A modular medium and low voltage primary and secondary complete set intelligent switch testing system and device

Abstract

The present invention discloses a modular medium and low voltage primary and secondary complete intelligent switch test system and device, which relates to the field of switch testing. Each test system is connected to the test switch in a one-to-one correspondence. The switching device controls the circuit conduction between the target test system and the main control system so that the target test system converts the test signal output by the main control system, so that the target test switch works based on the expected test signal, and the main control system can test the working state of the target test switch according to the control feedback signal and the test feedback signal when the target test switch works. Different test switches correspond to a test system respectively. By controlling the switching circuit to conduct the circuit between different test systems and the main control system, different target test systems can be selected according to different target test switches to meet the test of different test switches, improve the test efficiency, and reduce the design cost of the test system for testing different test switches.

Description

Technical Field

[0001] The present invention relates to the field of switch testing, and in particular to a modular medium and low voltage primary and secondary complete intelligent switch testing system and device. Background Art

[0002] In the prior art, due to the different structures of medium and low voltage primary and secondary complete intelligent switches, when testing different primary and secondary complete intelligent switches, it is necessary to design test devices for different primary and secondary complete intelligent switches. For example, the operating voltages of different primary and secondary complete intelligent switches are different, or the test items of different primary and secondary complete intelligent switches are different, and different test devices also need to have different test functions.

[0003] Therefore, in the prior art, a variety of different test devices need to be provided to test different primary and secondary complete intelligent switches, resulting in a high design cost for the test system. Summary of the Invention

[0004] The purpose of the present invention is to provide a modular medium and low voltage primary and secondary complete intelligent switch test system and device, in which different test switches correspond to one test system respectively. By controlling the switching circuit to conduct the circuit between different test systems and the main control system, different target test systems can be selected according to different target test switches to meet the test requirements of different test switches, improve test efficiency, and reduce the design cost of the test system for testing different test switches.

[0005] To solve the above technical problems, the present invention provides a modular medium and low voltage primary and secondary complete intelligent switch test system, comprising a main control system, a switching device and multiple test systems, each of which is connected to the main control system via the switching device, and each of the test systems is connected to a tested switch in a one-to-one correspondence;

[0006] The main control system is used to output a test signal, control the target test switch to operate based on the expected test signal, and receive a control feedback signal from the target test switch, and determine the operating state of the target test switch according to the control feedback signal and the test feedback signal;

[0007] The switching device is used to control the conduction of the circuit between the main control system and the target test system, and the target test system is the test system connected to the target test switch;

[0008] The target test system is configured to convert the test signal current into the desired test signal for the target test switch when the circuit between the target test system and the main control system is connected, and to feed back the test feedback signal of the target test switch to the main control system.

[0009] Preferably, the main control system includes a test management module and a main control device;

[0010] The test management module is configured to control the main control device to output the test signal, control the target test switch to operate based on the expected test signal through the main control device, receive the control feedback signal of the target test switch, and determine the operating state of the target test switch according to the test feedback signal and the control feedback signal;

[0011] The main control device is used to output the test signal and forward the test feedback signal sent by the target test system to the test management module.

[0012] Preferably, the main control device includes:

[0013] a communication device, configured to forward the control working signal of the test management module on the target test switch to the target test switch, so that the target test switch operates based on the expected test signal, forward the control output signal of the test management module to the voltage and current generation and acquisition module, and forward the test feedback signal received by the voltage and current generation and acquisition module to the test management module;

[0014] The voltage and current generation and acquisition module is used to output the test signal based on the control output signal, and receive the test feedback signal of the target test switch sent by the target test system.

[0015] Preferably, the voltage and current generation and acquisition module includes a test feedback signal interface module, a voltage programmable source, a current programmable source, an adjustable overload current source and a residual current source;

[0016] The test signal includes the test voltage output by the voltage programmable source, the test current output by the current programmable source, the overload current output by the adjustable overload current source, and the residual current characteristic signal output by the residual current source;

[0017] The test feedback signal interface module is used to receive the test feedback signal.

