Sample analysis system and method of controlling the same

Abstract

The application provides a sample analysis system and a control method thereof. The sample analysis system comprises a sample supply mechanism, a first sample analyzer and a second sample analyzer. The sample supply mechanism comprises a first determination channel and a second determination channel, a first loading area and a second loading area for placing sample racks, a first supply channel between the first loading area and the first determination channel, and a second supply channel between the second loading area and the second determination channel. The first supply channel and the second supply channel are connected to bidirectionally transfer the sample racks from the first loading area and the second loading area between the first sample analyzer and the second sample analyzer. First sample-in buffer areas and first sample-out buffer areas are arranged between the first supply channel and the first determination channel. Second sample-in buffer areas and second sample-out buffer areas are arranged between the second supply channel and the second determination channel.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of medical diagnostic equipment, and in particular to a sample analysis system and a control method thereof. BACKGROUND

[0002] In the prior art, blood cell online process scheduling is mainly divided into two categories:

[0003] One category is to allocate samples on sample racks, such as disclosed in the existing patent CN101960312B, the sample racks are transported back and forth between two analyzers, and the samples on the sample racks are sent to the analyzers according to the established rules to complete the detection. This kind of way has high detection efficiency and simple structure. For this kind of way, when the sample feeder fails and cannot be recovered, both analyzers will stop working.

[0004] The other category is to allocate sample racks, such as disclosed in the existing patent application CN110398603A, that is, different sample racks are allocated to corresponding analyzers as a whole. This kind of allocation method is flexible, one analyzer corresponds to one sample feeder, when one sample feeder fails and cannot be recovered, it does not affect the work of another analyzer.

[0005] In the patent CN110398603A, because there is a cross-machine re-inspection requirement that the samples that the first analyzer cannot complete detection need to be detected by the second analyzer, therefore, the technology disclosed in CN110398603A has the following problems:

[0006] Without affecting the sample rack scheduling detection efficiency, if a separate recovery platform is not added at the terminal of the transmission channel, the user can only load the sample racks in the first loading buffer area, and the first unloading buffer area and the second loading buffer area can only be used as buffer areas, and cannot complete cross-machine re-inspection, and cannot be used as the final recovery area or the initial loading area of the sample racks, which leads to the waste problem of the first unloading buffer area and the second loading buffer area, the number of sample racks that the user can load at one time is too small, and the user's workload is increased;

[0007] If a separate recovery platform is added at the terminal of the transmission channel, the floor space of the blood cell online equipment is increased;

[0008] If the first unloading buffer area and the second loading buffer area can also serve as the last recovery area or the initial loading area of the sample rack without adding a separate recovery platform at the terminal of the transmission channel, a fast connection channel is added between the first feeding channel and the second feeding channel, the fast connection channel cannot buffer without a sample rack, and the sample rack detected by the first analyzer needs to be detected on the second analyzer, so that the sample on the sample rack on the second feeding channel can be sent from the first feeding channel to the second feeding channel after the sample on the sample rack on the second feeding channel is completely detected, at this time, the first analyzer is in an idle state for detection, and it is not conducive to improving the detection efficiency. SUMMARY

[0009] In order to solve the above technical problems, the present application provides a sample analysis system, which makes the scheduling of samples more flexible, improves the detection efficiency, saves and fully utilizes the floor area, reduces the loading or / and unloading times of the sample rack of the user, saves the time and physical strength of the user, and improves the user experience.

[0010] The first aspect of the present application provides a sample analysis system, which comprises a sample supply mechanism, at least a first sample analyzer and a second sample analyzer, wherein the sample supply mechanism comprises,

[0011] a first determination channel corresponding to the first sample analyzer and a second determination channel corresponding to the second sample analyzer;

[0012] a first loading area and a second loading area for placing sample racks; a first feeding channel located between the first loading area and the first determination channel, and a second feeding channel located between the second loading area and the second determination channel, and the first feeding channel and the second feeding channel are connected to transmit the sample racks from the first loading area and the second loading area between the first sample analyzer and the second sample analyzer; wherein a first sample feeding buffer area and a first sample discharging buffer area are respectively arranged between the first feeding channel and the first determination channel, the first sample feeding buffer area is used to buffer the sample racks to be fed to the first determination channel from the first feeding channel, and the first sample discharging buffer area is used to buffer the sample racks discharged from the first determination channel;

[0013] a second sample feeding buffer area and a second sample discharging buffer area are arranged between the second feeding channel and the second determination channel, the second sample discharging buffer area is used to buffer the sample racks to be fed to the second determination channel from the second feeding channel, and the second sample discharging buffer area is used to buffer the sample racks discharged from the second determination channel.

[0014] In one embodiment, the first sample loading buffer area and the second sample loading buffer area can buffer 1-3 sample racks at most.

[0015] In one embodiment, the first sample unloading buffer area and the second sample unloading buffer area can buffer 1-3 sample racks at most.

[0016] In one embodiment, the sample supply mechanism further comprises a first recovery area and a second recovery area, the first recovery area is located on the same side of the first loading area as the first supply channel, and is used for recovering sample racks from the first sample unloading buffer area and / or the second sample unloading buffer area; the second recovery area is located on the same side of the second loading area as the second supply channel, and is used for recovering sample racks from the second sample unloading buffer area and / or the first sample unloading buffer area.

[0017] In one embodiment, a code scanning component is arranged on each of the first assay channel and the second assay channel, and the code scanning component is used for scanning information of the sample rack and the sample tube to determine the destination of the sample rack to be tested and the test item.

[0018] In one embodiment, the sample supply mechanism further comprises a first emergency sample loading area and / or a second emergency sample loading area for storing emergency samples, wherein the first emergency sample loading area is located between the first sample loading buffer area and the first sample unloading buffer area, and corresponds to the first assay channel; and the second emergency sample loading area is located between the second sample loading buffer area and the second sample unloading buffer area, and corresponds to the second assay channel.

[0019] In one embodiment, the first loading area or the second loading area is an emergency sample loading area.

[0020] In one embodiment, the first sample analyzer and the second sample analyzer are the same type, and are configured with the same or different sample analyzers; or,

[0021] The first sample analyzer and the second sample analyzer are different types of sample analyzers.

[0022] In one embodiment, the first sample analyzer and the second sample analyzer are the same type, and are configured with the same or different full-automatic blood cell analyzers; or,

[0023] The first sample analyzer is a full-automatic blood cell analyzer, and the second sample analyzer is a push-piece dyeing machine or a specific protein analyzer.

[0024] In one embodiment, the sample analysis system further comprises a third sample analyzer, and the sample supply mechanism further comprises;

[0025] The third assay channel corresponds to the third sample analyzer.

[0026] a third loading area for placing sample carriers;

[0027] The third supply channel is connected with the second supply channel, and a third sample feeding buffer area and a third sample discharging buffer area are respectively arranged between the third supply channel and the third detection channel. The third sample feeding buffer area is used for buffering the sample carriers from the third supply channel to be supplied to the third detection channel, and the third sample discharging buffer area is used for buffering the sample carriers discharged from the third detection channel.

[0028] In an embodiment, the sample supply mechanism further comprises:

[0029] A third recovery area is arranged on the same side of the third supply channel as the third loading area and corresponds to the third sample discharging buffer area, and is used for recovering the sample carriers from the third sample discharging buffer area and / or the first sample discharging buffer area and / or the second sample discharging buffer area.

[0030] In an embodiment, the sample analysis system further comprises a sample scheduling mechanism, and the sample scheduling mechanism comprises:

[0031] A hook assembly is used to realize the one-way transportation of the sample carriers between the first loading area and the first supply channel, the first supply channel and the first sample feeding buffer area, the first sample feeding buffer area and the first detection channel, the first sample discharging buffer area and the first supply channel, and the first supply channel and the first recovery area, and the one-way transportation between the second loading area and the second supply channel, the second supply channel and the second sample feeding buffer area, the second sample feeding buffer area and the second detection channel, the second sample discharging buffer area and the second supply channel, and the second supply channel and the second recovery area.

[0032] A pull-back assembly is used to pull back the sample carriers not completely supplied on the first supply channel or the second supply channel or the third supply channel, and to realize the separation between the sample carriers on the first supply channel or the second supply channel.

[0033] A push assembly is used to push the sample carriers on the first detection channel / second detection channel to the first sample discharging buffer area / second sample discharging buffer area.

[0034] In an embodiment, the first sample analysis instrument and the second sample analysis instrument are of the same type, and the sample analysis instruments are configured to be the same or different. The third sample analysis instrument is a sample analysis instrument different from the first sample analysis instrument and the second sample analysis instrument in type.

[0035] In one embodiment, the first sample analyzer and the second sample analyzer are the same type of automatic blood cell analyzer, and the third sample analyzer is a slide dyeing machine or a specific protein analyzer.

[0036] The second aspect of the present application provides a control method of a sample analysis system, comprising:

[0037] The first sample analyzer corresponds to a first loading area where a sample rack is placed; the sample rack in the first loading area is transported to a first sample loading buffer area through a first feeding channel to wait for entering a first determination channel, the sample rack in the first sample loading buffer area is transported to the first determination channel and sampled and analyzed by the first sample analyzer, and is transported to a first sample output buffer area through the first determination channel;

[0038] The second sample analyzer corresponds to a second loading area where a sample rack is placed; the sample rack in the second loading area is transported to a second sample loading buffer area through a second feeding channel to wait for entering a second determination channel, the sample rack in the second sample loading buffer area is transported to the second determination channel and sampled and analyzed by the second sample analyzer, and is transported to a second sample output buffer area through the second determination channel;

[0039] The sample rack in the first loading area is also transported to the second sample loading buffer area through the first feeding channel and the second feeding channel, and waits to be transported to the second determination channel from the second sample loading buffer area;

[0040] The sample rack in the second loading area is also transported to the first sample loading buffer area through the second feeding channel and the first feeding channel, and waits to be transported to the first determination channel from the first sample loading buffer area.

