A method, device and storage medium for testing single crystal superalloy primary orientation

Abstract

The application discloses a single-crystal high-temperature alloy primary orientation test method, device and storage medium, which is used for improving the stability, reducing the relative error, increasing the alloy quantity of primary test and improving the test efficiency. The test method disclosed by the application comprises the following steps: testing the primary orientation of an alloy to obtain a Laue diffraction spot spectrum; calibrating the Laue diffraction spot spectrum, and determining a conversion matrix of a test reference coordinate system and a sample coordinate system according to a calibration result; and determining a primary orientation deviation according to the conversion matrix. The application further provides a single-crystal high-temperature alloy primary orientation test device and a storage medium.

Description

Technical Field

[0001] This application relates to the field of single-crystal superalloy turbine blade manufacturing technology, and in particular to a testing method, apparatus and storage medium for primary orientation of single-crystal superalloys. Background Technology

[0002] Aero-engine turbine blades operate in high-temperature, complex-stress, and extremely harsh environments. As one of the key components of an aero-engine, their quality and performance significantly impact engine performance. A key characteristic of single crystals is their anisotropy. Single-crystal superalloys, due to their lower elastic modulus, exhibit optimal overall mechanical properties. Therefore, in the fabrication of single-crystal blades, the deviation of the blade's orientation from the blade's stacking axis must be strictly controlled within a certain angular range to ensure optimal mechanical properties. Correspondingly, the primary orientation of the blade and test specimen must be strictly controlled during blade development and production.

[0003] In existing technologies, methods for testing the orientation of single-crystal superalloys include Laue diffraction. Regarding the required placement of the equipment, there are two commonly used Laue diffraction devices: one is horizontal, where the axis of the sample being tested lies flat on the sample stage, and the plane formed by the X-ray and detector axes is horizontal; the equipment detects the deviation of the alloy orientation along the axial direction. The other is vertical, where the axis of the sample being tested is vertical, and the plane formed by the X-ray and detector axes is perpendicular to the horizontal plane.

[0004] Testing the primary orientation of blades or test specimens using a vertical Laue diffraction apparatus typically requires the blades or test specimens to be placed vertically, i.e., upright. However, since the dimensions of blades or test specimens along the axial direction are usually significantly larger than their dimensions perpendicular to the axial direction, stability is poor when placed vertically. Compared to the large longitudinal projected area of ​​the blade, the positioning area is small when using end-positioning, resulting in a larger relative error. Furthermore, due to the large longitudinal projected area of ​​the blade, most of the six positioning points for the blade are located within the longitudinal projected area, making accurate positioning difficult when placed vertically. Testing the primary orientation of single-crystal blades using a horizontal Laue diffraction apparatus typically requires the blades or test specimens to be placed horizontally. However, because the blades or test specimens are placed linearly on the sample platform during testing, the number that can be clamped at one time is limited.

[0005] In summary, how to increase the number of alloys tested in a single test while improving stability and reducing relative error is an urgent technical problem to be solved in the existing technology. Summary of the Invention

[0006] To address the aforementioned technical problems, this application provides a testing method, apparatus, and storage medium for the primary orientation of single-crystal superalloys, which improves stability, reduces relative error, and increases the number of alloys that can be tested in a single test.

[0007] In a first aspect, the present invention provides a method for testing the primary orientation of a single-crystal superalloy, comprising:

[0008] The first orientation of the alloy was tested to obtain the Laue diffraction spot pattern;

[0009] The Laue diffraction spot pattern is calibrated, and the transformation matrix between the test reference coordinate system and the sample coordinate system is determined based on the calibration results;

[0010] The first orientation deviation is determined based on the transformation matrix.

[0011] Preferably, a vertical side-diffraction Laue diffraction device is used to test the primary orientation of a single crystal blade or test rod.

[0012] Preferably, the single-crystal blade or test rod lies flat on the testing platform.

