A storage device private log collection method, device and storage medium

Abstract

The application provides a storage device private log collection method, device and storage medium, which connects registers of an EDSFF new storage device with components such as Flash, DRAM and SRAM, so that each key component corresponds to a register space, and is used for collecting any abnormal state in the life cycle of the component; the collection tool and the golden finger channel of the EDSFF are interconnected, and the register information is exported in the storage device for analysis of abnormal problems. Through the specific interface of the new EDSFF storage device and the underlying log collection function, the application optimizes the traditional 2.5-inch hard disk log recording and collection mode, when the storage device is suspended or the server system is down, the underlying log collection of 16 separate registers can be performed through the special golden finger channel of the EDSFF, the private log information is enriched, the traditional log collection means is optimized, the FA analysis of the R&D personnel is facilitated, the client system reliability is ensured, and the customer experience is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of storage devices, in particular to a storage device private log collection method, device and storage medium. BACKGROUND

[0002] EDSFF is a new type of storage device, which has Long and Short two sizes, respectively corresponding to E1.L and E1.S interface forms. E1.S and E1.L are like a "ruler", which is very long and small in size. It is very suitable for vertical insertion of high-density storage in 1U servers, and can realize the storage scale and performance upper limit that 2.5-inch hard drives cannot achieve.

[0003] However, in the use process of the storage device, no matter what form or interface, it is essentially a carrier of data. As a storage device, there is a possibility of problems and exceptions. The current 2.5-inch SSD or HDD can only collect the SMART information of the disk through the specification in the SATA or SAS protocol using the hard disk information reading command under the operating system. The SMART information as the basic information of the disk can only show the macro data statistics such as power-on time and power-off times. It cannot record the more bottom-layer abnormal information of the storage device, and when the operating system is paralyzed, the disk will lose activity and cannot collect information for analysis by R&D personnel.

[0004] According to the advantages of the new EDSFF storage device, compared with the traditional 2.5-inch hard disk, EDSFF is a completely new storage interface, which will have more golden fingers and register designs. We can use the registers to collect abnormal information of Flash, DRAM, SRAM and other components, and then use a special collection tool to collect the golden fingers in EDSFF as an information channel to collect such abnormal information, achieving the purpose of collecting private logs of storage device bottom-layer controllers, flash memory, Sector and other components in addition to SMART information in the SATA / SAS protocol.

[0005] Such private logs can record any exceptions of EDSFF storage devices in the life cycle, including voltage jitter at a certain time, PE Cycle Fail, FW Assert, etc. These records cannot be recorded by the SMART log in the protocol. When the storage device has an exception, R&D personnel can analyze the problem and troubleshoot according to the designed private log, without the need to reproduce the problem in the data center, thereby improving customer satisfaction.

[0006] However, SMART logs can only record the basic information of the storage device at the macro level, and have little benefit for analyzing difficult problems. SMART information depends on the operating system, and when the operating system crashes or goes down, it cannot collect SMART logs. SUMMARY

[0007] Therefore, the present application aims to provide a storage device private log collection method, device and storage medium. According to the advantages of the EDSFF new storage device golden finger and the more registers than the traditional hard disk, the registers of the EDSFF storage are reconfigured, so that these registers are connected with the Flash, DRAM, SRAM and other components in the storage device, thereby realizing the bottom layer log recording function of the components. Through the special golden finger channel in the EDSFF, the exclusive collection tool is interconnected, and the dependence of log collection on the operating system is reduced. The problem of low efficiency of guessing root cause and reproducing efficiency of the traditional storage device is solved, and the quality stability and customer experience of the data center are improved.

[0008] To achieve the above purpose, in one aspect, the present application provides a storage device private log collection method, which comprises:

[0009] The registers of the EDSFF new storage device are connected with the components including Flash, DRAM, SRAM, so that each key component is corresponded with a register space for collecting any abnormal state of the components during the life cycle of the components;

[0010] The collection tool and the golden finger channel of the EDSFF are interconnected to export the register information in the storage device for analysis of abnormal problems.

[0011] As a further scheme of the present application, the EDSFF new storage device is additionally designed with 16 new registers for monitoring 16 different states of errors and abnormalities.

