Test method and device for server configuration, electronic equipment and storage medium

Abstract

This invention provides a server configuration testing method, apparatus, electronic device, and storage medium. First, it analyzes the test maturity of baseline test cases by using baseline test case data and considering relevant influencing factors. Then, it further determines the referenceability of baseline test cases by comparing the variance of test maturity. Finally, it marks baseline test cases according to different levels of reference, intuitively displaying their reference priority. This method can more efficiently improve the entire testing process and reasonably assist the test manager (VM) in allocating the execution order of baseline test cases based on their test maturity, ensuring that testing is completed within the required timeframe. Compared to manual configuration, this significantly improves testing efficiency and quality.

Description

Technical Field

[0001] This invention relates to the field of server technology, and in particular to a server configuration testing method, a server configuration testing apparatus, an electronic device, and a computer-readable storage medium. Background Technology

[0002] With the continuous iteration and updates of servers, multiple tests of server performance and related projects are essential to ensure normal operation during use. Server testing, whether manual or automated, relies heavily on specific baseline test cases. Currently, to avoid major bugs (errors / vulnerabilities) later in the testing process, the common approach is for the Verify Manager (VM) to allocate different baseline test case data based on their experience within the planned testing timeframe. This data is then selectively distributed to Test Engineers (TEs) for testing, aiming to ensure the project can be completed within the stipulated time. However, this method relies on the VM's experience to allocate baseline test cases, often lacking reliable reference points during manual configuration. This can lead to bugs not being resolved within the limited time, hindering timely completion of testing and significantly impacting testing efficiency and quality. Summary of the Invention

[0003] The present invention provides a method, apparatus, electronic device, and computer-readable storage medium for testing server configuration, in order to solve or partially solve the problem of low testing efficiency and quality caused by the lack of reliable reference data when testing servers based on manual configuration.

[0004] This invention discloses a method for testing server configuration, the method comprising:

[0005] Obtain the baseline test cases corresponding to the test tasks configured for the server, and the baseline test case data corresponding to the baseline test cases, wherein the baseline test cases are used to describe the test tasks;

[0006] The baseline test case data is used to calculate and obtain the test maturity corresponding to the baseline test case. The test maturity is used to characterize the stability of the test task.

[0007] If the test maturity is not equal to zero, then calculate the current test maturity variance corresponding to the baseline test case based on the test maturity.

[0008] Obtain the reference test maturity variance corresponding to the baseline test case, and determine the target display style for the baseline test case based on the current test maturity variance and the reference test maturity variance, and mark the baseline test case based on the target display style;

[0009] The display shows the marked baseline test cases and the corresponding test maturity levels of those baseline test cases.

[0010] Optionally, determining the target display style for the baseline test cases based on the current test maturity variance and the reference test maturity variance, and marking the baseline test cases based on the target display style, includes:

[0011] If the current test maturity variance is less than or equal to the reference test maturity variance, then the target display style for the baseline test case is determined to be the first preset display style, and the baseline test case is marked with the first preset display style;

[0012] If the current test maturity variance is greater than the reference test maturity variance, then the target display style for the baseline test case is determined to be the second preset display style, and the baseline test case is marked with the second preset display style.

[0013] Optionally, the method further includes:

[0014] If the test maturity is zero, then extract the test case reference count from the baseline test case data;

[0015] If the number of references to the test case is zero, then the target display style for the baseline test case is determined to be the third preset display style, and the baseline test case is marked with the third preset display style;

[0016] If the number of references to the test case is not zero, then the target display style for the baseline test case is determined to be the fourth preset display style, and the baseline test case is marked with the fourth preset display style.

[0017] Optionally, the baseline test case data includes the average number of errors, the error frequency of each type of error, and the severity level of each type of error. The step of using the baseline test case data to calculate the test maturity corresponding to the baseline test cases includes:

[0018] The test maturity corresponding to the baseline test cases is obtained by calculating the average number of errors, the error frequency of each type of error, and the severity level of each type of error.