[0013] Preferably, the calibration of the Laue diffraction spot pattern includes:

[0014] The calibration is performed according to a preset calibration rule, wherein the preset calibration rule includes setting calibration parameters that include at least two zone axes, and each of the at least two zone axes includes at least three diffraction spots.

[0015] Preferably, determining the transformation matrix between the test reference coordinate system and the sample coordinate system based on the calibration results includes:

[0016] The transformation matrix is:

[0017]

[0018] Among them, a 11 a 12 a 13 a 21 a 22 a 23 a 31 a 32 a 33 The specific numerical values ​​of the coordinates of the transformation matrix between the test reference coordinate system and the sample coordinate system.

[0019] Preferably, determining the first orientation deviation based on the transformation matrix includes:

[0020] The first orientation deviation is calculated using the following formula:

[0021] cos -1 (max(|a 11 |,|a 21 |,|a 31 |))

[0022] Wherein, the direction of the axis to be tested of the alloy is parallel to the X-axis of the sample coordinate system.

[0023] The step of determining the first orientation deviation based on the transformation matrix includes:

[0024] The first orientation deviation is calculated using the following formula:

[0025] cos -1 (max(|a 12 |,|a 22 |,|a 32 |))

[0026] The direction of the axis to be tested of the alloy is parallel to the Y-axis of the sample coordinate system.

[0027] Preferably, the number of the alloys to be tested is greater than or equal to 1 in a single automated test.

[0028] Secondly, the present invention also provides a testing device for the primary orientation of a single-crystal superalloy, comprising:

[0029] The testing module is configured to test the primary orientation of the alloy and obtain Laue diffraction spot patterns.

[0030] The transformation module is configured to calibrate the Laue diffraction spot pattern and determine the transformation matrix between the sample coordinate system and the test reference coordinate system based on the calibration results.

[0031] The calculation module is configured to determine a first orientation deviation based on the transformation matrix.

[0032] Thirdly, the present invention also provides a testing device for the primary orientation of a single-crystal superalloy, comprising: a memory, a processor, and a user interface;

[0033] The memory is used to store computer programs;

[0034] The user interface is used to interact with the user;

[0035] The processor is used to read the computer program in the memory, and when the processor executes the computer program, it implements the test method for primary orientation of single-crystal high-temperature alloy blades provided by the present invention.

[0036] Fourthly, the present invention also provides a processor-readable storage medium storing a computer program, wherein when the processor executes the computer program, it implements the test method for primary orientation of single-crystal high-temperature alloy blades provided by the present invention.

[0037] Using the method of this invention, a vertical side-diffraction Laue diffraction device is employed to indirectly test the primary orientation of single-crystal blades or test specimens. During the test, the blade or test specimen to be tested lies flat on a horizontal plane along its axial direction. The Laue diffraction pattern is obtained using the vertical side-diffraction Laue diffraction device. A transformation matrix between the test reference coordinate system and the sample coordinate system is obtained through computer processing. The primary orientation of the tested blade is indirectly obtained by calculating using this matrix. This allows multiple blades to be placed simultaneously, covering the entire sample plane, and facilitates accurate positioning relative to the blades. This invention combines the advantages of vertical diffraction equipment (allowing for a large number of blades to be clamped at once) and the ease of positioning flat blades, improving stability, reducing relative errors, increasing the number of alloys tested at once, and improving testing efficiency. Attached Figure Description

[0038] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0039] Figure 1 This is a schematic diagram of blade placement during testing using a vertical side-diffraction Laue diffraction device in the existing technology;

[0040] Figure 2 A schematic diagram of blade placement during testing using a vertical side-diffraction Laue diffraction device, provided for embodiments of this application;

[0041] Figure 3 A schematic diagram of a test method for primary orientation of a single-crystal superalloy provided in an embodiment of this application;

[0042] Figure 4 A schematic diagram of a testing device for primary orientation of a single-crystal superalloy provided in an embodiment of this application;

[0043] Figure 5 A schematic diagram of another test device for primary orientation of single-crystal high-temperature alloys provided in this application embodiment. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings. Obviously, the described embodiments are merely some embodiments of this invention, and not all embodiments. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0045] The following are explanations of some of the words that appear in the text:

[0046] 1. In the embodiments of this invention, the term "and / or" describes the relationship between associated objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, and B existing alone. The character " / " generally indicates that the preceding and following associated objects have an "or" relationship.