[0041] In one embodiment, the control method of the sample analysis system further comprises: when it is detected that the second loading area and the second sample loading buffer area have no sample rack, the sample rack in the first loading area is transported to the second sample loading buffer area through the feeding channel to wait for entering the second determination channel, the sample rack in the first sample loading buffer area is transported to the first determination channel to be sampled and analyzed by the first sample analyzer, and the sample rack in the second sample loading buffer area is transported to the second determination channel to be sampled and analyzed by the second sample analyzer;

[0042] And / or when it is detected that the first loading area and the first sample loading buffer area have no sample rack, the sample rack in the second loading area is transported to the first sample loading buffer area through the feeding channel to wait for entering the first determination channel, the sample rack in the first sample loading buffer area is transported to the first determination channel to be sampled and analyzed by the first sample analyzer, and the sample rack in the second sample loading buffer area is transported to the second determination channel to be sampled and analyzed by the second sample analyzer.

[0043] In one embodiment, the sample racks to be recycled in the first sample out buffer area are transported to the first recycling area, and the sample racks to be recycled in the second sample out buffer area are transported to the second recycling area.

[0044] In one embodiment, when it is detected that the first recycling area is full, the sample racks to be recycled in the first sample out buffer area are transported to the second recycling area; and when it is detected that the second recycling area is full, the sample racks to be recycled in the second sample out buffer area are transported to the first recycling area.

[0045] In one embodiment, the third sample analyzer corresponds to a third loading area for placing sample racks; the sample racks in the third loading area are transported to a third sample in buffer area through a third feeding channel to wait for entering a third determination channel, the sample racks in the third sample in buffer area are transported to the third determination channel to be sampled and analyzed by the third sample analyzer, and are transported from the third determination channel to a third sample out buffer area.

[0046] In one embodiment, the first sample in buffer area and the second sample in buffer area can accommodate 1-3 sample racks at most respectively; and / or the first sample out buffer area and the second sample out buffer area can accommodate 1-3 sample racks at most respectively, and / or the third sample in buffer area and the third sample out buffer area can accommodate 1-3 sample racks at most respectively.

[0047] In one embodiment, the sample racks to be recycled in the third sample out buffer area are transported to a third recycling area.

[0048] In one embodiment, the control method further comprises that when it is detected that the first recycling area is full, the sample racks to be recycled in the first sample out buffer area are transported to the second recycling area or a third recycling area; and when it is detected that the second recycling area is full, the sample racks to be recycled in the second sample out buffer area are transported to the third recycling area.

[0049] In one embodiment, the control method further comprises that when the samples after being sampled and analyzed by the first sample analyzer need to be cross-machine detected, the sample racks to be cross-machine detected are transported from the first sample out buffer area to the second sample in buffer area through the first feeding channel, and the sample racks transported to the second sample in buffer area are pushed to the second determination channel by a sample scheduling mechanism to be detected by a second sample analyzer.

[0050] In one embodiment, the first sample analyzer is a low-configuration full-automatic blood cell analyzer, and the second sample analyzer is a high-configuration full-automatic blood cell analyzer, or the first sample analyzer is a full-automatic blood cell analyzer, and the second sample analyzer is a push-piece dyeing machine or a specific protein analyzer.

[0051] In an embodiment, the cross-machine detection comprises the following steps:

[0052] The cross-machine detection rule is triggered after the first sample analyzer completes the sampling analysis of the sample to be cross-machine detected;

[0053] The sample rack to be cross-machine detected is transported from the first determination channel to the first sample discharge buffer area, and it is determined whether the first supply channel and the second supply channel meet the transport condition; if yes, it is determined whether the second sample inlet buffer area corresponding to the second sample analyzer meets the transport condition; if no, the sample rack to be cross-machine detected waits in the first sample discharge buffer area until the occupation process of the first supply channel and the second supply channel is completed and the transport condition is met;

[0054] If the second sample inlet buffer area meets the transport condition, the sample rack to be cross-machine detected in the first sample discharge buffer area is transported to the second sample inlet buffer area through the first supply channel and the second supply channel; if the second sample inlet buffer area does not meet the transport condition, the sample rack to be cross-machine detected waits in the first sample discharge buffer area until the occupation process of the second sample inlet buffer area is completed and the second sample inlet buffer area meets the transport condition;

[0055] The sample rack to be rechecked transported to the second sample inlet buffer area is transported to the second determination channel for rechecking analysis by the second sample analyzer.

[0056] In an embodiment, the control method further comprises:

[0057] When the sample analyzed by the first sample analyzer / second sample analyzer needs to be cross-machine detected, the sample rack to be cross-machine detected is transported from the first sample discharge buffer area / second sample discharge buffer area to the third sample inlet buffer area through the first supply channel / second supply channel, and the sample rack to be cross-machine detected transported to the third sample inlet buffer area is transported to the third determination channel through the sample scheduling mechanism for detection by the third sample analyzer.

[0058] The first sample analyzer / second sample analyzer is a fully automatic blood cell analyzer, and the third sample analyzer is a push-piece dyeing machine or a specific protein analyzer.

[0059] In an embodiment, the cross-machine detection comprises the following steps:

[0060] The cross-machine detection rule is triggered after the first sample analyzer / second sample analyzer completes the sampling analysis of the sample to be cross-machine detected;

[0061] The cross-machine detection sample rack is transported to the first sample-out buffer area / second sample-out buffer area, and it is determined whether the first supply channel / second supply channel and the third supply channel meet the transportation condition. If yes, it is determined whether the third sample-in buffer area corresponding to the third sample analyzer meets the transportation condition. If no, the cross-machine detection sample rack waits in the first sample-out buffer area / second sample-out buffer area until the occupation process of the first supply channel / second supply channel and the third supply channel is completed and the transportation condition is met.

[0062] If the third sample-in buffer area meets the transportation condition, the cross-machine detection sample rack in the first sample-out buffer area / second sample-out buffer area is transported to the third sample-in buffer area through the first supply channel / second supply channel and the third supply channel. If the third sample-in buffer area does not meet the transportation condition, the cross-machine detection sample rack waits in the first sample-out buffer area / second sample-out buffer area until the occupation process of the third sample-in buffer area is completed and the transportation condition is met.

[0063] The cross-machine detection sample rack transported to the third sample-in buffer area is transported to the third determination channel for reanalysis by the third sample analyzer.

[0064] In one embodiment, when the sample after sampling analysis needs to be reanalyzed locally, the following steps are included:

[0065] When the first sample analyzer / second sample analyzer detects and analyzes the nth sample, it is determined whether the first to (n-1)th samples that have been completed exist local reanalysis samples, and the sample analysis of the nth sample is completed. If there are local reanalysis samples, the sample rack is returned to the reanalysis rack position, and after the reanalysis of the sample detection in the reanalysis position is completed, the sample analysis is continued. If there are no local reanalysis samples, the sample analysis is continued until all sample analysis is completed.

[0066] It is determined whether the nth to last sample exists a local reanalysis sample. If there are local reanalysis samples, the sample rack is returned to the reanalysis rack position, and after the reanalysis of the sample detection in the reanalysis position is completed, the sample rack is transported to the corresponding first sample-out buffer area / second sample-out buffer area. If there are no local reanalysis samples, the sample rack is directly transported to the corresponding first sample-out buffer area / second sample-out buffer area.

[0067] In one embodiment, the first determination channel / second determination channel can accommodate two sample racks respectively. After the first n sample tubes of the sample rack complete detection and it is determined that there is no local reanalysis, the next sample rack to be detected is sent to the first determination channel / second determination channel from the first sample-in buffer area / second sample-in buffer area.

[0068] In one embodiment, the control method of the sample analysis system further includes:

[0069] The first loading area and / or the second loading area is arranged with a related machine sample rack;

[0070] The machine sample rack of the first loading area and / or the second loading area is transported to the first determination channel / second determination channel;

[0071] The machine sample rack and the sample tube arranged on the machine sample rack are scanned to determine shutdown information, and it is judged whether the shutdown information is compliant;

[0072] If the shutdown information is compliant and the shutdown information matches the current first sample analyzer / second sample analyzer, a shutdown process is performed;

[0073] If the shutdown information is compliant but the shutdown information does not match the current first sample analyzer / second sample analyzer, the machine sample rack is transported to the sample analyzer matched therewith, and a shutdown process is performed, and the sample rack of the first loading area and / or the second loading area is no longer allocated to the first sample loading buffer area / second sample loading buffer area corresponding to the first sample analyzer / second sample analyzer on which the shutdown process has been performed;

[0074] If the shutdown information is not compliant, the machine sample rack is directly transported to the corresponding first recycling area / second recycling area.

[0075] Compared with the prior art, the sample analysis system of the present application increases the buffer area (sample loading buffer area and sample unloading buffer area) between the determination channel and the supply channel, the sample loading buffer area and the sample unloading buffer area can be used to buffer 1-3 sample racks respectively, the loading area and the recycling area are located on the side of the supply channel away from the buffer area, the scanning of the sample rack or the sample is completed on the determination channel, which greatly gives the flexibility of scheduling. The control method of the sample analysis system of the present application has multiple sample rack allocation modes according to different needs, reduces the number of times of loading or / and unloading sample racks of the user, is more flexible in scheduling, has higher detection efficiency, saves time and physical strength of the user, and improves user experience.

