Automatic test method, device, equipment, system and medium for impulse voltage test

Abstract

The application relates to an automatic test method, device, equipment, system and medium for an impulse voltage test, which comprises the following steps: in response to starting a test operation, obtaining parameter information of an impulse voltage test of a current test sample; obtaining test parameters of a current group of the current test sample in the impulse voltage test, and generating an instruction for charging a capacitor in an impulse voltage generator body; if the charging voltage of the capacitor reaches a target charging voltage, the capacitor starts to discharge; obtaining the current discharge frequency collected by a discharge counter; and if the current discharge frequency reaches the target discharge frequency corresponding to the current group, the test of the current group is ended. The impulse voltage test of the current test sample can be automatically completed according to the parameter information, and the staff does not need to repeatedly input the parameter information of the current test sample and start the test after each charging and discharging, so that the workload of the staff in inputting the test parameters is reduced, and the safety hidden danger and error probability in the test are reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of impulse voltage test, in particular to an impulse voltage test automatic test method, device, equipment, system and medium. BACKGROUND

[0002] The impulse voltage test system is a test device for simulating impulse high voltage. In real life, impulse high voltage can be often encountered. For example, lightning in nature, where lightning falls, very high impulse current and voltage will appear, and very high impulse voltage will also be induced around; for another example, switching operation of switching equipment in power system will also cause transient impulse voltage. The amplitude of the transient impulse voltage is often above several tens of kilovolts or several hundred kilovolts, which will cause damage to equipment and endanger personal safety, so it is necessary to conduct impulse voltage test research. On the other hand, it is also meaningful to simulate natural lightning phenomenon to study discharge mechanism.

[0003] In the related art, the impulse voltage generator is the main device in the impulse voltage test system. When the impulse voltage generator is used to conduct lightning impulse test on the test product, the test parameters of the test point need to be manually input. Since each test point needs to be tested multiple times, the test parameters of each test need to be input manually, which is a large workload for the staff, has certain safety hazards and high error probability. SUMMARY

[0004] In order to reduce the workload of the staff in inputting test parameters and reduce safety hazards and error probability in test, the present application provides an impulse voltage test automatic test method, device, equipment, system and medium.

[0005] In a first aspect, the present application provides an impulse voltage test automatic test method, which adopts the following technical solution:

[0006] An impulse voltage test automatic test method, comprising:

[0007] In response to a start test operation, parameter information of impulse voltage test of a current test product is obtained, the parameter information including group information and test parameters corresponding to different groups;

[0008] The test parameters of the current group of the current test product in the impulse voltage test are obtained, and a command for charging a capacitor in the impulse voltage generator body is generated;

[0009] If the charging voltage of the capacitor reaches the target charging voltage, the capacitor starts to discharge, and the impulse voltage waveform data after discharge is obtained;

[0010] The current discharge count collected by the discharge counter is obtained;

[0011] if the current discharge number does not reach the target discharge number corresponding to the current group, repeating the step of generating the instruction of charging the capacitor in the impulse voltage generator body;

[0012] if the current discharge number reaches the target discharge number corresponding to the current group, ending the test of the current group.

[0013] By adopting the technical solution, after the staff starts the test and completes the parameter information setting of the current test sample, the impulse voltage test of the current test sample can be automatically completed according to the parameter information, and the staff does not need to repeatedly input the parameter information of the current test sample and start the test after each charging and discharging, thereby reducing the workload of the staff in inputting the test parameters and reducing the safety hazards and error probability in the test.

[0014] Optionally, the group information includes a total number of groups.

[0015] After the test of the current group is ended, the method further includes:

[0016] determining whether the current group is the last group based on the current group number and the total number of groups;

[0017] if the current group is not the last group, taking the next group as the current group and repeating the step of obtaining the test parameters of the current test sample in the impulse voltage test of the current group;

[0018] if the current group is the last group, ending the impulse voltage test of the current test sample.

[0019] By adopting the technical solution, after the parameter information corresponding to the current test sample is input and the test of the current group is ended, the test of the next group is automatically performed, and the staff does not need to repeatedly input the parameter information of the current test sample after each charging and discharging, thereby reducing the workload of the staff in inputting the test parameters and reducing the safety hazards and error probability in the test.

[0020] Optionally, the test parameters include a target discharge number.

[0021] Before the instruction of charging the capacitor in the impulse voltage generator body is generated, the method further includes:

[0022] determining whether the target discharge number in the current group is zero;

[0023] if yes, the current group does not perform the test;

[0024] if no, the step of generating the instruction of charging the capacitor in the impulse voltage generator body is executed.