[0047] 2. In the embodiments of this application, the term "multiple" refers to two or more, and other quantifiers are similar;

[0048] 3. In the embodiments of this application, the term "N or more" means N or more. For example, three or more includes three and more than three.

[0049] like Figure 1 As shown, 1 is an X-ray generator, 2 is a two-dimensional surface detector, 3 is a testing platform, and 4 is the alloy to be tested, which can be a blade or a test rod. In existing technologies, when using a vertical Laue diffraction device to test the primary orientation of a blade or test rod, it is usually required that the blade or test rod be placed vertically, i.e., standing upright, meaning the alloy to be tested 4 is placed upright on the testing platform 3. The advantage of this method is that the device can clamp multiple blades or test rods at once, making full use of the entire two-dimensional plane of the platform, allowing dozens or even hundreds of blades or test rods to be placed simultaneously. However, since the dimensions of blades or test rods along the axial direction are usually significantly larger than their dimensions perpendicular to the axial direction, stability is poor when placed vertically. Compared to the large longitudinal projected area of ​​the blade or test rod, the positioning area is small when using end positioning, resulting in a larger relative error. Furthermore, because the longitudinal projected area of ​​the blade or test rod is large, most of the six positioning points for locating the blade or test rod are located within the longitudinal projected area, making accurate positioning difficult when placed vertically.

[0050] To address the aforementioned technical problems, this invention proposes a testing method for the primary orientation of single-crystal superalloys. It should be noted that, in the embodiments of this invention, the single-crystal superalloy to be tested can be a blade or a test bar.

[0051] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of this application.

[0052] It should be noted that the order in which the embodiments of this application are presented only represents the chronological order of the embodiments and does not represent the superiority or inferiority of the technical solutions provided by the embodiments.

[0053] Example 1

[0054] See Figure 2 The present application provides a schematic diagram of a test method for primary orientation of a single-crystal superalloy, as shown in the embodiment. Figure 2 As shown, the method includes steps S201 to S203:

[0055] S201. Test the primary orientation of the alloy to obtain the Laue diffraction spot pattern;

[0056] In this embodiment, a vertical side-diffraction Laue diffraction device is used to test the primary orientation of a single-crystal superalloy, for example, a vertical side-diffraction Laue diffraction device is used to test the primary orientation of a single-crystal superalloy blade or test rod.

[0057] As a preferred example, in an embodiment of the present invention, such as Figure 3 As shown, the single-crystal blade or test rod lies flat on the testing platform. Figure 3 In the diagram, 1 is an X-ray generator, 2 is a two-dimensional surface detector, 3 is a testing platform, and 4 is the alloy to be tested. The alloy to be tested 4 can be a blade or a mechanical property test bar. The alloy to be tested 4 lies flat on the testing platform 3.

[0058] It should be noted that, in this embodiment, "lying flat" means that the axis of the alloy to be tested is parallel to the test platform 3. For example, if the alloy to be tested is a mechanical property test bar, then the mechanical property test bar is placed horizontally on the test platform, which is considered "lying flat" on the test platform, meaning the axis of the test bar is parallel to the test platform. As another example, if the alloy to be tested is a blade, then the blade is placed horizontally on the test platform, which is considered "lying flat" on the test platform, meaning the axis of the blade is parallel to the test platform.