[0076] The above technical features can be combined in various technically feasible ways to produce new embodiments, as long as the purpose of the present application can be achieved. BRIEF DESCRIPTION OF DRAWINGS

[0077] In the following, the present application will be described in more detail on the basis of non-limiting examples and with reference to the accompanying drawings. In which:

[0078] Figure 1 shows a structural schematic diagram of an embodiment of the sample analysis system according to the present application with two sample analyzers;

[0079] Figure 2 shows a structural schematic diagram of an embodiment of the sample analysis system according to the present application with three sample analyzers;

[0080] Figures 3-5 A schematic diagram showing the distribution mode of the sample analysis system control method according to the present application is shown;

[0081] Figure 6 A schematic diagram showing the cross-machine review flowchart of the sample system control method according to the present application is shown;

[0082] Figure 7 A schematic diagram showing the local review flowchart of the sample system control method according to the present application is shown;

[0083] Figure 8 A schematic diagram showing the sample rack flow direction of two sample analyzers of an embodiment of the present application is shown (where 2+0 indicates that the first sample analyzer and the second sample analyzer are of the same type);

[0084] Figure 9 A schematic diagram showing the sample rack flow direction of three sample analyzers of an embodiment of the present application is shown (2+1 indicates that the first sample analyzer and the second sample analyzer are of the same type, and the third sample analyzer is of a different type).

[0085] Figure 10 A schematic diagram showing the shutdown flowchart of the sample system control method according to the present application is shown;

[0086] Figure 11 A schematic diagram showing the processing mode of different relationship scanning code information is shown;

[0087] Figure 12 A schematic diagram showing the structure of the sample analysis system according to the present application is shown.

[0088] In the drawings, the same components are denoted by the same reference numerals. The drawings are not drawn to scale.

[0089] In the drawings, the following reference numerals are used:

[0090] 1. First Sample Analyzer; 11. Low-Configuration Fully Automated Hematology Analyzer; 12. First Loading Area; 13. First Supply Channel; 131. First Sample Injection Dispensing Position; 132. First Sample Outjection Dispensing Position; 14. First Sample Injection Buffer Area; 15. First Measurement Channel; 16. First Sample Outjection Buffer Area; 17. First Recovery Area; 18. First Emergency Sample Injection Area; 2. Second Sample Analyzer; 21. High-Configuration Fully Automated Hematology Analyzer; 22. Second Loading Area; 23. Second Supply Channel; 231. Second Sample Injection Dispensing Position; 232. Second Sample Outjection Dispensing Position; 24. Second Sample Injection Buffer Area 25. Storage area; 26. Second measurement channel; 27. Second sample output buffer area; 28. Second recovery area; 3. Third sample injection area; 31. Slide staining machine or specific protein analyzer; 32. Third loading area; 33. Third supply channel; 331. Third sample injection distribution position; 332. Third sample output distribution position; 34. Third sample injection buffer area; 35. Third measurement channel; 36. Third sample output buffer area; 37. Third recovery area; 38. Third emergency sample injection area; 4. Barcode scanning component; 51. Hook component; 52. Pull-back component; 53. Push component. Detailed Implementation

[0091] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that, as long as there is no conflict, the various embodiments and features in each embodiment of the present invention can be combined with each other, and the resulting technical solutions are all within the protection scope of the present invention.

[0092] For any parts not mentioned in this invention, existing technologies can be used or referenced.

[0093] Example 1

[0094] like Figure 1 As shown, a first aspect of the present invention provides a sample analysis system, the sample analysis system comprising a sample supply mechanism, at least a first sample analyzer 1 and a second sample analyzer 2, wherein the sample supply mechanism comprises:

[0095] The first measurement channel 15 and the second measurement channel 25 correspond to the first sample analyzer 1 and the second measurement channel 25 correspond to the second sample analyzer 2.

[0096] The first loading area 12 and the second loading area 22 are used to place sample holders.

[0097] The first supply channel 13 is located between the first loading area 12 and the first sample analyzer 1, the second supply channel 23 is located between the second loading area 22 and the second sample analyzer 2, and the first supply channel 13 and the second supply channel 23 are connected to each other for bidirectional transmission of the sample racks from the first loading area 12 and the second loading area 22 between the first sample analyzer 1 and the second sample analyzer 2;

[0098] The first supply channel 13 and the first determination channel 15 are respectively provided with a first sample feeding buffer area 14 and a first sample output buffer area 16, the first sample feeding buffer area 14 is used for buffering the sample rack from the first supply channel 13 to be supplied to the first determination channel 15, and the first sample output buffer area 16 is used for buffering the sample rack transported out of the first determination channel 15;

[0099] The second supply channel 23 and the second determination channel 25 are provided with a second sample feeding buffer area 24 and a second sample output buffer area 26, the second sample output buffer area 26 is used for buffering the sample rack from the second supply channel 23 to be supplied to the second determination channel 25, and the second sample output buffer area 26 is used for buffering the sample rack transported out of the second determination channel 25.

[0100] In a preferred embodiment, the first determination channel 15 and the second determination channel 25 are respectively provided with a code scanning assembly 4, which is used for scanning the information of the sample rack and the sample tube to determine the destination of the sample rack to be tested and the test item to be detected.

[0101] Generally, the sample rack is loaded through the supply channel and the sample feeding buffer area before reaching the determination channel, the whole transportation path is relatively long, and the supply channel occupies a high probability (and the sample rack needs to meet that there is no test sample rack on the determination channel or the two-dimensional code of the sample rack on the determination channel is scanned and completed, and the analyzer is in a normal working state when the sample rack is loaded). Therefore, when the determination channel needs to detect the sample rack, if the sample rack is transported from the loading area at this time, the whole waiting process is relatively long, which is not conducive to the continuity of detection. The sample analysis system of the present application increases the sample feeding buffer area and the sample output buffer area between the determination channel and the supply channel, which ensures that there is one or more sample racks in the sample feeding buffer area (considering the space problem in the depth direction in front of and behind the instrument, the sample feeding buffer area can accommodate at most 3 sample racks, and preferably 1 sample rack), that is, when there is no sample rack or the sample rack buffer amount is insufficient in the sample feeding buffer area, the sample rack in the loading area will be sent to the sample feeding buffer area for buffering, which improves the continuity of detection.

[0102] As Figure 1 and Figure 2As shown, the first supply channel 13 and the second supply channel 23 are connected for bidirectional transmission of the sample racks from the first loading area 12 and the second loading area 22 between the first sample analyzer 1 and the second sample analyzer 2.

[0103] When the first sample analyzer 1 and the second sample analyzer 2 are analyzers of the same type but different configurations, such as both being automatic blood cell analyzers, usually the right-hand side is a low-end configuration (i.e. the first sample analyzer 1 in the figure) and the left-hand side is a high-end configuration (i.e. the second sample analyzer 2). The first supply channel 13 is used to transport the sample racks that have been analyzed by the first sample analyzer 1 and buffered in the first sample discharge buffer area 16 to the second supply channel 23 and then to the second sample loading buffer area 24, and the sample racks in the second sample loading buffer area 24 are transported to the second determination channel 25 for detection and analysis by the second sample analyzer 2.

[0104] When the first sample analyzer 1 and the second sample analyzer 2 are analyzers of different types, such as the first sample analyzer 1 being an automatic blood cell analyzer and the second sample analyzer being a push-piece dyeing machine or a specific protein analyzer, the first supply channel 13 is used to transport the sample racks that have been analyzed by the first sample analyzer 1 and buffered in the first sample discharge buffer area 16 to the second supply channel 23 and then to the second sample loading buffer area 24, and the sample racks in the second sample loading buffer area 24 are transported to the second determination channel 25 for sampling and analysis by the second sample analyzer 2; the second supply channel 23 is used to transport the sample racks that have been analyzed by the second sample analyzer 2 and buffered in the second sample discharge buffer area 26 to the first supply channel 13 and then to the first sample loading buffer area 14, and the sample racks in the first sample loading buffer area 14 are transported to the first determination channel 15 for sampling and analysis by the first sample analyzer 1.

[0105] Embodiment 2

[0106] In a preferred embodiment, the sample supply mechanism comprises a sample scheduling mechanism, such as Figure 12 As shown, the sample scheduling mechanism comprises:

[0107] a hook assembly, ( Figure 12(Only one of the hook components 51 is shown in the image). The hook component is used to realize the one-way transport of the sample holder between the first loading area 12 and the first supply channel 13, the first supply channel 13 and the first sample inlet buffer area 14, the first sample inlet buffer area 14 and the first measurement channel 15, the first sample outlet buffer area 16 and the first supply channel 13, the first supply channel 13 and the first recovery area 17, and the second loading area 22 and the second supply channel 23, the second supply channel 23 and the second sample inlet buffer area 24, the second sample inlet buffer area 24 and the second measurement channel 25, the second sample outlet buffer area 26 and the second supply channel 23, the second supply channel 23 and the second recovery area 27.

[0108] The pullback assembly 52 is capable of pulling back the sample rack supplied to the first supply channel 13 or the second supply channel 23 to achieve separation between the sample rack located on the first supply channel 13 or the second supply channel 23 and the sample rack in the loading area.

[0109] Pushing component 53, the pushing component is used to push the sample rack on the first measurement channel 15 / second measurement channel 25 to the first sample output buffer 16 / second sample output buffer 26.

[0110] The hook component 51, pull-back component 52, and push component 53 can be implemented using existing technologies, and will not be described in detail here.

[0111] Example 3

[0112] like Figure 1 As shown, this embodiment 3 is an improvement on the basis of embodiment 1. The sample supply mechanism in this embodiment further includes a first recycling area 17 and a second recycling area 27. The first recycling area 17 and the first loading area 12 are located on the same side of the first supply channel 13 and are used to recycle sample racks from the first sample discharge buffer area 16 and / or the second sample discharge buffer area 26. The second recycling area 27 and the second loading area 22 are located on the same side of the second supply channel 23 and are used to recycle sample racks from the second sample discharge buffer area 26 and / or the first sample discharge buffer area 16.

