Method and device for measuring three-dimensional roughness of structural plane based on profile line strip

Abstract

A kind of structural plane three-dimensional roughness measurement method based on contour line strip, the three-dimensional local topography of structural plane is characterized by the contour line strip consisting of adjacent contour lines, and different contour line optimal strip widths are used for different sizes of structural plane, while the measured contour line strip is dynamically judged whether it is sufficient to reliably evaluate the three-dimensional roughness of structural plane during measurement;The present application also provides a measuring device for implementing the method, comprising a recording unit, a measuring unit and a connecting carrier, the recording unit is horizontally installed on the upper part of the connecting carrier, the measuring unit is vertically installed on the lower part of the connecting carrier, the recording unit comprises a horizontal distance adjusting module and a recording pen, and the measuring unit comprises a vertical distance adjusting module and a probe.The present application can effectively eliminate the dimensional difference between two-dimensional contour line and three-dimensional topography of structural plane, the device structure is simple, small in size, convenient to carry, and the measurement distance of contour line can be quantitatively adjusted.

Description

Technical Field

[0001] This invention relates to the field of geotechnical engineering technology, specifically to a method and apparatus for measuring the three-dimensional roughness of structural surfaces based on contour lines. Background Technology

[0002] Structural surface roughness has a significant impact on the mechanical and hydraulic properties of rock masses and is a key parameter in rock mass stability analysis. In engineering practice, a profile curve analyzer can be conveniently used to measure two-dimensional profile curves on the surface of structural surfaces, and then the roughness of the structural surface can be evaluated based on the measured two-dimensional profile lines. However, the following shortcomings still exist when using a profile curve analyzer to measure and evaluate the roughness of structural surfaces:

[0003] (1) The surface morphology of the structured surface has three-dimensional features. Given the dimensional difference between two-dimensional roughness and three-dimensional roughness, it remains controversial whether the three-dimensional roughness of the structured surface can be accurately evaluated using a single or multiple two-dimensional contour lines.

[0004] (2) When using two-dimensional profiles to evaluate the roughness of structural surfaces, some geometric features located within the profile interval may be ignored. Previous studies have typically used sampling intervals of 0.1 mm to 15 mm to measure the profile. Although studies have verified the influence of the profile sampling interval on the roughness evaluation results, there are still inconsistent results regarding the optimal profile sampling interval.

[0005] (3) Although reducing the sampling interval of two-dimensional contour lines can improve the accuracy of structural surface roughness evaluation, measuring too many contour lines is time-consuming and labor-intensive, which is not conducive to engineering practice. The research of Du Shigui et al. shows that structural surface roughness is non-uniform and there are significant differences in different locations. In most cases, it is impossible to obtain reliable prior statistical information about structural surface roughness. In fact, the statistical information of structural surface roughness can only be gradually revealed during the roughness measurement process. However, it is still difficult to dynamically judge whether the measured contour lines are sufficient to reliably evaluate the roughness of the structural surface during the measurement process.

[0006] (4) Existing processing of two-dimensional roughness of contour lines (i.e., average roughness, maximum roughness, and weighted average roughness) has promoted the application of contour lines in evaluating the three-dimensional roughness of structural surfaces; however, different processing methods yield inconsistent results, which weakens the practicality of contour lines; this inconsistency may be because the dimensional difference between two-dimensional contour lines and three-dimensional structural surface morphology cannot be eliminated by simply increasing the number of contour lines; therefore, how to effectively use contour lines to evaluate the three-dimensional roughness of structural surfaces requires further research.

[0007] (5) Existing profile curve instruments cannot quantitatively control the spacing between profile lines during the two-dimensional profile measurement process, which affects the accuracy of the surface roughness evaluation results.

[0008] Two-dimensional profile lines of structural surfaces are widely used in engineering practice for evaluating surface roughness due to their ease of acquisition and measurement. While profile lines have been successfully applied to measure two-dimensional surface roughness, their use in measuring three-dimensional surface roughness still faces challenges, including difficulty in accurately determining the sampling interval, lack of quantitative indicators for the number of measurements, and the inability to eliminate dimensional differences between two-dimensional profile lines and three-dimensional surface morphology. Furthermore, existing profile curve measuring devices can only measure single profile lines and cannot measure profile lines with a given spacing. Therefore, when using two-dimensional profile lines to evaluate the three-dimensional roughness of structural surfaces, the reliability of the evaluation results is insufficient, directly affecting the accuracy of the evaluation results for the mechanical and hydraulic properties of the structural surfaces. Summary of the Invention