[0012] As a further scheme of the present application, the 16 new registers additionally designed in the EDSFF new storage device are provided with flash chips for recording the information of the life cycle state of each key component.

[0013] As a further scheme of the present application, the 16 registers respectively monitor 16 different abnormal states of the EDSFF storage device, and the 16 registers are used for real-time recording of 16 aspects of the EDSFF storage device, including write protection, FW suspension reason, Nand write and Die failure, XOR Flash exception, ECC error of DRAM and SRAM, flash current and voltage exception, capacitor failure, controller reset, data model, temperature curve, PE Cycle, command timeout, EDSFF Reset and Core core exception, to collect information and record bottom layer logs of the EDSFF storage device.

[0014] As a further scheme of the present application, the monitoring items of the 16 registers include:

[0015] Write Project, for recording the cause of the device entering write protection;

[0016] FW Assert, for recording FW exception or firmware disconnection;

[0017] Nand Write Issue, for recording and reporting the write failure in Nnad;

[0018] Nand Die Fail, for recording and reporting the Die exception in Nnad;

[0019] XOR Fail, for recording the failure information of XOR Flash;

[0020] DRAM ECC, for recording and reporting the ECC problem of DRAM;

[0021] SRAM ECC, for recording and reporting the ECC problem of SRAM;

[0022] NOR Flash Fail, for recording the failure in flash memory, including the recording of current and voltage exception;

[0023] Cap (capacitor) Fail, for recording the capacitor exception or damage in the device;

[0024] Controller Reset, for recording the reset cause and trigger condition when the controller is reset;

[0025] Data Record, for recording the data change of stress or service scenario in the life cycle of the device;

[0026] Temperature, for recording the curve of temperature change, not the highest or lowest instantaneous value;

[0027] Flash PE, for recording the erase and write times in flash memory;

[0028] CMD Timeout, for recording the specific exception command when the command is timed out or abnormal;

[0029] SSD Reset, for recording the XX Reset command given by the device Reset or OS when the device is reset;

[0030] Power-on Sequence, for recording the power-on sequence and boot process of the controller and the data record in the Core.

[0031] Still another aspect of the present application provides a computer device comprising a memory and a processor, the memory storing a computer program, the computer program being executed by the processor to perform any of the above-mentioned collection methods of private logs of storage devices according to the present application.

[0032] Still another aspect of the present application provides a computer-readable storage medium storing computer program instructions, the computer program instructions being executed to implement any of the above-mentioned collection methods of private logs of storage devices according to the present application.

[0033] Compared with the conventional implementation, the present application has the following main advantages:

[0034] The present application makes each key component have a register space for correspondence by connecting the registers of the new EDSFF storage device with Flash, DRAM, SRAM and other components, for collecting any abnormal state in the life cycle of the components. Then the special collection tool and the golden finger channel of the EDSFF are interconnected to export the register information in the storage device for abnormal problem analysis, which no longer relies on the operating system. In the case of OS crash or server downtime, the underlying information collection of the storage device is still not affected, so that more efficient abnormal state analysis is realized.

[0035] The present application optimizes the traditional 2.5-inch hard disk log recording and collection method by the specific interface and underlying log collection function of the new EDSFF storage device. When the storage device hangs or the server system crashes, the underlying log collection of 16 individual registers can be performed through the special golden finger channel of the EDSFF, which enriches the private log information and optimizes the traditional log collection means, facilitating the FA analysis of the R&D personnel, ensuring the reliability of the client system and improving the customer experience.

[0036] These and other aspects of the application will become more apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0037] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed to be used in the embodiments or the prior art description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other embodiments can be obtained without creative labor on the basis of these drawings.

[0038] In the drawings:

[0039] Figure 1 Structure diagram of a new type of register additionally designed in the collection method of the storage device private log of the application;

[0040] Figure 2 Structure diagram of an embodiment of the computer readable storage medium for implementing the collection method of the storage device private log of the application;

[0041] Figure 3 Hardware structure diagram of an embodiment of the computer device for implementing the collection method of the storage device private log of the application. DETAILED DESCRIPTION

[0042] In order to make the objects, technical solutions and advantages of the application clearer, the embodiments of the application are further described in detail below with reference to the accompanying drawings.

