An automated test system and method

Abstract

The application discloses an automatic test system and method. The system comprises an intelligent power module, a host computer and a device under test. The intelligent power module, the host computer and the device under test are interconnected through an exchange network. An automatic test tool is run in the host computer. The automatic test tool is used for configuring multiple real-time operating system test scenes, controlling the device under test to perform performance test according to the test scenes, monitoring the test state of the device under test, determining the power supply logic of the intelligent power module according to the test state, and issuing a power supply instruction to the intelligent power module. The intelligent power module is used for performing power-on and power-off control on the device under test according to the power supply instruction issued by the automatic test tool. The technical scheme can ensure the continuity of test, thereby reducing the test cost.

Description

Technical Field

[0001] This invention relates to the field of automated testing technology, and in particular to an automated testing system and method. Background Technology

[0002] Real-time operating systems are fundamental software with numerous basic functions and a wide range of compatible platforms, resulting in thousands of different testing scenarios. Manual testing is clearly no longer sufficient to meet the testing requirements of operating systems.

[0003] Existing automated testing solutions for real-time operating systems typically involve hot-rebooting the device using a restart interface after completing one scenario test, and then running another scenario test until all scenarios are completed. However, this approach has the following drawbacks: if running a certain user scenario causes the system to crash, the automated test immediately terminates, failing to guarantee the continuity of testing and thus increasing product evaluation costs. Summary of the Invention

[0004] This invention provides an automated testing system and method that can ensure the continuity of testing, thereby reducing testing costs.

[0005] In a first aspect, embodiments of the present invention provide an automated testing system, comprising: an intelligent power module, a host computer, and a device under test; the intelligent power module, the host computer, and the device under test are interconnected via a switching network; and the host computer runs automated testing tools.

[0006] The automated testing tool is used to configure multiple real-time operating system test scenarios, control the device under test to perform performance tests according to the test scenarios, monitor the test status of the device under test, determine the power supply logic of the intelligent power module based on the test status, and issue power supply commands to the intelligent power module.

[0007] The intelligent power module is used to control the power-on and power-off of the device under test according to the power supply command issued by the automated testing tool.

[0008] Optionally, if the automated testing tool monitors the test status of the device under test as any of the following: test abnormality, test failure, or test completion, then it determines that the power supply logic of the intelligent power module is to power down, and sends a power down command to the intelligent power module.

[0009] Optionally, after the automated testing tool sends a power-down command to the intelligent power module for a first set duration, it determines that the power supply logic of the intelligent power module is power-on and sends a power-on command to the intelligent power module.

[0010] Optionally, the intelligent power module includes a processor and a relay;

[0011] The processor is used to parse the power supply command and control the relay to open or close based on the parsing result.

[0012] Optionally, if the automated testing tool monitors that the test status of the device under test has been in the test for more than a second set time, it determines that the power supply logic of the intelligent power module is to power off, and sends a power-off command to the intelligent power module.

[0013] Optionally, the automated testing tool is also used to count the number of test scenarios that have been run, and to determine whether the test is complete based on the number of test scenarios that have been run.

[0014] If the test is not completed, the automated test tool will issue a power-down command to the intelligent power module for a first set time after which it determines that the power supply logic of the intelligent power module is power-on and issues a power-on command to the intelligent power module.

[0015] If the test is completed, the automated test tool will send a power-down command to the intelligent power module and then stop generating power-on commands.

[0016] Optionally, the device under test runs a real-time operating system.

[0017] Secondly, embodiments of the present invention also provide an automated testing method, the method being executed by an automated testing system, comprising:

[0018] Monitor the test status of the device under test;

[0019] The power supply logic of the intelligent power module is determined based on the test status;

[0020] According to the power supply logic, a power supply command is issued to the intelligent power module, so that the intelligent power module controls the power-on and power-off of the device under test according to the power supply command.

[0021] Optionally, the power supply logic of the intelligent power module is determined based on the test status, including:

[0022] If the monitored test status is any of the following: test abnormal, test failed, or test abnormal, then the power supply logic of the intelligent power module is determined to be power-down.

[0023] After a first set time after issuing a power-down command to the intelligent power module, the power supply logic of the intelligent power module is determined to be power-on, and a power-on command is issued to the intelligent power module.

[0024] Thirdly, embodiments of the present invention also provide a computer-readable storage medium storing computer instructions for causing a processor to execute the automated testing method described in any one of the embodiments of the present invention.