[0009] To overcome the problems of difficulty in accurately determining the sampling interval, lack of quantitative indicators for the number of measurements, and inability to eliminate the dimensional differences between the two-dimensional contour lines and the three-dimensional structural surface morphology in existing technologies for evaluating the three-dimensional roughness of structural surfaces using two-dimensional contour lines, as well as the problem that existing contour curve measuring devices can only measure single contour lines and cannot measure contour lines with a given spacing, this invention provides a method and device for measuring the three-dimensional roughness of structural surfaces based on contour line bands. This method uses contour line bands composed of adjacent contour lines instead of single contour lines to characterize the three-dimensional local morphology of the structural surface. It proposes the optimal width of the contour line band for structural surfaces of different sizes, and dynamically determines whether the measured contour line band is sufficient to reliably evaluate the three-dimensional roughness of the structural surface during the measurement process. The measuring device has a clear principle, is simple to operate, and can measure contour lines with a given spacing, which can effectively promote the engineering application of two-dimensional contour lines in the evaluation of the three-dimensional roughness of structural surfaces.

[0010] The technical solution adopted by this invention to solve its technical problem is:

[0011] A method for measuring the three-dimensional roughness of a structural surface based on contour lines, the method comprising the following steps:

[0012] S1. Select the outcrop of the structural surface, investigate the shear direction of the structural surface or the seepage direction of the crack, and determine the measurement direction of the three-dimensional roughness.

[0013] S2. Measure the dimensions of the structural surface and determine the optimal width of the contour line band according to the size of the structural surface; the contour line band is composed of two adjacent contour lines, and its width is equal to the distance between the two adjacent contour lines.

[0014] S3. Based on the measurement direction and the optimal width of the contour line band, the contour line band is measured on the surface of the structural surface using a contour line band measuring device.

[0015] S4. Select the three-dimensional average dip angle θ of the structural plane. s Root mean square Z of the three-dimensional slope of the structural surface 2s and the structural surface area projection ratio R s As the basic index of three-dimensional roughness of the contour line band, θ is expressed according to the following formulas (1) to (3). s Z 2s and R s Perform the calculation and calculate the measurement error of the three-dimensional roughness of the structure surface according to the following formula (4);

[0016]

[0017]

[0018]

[0019]

[0020] Among them, M x M y Let α be the number of sampling points uniformly distributed along the X and Y axes, respectively. i Let A be the angle of inclination of the outward normal vector of the i-th triangular element, i.e., the angle between the outward normal of the triangular plane and the Z-axis. t A is the actual area of ​​the structural surface. n Let a be the projected area of ​​the structural surface on the XY plane. i Let be the area of ​​the i-th triangular unit, SI be the sampling interval of the point cloud, δ be the measurement error of the three-dimensional roughness of the structural surface, s be the standard deviation of the basic three-dimensional roughness index of the contour line band, μ be the mean of the basic three-dimensional roughness index of the contour line band, n be the number of measurements of the contour line band, and β be the confidence level. Let be the upper quantile of the t-distribution with n-1 degrees of freedom;

[0021] S5. During the measurement of the contour line band, dynamically update the measurement error δ of the three-dimensional roughness of the structural surface until the measurement error δ of the three-dimensional roughness of the structural surface meets the engineering requirements.

[0022] S6. Using a sampling interval consistent with the point spacing required in the calculation formula of the three-dimensional roughness parameters of the structural surface to be calculated, the measured contour line band is triangulated, and the three-dimensional roughness of the structural surface is evaluated based on the triangulated model of the contour line band.

[0023] Furthermore, in step S3, the specific content of measuring the contour line band on the surface of the structure using the contour line band measuring device is as follows: firstly, the first contour line of the contour line band is drawn along the measurement direction using the contour line band measuring device; then, the position of the recording pen is adjusted to the optimal width of the contour line band, and the position of the probe is adjusted to ensure that the drawn contour lines do not overlap; subsequently, the second contour line of the contour line band is drawn.

[0024] Furthermore, in step S2, the dimensions of the structural surface are measured. When the structural surface dimension is less than or equal to 300mm, the optimal width of the contour line is 3mm. When the structural surface dimension is greater than 300mm, the optimal width of the contour line is 5mm.

[0025] A measuring device for implementing the three-dimensional roughness measurement method of the structure surface based on the contour line band, the measuring device includes a recording unit, a measuring unit and a connecting carrier, the recording unit is horizontally installed on the upper part of the connecting carrier and the measuring unit is vertically installed on the lower part of the connecting carrier;

[0026] The recording unit includes a horizontal adjustment module and a recording pen. The horizontal adjustment module includes a horizontal adjustment module core and a horizontal adjustment module shell. The horizontal adjustment module core is provided with a pen slot and a scale. The horizontal adjustment module shell is provided with a fixed pointer. The recording pen is horizontally installed in the pen slot of the horizontal adjustment module core.

