Direct current current transformer transient delay test method, circuit, system and device

Abstract

The embodiment of the application discloses a direct-current current transformer transient delay test method, circuit, system and device; the method comprises the following steps: obtaining a test product step parameter of a first target point; calculating a standard step parameter of a second target point corresponding to the first target point on a standard step curve based on the test product step parameter; processing the test product step parameter and the standard step parameter by using an interpolation model to obtain sampling step parameters of two sampling points adjacent to the second target point; calculating a standard time parameter corresponding to the second target point according to the sampling step parameter and the standard step parameter; and calculating a transient delay parameter based on the standard time parameter and the test product step parameter. The test product step parameter is processed by using the interpolation model to obtain the sampling step parameters of the two sampling points adjacent to the second target point on the standard step curve, which is equivalent to inserting the test product value into the standard value, shortens the time interval between the two sampling points, reduces the calculation deviation, and improves the test accuracy.

Description

Technical Field

[0001] This invention relates to the field of current transformer technology, and more particularly to a method, circuit, system, and device for testing the transient delay of a DC current transformer. Background Technology

[0002] With the widespread application of flexible DC technology, the resonance risk of power grid systems has increased. Especially under asynchronous operation, harmonics have a significant negative impact on the safety and stability of the power grid. In this situation, the time delay of DC current transformers is particularly important for adjusting parameters and quickly suppressing broadband oscillations, which greatly contributes to the safety and stability of the power grid.

[0003] To gain a more comprehensive understanding of the time delay characteristics of DC current transformers, time delay testing is indispensable. Existing technologies typically utilize time delay equivalent testing methods based on transient signals. This involves acquiring discrete points of a standard signal and a test signal, then using interpolation to insert the standard value into the test value to calculate the corresponding delay duration. However, because the sampling frequency of the standard signal is higher than that of the test signal, the calculation of the transient delay becomes excessively inaccurate, resulting in poor test results. Summary of the Invention

[0004] In view of this, the present invention provides a method, circuit, system, and apparatus for testing the transient delay of a DC current transformer, to solve the problem of poor accuracy of test results in the prior art. To achieve one or more of the above objectives, or other objectives, the present invention proposes a method, circuit, system, and apparatus for testing the transient delay of a DC current transformer, in the first aspect:

[0005] A method for testing the transient delay of a DC current transformer includes:

[0006] Obtain the test specimen step parameters at the first target point on the test specimen step curve of the DC current transformer under test;

[0007] Calculate the standard step parameters of the second target point on the standard step curve corresponding to the first target point based on the sample step parameters;

[0008] The sample step parameters and the standard step parameters are processed using a preset interpolation model to obtain the sampled step parameters of two sampling points adjacent to the second target point;

[0009] The standard time parameters corresponding to the second target point are calculated based on the sampled step parameters and the standard step parameters.

[0010] The transient delay parameters are calculated based on the standard time parameters and the sample step parameters.

[0011] Preferably, the step of obtaining the sample step parameters at the first target point on the sample step curve includes:

[0012] Obtain the sample time parameters and sample amplitude parameters of the first target point;

[0013] The initial parameters of the steady-state step and the point step parameters of the sample are calculated using the sample amplitude parameters.

[0014] The sample step amplitude ratio parameter in the sample step parameters is calculated based on the sample amplitude parameter, the sample step steady-state initial parameter, and the point step parameter.

[0015] Preferably, the step of calculating the sample step amplitude ratio parameter in the sample step parameters based on the sample amplitude parameter, the sample step steady-state initial parameter, and the point step parameter includes:

[0016] The difference parameter is obtained by subtracting the point step parameter from the initial step steady-state parameter of the sample.

[0017] The sample step amplitude ratio parameter is obtained by using the ratio of the sample amplitude parameter and the difference parameter.

[0018] Preferably, before obtaining the test specimen step parameters at the first target point on the test specimen step curve of the DC current transformer under test, the method further includes:

[0019] The rise time period of the standard step curve is adjusted to obtain the sample step parameters based on the rise time period.