[0025] Optionally, the parameter information of the impulse voltage test of the current test sample comprises:

[0026] The basic information of the current test sample is acquired, and the basic information comprises a test sample name and a model number;

[0027] Parameter information corresponding to the basic information is acquired based on the basic information, and the corresponding parameter information is taken as the parameter information of the current test sample.

[0028] According to the technical solution, the parameter information corresponding to the current group of the historical test sample is directly acquired based on the basic information, and the parameter information corresponding to the historical test sample is taken as the parameter information of the current test sample, thereby reducing the workload of the staff in inputting the parameter information through the input device and reducing the error probability of the input parameter information.

[0029] Optionally, after the impulse voltage waveform data after discharge is obtained, the method further comprises:

[0030] It is judged whether the impulse voltage waveform data is qualified or not;

[0031] If there is an unqualified item in the impulse voltage waveform data, the impulse voltage test of the current test sample is ended, and a first early warning information is sent to the terminal device corresponding to the staff.

[0032] According to the technical solution, when there is an unqualified item in the impulse voltage waveform data, the possibility of inaccurate data in this test exists, and the staff needs to timely check the test equipment according to the first early warning information, thereby reducing the possibility of directly analyzing according to the inaccurate test data.

[0033] Optionally, the impulse voltage generator body is provided in multiple stages, and each stage of the impulse voltage generator body corresponds to a pair of trigger balls;

[0034] The test parameter further comprises a number of stages of the impulse voltage generator body and a ball gap between the trigger balls;

[0035] After the control capacitor starts discharging, the method further comprises:

[0036] If the number of stages of the capacitor in the current level is multiple, the discharge states of each pair of trigger balls are acquired;

[0037] The discharge states of multiple pairs of trigger balls are compared, if the discharge states are inconsistent, the impulse voltage test of the current test sample is paused, and a second early warning information is sent to the terminal device corresponding to the staff;

[0038] Before the control capacitor starts discharging, the method further comprises:

[0039] If the number of capacitors in the current level is multi-level, the discharge state of each pair of trigger balls is obtained;

[0040] If there is a discharge state in the discharge state of multiple pairs of trigger balls, the impulse voltage test of the current sample is suspended, and third early warning information is sent to the corresponding terminal device of the staff.

[0041] By using the above technical solution, when the discharge states of multiple pairs of trigger balls are inconsistent, there are individual trigger balls that do not discharge or discharge prematurely, and the staff needs to investigate the trigger balls with abnormal discharge states and adjust the ball gap in a timely manner according to the second early warning information or the third early warning information received by the corresponding terminal device.

[0042] In a second aspect, the application provides an impulse voltage test automatic testing device, which adopts the following technical solution:

[0043] An impulse voltage test automatic testing device comprises:

[0044] A response acquisition module is configured to acquire parameter information of an impulse voltage test of a current sample in response to a start test operation, wherein the parameter information comprises group information and test parameters corresponding to different groups;

[0045] A first acquisition module is configured to acquire test parameters of a current group of the current sample in the impulse voltage test;

[0046] A generation module is configured to generate an instruction for charging a capacitor in an impulse voltage generator body;

[0047] A control obtaining module is configured to control the capacitor to start discharging when a charging voltage of the capacitor reaches a target charging voltage, and obtain a discharge voltage waveform data after discharging;

[0048] A second acquisition module is configured to acquire a current discharge count collected by a discharge counter;

[0049] A first repetition module is configured to repeat the step of generating the instruction for charging the capacitor in the impulse voltage generator body when the current discharge count does not reach a target discharge count corresponding to the current group;

[0050] A first end test module is configured to end the test of the current group when the current discharge count reaches the target discharge count corresponding to the current group.

[0051] In a third aspect, the application provides an electronic device, which adopts the following technical solution:

[0052] An electronic device comprising a memory and a processor, the memory having stored thereon a computer program loadable and executable by the processor to perform the method of any of the first aspect.

[0053] In a fourth aspect, the present application provides an automatic test system for impulse voltage test, which adopts the technical scheme as follows:

[0054] An automatic test system for impulse voltage test, comprising the electronic device of the third aspect and a direct current charging device, an impulse voltage generator body, a weak damping voltage divider, and an input device.

[0055] The input device is configured to send a corresponding electrical signal to the processor in the electronic device in response to a parameter input operation of a worker.

