Method for finding zero-degree field-of-view optical axis of off-axis two-reflection product and monitoring method

Abstract

This invention belongs to the field of optical-mechanical assembly technology, specifically relating to a method for finding and monitoring the zero-degree field-of-view optical axis of an off-axis dual-mirror product. Using a laser interferometer, a flat crystal, an autocollimator, and an adjustable reflector, the method enables the search for the off-axis reflector's optical axis and the continuous monitoring of the off-axis dual-mirror product's optical axis during assembly and adjustment. This facilitates the rapid and precise threading of the off-axis dual-mirror product on an optical-mechanical assembly platform. While ensuring product accuracy, this invention improves work efficiency and reduces assembly costs, promising broad application prospects.

Description

Technical Field

[0001] The present invention belongs to the technical field of optical-mechanical assembly and adjustment, and in particular relates to a method for finding and monitoring the zero-degree field of view optical axis of an off-axis mirrorless product. Background Art

[0002] The development of airborne weapons has placed increasing demands on the detection range of optoelectronic products. Off-axis dual-conductor (DBI) systems, with their advantages of achromatic aberration, compact structure, lightweight design, and large aperture, are widely used in optical systems in aviation and aerospace. However, during optical and mechanical alignment of DBIs, finding the optical axis of the field of view is cumbersome, hindering the rapid and accurate threading of the DBIs. Summary of the Invention

[0003] In view of this, the present invention proposes a method for finding and monitoring the zero-degree field of view optical axis of an off-axis two-mirror product, which realizes the monitoring of the zero-degree field of view optical axis of the off-axis two-mirror product at any time during the assembly and adjustment process, and facilitates the off-axis two-mirror product to carry out the axis threading work quickly and accurately on the optical and mechanical assembly and adjustment platform. While ensuring product accuracy, this invention improves work efficiency and reduces assembly costs, and has broad application prospects.

[0004] In order to achieve the above technical objectives, the specific technical solutions adopted by the present invention are:

[0005] A method for finding the zero-degree field of view optical axis of an off-axis mirrored product is based on an optical axis finding device, wherein the optical axis finding device includes a laser interferometer, a flat crystal, and an adjustable reflector;

[0006] The method for finding the zero-degree field optical axis of the off-axis two-mirror product comprises the following steps:

[0007] S101: aligning the laser interferometer and the flat crystal; then keeping the laser interferometer and the flat crystal unchanged;

[0008] S102: Finding the optical axis of the zero-degree field of view of the off-axis two-inverted product on the laser interferometer; maintaining the relative posture between the laser interferometer and the off-axis two-inverted product;

[0009] S103: self-aligning the laser interferometer and the adjustable reflector; removing the off-axis two-reflection product and keeping the position of the off-axis two-reflection product on the adjustable reflector unchanged.

[0010] Furthermore, in S101, the method for self-aligning the laser interferometer and the flat crystal is specifically as follows: the laser interferometer is switched to the self-alignment mode, the flat crystal is adjusted so that the self-alignment image spot of the laser interferometer beam after passing through the flat crystal coincides with the original image spot of the laser interferometer, and the test mode is switched to obtain a clear interference fringe image by adjusting the flat crystal, and the interference fringes are minimized.

[0011] Furthermore, in S102, the method for finding the optical axis of the zero-degree field of view of the off-axis two-reflection product on the laser interferometer is specifically as follows: the off-axis two-reflection product clamped on the adjustable reflector by the tooling is placed between the laser interferometer and the flat crystal, and the laser interferometer is switched to the self-alignment mode so that the laser interferometer light beam covers the light-transmitting aperture of the off-axis two-reflection product, and the optical path position of the off-axis two-reflection product is adjusted so that the self-aligned image spot of the laser interferometer light beam after passing through the off-axis two-reflection product and the flat crystal coincides with the original image spot of the laser interferometer; then, the laser interferometer is switched to the test mode, and a clear interference fringe image is obtained in the laser interferometer by adjusting the optical path position of the off-axis two-reflection product, and the interference fringes are minimized. At this time, the optical axis of the zero-degree field of view of the off-axis two-reflection product is parallel to the optical axis of the laser interferometer.