[0059] In this invention, a vertical side-diffraction Laue diffraction device is used to test the primary orientation of a single-crystal superalloy. The alloy lies flat on the testing platform, which facilitates the design and fabrication of positioning fixtures. The testing process is non-contact, with no load applied, and the blades do not need to be clamped; they simply lie flat on the fixture. The axis of the blade or test bar to be tested is parallel to the X-axis or Y-axis of the sample coordinate system, and the number of alloys to be tested is greater than or equal to one in a single automatic test. This allows for the simultaneous testing of multiple alloys, improving testing efficiency, or it can test only one alloy at a time.

[0060] S202. The Laue diffraction spot pattern is calibrated, and the transformation matrix between the test reference coordinate system and the sample coordinate system is determined based on the calibration results.

[0061] As a preferred example, the calibration of the Laue diffraction spot pattern can be performed by calibrating according to a preset calibration rule, wherein the preset calibration rule includes setting calibration parameters that include at least two zone axes, and each of the at least two zone axes includes at least three diffraction spots.

[0062] In this embodiment of the invention, since a vertical side-diffraction Laue diffraction device is used to test the primary orientation of the alloy, but the alloy to be tested is lying flat on the testing platform, the deviation of the primary orientation needs to be calculated separately.

[0063] As a preferred example, determining the transformation matrix between the test reference coordinate system and the sample coordinate system based on the calibration results includes:

[0064] The transformation matrix is:

[0065]

[0066] Among them, a 11 a 12 a 13 a 21 a 22 a 23 a 31 a 32 a 33 The specific numerical values ​​of the coordinates of the transformation matrix between the test reference coordinate system and the sample coordinate system.

[0067] It should be noted that the sample coordinate system specifically refers to a right-hand rule-compliant rectangular coordinate system that is parallel to the crystal coordinate axis of the single-crystal high-temperature alloy test sample facing a cubic crystal structure; the test reference coordinate system refers to the test reference coordinate system of the equipment.

[0068] S203. Determine the first orientation deviation based on the transformation matrix.

[0069] In this embodiment of the invention, the orientation deviation is determined based on the transformation matrix, and there are two cases:

[0070] The first scenario: The direction of the axis to be tested of the alloy is parallel to the X-axis of the sample coordinate system.

[0071] In this case, the first orientation deviation is calculated according to the following formula:

[0072] cos -1 (max(|a 11 |,|a 21 |,|a 31 |))

[0073] The second scenario: The direction of the axis to be tested of the alloy is parallel to the Y-axis of the sample coordinate system.

[0074] In this case, the first orientation deviation is calculated according to the following formula:

[0075] cos -1 (max(|a12 |,|a 22 |,|a 32 |))

[0076] Through the above detection and calculation, the first orientation deviation of the blade or test rod lying flat on the detection platform can be obtained.

[0077] In this embodiment of the invention, S201 to S203 described above can be described as follows:

[0078] First, based on the specific blade being measured, the blade support is designed and manufactured according to the six-point positioning of the blade. When the blade is correctly placed on the support, the axis of the blade is parallel to a specific horizontal straight line of the support.

[0079] When using a vertical side-diffraction Laue diffraction device to detect the orientation of a single crystal, place the support on the sample platform so that a specific horizontal line is parallel to the X-axis or Y-axis of the sample coordinate system.

[0080] Perform the test according to the equipment's operating procedures, calibrate the obtained Laue diffraction spot pattern, and use the calibration results to calculate or the equipment software to obtain the transformation matrix between the sample coordinate system and the crystal coordinate system:

[0081]

[0082] When the axis of the blade or test rod to be tested is parallel to the X-axis of the sample coordinate system, the formula for calculating the first orientation deviation of the blade or test rod is:

[0083] cos -1 (max(|a 11 |,|a 21 |,|a 31 |))

[0084] When the axis of the blade or test rod to be tested is parallel to the Y-axis of the sample coordinate system, the formula for calculating the first orientation deviation of the blade or test rod is:

[0085] cos -1 (max(|a 12 |,|a 22 |,|a 32 |))

[0086] Through the above detection and calculation, the first orientation deviation of the blade or test rod lying flat on the detection platform can be obtained.