[0027] The measuring unit includes a vertical adjustment module and a probe. The vertical adjustment module includes a vertical adjustment module core and a vertical adjustment module shell. The vertical adjustment module core is provided with a probe slot and a scale. The vertical adjustment module shell is provided with a fixed pointer. The probe is vertically installed in the probe slot of the vertical adjustment module core.

[0028] The upper and lower parts of the connecting carrier are respectively provided with a horizontal slot and a vertical slot. The size of the horizontal slot is the same as the size of the recording unit, and the size of the vertical slot is the same as the size of the measuring unit.

[0029] Furthermore, the core of the horizontal adjustment module includes a connecting rod, gears, a keyed connecting rod, a stabilizing gear, and a gear rack. Two gears are connected to each end of the connecting rod to form a gear-tooth structure, which is movably connected to the gear rack located at the top of the horizontal adjustment module core. The keyed connecting rod is equipped with a knob, a key, and a displacement restraint. The stabilizing gear has a key with a grooved structure. Two stabilizing gears are connected in the middle of the keyed connecting rod to form a gear-tooth structure, which is movably connected to the gear rack located at the bottom of the horizontal adjustment module core. The key and stabilizing gears are staggered, and the distance between the two stabilizing gears is the same as the distance between the two gears at the top of the horizontal adjustment module core. The size of the stabilizing gear is the same as the size of the gear.

[0030] Furthermore, the horizontal adjustment module housing includes a baffle and a gear rack, with the gear rack located at the top and bottom of the horizontal adjustment module housing, and the baffle located on both sides of the gear rack.

[0031] Furthermore, the core of the horizontal adjustment module and the outer shell of the horizontal adjustment module are movably connected by a gear rack and rod tooth structure.

[0032] Preferably, the structure of the vertical adjustment module core and the vertical adjustment module housing is the same as that of the horizontal adjustment module core and the horizontal adjustment module housing.

[0033] Compared with existing technologies, the beneficial effects of this invention are mainly reflected in the following aspects: Using contour line bands composed of adjacent contour lines instead of single contour lines to characterize the three-dimensional local morphology of the structural surface can effectively eliminate the dimensional differences between two-dimensional contour lines and the three-dimensional morphology of the structural surface; employing different optimal widths of contour line bands for structural surfaces of different sizes can significantly reduce measurement time while ensuring the accuracy of three-dimensional roughness measurement; dynamically updating the measurement error of the three-dimensional roughness of the structural surface during the measurement process until the measurement error meets engineering requirements can provide a quantitative indicator for the number of contour line bands required for three-dimensional roughness evaluation of the structural surface, avoiding resource waste while accurately evaluating the three-dimensional roughness of the structural surface; providing a measurement device suitable for measuring contour line bands, employing a new structural surface morphology measurement strategy between two-dimensional and three-dimensional measurement, achieving higher roughness evaluation accuracy than two-dimensional structural surface morphology measurement, and saving costs compared to three-dimensional structural surface morphology measurement; the device has a simple structure, small size, and is easy to carry, can quantitatively adjust the contour line measurement spacing, and is unaffected by the measurement environment, making it suitable for batch surveys of structural surfaces in the field, and effectively promoting the engineering application of two-dimensional contour lines in the three-dimensional roughness evaluation of structural surfaces. Attached Figure Description

[0034] Figure 1 The influence of the width of the contour line band on the evaluation of three-dimensional roughness;

[0035] Figure 2 These are the local triangular units and contour lines extracted from the structural surface triangulation model, where (a) is the structural surface triangulation model, (b) is the local triangular unit, and (c) is the contour line.

[0036] Figure 3 This is a schematic diagram of a measuring device used for measuring contour lines;

[0037] Figure 4 This is a structural schematic diagram of a contour line measuring device, where (a) is the recording unit, (b) is the measuring unit, and (c) is the connecting carrier;

[0038] Figure 5This is a schematic diagram of the horizontal adjustment module, where (a) is the core of the horizontal adjustment module, (b) is the outer shell of the horizontal adjustment module, (c) is a right view of the core of the horizontal adjustment module, and (d) is a right view of the outer shell of the horizontal adjustment module.

[0039] Figure 6 This is a schematic diagram of a rod-tooth structure consisting of a keyed connecting rod and a stabilizing gear;

[0040] Figure 7 This is a schematic diagram of the stabilizing gear;

[0041] Figure 8 This is the right view of the recording unit;

[0042] Figure 9 This is the location of the outline band. The image only shows one outline on the left side of the outline band, and the width of the outline band is 3mm.

