Nixie tube detection method and related device

Abstract

The application discloses a nixie tube detection method and related equipment, which is used for improving the efficiency of nixie tube detection. The method comprises the following steps: obtaining M target patterns, the target pattern is a short-circuit detection pattern used for determining whether the adjacent pins of a to-be-detected nixie tube are short-circuited, and each pair of adjacent pins corresponds to a target pattern; when the short-circuit detection pattern is displayed, a first pen segment of the to-be-detected nixie tube emits light and a second pen segment is extinguished, the segment selection line corresponding to the first pen segment is a first pin, the segment selection line corresponding to the second pen segment is a second pin, and the first pin and the second pin are any one pair of the N pairs of adjacent pins of the to-be-detected nixie tube; and whether the to-be-detected nixie tube can display the M target patterns is detected. By determining the corresponding target pattern according to the adjacent pins, the patterns required to be displayed for short-circuit detection of the to-be-detected nixie tube can be reduced, and thus the detection process can be shortened, and the detection efficiency can be improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of electronic component detection, in particular to a nixie tube detection method and related equipment. BACKGROUND

[0002] A nixie tube is also called a glow tube, a semiconductor nixie tube or a light-emitting diode (LED) nixie tube. It is a digital display device in which a plurality of light-emitting diodes are arranged and packaged together in a certain pattern. By controlling the lighting of different combinations of light-emitting diodes in the nixie tube, the nixie tube can display different patterns.

[0003] Due to its low price and easy use, the nixie tube is widely used in electronic products in various fields. In order to ensure the quality of the nixie tube, the manufacturer needs to perform quality detection on the nixie tube before it is shipped out of the factory to determine whether the nixie tube can work normally.

[0004] The current detection method causes the nixie tube to be detected to display all working patterns of the nixie tube in sequence. Taking a unit 8-character nixie tube as an example, the nixie tube to be detected starts from the number 0 and displays the numbers 0, 1,..., 8, 9 and English letters A, b, C, d, E, F in sequence. Then, whether the nixie tube to be detected can display the aforementioned working patterns is determined by artificial vision or machine vision, and whether the nixie tube can work normally is determined.

[0005] However, the above method takes a long time to detect and has low detection efficiency. SUMMARY

[0006] The present application provides a nixie tube detection method and related equipment, which can improve the efficiency of nixie tube detection.

[0007] In a first aspect, the present application provides a nixie tube detection method applied to a test platform, which comprises:

[0008] M target patterns are obtained, the target pattern being a short-circuit detection pattern used to determine whether adjacent pins of a nixie tube to be detected are short-circuited, each pair of adjacent pins corresponding to a target pattern; when the short-circuit detection pattern is displayed, a first stroke of the nixie tube to be detected emits light and a second stroke is extinguished, the bit selection line corresponding to the first stroke and the bit selection line corresponding to the second stroke are both connected to a power supply, the segment selection line corresponding to the first stroke is a first pin and the segment selection line corresponding to the second stroke is a second pin, the first pin and the second pin being any one pair of the N pairs of adjacent pins of the nixie tube to be detected, and M is less than or equal to N;

[0009] It is detected whether the nixie tube to be detected can display the M target patterns.

[0010] In the present application, by acquiring a short-circuit detection pattern in which a first pen segment emits light and a second pen segment is extinguished when the corresponding bit selection line is turned on as a target pattern of the corresponding adjacent pins, and then detecting whether the second pen segment emits light when the to-be-tested nixie tube displays the target pattern to determine whether the pair of adjacent pins is short-circuited, the patterns required to be displayed for short-circuit detection of the to-be-tested nixie tube can be reduced, and thus the detection process can be shortened and the detection efficiency can be improved.

[0011] In a possible implementation, before the M target patterns are acquired, the method further includes: acquiring a correspondence between the pins and the pen segments of the to-be-tested nixie tube; determining N short-circuit detection pattern sets according to the N pairs of adjacent pins and the correspondence, each short-circuit detection pattern in each short-circuit detection pattern set being capable of detecting whether the corresponding adjacent pins are short-circuited, and each pair of adjacent pins corresponding to a short-circuit detection pattern set; and the acquiring of the M target patterns includes: acquiring the M target patterns from the N short-circuit detection pattern sets.

[0012] In the present application, by determining the short-circuit detection pattern set that can detect whether the pair of adjacent pins is short-circuited according to the adjacent pins and the pen segments corresponding to the adjacent pins, the test platform can flexibly select a short-circuit detection pattern as a target pattern according to various priorities.

[0013] In a possible implementation, the acquiring of the M target patterns from the N short-circuit detection pattern sets includes: acquiring a frequency at which each short-circuit detection pattern appears in the N short-circuit detection pattern sets; determining the short-circuit detection pattern with the highest frequency in each short-circuit detection pattern set as the target pattern, to obtain the M target patterns.

[0014] In the present application, by determining the candidate pattern with the highest frequency in each candidate pattern set as the target pattern, short-circuit detection of the N pairs of adjacent pins can be completed with as few target patterns as possible, and the detection efficiency can be improved.

[0015] In a possible implementation, before the M target patterns are acquired, the method further includes: detecting whether the to-be-tested nixie tube can display an open-circuit detection pattern, the open-circuit detection pattern being a pattern formed by all pen segments of the to-be-tested nixie tube emitting light; and if the to-be-tested nixie tube can display the open-circuit detection pattern, triggering the step of acquiring the M target patterns.

[0016] In the present application, by determining whether the to-be-tested nixie tube can display the open-circuit verification pattern to exclude open-circuit faults, and then performing short-circuit detection after it is determined that the to-be-tested nixie tube has no open-circuit fault, the display of the short-circuit detection pattern can be prevented from being disturbed by the pen segments or pins of the open-circuit, and the accuracy of the detection result can be improved.

[0017] In a possible implementation, after the detection of whether the to-be-detected nixie tube can display the short-circuit detection pattern, the method further includes: if the to-be-detected nixie tube cannot display the short-circuit detection pattern, determining a light pen segment of the to-be-detected nixie tube when the to-be-detected nixie tube displays the short-circuit detection pattern; and the obtaining of the M target patterns includes: obtaining the M target patterns from the short-circuit detection patterns that can be displayed by the light pen segment.