[0018] Preferably, when the target tested switch is a medium voltage primary and secondary complete intelligent switch, the target test system includes a voltage booster, a first current booster and a first feedback signal acquisition device;

[0019] The booster is used to convert the test voltage into the desired voltage of the medium voltage primary and secondary complete intelligent switch when the circuit between the booster and the main control system is connected, and the first current booster is used to convert the test current into the first desired current of the medium voltage primary and secondary complete intelligent switch;

[0020] The first feedback signal acquisition device is used to collect the test feedback signal of the medium voltage primary and secondary complete intelligent switch when it operates based on the expected voltage and the first expected current, and feed it back to the main control system.

[0021] Preferably, when the target tested switch is a low-voltage primary and secondary complete intelligent switch, the target test system includes a second current booster, a voltage regulating current booster, an isolation device, and a second feedback signal acquisition device;

[0022] The second current booster is used to convert the test current into a second desired current of the low-voltage primary and secondary complete intelligent switch;

[0023] The voltage regulator and current booster is used to load the overload current to both ends of the low-voltage primary and secondary complete intelligent switch;

[0024] The isolation device is used to load the residual current to the low-voltage primary and secondary complete intelligent switch based on the residual current characteristic signal;

[0025] The second feedback signal acquisition device is used to collect the test feedback signal of the low-voltage primary and secondary intelligent switch when it is operating based on the second expected current, the test voltage in the test signal, the overload current and the residual current, and feed it back to the main control system.

[0026] Preferably, the test feedback signal includes the operating voltage and the operating current of the tested switch.

[0027] Preferably, it also includes:

[0028] The test product access module is provided between the test system and the test switch, and is used to connect the circuit between the test system and the test switch.

[0029] Preferably, it further comprises a communication interface module provided between the main control system and the tested switch; the tested switch comprises a processor and a switch circuit;

[0030] The main control system is specifically used to output a test signal, communicate with the processor through the communication interface module, so as to control the switch circuit to operate based on the expected test signal through the processor, and receive a control feedback signal for the switch circuit sent by the processor, and determine the operating state of the target test switch according to the control feedback signal and the test feedback signal.

[0031] To solve the above technical problems, the present invention provides a modular medium and low voltage primary and secondary complete intelligent switch testing device, including the modular medium and low voltage primary and secondary complete intelligent switch testing system as described above, and also including multiple test switches.

[0032] The present application provides a modular medium and low voltage primary and secondary complete intelligent switch test system and device, which relates to the field of switch testing. Each test system is connected to the test switch in a one-to-one correspondence. The switching device controls the circuit conduction between the target test system and the main control system so that the target test system converts the test signal output by the main control system, so that the target test switch works based on the expected test signal, and the main control system can test the working state of the target test switch according to the control feedback signal and the test feedback signal when the target test switch works. Different test switches correspond to a test system respectively. By controlling the switching circuit to conduct the circuit between different test systems and the main control system, different target test systems can be selected according to different target test switches to meet the test of different test switches, improve the test efficiency, and reduce the design cost of the test system for testing different test switches. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the prior art and the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0034] Figure 1 A schematic diagram of the structure of a modular medium and low voltage primary and secondary complete intelligent switch test system provided by the present invention;

[0035] Figure 2 This is a specific structural diagram of a modular medium and low voltage primary and secondary complete intelligent switch testing system provided by the present invention. DETAILED DESCRIPTION

[0036] The core of the present invention is to provide a modular medium and low voltage primary and secondary complete intelligent switch test system and device, in which different test switches correspond to one test system respectively. By controlling the switching circuit to conduct the circuit between different test systems and the main control system, different target test systems can be selected according to different target test switches to meet the test requirements of different test switches, improve test efficiency, and reduce the design cost of the test system for testing different test switches.

[0037] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0038] Please refer to Figure 1 , Figure 1 This is a structural diagram of a modular medium- and low-voltage primary and secondary complete intelligent switch test system provided by the present invention. The system includes a main control system 1, a switching device 2, and multiple test systems 3. Each test system 3 is connected to the main control system 1 through the switching device 2, and each test system 3 is connected to a tested switch in a one-to-one correspondence.