[0020] Preferably, the step of adjusting the rise time of the standard step curve includes:

[0021] Adjusting the impedance parameters in the standard test circuit corresponding to the standard step curve, and / or adjusting the wiring method and loop area in the standard test circuit, to change the rise time period. Second aspect:

[0022] A transient delay test circuit for a DC current transformer includes a power supply module, an equivalent circuit module, a standard voltage module, a test sample module, and a test module.

[0023] The power module, the equivalent circuit module, the sample module, and the standard voltage module are connected in series.

[0024] The signal output terminal of the test module is connected to the first signal input terminal of the test module, and is used to transmit the digital message signal of the DC current transformer under test to the test module.

[0025] The signal output terminal of the standard voltage module is connected to the second signal input terminal of the test module, and is used to transmit the standard voltage signal to the test module;

[0026] The test module is used to test the transient delay parameters of the DC current transformer under test using the method described above.

[0027] Preferably, the power supply module is a complex multi-state current source used to output transient step current and / or high-frequency current.

[0028] Third aspect:

[0029] A transient delay test system for a DC current transformer includes an acquisition module for acquiring the test step parameters of the test sample at a first target point on the test sample step curve of the DC current transformer under test.

[0030] The standard module is used to calculate the standard step parameters of the second target point on the standard step curve corresponding to the first target point based on the sample step parameters;

[0031] The sampling module is used to process the sample step parameters and the standard step parameters using a preset interpolation model to obtain the sampled step parameters of two sampling points adjacent to the second target point;

[0032] The time-marking module is used to calculate the standard time parameters corresponding to the second target point based on the sampled step parameters and the standard step parameters;

[0033] The delay module is used to calculate the transient delay parameters based on the standard time parameters and the sample step parameters.

[0034] Preferably, the acquisition module includes an acquisition unit, used to acquire the sample time parameter and sample amplitude parameter of the first target point;

[0035] The calculation unit is used to calculate the initial parameters of the steady-state step and the point step parameters of the sample using the sample amplitude parameters;

[0036] The amplitude ratio unit is used to calculate the sample step amplitude ratio parameter in the sample step parameters based on the sample amplitude parameters, the sample step steady-state initial parameters, and the point step parameters.

[0037] Preferably, the amplitude ratio unit includes a difference subunit, which is used to obtain the difference parameter by subtracting the point step parameter from the initial step steady-state parameter of the sample.

[0038] The comparison sub-unit is used to obtain the sample step amplitude ratio parameter by using the ratio of the sample amplitude parameter and the difference parameter.

[0039] Preferably, the system further includes an adjustment module, used to adjust the rise time period of the standard step curve before acquiring the test specimen step parameter at the first target point on the test specimen step curve of the DC current transformer under test, so as to acquire the test specimen step parameter based on the rise time period.

[0040] Preferably, the adjustment module includes a first adjustment unit for adjusting the impedance parameters in the standard test circuit corresponding to the standard step curve;

[0041] And / or, a second adjustment unit is used to adjust the wiring method and loop area in the standard test circuit to change the rise time period.

[0042] Fourth aspect:

[0043] A transient delay test device for a DC current transformer includes a memory and a processor. The memory stores a transient delay test method for a DC current transformer, and the processor is used to employ the aforementioned transient delay test method when executing the transient delay test method for a DC current transformer.

[0044] Fifth aspect:

[0045] A storage medium characterized in that it stores a computer program capable of being loaded by a processor and executing the methods described above.

[0046] Implementing the embodiments of the present invention will have the following beneficial effects:

[0047] After obtaining the test sample step parameters of the DC current transformer under test, the standard step parameters of the second target point on the standard step curve corresponding to the first target point are calculated. Then, an interpolation model is used to obtain the sampling step parameters of the two sampling points adjacent to the second target point. A reverse approach is adopted, interpolating the test sample values ​​into the standard values ​​to calculate the transient delay parameters. This method utilizes the fact that the sampling frequency of the standard signal is greater than that of the test sample signal, reducing calculation errors and thus improving the accuracy of the test results. Attached Figure Description

[0048] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0049] in:

[0050] Figure 1This is an overall flowchart of a transient delay test method for a DC current transformer in one embodiment.

[0051] Figure 2 This is a flowchart illustrating the calculation of the test sample step amplitude ratio parameter in a transient delay test method for a DC current transformer in one embodiment.