[0018] In the present application, in the case that the to-be-detected nixie tube has a short-circuit fault, the light pen segment of the to-be-detected nixie tube that can emit light is determined first, then the short-circuit detection patterns that can be displayed according to the light pen segment are determined, and finally the target patterns are obtained from the short-circuit detection patterns that can be displayed, so as to detect the adjacent pin short-circuit condition of the to-be-detected nixie tube as much as possible, and improve the coverage and accuracy of the detection result.

[0019] In a possible implementation, after the detection of whether the to-be-detected nixie tube can display the short-circuit detection pattern, the method further includes: if the to-be-detected nixie tube cannot display the short-circuit detection pattern, determining a light pen segment of the to-be-detected nixie tube when the to-be-detected nixie tube displays the short-circuit detection pattern; and the obtaining of the M target patterns includes: obtaining the M target patterns from the short-circuit detection patterns that can be displayed by the light pen segment.

[0020] In the present application, in the case that the to-be-detected nixie tube has a short-circuit fault, the light pen segment of the to-be-detected nixie tube that can emit light is determined first, then the short-circuit detection patterns that can be displayed according to the light pen segment are determined, and finally the target patterns are obtained from the short-circuit detection patterns that can be displayed, so as to detect the adjacent pin short-circuit condition of the to-be-detected nixie tube as much as possible, and improve the coverage and accuracy of the detection result.

[0021] In a possible implementation, the target pattern is a pattern displayed by the to-be-detected nixie tube when the to-be-detected nixie tube works normally.

[0022] In the present application, by limiting the target pattern to a pattern displayed by the to-be-detected nixie tube when the to-be-detected nixie tube works normally, on the one hand, the amount of calculation of the test platform for determining the target pattern can be reduced, and on the other hand, the test platform is facilitated to identify, and the accuracy and efficiency of the identification algorithm are improved.

[0023] In a possible implementation, after the detection of whether the to-be-detected nixie tube can display the M target patterns, the method further includes: acquiring a first detection image of the to-be-detected nixie tube when the to-be-detected nixie tube displays the short-circuit detection pattern; comparing the first detection image with a preset standard image to determine whether a difference between a brightness of a light-emitting pen segment of the to-be-detected nixie tube in the first detection image and a brightness of a corresponding pen segment in the standard image is greater than a preset threshold, the standard image being an image of the to-be-detected nixie tube displaying the short-circuit detection pattern without failure; if yes, determining that the light-emitting pen segment is damaged; and if no, determining that the light-emitting pen segment is not damaged.

[0024] In the present application, after the short-circuit fault detection of the to-be-detected nixie tube is completed, whether the corresponding pen segment is damaged is determined by detecting whether the difference between the brightness of the pen segment of the to-be-detected nixie tube and the standard brightness is greater than the preset threshold, so that more comprehensive quality detection of the to-be-detected nixie tube can be implemented.

[0025] In a second aspect, the present application provides a test platform, which includes:

[0026] An acquisition unit is configured to acquire M target patterns, the target pattern being a short-circuit detection pattern used to determine whether adjacent pins of a to-be-detected nixie tube are short-circuited, each pair of adjacent pins corresponding to a target pattern; when the short-circuit detection pattern is displayed, a first pen segment of the to-be-detected nixie tube emits light and a second pen segment is extinguished, a bit selection line corresponding to the first pen segment and a bit selection line corresponding to the second pen segment are both connected to a power supply, a segment selection line corresponding to the first pen segment is a first pin, a segment selection line corresponding to the second pen segment is a second pin, the first pin and the second pin being any one pair of the N pairs of adjacent pins of the to-be-detected nixie tube, and M being less than or equal to N.

[0027] A detection unit is configured to detect whether the to-be-detected nixie tube can display the M target patterns.

[0028] In a possible implementation, the acquisition unit is further configured to acquire a correspondence between the pins and the pen segments of the to-be-detected nixie tube; the test platform further includes a determination unit configured to determine, according to the N pairs of adjacent pins and the correspondence, N short-circuit detection pattern sets, each short-circuit detection pattern set including short-circuit detection patterns capable of detecting whether corresponding adjacent pins are short-circuited, each pair of adjacent pins corresponding to a short-circuit detection pattern set; and the acquisition unit is specifically configured to acquire the M target patterns from the N short-circuit detection pattern sets.

[0029] In a possible implementation, the acquisition unit is specifically configured to: acquire a frequency at which each short-circuit detection pattern appears in the N short-circuit detection pattern sets; and determine, as the target pattern, a short-circuit detection pattern with the highest frequency in each short-circuit detection pattern set, to obtain the M target patterns.

[0030] In a possible implementation, the detection unit is further configured to: detect whether the to-be-detected nixie tube can display a short-circuit detection pattern, the short-circuit detection pattern being a pattern formed by all light-emitting segments of the to-be-detected nixie tube; and if the to-be-detected nixie tube can display the short-circuit detection pattern, trigger the acquisition unit to perform the step of acquiring the M target patterns.

[0031] In a possible implementation, the determination unit is further configured to: if the to-be-detected nixie tube cannot display the short-circuit detection pattern, determine a light-emitting segment of the to-be-detected nixie tube when the to-be-detected nixie tube displays the short-circuit detection pattern; and the acquisition unit is specifically configured to: acquire the M target patterns from the short-circuit detection pattern that can be displayed by the light-emitting segment.

[0032] In a possible implementation, the determination unit is further configured to: if the to-be-detected nixie tube cannot display the short-circuit detection pattern, determine a target nixie tube with the largest number of light-emitting segments when the to-be-detected nixie tube displays the short-circuit detection pattern; and the acquisition unit is specifically configured to: acquire the M target patterns from the short-circuit detection pattern that can be displayed by the light-emitting segments of the target nixie tube when the target nixie tube displays the short-circuit detection pattern; and the detection unit is specifically configured to: detect whether the target nixie tube can display the M target patterns.

[0033] In a possible implementation, the target pattern is a pattern displayed by the to-be-detected nixie tube when the to-be-detected nixie tube is in good condition.

[0034] In a possible implementation, the acquisition unit is further configured to: acquire a first detection image of the to-be-detected nixie tube when the to-be-detected nixie tube displays the short-circuit detection pattern; and the determination unit is further configured to: compare the first detection image with a preset standard image, determine whether a difference between a brightness of a light-emitting segment of the to-be-detected nixie tube in the first detection image and a brightness of a corresponding segment in the standard image is greater than a preset threshold, the standard image being an image of the to-be-detected nixie tube displaying the short-circuit detection pattern when the to-be-detected nixie tube is in good condition; if yes, determine that the light-emitting segment is damaged; and if no, determine that the light-emitting segment is not damaged.