[0113] Both the loading and recovery areas are located on the side of the supply channel away from the buffer area. The scanning of the sample rack or sample is completed on the measurement channel, which greatly increases the flexibility of scheduling and makes the instrument occupy a smaller area.

[0114] The recovery area can be used to quickly recover the sample rack after sample detection. The recovery mode can be freely selected by the user, which does not affect the online scheduling function. First, the partition recovery can be selected, which can quickly and conveniently distinguish the sample from which analyzer the final detection is completed. Second, the random recovery can be selected, which can recover more sample racks in a limited width direction to reduce the number of times of emptying the sample rack by the user, save the time and physical strength of the user, and improve the user experience.

[0115] As shown in Figure 5 the first sample rack to be recovered in the first sample-out buffer area 16 is recovered by the first recovery area 17, and the second sample rack to be recovered in the second sample-out buffer area 26 is recovered by the second recovery area 27.

[0116] When the random recovery is selected, the first sample rack to be recovered in the first sample-out buffer area 16 is recovered by the first recovery area 17, and the second sample rack to be recovered in the second sample-out buffer area 26 is recovered by the second recovery area 27.

[0117] Embodiment 4

[0118] This embodiment is an improvement based on the foregoing embodiments. The sample supply mechanism further comprises a first emergency sample inlet area 18 and a second emergency sample inlet area 28 for storing emergency samples. The first emergency sample inlet area 18 is located between the first sample inlet buffer area 14 and the first sample-out buffer area 16 and corresponds to the first detection channel 15. The second emergency sample inlet area 28 is located between the second sample inlet buffer area 24 and the second sample-out buffer area 26 and corresponds to the second detection channel 25.

[0119] In a more preferred embodiment, the second loading area 22 / first loading area 12 can be used as an emergency sample area, and the first loading area 12 / second loading area 22 can be used as a general sample area to solve the problem of a large number of emergency samples. This embodiment is a further improvement of the previous embodiment. In the previous embodiment, an emergency sample inlet area is separately provided. If a large number of emergency samples suddenly appear during sample detection, the emergency mode is used at this time, and the user needs to manually put or take out each sample, which consumes a lot of time of the user. At the same time, because of human factors, the detection process may be interrupted, thereby increasing the TAT time of the emergency sample. In this embodiment, one loading area is used as an emergency sample area, and the other loading area is used as a general sample area. At this time, the sample rack in the loading area as the emergency sample area is preferentially detected, thereby solving the problem of a large number of emergency samples.

[0120] In actual clinical use, users usually choose to place the ordinary sample racks in the first loading area 12, and when an emergency sample is needed, the sample rack for the emergency sample is placed in the second loading area 22.

[0121] Example 5

[0122] like Figure 2 As shown, this embodiment 5 is an improvement based on embodiment 1 and / or embodiment 2 and / or embodiment 3 and / or embodiment 4. The sample analysis system also includes a third sample analyzer 3. The sample supply mechanism includes a third supply channel 33 and a third measurement channel 35 corresponding to the third sample analyzer 3, which are used to supply the sample rack to be tested from the third loading area 32 to the third sample analyzer 3. The third supply channel 33 is connected to the second supply channel 23. A third sample inlet buffer area 34 and a third sample outlet buffer area 36 are provided between the third supply channel 33 and the third measurement channel 35. The third sample inlet buffer area 34 is used to buffer the sample rack to be supplied to the third measurement channel 35 from the third supply channel 33. The third sample outlet buffer area 36 is used to buffer the sample rack transported out from the third measurement channel 35.

[0123] Furthermore, the sample supply mechanism also includes a third recovery area 37, located on the same side of the third supply channel 33 as the third loading area 32, for recovering sample racks from the first sample discharge buffer area 16 and / or the second sample discharge buffer area 26 and / or the third sample discharge buffer area 36.

[0124] Specifically, recycling methods can include zoned recycling and random recycling:

[0125] When zoned recycling is selected, after the testing and / or retesting are completed, the sample racks to be recycled in the first sample output buffer 16 can only be assigned to the first recycling area 17; the sample racks to be recycled in the second sample output buffer 26 can only be assigned to the second recycling area 27; and the sample racks to be recycled in the third sample output buffer 36 can only be recycled to the third recycling area 37.

[0126] The zoned recycling system allows for quick and easy identification of which analyzer performed the final testing on a sample, making it easier for users to locate the relevant data.

[0127] When the random recycling method is selected: Sample racks awaiting recycling in the first sample output buffer 16 are assigned to the first recycling area 17. When the first recycling area 17 is full, they can be assigned to the second recycling area 27, and so on. Sample racks awaiting recycling in the second sample output buffer 26 can be recycled in the third recycling area 37 when the second recycling area 27 is full. When the third sample output buffer 36 is full in the third recycling area 37, no further recycling can be performed, and the system will issue an alarm.

[0128] Random recycling can be carried out in a finite width direction (i.e.) Figure 1or Figure 2 The arrow direction) occupies the space to recycle more sample racks, reduces the number of times of emptying sample racks by the user, saves the time and physical strength of the user, and improves the user experience.

[0129] In a preferred embodiment, the first sample analyzer 1 and the second sample analyzer 2 are of the same type, and are configured with the same or different analyzers, and the third sample analyzer 3 is a sample analyzer of a type different from the first sample analyzer 1 and the second sample analyzer 2.

[0130] Specifically, the first sample analyzer 1 and the second sample analyzer 2 are of the same type, and are configured with the same or different fully automatic blood cell analyzers, and the third sample analyzer 3 is a push piece dyeing machine or a specific protein analyzer.

[0131] Embodiment 6

[0132] The second aspect of the application provides a control method of a sample analysis system, including that a sample rack to be detected is placed in a first loading area 12 corresponding to a first sample analyzer 1; the sample rack in the first loading area 12 is transported to a first sample loading buffer area 14 through a first supply channel 13 to wait for entering a first determination channel 15, the sample rack in the first sample loading buffer area 14 is transported to the first determination channel 15, sampling analysis is performed by the first sample analyzer 1, and the sample rack is transported to a first sample output buffer area 16 through the first determination channel 15.

[0133] A second loading area 22 corresponding to a second sample analyzer 2 is placed with a sample rack; the sample rack in the second loading area 22 is transported to a second sample loading buffer area 24 through a second supply channel 23 to wait for entering the first determination channel 15, the sample rack in the second sample loading buffer area 24 is transported to a second determination channel 25, sampling analysis is performed by the second sample analyzer 2, and the sample rack is pushed to a second sample output buffer area 26 through the second determination channel 25.

[0134] And / or the sample rack in the first loading area 12 is also transported to the second sample loading buffer area 24 through the first supply channel 13 and the second supply channel 23, and is transported from the second sample loading buffer area 24 to the second determination channel 25;

[0135] The sample rack in the second loading area 22 is also transported to the first sample loading buffer area 14 through the second supply channel 23 and the first supply channel 13, and is transported from the first sample loading buffer area 14 to the first determination channel 15.

[0136] As Figure 8As shown in sample streams 1 and 2, in this mode, the sample racks in the first loading area 12 are transported to the first sample buffer area 14 for buffering and are only allocated to the first sample analyzer 1 for analysis and detection; the sample racks in the second loading area 22 are transported to the second sample buffer area 24 for buffering and are only allocated to the second sample analyzer 2 for analysis and detection, and the two analyzers do not interfere with each other.

[0137] The sample racks after sampling and analysis by the first sample analyzer 1 are transported to the first sample output buffer area 16. When zonal recycling is adopted, the sample racks to be recycled in the first sample output buffer area 16 are transported to the first recycling area 17 for recycling. The sample racks after sampling and analysis by the second sample analyzer 2 are transported to the second sample output buffer area 26. The sample racks to be recycled in the second sample output buffer area 26 are transported to the second recycling area 27 for recycling.

[0138] When random recycling is used, the sample racks in the first sample release buffer 16 are transported to the first recycling area 17 for recycling. When the first recycling area 17 is detected to be full, the sample racks to be recycled in the first sample release buffer 16 are transported to the second recycling area 27 for recycling. The sample racks to be recycled in the second sample release buffer 26 are transported to the second recycling area 27 for recycling. When the second recycling area 27 is detected to be full, the sample racks to be recycled in the first sample release buffer 16 are transported to the first recycling area 17 for recycling.

[0139] Preferably, the first sample inlet buffer and the second sample inlet buffer can each hold a maximum of 1 to 3 sample racks; the first sample outlet buffer and the second sample outlet buffer can each hold a maximum of 1 to 3 sample racks.

[0140] The buffer area can be used to cache 1 to 3 sample racks, ensuring that there is one or more sample racks in the sample loading buffer area. That is, when there are no sample racks in the sample loading buffer area or the sample rack cache is insufficient, the sample racks in the loading area will be sent to the sample loading buffer area for caching, which improves the continuity of detection, greatly improves the utilization efficiency of the loading area, increases the number of sample racks that users can load at one time, and greatly improves the detection efficiency.

[0141] Example 7

[0142] like Figure 3 As shown, the control method further includes, when it is detected that there is no sample holder in the second loading area 22 and the second sample buffer area 24, the sample holder in the first loading area 12 is transported to the second sample buffer area 24 via the first supply channel 13 and the second supply channel 23, the sample holder in the second sample buffer area 24 is transported to the second measurement channel 25 for sampling and analysis by the second sample analyzer 2, and the sample holder in the first sample buffer area 14 is transported to the first measurement channel 15 for sampling and analysis by the first sample analyzer 1.