[0012] Furthermore, in S103, the method for self-aligning the laser interferometer and the adjustable reflector is specifically as follows: keep the laser interferometer and the off-axis two-mirror product stationary, install the adjustable reflector on the off-axis two-mirror product, the laser interferometer beam covers the light aperture of the adjustable reflector, the laser interferometer is switched to the self-alignment mode, and the adjustable reflector on the off-axis two-mirror product is adjusted so that the self-alignment image spot of the laser interferometer beam after passing through the adjustable reflector coincides with the original image spot of the laser interferometer, and the test mode is switched to obtain a clear interference fringe image by adjusting the adjustable reflector, and the interference fringes are minimized. At this time, the normal of the adjustable reflector is the optical axis of the zero-degree field of view of the off-axis two-mirror product.

[0013] The present invention further proposes an optical axis monitoring method after the above-mentioned method for finding the zero-degree field of view optical axis of the off-axis two-mirror product is completed. The method is implemented based on a monitoring device, wherein the monitoring device includes an internal focusing telescope, an autocollimator, and a flat crystal. The monitoring method includes the following steps:

[0014] S201: converting the optical axis of the zero-degree field of view of the off-axis two-mirror product to the optical axis of the autocollimator; then keeping the autocollimator stationary;

[0015] S202: Ensure that the optical axis of the autocollimator is parallel to the optical axis of the inner focusing telescope; keep the inner focusing telescope stationary;

[0016] S203: Use an autocollimator to monitor the zero-degree field of view optical axis of the off-axis two-mirror product at any time during the installation and adjustment process.

[0017] Furthermore, the method of converting the optical axis of the zero-degree field of view of the off-axis mirrored product to the optical axis of the autocollimator in S201 is specifically as follows: aligning the autocollimator with the adjustable reflector on the off-axis mirrored product, ensuring that the off-axis mirrored product does not move, and adjusting the position of the autocollimator so that the autocollimator and the adjustable reflector are aligned and the autocollimation accuracy is ≤5".

[0018] Furthermore, the method for ensuring that the optical axis of the autocollimator and the optical axis of the inner focusing telescope are parallel in S202 is specifically as follows: even if the light beam of the inner focusing telescope covers the light aperture of the off-axis two mirror products, a flat crystal is placed in front of the inner focusing telescope and the autocollimator, the position of the flat crystal is adjusted so that the autocollimator and the flat crystal are aligned with the autocollimation accuracy of ≤5", the inner focusing telescope is adjusted while keeping the flat crystal stationary so that the inner focusing telescope and the flat crystal are aligned with the autocollimation accuracy of ≤5", and the flat crystal is removed.

[0019] Furthermore, the method for using the autocollimator in S203 to monitor the zero-degree field of view optical axis of the off-axis two-mirror product at any time during the installation and adjustment process is specifically as follows: the off-axis two-mirror product performs optical system axis penetration work based on the internal focusing telescope, and the autocollimator is used to monitor the zero-degree field of view optical axis of the off-axis two-mirror product at any time during the installation and adjustment process; if the angle of the off-axis two-mirror product changes spatially, the off-axis two-mirror product is adjusted so that the autocollimator and the adjustable reflector on the off-axis two-mirror product are aligned and the autocollimation accuracy is ≤5", so that the autocollimator can monitor the zero-degree field of view optical axis of the off-axis two-mirror product through the adjustable reflector on the off-axis two-mirror product. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the following briefly introduces the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present disclosure. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0021] Figure 1 This is a schematic structural diagram of an optical axis finding device in a specific embodiment of the present invention;

[0022] Figure 2 It is a structural diagram of a monitoring device in a specific embodiment of the present invention;

[0023] Among them: 1. Laser interferometer; 2. Flat crystal; 3. Adjustable reflector; 4. Off-axis mirror product; 5. Internal focusing telescope; 6. Autocollimator. DETAILED DESCRIPTION

[0024] The embodiments of the present disclosure are described in detail below with reference to the accompanying drawings.

[0025] The following describes the embodiments of the present disclosure through specific examples, and those skilled in the art can easily understand other advantages and effects of the present disclosure from the contents disclosed in this specification. Obviously, the described embodiments are only a part of the embodiments of the present disclosure, rather than all of the embodiments. The present disclosure can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed in various ways based on different viewpoints and applications without departing from the spirit of the present disclosure. It should be noted that, in the absence of conflict, the following embodiments and features in the embodiments can be combined with each other. Based on the embodiments in the present disclosure, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present disclosure.