[0043] It should be noted that all the expressions of "first" and "second" in the embodiments of the application are used to distinguish two non-identical entities or non-identical parameters with the same name, and it can be seen that "first" and "second" are only used for the convenience of description, and should not be understood as a limitation on the embodiments of the application. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, the process, method, system, product or device inherently includes other steps or units.

[0044] In order to make the objects, technical solutions and advantages of the application clearer, the embodiments of the application are further described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are only used to explain the application, and are not used to limit the application.

[0045] The technical solutions in the embodiments of the application will be described clearly and completely below with reference to the accompanying drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, rather than all the embodiments of the application. Based on the embodiments in the application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the application.

[0046] The flowchart shown in the accompanying drawings is only an example and is not necessarily required to include all the contents and operations / steps, and is not necessarily executed in the order described. For example, some operations / steps can be further divided, combined or partially combined, so that the actual execution order can be changed according to the actual situation.

[0047] Some embodiments of the application will be described in detail below with reference to the accompanying drawings. In the case of no conflict, the following embodiments and features in the embodiments can be combined with each other.

[0048] Since the SMART log can only record the basic information of the storage device at a macro level, the analysis benefit for difficult problem analysis is very small; the SMART information depends on the operating system, and when the operating system is dead or down, the collection of the SMART log cannot be performed any more.

[0049] In view of this, embodiments of the present application provide a storage device private log collection method, device and storage medium, according to the advantages of the EDSFF new storage device golden finger and more registers than the traditional hard disk, the part of registers of the EDSFF storage is reconfigured, so that these registers are connected with the elements such as Flash, DRAM, SRAM and the like in the storage device, so as to realize the bottom layer log recording function of the elements. Then through the special golden finger channel in the EDSFF, the exclusive collection tool is interconnected, and the dependence of the log collection on the operating system is reduced. The problem that the traditional storage device can only rely on the SMART basic information to guess the root cause and the low reproduction efficiency when an exception occurs is solved, and the quality stability and customer experience of the data center are improved.

[0050] In some embodiments of the present application, referring to Figure 1 as shown, a storage device private log collection method is provided, the method comprises:

[0051] The registers of the EDSFF new storage device are connected with the elements such as Flash, DRAM, SRAM and the like, so that each key element is corresponded with a register space, which is used for collecting any abnormal state in the element life cycle;

[0052] The collection tool and the golden finger channel of the EDSFF are interconnected, and the register information in the storage device is exported for analysis of abnormal problems.

[0053] In embodiments of the present application, 16 new registers are additionally designed in the EDSFF new storage device, which are respectively used for monitoring 16 different state errors and exceptions.

[0054] According to the advantages of the EDSFF new storage device golden finger and more registers than the traditional hard disk, the part of registers of the EDSFF storage is reconfigured, so that these registers are connected with the elements such as Flash, DRAM, SRAM and the like in the storage device, so as to realize the bottom layer log recording function of the elements. Then through the special golden finger channel in the EDSFF, the exclusive collection tool is interconnected, and the dependence of the log collection on the operating system is reduced. The problem that the traditional storage device can only rely on the SMART basic information to guess the root cause and the low reproduction efficiency when an exception occurs is solved, and the quality stability and customer experience of the data center are improved.

[0055] In the embodiment of the application, the 16 new registers additionally designed in the EDSFF new storage device are provided with flash chips for recording information of the life cycle state of each key component.

[0056] In the embodiment of the application, 16 registers respectively monitor 16 different abnormal states in the EDSFF storage device, and the 16 registers are used to record information of the EDSFF storage device in real time, including 16 aspects of write protection, FW suspension reason, Nand write and Die failure, XOR Flash exception, ECC error of DRAM and SRAM, flash current and voltage exception, capacitor failure, controller reset, data model, temperature curve, PE Cycle, command timeout, EDSFF Reset and Core core exception.

[0057] The application realizes that each key component has a register space for correspondence through the connection between the registers of the EDSFF new storage device and the Flash, DRAM, SRAM and other components, which is used to collect any abnormal state in the life cycle of the component. Then, the special collection tool and the golden finger channel of the EDSFF are interconnected to export the register information in the storage device for abnormal problem analysis, which no longer relies on the operating system. In the case of OS crash or server downtime, the underlying information collection of the storage device is still not affected, so that more efficient abnormal state analysis is realized.