[0039] The main control system 1 is used to output a test signal, control the target test switch to operate based on the expected test signal, receive a control feedback signal from the target test switch, and determine the operating state of the target test switch based on the control feedback signal and the test feedback signal;

[0040] The switching device 2 is used to control the conduction of the circuit between the main control system 1 and the target test system, which is the test system 3 connected to the target test switch;

[0041] The target test system is used to convert the test signal current into the expected test signal to the target test switch when the circuit between the target test system and the main control system 1 is connected, and feed back the test feedback signal of the target test switch to the main control system 1.

[0042] In recent years, with the continuous advancement of digital reform, the intelligence level of medium and low voltage primary and secondary complete intelligent switches has been continuously improved. On the basis of traditional closing, carrying and breaking current functions, by adding voltage and current sampling devices, power supply and control equipment to medium and low voltage primary and secondary complete intelligent switches, medium and low voltage primary and secondary complete intelligent switches are further equipped with the functions of supporting their own online monitoring, fault diagnosis, fault location and fault handling. At the same time, in view of the situation where new energy is connected to the distribution network, low voltage primary and secondary complete intelligent switches also need to add functions such as power quality management and new energy grid connection management.

[0043] To ensure the complete functionality and reliable performance of medium and low voltage primary and secondary complete intelligent switches after intelligent upgrades, all power companies have organized equipment quality testing for medium and low voltage primary and secondary complete intelligent switches and designed test devices for different scenarios. However, during the process of intelligent upgrades for medium and low voltage primary and secondary complete intelligent switches, considering the actual needs of different scenarios and the primary and secondary structural forms of different switches, the actual structural combinations are diverse and the product variety is wide. Configuring test devices one by one is not economical and the subsequent operation and maintenance costs are high. Therefore, it is necessary to develop a modular test system for medium and low voltage primary and secondary complete intelligent switches, taking into account test systems of different voltage levels, different current output forms, different frequency ranges, and different degrees of integration, thereby covering the test needs of 10kV / 20kV medium voltage primary and secondary complete intelligent switches and 380V low voltage primary and secondary complete intelligent switches.

[0044] In order to solve the above technical problems, in this embodiment, multiple test systems 3 are set up to connect with the main control system 1 through the switching device 2. The main control system 1 can output a unified test signal. The target test system connected by the target test switch converts the unified test signal output by the main control system 1 into the expected test signal of the target test switch. Different test switches are connected to different test systems 3, so that the test signal can be converted into the expected test signal corresponding to different test switches to realize testing of different test switches.

[0045] Among them, the tested switches can be medium-voltage primary and secondary complete intelligent switches and low-voltage primary and secondary complete intelligent switches. Different expected test signals are used for different primary and secondary complete intelligent switches. By modularizing the test systems 3 of different primary and secondary complete intelligent switches, the switching device 2 can be controlled to switch the conduction and disconnection of the circuit between the main control system 1 and the test system 3 to achieve testing of different tested switches.

[0046] Based on this, since a modular medium and low voltage primary and secondary intelligent switch test system in this application can realize the test of different test switches, different test switches correspond to a test system 3 respectively. By controlling the switching circuit to conduct the circuit between different test systems 3 and the main control system 1, different target test systems can be selected according to different target test switches to meet the test of different test switches, improve the test efficiency, and reduce the design cost of the test system 3 for testing different test switches.

[0047] Based on the above embodiment:

[0048] Please refer to Figure 2 , Figure 2 This is a specific structural diagram of a modular medium and low voltage primary and secondary complete intelligent switch testing system provided by the present invention.

[0049] As a preferred embodiment, the main control system 1 includes a test management module 11 and a main control device 12;

[0050] The test management module 11 is used to control the main control device 12 to output a test signal, control the target test switch to operate based on the expected test signal through the main control device 12, receive a control feedback signal from the target test switch, and determine the operating state of the target test switch based on the test feedback signal and the control feedback signal;

[0051] The main control device 12 is used to output a test signal and forward a test feedback signal sent by the target test system to the test management module 11 .

[0052] In this embodiment, the main control system 1 specifically includes a test management module 11 and a main control device 12, wherein the test management module 11 can be but is not limited to a host computer, which interacts with the target test switch through the main control device 12 to control the target test switch and receive the control feedback signal of the target test switch. The test management module 11 is also responsible for judging the working status of the target test switch, that is, whether the target test switch can be controlled normally, and whether the target test switch can input and output normally, etc. This application does not limit this.