[0056] The direct current charging device is electrically connected to the processor, and the direct current charging device is electrically connected to the impulse voltage generator body.

[0057] The impulse voltage generator body is configured to generate an impulse voltage of a target voltage.

[0058] The weak damping voltage divider is electrically connected to the impulse voltage generator.

[0059] In a fifth aspect, the present application provides a computer readable storage medium, which adopts the technical scheme as follows:

[0060] A computer readable storage medium having stored thereon a computer program loadable and executable by a processor to perform the method of the first aspect. BRIEF DESCRIPTION OF DRAWINGS

[0061] Figure 1 is a flowchart of a single group in an automatic test method for impulse voltage test according to an embodiment of the present application.

[0062] Figure 2 is a flowchart of multiple groups in an automatic test method for impulse voltage test according to an embodiment of the present application.

[0063] Figure 3 is a structural block diagram of an automatic test device for impulse voltage test according to an embodiment of the present application.

[0064] Figure 4 is a structural block diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0065] The present application will be further described in detail below with reference to the accompanying drawings.

[0066] The embodiment of the application provides an automatic test method for impulse voltage test, which can be executed by a device, which can be a server or a terminal device. The server can be a physical server, a server cluster composed of multiple physical servers, a distributed system, or a cloud server providing cloud computing services. The terminal device can be a smart phone, a tablet computer, a desktop computer, etc., but is not limited thereto.

[0067] As shown in FIG. 1, an automatic test method for impulse voltage test is provided, which takes a processor as an execution subject. The main process of the method is described as follows (steps S101-S103): Figure 1

[0068] Step S101: In response to starting the test operation, parameter information of the impulse voltage test of the current test sample is obtained, which includes group information and test parameters corresponding to different groups.

[0069] In the embodiment, the test parameters include charging polarity, target discharge times, target charging voltage, single-stage charging voltage, charging coefficient, wave head resistance, and wave tail resistance.

[0070] The processor is electrically connected with an input device, which can be a key or a touch screen. A worker performing the impulse voltage test can select whether to start the test through the input device. When the worker selects to start the test through the input device, the processor receives the corresponding signal and responds to the corresponding operation.

[0071] In the embodiment, since the parameter information of the same type of test sample in the impulse voltage test process is the same, the parameter information can be manually input by the worker through the input device, or the corresponding parameter information of the same type of test sample pre-stored can be directly obtained.

[0072] Therefore, obtaining the parameter information of the impulse voltage test of the current test sample further includes the following processing: obtaining basic information of the current test sample, which includes the test sample name and model; obtaining the pre-stored parameter information of the historical test sample with the same basic information as the current test sample based on the basic information, and taking the parameter information of the historical test sample as the parameter information of the current test sample.

[0073] In the embodiment, the basic information includes other information that can affect the test parameters of the test sample in addition to the test sample name and model. The pre-stored basic information of the historical test sample is the same as the basic information of the current test sample, which means that each item in the basic information corresponds to the same.

[0074] ​The parameter information corresponding to each test sample is pre-stored in the memory of the processor according to the test standard, the parameter information corresponding to the historical test sample in the current group is directly obtained according to the basic information, and the parameter information corresponding to the historical test sample is taken as the parameter information of the current test sample, so as to reduce the workload of the staff in inputting the parameter information through the input device and reduce the error probability of the input parameter information.

[0075] In the embodiment, the staff can input the basic information through the input device, the processor recognizes the input information, and searches for the parameter information corresponding to the basic information; or the staff can scan the nameplate containing the basic information of the test sample through the code scanning gun, the processor recognizes the scanning result, and filters out the parameter information corresponding to the basic information; or the staff can take a photo of the nameplate containing the basic information of the test sample or the whole test sample or the local test sample through the visual camera, the processor recognizes the image obtained by the photo, and searches for the parameter information corresponding to the same basic information.

[0076] The processor is electrically connected with a server, and the server communicates with the processors in the plurality of impulse voltage test systems in a certain area. When the parameter information corresponding to the basic information of the current test sample does not exist in the memory of the processor, the pre-stored data corresponding to other processors in the server can be obtained, and if the parameter information corresponding to the basic information of the current test sample exists in other processors, the pre-stored parameter information in other processors is taken as the parameter information of the current test sample.