[0025] The automated testing system of this invention includes: an intelligent power module, a host computer, and a device under test (DUT); the intelligent power module, the host computer, and the DUT are interconnected via a switching network; the host computer runs an automated testing tool; the automated testing tool is used to configure multiple real-time operating system test scenarios, control the DUT to perform performance testing according to the test scenarios, monitor the test status of the DUT, determine the power supply logic of the intelligent power module based on the test status, and issue power supply commands to the intelligent power module; the intelligent power module is used to control the power-on and power-off of the DUT according to the power supply commands issued by the automated testing tool. This technical solution can ensure the continuity of testing, thereby reducing testing costs. Attached Figure Description

[0026] Figure 1 This is a schematic diagram of the structure of an automated testing system provided in Embodiment 1 of the present invention;

[0027] Figure 2 This is a flowchart of an automated testing method provided according to Embodiment 2 of the present invention;

[0028] Figure 3 This is a schematic diagram of the structure of an electronic device provided according to Embodiment 3 of the present invention. Detailed Implementation

[0029] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, the accompanying drawings show only the parts relevant to the present invention, and not all of the structures.

[0030] Example 1

[0031] Figure 1 This is a schematic diagram of the structure of an automated testing system according to Embodiment 1 of the present invention, as shown below. Figure 1As shown, the automated testing system includes: an intelligent power module 110, a host computer 120, and a device under test (DUT) 130; the intelligent power module 110, the host computer 120, and the DUT 130 are interconnected via a switching network. The host computer runs automated testing tools; it can be understood that the intelligent power module 110 and the host computer 120 are connected via data; the host computer 120 and the DUT 130 are connected via data; and the intelligent power module 110 and the DUT 130 are electrically connected. Here, data connection can be understood as a communication connection through data transmission; in this embodiment, a switching network can be used to complete the data exchange process to achieve data connection. Electrical connection can be understood as a connection through power supply. The intelligent power module 110 can be used to provide power; the host computer 120 runs automated testing tools, which can be used to perform performance testing on the DUT 130 and monitor the test status of the DUT, determine the power supply logic of the intelligent power module based on the test status of the DUT, and issue power supply commands to the intelligent power module 110. The device under test 130 can be understood as the device that needs to be tested. The device under test 130 may run a real-time operating system and contain multiple test scenarios to perform various functional scenarios through an automated testing system.

[0032] In this embodiment, the host computer 120 of the automated testing system runs an automated testing tool. This tool can configure multiple real-time operating system test scenarios, control the device under test (DUT) 130 to perform performance tests according to the test scenarios, monitor the test status of the DUT 130, determine the power supply logic of the intelligent power module 110 based on the test status, and issue power supply commands to the intelligent power module 110. A test scenario can be understood as scenario testing, used to perform performance tests on the DUT 130. The automated testing tool in this embodiment can configure multiple real-time operating system test scenarios. The test scenarios in this embodiment can be pre-set. The automated testing tool in this embodiment can control the DUT 130 to perform performance tests according to the test scenarios. The test status of the DUT can include test abnormality, test failure, or test completion. Power supply logic can be understood as power-on or power-off. Power supply commands can include power-on commands and power-off commands. In this embodiment, the automated testing tool can monitor the test status of the DUT 130, determine the power supply logic of the intelligent power module 110 based on the test status, and issue power supply commands to the intelligent power module 110. In this embodiment, the automated testing tool in the host computer 120 can control the way the power supply command of the intelligent power module 110 is generated, so as to perform a cold restart on the device under test 130.

[0033] The intelligent power module 110 is used to control the power-on and power-off of the device under test (DUT) according to the power supply commands issued by the automated testing tool. The power supply commands may include power-on commands and power-off commands. In this embodiment, the intelligent power module 110 can control the power-on and power-off of the DUT 130 according to the power-on and power-off commands issued by the automated testing tool. In this embodiment, the intelligent power module 110 can be controlled by the automated testing tool running on the host computer 120, offering flexible usage methods. It provides power-on and power-off interfaces, and the automated testing system can implement the power-on and power-off of the intelligent power module 110 using programming languages ​​such as Python, C++, C, and JAVA. The power-on and power-off trigger times can be set according to the test scenario requirements.