[0035] In a third aspect, a computer readable storage medium is provided, the computer readable storage medium includes instructions that, when executed on a computer, cause the computer to perform the method of the first aspect.

[0036] In a fourth aspect, a computing device is provided, the computing device includes a processor, a memory;

[0037] The memory has stored therein instructions or codes;

[0038] The processor is configured to communicate with the memory and execute the instructions or codes in the memory to perform the method of the first aspect.

[0039] The solutions provided by the second aspect to the fourth aspect are used to implement or assist in implementing the method provided by the first aspect, and thus can achieve the same or corresponding beneficial effects as the first aspect. Therefore, no further description is provided here. BRIEF DESCRIPTION OF DRAWINGS

[0040] Figure 1 FIG. 1 is a schematic diagram of a digital tube detection device provided by an embodiment of the present application;

[0041] Figure 2 FIG. 2 is a flowchart of a digital tube detection method provided by an embodiment of the present application;

[0042] Figure 3 FIG. 3 is a pin diagram and a pen segment schematic diagram of a digital tube to be detected provided by an embodiment of the present application;

[0043] Figure 4 FIG. 4 is a flowchart of another digital tube detection method provided by an embodiment of the present application;

[0044] Figure 5 FIG. 5 is a schematic diagram of an open circuit detection pattern provided by an embodiment of the present application;

[0045] Figures 6 to 8 FIG. 6 is a schematic diagram of a short circuit detection pattern provided by an embodiment of the present application;

[0046] Figure 9 FIG. 7 is a schematic diagram of a pause detection pattern provided by an embodiment of the present application;

[0047] Figure 10 FIG. 8 is a structural schematic diagram of a test platform provided by an embodiment of the present application;

[0048] Figure 11 FIG. 9 is a structural schematic diagram of a computing device provided by an embodiment of the present application. DETAILED DESCRIPTION

[0049] The embodiments of the present application are described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all the embodiments. Those skilled in the art can know that, as the technology develops and new scenarios appear, the technical solutions provided by the embodiments of the present application are also applicable to similar technical problems.

[0050] The terms "first", "second", and the like, as used in the specification and claims of this application and the preceding drawings, are used for distinguishing between similar objects and are not necessarily used to describe a particular sequential or chronological order. It is to be understood that the use of the terms so construed can interchange depending on the context in which it is used. It is also to be understood that the term "or" as used herein is intended to mean "and / or", unless otherwise indicated by context. Further, the terms "include", "includes", and "including" are intended to be inclusive and mean that something other than the listed items is also possible. The term "comprise", "comprises" and "comprising" or "include", "includes" and "including" are used in the inclusive, open sense and do not exclude additional, unrecited elements.

[0051] As shown in Figure 1 Figure 1 A schematic diagram of a nixie tube detection device provided by an embodiment of the present application is shown in the figure, which includes a clamp 1, a measured single board 2, an image acquisition device 3 and a test platform 4, wherein the measured single board 2 is provided with a nixie tube 21.

[0052] The test platform 4 is connected with the image acquisition device 3, and the test platform 4 is connected with the measured single board 2 through the clamp 1.

[0053] The clamp 1 is used for clamping the measured single board 2, and is also used for forwarding a test signal received by the test platform 4 to the measured single board 2. It can be understood that, Figure 1 The clamp shown in the figure is only an example and is not limited, and in actual application, the structure of the clamp 1 can be more complex and precise to adapt to measured single boards 2 of different structures.

[0054] The clamp 1 can be connected with the test platform 4 and the measured single board 2 through wired connection or wireless connection, and acts as a data relay station for the two.

[0055] The measured single board 2 is used for controlling the nixie tube 21 to display a pattern corresponding to the test signal according to the test signal. Specifically, the measured single board 2 controls the nixie tube 21 to generate a potential difference between a common pin and a pen segment pin according to the test signal, so as to generate a current passing through a light-emitting diode of the nixie tube 21, so that the light-emitting diode is lighted up; finally, the lighted up one or more light-emitting diodes form the corresponding pattern.

[0056] The nixie tube 21 can be a unit nixie tube or a multi-bit nixie tube.

[0057] The pattern refers to a pattern formed by the nixie tube 21 being lighted up in part or all of the pen segments controlled by the test platform 4.

[0058] ​Specifically, a pen segment of a nixie tube refers to a light-emitting diode corresponding to a stroke segment constituting a character of the nixie tube. For example, the "8" of an 8-character nixie tube is composed of 7 pen segments.

[0059] In a unit nixie tube, each light-emitting diode is connected in a common cathode or common anode manner, that is, the anodes or cathodes of all the light-emitting diodes in the unit nixie tube are connected together as a common pin; and the cathodes or anodes of each light-emitting diode are independent pins, each pin controlling one pen segment, and thus the independent pin can be referred to as a pen segment pin.

[0060] In a multi-digit nixie tube, the connection manner of the light-emitting diodes in each digit nixie tube is the same as that in a unit nixie tube, and the different digit nixie tubes are in a parallel relationship. The common pin of each digit nixie tube is also referred to as a digit selection line. When a current passes through the common pin and lights up the digit nixie tube, it can be considered that the digit nixie tube is selected for display. The same pen segment of different digit nixie tubes corresponds to the same pin, which is also referred to as a segment selection line. It can be understood that the pen segment pin in the unit nixie tube can also be referred to as a segment selection line.

[0061] The test platform 4 can control the current to pass through different digit selection lines and segment selection lines to light up different pen segments in the multi-digit nixie tube to form different patterns.

[0062] More specifically, the test platform 4 can control a digit selection line corresponding to a pen segment to be connected to a high level and a segment selection line corresponding to the pen segment to be connected to a ground to light up the pen segment.

[0063] The image acquisition device 3 is configured to capture an image of the pattern displayed by the nixie tube 21 and return the image to the test platform 4.

[0064] The image acquisition device 3 can include a simple camera and a filter. The simple camera performs the function of capturing an image, and the filter is used to filter light to make the pattern displayed by the nixie tube 21 brighter and more prominent.