[0053] The main control device 12 is mainly responsible for outputting test signals based on the control of the test management module 11. Specifically, when the user sets the start of the test, or starts the test after detecting that the target test switch is connected to the target test system, the switching device 2 can be manually controlled by the user to make the circuit between the main control device 12 and the target test system conductive. After the test starts, the test management module 11 controls the main control device 12 to output the test signal and controls the target test switch to realize the test of the target test switch.

[0054] As a preferred embodiment, the main control device 12 includes:

[0055] Communication equipment, used to forward the control working signal of the test management module 11 on the target test switch to the target test switch, so that the target test switch operates based on the expected test signal, forward the control output signal of the test management module 11 to the voltage and current generation and acquisition module, and forward the test feedback signal received by the voltage and current generation and acquisition module to the test management module 11;

[0056] The voltage and current generation and acquisition module is used to output a test signal based on the control output signal and receive a test feedback signal of a target test switch sent by a target test system.

[0057] In this embodiment, the main control device 12 specifically includes a communication device and a voltage and current generation and acquisition module, wherein the communication device is mainly responsible for the interaction between the test management module 11 and the target test switch, and the interaction between the test management module 11 and the voltage and current generation and acquisition module.

[0058] Specifically, the test management module 11 can send the control working signal for controlling the target test switch to the communication device, and the communication device then forwards the control working signal to the target test switch, so that the target test switch works based on the control working signal, thereby realizing the control of the target test switch by the test management module 11; the test management module 11 can also send the control output signal for controlling the voltage and current generation and acquisition module to the communication device. The communication device and the voltage and current generation and acquisition module are both arranged in the main control device 12, so the communication device and the voltage and current generation and acquisition module are in a connection relationship. The communication device can forward the control output signal to the voltage and current generation and acquisition module, so that the voltage and current generation and acquisition module outputs the test signal, thereby realizing the control of the voltage and current generation and acquisition module by the test management module 11.

[0059] As a preferred embodiment, the voltage and current generation and acquisition module includes a test feedback signal interface module, a voltage programmable source, a current programmable source, an adjustable overload current source, and a residual current source;

[0060] The test signal includes a test voltage output by a voltage program-controlled source, a test current output by a current program-controlled source, an overload current output by an adjustable overload current source, and a residual current characteristic signal output by a residual current source;

[0061] The test feedback signal interface module is used to receive the test feedback signal.

[0062] The test feedback signal interface module in the voltage and current generation and acquisition module of this embodiment is connected to the test system 3 via the switching device 2. After receiving the test feedback signal sent by the target test system for the target test switch, it is sent to the test management module 11 via the communication device. The voltage programmable source and the current programmable source respectively output the test voltage and test current, which can specifically be 0-440V, 0-200A AC power, which is converted by the target test system to power the target test switch. The adjustable overload current source can output the overload current to perform an overload current reaction test on the target test switch, and the residual current source can output the residual current characteristic signal to perform a residual current reaction test on the target test switch.

[0063] Based on this, the main control device 12 can provide multiple test items, and the target test system can convert the test signal based on the requirements of the target test switch to realize the modular medium and low voltage primary and secondary complete intelligent switch test system to test different test switches.

[0064] The test feedback signal interface module may include, but is not limited to, a multifunctional standard meter and a transformer calibrator to receive the test feedback signal.

[0065] As a preferred embodiment, when the target tested switch is a medium voltage primary and secondary complete intelligent switch, the target test system includes a voltage booster, a first current booster, and a first feedback signal acquisition device;

[0066] The voltage booster is used to convert the test voltage into the desired voltage of the medium voltage primary and secondary complete intelligent switch when the circuit between the voltage booster and the main control system 1 is connected. The first current booster is used to convert the test current into the first desired current of the medium voltage primary and secondary complete intelligent switch.

[0067] The first feedback signal acquisition device is used to collect the test feedback signal of the medium voltage primary and secondary complete intelligent switch when it works based on the expected voltage and the first expected current, and feed it back to the main control system 1.