[0019] Optionally, the method further includes:

[0020] Obtain the number of errors occurring, the number of test case references, the probability coefficient of each type of error, the number of occurrences of each type of error, the severity coefficient of each type of error, and the number of occurrences of each type of error corresponding to the baseline test case;

[0021] The average number of errors is calculated using the number of errors occurring and the number of test case references.

[0022] The error frequency of each type of error is obtained by calculating the number of errors that occur, the probability coefficient of each type of error, and the number of errors that occur for each type of error.

[0023] The severity level of each type of error is obtained by calculating the number of errors that occurred, the severity level coefficient of each type of error, and the number of errors that occurred for each type of error.

[0024] The average number of errors, the frequency of each type of error, and the severity level of each type of error are used as the baseline test case data corresponding to the baseline test cases.

[0025] Optionally, the method further includes:

[0026] In response to the baseline test case library creation operation for the test task, a new baseline test case library corresponding to the test task is created.

[0027] The baseline test cases and their data are stored in the baseline test case library.

[0028] Optionally, the baseline test case data includes the historical test maturity of the baseline test cases at different testing phases, and the method further includes:

[0029] The test maturity variance corresponding to the baseline test cases is obtained by calculating the historical test maturity levels.

[0030] This invention also discloses a server configuration testing device, the device comprising:

[0031] The baseline test case acquisition module is used to acquire the baseline test cases corresponding to the test tasks configured for the server, as well as the baseline test case data corresponding to the baseline test cases. The baseline test cases are used to describe the test tasks.

[0032] The test maturity generation module is used to calculate the test maturity corresponding to the baseline test cases using the baseline test case data. The test maturity is used to characterize the stability of the test task.

[0033] The current test maturity variance calculation module is used to calculate the current test maturity variance corresponding to the baseline test case based on the test maturity if the test maturity is not equal to zero.

[0034] The baseline test case marking module is used to obtain the reference test maturity variance corresponding to the baseline test case, and determine the target display style for the baseline test case based on the current test maturity variance and the reference test maturity variance, and mark the baseline test case based on the target display style;

[0035] The test maturity display module is used to display the marked baseline test cases and the test maturity corresponding to the baseline test cases.

[0036] Optionally, the baseline test case tagging module includes:

[0037] The first preset display style determination module is used to determine the target display style for the baseline test case as the first preset display style if the current test maturity variance is less than or equal to the reference test maturity variance, and to mark the baseline test case with the first preset display style.

[0038] The second preset display style determination module is used to determine the target display style for the baseline test case as the second preset display style if the current test maturity variance is greater than the reference test maturity variance, and to mark the baseline test case with the second preset display style.

[0039] Optionally, the device further includes:

[0040] The test case reference count extraction module is used to extract the test case reference count from the baseline test case data if the test maturity is equal to zero.

[0041] The third preset display style determination module is used to determine the target display style for the baseline test case as the third preset display style if the number of references of the test case is equal to zero, and to mark the baseline test case with the third preset display style;

[0042] The fourth preset display style determination module is used to determine the target display style for the baseline test case as the fourth preset display style if the number of references of the test case is not equal to zero, and to mark the baseline test case with the fourth preset display style.

[0043] Optionally, the baseline test case data includes the average number of errors, the error frequency of each type of error, and the severity level of each type of error. The test maturity generation module is specifically used for:

[0044] The test maturity corresponding to the baseline test cases is obtained by calculating the average number of errors, the error frequency of each type of error, and the severity level of each type of error.

[0045] Optionally, the device further includes:

[0046] The baseline test case data acquisition module is used to acquire the number of errors occurring, the number of test case references, the probability coefficient of each type of error, the number of errors occurring, the severity coefficient of each type of error, and the number of errors occurring for each type of error.

[0047] The average number of errors generated is used to calculate the average number of errors by using the number of errors and the number of times the test cases are referenced.

[0048] The error occurrence frequency generation module is used to calculate the error occurrence frequency of each type of error by using the number of errors, the probability coefficient of each type of error, and the number of occurrences of each type of error.