[0065] The test platform 4 can be a terminal or other computing device with data processing capability. The embodiments of the present application are not limited to the specific form of the test platform 4 shown in the drawings. For example, the test platform 4 can be a mobile phone, a tablet computer (pad), or a personal computer (PC), etc. Figure 1

[0066] ​The test platform 4 is configured to acquire a detection pattern used to detect whether the nixie tube 21 is faulty, and send a first control signal used to instruct the nixie tube 21 to display the detection pattern to the single board 2 under test; and is further configured to send a second control signal used to instruct the image acquisition device 3 to acquire a detection image of the nixie tube 21 displaying the detection pattern; and is further configured to identify a verification pattern actually displayed by the nixie tube 21 in the detection image, and compare the verification pattern with the corresponding detection pattern; if all the verification patterns are consistent with the corresponding detection patterns, it is determined that the nixie tube 21 is not faulty.

[0067] The detection pattern can include an open circuit detection pattern and a short circuit detection pattern. The open circuit detection pattern is used to detect whether the nixie tube 21 has an open circuit fault, and the short circuit detection pattern is used to detect whether the nixie tube 21 has a short circuit fault. By detecting whether the nixie tube 21 has an open circuit fault and a short circuit fault, it can be determined whether the nixie tube 21 can work normally.

[0068] It can be understood that the structure illustrated in the embodiment does not constitute a specific limitation on the nixie tube detection device. In other embodiments, the nixie tube detection device can include more or fewer components than those illustrated, or combine certain components, or split certain components, or different component arrangements.

[0069] On the basis of the nixie tube detection device described above, the embodiment of the present application provides a nixie tube detection method. Please refer to Figure 2 , Figure 2 A flowchart of a nixie tube detection method provided by the embodiment of the present application is shown. The method can be applied to the test platform in the nixie tube detection device described above, and the method includes steps 201 to 202.

[0070] 201. Acquire M target patterns.

[0071] The target pattern is a short circuit detection pattern used to determine whether the adjacent pins of the nixie tube under test are short-circuited.

[0072] When any one pair of adjacent pins of the nixie tube under test is short-circuited, as long as one pin (hereinafter referred to as the first pin) in the pair of adjacent pins is powered, the other pin (hereinafter referred to as the second pin) will be powered through the short circuit between the pair of adjacent pins; that is, when the first pen segment controlled by the first pin emits light, the second pen segment controlled by the second pin will also emit light due to the short circuit. Therefore, based on the first pen segment emitting light and the second pen segment being extinguished, a plurality of short circuit detection patterns capable of detecting whether the pair of adjacent pins is short-circuited can be designed. Specifically, when the nixie tube under test displays the short circuit detection pattern, if the second pen segment does not emit light, it can be determined that the pair of adjacent pins has no short circuit fault.

[0073] The bit selection line corresponding to the first pen segment and the bit selection line corresponding to the second pen segment are both connected to the power supply. It can be understood that the "first pin controlled first pen segment" means that the test platform can control the first pin to connect to the other pole to make the first pen segment under the condition that the corresponding bit selection line is connected to one pole of the power supply. The "second pin controlled second pen segment" is the same.

[0074] It can be understood that when the to-be-detected nixie tube is a multi-bit nixie tube, one pin corresponds to multiple pen segments; and in the display of the short circuit detection pattern, in the nixie tube corresponding to the bit selection line not connected to the power supply, the pen segment corresponding to the first pin or the second pin does not belong to the first pen segment or the second pen segment.

[0075] Therefore, as described above, each pair of adjacent pins of the to-be-detected nixie tube corresponds to a set of short circuit detection patterns, and each set of short circuit detection patterns can be regarded as a short circuit detection pattern set; and detecting whether a pair of adjacent pins is short-circuited only needs one short circuit detection pattern, that is, each pair of adjacent pins corresponds to a target pattern, and therefore the M target patterns are selected from the N short circuit detection pattern sets corresponding to the N pairs of adjacent pins.

[0076] It can be understood that each pair of adjacent pins has a target pattern for determining whether it is short-circuited, and one target pattern can determine whether one or more pairs of adjacent pins are short-circuited, so that the number M of target patterns is less than or equal to the number N of adjacent pins, that is, M is less than or equal to N.

[0077] For example, in a target pattern, the first pen segment emits light, and the pen segments corresponding to the two pins adjacent to the first pin are extinguished, so that the target pattern can determine whether the two pairs of adjacent pins containing the first pin are short-circuited.

[0078] Before step 201 is performed, the test platform can detect whether the to-be-detected nixie tube can display an open circuit detection pattern, wherein the open circuit detection pattern is a pattern formed by lighting all pen segments of the to-be-detected nixie tube.

[0079] The test platform can control the to-be-detected nixie tube to display the open circuit verification pattern, and then control the image acquisition device to acquire a first detection image in which the to-be-detected nixie tube displays the open circuit verification pattern; then identify a first verification pattern actually displayed by the to-be-detected nixie tube in the first detection image; if the first verification pattern is consistent with the open circuit verification pattern, it can be determined that the to-be-detected nixie tube has no open circuit fault; if the first verification pattern is inconsistent with the open circuit verification pattern, it can be determined that the to-be-detected nixie tube has an open circuit fault.

[0080] In a possible implementation, if the to-be-tested nixie tube cannot display the open-circuit detection pattern, that is, the to-be-tested nixie tube has an open-circuit fault, the test platform can determine the light pen segment of the to-be-tested nixie tube when the to-be-tested nixie tube displays the open-circuit detection pattern, and then acquire the M target patterns from the short-circuit detection patterns that can be displayed by the light pen segment.

[0081] In a specific possible implementation, the test platform can determine the short-circuit detection patterns that can be displayed by the to-be-tested nixie tube according to the light pen segment, and then divide the short-circuit detection patterns into different short-circuit detection pattern sets according to the adjacent pins of the to-be-tested nixie tube, and finally acquire the corresponding target patterns from each short-circuit detection pattern set.

[0082] It can be understood that when the same pen segment of each nixie tube does not emit light when the to-be-tested nixie tube displays the open-circuit detection pattern, it can be determined that the pin corresponding to the pen segment has an open-circuit fault, and in this case, the test platform does not need to perform short-circuit detection related to the pin.

