Chip operation performance detection method, storage medium and system
By configuring the temperature chamber mode, sending the test data and scripts to the test terminal, calling the encrypted interface of the chip test case library, obtaining and verifying the results, and generating a test report, the problem of low chip testing efficiency and poor flexibility in the existing technology is solved, and multi-chip, multi-task parallel testing and automatic report generation are realized.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING WATCH DATA SYSTEM CO LTD
- Filing Date
- 2022-08-30
- Publication Date
- 2026-05-12
AI Technical Summary
Existing technologies struggle to effectively address the technical challenges of chip testing. Specifically, existing technologies fail to effectively solve the technical problem of chip testing itself.
The proposed technical solution is a chip computing performance testing method, which includes selecting a testing task, configuring a temperature chamber mode, testing data, testing script, and testing case library according to the testing task, sending them to the testing terminal, calling the chip through the testing case library to achieve encrypted computing data, and verifying the correctness of the obtained testing results.
It supports the simultaneous detection of multiple chips, improving detection efficiency and expanding the detection range. It also supports the performance testing of multiple algorithms, generating test logs and reports to facilitate problem finding.
Smart Images

Figure CN115629302B_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of chip testing technology, specifically relating to a chip computing performance testing method, storage medium, and system. Background Technology
[0002] Chip testing involves using specialized automated testing equipment to check whether the functions and performance of manufactured chips meet certain requirements. Therefore, chip testing includes many aspects, among which the chip's computing performance, including its processing speed, is crucial. The performance of a chip determines the performance of the product it is used in, so testing the chip's computing performance is a key aspect of chip testing.
[0003] Existing chip testing methods typically involve developing performance simulators based on the chip's hardware design and implementation. This means that testing each chip requires a separate solution developed based on its hardware design.
[0004] However, the test development process requires developers to have a deep understanding of the chip's design and implementation methods, and it consumes a significant amount of development resources and time. Furthermore, it is difficult to improve the accuracy and precision of the test results, resulting in low flexibility and high version iteration costs. Summary of the Invention
[0005] To address the shortcomings of existing technologies, the purpose of this invention is to provide a chip computing performance testing method, storage medium, and system to support the testing of various chip computing performances and reduce the development costs required for testing.
[0006] To achieve the above objectives, the technical solution adopted by the present invention is: a chip computing performance testing method, comprising the following steps: selecting a testing task and configuring a temperature chamber according to the testing task; sending the testing data, testing script, and testing case library configured according to the testing task to a testing terminal; executing the testing script in sequence, calling the encryption interface of the chip's corresponding testing case library during the execution process, and obtaining the result of the testing case library calling the chip to encrypt the computing data; and verifying the correctness of the result after obtaining it.
[0007] Furthermore, the configured temperature chamber includes adjusting the temperature chamber mode, detecting the highest temperature, detecting the lowest temperature, and setting the step size.
[0008] Furthermore, instructions to adjust the temperature of the incubator are sent to the incubator via socket communication.
[0009] Furthermore, by selecting the detection task through the web client interface, checking the detection script to be run, and then starting the detection task.
[0010] Furthermore, the detection data, the detection script, and the detection test case library are packaged into a zip file and sent to the detection terminal.
[0011] Furthermore, the step of executing the detection script sequentially, calling the encryption interface of the detection test case library corresponding to the chip during execution, and obtaining the result of the detection test case library calling the chip to encrypt the calculated data also includes the following steps: the detection terminal executes the detection script sequentially; calls the encryption interface of the detection test case library corresponding to the chip, and passes the detection data to the detection test case library in the form of parameters; the detection test case library calls the chip to encrypt the calculated data; and the result is then passed back to the encryption interface as a return parameter.
[0012] Furthermore, the computational data is encrypted using the sm4 encryption algorithm.
[0013] Furthermore, after the detection terminal completes the verification, it packages and uploads the detection logs. After the detection logs are uploaded, a detection report is generated. After the detection report is generated, the detection logs and the detection report are downloaded and displayed on the browser.
[0014] The present invention also provides a storage medium storing a computer program, wherein the computer program is configured to execute the chip computing performance testing method at runtime.