[0043] Figure 10 This is a schematic diagram of a measuring device used for measuring contour lines;

[0044] Among them, 1-connecting carrier, 2-recording pen, 3-pen slot, 4-scale, 5-fixed pointer, 6-probe, 7-probe slot, 8-gear, 9-gear rack, 10-knob, 11-baffle, 12-connecting rod, 13-connecting rod with key, 14-stabilizing gear, 15-key position, 16-key, 17-displacement restraint, 18-structural surface protrusion, 19-survey board. Detailed Implementation

[0045] The invention will now be further described with reference to the accompanying drawings.

[0046] Reference Figures 1-10 A method for measuring the three-dimensional roughness of a structural surface based on contour lines, the method comprising the following steps:

[0047] S1. Select the outcrop of the structural surface, investigate the shear direction of the structural surface or the seepage direction of the crack, and determine the measurement direction of the three-dimensional roughness.

[0048] Specifically, the measurement direction of three-dimensional roughness is consistent with the shear direction of the structural surface or the seepage direction of the crack;

[0049] S2. Measure the dimensions of the structural surface. When the structural surface dimension is less than or equal to 300mm, the optimal width of the contour line strip is 3mm. When the structural surface dimension is greater than 300mm, the optimal width of the contour line strip is 5mm. The contour line strip is composed of two adjacent contour lines, and its width is equal to the distance between the two adjacent contour lines.

[0050] Specifically, five contour strip widths (1mm, 2mm, 3mm, 4mm, and 5mm) were used to study the influence of contour strip width on the accuracy of three-dimensional roughness evaluation of structural surfaces. Under the condition that the measurement error δ of the three-dimensional roughness of the structural surface was set to 5% and the confidence level β was set to 95%, 30 random sampling tests were conducted for each width of the contour strip. After the measurement, the measurement error of the three-dimensional roughness of the structural surface obtained for each contour strip width was calculated. Figure 1 As shown in the figure, the average sampling rate of structural surfaces of different sizes decreases with the increase of the width of the contour strip, indicating that increasing the width of the contour strip can effectively reduce the measurement time. The figure also shows that the measurement error of the three-dimensional roughness of the structural surface decreases with the increase of the structural surface size, but increases with the increase of the width of the contour strip. When the structural surface size is greater than 300 mm, the basic three-dimensional roughness index, the three-dimensional average tilt angle (θ) of the structural surface... s ), Root mean square of three-dimensional slope of structural surface (Z) 2s ) and the structural surface area projection ratio (R s The measurement error of Zn is less than 5% under all contour line width conditions; however, when the structural surface size is less than or equal to 300 mm, the basic three-dimensional roughness index Zn is higher. 2s The measurement error is greater than 5% when the width of the contour line is 5mm; therefore, for structural surfaces with a size less than or equal to 300mm, a contour line width of 3mm is recommended as the optimal width, and for structural surfaces with a size greater than 300mm, a contour line width of 5mm is recommended as the optimal width.

[0051] S3. Based on the measurement direction and the optimal width of the contour line band, the contour line band is measured on the surface of the structural surface using a contour line band measuring device.

[0052] Specifically, high-precision scanners and image processing technology can be used to digitize the measured contour lines;

[0053] S4. Select the three-dimensional average dip angle θ of the structural plane. s Root mean square Z of the three-dimensional slope of the structural surface 2s and the structural surface area projection ratio R s As the basic index of three-dimensional roughness of the contour line band, θ is expressed according to the following formulas (1) to (3). s Z 2s and R s Perform the calculation and calculate the measurement error of the three-dimensional roughness of the structure surface according to the following formula (4);

[0054]

[0055]

[0056]

[0057]

[0058] Among them, M x M y Let α be the number of sampling points uniformly distributed along the X and Y axes, respectively. i Let A be the inclination angle of the outward normal vector of the i-th triangular element (i.e., the angle between the outward normal vector of the triangular plane and the Z-axis). t A is the actual area of ​​the structural surface. n Let a be the projected area of ​​the structural surface on the XY plane. i Let be the area of ​​the i-th triangular unit, SI be the sampling interval of the point cloud, δ be the measurement error of the three-dimensional roughness of the structural surface, s be the standard deviation of the basic three-dimensional roughness index of the contour line band, μ be the mean of the basic three-dimensional roughness index of the contour line band, n be the number of measurements of the contour line band, and β be the confidence level. Let be the upper quantile of the t-distribution with n-1 degrees of freedom;