[0026] It should be noted that various aspects of the embodiments within the scope of the appended claims are described below. It should be apparent that the aspects described herein can be embodied in a wide variety of forms, and any specific structure and / or function described herein is merely illustrative. Based on this disclosure, it should be understood by those skilled in the art that an aspect described herein can be implemented independently of any other aspect, and two or more of these aspects can be combined in various ways. For example, any number of aspects described herein can be used to implement an apparatus and / or practice a method. In addition, other structures and / or functionalities other than one or more of the aspects described herein can be used to implement this apparatus and / or practice this method.

[0027] It should also be noted that the illustrations provided in the following embodiments are only schematic illustrations of the basic concept of the present disclosure. The illustrations only show components related to the present disclosure and are not drawn according to the number, shape and size of components in actual implementation. In actual implementation, the type, quantity and proportion of each component can be changed at will, and the component layout type may also be more complicated.

[0028] Additionally, in the following description, specific details are provided to provide a thorough understanding of the examples. However, one skilled in the art will appreciate that the aspects described can be practiced without these specific details.

[0029] In one embodiment of the present invention, a method for finding the zero-degree field optical axis of an off-axis two-mirror product is proposed, which is based on an optical axis finding device, such as Figure 1 As shown, the optical axis finding device includes a laser interferometer 1, a flat crystal 2 and an adjustable reflector 3;

[0030] The method for finding the zero-degree field of view optical axis of the off-axis dual-mirror product includes the following steps:

[0031] S101: Align the laser interferometer 1 and the flat crystal 2; then keep the laser interferometer 1 and the flat crystal 2 unchanged;

[0032] S102: Finding the optical axis of the zero-degree field of view of the off-axis two-inversion product 4 on the laser interferometer 1; maintaining the relative posture between the laser interferometer 1 and the off-axis two-inversion product 4;

[0033] S103: self-aligning the laser interferometer 1 and the adjustable reflector 3; removing the off-axis two-reflection product 4, and keeping the position of the off-axis two-reflection product 4 on the adjustable reflector 3 unchanged.

[0034] In this embodiment, in S101, the method for self-aligning the laser interferometer 1 and the flat crystal 2 is specifically as follows: the laser interferometer 1 is switched to the self-alignment mode, the flat crystal 2 is adjusted so that the self-alignment image spot of the laser interferometer 1 light beam after passing through the flat crystal 2 coincides with the original image spot of the laser interferometer 1, and the test mode is switched to obtain a clear interference fringe image by adjusting the flat crystal 2, and the interference fringes are minimized.

[0035] In S102 of this embodiment, the method for finding the optical axis of the zero-degree field of view of the off-axis two-reflection product 4 on the laser interferometer 1 is specifically as follows: the off-axis two-reflection product 4 clamped on the adjustable reflector 3 by the tooling is placed between the laser interferometer 1 and the flat crystal 2, and the laser interferometer 1 is switched to the self-collimation mode so that the light beam of the laser interferometer 1 covers the light aperture of the off-axis two-reflection product 4, and the optical path position of the off-axis two-reflection product 4 is adjusted so that the self-collimation image spot of the laser interferometer 1 after passing through the off-axis two-reflection product 4 and the flat crystal 2 coincides with the original image spot of the laser interferometer 1; then the laser interferometer 1 is switched to the test mode, and a clear interference fringe image is obtained in the laser interferometer 1 by adjusting the optical path position of the off-axis two-reflection product 4, and the interference fringes are minimized. At this time, the optical axis of the zero-degree field of view of the off-axis two-reflection is parallel to the optical axis of the laser interferometer 1.

[0036] In S103 of this embodiment, the method for self-aligning the laser interferometer 1 and the adjustable mirror 3 is specifically as follows: keep the laser interferometer 1 and the off-axis two-reflection product 4 stationary, install the adjustable mirror 3 on the off-axis two-reflection product 4, the laser interferometer 1 light beam covers the light aperture of the adjustable mirror 3, the laser interferometer 1 is switched to the self-alignment mode, and the adjustable mirror 3 on the off-axis two-reflection product 4 is adjusted to make the self-alignment image spot of the laser interferometer 1 light beam after passing through the adjustable mirror 3 coincide with the original image spot of the laser interferometer 1, and switch to the test mode, and obtain a clear interference fringe image by adjusting the adjustable mirror 3, and minimize the interference fringes. At this time, the normal of the adjustable mirror 3 is the optical axis of the zero-degree field of view of the off-axis two-reflection product 4.