[0087] Using the method of this invention, a vertical side-diffraction Laue diffraction device is employed to indirectly test the primary orientation of single-crystal blades or test specimens. During the test, the blade or test specimen to be tested lies flat on a horizontal plane along its axial direction. The Laue diffraction pattern is obtained using the vertical side-diffraction Laue diffraction device. A transformation matrix between the test reference coordinate system and the sample coordinate system is obtained through computer processing. The primary orientation of the tested blade is indirectly obtained by calculating using this matrix. This allows multiple blades to be placed simultaneously, covering the entire sample plane, and facilitates accurate positioning relative to the blades. This invention combines the advantages of vertical diffraction equipment (allowing for a large number of blades to be clamped at once) and the ease of positioning flat blades, improving stability, reducing relative errors, increasing the number of alloys tested at once, and improving testing efficiency.

[0088] Example 2

[0089] Based on the same inventive concept, embodiments of the present invention also provide a testing device for the primary orientation of single-crystal superalloys, such as... Figure 4 As shown, the device includes:

[0090] Test module 401 is configured to test the primary orientation of the alloy and obtain Laue diffraction spot patterns;

[0091] The conversion module 402 is configured to calibrate the Laue diffraction spot pattern and determine the transformation matrix between the sample coordinate system and the test reference coordinate system based on the calibration result.

[0092] The calculation module 403 is configured to determine a first orientation deviation based on the transformation matrix.

[0093] As a preferred example, the test module 401 is configured to test the primary orientation of a single crystal blade or test rod using a vertical side-diffraction Laue diffraction device, wherein the single crystal blade or test rod lies flat on the test platform.

[0094] As a preferred example, the conversion module 402 is configured to perform calibration according to a preset calibration rule, wherein the preset calibration rule includes setting calibration parameters that include at least two zone axes, each of the at least two zone axes including at least three diffraction spots.

[0095] The transformation matrix is:

[0096]

[0097] Among them, a 11 a 12 a 13 a 21 a 22 a 23 a 31 a 32a 33 The specific numerical values ​​of the coordinates of the transformation matrix between the test reference coordinate system and the sample coordinate system.

[0098] As a preferred example, the calculation module 403 is configured to calculate the first orientation deviation according to the following formula:

[0099] cos -1 (max(|a 11 |,|a 21 |,|a 31 |))

[0100] Wherein, the direction of the axis to be tested of the alloy is parallel to the X-axis of the sample coordinate system.

[0101] As a preferred example, the calculation module 403 is configured to calculate the first orientation deviation according to the following formula:

[0102] cos -1 (max(|a 12 |,|a 22 |,|a 32 |))

[0103] The direction of the axis to be tested of the alloy is parallel to the Y-axis of the sample coordinate system.

[0104] It should be noted that the number of alloys to be tested is greater than or equal to 1 in a single automated test.

[0105] It should be noted that the test module 401 provided in this embodiment can realize all the functions included in step S201 in embodiment one, solve the same technical problems, and achieve the same technical effects, which will not be repeated here;

[0106] It should be noted that the conversion module 402 provided in this embodiment can realize all the functions included in step S202 in embodiment one, solve the same technical problems, and achieve the same technical effects, which will not be repeated here;

[0107] It should be noted that the calculation module 403 provided in this embodiment can realize all the functions included in step S203 in embodiment one, solve the same technical problems, and achieve the same technical effects, which will not be repeated here;

[0108] It should be noted that the device provided in Embodiment 2 and the method provided in Embodiment 1 belong to the same inventive concept, solve the same technical problem, and achieve the same technical effect. The device provided in Embodiment 2 can implement all the methods in Embodiment 1, and the similarities will not be repeated.

[0109] Example 3

[0110] Based on the same inventive concept, embodiments of the present invention also provide a testing device for the primary orientation of single-crystal superalloys, such as... Figure 5 As shown, the device includes:

[0111] It includes a memory 502, a processor 501, and a user interface 503;

[0112] The memory 502 is used to store computer programs;

[0113] The user interface 503 is used to interact with the user.