[0059] Specifically, the basic index of three-dimensional roughness θ s Z 2s and R s These three-dimensional roughness indices can respectively reflect the average tilt angle characteristics, local tilt angle characteristics, and size characteristics of surface protrusions on the structural surface. The tilt degree and size of the protrusions on the structural surface are the basic roughness factors affecting the mechanical and hydraulic performance of the structural surface. Therefore, the selected three-dimensional roughness basic indices are sufficient to quantify the three-dimensional roughness of the structural surface. In addition, to further improve the evaluation accuracy of the three-dimensional roughness of the structural surface, more three-dimensional roughness parameters (such as undulation height parameters) can be included in the three-dimensional roughness basic indices.

[0060] In engineering practice, the confidence level β can be set to 95%, and the upper quantile of the t-distribution with n-1 degrees of freedom can be used. The value can be obtained by looking up a table or by calculation based on the number of contour lines being measured;

[0061] S5. During the measurement of the contour line band, dynamically update the measurement error δ of the three-dimensional roughness of the structural surface until the measurement error δ of the three-dimensional roughness of the structural surface meets the engineering requirements.

[0062] Specifically, due to the variability of the standard deviation s and mean μ of the three-dimensional roughness index of the contour line band, the measurement error δ of the three-dimensional roughness of the structural surface will dynamically change during the measurement process. When the measurement error δ of the three-dimensional roughness of the structural surface does not meet the engineering requirements, the contour line band measuring device is used to continue measuring the contour line band on the surface of the structural surface until the measurement error δ of the three-dimensional roughness of the structural surface meets the engineering requirements. Usually, the allowable measurement error of the three-dimensional roughness of the structural surface in the engineering can be set to 5%. When the measurement error δ of the three-dimensional roughness of the structural surface is less than or equal to 5%, the measurement of the contour line band can be stopped.

[0063] S6. Using a sampling interval consistent with the point spacing required in the calculation formula of the three-dimensional roughness parameters of the structural surface to be calculated, the measured contour line band is triangulated, and the three-dimensional roughness of the structural surface is evaluated based on the triangulated model of the contour line band.

[0064] Specifically, the point cloud data of the contour line band can be regularized so that the point cloud spacing of the established triangular contour line band model is consistent with the point spacing required in the calculation formula of the three-dimensional roughness parameters.

[0065] The surface morphology of structural surfaces is typically constructed on the measured point cloud using triangulation methods. The Delaunay triangulation algorithm can be used to triangulate the measured contour lines. Through triangulation, the surface morphology of the structural surface can be discretized into a finite number of triangles, such as... Figure 2 As shown in (a); this method is widely used to characterize the geometric features of structured surfaces and has significant advantages in evaluating the three-dimensional roughness of structured surfaces; when evaluating the three-dimensional roughness of structured surfaces, the geometric features of the structured surface can be conveniently characterized by the inclination angle and area of ​​the triangular elements on its triangular surface model; two local triangular elements extracted from the triangular model of the structured surface are shown in (a). Figure 2 As shown in (b), the figure illustrates that the geometric features of two local triangular units T1 and T2 are controlled by two adjacent two-dimensional contour lines P1 and P2; however, the sloping direction of the contour lines is inconsistent with the inclination of the triangular units, and therefore the sloping angle of the contour lines is different from that of the triangular units. These observations confirm that a single contour line cannot accurately reflect the three-dimensional morphological features of the structural surface; in contrast, the local three-dimensional morphological features of the structural surface can be accurately characterized by the combined morphology of two adjacent two-dimensional contour lines, which is called a contour line band, such as... Figure 2As shown in (c), the width of the contour line band is equal to the distance between its two adjacent two-dimensional contour lines. Generally, the three-dimensional morphology of the structure surface can be decomposed into a series of contour line bands, the number of which depends on the width of the contour line bands. Therefore, the roughness of multiple contour line bands can potentially be used to approximate the three-dimensional roughness of the entire surface of the structure surface.

[0066] Preferably, in step S3, the specific content of measuring the contour line band on the surface of the structure using the contour line band measuring device is as follows: first, the first contour line of the contour line band is drawn along the measurement direction using the contour line band measuring device; then, the position of the recording pen is adjusted to the optimal width of the contour line band, and the position of the probe is adjusted to ensure that the drawn contour lines do not overlap; then, the second contour line of the contour line band is drawn.

[0067] This embodiment also provides a measuring device for implementing the aforementioned method for measuring the three-dimensional roughness of structural surfaces based on contour lines, such as... Figure 3 and Figure 4 As shown, the measuring device includes a recording unit, a measuring unit, and a connecting carrier 1. The recording unit is horizontally mounted on the upper part of the connecting carrier 1, and the measuring unit is vertically mounted on the lower part of the connecting carrier 1.