[0052] Figure 3 This is a schematic diagram of a transient delay test circuit for a DC current transformer in one embodiment.

[0053] Figure 4 This is a block diagram of a DC current transformer transient delay test system in one embodiment.

[0054] Figure 5 This is a schematic diagram of the structure of a DC current transformer transient delay test equipment in one embodiment. Detailed Implementation

[0055] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0056] In the following description, references are made to “some embodiments,” which describe a subset of all possible embodiments. However, it is understood that “some embodiments” may be the same subset or different subsets of all possible embodiments and may be combined with each other without conflict.

[0057] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used herein is for the purpose of describing embodiments of the invention only and is not intended to limit the invention.

[0058] This application discloses a transient delay test method for DC current transformers. The rapid development of DC power transmission in high-capacity, long-distance transmission, especially the widespread application of flexible DC power lines due to their controllability and flexibility, has led to the widespread use of DC current transformers. The delay characteristics of DC current transformers are widely used because they effectively suppress the negative impacts of DC power transmission or flexible DC power. Currently, there is a lack of systematic research on the delay characteristics of DC electronic current transformers. Due to limitations in experimental methods and technology, delay test calibration simulating actual operating conditions has not been effectively carried out in the field. In particular, there is a lack of in-depth research and field test data for calibrating delays under different signal excitation conditions. Furthermore, DC systems often exhibit various signal patterns during operation, especially in broadband signal detection, relay protection, and control parameter adjustment, which places more accurate demands on the delay time of DC current transformers.

[0059] In existing technologies, the sampling frequency of the DC current transformer under test, also known as the test object or object under test, is relatively low, typically 10kHz, resulting in a time interval of 100 microseconds between two discrete sampling points. In contrast, the sampling frequency of the standard signal is 500kHz or higher, with a sampling interval of 2 microseconds or less. Existing technologies use interpolation to calculate transient delays, inserting the standard value into the test object value. However, the large time interval between the two discrete sampling points increases the calculation deviation, making it difficult to guarantee the accuracy of the transient delay test results.

[0060] To overcome the above-mentioned defects, this application provides a method for testing the transient delay of a DC current transformer, such as... Figure 1 As shown, it includes:

[0061] 101. Obtain the test sample step parameters at the first target point on the test sample step curve of the DC current transformer under test.

[0062] The DC current transformer under test refers to the DC current transformer that needs to undergo transient delay testing. In one embodiment, a preset transient delay test system or test circuit is used to perform a transient delay test on the DC current transformer under test. Through the test, a test sample step curve corresponding to the DC current transformer under test can be obtained.

[0063] In one embodiment, the test specimen step curve refers to the voltage step signal of the DC current transformer under test. The first target point is a discrete sampling point in the waveform of the test specimen step curve during its rising phase. The test specimen step parameters corresponding to the first target point include at least one of the following: test specimen timing parameter, test specimen amplitude parameter, test specimen step amplitude ratio parameter, test specimen step steady-state initial parameter, and point step parameter.

[0064] In one embodiment, the sample step parameters are transmitted to the current execution entity by other devices; in another embodiment, the sample step parameters are calculated by the current execution entity through controlling the test circuit or test system.

[0065] 102. Calculate the standard step parameters of the second target point on the standard step curve corresponding to the first target point based on the sample step parameters.

[0066] In one embodiment, the calculation of the standard step parameter is constrained by the sample step parameter. Based on the information of the first target point on the sample step curve, which may be location information, time information, or sampling number information, a corresponding second target point is found on the standard step curve. Then, under the constraint of the sample step parameter, the standard step parameter of the second target point is calculated.

[0067] 103. The sample step parameters and the standard step parameters are processed using a preset interpolation model to obtain the sampled step parameters of two sampling points adjacent to the second target point.

[0068] The interpolation model refers to the calculation process and / or calculation formula formed using an interpolation algorithm. In one embodiment, let the standard time parameter and standard amplitude parameter corresponding to the second target point be (t). n u n The previous sampling point was (t). n-1 u n-1 The next sampling point is (t) n+1 u n+1 The sampling frequency is f. su The sampling interval is 1 / f su .

[0069] 104. Calculate the standard time parameter corresponding to the second target point based on the sampled step parameter and the standard step parameter.