[0034] In this embodiment, optionally, if the automated testing tool monitors the test status of the device under test 130 as any of the following: test abnormality, test failure, or test completion, then it determines that the power supply logic of the intelligent power module 110 is power-down, and issues a power-down command to the intelligent power module 110. Here, test abnormality can be an abnormal state of the device under test 130 due to various reasons during testing. Test failure can be understood as the state of the test scenario of the device under test 130 failing. Test completion can be understood as the state of the test scenario of the device under test 130 completing. The power-down command can power down the intelligent power module 110, that is, suspend power supply to the device under test 130. In this embodiment, if the automated testing tool monitors the test status of the device under test 130 as any of test abnormality, test failure, or test completion, it can determine that the power supply logic of the intelligent power module is power-down, and issue a power-down command to the intelligent power module 110 to suspend power supply to the device under test 130. The automated testing system of this embodiment can monitor the test status of the device under test 130 through automated testing tools and determine the power supply logic of the intelligent power module 110 through such settings, thereby facilitating the power-on and power-off control of the device under test 130.

[0035] In this embodiment, optionally, after the automated testing tool sends a power-down command to the intelligent power module 110 for a first set duration, it determines that the power supply logic of the intelligent power module 110 is power-on, and sends a power-on command to the intelligent power module 110.

[0036] The first set duration can be a pre-set duration by the automated testing system; for example, the first set duration can be 5 seconds, 6 seconds, or 10 seconds, etc., and can be set according to actual needs. In this embodiment, the automated testing tool running in the host computer 120 can determine that the power supply logic of the intelligent power module 110 is "power-on" after the first set duration has elapsed, and issue a power-on command to the intelligent power module 110, thereby enabling the intelligent power module 110 to power on according to the power-on command, so as to continue supplying power to the device under test 130, allowing the device under test 130 to run the next test scenario. Through this setting in this embodiment, a power-on command can be continued to be issued to the intelligent power module 110 after the pre-set duration, so as to continue testing and thus ensure the continuity of testing.

[0037] For example, when running a certain test scenario of the operating system, if the test status of the device under test is pass or the test result is fail, or if the test scenario causes an abnormality in the test system, the automated test tool sends a power-down command to the intelligent power module 110 to power down the device under test 130. After the device under test 130 is powered down for a first set time, the automated test tool can determine that the power supply logic of the intelligent power module 110 is power-on, and send a power-on command to the intelligent power module 110 to control the intelligent power module 110 to power on the device and complete the restart, so that the device under test can run the next test scenario.

[0038] In this embodiment, optionally, the intelligent power module 110 may include a processor and a relay; the processor may be used to parse the power supply command and control the relay to open or close according to the parsing result.

[0039] In this embodiment, the processor can be a DSP chip. The processor can parse power supply commands, which can be understood as parsing power-on or power-off commands. The parsing results can be understood as power-on parsing results and power-off parsing results. In this embodiment, the relay can be controlled to open based on the power-off parsing result, or controlled to close based on the power-on command. With this setting, the processor and relay in the intelligent power module 110 can control power-on and power-off. Specifically, the intelligent power module 110 can connect to the device under test 130 via a network; the processor of the intelligent power module 110 can be a DSP chip. After the intelligent power module 110 completes power-on initialization, upon receiving a power-on or power-off command from the automated test tool running on the host computer 120, the intelligent power module 110 can control the power interface to be connected or disconnected by closing or opening the relay. One power-on / off cycle completes one test scenario, and the automated test tool can monitor the test status of the device under test 130 and determine the power supply logic of the intelligent power module 110 based on the test status. The intelligent power module in this embodiment implements an external calling interface, which may include interfaces for setting the default intelligent power interface to be closed or open, closing the control interface, and disconnecting the control interface. In this embodiment, the automated testing system can ensure stable and reliable interface control of the intelligent power module 110 through such operations.

[0040] In this embodiment, optionally, if the automated testing tool monitors that the test status of the device under test 130 is in the test for more than a second set time, it determines that the power supply logic of the intelligent power module 110 is to power off, and sends a power-off command to the intelligent power module 110.

[0041] The second set duration can be a pre-set duration by the automated testing system. The second set duration can be longer than the first set duration and can be set according to actual needs. In this embodiment, if the device under test (DUT) remains in the testing state for longer than the pre-set second duration, the current test scenario may have entered an infinite loop or malfunctioned, requiring a power-down operation. In this embodiment, if the automated testing tool running on the host computer 120 of the automated testing system detects that the DUT 130's testing state has remained in the testing state for longer than the pre-set second duration, it determines that the power supply logic of the intelligent power module 110 is power-down, generates a power-down command, and sends the command to the intelligent power module 110 to power down and suspend power supply to the DUT 130. This automated testing system in this embodiment can avoid situations where the DUT malfunctions and cannot generate test results through such settings.