[0077] Step S102: obtaining the test parameter of the current test sample in the current group in the impulse voltage test;

[0078] Step S103: generating an instruction for charging the capacitor in the impulse voltage generator body;

[0079] Step S104: judging whether the charging voltage of the capacitor reaches the target charging voltage, if yes, turning to step S104, and if no, continuing to charge the capacitor;

[0080] In the embodiment, the group information includes the total number of groups, the total number of groups is greater than one, and the total number of groups is a constant value in the test process of different test samples. For example, the total number of groups in the test process of a plurality of different test samples is four. If the total number of groups in the test standard of the current test sample is less than the total number of groups, the excess groups do not need to be tested, and therefore, before the step of generating the instruction for charging the capacitor in the impulse voltage generator body, the following processing is further included:

[0081] Judging whether the target discharge number in the current group is zero, if yes, the current group does not need to be tested, and if no, the step of generating the instruction for charging the capacitor in the impulse voltage generator body is executed.

[0082] Step S105: control the capacitor to start discharging, obtain the discharged impulse voltage waveform data, and analyze and save the impulse voltage waveform data.

[0083] In this embodiment, after step S104, the following processing is further included: judging whether the impulse voltage waveform data is qualified; if there is unqualified item in the impulse voltage waveform data, ending the impulse voltage test of the current test sample, and sending the first early warning information to the terminal device corresponding to the staff.

[0084] As an optional implementation of this embodiment, the impulse voltage test of the test sample includes full-wave test and chopped-wave test, and correspondingly, the impulse voltage waveform data includes full-wave test waveform data and chopped-wave test waveform data; judging whether the impulse voltage waveform data is qualified includes judging a plurality of judgment items in the full-wave test waveform data respectively, and if all the plurality of judgment items are qualified, the full-wave test of the test sample is qualified; judging whether the impulse voltage waveform data is qualified includes judging a plurality of judgment items in the chopped-wave test waveform data respectively, and if all the plurality of judgment items are qualified, the chopped-wave test of the test sample is qualified.

[0085] The full-wave test waveform data judgment items include whether the wave head time is qualified, whether the wave tail time is qualified, and whether the test sample appears flashover, and exemplarily, the wave head time is qualified when it is located in the interval of 1.2*(1±30%)us, the wave tail time is qualified when it is located in the interval of 50*(1±20%)us, and the test sample appears flashover when the slope of the waveform descending segment is less than a preset value.

[0086] The chopped-wave test waveform data judgment items include whether the wave head time is qualified and whether the cut-off time is qualified, and exemplarily, the wave head time is qualified when it is located in the interval of 1.2*(1±30%)us, and the cut-off time is qualified when it is located in the interval of 2-5us.

[0087] As another optional implementation of this embodiment, judging whether the impulse voltage waveform data is qualified can further include: obtaining the impulse voltage waveform data corresponding to the current group of the historical test sample with the same basic information as the current test sample; comparing the impulse voltage waveform data of the current test sample with the impulse voltage waveform data corresponding to the historical test sample; and if the comparison coincidence degree is less than a preset threshold, ending the impulse voltage test of the current test sample, and sending the first early warning information to the terminal device corresponding to the staff.

[0088] The comparison coincidence degree is the coincidence proportion of the impulse voltage waveform data corresponding to the historical test sample and the impulse voltage waveform data of the current test sample; and exemplarily, the preset threshold is 80%.

[0089] When the coincidence degree of the comparison is less than the preset threshold, the possibility of inaccurate data in this test exists, and the staff needs to check the test equipment in time according to the first warning information, thereby reducing the possibility of directly analyzing according to the inaccurate test data.

[0090] Step S106: Obtain the current discharge frequency collected by the discharge counter.

[0091] Step S107: Determine whether the current discharge frequency reaches the target discharge frequency corresponding to the current group, if not, repeat the operation of step S103, if yes, go to step S108.

[0092] Step S108: End the test of the current group.

[0093] After the staff starts the test and completes the parameter information setting of the current test sample, the impulse voltage test of the current test sample can be automatically completed according to the parameter information, and the staff does not need to repeatedly input the parameter information of the current test sample after each charge and discharge, thereby reducing the workload of the staff in inputting test parameters and reducing the safety hazards and error probability in the test.

[0094] In this embodiment, since the groups are set to multiple groups, as shown in FIG. 10, after step S108, the following processing is further included: Figure 2

[0095] Step S109: Determine whether the current group is the last group based on the current group number and the total number of groups, if not, go to step S1010, if yes, go to step S1011.

[0096] Step S1010: Take the next group as the current group, and repeat the step of obtaining the test parameters of the current group in the impulse voltage test of the current test sample.

[0097] Step S1011: End the impulse voltage test of the current test sample.