[0114] The processor 501 is used to read the computer program in the memory 502, and when the processor 501 executes the computer program, it implements:

[0115] The first orientation of the alloy was tested to obtain the Laue diffraction spot pattern;

[0116] The Laue diffraction spot pattern is calibrated, and the transformation matrix between the test reference coordinate system and the sample coordinate system is determined based on the calibration results;

[0117] The first orientation deviation is determined based on the transformation matrix.

[0118] Among them, Figure 5 In this context, the bus architecture can include any number of interconnected buses and bridges, specifically linking various circuits together, represented by one or more processors (processor 501) and memory (memory 502). The bus architecture can also link various other circuits such as peripheral devices, voltage regulators, and power management circuits, which are well known in the art and therefore will not be described further herein. The bus interface provides the interface. Processor 501 is responsible for managing the bus architecture and general processing, and memory 502 can store data used by processor 501 during operation.

[0119] Processor 501 can be a CPU, ASIC, FPGA or CPLD, and processor 501 can also adopt a multi-core architecture.

[0120] When processor 501 executes the computer program stored in memory 502, it implements the test method for primary orientation of any single-crystal high-temperature alloy in Embodiment 1.

[0121] As a preferred example, a vertical side-diffraction Laue diffraction device is used to test the primary orientation of a single crystal blade or test rod, which lies flat on the testing platform.

[0122] As a preferred example, when processor 501 executes a computer program stored in memory 502, it implements:

[0123] The calibration is performed according to a preset calibration rule, wherein the preset calibration rule includes setting calibration parameters that include at least two zone axes, and each of the at least two zone axes includes at least three diffraction spots.

[0124] As a preferred example, when processor 501 executes the computer program stored in memory 502, it performs the following: determining the transformation matrix between the test reference coordinate system and the sample coordinate system based on the calibration results, wherein the transformation matrix is:

[0125]

[0126] Among them, a 11 a 12 a 13 a 21 a 22 a 23 a 31 a 32 a 33 The specific numerical values ​​of the coordinates of the transformation matrix between the test reference coordinate system and the sample coordinate system.

[0127] As a preferred example, when processor 501 executes a computer program stored in memory 502, it implements:

[0128] The first orientation deviation is calculated using the following formula:

[0129] cos -1 (max(|a 11 |,|a 21 |,|a 31 |))

[0130] Wherein, the direction of the axis to be tested of the alloy is parallel to the X-axis of the sample coordinate system.

[0131] As a preferred example, when processor 501 executes a computer program stored in memory 502, it implements:

[0132] The first orientation deviation is calculated using the following formula:

[0133] cos -1 (max(|a 12 |,|a 22 |,|a 32 |))

[0134] The direction of the axis to be tested of the alloy is parallel to the Y-axis of the sample coordinate system.

[0135] In this embodiment of the invention, the number of alloys to be tested is greater than or equal to 1 in a single automatic test.

[0136] It should be noted that the device provided in Embodiment 3 and the method provided in Embodiment 1 belong to the same inventive concept, solve the same technical problem, and achieve the same technical effect. The device provided in Embodiment 3 can implement all the methods in Embodiment 1, and the similarities will not be repeated.

[0137] This application also proposes a processor-readable storage medium. This processor-readable storage medium stores a computer program, which, when executed by the processor, implements the test method for primary orientation of any single-crystal superalloy in Embodiment 1.

[0138] It should be noted that the division of units in the embodiments of this application is illustrative and only represents one logical functional division. In actual implementation, other division methods may be used. Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated units described above can be implemented in hardware or as software functional units.

[0139] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product implemented on one or more computer-usable storage media (including, but not limited to, disk storage and optical storage) containing computer-usable program code.