[0070] After obtaining the sampled step parameters and the standard step parameters, the standard time parameters of the second target point can be calculated. In one embodiment, the calculation formula is as follows:

[0071]

[0072] Among them, t n The standard time parameter for the second target point; t n-1 The standard time parameter for the previous sampling point; u n The standard amplitude parameter for the second target point; u n-1 The standard amplitude parameter of the previous sampling point; u n+1 This is the standard amplitude parameter for the next sampling point; This represents the sampling interval for the standard step curve.

[0073] 105. The transient delay parameter is calculated based on the standard time parameter and the sample step parameter.

[0074] In one embodiment, the transient delay parameter is obtained by subtracting the sample time parameter from the standard time parameter in the sample step parameter.

[0075] By employing reverse thinking, the sample value is interpolated into the standard value using an interpolation method to calculate the transient delay parameter. This approach leverages the fact that the standard signal sampling frequency is greater than the sample signal sampling frequency, reducing calculation bias and thus improving the accuracy of the test results.

[0076] In another embodiment of this application, such as Figure 2 As shown, the steps for obtaining the sample step parameters at the first target point on the sample step curve include:

[0077] 201. Obtain the sample time parameter and sample amplitude parameter of the first target point.

[0078] In one embodiment, the first target point is M(t) m v m ); where t m For the sample timing parameter; v m This refers to the amplitude parameters of the test sample.

[0079] 202. The initial parameters of the steady-state step and the point step parameters of the sample are calculated using the sample amplitude parameters.

[0080] In one embodiment, a data window of the initial stage of the step steady state of the test sample is selected, and the initial parameters of the step steady state of the test sample are calculated by averaging the data; then, the point step parameters are obtained by selecting the high value of the step steady state.

[0081] 203. Based on the sample amplitude parameter, the sample step steady-state initial parameter, and the point step parameter, calculate the sample step amplitude ratio parameter in the sample step parameter.

[0082] In one embodiment, the sample step amplitude ratio parameter is calculated using the following formula:

[0083]

[0084] Where m is the sample step amplitude ratio parameter; v m JGR is the amplitude parameter of the sample; JDR is the step parameter; JDR is the initial step steady-state parameter of the sample.

[0085] Calculating the step amplitude ratio parameter of the test sample helps ensure its accuracy, thereby improving the accuracy of the transient delay test results.

[0086] In another embodiment of this application, the step of calculating the sample step amplitude ratio parameter in the sample step parameters based on the sample amplitude parameter, the sample step steady-state initial parameter, and the point step parameter includes:

[0087] 301. The difference parameter is obtained by subtracting the point step parameter from the initial step steady-state parameter of the sample.

[0088] That is, the difference parameter = JGR - JDR; where JGR is the point step parameter; and JDR is the initial step steady-state parameter of the sample.

[0089] 302. The sample step amplitude ratio parameter is obtained by using the ratio of the sample amplitude parameter and the difference parameter.

[0090] The step amplitude ratio parameter of the test sample is calculated using a relatively simple calculation process. This helps to ensure the accuracy of the step amplitude ratio parameter of the test sample while ensuring limited resources are used.

[0091] In another embodiment of this application, the step 102 of calculating the standard step parameter includes: calculating the standard step parameter by selecting time window data of the high step value stage and averaging the data.

[0092] In another embodiment of this application, the step 103 of calculating the sampling step parameters of the two sampling points includes: calculating the sampling step parameters of the two sampling points based on the sample step amplitude ratio parameter m. For example, in an application scenario, m = 0.1, i.e., 10%. Then the time and amplitude of the second target point corresponding to the standard signal are (t bz -10%, u bz -10%), the corresponding previous discrete sampling point is (t bz -s1,u bz -s1), the next sampling point is (t) bz -s2,u bz -s2). The time and amplitude (t) corresponding to the test sample signal with a 10% step amplitude. bs -10%, v bs -10%), the corresponding previous discrete sampling point is (tbs-s1, vbs-s1), and the next sampling point is (t bs -s2,v bs -s2), based on which the time corresponding to the 10% step amplitude value can be calculated.

[0093] In another embodiment of this application, before obtaining the test specimen step parameter at the first target point on the test specimen step curve of the DC current transformer under test, the method further includes:

[0094] The rise time period of the standard step curve is adjusted to obtain the sample step parameters based on the rise time period.