[0098] During the test of the test sample according to the test standard, it is necessary to start testing from a voltage value lower than the test standard voltage. For example, the test standard voltage of a test sample is 100KV, and the target charging voltage in the test starts from 50KV.

[0099] After inputting the parameter information corresponding to the current test sample and ending the test of the current group, the test of the next group is automatically performed, and the staff does not need to repeatedly input the parameter information of the current test sample after each charge and discharge, thereby reducing the workload of the staff in inputting test parameters and reducing the safety hazards and error probability in the test.

[0100] ​Exemplarily, Table 1 is a schematic table of partial parameter information, wherein the total number of groups is 4, the group number of the group is 4, and the group is the last executed group; the test parameters further include the body stage number of the impulse voltage generator.

[0101] Table 1

[0102] Group Target discharge number Impulse voltage generator body stage number Charging polarity Target charging voltage (KV) Single-stage charging voltage (KV) Charging coefficient 1 5 2 Positive (+) 50 26.6 0.94 2 5 2 Negative (-) 50 26.6 0.94 3 5 4 Positive (+) 100 26.9 0.93 4 5 4 Negative (-) 100 26.9 0.93

[0103] The body stage number of the impulse voltage generator in Table 1 can be set to multiple stages, when the body stage number is set to multiple stages, the corresponding capacitors are also multiple stages, and the multiple-stage impulse voltage generator body corresponds to capacitors in parallel charging and series discharging, and each stage of the impulse voltage generator body corresponds to a pair of trigger balls; the test parameters further include a ball gap between the trigger balls.

[0104] In the embodiment, after step S104, the following processing is further included: if the capacitor stage number in the current level is multiple stages, the discharge state of each pair of trigger balls is obtained; the discharge states of the multiple pairs of trigger balls are compared, if the discharge state comparison is inconsistent, the impulse voltage test of the current test product is suspended, and the second early warning information is sent to the terminal device corresponding to the worker. The discharge state includes no discharge or discharge.

[0105] When the discharge states of the multiple pairs of trigger balls are inconsistent, at this time, there are individual trigger balls that do not discharge and the like, and the worker needs to investigate the trigger balls with abnormal discharge states and adjust the ball gap in a timely manner according to the second early warning information received by the corresponding terminal device.

[0106] In the embodiment, before step S104, the following processing is further included: if there is a discharge in the discharge states of the multiple pairs of trigger balls, the impulse voltage test of the current test product is suspended, and the third early warning information is sent to the terminal device corresponding to the worker.

[0107] Before generating the instruction to control the capacitor to start discharging, there is a discharge in the discharge states of the multiple pairs of trigger balls, so the trigger balls have an early discharge, and the worker can adjust the ball gap of the trigger balls that discharge early according to the third early warning information.

[0108] After completing the impulse voltage test of the current test product, the processor can generate a test report according to the wave head time, the wave tail time, the impulse voltage waveform and the test result (qualified or unqualified) of each test.

[0109] Based on the same technical concept, the present application also provides an impulse voltage test automatic testing device, as shown in Figure 3 The impulse voltage test automatic testing device 200 mainly includes:

[0110] The response acquisition module 201 is configured to acquire parameter information of the impulse voltage test of the current test sample in response to starting the test operation, and the test parameters include group information and test parameters corresponding to different groups.

[0111] The first acquisition module 202 is configured to acquire test parameters of the current group of the current test sample in the impulse voltage test.

[0112] The generation module 203 is configured to generate an instruction for charging the capacitor in the impulse voltage generator body.

[0113] The control obtaining module 204 is configured to control the capacitor to start discharging when the charging voltage of the capacitor reaches the target charging voltage, and obtain the impulse voltage waveform data after discharging.

[0114] The second acquisition module 205 is configured to acquire the current discharge count collected by the discharge counter.

[0115] The first repetition module 206 is configured to repeat the step of generating the instruction for charging the capacitor in the impulse voltage generator body when the current discharge count does not reach the target discharge count corresponding to the current group.

[0116] The first end test module 207 is configured to end the test of the current group when the current discharge count reaches the target discharge count corresponding to the current group.

[0117] Optionally, the first end test module 207 further includes:

[0118] The first judgment module is configured to judge whether the current group is the last group based on the current group number and the total number of groups.

[0119] The second repetition module is configured to, when the current group is not the last group, take the next group as the current group, and repeat the step of acquiring the test parameters of the current group of the current test sample in the impulse voltage test.

[0120] The second end test module is configured to end the impulse voltage test of the current test sample when the current group is the last group.