[0058] In the EDSFF new storage device, 16 new registers are additionally designed for monitoring errors and exceptions in 16 different states. The registers have flash chips, which can realize information recording of the life cycle state of each key component. When the storage device is suspended or the server system is down, a special tool can be used to establish a path with the golden finger channel of the EDSFF, so as to realize the collection of the private log of the registers in the EDSFF device.

[0059] In some embodiments, 16 registers are respectively used to monitor 16 different abnormal states in the EDSFF storage device, and the monitoring items of the 16 registers include:

[0060] Write Project, used for recording the reason of entering write protection;

[0061] FW Assert, used for recording FW exception or firmware disconnection;

[0062] Nand Write Issue, used for recording and abnormal feedback of write failure in Nnad;

[0063] Nand Die Fail, for Die abnormality in Nand, with record and abnormal feedback;

[0064] XOR Fail, for XOR Flash abnormality, with separate failure information;

[0065] DRAM ECC, for ECC problem in DRAM, with separate record and error report;

[0066] SRAM ECC, for ECC problem in SRAM, with separate record and error report;

[0067] NOR Flash Fail, for failure in flash memory, including current and voltage abnormality record;

[0068] Cap (Capacitor) Fail, for capacitor abnormality or damage record in the device;

[0069] Controller Reset, for controller reset record, with reset reason and trigger condition;

[0070] Data Record, for data change record in device life cycle, with stress or service scenario;

[0071] Temperature, for temperature change curve record, with non-highest or lowest instantaneous value;

[0072] Flash PE, for flash memory erase and write times record;

[0073] CMD Timeout, for command timeout or abnormality, with specific abnormal command record;

[0074] SSD Reset, for device reset record, with self-reset or OS XX Reset command;

[0075] Power-on Sequence, for controller power-on sequence and boot process record, with Core data record.

[0076] 16 registers are used to monitor 16 different abnormal states in EDSFF storage device, as shown in the following table:

[0077]

[0078]

[0079] Through the design of special registers in the EDSFF, 16 aspects of the EDSFF storage device can be recorded in real time, including write protection of the storage device, FW suspension reason, Nand writing and Die failure, XOR Flash exception, ECC error of DRAM and SRAM, flash current and voltage exception, capacitor failure, controller reset, data model, temperature curve, PE Cycle, command timeout, EDSFF Reset and Core core exception, so as to fundamentally solve the problem that the traditional 2.5-inch hard disk cannot record the underlying log, improve the timeliness of the R&D personnel in solving problems, and greatly improve the reliability of the server operation.

[0080] In summary, through the unique interface and underlying log collection function of the new EDSFF storage device, the traditional 2.5-inch hard disk log recording and collection method is optimized, and when the storage device is suspended or the server system is down, the underlying log collection of 16 individual registers can be performed through the EDSFF special golden finger channel, the private log information is enriched, the traditional log collection means is optimized, the R&D personnel can perform FA analysis, the client system reliability is ensured, and the customer experience is improved.

[0081] It should be noted that the EDSFF new storage device in the application is different from the current 2.5-inch hard disk, and the size, architecture and golden finger channel are different from the current hard disk. The EDSFF has more register space and golden finger channels, and the EDSFF underlying private log items and a new log collection method are defined by using the registers and golden finger channels.

[0082] It should be understood that although the above steps are described in a certain order, these steps are not necessarily executed in the above order. Unless otherwise stated herein, the execution of these steps has no strict order limitation, and these steps can be executed in other orders. Moreover, part of the steps of the embodiment can include multiple steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily sequential, but can be alternately executed with at least part of other steps or steps or stages in other steps.

[0083] The second aspect of the embodiment of the application also provides a computer device 400, including a memory 420 and a processor 410, the memory stores a computer program, and the computer program is executed by the processor to realize the method of any one of the above-mentioned embodiments, including the following steps:

[0084] The registers of the EDSFF new storage device are connected with the components such as Flash, DRAM, SRAM, so that each key component is corresponding to a register space, which is used to collect any abnormal state in the life cycle of the component.