[0143] In this mode, the sample racks in the second loading area 22 are only transported to the second sample buffer area 24 to be buffered and wait to enter the second determination channel 25, the sample racks in the second sample buffer area 24 are transported to the second determination channel 25 to be analyzed by the second sample analyzer 2; the sample racks in the first loading area 12 can be transported to the first sample buffer area 14 through the first supply channel 13 to be buffered, when it is detected that there is no sample rack in the second loading area 22 and the second sample buffer area 24, i.e. after the sample racks in the second loading area 22 are detected, the sample racks in the first loading area 12 can be transported to the second sample buffer area 24 through the first supply channel 13 and the second supply channel 23, the sample racks buffered in the first sample buffer area 14 are transported to the first determination channel 15 to be analyzed by the first sample analyzer 1, and the sample racks analyzed by the first sample analyzer 1 are transported to the first sample discharge buffer area 16; the sample racks buffered in the second sample buffer area 24 are transported to the second determination channel 25 to be analyzed by the second sample analyzer 2 (as shown in the sample flow 1, the sample flow 2, the sample flow 3 and the sample flow 5 in Figure 8 Figure 9

[0144] In this mode, it is especially suitable for the detection of a large number of emergency samples, when there are a large number of emergency sample racks, the emergency sample racks can be placed in the second loading area 22, and the first loading area 12 serves as a general sample area, at this time, according to this mode, the sample racks in the second loading area 22 as the emergency sample area are preferentially detected, and after the sample detection in the second loading area 22 is completed, the sample racks in the first loading area 12 are transported to the second sample analyzer for detection, thereby solving the problem of a large number of emergency samples.

[0145] or when it is detected that there is no sample rack in the first loading area 12 and the first sample buffer area 14, the sample racks in the second loading area 22 are transported to the first sample buffer area 14 through the second supply channel 23 and the first supply channel 13, the sample racks in the first sample buffer area 14 are transported to the first determination channel 15 to be analyzed by the first sample analyzer 1, and the sample racks in the second sample buffer area 24 are transported to the second determination channel 25 to be analyzed by the second sample analyzer 2.

[0146] ​​In this mode, the sample racks in the first loading area 12 are only transported to the first sample buffer area 14 for buffering, the sample racks in the first sample buffer area 14 are transported to the first determination channel 15 for sample analysis in the first sample analyzer 1; the sample racks in the second loading area 22 can be transported to the second sample buffer area 24 for buffering through the second supply channel 23, when it is detected that there is no sample rack in the first loading area 12 and the first sample buffer area 14, i.e. after the sample racks in the first loading area 12 are detected, the sample racks in the second loading area 22 can be transported to the first sample buffer area 14 through the second supply channel 23 and the first supply channel 13, the sample racks buffered in the first sample buffer area 14 are transported to the first determination channel 15, and the sample analysis in the first sample analyzer 1 is completed; the sample racks buffered in the second sample buffer area 24 are transported to the second determination channel 25, and the sample analysis in the second sample analyzer 2 is completed; and the sample racks after sample analysis in the first sample analyzer 1 are transported to the first sample discharge buffer area 16; the sample racks after sample analysis in the second sample analyzer 2 are transported to the second sample discharge buffer area 26.

[0147] Embodiment 8

[0148] On the basis of embodiment 7, the control method of the application further comprises: when it is detected that there is no sample rack in the first loading area 12 and the first sample buffer area 14, the sample racks in the second loading area 22 are transported to the first sample buffer area 14 through the second supply channel 23 and the first supply channel 13, the sample racks in the first sample buffer area 14 are transported to the first determination channel 15 for sample analysis in the first sample analyzer 1, the sample racks in the second sample buffer area 24 are transported to the second determination channel 25 for sample analysis in the second sample analyzer 2; and simultaneously, when it is detected that there is no sample rack in the second loading area 22 and the second sample buffer area 24, the sample racks in the first loading area 12 are transported to the second sample buffer area 24 through the first supply channel 13 and the second supply channel 23, the sample racks in the second sample buffer area 24 are transported to the second determination channel 25 for sample analysis in the second sample analyzer 2, and the sample racks in the first sample buffer area 14 are transported to the first determination channel 15 for sample analysis in the first sample analyzer 1.

[0149] In the embodiment of embodiment 7, if there are a large number of cross-machine review samples in the first loading area 12, due to the review priority principle, the samples in the second loading area 22 will be detected after the review samples are completed, thus, there may be a case that the samples in the first loading area 12 are all detected, but the samples in the second loading area 22 are not detected, which is not conducive to improving the detection efficiency. Embodiment 8 is further improved on the basis of embodiment 7, and is especially suitable for the case that there are a large number of cross-machine review samples.

[0150] As Figure 4As shown, in this mode, the sample racks of the first loading area 12 can be transported to the first sample buffer area 14 for buffering through the first feeding channel 13, when it is detected that the second loading area 22 and the second sample buffer area 24 have no sample racks, i.e. after the sample racks of the second loading area 22 are detected, the sample racks of the first loading area 12 can be transported to the second sample buffer area 24 through the first feeding channel 13 and the second feeding channel 23, the sample racks buffered in the first sample buffer area 14 are transported to the first determination channel 15, and the analysis detection is completed by the first sample analyzer 1, and the sample racks buffered in the second sample buffer area 24 are transported to the second determination channel 25, and the analysis detection is completed by the second sample analyzer 2; the sample racks of the second loading area 22 can be transported to the second sample buffer area 24 for buffering through the second feeding channel 23, when it is detected that the first loading area 12 and the first sample buffer area 14 have no sample racks, i.e. after the sample racks of the first loading area 12 are detected, the sample racks of the second loading area 22 can be transported to the first sample buffer area 14 through the second feeding channel 23 and the first feeding channel 13, the sample racks buffered in the first sample buffer area 14 are transported to the first determination channel 15, and the analysis detection is completed by the first sample analyzer 1, and the sample racks buffered in the second sample buffer area 24 are transported to the second determination channel 25, and the analysis detection is completed by the second sample analyzer 2.

[0151] In this way, the sample racks of the first loading area 12 are transported to the first sample buffer area 14 for buffering and are allocated to the first sample analyzer 1 for analysis detection; the sample racks of the second loading area 22 are transported to the second sample buffer area 24 for buffering and are allocated to the second sample analyzer 2 for analysis detection (the sample rack flow direction is as shown in the sample flow 1 and the sample flow 2 in Figure 8 , as shown in the sample flow 1, the sample flow 5 and the sample flow 11 in Figure 9 ); when it is detected that the sample racks of the second loading area 22 are detected, the sample racks of the first loading area 12 can be transported to the second sample buffer area 24 through the first feeding channel 13 and the second feeding channel 23, and the detection of the first loading area 12 is completed with the help of the second sample analyzer 2; and when it is detected that the sample racks of the first loading area 12 are detected, the sample racks of the second loading area 22 can be transported to the first sample buffer area 14 through the second feeding channel 23 and the first feeding channel 13, and the detection is completed with the help of the first sample analyzer 1. This control mode is particularly suitable for the case where there are a large number of cross-machine recheck samples and / or a large number of one-time samples. Through this control mode, the sample racks can be evenly allocated to the first sample analyzer 1 and the second sample analyzer 2, the detection advantages of the two machines are fully utilized, and thus the detection efficiency is improved (the sample rack flow direction is as shown in the sample flow 1-6 in Figure 8 , as shown in the sample flow 1-11 in Figure 9 ).

[0152] Example 9

[0153] The control method of the sample analysis system of the present invention further includes a sample rack placed in the third loading area 32 corresponding to the third sample analyzer 3; the sample rack in the third loading area 32 is transported to the third sample inlet buffer area 34 via the third supply channel 33 to wait for entry into the third measurement channel 35; the sample rack in the third sample inlet buffer area 34 is transported to the third measurement channel 35 and sampled and analyzed by the third sample analyzer 3; the sample rack after sampling and analysis is transported to the third sample outlet buffer area 36.

[0154] Since the third sample analyzer 3 is different from the first sample analyzer 1 and the second sample analyzer 2, the sample rack to be tested in the third loading area 32 is only transported to the third sample buffer area 34 through the third supply channel 33, and analyzed and detected by the third sample analyzer 3.

[0155] Of course, the sample rack to be tested in the third loading area 32 can also be transported to the second sample analyzer 2 and the first sample analyzer 1 for analysis and testing through the second supply channel 23 and the first supply channel 13.

[0156] The third sample inlet buffer and the third sample outlet buffer can each hold a maximum of 1 to 3 sample racks.

[0157] Example 10

[0158] like Figure 5 As shown, the control method of the sample analysis system of the present invention further includes that when the system detects that the first recycling area 17 is fully loaded, the sample rack to be recycled at the first sample output buffer area 16 is sent to the second recycling area 27 for recycling; when the system detects that the second recycling area 27 is fully loaded, the sample rack to be recycled at the first sample output buffer area 16 or the second sample output buffer area 26 is transported to the third recycling area 37 for recycling; when the system detects that the third recycling area 37 is fully loaded, the system issues a recycling full load alarm.

[0159] This recycling method does not affect the online scheduling function. When the recycling area corresponding to the sample analyzer is full, it can be recycled in the rear recycling area. In this way, more sample racks can be recycled within the limited space occupied in the width direction, reducing the number of times users need to empty the sample racks, saving users time and energy, and improving the user experience.

[0160] Example 11

[0161] The control method of the sample analysis system of the present application can also include using only the second loading area 22 as a sample placement area, and not scheduling the sample racks stored therein, and only scheduling the sample racks placed in the first loading area 12, and transporting the sample racks in the first loading area 12 to the first sample buffer area 14 and the second sample buffer area 24 through the first supply channel 13 and the second supply channel 23, transporting the sample racks stored in the first sample buffer area 14 to the first determination channel 15, and completing the analysis and detection by the first sample analyzer 1, and transporting the sample racks stored in the second sample buffer area 24 to the second determination channel 25, and completing the analysis and detection by the second sample analyzer 2.