[0121] Optionally, the generation module 203 further includes:

[0122] The second judgment module is configured to judge whether the target discharge count in the current group is zero, if yes, the current group does not need to be tested, and if no, the step of generating the instruction for charging the capacitor in the impulse voltage generator body is executed.

[0123] Optionally, the response acquisition module 201 includes:

[0124] The first acquisition sub-module is configured to acquire basic information of the current test sample, and the basic information includes the name and model of the test sample.

[0125] The second obtaining sub-module is configured to obtain pre-stored parameter information corresponding to the basic information based on the basic information, and take the corresponding parameter information as the parameter information of the current test sample.

[0126] Optionally, the control obtaining module 204 further comprises:

[0127] The third judging module is configured to judge whether the impulse voltage waveform data is qualified.

[0128] The third ending test module is configured to end the impulse voltage test of the current test sample and send the first early warning information to the terminal device corresponding to the staff if there is unqualified item in the impulse voltage waveform data.

[0129] Optionally, the control obtaining module 204 further comprises:

[0130] The fourth obtaining module is configured to obtain the discharge state of each pair of trigger balls if the capacitor series in the current level is multi-level.

[0131] The second comparing module is configured to compare the discharge states of the multiple pairs of trigger balls, and pause the impulse voltage test of the current test sample and send the second early warning information to the terminal device corresponding to the staff if the discharge states are inconsistent.

[0132] Optionally, the control obtaining module 204 further comprises:

[0133] The fifth obtaining module is configured to obtain the discharge state of each pair of trigger balls if the capacitor series in the current level is multi-level.

[0134] The test pausing module is configured to pause the impulse voltage test of the current test sample and send the third early warning information to the terminal device corresponding to the staff if there is discharge in the discharge states of the multiple pairs of trigger balls.

[0135] In one example, the modules in any of the above apparatuses can be one or more integrated circuits configured to implement one or more of the above methods, such as one or more application specific integrated circuits (ASICs), or one or more digital signal processors (DSPs), or one or more field programmable gate arrays (FPGAs), or a combination of at least two of these integrated circuit forms.

[0136] For example, when the modules in the apparatus can be implemented in the form of a processing element scheduler, the processing element can be a general-purpose processor, such as a central processing unit (CPU) or other processor that can invoke a program. For another example, the modules can be integrated together to be implemented in the form of a system-on-a-chip (SOC).

[0137] In the present application, various objects such as messages / information / equipment / network elements / systems / apparatuses / actions / operations / processes / concepts, etc. that can appear in the present application are named. It can be understood that these specific names do not constitute a limitation on the related objects, and the assigned names can be changed according to factors such as scenes, contexts, or usage habits. The technical meaning of the technical terms in the present application should be mainly determined according to the functions and technical effects embodied / implemented in the technical solutions.

[0138] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described system, apparatus and module can refer to the corresponding processes in the foregoing method embodiments, which will not be described here.

[0139] Those of ordinary skill in the art can realize that the modules and algorithm steps of the examples described in combination with the embodiments disclosed herein can be realized by electronic hardware or a combination of computer software and electronic hardware. Whether the functions are performed in hardware or software depends on the specific application and design constraints of the technical solutions. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of the present application.

[0140] Based on the same technical concept, the embodiments of the present application also disclose an electronic device, as shown in Figure 4 As shown, the electronic device 300 includes a processor 301 and a memory 302, and can further include one or more of an information input / output (I / O) interface 303, a communication component 304, and a communication bus 305.

[0141] The processor 301 is configured to control overall operations of the electronic device 300 to complete all or part of the steps of the surge voltage test automatic test method described above. The memory 302 is configured to store various types of data to support operations of the electronic device 300. The data can include, for example, instructions for any application or method operating on the electronic device 300, and application-related data. The memory 302 can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as one or more of a static random access memory (SRAM), an electrically erasable programmable read-only memory (EEPROM), an erasable programmable read-only memory (EPROM), a programmable read-only memory (PROM), a read-only memory (ROM), a magnetic memory, a flash memory, a magnetic disk, or an optical disk.

[0142] The I / O interface 303 provides an interface between the processor 301 and other interface modules, which can be a keyboard, a mouse, a button, and the like. The buttons can be virtual buttons or physical buttons. The communication component 304 is configured to test wired or wireless communication between the electronic device 300 and other devices. The wireless communication, such as Wi-Fi, Bluetooth, near field communication (NFC), 2G, 3G, or 4G, or a combination of one or more of them, so the corresponding communication component 104 can include a Wi-Fi component, a Bluetooth component, and an NFC component.