[0095] In one embodiment, the rising time period is adjusted to be within the following range:

[0096]

[0097] Among them, f s T is the sampling frequency of the merging unit of the DC current transformer under test; f The rising time.

[0098] Adjusting the rise time of the standard step curve helps improve the accuracy of subsequent parameter calculations and further reduces the deviation of test results obtained using interpolation, thus improving the accuracy of the test results.

[0099] In another embodiment of this application, the step of adjusting the rise time of the standard step curve includes:

[0100] 501. Adjust the impedance parameters in the standard test circuit corresponding to the standard step curve.

[0101] The rise time can be adjusted by changing the impedance parameter.

[0102] 502. Adjust the wiring method and loop area in the standard test circuit to change the rise time period.

[0103] By adjusting the rise time period using the impedance, wiring method, and loop area of ​​the primary circuit, the test effect can be improved, thereby increasing the accuracy of the test results.

[0104] It should be noted that, in one embodiment, steps 501 and 502 are in an AND / OR relationship.

[0105] After obtaining the test sample step parameters of the DC current transformer under test, the standard step parameters of the second target point on the standard step curve corresponding to the first target point are calculated. Then, an interpolation model is used to obtain the sampling step parameters of two sampling points adjacent to the second target point. A reverse approach is adopted, interpolating the test sample values ​​into the standard values ​​to calculate the transient delay parameters. Generally, the standard signal has a high sampling frequency and more densely packed discrete sampling points, with an interval of 2 microseconds between two sampling points. Therefore, interpolation is performed within these two 2-microsecond sampling intervals. This method utilizes the fact that the standard signal sampling frequency is greater than the test sample signal sampling frequency, reducing calculation errors and thus improving the accuracy of the test results.

[0106] This application also provides a transient delay test circuit for a DC current transformer, such as... Figure 3As shown, it includes a power supply module, an equivalent circuit module, a standard voltage module, a test sample module, and a test module.

[0107] The power module, the equivalent circuit module, the sample module, and the standard voltage module are connected in series.

[0108] The signal output terminal of the test module is connected to the first signal input terminal of the test module, and is used to transmit the digital message signal of the DC current transformer under test to the test module.

[0109] The signal output terminal of the standard voltage module is connected to the second signal input terminal of the test module, and is used to transmit the standard voltage signal to the test module;

[0110] The test module is used to test the transient delay parameters of the DC current transformer under test using the method described above.

[0111] In one embodiment, the power supply module is a complex multistate current source used to output transient step current and / or high-frequency current.

[0112] In one embodiment, the equivalent circuit module includes a resistor and an inductor connected in series.

[0113] In one embodiment, the test module is a DC electronic current transformer, including a shunt, a voltage distribution driver, multiple independent remote modules, and a merging unit. The shunt, voltage distribution driver, multiple independent remote modules, and merging unit are connected in series.

[0114] In one embodiment, the standard voltage module includes a high-precision resistor Rb for outputting a standard voltage signal ub.

[0115] When testing the transient delay of a DC current transformer, the DC current transformer under test is connected as a test module in the circuit. The test module then calculates the transient delay using the method described above, improving the accuracy of the test results.

[0116] This application also provides a transient delay test system for DC current transformers, such as... Figure 4 As shown, it includes an acquisition module 1, which is used to acquire the test specimen step parameters at the first target point on the test specimen step curve of the DC current transformer under test;

[0117] Standard module 2 is used to calculate the standard step parameters of the second target point on the standard step curve corresponding to the first target point based on the sample step parameters;

[0118] Sampling module 3 is used to process the sample step parameters and the standard step parameters using a preset interpolation model to obtain the sampled step parameters of two sampling points adjacent to the second target point;

[0119] The time-marking module 4 is used to calculate the standard time parameter corresponding to the second target point based on the sampled step parameter and the standard step parameter;

[0120] Delay module 5 is used to calculate transient delay parameters based on the standard time parameters and the sample step parameters.