[0162] Embodiment 12

[0163] The control method of the present application also includes when the sample after sampling analysis by the first sample analyzer 1 needs to be cross-machine detected, the sample rack to be cross-machine detected is transported from the first sample buffer area 16 to the second sample buffer area 24 through the first determination channel 15, and the sample rack transported to the second sample buffer area 24 is transported to the second determination channel 25 through the sample scheduling mechanism, and detected by the second sample analyzer 2;

[0164] Wherein, the first sample analyzer 1 is a low-configuration full-automatic blood cell analyzer 11, and the second sample analyzer is a high-configuration full-automatic blood cell analyzer 21, at this time, it can also be called cross-machine review. Or the first sample analyzer 1 is a full-automatic blood cell analyzer, and the second sample analyzer is a push-piece dyeing machine or a specific protein analyzer.

[0165] As shown in Figure 6 Taking the first sample analyzer 1 as a low-configuration full-automatic blood cell analyzer 11 and the second sample analyzer as a high-configuration full-automatic blood cell analyzer 21 as an example, the cross-machine detection includes the following steps:

[0166] The cross-machine detection rule is triggered after the sample to be cross-machine detected is sampled and analyzed by the first sample analyzer 1;

[0167] The sample rack to be cross-machine detected is transported to the first sample buffer area 16, and it is judged whether the first supply channel 13 and the second supply channel 23 meet the transportation conditions, if yes, it is judged whether the second sample buffer area 24 meets the transportation conditions; if no, the sample rack to be cross-machine detected is kept in the first sample buffer area 16 until the first supply channel 13 and the second supply channel 23 complete the occupation process and meet the transportation conditions;

[0168] If the second sample input buffer area 24 meets the transport condition, the sample rack to be cross-machine detected in the first sample output buffer area 16 is transported to the second sample input buffer area 24 through the first supply channel 13 and the second supply channel 23; if the second sample input buffer area 24 does not meet the transport condition, the sample rack to be cross-machine detected in the first sample output buffer area 16 waits until the second sample input buffer area 24 occupies the process and meets the transport condition;

[0169] The sample rack to be cross-machine detected transported to the second sample input buffer area 24 is transported to the second sample analyzer 2 for cross-machine detection.

[0170] When the first sample analyzer and the second sample analyzer are different types of sample analyzers, the steps are the same, which will not be repeated here.

[0171] When the third sample analyzer is included, the steps are the same as those when two sample analyzers are included, which will not be repeated here.

[0172] In the control method of the present application, cross-machine re-inspection is prior to local detection, so that the first sample can be detected first, the input and output of the sample are kept consistent, and the overall use efficiency is improved.

[0173] Embodiment 13

[0174] The control method of the sample analysis system of the present application further includes local re-inspection control, as shown in the following steps: Figure 7

[0175] When the first sample analyzer / second sample analyzer detects and analyzes the nth sample rack, it is judged whether the first to the n-1 sample racks that have been completed exist local re-inspection samples, and the sample analysis of the nth sample rack is completed; if there are local re-inspection samples, the sample rack is returned to the re-inspection rack, and the sample detection of the re-inspection position is completed, and then the sample analysis is continued; if there are no local re-inspection samples, the sample analysis is continued until the sample analysis is completed.

[0176] It is judged whether the n-th sample rack to the last sample rack position exists local re-inspection samples, if there are local re-inspection samples, the sample rack is returned to the re-inspection rack, and the sample detection of the re-inspection position is completed, and then the sample rack is transported to the corresponding first sample output buffer area / second sample output buffer area; if there are no local re-inspection samples, the sample rack is directly transported to the corresponding first sample output buffer area / second sample output buffer area.

[0177] The steps of local re-inspection are illustrated in a specific embodiment,

[0178] ​The first sample analyzer 1 judges whether there is a local re-inspection sample when the first sample analyzer 1 completes the detection of the 6th rack position and starts the detection of the 7th rack position on the first detection channel, and completes the detection of the 7th rack position.

[0179] If there is a local re-inspection sample, the sample rack is returned to the rack position that needs to be re-inspected, and after the detection of the re-inspected sample is completed, the detection and analysis of the 8th-10th rack positions are continued.

[0180] If there is no local re-inspection sample, the detection and analysis of the 8th-10th rack positions are continued.

[0181] After the detection is completed, the sample rack is transported to the first sample buffer area 16. In the control method of the present application, the local re-inspection is prior to the cross-machine re-inspection, the detection is prior to the recovery, the manual sample feeding is prior to the automatic sample feeding, and the short path is prior to the long path.

[0182] In addition, the detection channel of the sample analysis system of the present application can accommodate at most two sample racks. When it is identified that the first 1-n rack positions (such as the first 1-6 rack positions in the above embodiment) of the first sample rack do not have local re-inspection, the second sample rack is transported to the first detection channel 15 by the sample scheduling mechanism.

[0183] The local re-inspection steps of the second sample analyzer 2 and the third sample analyzer 3 are the same as those of the first sample analyzer 1, and will not be described here.

[0184] Embodiment 14

[0185] As shown in Figure 10 , the sample analysis system control method of the present application further comprises:

[0186] The first loading area 12 / second loading area 22 corresponding to the first sample analyzer 1 / second sample analyzer 2 is placed with a relevant-machine sample rack;

[0187] The relevant-machine sample rack in the first loading area 12 / second loading area 22 is transported to the first detection channel 15 / second detection channel 25;

[0188] The code scanning is performed on the relevant-machine sample rack and the sample tubes placed on the relevant-machine sample rack to determine the shutdown information, and it is judged whether the shutdown information is compliant;

[0189] If the shutdown information is compliant and matches the current first sample analyzer / second sample analyzer, then the shutdown process is executed; if the shutdown information is compliant but does not match the current first sample analyzer / second sample analyzer, then the shutdown sample rack is transported to the matching sample analyzer and the shutdown process is executed, and the sample racks in the first loading area 12 / second loading area 22 are no longer allocated to the first sample inlet buffer 14 / second sample inlet buffer 24 corresponding to the first sample analyzer 1 / second sample analyzer 2 that has already executed the shutdown process;

[0190] If the shutdown information is not compliant, the shutdown sample rack will be directly transported to the corresponding first recycling area 17 / second recycling area 27.

[0191] The aforementioned power-off sample racks can all be placed in the first loading area 12 / second loading area 22, or one rack can be placed in each of the first loading area 12 and the second loading area 22.

[0192] Compliant shutdown information means that the sample rack is a shutdown sample rack, the sample tube is a shutdown sample tube, and the shutdown sample tube is placed in the correct position on the shutdown sample rack.

[0193] Specific details regarding scanning the code to power off are as follows: Figure 11 As shown, when the information output by the barcode of the power-off sample rack and the power-off sample tube is correct (i.e., the barcode information of the sample rack is power-off sample rack, the barcode information of the sample tube is power-off sample tube, and the placement position of the power-off sample tube on the power-off sample rack is also correct), it is determined whether there is an instrument that is not yet powered off corresponding to the position on the sample rack. If so, the sample supply mechanism allocates it to the relevant instrument to complete the power-off process. That is, if the power-off information matches the current first sample analyzer / second sample analyzer, the power-off process is executed. If the power-off information does not match the current first sample analyzer / second sample analyzer, the power-off sample rack is transported to the matching sample analyzer, and the power-off process is executed.

[0194] When the barcode information output of the power-off sample rack and power-off sample tube is correct, but the position of the power-off sample tube is incorrect, the sample rack on the corresponding first measurement channel 15 / second measurement channel 25 is directly transported to the corresponding first recovery area 17 / second recovery area 27.

[0195] If the barcode information of either the power-off sample rack or the power-off sample tube is incorrect, i.e., the barcode information of the sample rack is not power-off or the barcode information of the sample tube is not power-off, then the sample rack on the corresponding first measurement channel 15 / second measurement channel 25 is directly transported to the corresponding first recovery area 17 / second recovery area 27.

[0196] When the scan code information of the shutdown sample rack and the shutdown sample tube are both incorrect, that is, the scan information of the sample rack is not a shutdown sample rack, and the scan code information of the sample tube is not a shutdown sample tube, the sample detection process is executed according to the scan code information.

[0197] When the third sample analyzer 3 is included, the shutdown process of the third sample analyzer 3 is similar to that of the first sample analyzer 1 / second sample analyzer 2, which will not be repeated here.

[0198] The sample analysis system control method of the application can complete automatic shutdown after detection by only placing the shutdown sample rack at the rear end of the detection sample rack, and when the instrument scans the shutdown sample rack, the sample rack in the loading area is not allocated to the sample rack buffer area corresponding to the current instrument.

[0199] Embodiment 15

[0200] The control method of the application further includes quality control scheduling of the sample analyzer, which includes the following steps:

[0201] The first loading area 12 / second loading area 22 is placed with a quality control sample, which is transported to the corresponding first sample analyzer 1 / second sample analyzer 2.

[0202] The first sample analyzer 1 / second sample analyzer 2 performs quality control.

[0203] The second sample analyzer 2 / first sample analyzer 1 performs sample condition.

[0204] The quality control sample completes quality control in the first sample analyzer 1 / second sample analyzer 2.

[0205] The quality control sample is transported to the second sample analyzer 2 / first sample analyzer 1.

[0206] The second sample analyzer 2 / first sample analyzer 1 performs quality control.

[0207] After completing quality control, the quality control sample is transported to the corresponding second recovery area 27 / first recovery area 17.