[0015] This invention also provides a chip computing performance testing system, comprising: a task selection module for selecting testing tasks, checking testing scripts, and executing testing tasks; a testing platform module for configuring testing data, testing scripts, and testing case libraries according to the testing tasks, sending the configured testing data, testing scripts, and testing case libraries to a testing terminal, and adjusting the temperature chamber; a testing module for executing testing scripts sequentially, calling the encryption interface of the chip's corresponding testing case library during execution, and obtaining the result of the testing case library calling the chip to encrypt the computational data; and a verification module for verifying the correctness of the results obtained by the testing module.
[0016] The advantages of this invention are: it supports simultaneous detection of multiple chips, greatly improving detection efficiency; it supports simultaneous detection of multiple tasks, greatly improving detection efficiency; it supports performance testing of multiple algorithms, expanding the detection range; it supports the generation of test logs, facilitating problem finding; and it supports the automatic generation of test reports, making it convenient to use. Attached Figure Description
[0017] Figure 1 This is a flowchart of the steps of a chip computing performance testing method according to the present invention;
[0018] Figure 2 This is a schematic diagram illustrating the principle architecture of a chip computing performance testing method according to the present invention;
[0019] Figure 3This is a schematic diagram of a chip computing performance testing system according to the present invention. Detailed Implementation
[0020] The present invention will now be further described with reference to the accompanying drawings and specific embodiments.
[0021] like Figure 1-3 As shown, the present invention provides a chip computing performance testing method, which includes the following steps:
[0022] S1, Select the testing task and configure the temperature chamber according to the testing task;
[0023] Specifically, the corresponding testing task is selected according to the specific chip testing requirements. Since chip testing is related to the external temperature, it is necessary to use a temperature chamber for adjustment.
[0024] Furthermore, configuring the temperature chamber includes adjusting the temperature chamber mode, detecting the highest temperature, detecting the lowest temperature, and setting the step size.
[0025] Furthermore, instructions to adjust the temperature of the incubator are sent to the incubator via socket communication.
[0026] In this embodiment, after selecting the detection task and checking the detection script to be run through the web client interface, the detection task begins execution. Upon receiving the detection task request, the detection platform, based on the configured temperature chamber settings (including chamber mode, maximum detection temperature, minimum detection temperature, and step size), sends a temperature adjustment command to the temperature chamber via socket communication. Upon receiving the temperature adjustment command, the temperature chamber adjusts its temperature. During this process, the detection platform continuously monitors whether the current temperature of the temperature chamber meets the test conditions via socket communication.
[0027] S2 will send the detection data, detection scripts, and detection test case library configured according to the detection task to the detection terminal;
[0028] Specifically, once the chamber temperature reaches the specified value, the test data, test scripts, and test case library configured for the test task are packaged into a zip file and sent to the test terminal. After receiving the test task from the test platform, the test terminal parses the zip file to obtain the test data, test scripts, and test case library.
[0029] S3, execute the detection script in sequence, call the encryption interface of the detection test case library corresponding to the chip during the execution process, and obtain the result of the detection test case library calling the chip to implement the encryption of the calculation data;
[0030] Specifically, after acquiring the detection data, detection script, and detection test case library, the detection terminal executes the detection script sequentially. During execution, it calls the encryption interface of the detection test case library corresponding to the chip, passing the detection data to the library as parameters. After passing the detection data to the library, it calculates the data encryption result and returns the result to the detection terminal through the encryption interface.
[0031] Furthermore, step S3 also includes the following steps:
[0032] The detection terminal executes the detection scripts sequentially.
[0033] Call the encryption interface of the corresponding test case library for the chip to pass the test data to the test case library in the form of parameter passing;
[0034] The test case library calls the chip to calculate the encrypted data result.
[0035] The result is then passed to the encryption interface as a return parameter.
[0036] Furthermore, the computational data is encrypted using the sm4 encryption algorithm.
[0037] It is understood that this embodiment only uses the sm4 encryption algorithm as an example, but it is also applicable to other operations.
[0038] S4. After obtaining the result, perform a correctness check.
[0039] Specifically, after the detection terminal obtains the results, it verifies the correctness of the results. Once the verification is complete, the detection result can be obtained.
[0040] Furthermore, after the detection terminal is verified, the detection logs are packaged and uploaded.
[0041] In this embodiment, the detection logs are packaged and uploaded to the detection platform. By generating logs, it is easier to find problems.