[0083] In another specific possible implementation, the test platform can first acquire N short-circuit detection pattern sets according to the N pairs of adjacent pins, then filter the short-circuit detection patterns that cannot be displayed by the light pen segment from the N short-circuit detection pattern sets, and finally acquire the M target patterns from the N filtered short-circuit detection pattern sets.

[0084] In another possible implementation, if the to-be-tested nixie tube cannot display the open-circuit detection pattern, that is, the to-be-tested nixie tube has an open-circuit fault, the test platform can determine the target nixie tube as the nixie tube with the largest number of light pen segments when the to-be-tested nixie tube displays the open-circuit detection pattern, then acquire the M target patterns from the short-circuit detection patterns that can be displayed by the light pen segments of the target nixie tube when the target nixie tube displays the open-circuit detection pattern, and finally detect whether the target nixie tube can display the M patterns.

[0085] In this way, the target patterns are limited to the patterns displayed by a unit nixie tube, so that when an image of a pattern displayed by the to-be-tested nixie tube is collected, the dynamic cycle display time interval when multiple nixie tubes display a pattern does not need to be considered, the scheme is simpler and more direct, and the problem that the image clarity is not enough and the image brightness is greatly different from the actual brightness due to circuit time delay can be reduced.

[0086] The embodiments of the present application can improve the accuracy of the detection result by determining whether the to-be-tested nixie tube can display the open-circuit verification pattern to exclude an open-circuit fault, performing short-circuit detection after determining that the to-be-tested nixie tube has no open-circuit fault, or acquiring target patterns that are not affected according to the open-circuit fault condition to perform short-circuit detection.

[0087] If the to-be-detected nixie tube does not have an open circuit fault, the test platform can directly obtain the M target patterns.

[0088] In a possible implementation, obtaining the M target patterns can include: receiving the M target patterns of the external input.

[0089] In the possible implementation, the tester can determine the corresponding M target patterns after determining the model, type and pin layout of the to-be-detected nixie tube, and input the M target patterns to the test platform, so that the test platform executes step 202 according to the M target patterns.

[0090] In another possible implementation, obtaining the M target patterns can include: obtaining a correspondence between the pins and the pen segments of the to-be-detected nixie tube; obtaining N short-circuit test pattern sets corresponding to the N pairs of adjacent pins according to the N pairs of adjacent pins and the correspondence; and finally obtaining the M target patterns from the N short-circuit test pattern sets.

[0091] In the possible implementation, the test platform can obtain the M target patterns from the N short-circuit test pattern sets according to a preset priority.

[0092] In the possible implementation, all short-circuit detection patterns in each short-circuit detection pattern set can detect whether the corresponding adjacent pins are short-circuited.

[0093] In a possible implementation, the test platform can count the frequency of each short-circuit test pattern in the N short-circuit test pattern sets; determine the short-circuit test pattern with the highest frequency in each short-circuit test pattern as the target pattern, and obtain the M target patterns.

[0094] In the possible implementation, the test platform can obtain the pin information of the to-be-detected nixie tube in the database or the storage, or the design drawing or pin diagram of the to-be-detected nixie tube containing the pin information; and obtain the N pairs of adjacent pins and the correspondence from the pin information.

[0095] In the possible implementation, the frequency of each short-circuit test pattern in the N short-circuit test pattern sets indicates the number of pairs of adjacent pins that can be detected by the short-circuit test pattern.

[0096] In the possible implementation, by determining the candidate pattern with the highest frequency in each candidate pattern set as the target pattern, short-circuit detection of the N pairs of adjacent pins can be completed with as few target patterns as possible, and the detection efficiency is improved.

[0097] It can be understood that the scheme for obtaining the target pattern in the possible implementation can also be applied to the scenario of obtaining the target pattern from the short-circuit detection pattern set after the open circuit fault occurs.

[0098] In a possible implementation, the target pattern is a pattern displayed by the to-be-tested digital tube when the to-be-tested digital tube is in normal operation.

[0099] It can be understood that the pattern displayed by the to-be-tested digital tube when the to-be-tested digital tube is in normal operation is generally recognizable and has a specific meaning, for example, the numbers 0 to 9, the English letters A, B, C, D, E, and F displayed by an 8-shaped digital tube, and the English letters A to Z displayed by a rice-shaped digital tube.

[0100] By limiting the target pattern to the pattern displayed by the to-be-tested digital tube when the to-be-tested digital tube is in normal operation, on the one hand, the amount of calculation of the test platform for determining the target pattern can be reduced, and on the other hand, the test platform is facilitated to identify, and the accuracy and efficiency of the identification algorithm are improved.

[0101] 202. Determine whether the to-be-tested digital tube can display the M target patterns.

[0102] After the M target patterns are acquired, the test platform can determine whether the to-be-tested digital tube has a short-circuit fault by detecting whether the to-be-tested digital tube can display the M target patterns.

[0103] In a possible implementation, the test platform can control the to-be-tested digital tube to display the M target patterns in sequence, control the image acquisition device to acquire a second detection image of the to-be-tested digital tube when the to-be-tested digital tube displays the M target patterns, identify M second verification patterns displayed by the to-be-tested digital tube in the second detection image and corresponding to the M target patterns, determine that the to-be-tested digital tube can display the M target patterns if the M second verification patterns and the corresponding target patterns are all the same, and determine that the to-be-tested digital tube cannot display the M target patterns if one or more of the verification patterns and the corresponding target patterns are different.

[0104] Specifically, the test platform can limit the target pattern to a pattern displayed by the to-be-tested digital tube when the to-be-tested digital tube is in normal operation, identify a second verification pattern in the second detection image by using an optical character recognition (OCR) technology, to obtain a corresponding verification string, and finally compare the verification string and a string of the corresponding target pattern to determine whether the second verification pattern and the corresponding target pattern are the same.

[0105] In a possible implementation, after it is determined that the to-be-tested digital tube cannot display a certain target pattern, the test platform can compare the corresponding second verification pattern and the target pattern to determine a short-circuit pen segment between the second verification pattern and the target pattern, and determine a pair of adjacent pins of a short circuit according to the short-circuit pen segment.

[0106] In this embodiment of the application, by comparing the second detection pattern with the corresponding target pattern, it can be determined whether the digital tube to be detected has a short circuit; and when a short circuit occurs, the adjacent pins of the short circuit can be further determined, so as to accurately detect the cause of the short circuit fault.

[0107] After completing the open-circuit and short-circuit fault detection of the digital tube under test, the test platform can further detect whether the diodes in the digital tube under test are damaged.

