodes. The two positive test electrodes are arranged in parallel and separated by a certain gap. The two negative test electrodes are arranged under the positive test electrode in the same way. There are two test electrode positioning columns, one is located in the gap between the positive test electrode and the negative test electrode, and the other is located between the positive test electrode, the negative test electrode and the test electrode pushing seat.

4. The testing tool for strip-mounted diodes according to claim 1, characterized in that: The test electrode positioning column and the diode electrode positioning column are located at the same height. In the initial or test state, the test electrode positioning column is in a retracted state, and the diode electrode positioning column is in an ejected state.

5. The testing tool for strip-mounted diodes according to claim 1, characterized in that: The test electrode positioning column and the diode electrode positioning column are both made of insulating materials.

6. The testing tool for strip-mounted diodes according to claim 1, characterized in that: A shock-absorbing spring is arranged between the stop pin and the guide rail.

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