[0208] The quality control scheduling of the sample analyzer of the application completes the quality control of two sample analyzers by a set of quality control samples, and provides a channel for circulating the quality control samples, ensuring that the quality control channel does not interfere with the remaining scheduling work.

[0209] Embodiment 16

[0210] The working principle of the sample analysis system of the application will be described below in conjunction with specific device diagrams, referring to Figure 1 and Figure 12 Taking the sample rack pushing of the first sample analyzer 1 as an example,

[0211] The sample rack of the first loading area 12 is transported to the first sample feeding distribution position 131 of the first feeding channel 13 by the hook assembly 51 of the sample scheduling mechanism. When the first sample rack reaches the first feeding channel 13, the pull-back assembly 52 of the sample scheduling mechanism pulls back the sample rack that has not been completely fed to the first feeding channel 13, so as to separate the sample rack from the first sample rack that reaches the first feeding channel 13, facilitating subsequent transportation.

[0212] The sample rack of the first sample feeding distribution position 131 is transported to the first sample feeding buffer area 14 by the hook assembly 51 of the sample scheduling mechanism, and waits to enter the first determination channel 15. The first sample feeding buffer area 14 can buffer 1-3 sample racks at most. The sample rack of the first sample feeding buffer area 14 is transported to the first determination channel 15 by the hook assembly 51 of the sample scheduling mechanism. The sample rack on the first determination channel 15 is scanned by the code scanning assembly 4 for sample rack and sample tube information. If the scanned information is detected by the first sample analyzer 1, the first sample analyzer 1 performs detection and analysis.

[0213] The first determination channel 15 can accommodate two sample racks at most. During detection, it is identified whether there is a recheck sample. When it is identified that the first sample rack has no local recheck in the first 1-n positions (such as 1-6 positions), the second sample rack is transported to the first determination channel 15. The sample rack after detection is transported to the first sample output buffer area 16 by the push assembly 53 of the sample scheduling mechanism. The sample rack of the first sample output buffer area 16 is transported to the first sample output distribution position 132 of the first feeding channel 13 by the hook assembly 51 of the sample scheduling mechanism, and then is transported to the first recovery area 17 for recovery by the hook assembly of the sample scheduling mechanism.

[0214] If it is identified that the scanned information needs to be detected by the second sample analyzer 2 or the third sample analyzer 3, the corresponding analyzer is sent for detection through the cross-machine detection process, which will not be described in detail here.

[0215] Unless otherwise defined, the technical terms or scientific terms used in the present application should be understood as the usual meanings understood by those skilled in the art to which the present application belongs. The terms "first", "second", and similar words used in the present application do not represent any order, number, or importance, but are only used to distinguish different components. The terms "include" or "contain" and similar words mean that the elements or objects before the words cover the elements or objects listed after the words and their equivalents, without excluding other elements or objects.

[0216] In the embodiments provided by the present application, it should be understood that the disclosed apparatus and method can be implemented in other manners. For example, the described apparatus embodiment is merely schematic. For example, the division of the units is only a logical function division. There can be another division manner for the actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the illustrated or described embodiments of the present application are not intended to limit the scope of the present application. The technical solutions of the present application can be implemented in other forms without departing from the spirit of the present application. The disclosed apparatus embodiment can be implemented in other ways, or can be implemented together with other apparatus embodiments. In some embodiments, the components of the apparatus can be combined together or separated. In some embodiments, some components of the apparatus can be combined to form other components, or some components of the apparatus can be separated to form other components. In some embodiments, specific names and specific details of the technical features of the apparatus can be replaced by other technical features that serve the same function.

[0217] In addition, although the real-time operations of the present application are described in a specific order in the accompanying drawings, this is not intended to or imply that the operations must be performed in this specific order, or that all of the illustrated operations must be performed to achieve the desired result. Some steps can be omitted, multiple steps can be combined into one step, or one step can be divided into multiple steps.

[0218] Up to now, those skilled in the art should recognize that although the present application has been described with reference to the preferred embodiments, various modifications can be made to the present application and equivalent replacements can be made to the components thereof without departing from the scope of the present application. In particular, the technical features mentioned in each embodiment can be combined in any manner as long as there is no structural conflict. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions falling within the scope of the claims.

Claims

1. A sample analysis system, characterized by, The sample analysis system comprises a sample supply mechanism, at least a first sample analyzer and a second sample analyzer, wherein the sample supply mechanism comprises: a first assay channel corresponding to the first sample analyzer and a second assay channel corresponding to the second sample analyzer; a first loading area and a second loading area for placing sample racks, a first supply channel between the first loading area and the first assay channel, and a second supply channel between the second loading area and the second assay channel, and the first supply channel and the second supply channel are connected to bidirectionally transfer sample racks from the first loading area and the second loading area between the first sample analyzer and the second sample analyzer; wherein a first sample-in buffer area and a first sample-out buffer area are respectively arranged between the first supply channel and the first assay channel, the first sample-in buffer area is used for buffering sample racks from the first supply channel to be supplied to the first assay channel, and the first sample-out buffer area is used for buffering sample racks transported out of the first assay channel; a second sample-in buffer area and a second sample-out buffer area are arranged between the second supply channel and the second assay channel, the second sample-in buffer area is used for buffering sample racks from the second supply channel to be supplied to the second assay channel, and the second sample-out buffer area is used for buffering sample racks transported out of the second assay channel; the first sample-in buffer area and the second sample-in buffer area can respectively buffer 1-3 sample racks; a first recovery area and a second recovery area, the first recovery area is located on the same side of the first supply channel as the first loading area, and is used for recovering sample racks from the first sample-out buffer area and / or the second sample-out buffer area; the second recovery area is located on the same side of the second supply channel as the second loading area, and is used for recovering sample racks from the second sample-out buffer area and / or the first sample-out buffer area.

2. The sample analysis system of claim 1, wherein, The first sample-out buffer area and the second sample-out buffer area can respectively buffer 1-3 sample racks.

3. The sample analysis system of claim 1, wherein, A code scanning component is arranged on each of the first assay channel and the second assay channel, and the code scanning component is used for scanning information of sample racks and sample tubes to determine the destination of sample racks to be tested and the test items.

4. The sample analysis system of claim 1, wherein, The sample supply mechanism further comprises a first emergency sample-in area and / or a second emergency sample-in area for storing emergency samples, wherein the first emergency sample-in area is located between the first sample-in buffer area and the first sample-out buffer area and corresponds to the first assay channel; the second emergency sample-in area is located between the second sample-in buffer area and the second sample-out buffer area and corresponds to the second assay channel.

5. The sample analysis system of claim 1, wherein, The first loading area or the second loading area is an emergency sample loading area.

6. The sample analysis system of claim 1, wherein, The first sample analyzer and the second sample analyzer are the same type and are configured with the same or different sample analyzers; or The first sample analyzer and the second sample analyzer are sample analyzers of different types.

7. The sample analysis system of claim 1, wherein, The first sample analyzer and the second sample analyzer are full-automatic blood cell analyzers of the same type and same configuration or different configuration. The first sample analyzer is a full-automatic blood cell analyzer, and the second sample analyzer is a slide dyeing machine or a specific protein analyzer.

8. The sample analysis system of claim 1, wherein, The sample analysis system further comprises a third sample analyzer, and the sample feeding mechanism further comprises: a third feeding channel corresponding to the third sample analyzer; a third loading area for placing a sample rack; The third feeding channel is in communication with the second feeding channel, and the third feeding channel and the third measuring channel are respectively provided with a third sample feeding buffer area and a third sample discharging buffer area. The third sample feeding buffer area is used for buffering the sample rack from the third feeding channel to be fed to the third measuring channel, and the third sample discharging buffer area is used for buffering the sample rack discharged from the third measuring channel.

9. The sample analysis system of claim 8, wherein, The sample feeding mechanism further comprises a third recovery area, which is located on the same side of the third feeding channel as the third loading area, and is used for recovering the sample rack from the third sample discharging buffer area and / or the first sample discharging buffer area and / or the second sample discharging buffer area.

10. The sample analysis system of claim 1, wherein, The sample analysis system further comprises a sample scheduling mechanism, and the sample scheduling mechanism comprises: a hooking assembly, which is used for realizing one-way transportation of the sample rack between the first loading area and the first feeding channel, the first feeding channel and the first sample feeding buffer area, the first sample feeding buffer area and the first measuring channel, the first sample discharging buffer area and the first feeding channel, and the first feeding channel and the first recovery area, and one-way transportation between the second loading area and the second feeding channel, the second feeding channel and the second sample feeding buffer area, the second sample feeding buffer area and the second measuring channel, the second sample discharging buffer area and the second feeding channel, and the second feeding channel and the second recovery area; a pull-back assembly, which is used for pulling back the sample rack not completely fed on the first feeding channel / second feeding channel, and realizing separation between the sample racks on the first feeding channel / second feeding channel; a pushing assembly, which is used for pushing the sample rack on the first measuring channel / second measuring channel to the first sample discharging buffer area / second sample discharging buffer area.

11. The sample analysis system of claim 8 or 9, wherein, The first sample analyzer and the second sample analyzer are sample analyzers of the same type and same configuration or different configuration, and the third sample analyzer is a sample analyzer different from the first sample analyzer and the second sample analyzer in type.

12. The sample analysis system of claim 11, wherein, The first sample analyzer and the second sample analyzer are full-automatic blood cell analyzers of the same type and same configuration or different configuration, and the third sample analyzer is a slide dyeing machine or a specific protein analyzer.