[0085] The register information is exported in the storage device through the collection tool and the golden finger channel of the EDSFF for analysis of abnormal problems.

[0086] The EDSFF new storage device is additionally designed with 16 new registers, which are used to monitor 16 different states of errors and abnormalities.

[0087] The monitoring items of the 16 registers include:

[0088] Write Project, used for recording the reason of entering write protection of the device;

[0089] FW Assert, used for recording FW exception or firmware disconnection;

[0090] Nand Write Issue, used for recording and abnormal feedback of write failure in Nnad;

[0091] Nand Die Fail, used for recording and abnormal feedback of Die exception in Nnad;

[0092] XOR Fail, used for recording failure information of XOR Flash exception;

[0093] DRAM ECC, used for recording and error reporting of ECC problem of DRAM;

[0094] SRAM ECC, used for recording and error reporting of ECC problem of SRAM;

[0095] NOR Flash Fail, used for recording fault in flash memory, including current and voltage abnormality;

[0096] Cap (Capacitor) Fail, used for recording capacitor abnormality or damage in the device;

[0097] Controller Reset, used for recording reset reason and trigger condition when the controller is reset;

[0098] Data Record, used for recording data changes of stress or business scenarios in the life cycle of the device;

[0099] Temperature, used for recording temperature change curve, not the highest or lowest instantaneous value;

[0100] Flash PE is used to record the number of erase and write cycles in the flash memory.

[0101] CMD Timeout is used to record the specific abnormal command when a command times out or encounters an error.

[0102] SSD Reset is used to record the device's own Reset or the XX Reset command given by the OS when the device is reset;

[0103] Power-on Sequence is used by the controller to record the power-on sequence, boot process, and data recording in the Core.

[0104] like Figure 3 The diagram shown is a hardware structure schematic of an embodiment of a computer device for executing a method for collecting private logs from a storage device, as provided by the present invention. Figure 3 Taking the computer device 400 shown as an example, this computer device includes a processor 410 and a memory 420, and may also include an input device 430 and an output device 440. The processor 410, memory 420, input device 430, and output device 440 can be connected via a bus or other means. Figure 3 Taking a bus connection as an example, input device 430 can receive input digital or character information and generate signal inputs related to the collection of private logs of the storage device. Output device 440 may include display devices such as a display screen.

[0105] Memory 420, as a non-volatile computer-readable storage medium, can be used to store non-volatile software programs, non-volatile computer-executable programs, and modules, such as the program instructions / modules corresponding to the storage device private log collection method in the embodiments of this application. Memory 420 may include a program storage area and a data storage area, wherein the program storage area may store the operating system and application programs required for at least one function; the data storage area may store data created by using the storage device private log collection method, etc. In addition, memory 420 may include high-speed random access memory and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, memory 420 may optionally include memory remotely located relative to processor 410, and these remote memories can be connected to the local module via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0106] The processor 410 performs various function applications and data processing of the server by running the non-volatile software programs, instructions and modules stored in the memory 420, that is, implements the collection method of the storage device private log of the above-mentioned method embodiment, the steps are as follows:

[0107] The registers of the EDSFF new storage device are connected with the components such as Flash, DRAM and SRAM, so that each key component corresponds to a register space, which is used to collect any abnormal state in the life cycle of the component;

[0108] The collection tool and the golden finger channel of the EDSFF are interconnected, and the register information is exported in the storage device for analysis of abnormal problems.

[0109] The EDSFF new storage device is additionally designed with 16 new registers, which are respectively used to monitor 16 different states of errors and abnormalities.

[0110] The monitoring items of the 16 registers include:

[0111] Write Project, used for recording the reason of entering write protection of the device;

[0112] FW Assert, used for recording FW exception or firmware disconnection;

[0113] Nand Write Issue, used for recording and abnormal feedback of write failure in Nnad;

[0114] Nand Die Fail, used for recording and abnormal feedback of Die exception in Nnad;

[0115] XOR Fail, used for recording failure information of XOR Flash exception;

[0116] DRAM ECC, used for recording and error reporting of ECC problem of DRAM;

[0117] SRAM ECC, used for recording and error reporting of ECC problem of SRAM;