[0108] In one possible implementation, the testing platform can compare the first verification image with a preset standard image to determine whether the difference between the brightness of the illuminated segment of the digital tube to be tested in the first verification image and the brightness of the corresponding segment in the standard image is greater than a preset threshold; if so, the illuminated segment is determined to be damaged; if not, the illuminated segment is determined to be undamaged.

[0109] The standard image is the image of a fault-free digital tube displaying a circuit breaker detection pattern.

[0110] In this embodiment of the application, by using a short-circuit detection image that can detect whether the most adjacent pin pairs are short-circuited as the target image, and detecting whether the digital tube can display the above M target patterns, the efficiency of short-circuit detection of the digital tube can be greatly improved.

[0111] Please see Figure 3 , Figure 3 This is a pin diagram and segment diagram for a three-digit LED display. (Example:) Figure 3 As shown, this three-digit LED display is a common-anode 8-shaped seven-segment display. Each digit consists of seven segments, named A, B, C, D, E, F, and G. In this three-digit LED display, each digit uses its own common pins DIG1, ​​DIG2, and DIG3 as digit selection lines. The same segments in this three-digit LED display share one pin as the segment selection line, specifically: segment A corresponds to pin 9, segment B corresponds to pin 7, segment C corresponds to pin 6, segment D corresponds to pin 3, segment E corresponds to pin 2, segment F corresponds to pin 5, and segment G corresponds to pin 1.

[0112] It is understandable that, except for the empty pin 4, the pins corresponding to the adjacent numbers are the adjacent pins.

[0113] Specifically, the test platform can control the bit selection line corresponding to a certain segment to be connected to a high level, and the corresponding segment selection line (segment pin) to be grounded, so as to light up that segment.

[0114] by Figure 3 The three-digit LED display shown is the LED display to be tested. The LED display testing method provided in this application will be described in further detail below. Please refer to [link to relevant documentation]. Figure 4 , Figure 4This is a flowchart illustrating another digital tube testing method provided in an embodiment of this application. The method is applied to the test platform in the aforementioned digital tube testing device and includes steps 401 to 405.

[0115] 401. Perform an open circuit test on the digital tube to be tested.

[0116] Among them, such as Figure 5 As shown, the open circuit detection pattern corresponding to the digital tube to be tested in this embodiment is "888".

[0117] Step 401 in this embodiment is the same as described above. Figure 2 The technical means used in step 201 of the illustrated embodiment to detect whether the digital tube under test can display the open circuit detection pattern is similar, and will not be described in detail here.

[0118] 402. Obtain the target pattern.

[0119] The testing platform can obtain the pin information as described above by receiving input from staff or by retrieving the design diagram or pin diagram of the digital tube under test from the database. Figure 3 The relevant instructions include pin information and the correspondence between pins and segments.

[0120] Specifically, the test platform can obtain a total of 9 pairs of adjacent pins: 1-2, 2-3, 3-5, 5-6, 6-7, 7-8, 8-9, 9-10, and 10-11.

[0121] Then, the test platform can obtain a set of 9 short-circuit detection patterns based on the segments corresponding to each pair of adjacent pins. It can be understood that the test platform can obtain short-circuit detection patterns from the patterns displayed when a fault-free digital tube under test is working, namely the numbers 0, 1, ... 8, 9 and the English letters A, b, C, d, E, F.

[0122] For example, adjacent pins 1-2 correspond to segments E and G. The test platform can obtain short-circuit detection patterns corresponding to one segment emitting light and the other extinguishing light: 0, 3, 4, 5, 9 and C.

[0123] The table below summarizes the nine short-circuit detection patterns corresponding to the nine pairs of adjacent pins:

[0124]

[0125]

[0126] Please refer to Figures 6 to 8 , Figures 6 to 8is a schematic view corresponding to short-circuit detection patterns "d--", "-F-", and "--3". In combination with the above table, the short-circuit detection pattern "d--" can detect whether the adjacent pin pairs "3-5", "5-6", "7-8", and "10-11" of the digital tube to be detected in the embodiment are short-circuited; the short-circuit detection pattern "-F-" can detect whether the adjacent pin pairs "2-3", "3-5", "5-6", "8-9", and "10-11" of the digital tube to be detected in the embodiment are short-circuited; and the short-circuit detection pattern "--3" can detect whether the adjacent pin pairs "1-2", "2-3", "3-5", "5-6", and "9-10" of the digital tube to be detected in the embodiment are short-circuited.

[0127] In the above table, the test platform can calculate the frequency of each short-circuit detection pattern in the set of all short-circuit detection patterns, and then determine the short-circuit detection pattern with the highest frequency in each set of short-circuit detection patterns as the corresponding target pattern. As shown in the above table, the pattern with 3 appearing in the first position has the highest frequency, that is, the pattern "3--" can detect the largest number of adjacent pins at the same time, and therefore the test platform can determine the pattern "3--" as the target pattern for the 8 adjacent pins.

[0128] Further, it can be seen that the number of target patterns determined by the test platform is 2, that is, 2 target patterns are used to detect the short-circuit of the digital tube to be detected, and it can be determined whether the digital tube to be detected has a short-circuit fault, thereby greatly improving the detection efficiency.

[0129] It can be understood that "-" in the above pattern means empty, that is, the pen segment of the digital tube at this position does not emit light.

[0130] It can be understood that when the detection result in step 401 shows that the digital tube to be detected does not have an open-circuit fault, the test platform can execute step 402 to obtain the target pattern according to the above description.

[0131] When the detection result in step 401 shows that the light-emitting diode or pin of the digital tube to be detected has an open-circuit fault, the test platform can first select a digital tube with the largest number of light-emitting pen segments as a target digital tube; then filter the short-circuit detection patterns that can be displayed by the target digital tube and are not affected by the open-circuit fault according to the pen segments that can be controlled by the target digital tube to emit light or extinguish light; and finally determine the target pattern from the set of filtered short-circuit detection patterns.

[0132] 403, performing short-circuit detection on the digital tube to be detected.

[0133] 404, performing damage detection on the digital tube to be detected.

[0134] It can be understood that Figure 9 , Figure 9The pattern displayed when all the segments of the to-be-detected nixie tube in the embodiment do not emit light. In a possible implementation, the pattern with all the segments not emitting light can be used as a pause detection pattern, which is displayed to inform the test platform to control the image acquisition device to stop acquiring images after the test platform completes detection of one to-be-detected nixie tube or completes detection of one type of nixie tube.