[0143] The communication bus 305 can include a path for transmitting information between the above-mentioned components. The communication bus 305 can be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus, or the like. The communication bus 305 can be divided into an address bus, a data bus, a control bus, and the like.

[0144] The electronic device 300 can be implemented by one or more Application Specific Integrated Circuit (ASIC), Digital Signal Processor (DSP), Digital Signal Processing Device (DSPD), Programmable Logic Device (PLD), Field Programmable Gate Array (FPGA), controller, microcontroller, microprocessor or other electronic elements for performing the automatic test method of the impulse voltage test given in the above embodiments.

[0145] The electronic device 300 can include, but is not limited to, a mobile terminal of a digital broadcast receiver, a PDA (Personal Digital Assistant), a PMP (Portable Multimedia Player), and the like, and a fixed terminal such as a digital TV, a desktop computer, and the like, and can also be a server or the like.

[0146] Based on the same technical concept, the present application also discloses an automatic test system of impulse voltage test, which comprises a processor and a direct current charging device, an impulse voltage generator body, a weak damping voltage divider, and an input device. According to the requirements of the test product, the automatic test system of impulse voltage test can further comprise a chopping device, a steep wave device, and the like.

[0147] The input device is used to send a corresponding electrical signal to the processor in the electronic device in response to the parameter input operation of the staff.

[0148] The direct current charging device is electrically connected with the processor and the impulse voltage generator body, and is used to receive a charging instruction sent by the processor and charge a capacitor in the impulse voltage generator body according to the charging instruction. The impulse voltage generator body is used to generate an impulse voltage of a target voltage; and the weak damping voltage divider is electrically connected with the impulse voltage generator.

[0149] Based on the same technical concept, the present application also discloses a computer readable storage medium, which stores a computer program. When the computer program is executed by a processor, the steps of the automatic test method of the impulse voltage test described above are realized.

[0150] The computer readable storage medium can include a variety of media that can store program codes, such as a U disk, a mobile hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk.

[0151] The terms "comprise", "contain", or any other variant thereof are intended to cover a non-exclusive inclusion, so that a process, method, article, or apparatus that comprises a list of elements not only includes those elements, but also includes other elements not expressly listed or inherent to such process, method, article, or apparatus.

[0152] The above description is merely preferred embodiments of the present application and a description of the principles of the technology used. Those skilled in the art should understand that the scope of the application involved in the present application is not limited to the technical solutions formed by the specific combinations of the above technical features, and should also cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the above application concept. For example, the above features are replaced with technical features with similar functions applied in the present application (but not limited to) to form technical solutions.

Claims

1. A method of automatically testing a surge voltage test, characterized by, The method comprises the following steps: in response to starting the test operation, obtaining parameter information of the impulse voltage test of the current test sample, the parameter information comprising group information and test parameters corresponding to different groups; obtaining the test parameters of the current group in the impulse voltage test of the current test sample; generating a command for charging a capacitor in the impulse voltage generator body; if the charging voltage of the capacitor reaches the target charging voltage, controlling the capacitor to start discharging to obtain the impulse voltage waveform data after discharging; obtaining the current discharge count collected by the discharge counter; if the current discharge count does not reach the target discharge count corresponding to the current group, repeating the step of generating the command for charging the capacitor in the impulse voltage generator body; if the current discharge count reaches the target discharge count corresponding to the current group, ending the test of the current group; the group information comprises the total number of groups; after the test of the current group is ended, the method further comprises the following steps: determining whether the current group is the last group based on the current group number and the total number of groups; if the current group is not the last group, taking the next group as the current group and repeating the step of obtaining the test parameters of the current group in the impulse voltage test of the current test sample; if the current group is the last group, ending the impulse voltage test of the current test sample; the test parameters comprise the target discharge count; before the step of generating the command for charging the capacitor in the impulse voltage generator body, the method further comprises the following steps: determining whether the target discharge count in the current group is zero; if yes, the current group does not need to be tested; if no, executing the step of generating the command for charging the capacitor in the impulse voltage generator body; the step of obtaining the parameter information of the impulse voltage test of the current test sample comprises the following steps: obtaining basic information of the current test sample, the basic information comprising the name and model of the test sample; based on the basic information, obtaining the pre-stored parameter information corresponding thereto, and taking the corresponding parameter information as the parameter information of the current test sample; after the step of obtaining the impulse voltage waveform data after discharging, the method further comprises the following steps: determining whether the impulse voltage waveform data is qualified; if there are unqualified items in the impulse voltage waveform data, ending the impulse voltage test of the current test sample and sending first warning information to the corresponding terminal device of the staff; the impulse voltage test of the test sample comprises full-wave test and chopped-wave test, and the impulse voltage waveform data comprises full-wave test waveform data and chopped-wave test waveform data; the step of determining whether the impulse voltage waveform data is qualified comprises judging a plurality of judgment items in the full-wave test waveform data respectively, and if all the plurality of judgment items are qualified, the full-wave test of the test sample is qualified, wherein the full-wave test waveform data judgment items comprise whether the wave head time is qualified, whether the wave tail time is qualified and whether the test sample appears flashover; the step of determining whether the impulse voltage waveform data is qualified comprises judging a plurality of judgment items in the chopped-wave test waveform data respectively, and if all the plurality of judgment items are qualified, the chopped-wave test of the test sample is qualified, wherein the chopped-wave test waveform data judgment items comprise whether the wave head time is qualified and whether the cutoff time is qualified; Alternatively, the determining whether the impulse voltage waveform data is qualified comprises: obtaining impulse voltage waveform data corresponding to the current group of the historical test sample with the same basic information as the current test sample; comparing the impulse voltage waveform data of the current test sample with the impulse voltage waveform data corresponding to the historical test sample; if the comparison coincidence degree is less than a preset threshold, determining that the impulse voltage waveform data is unqualified; wherein the comparison coincidence degree is the coincidence proportion of the impulse voltage waveform data corresponding to the historical test sample and the impulse voltage waveform data of the current test sample.