[0118] NOR Flash Fail, used for recording fault in flash memory, including current and voltage abnormality;

[0119] Cap (Capacitor) Fail, used for recording capacitor abnormality or damage in the device;

[0120] Controller Reset, used for recording reset reason and trigger condition when the controller is reset;

[0121] Data Record, for recording data changes of the device life cycle pressure or business scenarios;

[0122] Temperature, for recording the curve of temperature changes, non-highest or lowest instantaneous value;

[0123] Flash PE, for recording the number of erasing and writing times in the flash memory;

[0124] CMD Timeout, for recording specific exception commands when the command timeout or exception occurs;

[0125] SSD Reset, for recording the self-reset or XX reset command given by the OS when the device is reset;

[0126] Power-on Sequence, for the controller to record the power-on sequence and boot process and the data record in the core.

[0127] The fourth aspect of the embodiment of the application also provides a computer readable storage medium, Figure 2 The schematic diagram of the computer readable storage medium of the collection method of the storage device private log provided by the embodiment of the application is shown in the figure. Figure 2 As shown, the computer readable storage medium 300 stores computer program instructions 310, which can be executed by the processor. The computer program instructions 310 are executed to implement the method of any one of the above embodiments, including the following steps:

[0128] The registers of the EDSFF new storage device are connected with the components such as flash, DRAM, SRAM, so that each key component corresponds to a register space, which is used to collect any abnormal state in the life cycle of the component.

[0129] The collection tool and the golden finger channel of the EDSFF are interconnected, and the register information is exported in the storage device for analysis of abnormal problems.

[0130] The EDSFF new storage device is additionally designed with 16 new registers, which are respectively used to monitor 16 different state errors and abnormalities.

[0131] The monitoring items of the 16 registers include:

[0132] Write Project, for recording the reason of entering the write protection of the device;

[0133] FW Assert, for recording the FW exception or firmware disconnection;

[0134] Nand Write Issue, for write failure in Nand, with record and abnormal feedback;

[0135] Nand Die Fail, for Die abnormal in Nand, with record and abnormal feedback;

[0136] XOR Fail, for abnormal in XOR Flash, with failure information alone;

[0137] DRAM ECC, for ECC problem in DRAM, with record and error alone;

[0138] SRAM ECC, for ECC problem in SRAM, with record and error alone;

[0139] NOR Flash Fail, for failure in flash, including current, voltage abnormal record;

[0140] Cap (Capacitor) Fail, for abnormal or damage record of capacitor in device;

[0141] Controller Reset, for record of reset reason and trigger condition when controller resets;

[0142] Data Record, for record of data change of stress or service scenario in device life cycle;

[0143] Temperature, for record of temperature change curve, non-highest or lowest instantaneous value;

[0144] Flash PE, for record of erase and write times in flash;

[0145] CMD Timeout, for record of specific abnormal command when command times out or is abnormal;

[0146] SSD Reset, for record of XX Reset command given by itself or OS when device resets;

[0147] Power-on Sequence, for record of power-on sequence and boot process by controller and data record in Core.

[0148] It should be understood that all the embodiments, features and advantages described above for the collection method of the private log of the storage device according to the present application are equally applicable to the collection system of the private log of the storage device according to the present application and the storage medium.

[0149] The application makes each key component have a register space for correspondence through the connection between the registers of the new EDSFF storage device and the Flash, DRAM, SRAM and other components, which is used to collect any abnormal state in the life cycle of the component. Then, the special collection tool and the golden finger channel of the EDSFF are interconnected to export the register information in the storage device for abnormal problem analysis, which no longer relies on the operating system, and the underlying information collection of the storage device is still not affected in the case of OS crash or server downtime, so that higher efficiency of abnormal state analysis is realized.

[0150] The application optimizes the traditional 2.5-inch hard disk log recording and collection mode through the specific interface and underlying log collection function of the new EDSFF storage device. When the storage device is suspended or the server system is down, the underlying log collection of 16 individual registers can be performed through the special golden finger channel of the EDSFF, which enriches the private log information and optimizes the traditional log collection means, facilitates the FA analysis of the R&D personnel, guarantees the reliability of the client system, and improves the customer experience.