13. A control method of a sample analysis system, characterized in that: a sample rack of a sample to be detected is placed in a first loading area corresponding to a first sample analyzer; the sample rack in the first loading area is transported to a first sample feeding buffer area through a first feeding channel to wait for entering a first measuring channel, the sample rack in the first sample feeding buffer area is transported to the first measuring channel and sampled and analyzed by the first sample analyzer, and is transported to a first sample discharging buffer area through the first measuring channel. The second sample analyzer corresponds to a second loading area where a sample rack with samples to be detected is placed; the sample rack of the second loading area is transported to a second sample feeding buffer area through a second feeding channel to wait for entering a second determination channel, the sample rack of the second sample feeding buffer area is transported to the second determination channel and is sampled and analyzed by the second sample analyzer, and is transported to a second sample discharging buffer area through the second determination channel. The sample rack of the first loading area is also transported to the second sample feeding buffer area through the first feeding channel and the second feeding channel, and waits to be transported to the second determination channel from the second sample feeding buffer area. The sample rack of the second loading area is also transported to the first sample feeding buffer area through the second feeding channel and the first feeding channel, and waits to be transported to the first determination channel from the first sample feeding buffer area. The sample rack to be recycled in the first sample discharging buffer area is transported to a first recycling area, and the sample rack to be recycled in the second sample discharging buffer area is transported to a second recycling area.

14. The control method of a sample analysis system according to claim 13, wherein The control method further comprises: when it is detected that the second loading area has no sample rack in the second sample feeding buffer area, the sample rack of the first loading area is transported to the second sample feeding buffer area through the first feeding channel and the second feeding channel to wait for entering the second determination channel, the sample rack of the first sample feeding buffer area is transported to the first determination channel to be sampled and analyzed by the first sample analyzer, and the sample rack of the second sample feeding buffer area is transported to the second determination channel to be sampled and analyzed by the second sample analyzer. The control method further comprises: when it is detected that the second loading area has no sample rack in the second sample feeding buffer area, the sample rack of the first loading area is transported to the second sample feeding buffer area through the first feeding channel and the second feeding channel to wait for entering the second determination channel, the sample rack of the first sample feeding buffer area is transported to the first determination channel to be sampled and analyzed by the first sample analyzer, and the sample rack of the second sample feeding buffer area is transported to the second determination channel to be sampled and analyzed by the second sample analyzer.

15. The method of controlling a sample analysis system according to claim 13, wherein, When it is detected that the first recycling area is full, the sample rack to be recycled in the first sample discharging buffer area is transported to the second recycling area; when it is detected that the second recycling area is full, the sample rack to be recycled in the second sample discharging buffer area is transported to the first recycling area.

16. The method of controlling a sample analysis system according to claim 13, wherein, The third sample analyzer corresponds to a third loading area where a sample rack is placed; the sample rack of the third loading area is transported to a third sample feeding buffer area through a third feeding channel to wait for entering a third determination channel, the sample rack of the third sample feeding buffer area is transported to the third determination channel to be sampled and analyzed by the third sample analyzer, and is transported to a third sample discharging buffer area through the third determination channel.

17. The control method of a sample analysis system according to any one of claims 13 to 16, characterized by, The first sample feeding buffer area and the second sample feeding buffer area can accommodate 1-3 sample racks respectively; and / or the first sample discharging buffer area and the second sample discharging buffer area can accommodate 1-3 sample racks respectively, and / or the third sample feeding buffer area and the third sample discharging buffer area can accommodate 1-3 sample racks respectively.

18. The method of controlling a sample analysis system according to claim 16, wherein, The sample rack to be recycled in the third sample discharging buffer area is transported to a third recycling area.

19. The method of controlling a sample analysis system of claim 16, wherein, The control method further comprises: when it is detected that the first recovery area is full, the sample rack to be recovered in the first sample buffer area is transported to the second recovery area or the third recovery area; and when it is detected that the second recovery area is full, the sample rack to be recovered in the second sample buffer area is transported to the third recovery area.

20. The control method of a sample analysis system according to claim 13 or 16, characterized by, When the sample analyzed by the first sample analyzer needs to be detected across machines, the sample rack to be detected across machines is transported from the first sample buffer area to the second sample buffer area through the first feeding channel, and the sample rack to be detected across machines transported to the second sample buffer area is transported to the second measuring channel through the sample scheduling mechanism and detected by the second sample analyzer. The first sample analyzer is a low-configuration automatic blood cell analyzer, and the second sample analyzer is a high-configuration automatic blood cell analyzer, or the first sample analyzer is an automatic blood cell analyzer, and the second sample analyzer is a push-piece dyeing machine or a specific protein analyzer.

21. The control method of a sample analysis system according to claim 20, wherein The cross-machine detection comprises the following steps: The sample to be detected across machines triggers a cross-machine detection rule after the sample analysis by the first sample analyzer is completed; The sample rack to be detected across machines is transported from the first measuring channel to the first sample buffer area, and it is judged whether the first feeding channel and the second feeding channel meet the transportation condition; if yes, it is judged whether the second sample buffer area corresponding to the second sample analyzer meets the transportation condition; if no, the sample rack to be detected across machines waits in the first sample buffer area until the transportation condition is met after the occupation process of the first feeding channel and the second feeding channel is completed; If the second sample buffer area meets the transportation condition, the sample rack to be detected across machines in the first sample buffer area is transported to the second sample buffer area through the first feeding channel and the second feeding channel; if the second sample buffer area does not meet the transportation condition, the sample rack to be detected across machines waits in the first sample buffer area until the second sample buffer area meets the transportation condition after the occupation process of the second sample buffer area is completed; The sample rack to be detected across machines transported to the second sample buffer area is transported to the second measuring channel and detected by the second sample analyzer.

22. The method of controlling a sample analysis system according to claim 20, wherein, The control method further comprises: When the sample analyzed by the first sample analyzer / second sample analyzer needs to be detected across machines, the sample rack to be detected across machines is transported from the first sample buffer area / second sample buffer area to the third sample buffer area through the first feeding channel / second feeding channel, and the sample rack to be detected across machines transported to the third sample buffer area is transported to the third measuring channel through the sample scheduling mechanism and detected by the third sample analyzer. The first sample analyzer / second sample analyzer is an automatic blood cell analyzer, and the third sample analyzer is a push-piece dyeing machine or a specific protein analyzer.

23. The method of controlling a sample analysis system according to claim 22, wherein, The steps of the cross-machine detection comprise: The sample to be detected across machines triggers a cross-machine detection rule after the sample analysis by the first sample analyzer / second sample analyzer is completed; The sample to be detected across machines triggers a cross-machine detection rule after the sample analysis by the first sample analyzer / second sample analyzer is completed; The to-be-rechecked sample rack is transported to the first sample-out buffer area / second sample-out buffer area, and it is determined whether the first supply channel / second supply channel and the third supply channel meet the transportation condition. If yes, it is determined whether the third sample-in buffer area corresponding to the third sample analyzer meets the transportation condition. If no, the to-be-cross-machine detection sample rack waits in the first sample-out buffer area / second sample-out buffer area for the occupation process of the first supply channel / second supply channel and the third supply channel to be completed until the transportation condition is met. If the third sample-in buffer area meets the transportation condition, the to-be-cross-machine detection sample rack in the first sample-out buffer area / second sample-out buffer area is transported to the third sample-in buffer area through the first supply channel / second supply channel and the third supply channel. If the third sample-in buffer area does not meet the transportation condition, the to-be-cross-machine detection sample rack waits in the first sample-out buffer area / second sample-out buffer area for the occupation process of the third sample-in buffer area to be completed until the third sample-in buffer area meets the transportation condition. The to-be-cross-machine detection sample rack transported to the third sample-in buffer area is transported to the third determination channel for rechecking analysis by the third sample analyzer.

24. The sample analysis system control method according to claim 13, wherein when the sample after sampling analysis needs to be rechecked locally, the following steps are included: When the first sample analyzer / second sample analyzer detects and analyzes the nth sample, it is determined whether there is a local recheck sample among the first to (n-1)th samples that have been completed, and the sample analysis of the nth sample is completed. If there is a local recheck sample, the sample rack is returned to the recheck rack position, and after the recheck sample detection in the recheck position is completed, the sample analysis is continued. If there is no local recheck sample, the sample analysis is continued until the sample analysis is completed. It is determined whether there is a local recheck sample among the nth to last samples. If there is a local recheck sample, the sample rack is returned to the recheck rack position, and after the recheck sample detection is completed, the sample rack is transported to the corresponding first sample-out buffer area / second sample-out buffer area. If there is no local recheck sample, the sample rack is directly transported to the corresponding first sample-out buffer area / second sample-out buffer area.

25. The sample analysis system control method according to claim 24, wherein the first determination channel / second determination channel can accommodate two sample racks respectively, and after the first n sample tubes of a sample rack are detected and it is determined that there is no local recheck, the next to-be-detected sample rack is sent to the first determination channel / second determination channel from the first sample-in buffer area / second sample-in buffer area. The sample analysis system control method further includes: The on-machine sample rack is placed in the first loading area and / or the second loading area; 26. The method of controlling a sample analysis system of claim 13, wherein, The off-machine sample rack in the first loading area and / or the second loading area is transported to the first determination channel / second determination channel; The off-machine information of the off-machine sample rack and the sample tubes placed on the off-machine sample rack is scanned and determined, and it is determined whether the off-machine information is compliant. ​ ​ If the shutdown information is compliant, and the shutdown information matches the current first sample analyzer / second sample analyzer, the shutdown process is performed; if the shutdown information is compliant, but the shutdown information does not match the current first sample analyzer / second sample analyzer, the shutdown sample rack is transported to the sample analyzer that it matches, and the shutdown process is performed; the sample racks of the first loading area and / or the second loading area are no longer assigned to the first sample injection buffer area / second sample injection buffer area corresponding to the first sample analyzer / second sample analyzer that has performed the shutdown process; if the shutdown information is not compliant, the shutdown sample rack is directly transported to the corresponding first recycling area / second recycling area.

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