[0068] Furthermore, such as Figure 4 and Figure 5 As shown, the recording unit includes a horizontal adjustment module and a recording pen 2. The horizontal adjustment module includes a horizontal adjustment module core and a horizontal adjustment module shell. The horizontal adjustment module core is provided with a pen slot 3 and a scale 4. The horizontal adjustment module shell is provided with a fixed pointer 5. The recording pen 2 is horizontally installed in the pen slot 3 of the horizontal adjustment module core.

[0069] like Figure 4 As shown, the measuring unit includes a vertical adjustment module and a probe 6. The vertical adjustment module includes a vertical adjustment module core and a vertical adjustment module shell. The vertical adjustment module core is provided with a probe slot 7 and a scale 4. The vertical adjustment module shell is provided with a fixed pointer 5. The probe 6 is vertically installed in the probe slot 7 of the vertical adjustment module core.

[0070] like Figure 4 As shown, the upper and lower parts of the connecting carrier are respectively provided with a horizontal slot and a vertical slot. The size of the horizontal slot is the same as the size of the recording unit, and the size of the vertical slot is the same as the size of the measuring unit.

[0071] like Figure 4 , Figure 5 , Figure 6 and Figure 7As shown, the core of the horizontal adjustment module includes a connecting rod 12, a gear 8, a keyed connecting rod 13, a stabilizing gear 14, and a gear rack 9. The two ends of the connecting rod 12 are respectively connected to two gears 8 to form a gear tooth structure, which is movably connected to the gear rack 9 located at the top of the horizontal adjustment module core. The keyed connecting rod 13 is respectively provided with a knob 10, a key 16, and a displacement restraint 17. The stabilizing gear 14 is provided with a key position 15 with a groove structure. The keyed connecting rod 13 is connected to two stabilizing gears 14 in the middle to form a gear tooth structure, which is movably connected to the gear rack 9 located at the bottom of the horizontal adjustment module core. The key 16 and the stabilizing gear 14 are staggered. The distance between the two stabilizing gears 14 is the same as the distance between the two gears 8 at the top of the horizontal adjustment module core. The size of the stabilizing gear 14 is the same as the size of the gear 8.

[0072] Specifically, during the adjustment, the knob 10 is first pushed inward to position the key 16 in the key position 15. Rotating the knob 10 allows the horizontal adjustment module to operate normally. Rotating the knob 10 generates torque that drives the keyed connecting rod 13 to rotate, allowing the stabilizing gear 14 to roll on the gear rack 9. This gear 14 then engages with the connecting rod 12, gear 8, and gear rack 9 at the top of the horizontal adjustment module core, enabling the horizontal adjustment module core to adjust its distance. After adjustment, the knob 10 is pulled outward to disengage the key 16 from the key position 15. Since the diameter of the keyed connecting rod 13 is smaller than the diameter of the hole in the stabilizing gear 14, even if the keyed connecting rod 13 is subjected to force, it will not affect the stability of the horizontal adjustment module due to free rotation within the hole of the stabilizing gear 14. This ensures the stability of the horizontal adjustment module. The presence of the displacement restraint 17 limits the displacement of the keyed connecting rod 13, preventing it from detaching from the entire device, thus ensuring the overall integrity of the device.

[0073] like Figure 5 As shown, the housing of the horizontal adjustment module includes a baffle 11 and a gear rack 9. The gear rack 9 is located at the top and bottom of the housing of the horizontal adjustment module, and the baffle 11 is located on both sides of the head and tail of the gear rack 9.

[0074] Specifically, the presence of baffle 11 can limit the displacement of gears 8 and stabilizing gear 14 at the top and bottom of the horizontal adjustment module core on the gear rack 9, thereby preventing excessive displacement from causing the horizontal adjustment module core to detach from the horizontal adjustment module shell and ensuring the integrity of the entire device.

[0075] like Figure 5 and Figure 8 As shown, the core of the horizontal adjustment module and the outer shell of the horizontal adjustment module are movably connected by a gear rack 9 and a rod tooth structure.

[0076] like Figure 4 As shown, the structure of the vertical adjustment module core and the vertical adjustment module shell is the same as that of the horizontal adjustment module core and the horizontal adjustment module shell.