[0121] Preferably, the acquisition module 1 includes an acquisition unit, used to acquire the sample time parameter and sample amplitude parameter of the first target point;

[0122] The calculation unit is used to calculate the initial parameters of the steady-state step and the point step parameters of the sample using the sample amplitude parameters;

[0123] The amplitude ratio unit is used to calculate the sample step amplitude ratio parameter in the sample step parameters based on the sample amplitude parameters, the sample step steady-state initial parameters, and the point step parameters.

[0124] Preferably, the amplitude ratio unit includes a difference subunit, which is used to obtain the difference parameter by subtracting the point step parameter from the initial step steady-state parameter of the sample.

[0125] The comparison sub-unit is used to obtain the sample step amplitude ratio parameter by using the ratio of the sample amplitude parameter and the difference parameter.

[0126] Preferably, the system further includes an adjustment module, used to adjust the rise time period of the standard step curve before acquiring the test specimen step parameter at the first target point on the test specimen step curve of the DC current transformer under test, so as to acquire the test specimen step parameter based on the rise time period.

[0127] Preferably, the adjustment module includes a first adjustment unit for adjusting the impedance parameters in the standard test circuit corresponding to the standard step curve;

[0128] And / or, a second adjustment unit is used to adjust the wiring method and loop area in the standard test circuit to change the rise time period.

[0129] It should be noted that the above description of the embodiment of the DC current transformer transient delay test system is similar to the method description above and has the same beneficial effects as the method embodiment. For technical details not disclosed in the embodiments of the DC current transformer transient delay test system of this invention, those skilled in the art should refer to the description of the method embodiment of this invention for understanding.

[0130] It should be noted that, in the embodiments of the present invention, if the above methods are implemented in the form of software functional modules and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the embodiments of the present invention, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), magnetic disks, or optical disks. Thus, the embodiments of the present invention are not limited to any specific hardware and software combination.

[0131] Accordingly, embodiments of this application also disclose a storage medium storing a computer program that can be loaded by a processor and execute the above-described methods.

[0132] This application also discloses a transient delay testing device for a DC current transformer, such as... Figure 5 As shown, the system includes a processor 100, at least one communication bus 200, a user interface 300, at least one external communication interface 400, and a memory 500. The communication bus 200 is configured to enable communication between these components. The user interface 300 may include a display screen, and the external communication interface 400 may include standard wired and wireless interfaces. The memory 500 stores a transient delay test method for a DC current transformer. The processor 100 is used to employ the aforementioned method when executing the transient delay test method for a DC current transformer stored in the memory 500.

[0133] The above description of the transient delay testing device and storage medium for DC current transformers is similar to the description of the method embodiments described above, and has similar beneficial effects. For technical details not disclosed in the embodiments of the DC current transformer transient delay testing device and storage medium of the present invention, please refer to the description of the method embodiments of the present invention for understanding.

[0134] It should be understood that the phrase "one embodiment" or "an embodiment" throughout the specification means that a specific feature, structure, or characteristic related to the embodiment is included in at least one embodiment of the invention. Therefore, "in one embodiment" or "in an embodiment" appearing throughout the specification does not necessarily refer to the same embodiment. Furthermore, these specific features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. It should be understood that in the various embodiments of the invention, the sequence numbers of the above-described processes do not imply a sequential order of execution; the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the invention. The sequence numbers of the above-described embodiments of the invention are merely descriptive and do not represent the superiority or inferiority of the embodiments.

[0135] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0136] In the several embodiments provided by this invention, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely illustrative. For example, the division of units is only a logical functional division, and in actual implementation, there may be other division methods, such as: multiple units or components can be combined, or integrated into another system, or some features can be ignored or not executed. In addition, the coupling, direct coupling, or communication connection between the various components shown or discussed can be through some interfaces, and the indirect coupling or communication connection between devices or units can be electrical, mechanical, or other forms.

[0137] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units. They may be located in one place or distributed across multiple network units. Some or all of the units may be selected to achieve the purpose of this embodiment according to actual needs.

[0138] In addition, in the various embodiments of the present invention, each functional unit can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; the integrated unit can be implemented in hardware or in the form of hardware plus software functional units.

[0139] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as mobile storage devices, ROMs, magnetic disks, or optical disks.

[0140] Alternatively, if the integrated units of this invention are implemented as software functional modules and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the embodiments of this invention, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a device to execute all or part of the methods described in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROMs, magnetic disks, or optical disks.