[0042] In this embodiment, optionally, the automated testing tool in the automated testing system can also be used to count the number of run test scenarios and determine whether the test is complete based on the number of run test scenarios. If the test is not complete, the automated testing tool sends a power-down command to the intelligent power module for a first set time, then determines that the power supply logic of the intelligent power module 110 is power-on, and sends a power-on command to the intelligent power module 110. If the test is complete, the automated testing tool stops generating power-on commands after sending a power-down command to the intelligent power module 110. The first set time can be a pre-set time by the automated testing system. Specifically, the automated testing system in this embodiment can set the default intelligent power interface to closed through the interface provided by the intelligent power module 110. After the device under test 130 is powered on, it runs the first test scenario. After the test is completed, the automated testing tool in the host computer 120 controls the power supply of the intelligent power module to disconnect, and then controls the intelligent power supply to close again after the first preset time to run the next test scenario. In this embodiment, after the current test scenario is completed, the automated testing tool in the automated testing system can determine whether all test scenarios have been completed based on the statistical count of run test scenarios. If the test is not completed, the automated testing tool sends a pre-set first preset time interval to the intelligent power module to issue a power-down command, determines that the power supply logic of the intelligent power module 110 is power-on, generates a power-on command, and sends a power-on command to the intelligent power module 110, continuing to control the intelligent power module 110 to open or close until all test scenarios are completed. If the test is completed, the automated testing tool can stop generating power-on commands after issuing a power-down command to the intelligent power module 110. In addition, in this embodiment, the automated testing system can also statistically analyze data such as the number of successful, failed, and abnormal scenarios. The test results of the test scenarios in this embodiment can include compilation failure, runtime failure, runtime exception, and runtime success. In this embodiment, the automated testing system ensures the continuity of testing by performing such operations, avoiding system crashes caused by abnormal testing scenarios that could lead to test termination, thus further reducing testing costs. At the same time, it simulates real user scenarios as accurately and objectively as possible, exposing bugs in the operating system in advance, shortening the testing cycle, and improving the quality of the testing system efficiently.

[0043] In this embodiment, optionally, the device under test 130 runs a real-time operating system. The fact that the device under test 130 runs a real-time operating system in this embodiment facilitates the automated testing system in performing tests on multiple test scenarios.

[0044] The automated testing system of this invention includes: an intelligent power module, a host computer, and a device under test (DUT); the intelligent power module, the host computer, and the DUT are interconnected via a switching network; the host computer runs an automated testing tool; the automated testing tool is used to configure multiple real-time operating system test scenarios, control the DUT to perform performance tests according to the test scenarios, monitor the test status of the DUT, determine the power supply logic of the intelligent power module based on the test status, and issue power supply commands to the intelligent power module; the intelligent power module is used to control the power-on and power-off of the DUT according to the power supply commands issued by the automated testing tool. This technical solution can ensure the continuity of testing, thereby reducing testing costs.

[0045] Example 2

[0046] Figure 2 This is a flowchart of an automated testing method according to Embodiment 2 of the present invention. This embodiment is applicable to the automated testing of equipment. The method can be executed by an automated testing system and specifically includes the following steps:

[0047] Step 210: Monitor the test status of the device under test.

[0048] The technical solution in this embodiment can be executed by an automated testing system. The automated testing system may include an intelligent power module, a host computer, and the device under test (DUT), with automated testing tools running on the host computer. In this embodiment, the automated testing tools can monitor the test status of the DUT.

[0049] The device under test (DUT) can be understood as the device to be tested by the automated testing system. The test status can include any of the following: test error, test failure, or other abnormal states. In this embodiment, the automated testing tool can monitor the test status of the DUT.

[0050] Step 220: Determine the power supply logic of the intelligent power module based on the test status.

[0051] The power supply logic of the intelligent power module can be understood as power-on or power-off. This power supply logic can be determined based on the test status. In this embodiment, an automated testing tool can determine the power supply logic of the intelligent power module based on the test status.

[0052] In this embodiment, optionally, determining the power supply logic of the intelligent power module based on the test status includes: if the monitored test status is any of the following: test abnormality, test failure, or test abnormality, then determining that the power supply logic of the intelligent power module is power-down; after a first set time after issuing a power-down command to the intelligent power module, determining that the power supply logic of the intelligent power module is power-on, and issuing a power-on command to the intelligent power module.