[0077] Example: A method for evaluating the three-dimensional roughness of structural surfaces based on contour lines, comprising the following steps:

[0078] First, a sandstone outcrop of a structural surface was selected in the Majiagou landslide area of ​​Guizhou Town, Zigui County, Yichang City, Hubei Province. The three-dimensional roughness was measured in the shear direction of the structural surface. The size of the structural surface is about 100 mm, so the optimal width of the contour line band is 3 mm.

[0079] Then, based on the measurement direction and the optimal width of the contour line band, the contour line band is measured on the surface of the structural surface using the contour line band measuring device provided by the present invention, and the measured contour line band is digitized using a high-precision scanner and image processing technology; the three-dimensional roughness basic index of the structural surface three-dimensional average tilt angle (θ) is calculated according to formulas (1) to (3). s ), Root mean square of three-dimensional slope of structural surface (Z) 2s ) and the structural surface area projection ratio (R s The calculation is performed with a confidence level β set to 95%. The measurement error δ of the three-dimensional roughness of the structural surface is calculated according to formula (4). The measurement error δ of the three-dimensional roughness of the structural surface is dynamically updated during the measurement of the contour line band until the measurement error δ of the three-dimensional roughness of the structural surface is less than or equal to 5%, at which point the measurement of the contour line band is stopped. The final measured position of the contour line band is as follows: Figure 9 As shown;

[0080] Specifically, such as Figure 10 As shown, the process of measuring the contour line band on the surface of a structure using the contour line band measuring device provided by this invention is as follows: Push the knobs 10 of the horizontal and vertical adjustment modules inwards; rotate the knobs 10 until the fixed pointer 5 points to the zero mark of the scale 4; then pull the knobs 10 outwards; place the recording pen 2 in contact with the surveying board 19, and the probe 6 in contact with the exposed part 18 of the structure surface; move the measuring device along the measurement direction to measure the first contour line; after measuring the first contour line, push the horizontal and vertical adjustment modules inwards... Rotate knob 10 to move the recording pen 2 horizontally by 3mm and the probe 6 vertically by 5mm, ensuring that the distance between the second contour line and the first contour line is equal to the optimal width of the contour line band, and that the contour lines recorded by the surveying board 19 do not overlap. After the distance adjustment is completed, pull knob 10 outward to measure the second contour line, thus completing the measurement of one contour line band. Repeat the above process to complete the measurement of all contour line bands. After the measurement is completed, reset the scales of the horizontal distance adjustment module and the vertical distance adjustment module to zero.

[0081] Finally, the measured contour line bands were triangulated using the Delaunay triangulation algorithm; the triangulated model of the contour line bands, established with a sampling interval of 0.5 mm, was used to evaluate the three-dimensional roughness of the structural surface.

[0082] The root mean square Z of the three-dimensional slope of the structural surface is calculated based on the established contour line triangulation model. 2s Then, the three-dimensional joint roughness coefficient JRC is calculated according to the formula (5) proposed by Mo and Li. The calculation result is 11.1. The true value of the three-dimensional JRC of the structure surface is 11.8 based on the direct shear test. The relative error between the three-dimensional roughness evaluation result of the structure surface based on the contour line band and the true value is only -5.9%, indicating that the present invention can conveniently and accurately evaluate the three-dimensional roughness of the structure surface.

[0083]

[0084] The embodiments described in this specification are merely examples of implementations of the inventive concept and are for illustrative purposes only. The scope of protection of this invention should not be considered limited to the specific forms described in these embodiments; rather, it extends to equivalent technical means conceived by those skilled in the art based on the inventive concept.

Claims

1. A method for measuring the three-dimensional roughness of a structural surface based on contour lines, characterized in that, The method includes the following steps: S1. Select the outcrop of the structural surface, investigate the shear direction of the structural surface or the seepage direction of the crack, and determine the measurement direction of the three-dimensional roughness. S2. Measure the dimensions of the structural surface and determine the optimal width of the contour line band according to the size of the structural surface; the contour line band is composed of two adjacent contour lines, and its width is equal to the distance between the two adjacent contour lines. S3. Based on the measurement direction and the optimal width of the contour line band, the contour line band is measured on the surface of the structural surface using a contour line band measuring device. S4. Select the three-dimensional average dip angle θ of the structural plane. s Root mean square Z of the three-dimensional slope of the structural surface 2s and the structural surface area projection ratio R s As the basic index of three-dimensional roughness of the contour line band, θ is expressed according to the following formulas (1) to (3). s Z 2s and R s The measurement error of the three-dimensional roughness of the structural surface is calculated according to the following formula (4); Among them, M x M y Let α be the number of sampling points uniformly distributed along the X and Y axes, respectively. i Let A be the angle of inclination of the outward normal vector of the i-th triangular element, i.e., the angle between the outward normal of the triangular plane and the Z-axis. t A is the actual area of ​​the structural surface. n Let a be the projected area of ​​the structural surface on the XY plane. i Let be the area of ​​the i-th triangular unit, SI be the sampling interval of the point cloud, δ be the measurement error of the three-dimensional roughness of the structural surface, s be the standard deviation of the basic three-dimensional roughness index of the contour line band, μ be the mean of the basic three-dimensional roughness index of the contour line band, n be the number of measurements of the contour line band, and β be the confidence level. Let be the upper quantile of the t-distribution with n-1 degrees of freedom; S5. During the measurement of the contour line band, dynamically update the measurement error δ of the three-dimensional roughness of the structural surface until the measurement error δ of the three-dimensional roughness of the structural surface meets the engineering requirements. S6. Using a sampling interval consistent with the point spacing required in the calculation formula of the three-dimensional roughness parameters to be calculated, the measured contour line band is triangulated, and the three-dimensional roughness of the structural surface is evaluated based on the triangulated model of the contour line band.