[0037] Based on the same inventive concept, in one embodiment of the present invention, an optical axis monitoring method based on the above-mentioned off-axis two-mirror product 4 zero-degree field of view optical axis search method is proposed, which is implemented based on a monitoring device, such as Figure 2 As shown, the monitoring device includes an internal focusing telescope 5, an autocollimator 6 and a flat crystal 2; the monitoring method includes the following steps:

[0038] S201: converting the optical axis of the zero-degree field of view of the off-axis two-mirror product 4 to the optical axis of the autocollimator 6; then keeping the autocollimator 6 stationary;

[0039] S202: Ensure that the optical axis of the autocollimator 6 is parallel to the optical axis of the inner focusing telescope 5; keep the inner focusing telescope 5 stationary;

[0040] S203: Use the autocollimator 6 to monitor the zero-degree field of view optical axis of the off-axis two-mirror product 4 at any time during the installation and adjustment process.

[0041] In this embodiment, the method of converting the optical axis of the zero-degree field of view of the off-axis two-mirror product 4 to the optical axis of the autocollimator 6 in S201 is specifically as follows: aligning the autocollimator with the adjustable reflector 3 on the off-axis two-mirror product 4, ensuring that the off-axis two-mirror product 4 does not move, and adjusting the position of the autocollimator 6 so that the autocollimator 6 and the adjustable reflector 3 are aligned and the autocollimation accuracy is ≤5".

[0042] In this embodiment, the method for ensuring that the optical axis of the autocollimator 6 is parallel to the optical axis of the internal focusing telescope 5 in S202 is specifically as follows: even if the light beam of the internal focusing telescope 5 covers the light aperture of the off-axis two-mirror product 4, and a flat crystal 2 is placed in front of the internal focusing telescope 5 and the autocollimator 6, the position of the flat crystal 2 is adjusted so that the autocollimator 6 is aligned with the flat crystal 2 and the self-alignment accuracy is ≤5", the internal focusing telescope 5 is kept stationary, so that the internal focusing telescope 5 is aligned with the flat crystal 2 and the self-alignment accuracy is ≤5", and the flat crystal 2 is taken out.

[0043] In this embodiment, the method of using the autocollimator 6 in S203 to monitor the zero-degree field of view optical axis of the off-axis two-mirror product 4 at any time during the adjustment process is specifically as follows: the off-axis two-mirror product 4 performs the optical system through-axis work based on the internal focusing telescope 5, and the autocollimator 6 is used to monitor the zero-degree field of view optical axis of the off-axis two-mirror product 4 at any time during the adjustment process. If the angle of the off-axis two-mirror product 4 changes spatially, the off-axis two-mirror product 4 is adjusted so that the autocollimator 6 and the adjustable reflector 3 on the off-axis two-mirror product 4 are aligned and the autocollimation accuracy is ≤5", so that the autocollimator 6 can monitor the zero-degree field of view optical axis of the off-axis two-mirror product 4 through the adjustable reflector 3 on the off-axis two-mirror product 4. The above is only a specific embodiment of the present disclosure, but the scope of protection of the present disclosure is not limited thereto. Any changes or substitutions that can be easily conceived by any person skilled in the art within the technical scope disclosed in the present disclosure should be covered by the scope of protection of the present disclosure. Therefore, the scope of protection of the present disclosure should be based on the scope of protection of the claims.

Claims

1. A method for finding the zero-degree field of view optical axis of an off-axis mirrorless product, characterized in that: The optical axis search device includes a laser interferometer, a flat crystal, and an adjustable reflector. The method for finding the zero-degree field optical axis of the off-axis two-mirror product comprises the following steps: S101: aligning the laser interferometer and the flat crystal; then keeping the laser interferometer and the flat crystal unchanged; S102: finding the optical axis of the zero-degree field of view of the off-axis two-reflection product on the laser interferometer; maintaining the relative posture between the laser interferometer and the off-axis two-reflection product, and finding the optical axis of the zero-degree field of view of the off-axis two-reflection product on the laser interferometer is specifically as follows: placing the off-axis two-reflection product clamped on the adjustable reflector based on the tooling between the laser interferometer and the flat crystal, switching the laser interferometer to the autocollimation mode, so that the laser interferometer beam covers the clear aperture of the off-axis two-reflection product, and adjusting the optical path posture of the off-axis two-reflection product so that the autocollimation image spot of the laser interferometer beam after passing through the off-axis two-reflection product and the flat crystal coincides with the original image spot of the laser interferometer; then switching the laser interferometer to the test mode, and obtaining a clear interference fringe image in the laser interferometer by adjusting the optical path posture of the off-axis two-reflection product, and making the interference fringes as small as possible, at this time the zero-degree field optical axis of the off-axis two-reflection product is parallel to the optical axis of the laser interferometer; S103: self-aligning the laser interferometer and the adjustable reflector; removing the off-axis two-reflection product and keeping the positions of the off-axis two-reflection product on the adjustable reflector unchanged.