[0141] The above description discloses only preferred embodiments of the present invention and should not be construed as limiting the scope of the present invention. Therefore, equivalent variations made in accordance with the claims of the present invention are still within the scope of the present invention.

Claims

1. A method for testing the transient delay of a DC current transformer, characterized in that, include: Obtain the test specimen step parameters at the first target point on the test specimen step curve of the DC current transformer under test; Calculate the standard step parameters of the second target point on the standard step curve corresponding to the first target point based on the sample step parameters; The sample step parameters and the standard step parameters are processed using a preset interpolation model to obtain the sampled step parameters of two sampling points adjacent to the second target point; The standard time parameters corresponding to the second target point are calculated based on the sampled step parameters and the standard step parameters. The transient delay parameters are calculated based on the standard time parameters and the sample step parameters.

2. The transient delay test method for DC current transformers as described in claim 1, characterized in that, The steps for obtaining the sample step parameters at the first target point on the sample step curve include: Obtain the sample time parameters and sample amplitude parameters of the first target point; The initial parameters of the steady-state step and the point step parameters of the sample are calculated using the sample amplitude parameters. The sample step amplitude ratio parameter in the sample step parameters is calculated based on the sample amplitude parameter, the sample step steady-state initial parameter, and the point step parameter.

3. The transient delay test method for DC current transformers as described in claim 2, characterized in that, The step of calculating the sample step amplitude ratio parameter in the sample step parameters based on the sample amplitude parameter, the sample step steady-state initial parameter, and the point step parameter includes: The difference parameter is obtained by subtracting the point step parameter from the initial step steady-state parameter of the sample. The sample step amplitude ratio parameter is obtained by using the ratio of the sample amplitude parameter and the difference parameter.

4. The transient delay test method for DC current transformers as described in claim 1, characterized in that, Before obtaining the test specimen step parameters at the first target point on the test specimen step curve of the DC current transformer under test, the method further includes: The rise time period of the standard step curve is adjusted to obtain the sample step parameters based on the rise time period.

5. The transient delay test method for DC current transformers as described in claim 4, characterized in that, The step of adjusting the rise time of the standard step curve includes: Adjust the impedance parameters in the standard test circuit corresponding to the standard step curve, and / or adjust the wiring method and loop area in the standard test circuit to change the rise time period.

6. A transient delay test circuit for a DC current transformer, characterized in that, It includes a power supply module, an equivalent circuit module, a standard voltage module, a test sample module, and a test module; The power module, the equivalent circuit module, the sample module, and the standard voltage module are connected in series. The signal output terminal of the test module is connected to the first signal input terminal of the test module, and is used to transmit the digital message signal of the DC current transformer under test to the test module. The signal output terminal of the standard voltage module is connected to the second signal input terminal of the test module, and is used to transmit the standard voltage signal to the test module; The test module is used to test the transient delay parameters of the DC current transformer under test using the method described in any one of claims 1-5.

7. The DC current transformer transient delay test circuit as described in claim 6, characterized in that, The power module is a complex multi-state current source used to output transient step current and / or high-frequency current.

8. A transient delay test system for a DC current transformer, characterized in that, Includes an acquisition module for acquiring the test specimen step parameters at the first target point on the test specimen step curve of the DC current transformer under test; The standard module is used to calculate the standard step parameters of the second target point on the standard step curve corresponding to the first target point based on the sample step parameters; The sampling module is used to process the sample step parameters and the standard step parameters using a preset interpolation model to obtain the sampled step parameters of two sampling points adjacent to the second target point; The time-marking module is used to calculate the standard time parameters corresponding to the second target point based on the sampled step parameters and the standard step parameters; The delay module is used to calculate the transient delay parameters based on the standard time parameters and the sample step parameters.

9. A transient delay testing device for a DC current transformer, comprising a memory and a processor, characterized in that, The memory stores a transient delay test method for a DC current transformer, and the processor is used to employ the transient delay test method for a DC current transformer according to any one of claims 1-5 when executing the transient delay test method for a DC current transformer.

10. A storage medium, characterized in that, The computer program is stored that can be loaded by a processor and executed as described in any one of claims 1-5.

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