2. The automatic test method of switching impulse voltage test according to claim 1, characterized in that, The impulse voltage generator body is arranged in multiple stages, and each stage of the impulse voltage generator body corresponds to a pair of trigger balls; The test parameters further include the number of stages of the impulse voltage generator body and the ball gap between the trigger balls; After the control capacitor starts discharging, the method further comprises: if the number of stages of the capacitor in the current level is multiple, the discharge state of each pair of trigger balls is obtained; comparing the discharge states of multiple pairs of trigger balls, if the discharge state comparison is inconsistent, the impulse voltage test of the current test sample is suspended, and a second early warning information is sent to the terminal device corresponding to the staff; Before the control capacitor starts discharging, the method further comprises: if the number of stages of the capacitor in the current level is multiple, the discharge state of each pair of trigger balls is obtained; if there is a discharge condition in the discharge state of multiple pairs of trigger balls, the impulse voltage test of the current test sample is suspended, and a third early warning information is sent to the terminal device corresponding to the staff.

3. An automatic test device for impulse voltage tests, characterized in that comprising: in response to the starting test operation, the parameter information of the impulse voltage test of the current test sample is obtained, the parameter information includes group information and test parameters corresponding to different groups; the first obtaining module is used to obtain the test parameters of the current group in the impulse voltage test of the current test sample; the generating module is used to generate an instruction for charging the capacitor in the impulse voltage generator body; the control obtaining module is used to control the capacitor to start discharging when the charging voltage of the capacitor reaches the target charging voltage, and obtain the impulse voltage waveform data after discharging; the second obtaining module is used to obtain the current discharge count collected by the discharge counter; the first repeating module is used to repeat the step of generating the instruction for charging the capacitor in the impulse voltage generator body when the current discharge count does not reach the target discharge count corresponding to the current group; the first end test module is used to end the test of the current group when the current discharge count reaches the target discharge count corresponding to the current group.

4. An electronic device, comprising: comprising a memory and a processor, the memory has a computer program loaded and executed by the processor, which can execute the method of any one of claims 1 to 2.

5. An automatic test system for impulse voltage tests, characterized in that comprising the electronic device of claim 4 and the direct current charging device, the impulse voltage generator body, the weak damping voltage divider, and the input device; the input device is used to send the corresponding electrical signal to the processor in the electronic device in response to the parameter input operation of the staff; The direct current charging device is electrically connected with the processor, and is electrically connected with the impulse voltage generator body, and is used for receiving the charging instruction sent by the processor and charging the capacitor in the impulse voltage generator body according to the charging instruction. The impulse voltage generator body is used for generating the impulse voltage of the target voltage. The weak damping voltage divider is electrically connected with the impulse voltage generator.

6. A computer-readable storage medium, characterized in that, The computer program capable of being loaded and executed by the processor and performing the method of any one of claims 1 to 2 is stored.

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