[0135] Specifically, when the test platform identifies the pause detection pattern from the image returned by the image acquisition device, the test platform controls the image acquisition device to enter a standby or shutdown mode and remains in the standby or shutdown mode for a preset time length.

[0136] By setting the pause detection pattern, the test personnel can more flexibly perform automatic image acquisition when replacing the to-be-detected single board, replacing the nixie tube, or performing short-term maintenance on the test platform and other devices, thereby saving resources.

[0137] Steps 403 to 404 in the embodiment are similar to the technical means described in step 202 in the foregoing Figure 2 embodiment, and details are described in the corresponding description, which is not described here again.

[0138] 405. Output the detection report.

[0139] After the test platform completes the detection of the to-be-detected nixie tube in the three aspects, the test platform can output a detection report according to the three detection results, so that the test personnel can quickly understand the fault condition of the to-be-detected nixie tube.

[0140] In the embodiment, the nixie tube is detected for open circuit fault, short circuit fault, and light emitting diode damage, thereby achieving comprehensive quality detection.

[0141] Please refer to Figure 10 , Figure 10 A structural block diagram of a test platform 1000 provided in the embodiment is shown in FIG. 1. The test platform 1000 includes:

[0142] An acquisition unit 1001 is configured to acquire M target patterns, the target pattern being a short circuit detection pattern used to determine whether adjacent pins of a to-be-detected nixie tube are short-circuited, each pair of the adjacent pins corresponding to one target pattern; when the short circuit detection pattern is displayed, a first segment of the to-be-detected nixie tube emits light and a second segment of the to-be-detected nixie tube is extinguished, the bit selection line corresponding to the first segment and the bit selection line corresponding to the second segment are both connected to a power supply, the segment selection line corresponding to the first segment is a first pin, the segment selection line corresponding to the second segment is a second pin, the first pin and the second pin are any one pair of the N pairs of adjacent pins of the to-be-detected nixie tube, and M is less than or equal to N.

[0143] A detection unit 1002 is configured to detect whether the to-be-detected nixie tube can display the M target patterns.

[0144] In a possible implementation, the acquisition unit 1001 is further configured to acquire a correspondence between the pins of the to-be-detected nixie tube and the segments; the testing platform further includes a determination unit 1003 configured to determine, according to the N pairs of adjacent pins and the correspondence, N sets of short-circuit detection patterns, each set of short-circuit detection patterns being capable of detecting whether the corresponding adjacent pins are short-circuited, and each pair of adjacent pins corresponding to one set of short-circuit detection patterns; and the acquisition unit 1001 is specifically configured to acquire the M target patterns from the N sets of short-circuit detection patterns.

[0145] In a possible implementation, the acquisition unit 1001 is specifically configured to: acquire a frequency at which each short-circuit detection pattern appears in the N sets of short-circuit detection patterns; and determine, as the target pattern, the short-circuit detection pattern with the highest frequency in each set of short-circuit detection patterns, to obtain the M target patterns.

[0146] In a possible implementation, the detection unit 1002 is further configured to: detect whether the to-be-detected nixie tube can display an open-circuit detection pattern, the open-circuit detection pattern being a pattern formed by all the segments of the to-be-detected nixie tube emitting light; and if the to-be-detected nixie tube can display the open-circuit detection pattern, trigger the acquisition unit 1001 to perform the step of acquiring the M target patterns.

[0147] In a possible implementation, the determination unit 1003 is further configured to: if the to-be-detected nixie tube cannot display the open-circuit detection pattern, determine the emitting segments of the to-be-detected nixie tube when displaying the open-circuit detection pattern; and the acquisition unit 1001 is specifically configured to: acquire the M target patterns from the short-circuit detection patterns that can be displayed by the emitting segments.

[0148] In a possible implementation, the determination unit 1003 is further configured to: if the to-be-detected nixie tube cannot display the open-circuit detection pattern, determine, as a target nixie tube, a nixie tube with the largest number of emitting segments when displaying the open-circuit detection pattern; and the acquisition unit 1001 is specifically configured to: acquire the M target patterns from the short-circuit detection patterns that can be displayed by the emitting segments of the target nixie tube when displaying the open-circuit detection pattern; and the detection unit 1003 is specifically configured to: detect whether the target nixie tube can display the M target patterns.

[0149] In a possible implementation, the target pattern is a pattern displayed by the to-be-detected nixie tube when the to-be-detected nixie tube is working without faults.

[0150] In a possible implementation, the acquisition unit 1001 is further configured to acquire a first detection image of the to-be-detected nixie tube when the nixie tube displays the open-circuit detection pattern; and the determination unit 1003 is further configured to compare the first detection image with a preset standard image, determine whether a difference between a luminance of a light-emitting pen segment of the to-be-detected nixie tube in the first detection image and a luminance of a corresponding pen segment in the standard image is greater than a preset threshold, the standard image being an image of the to-be-detected nixie tube displaying the open-circuit detection pattern without failure; if yes, it is determined that the light-emitting pen segment is damaged; and if no, it is determined that the light-emitting pen segment is not damaged.

[0151] The test platform 1000 provided by the embodiments of the present application can be understood with reference to the corresponding content in the foregoing method embodiments of the nixie tube detection method, which will not be repeated here.

[0152] As shown in Figure 11 , Figure 11 a possible logical structure diagram of the computing device 1100 provided by the embodiments of the present application. The computing device 1100 includes a processor 1101 and a memory 1102; the memory 1102 stores instruction operations or codes; the processor 1101 is configured to communicate with the memory 1102 and execute the instruction operations or codes in the memory 1102 to perform the nixie tube test method described in the foregoing Figure 2 or Figure 4 part of the embodiments.

[0153] The processor 1101 and the memory 1102 are connected to each other through a bus.

[0154] In another embodiment of the present application, a computer readable storage medium is also provided, and the computer readable storage medium includes instructions, when the instructions run on a computer, the computer executes the nixie tube test method described in the foregoing Figure 2 or Figure 4 part of the embodiments.