[0151] The above is the exemplary embodiment disclosed by the application, but it should be noted that various changes and modifications can be made without departing from the scope of the embodiments disclosed by the application defined in the claims. The functions, steps and / or actions of the method claims described herein need not be performed in any particular order. In addition, although the elements of the embodiments disclosed by the application can be described or claimed in individual form, they can also be understood as plural unless explicitly limited to singular.

[0152] It should be understood that, unless the context clearly supports otherwise, the singular form "a", "an", and "the" as used herein are intended to include the plural forms as well. It should also be understood that "and / or" as used herein refers to any and all possible combinations of one or more of the associated listed items. The above embodiment numbers of the embodiments disclosed by the application are only for description, not representing the advantages and disadvantages of the embodiments.

[0153] Those skilled in the art should understand that the above discussion of any embodiment is only exemplary and is not intended to limit the scope of the embodiments disclosed by the application (including the claims); under the idea of the embodiments of the application, the technical features of the above embodiments or different embodiments can also be combined, and there are many other changes of the different aspects of the embodiments of the application as described above. In order to be brief, they are not provided in detail. Therefore, any omissions, modifications, equivalent replacements, improvements, etc. made in the spirit and principle of the embodiments of the application should be included in the protection scope of the embodiments of the application.

Claims

1. A collection method of a storage device private log, characterized by, The method comprises the steps of: The registers of the EDSFF new storage device are connected with the components such as Flash, DRAM and SRAM, so that each key component corresponds to a register space for collecting any abnormal state in the life cycle of the component; The register information is exported in the storage device through the collection tool and the golden finger channel of the EDSFF for analysis of abnormal problems; The EDSFF new storage device is additionally designed with 16 new registers for monitoring 16 different states of errors and abnormalities; The flash chip is arranged in the 16 new registers additionally designed in the EDSFF new storage device, and the flash chip is used for recording the life cycle state information of each key component.

2. The method of claim 1, wherein the method further comprises: The 16 registers are used for real-time recording of 16 aspects of the EDSFF storage device, including write protection, FW suspension reason, Nand write and Die failure, XOR Flash abnormality, ECC error of DRAM and SRAM, flash current and voltage abnormality, capacitor failure, controller reset, data model, temperature curve, PE cycle, command timeout, EDSFFReset and Core core abnormality.

3. The method of claim 2, wherein, The registers additionally designed in the EDSFF new storage device comprise: Write Project, used for recording the reason of entering write protection of the device; FW Assert, used for recording FW abnormality or firmware disconnection; Nand Write Issue, used for recording and abnormal feedback of write failure in Nnad; Nand Die Fail, used for recording and abnormal feedback of Die abnormality in Nnad.

4. The method of claim 3, wherein, The registers additionally designed in the EDSFF new storage device further comprise: XOR Fail, used for recording failure information of XOR Flash abnormality; DRAM ECC, used for recording and error reporting of ECC problem of DRAM; SRAM ECC, used for recording and error reporting of ECC problem of SRAM; NOR Flash Fail, used for recording current and voltage abnormality of flash failure.

5. The method of claim 4, wherein, The registers additionally designed in the EDSFF new storage device further comprise: CapFail, used for recording capacitor abnormality or damage in the device; Controller Reset, used for recording reset reason and trigger condition when the controller is reset; Data Record, used for recording data change of stress or business scenario in the life cycle of the device; Temperature, used for recording temperature change curve, non-highest or lowest instantaneous value; Flash PE, used for recording the number of times of erasing and writing in the flash.

6. The storage device private log collection method of claim 5, wherein, The registers additionally designed in the EDSFF new storage device further comprise: CMD Timeout, used for recording specific abnormal command when the command is timed out or abnormal. SSD Reset, for the device to record the Reset or OS given XX Reset command when Reset; Power-on Sequence, for the controller to record the power-on sequence and boot flow and the data in the Core.

7. A computer device comprising a memory and a processor, the memory having stored therein a computer program, characterized in that, The computer program is executed by a processor to perform the collection method of the private log of the storage device according to any one of claims 1-6.

8. A computer-readable storage medium storing computer program instructions, wherein, The computer program instructions are executed to implement the collection method of the private log of the storage device according to any one of claims 1-6.

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