[0053] In this context, "power-down" can be understood as causing the intelligent power module to power down, pausing power supply. The "power-down command" can be understood as the intelligent power module powering down to pause power supply to the device under test. The first preset duration can be pre-set by the automated testing system. For example, the first preset duration can be 5 seconds, 6 seconds, or 10 seconds, etc., and can be set according to actual needs. The "power-on command" can be understood as the intelligent power module powering on to supply power to the device under test.

[0054] In this embodiment, the power supply logic can be automatically determined. If the test status of the device under test (DUT) monitored by the automated testing tool is any one of test abnormality, test failure, or test anomaly, then the power supply logic of the intelligent power module can be determined to be power-down. In this embodiment, the intelligent power module of the automated testing system can pause power supply to the DUT according to the power-down command. In this embodiment, the automated testing tool in the automated testing system can determine that the power supply logic of the intelligent power module is power-on after a first set time interval following the issuance of the power-down command, and then issue a power-on command to the intelligent power module. This setting allows the power-on command to be issued to the intelligent power module after the set time interval, facilitating continued testing and ensuring test continuity.

[0055] Step 230: Send a power supply command to the intelligent power module according to the power supply logic, so that the intelligent power module controls the power-on and power-off of the device under test according to the power supply command.

[0056] The power supply command can include power-on and power-off commands. These commands can be generated based on power supply logic. In this embodiment, the automated testing tool can issue power supply commands to the intelligent power module according to the power supply logic, enabling the intelligent power module to control the power-on and power-off of the device under test based on the commands.

[0057] In this embodiment, if the automated testing tool detects that the device under test has been in the testing state for more than a second set time, it generates a power-down command.

[0058] In this embodiment, the method may also include counting the number of test scenarios that have been run, determining whether the test is complete based on the number of test scenarios that have been run; if the test is not complete, after a first set time after issuing a power-down command to the intelligent power module, determining that the power supply logic of the intelligent power module is power-on, and issuing a power-on command to the intelligent power module; if the test is complete, after issuing a power-down command to the intelligent power module, the generation of power-on commands is stopped.

[0059] This invention monitors the test status of the device under test (DUT); determines the power supply logic of the intelligent power module based on the test status; and issues a power supply command to the intelligent power module according to the power supply logic, enabling the intelligent power module to control the power-on and power-off of the DUT based on the power supply command. This technical solution ensures the continuity of testing, thereby reducing testing costs.

[0060] Example 3

[0061] Figure 3 This is a schematic diagram of an electronic device according to Embodiment 3 of the present invention. The electronic device 10 is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device may also represent various forms of mobile devices, such as personal digital processors, cellular phones, smartphones, wearable devices (such as helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the invention described and / or claimed herein.

[0062] like Figure 3 As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12 or a random access memory (RAM) 13, communicatively connected to the at least one processor 11. The memory stores computer programs executable by the at least one processor. The processor 11 can perform various appropriate actions and processes based on the computer program stored in the ROM 12 or loaded from storage unit 18 into the RAM 13. The RAM 13 may also store various programs and data required for the operation of the electronic device 10. The processor 11, ROM 12, and RAM 13 are interconnected via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0063] Multiple components in electronic device 10 are connected to I / O interface 15, including: input unit 16, such as keyboard, mouse, etc.; output unit 17, such as various types of displays, speakers, etc.; storage unit 18, such as disk, optical disk, etc.; and communication unit 19, such as network card, modem, wireless transceiver, etc. Communication unit 19 allows electronic device 10 to exchange information / data with other devices through computer networks such as the Internet and / or various telecommunications networks.

[0064] Processor 11 can be a variety of general-purpose and / or special-purpose processing components with processing and computing capabilities. Some examples of processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. Processor 11 performs the various methods and processes described above, such as automated testing methods.

[0065] In some embodiments, the automated testing method may be implemented as a computer program tangibly contained in a computer-readable storage medium, such as storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on electronic device 10 via ROM 12 and / or communication unit 19. When the computer program is loaded into RAM 13 and executed by processor 11, one or more steps of the automated testing method described above may be performed. Alternatively, in other embodiments, processor 11 may be configured to perform the automated testing method by any other suitable means (e.g., by means of firmware).

[0066] Various embodiments of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0067] Computer programs used to implement the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when executed by the processor, the computer programs cause the functions / operations specified in the flowcharts and / or block diagrams to be performed. The computer programs may be executed entirely on a machine, partially on a machine, or as a standalone software package, partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0068] In the context of this invention, a computer-readable storage medium can be a tangible medium that may contain or store a computer program for use by or in conjunction with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination thereof. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fibers, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof.