[0042] Furthermore, after the detection logs are uploaded, a detection report is generated;
[0043] After obtaining the detection logs, the detection platform parses the logs and generates a detection report.
[0044] Furthermore, after generating the test report, the test log and test report are downloaded and displayed in the browser.
[0045] It is understandable that after generating the test report, the interface requests to download the test log and report and displays them on the browser so that the test results can be viewed directly.
[0046] It is understandable that there can be multiple detection tasks, targeting different types of chips or multiple chips being detected simultaneously, thereby improving detection efficiency.
[0047] Understandably, the detection process supports performance testing of multiple algorithms, thus expanding the detection scope.
[0048] The present invention also provides a storage medium storing a computer program, wherein the computer program is configured to execute the above-described method steps during runtime. The storage medium may include, for example, a floppy disk, optical disk, DVD, hard disk, flash memory, USB flash drive, CF card, SD card, MMC card, SM card, Memory Stick, XD card, etc.
[0049] The computer software product is stored in a storage medium and includes several instructions to cause one or more computer devices (which may be personal computer devices, servers or other network devices, etc.) to execute all or part of the steps of the method of the present invention.
[0050] The present invention also provides a chip computing performance testing system, comprising:
[0051] The task selection module is used to select detection tasks, check detection scripts, and execute detection tasks.
[0052] The testing platform module is used to configure testing data, testing scripts, and testing test case libraries according to the testing task, and send the configured testing data, testing scripts, and testing test case libraries to the testing terminal, while adjusting the temperature chamber.
[0053] The detection module is used to execute the detection scripts in sequence. During the execution, it calls the encryption interface of the detection test case library corresponding to the chip and obtains the result of the detection test case library calling the chip to encrypt the calculated data.
[0054] The verification module is used to verify the correctness of the results obtained by the detection module.
[0055] In this embodiment, the chip is accessed using the same standard interface provided by the chip manufacturer, which reduces the development work for developers on different chips and lowers the development difficulty.
[0056] Furthermore, the chip computing performance testing system also includes a log generation module, which generates test logs and packages and uploads the test logs.
[0057] Furthermore, the chip computing performance testing system also includes a report generation module, which generates a test report after the test logs are uploaded.
[0058] Furthermore, the chip computing performance testing system also includes a display module for downloading test logs and test reports and displaying them in a browser.
[0059] In this embodiment, the task selection module includes a web client, through which detection tasks can be selected, detection scripts can be checked, and detection tasks can be executed.
[0060] It is understandable that, in actual use of this system, the web client can display the web resources requested by the user from the testing platform in the browser. The testing platform deploys a database server and a web server, responding to different functions based on the operations on the web interface, including operator management, operation permission management, testing equipment management, chamber management, testing data management, testing test case library management, testing task management, testing task execution management, testing result viewing, and corresponding data storage functions.
[0061] Operator management includes functions for adding, deleting, modifying, and querying operators, as well as managing operation logs.
[0062] Operator permission management: Enables the assignment of operation permissions to operators and the creation, deletion, modification, and query functions for permissions;
[0063] Testing equipment management: Used to configure the IP address, port number, and name of the test terminal, as well as the functions of adding, deleting, modifying, and querying test terminals;
[0064] Incubator Management: Set incubator mode, maximum temperature, minimum temperature, and step size;
[0065] Test data management: Configure test data paths, number of test data entries, test data descriptions, and add, delete, modify, query, and download functions for test data;
[0066] Test Case Library Management: Used to configure the name, path, and other information of the test case library, as well as the functions of adding, deleting, modifying, querying, and downloading test case libraries;
[0067] Test case management: Configure test case paths, test case descriptions, and the test data information used.
[0068] Testing Task Management: Used to configure information such as product name, test case library, test cases, testing equipment, and task description for testing tasks, as well as to add, delete, and query testing tasks;
[0069] Detection task operation management, including:
[0070] Check the testing service status: Check whether the testing terminal service is enabled;
[0071] Termination of testing service: Termination of service for the testing terminal;
[0072] View execution queue: View the queue of all currently executing detection tasks on the detection terminal;
[0073] Clear the execution queue: Clear the queue of detection tasks currently being executed on the detection terminal;
[0074] Start Testing: After selecting a testing task and the test case script to be tested, this function sends the test cases and the test data configured for the testing task to the testing terminal. After receiving the data, the testing terminal automatically starts executing the selected script. After the testing terminal completes the testing, it automatically generates a testing log and sends the log back to the testing platform. During the testing process, the temperature environment is adjusted according to the temperature chamber configuration of the task to execute the testing script.