[0068] In this embodiment, when the switch under test is a medium-voltage primary and secondary complete intelligent switch, there is no need to perform residual current and overload current reaction tests. The target test system can convert the test voltage output by the voltage programmable source into the expected voltage of the medium-voltage primary and secondary complete intelligent switch, and convert the test current output by the current programmable source into the first expected current of the medium-voltage primary and secondary complete intelligent switch. Specifically, different medium-voltage primary and secondary complete intelligent switches require different expected voltages and first expected currents. For a 10kV medium-voltage primary and secondary complete intelligent switch, the booster in the test system 3 corresponding to the 10kV medium-voltage primary and secondary complete intelligent switch is required to boost the expected voltage to 10kV. For a 20kV medium-voltage primary and secondary complete intelligent switch, the booster in the test system 3 corresponding to the 20kV medium-voltage primary and secondary complete intelligent switch is required to boost the expected voltage to 20kV. Therefore, medium-voltage primary and secondary complete intelligent switches of different voltages also correspond to different test systems 3, thereby enabling testing of different medium-voltage primary and secondary complete intelligent switches.

[0069] The first feedback signal acquisition device is used to collect the test feedback signal of the medium voltage primary and secondary complete intelligent switch when it is working based on the expected voltage and the first expected current, and feed it back to the main control system 1 so that the main control system 1 can judge the working status of the medium voltage primary and secondary complete intelligent switch when it is working.

[0070] As a preferred embodiment, when the target tested switch is a low-voltage primary and secondary complete intelligent switch, the target test system includes a second current booster, a voltage regulating current booster, an isolation device, and a second feedback signal acquisition device;

[0071] The second current booster is used to convert the test current into a second desired current of the low-voltage primary and secondary complete intelligent switch;

[0072] The voltage regulator and current booster is used to load the overload current to both ends of the low-voltage primary and secondary complete intelligent switch;

[0073] The isolation device is used to load residual current to the low-voltage primary and secondary complete intelligent switch based on the residual current characteristic signal;

[0074] The second feedback signal acquisition device is used to collect the test feedback signal of the low-voltage primary and secondary complete intelligent switch when it is working based on the second expected current, the test voltage in the test signal, the overload current and the residual current, and feed it back to the main control system 1.

[0075] In this embodiment, if the target test switch is a low-voltage primary and secondary complete intelligent switch, since the expected voltage of the low-voltage primary and secondary complete intelligent switch is usually 380V / 220V, there is no need to boost the test voltage. This not only enables the power supply to the low-voltage primary and secondary complete intelligent switch, but also enables the response test of the low-voltage primary and secondary complete intelligent switch to a wide-frequency voltage range, that is, the response test of the low-voltage primary and secondary complete intelligent switch to a voltage range of 50±650Hz, thereby achieving the test of power quality management and new energy grid connection management of the low-voltage primary and secondary complete intelligent switch.

[0076] In addition, although the test voltage does not need to be converted, the test current still needs to be increased to the second expected current before power can be supplied to the low-voltage primary and secondary complete intelligent switch.

[0077] By loading the overload current to both ends of the low-voltage primary and secondary complete intelligent switch through the voltage regulator and current booster, the main control system 1 can determine whether the target test switch is normal through the protection action response of the target test switch after the overload current is loaded; and by loading the residual current on the low-voltage primary and secondary complete intelligent switch through the isolation device, the main control system 1 can determine whether the target test switch is normal through the protection action response of the target test switch after the residual current is loaded. Under normal working conditions, the target test switch will immediately perform a protection action after being loaded with an overload voltage and / or residual current, such as turning off the switch, disconnecting the input, etc. If the target test switch does not perform a protection response in time after the overload voltage and / or residual current is loaded, it can be determined that the target test switch has a fault. Accordingly, whether a protection action response is performed can be determined by the main control system 1 through the control feedback signal of the target test switch.

[0078] As a preferred embodiment, the test feedback signal includes the operating voltage and the operating current of the tested switch.

[0079] In this embodiment, the test feedback signal includes the operating voltage and operating current of the test switch. That is, after the target test switch operates based on the expected test signal, if the working state is positive, the operating voltage and operating current are also the expected working current and expected working voltage, respectively. Therefore, the main control system 1 determines whether the target test switch is operating normally based on whether the operating voltage and operating current are normal.