[0069] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0070] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as data servers), or computing systems that include middleware components (e.g., application servers), or computing systems that include frontend components (e.g., user computers with graphical user interfaces or web browsers through which users can interact with implementations of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., communication networks). Examples of communication networks include local area networks (LANs), wide area networks (WANs), blockchain networks, and the Internet.

[0071] A computing system can include clients and servers. Clients and servers are generally located far apart and typically interact through communication networks. The client-server relationship is created by computer programs running on the respective computers and having a client-server relationship with each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a hosting product within the cloud computing service system to address the shortcomings of traditional physical hosts and VPS services, such as high management difficulty and weak business scalability.

[0072] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps described in this invention can be executed in parallel, sequentially, or in different orders, as long as the desired result of the technical solution of this invention can be achieved, and this is not limited herein.

[0073] The specific embodiments described above do not constitute a limitation on the scope of protection of this invention. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this invention should be included within the scope of protection of this invention.

Claims

1. An automated testing system, characterized in that, include: The system comprises an intelligent power module, a host computer, and a device under test (DUT); the intelligent power module, the host computer, and the DUT are interconnected via a switching network; the host computer runs automated testing tools. The automated testing tool is used to configure multiple real-time operating system test scenarios and control the device under test to perform performance tests according to the test scenarios. And monitor the test status of the device under test, determine the power supply logic of the intelligent power module based on the test status, and send a power supply command to the intelligent power module; The intelligent power module is used to control the power-on and power-off of the device under test according to the power supply command issued by the automated testing tool; If the automated testing tool monitors that the test status of the device under test has been in the test for more than the second set time, it determines that the power supply logic of the intelligent power module is to power down, and sends a power down command to the intelligent power module. The automated testing tool is also used to count the number of test scenarios that have been run, and to determine whether the test is complete based on the number of test scenarios that have been run. If the test is not completed, the automated test tool will issue a power-down command to the intelligent power module for a first set time after which it determines that the power supply logic of the intelligent power module is power-on and issues a power-on command to the intelligent power module. If the test is completed, the automated test tool will send a power-down command to the intelligent power module and then stop generating power-on commands. Wherein, the second set duration is greater than the first set duration; If the automated testing tool detects that the test status of the device under test is any of the following: test abnormality, test failure, or test completion, then it determines that the power supply logic of the intelligent power module is to power down, and sends a power down command to the intelligent power module; wherein, the power down command is used to suspend the power supply to the device under test.

2. The system according to claim 1, characterized in that, After the automated testing tool sends a power-down command to the intelligent power module for a first set time, it determines that the power supply logic of the intelligent power module is power-on, and sends a power-on command to the intelligent power module.

3. The system according to claim 1, characterized in that, The intelligent power module includes a processor and a relay; The processor is used to parse the power supply command and control the relay to open or close based on the parsing result.

4. The system according to claim 1, characterized in that, The device under test runs a real-time operating system.

5. An automated testing method, characterized in that, The method is executed by any one of the automated testing systems described in claims 1-4, and includes: Monitor the test status of the device under test; The power supply logic of the intelligent power module is determined based on the test status; According to the power supply logic, a power supply command is issued to the intelligent power module, so that the intelligent power module controls the power on and off of the device under test according to the power supply command; If the device under test is found to be in the test state for more than the second set time, a power-down command is generated. The number of run test scenarios is counted, and the test completion status is determined based on the number of run test scenarios. If the test is not completed, a power-down command is sent to the intelligent power module for a first set time, and the power supply logic of the intelligent power module is determined to be power-on, and a power-on command is sent to the intelligent power module. If the test is completed, the generation of power-on commands is stopped after the power-down command is sent to the intelligent power module. The power-down command is used to pause the power supply to the device under test. Wherein, the second set duration is greater than the first set duration; The power supply logic of the intelligent power module is determined based on the test status, including: If the monitored test status is any of the following: test abnormal, test failed, or test completed, then the power supply logic of the intelligent power module is determined to be power-off.

6. The method according to claim 5, characterized in that, The power supply logic of the intelligent power module is determined based on the test status, including: After a first set time after issuing a power-down command to the intelligent power module, the power supply logic of the intelligent power module is determined to be power-on, and a power-on command is issued to the intelligent power module.

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer instructions that cause a processor to execute the automated testing method according to any one of claims 5-6.

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