[0155] Those skilled in the art can realize that the units and algorithm steps of the examples described in combination with the embodiments disclosed herein can be realized by electronic hardware or a combination of computer software and electronic hardware. Whether the functions are realized in hardware or software mode depends on the specific application and design constraints of the technical solution. The skilled person can use different methods to realize the described functions for each specific application, but such implementation should not be considered beyond the scope of the embodiments of the present application.

[0156] Those skilled in the art can clearly understand that, for the convenience and brevity of the description, the specific working processes of the above-described system, device and unit can refer to the corresponding processes in the foregoing method embodiments, which will not be repeated here.

[0157] In several embodiments provided by the embodiments of the present application, it should be understood that the disclosed system, device and method can be implemented by other manners. For example, the device embodiments described above are merely illustrative, for example, the division of the units is merely a logical function division, and actual implementation can have another division manner, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the units or components shown or discussed can be indirect coupling or communication connection through some interfaces, devices or units, and can be electrical, mechanical or other forms.

[0158] The units described as separate components can or can not be physically separated, and the components shown as units can or can not be physical units, that is, they can be located in one place, or can be distributed on a plurality of network units. Part or all of the units can be selected according to actual needs to achieve the purpose of the embodiments of the present application.

[0159] In addition, each functional unit in each embodiment of the embodiments of the present application can be integrated in one processing unit, or each unit can be physically present separately, or two or more units can be integrated in one unit.

[0160] If the functions are realized in the form of software function units and sold or used as independent products, they can be stored in a computer readable storage medium. Based on this understanding, the technical solutions of the embodiments of the present application essentially or the parts that make contributions to the prior art or parts of the technical solutions can be embodied in the form of software product. The computer software product is stored in a storage medium, and includes a plurality of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the method described in the embodiments of the present application. The foregoing storage medium includes: a U disk, a mobile hard disk, a read-only memory (Read-Only Memory, ROM), a random access memory (Random Access Memory, RAM), a magnetic disk or an optical disk, and various program code storage media.

Claims

1. A method of detecting a nixie tube, characterized by, The method is applied to a test platform, and the method comprises the following steps: Obtaining the correspondence between the pins of a to-be-tested nixie tube and the pen segments; According to the N pairs of adjacent pins of the to-be-tested nixie tube and the correspondence, determining N sets of short-circuit detection patterns, each short-circuit detection pattern in each set of short-circuit detection patterns being capable of detecting whether the corresponding adjacent pins are short-circuited, each pair of adjacent pins corresponding to one set of short-circuit detection patterns, and each short-circuit detection pattern comprising a plurality of light-emitting pen segments; Obtaining the frequency of each short-circuit detection pattern in the N sets of short-circuit detection patterns, the short-circuit detection pattern with the highest frequency being capable of simultaneously detecting the most adjacent pins; Determining the short-circuit detection pattern with the highest frequency in each set of short-circuit detection patterns as a target pattern, thereby obtaining M target patterns; The target pattern is the short-circuit detection pattern used to determine whether the adjacent pins of the to-be-tested nixie tube are short-circuited, and each pair of adjacent pins corresponds to one target pattern; when the short-circuit detection pattern is displayed, a first pen segment of the to-be-tested nixie tube emits light and a second pen segment is extinguished, the bit selection line corresponding to the first pen segment and the bit selection line corresponding to the second pen segment are both connected to a power supply, the segment selection line corresponding to the first pen segment is a first pin, the segment selection line corresponding to the second pen segment is a second pin, the first pin and the second pin are any one pair of the N pairs of adjacent pins of the to-be-tested nixie tube, and M is less than or equal to N; Detecting whether the to-be-tested nixie tube can display the M target patterns.

2. The method of claim 1, wherein, Before the step of obtaining the M target patterns, the method further comprises the following steps: Detecting whether the to-be-tested nixie tube can display an open-circuit detection pattern, the open-circuit detection pattern being a pattern formed by all the pen segments of the to-be-tested nixie tube emitting light; If the to-be-tested nixie tube can display the open-circuit detection pattern, triggering the step of obtaining the M target patterns.

3. The method of claim 2, wherein, After the step of detecting whether the to-be-tested nixie tube can display the open-circuit detection pattern, the method further comprises the following steps: If the to-be-tested nixie tube cannot display the open-circuit detection pattern, determining the light-emitting pen segment of the to-be-tested nixie tube when the open-circuit detection pattern is displayed; The step of obtaining the M target patterns comprises the following step: From the short-circuit detection patterns that can be displayed by the light-emitting pen segment, obtaining the M target patterns.

4. The method of claim 2, wherein, After the step of detecting whether the to-be-tested nixie tube can display the open-circuit detection pattern, the method further comprises the following steps: If the to-be-tested nixie tube cannot display the open-circuit detection pattern, determining a target bit nixie tube with the largest number of light-emitting pen segments when the open-circuit detection pattern is displayed by the to-be-tested nixie tube as the target bit nixie tube; The step of obtaining the M target patterns comprises the following step: From the short-circuit detection patterns that can be displayed by the light-emitting pen segment of the target bit nixie tube when the open-circuit detection pattern is displayed, obtaining the M target patterns; The step of detecting whether the to-be-tested nixie tube can display the M target patterns comprises the following step: Detecting whether the target bit nixie tube can display the M target patterns.

5. The method according to any one of claims 2 to 4, characterized in that, The target pattern is a pattern displayed by the to-be-tested nixie tube when the to-be-tested nixie tube is working without faults.

6. The method of claim 5, wherein, After the detecting whether the to-be-detected nixie tube can display the M target patterns, the method further comprises: acquiring a first detection image of the to-be-detected nixie tube when displaying the open-circuit detection pattern; comparing the first detection image with a preset standard image to determine whether a difference between a luminance of a light-emitting pen segment of the to-be-detected nixie tube in the first detection image and a luminance of a corresponding pen segment in the standard image is greater than a preset threshold, the standard image being an image of the to-be-detected nixie tube displaying the open-circuit detection pattern without failure; if yes, determining that the light-emitting pen segment is damaged; if no, determining that the light-emitting pen segment is not damaged.

7. A computer-readable storage medium, characterized in that, The computer readable storage medium comprises instructions which, when executed on a computer, cause the computer to perform the method of any one of claims 1 to 6.

8. A computing device, comprising: The computing device comprises a processor, a memory; The memory has stored therein instruction operations or codes; The processor is configured to communicate with the memory and execute the instruction operations or codes in the memory to perform the method of any one of claims 1 to 6.

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