2. The method for finding the zero-degree field of view optical axis of an off-axis mirrorless product according to claim 1, characterized in that: In S101, the method for self-aligning the laser interferometer and the flat crystal is specifically as follows: the laser interferometer is switched to the self-alignment mode, the flat crystal is adjusted so that the self-alignment image spot of the laser interferometer beam after passing through the flat crystal coincides with the original image spot of the laser interferometer, and the test mode is switched to obtain a clear interference fringe image by adjusting the flat crystal, and the interference fringes are minimized.

3. The method for finding the zero-degree field of view optical axis of an off-axis mirrorless product according to claim 2, characterized in that: In S103, the method for self-aligning the laser interferometer and the adjustable reflector is specifically as follows: keep the laser interferometer and the off-axis two-mirror product stationary, install the adjustable reflector on the off-axis two-mirror product, the laser interferometer beam covers the light aperture of the adjustable reflector, the laser interferometer is switched to the self-alignment mode, and the adjustable reflector on the off-axis two-mirror product is adjusted so that the self-alignment image spot of the laser interferometer beam after passing through the adjustable reflector coincides with the original image spot of the laser interferometer, and the test mode is switched to obtain a clear interference fringe image by adjusting the adjustable reflector, and the interference fringes are minimized. At this time, the normal of the adjustable reflector is the optical axis of the zero-degree field of view of the off-axis two-mirror product.

4. An optical axis monitoring method based on the method for finding the zero-degree field of view optical axis of an off-axis two-mirror product according to any one of claims 1 to 3, characterized in that: The monitoring device is implemented based on the monitoring device, which includes an internal focusing telescope, an autocollimator and a flat crystal; the monitoring method includes the following steps: S201: converting the optical axis of the zero-degree field of view of the off-axis two-mirror product to the optical axis of the autocollimator; then keeping the autocollimator stationary; S202: Ensure that the optical axis of the autocollimator is parallel to the optical axis of the inner focusing telescope; keep the inner focusing telescope stationary; S203: Use an autocollimator to monitor the zero-degree field of view optical axis of the off-axis two-mirror product at any time during the assembly and adjustment process.

5. The optical axis monitoring method according to claim 4, characterized in that: The method for converting the optical axis of the zero-degree field of view of the off-axis two-mirror product to the optical axis of the autocollimator in S201 is specifically as follows: aligning the autocollimator with the adjustable reflector on the off-axis two-mirror product, ensuring that the off-axis two-mirror product does not move, and adjusting the position of the autocollimator so that the autocollimator and the adjustable reflector are aligned and the autocollimation accuracy is ≤5".

6. The optical axis monitoring method according to claim 5, characterized in that: The method for ensuring that the optical axis of the autocollimator and the optical axis of the inner focusing telescope are parallel in the above-mentioned S202 is specifically as follows: even if the light beam of the inner focusing telescope covers the light aperture of the off-axis two mirror products, a flat crystal is placed in front of the inner focusing telescope and the autocollimator, the position of the flat crystal is adjusted so that the autocollimator and the flat crystal are aligned with the autocollimation accuracy of ≤5", the inner focusing telescope is adjusted while keeping the flat crystal stationary so that the inner focusing telescope and the flat crystal are aligned with the autocollimation accuracy of ≤5", and the flat crystal is removed.

7. The optical axis monitoring method according to claim 6, characterized in that: The method of using the autocollimator in S203 to monitor the zero-degree field of view optical axis of the off-axis two-mirror product at any time during the installation and adjustment process is specifically as follows: the off-axis two-mirror product performs optical system axis penetration work based on the internal focusing telescope, and the autocollimator is used to monitor the zero-degree field of view optical axis of the off-axis two-mirror product at any time during the installation and adjustment process; if the angle of the off-axis two-mirror product changes in space, the off-axis two-mirror product is adjusted so that the autocollimator and the adjustable reflector on the off-axis two-mirror product are aligned with the autocollimation accuracy of ≤5", so that the autocollimator can monitor the zero-degree field of view optical axis of the off-axis two-mirror product through the adjustable reflector on the off-axis two-mirror product.

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