[0080] Correspondingly, the control feedback signal can be a feedback signal for whether the target test switch responds normally to the control of the main control system 1 after the main control system 1 controls the target test switch. Specifically, the main control system 1 can determine whether each switch responds normally to the shutdown or conduction control of the main control system 1 through the control feedback signal.

[0081] As a preferred embodiment, the present invention further comprises:

[0082] The test product access module provided between the test system 3 and the test switch is used to connect the circuit between the test system 3 and the test switch.

[0083] Since different test switches have different expected test signals, in order to ensure that different test systems 3 can be connected to different test switches, in this embodiment, a test product access module is also provided between the test system 3 and the test switch. Specifically, the test product access module between a 20kV medium voltage primary and secondary complete intelligent switch and the corresponding test system 3 is a 20kV voltage level interface, that is, an interface that can withstand a 20kV voltage.

[0084] In addition, the test product access module also includes a connecting copper rod to ensure a stable connection between the test system 3 and the test switch.

[0085] As a preferred embodiment, it further includes a communication interface module provided between the main control system 1 and the tested switch; the tested switch includes a processor and a switch circuit;

[0086] The main control system 1 is specifically used to output a test signal, communicate with the processor through the communication interface module, and control the switch circuit to operate based on the expected test signal through the processor, and receive the control feedback signal of the switch circuit sent by the processor, and determine the working state of the target test switch according to the control feedback signal and the test feedback signal.

[0087] In this embodiment, a communication interface module is further included, which is arranged between the main control system 1 and the tested switch. The communication interface module is responsible for the communication between the main control system 1 and the tested switch, and can transmit the control working signal of the main control system 1 to the target tested switch, and can also transmit the control feedback signal of the target tested switch. The communication interface module can include, but is not limited to, a standard terminal (SCU / DTU / FTU), and can communicate with the main control system 1 via the 104 protocol, and can communicate with the tested switch via the 645 or 698 protocol.

[0088] It should be noted that when the main control system 1 controls the switching circuit, the operating current and operating voltage of the target test switch can be used to determine the integration accuracy of the target test switch, and the control feedback signal of the target test switch can be used to determine the control status of the remote and local opening and closing of the switching circuit in the normal state by the main control system 1, and the identification and isolation functions and performance testing of fault states (including phase-to-phase and phase-to-ground short-circuit faults) can be carried out.

[0089] It should also be noted that when selecting the parameters of each module in the main control system 1, the boundary conditions of the rated parameters of the medium and low voltage primary and secondary complete intelligent switch test system below 35kV can be clarified, among which the source stability is ≤±0.03%RD / 2in, the transient output 2nd to 13th harmonics, the measurement accuracy of the multi-function standard meter is ≤0.05%RD, the rated load capacity of the voltage programmable source is 800VA, the rated load capacity of the current programmable source is 3000VA (at 800A), and the rated load capacity of the adjustable overload current source is 5000VA (at 1260A).

[0090] The present invention provides a modular medium- and low-voltage primary and secondary complete intelligent switch testing device, which includes the modular medium- and low-voltage primary and secondary complete intelligent switch testing system as described above, and also includes a plurality of tested switches.

[0091] For an introduction to a medium and low voltage primary and secondary complete intelligent switch testing device provided by the present invention, please refer to the above system embodiment, and the present invention will not be described in detail here.

[0092] It should also be noted that, in this specification, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variants thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of additional identical elements in the process, method, article, or apparatus comprising the element.

[0093] The above description of the disclosed embodiments will enable one skilled in the art to implement or use the present invention. Various modifications to these embodiments will be readily apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention is not limited to the embodiments shown herein but is to be construed in the widest manner consistent with the principles and novel features disclosed herein.