[0075] Terminate Detection: If you want to terminate the detection task during its execution, you can use this function to terminate the task.
[0076] Get detection status: Detection tasks have several statuses, including not detected, detecting, detection completed, and abnormal termination. You can use this function to view the status of the detection task.
[0077] Clear detection data: Clears the detection data, detection logs, and other information sent and received by the detection terminal.
[0078] Viewing test results: After the test is completed, the test terminal uploads the test log to the test platform. The platform generates a test report based on the log. The test log and test report can be downloaded from the web interface of the platform.
[0079] Data storage: All operator information, permission information, equipment information, temperature chamber information, test data information, test case library, test task information, as well as test logs and test reports are stored in a database.
[0080] As can be seen from the above embodiments, the present invention supports the simultaneous detection of multiple chips, greatly improving detection efficiency; supports the simultaneous detection of multiple tasks, greatly improving detection efficiency; supports the performance testing of multiple algorithms, expanding the detection range; supports the generation of test logs, facilitating problem finding; and supports the automatic generation of test reports, making it convenient to use.
[0081] The methods and systems described in this invention are not limited to the embodiments described in the specific implementation. Other implementation methods derived by those skilled in the art based on the technical solutions of this invention also fall within the scope of technical innovation of this invention.
Claims
1. A method for testing the computing performance of a chip, characterized in that, Including the following steps: Select the testing task and configure the chamber accordingly; The detection data, detection scripts, and detection test case library configured according to the detection task will be sent to the detection terminal; The detection script is executed sequentially. During the execution, the encryption interface of the detection test case library corresponding to the chip is called, and the result of the detection test case library calling the chip to encrypt the calculated data is obtained. After obtaining the results, verify their correctness.
2. The chip computing performance testing method as described in claim 1, characterized in that: The configured temperature chamber includes adjusting the temperature chamber mode, detecting the highest temperature, detecting the lowest temperature, and setting the step size.
3. The chip computing performance testing method as described in claim 1, characterized in that: Commands to adjust the temperature of the incubator are sent via socket communication.
4. The chip computing performance testing method as described in claim 1, characterized in that: Select the detection task through the web client interface, check the detection scripts to run, and then start executing the detection task.
5. The chip computing performance testing method as described in claim 1, characterized in that: The detection data, the detection script, and the detection test case library are packaged into a zip file and sent to the detection terminal.
6. The chip computing performance testing method as described in claim 1, characterized in that... The step of executing the detection script sequentially, calling the encryption interface of the detection test case library corresponding to the chip during execution, and obtaining the result of the detection test case library calling the chip to encrypt the calculated data further includes the following steps: The detection terminal executes the detection scripts sequentially. Call the encryption interface of the corresponding test case library for the chip to pass the test data to the test case library in the form of parameter passing; The test case library calls the chip to calculate the encrypted data result. The result is then passed to the encryption interface as a return parameter.
7. The chip computing performance testing method as described in claim 6, characterized in that... : The computational data is encrypted using the sm4 encryption algorithm.
8. The chip computing performance testing method as described in claim 1, characterized in that... : After the detection terminal completes the verification, the detection log is packaged and uploaded. After the detection log is uploaded, a detection report is generated. After the detection report is generated, the detection log and the detection report are downloaded and displayed on the browser.
9. A storage medium, characterized in that: The storage medium stores a computer program, wherein the computer program is configured to execute the chip computing performance testing method according to any one of claims 1-8 when it is run.
10. A chip computing performance testing system, characterized in that, include: The task selection module is used to select detection tasks, check detection scripts, and execute detection tasks; The testing platform module is used to configure testing data, testing scripts, and testing test case library according to the testing task, and send the configured testing data, testing scripts, and testing test case library to the testing terminal, while adjusting the temperature chamber. The detection module is used to execute the detection script in sequence. During the execution, it calls the encryption interface of the detection test case library corresponding to the chip and obtains the result of the detection test case library calling the chip to encrypt the calculated data. The verification module is used to verify the correctness of the results obtained by the detection module.