[0140] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0141] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0142] Obviously, those skilled in the art can make various modifications and variations to this application without departing from the spirit and scope of this application. Therefore, if such modifications and variations fall within the scope of the claims of this application and their equivalents, this application also intends to include such modifications and variations.

Claims

1. A method for testing the primary orientation of a single-crystal superalloy, characterized in that, include: The first orientation of the alloy was tested to obtain the Laue diffraction spot pattern; The Laue diffraction spot pattern is calibrated, and the transformation matrix between the test reference coordinate system and the sample coordinate system is determined based on the calibration results; The first orientation deviation is determined based on the transformation matrix; The primary orientation of the test alloy includes: The primary orientation of a single crystal blade or test rod is tested using a vertical side-diffraction Laue diffraction apparatus. The single crystal blade or test rod lies flat on the testing platform; The calibration of the Laue diffraction spot pattern includes: The calibration is performed according to a preset calibration rule, wherein the preset calibration rule includes setting calibration parameters that include at least two zone axes, and each of the at least two zone axes includes at least three diffraction spots; The step of determining the transformation matrix between the test reference coordinate system and the sample coordinate system based on the calibration results includes: The transformation matrix is: Among them, a 11 a 12 a 13 a 21 a 22 a 23 a 31 a 32 a 33 The specific numerical values ​​of the coordinates of the transformation matrix between the test reference coordinate system and the sample coordinate system.

2. The method according to claim 1, characterized in that, The determination of the first orientation deviation based on the transformation matrix includes: The first orientation deviation is calculated using the following formula: cos -1 (max(|a 11 |,|a 21 |,|a 31 |)) Wherein, the direction of the axis to be tested of the alloy is parallel to the X-axis of the sample coordinate system.

3. The method according to claim 1, characterized in that, The determination of the first orientation deviation based on the transformation matrix includes: The first orientation deviation is calculated using the following formula: cos -1 (max(|a 12 |,|a 22 |,|a 32 |)) The direction of the axis to be tested of the alloy is parallel to the Y-axis of the sample coordinate system.

4. The method according to any one of claims 1 to 3, characterized in that, include: The quantity of the alloy to be tested is greater than or equal to 1 in a single automated test.

5. A testing device for the primary orientation of a single-crystal superalloy, characterized in that, include: The testing module is configured to test the primary orientation of the alloy and obtain Laue diffraction spot patterns. The transformation module is configured to calibrate the Laue diffraction spot pattern and determine the transformation matrix between the sample coordinate system and the test reference coordinate system based on the calibration results. The calculation module is configured to determine a first orientation deviation based on the transformation matrix; The primary orientation of the test alloy includes: The primary orientation of a single crystal blade or test rod is tested using a vertical side-diffraction Laue diffraction apparatus. The single crystal blade or test rod lies flat on the testing platform; The calibration of the Laue diffraction spot pattern includes: The calibration is performed according to a preset calibration rule, wherein the preset calibration rule includes setting calibration parameters that include at least two zone axes, and each of the at least two zone axes includes at least three diffraction spots; The step of determining the transformation matrix between the test reference coordinate system and the sample coordinate system based on the calibration results includes: The transformation matrix is: Among them, a 11 a 12 a 13 a 21 a 22 a 23 a 31 a 32 a 33 The specific numerical values ​​of the coordinates of the transformation matrix between the test reference coordinate system and the sample coordinate system.

6. A testing device for the primary orientation of a single-crystal superalloy, characterized in that, This includes memory, processor, and user interface; The memory is used to store computer programs; The user interface is used to interact with the user; The processor is used to read computer programs and test data from the memory. When the processor executes the computer program, it implements the test method for primary orientation of single-crystal high-temperature alloys as described in any one of claims 1 to 4.

7. A processor-readable storage medium, characterized in that, The processor-readable storage medium stores a computer program and test data, and when the processor executes the computer program, it implements the test method for primary orientation of single-crystal high-temperature alloys as described in any one of claims 1 to 4.

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