Claims

1. A modular medium and low voltage primary and secondary complete intelligent switch test system, characterized by: It includes a main control system, a switching device and multiple test systems, each of the test systems is connected to the main control system through the switching device, and each of the test systems is connected to the tested switch in a one-to-one correspondence; The main control system is used to output a test signal, control the target test switch to operate based on the expected test signal, and receive a control feedback signal from the target test switch, and determine the operating state of the target test switch based on the control feedback signal and the test feedback signal; the test signal includes a test voltage, a test current, an overload current, and a residual current characteristic signal; The switching device is used to control the conduction of the circuit between the main control system and the target test system, and the target test system is the test system connected to the target test switch; The target test system is configured to convert the test signal into the expected test signal for the target test switch when the circuit between the target test system and the main control system is connected, and feed back the test feedback signal of the target test switch to the main control system; When the target tested switch is a medium voltage primary and secondary complete intelligent switch, the target test system includes a voltage booster, a first current booster and a first feedback signal acquisition device; When the target tested switch is a low-voltage primary and secondary complete intelligent switch, the target test system includes a second current booster, a voltage regulating current booster, an isolation device, and a second feedback signal acquisition device; The voltage booster is used to convert the test voltage into the desired voltage of the medium voltage primary and secondary complete intelligent switch when the circuit between the voltage booster and the main control system is connected. The first current booster is used to convert the test current into the first desired current of the medium voltage primary and secondary complete intelligent switch. The second current booster is used to convert the test current into a second desired current of the low-voltage primary and secondary complete intelligent switch; The voltage regulator and current booster is used to load the overload current to both ends of the low-voltage primary and secondary complete intelligent switch; The isolation device is used to load residual current to the low-voltage primary and secondary complete intelligent switch based on the residual current characteristic signal; The first feedback signal acquisition device is used to collect the test feedback signal of the medium voltage primary and secondary complete intelligent switch when it is working based on the expected voltage and the first expected current. The second feedback signal acquisition device is used to collect the test feedback signal of the low voltage primary and secondary complete intelligent switch when it is working based on the second expected current, the test voltage, overload current and residual current in the test signal, and feed it back to the main control system.

2. The modular medium and low voltage primary and secondary complete intelligent switch test system according to claim 1, characterized in that: The main control system includes a test management module and a main control device; The test management module is configured to control the main control device to output the test signal, control the target test switch to operate based on the expected test signal through the main control device, receive the control feedback signal of the target test switch, and determine the operating state of the target test switch based on the test feedback signal and the control feedback signal; The main control device is used to output the test signal and forward the test feedback signal sent by the target test system to the test management module.

3. The modular medium and low voltage primary and secondary complete intelligent switch test system according to claim 2, characterized in that: The main control device includes: a communication device, configured to forward the control working signal of the test management module on the target test switch to the target test switch, so that the target test switch operates based on the expected test signal, forward the control output signal of the test management module to the voltage and current generation and acquisition module, and forward the test feedback signal received by the voltage and current generation and acquisition module to the test management module; The voltage and current generation and acquisition module is used to output the test signal based on the control output signal, and receive the test feedback signal of the target test switch sent by the target test system.

4. The modular medium and low voltage primary and secondary complete intelligent switch test system according to claim 3, characterized in that: The voltage and current generation and acquisition module includes a test feedback signal interface module, a voltage programmable source, a current programmable source, an adjustable overload current source and a residual current source; The test signal includes the test voltage output by the voltage programmable source, the test current output by the current programmable source, the overload current output by the adjustable overload current source, and the residual current characteristic signal output by the residual current source; The test feedback signal interface module is used to receive the test feedback signal.

5. The modular medium and low voltage primary and secondary complete intelligent switch test system according to claim 1, characterized in that: The test feedback signal includes the operating voltage and the operating current of the tested switch.

6. The modular medium and low voltage primary and secondary complete intelligent switch test system according to claim 1, characterized in that: Also includes: The test product access module is provided between the test system and the test switch, and is used to connect the circuit between the test system and the test switch.

7. The modular medium and low voltage primary and secondary complete intelligent switch test system according to any one of claims 1 to 6, characterized in that: It also includes a communication interface module provided between the main control system and the tested switch; the tested switch includes a processor and a switch circuit; The main control system is specifically used to output a test signal, communicate with the processor through the communication interface module, so as to control the switch circuit to operate based on the expected test signal through the processor, and receive a control feedback signal for the switch circuit sent by the processor, and determine the operating state of the target test switch according to the control feedback signal and the test feedback signal.

8. A modular medium and low voltage primary and secondary complete intelligent switch test device, characterized in that: It comprises the modular medium and low voltage primary and secondary complete intelligent switch testing system as described in any one of claims 1 to 6, and also comprises a plurality of tested switches.

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