2. The method for measuring the three-dimensional roughness of a structural surface based on contour lines as described in claim 1, characterized in that, In step S3, the specific content of measuring the contour line band on the surface of the structure using the contour line band measuring device is as follows: First, the first contour line of the contour line band is drawn along the measurement direction using the contour line band measuring device. Then, the position of the recording pen is adjusted to the optimal width of the contour line band, and the position of the probe is adjusted to ensure that the drawn contour lines do not overlap. Subsequently, the second contour line of the contour line band is drawn.

3. The method for measuring the three-dimensional roughness of a structural surface based on contour lines as described in claim 1 or 2, characterized in that, In step S2, the dimensions of the structural surface are measured. When the structural surface dimension is less than or equal to 300mm, the optimal width of the contour line is 3mm. When the structural surface dimension is greater than 300mm, the optimal width of the contour line is 5mm.

4. A measuring device for implementing the three-dimensional roughness measurement method of structural surfaces based on contour lines as described in claim 1, characterized in that, The measuring device includes a recording unit, a measuring unit, and a connecting carrier. The recording unit is horizontally mounted on the upper part of the connecting carrier, and the measuring unit is vertically mounted on the lower part of the connecting carrier. The recording unit includes a horizontal adjustment module and a recording pen. The horizontal adjustment module includes a horizontal adjustment module core and a horizontal adjustment module shell. The horizontal adjustment module core is provided with a pen slot and a scale. The horizontal adjustment module shell is provided with a fixed pointer. The recording pen is horizontally installed in the pen slot of the horizontal adjustment module core. The measuring unit includes a vertical adjustment module and a probe. The vertical adjustment module includes a vertical adjustment module core and a vertical adjustment module shell. The vertical adjustment module core is provided with a probe slot and a scale. The vertical adjustment module shell is provided with a fixed pointer. The probe is vertically installed in the probe slot of the vertical adjustment module core. The upper and lower parts of the connecting carrier are respectively provided with a horizontal slot and a vertical slot. The size of the horizontal slot is the same as the size of the recording unit, and the size of the vertical slot is the same as the size of the measuring unit.

5. The measuring device as described in claim 4, characterized in that, The core of the horizontal adjustment module includes a connecting rod, gears, a keyed connecting rod, a stabilizing gear, and a gear rack. Two gears are connected to each end of the connecting rod to form a gear-tooth structure, which is movably connected to the gear rack located at the top of the horizontal adjustment module core. The keyed connecting rod is equipped with a knob, a key, and a displacement restraint. The stabilizing gear has a key with a grooved structure. Two stabilizing gears are connected in the middle of the keyed connecting rod to form a gear-tooth structure, which is movably connected to the gear rack located at the bottom of the horizontal adjustment module core. The key and stabilizing gears are staggered. The distance between the two stabilizing gears is the same as the distance between the two gears at the top of the horizontal adjustment module core. The size of the stabilizing gear is the same as the size of the gear.

6. The measuring device as described in claim 4 or 5, characterized in that, The horizontal adjustment module housing includes a baffle and a gear rack, with the gear rack located at the top and bottom of the horizontal adjustment module housing and the baffle located on both sides of the gear rack.

7. The measuring device as described in claim 4 or 5, characterized in that, The core and outer shell of the horizontal adjustment module are movably connected by a gear rack and tooth structure.

8. The measuring device as described in claim 4 or 5, characterized in that, The structure of the vertical pitch adjustment module core and the vertical pitch adjustment module shell is the same as that of the horizontal pitch adjustment module core and the horizontal pitch adjustment module shell.

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