[0049] The error severity level generation module is used to calculate the severity level of each type of error by using the number of times the error occurred, the severity level coefficient of each type of error, and the number of times each type of error occurred.

[0050] The baseline test case data determination module is used to take the average number of errors, the error frequency of each type of error, and the severity level of each type of error as the baseline test case data corresponding to the baseline test case.

[0051] Optionally, the device further includes:

[0052] The baseline test case library creation module is used to create a new baseline test case library corresponding to the test task in response to the baseline test case library creation operation for the test task.

[0053] The baseline test case data storage module is used to store the baseline test cases and the baseline test case data in the baseline test case library.

[0054] Optionally, the baseline test case data includes the historical test maturity of the baseline test cases at different testing phases, and the apparatus further includes:

[0055] The test maturity variance generation module is used to calculate the test maturity variance corresponding to the baseline test cases by using the historical test maturity values.

[0056] This invention also discloses an electronic device, including a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory communicate with each other through the communication bus;

[0057] The memory is used to store computer programs;

[0058] When the processor executes a program stored in the memory, it implements the method described in the embodiments of the present invention.

[0059] This invention also discloses a computer-readable storage medium storing instructions that, when executed by one or more processors, cause the processors to perform the methods described in this invention.

[0060] The embodiments of the present invention have the following advantages:

[0061] In this embodiment of the invention, a testing method for baseline test case maturity analysis based on server configuration is provided. First, the test maturity of the baseline test cases is analyzed using baseline test case data and relevant influencing factors. Then, the referenceability of the baseline test cases is further determined by comparing the variance of test maturity. Finally, the baseline test cases are marked according to different levels of reference, which more intuitively displays the reference priority of the baseline test cases. This testing method can more efficiently improve the entire testing process and reasonably assist the test manager (VM) in allocating the execution order of baseline test cases according to their test maturity, ensuring that the testing work can be completed within the required time. Compared with manual configuration, this method greatly improves testing efficiency and quality. Attached Figure Description

[0062] Figure 1 This is a flowchart of the steps of a server configuration testing method provided in an embodiment of the present invention;

[0063] Figure 2 This is a flowchart of the steps of a server configuration testing method provided in an embodiment of the present invention;

[0064] Figure 3 This is a flowchart illustrating a server configuration testing method provided in an embodiment of the present invention;

[0065] Figure 4This is a structural block diagram of a server configuration testing device provided in an embodiment of the present invention;

[0066] Figure 5 This is a block diagram of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0067] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0068] To enable those skilled in the art to better understand the technical solutions in the embodiments of the present invention, some technical features involved in the embodiments of the present invention are explained and described below:

[0069] Baseline test cases: For server-related tests, a set of test inputs, execution conditions, and expected results are compiled for a specific goal, in order to test whether the server configuration meets a specific requirement. Baseline test cases can be used to describe test tasks, such as textual descriptions.

[0070] Baseline test case data: Relevant data for baseline test cases, including but not limited to the average number of errors during the testing process, the frequency of each type of error, and the severity level of each type of error.

[0071] Test maturity: refers to the maturity of baseline test cases. It can be used to characterize the stability of testing tasks. The higher the maturity, the more stable the baseline test case data has become after a long period of accumulation, and the more reliable it is for reference.

[0072] Test maturity variance: The data obtained by calculating the variance of multiple test maturity levels of baseline test cases can be used to characterize the data fluctuation of baseline test cases. In this invention, the stability of the test task corresponding to the baseline test case can be determined by combining test maturity and test maturity variance.

[0073] As an example, with the rapid development of the internet, various industries (especially those primarily engaged in internet business) have increasingly higher requirements for servers, reflecting the continuous challenges to the quantity and performance of servers. This further drives the continuous iteration and upgrading of servers. Therefore, the ability to conduct efficient and high-quality server testing is crucial. To ensure the normal operation of servers during use, multiple tests on server performance and various related projects are an essential step. For server testing, whether manual or automated, specific baseline test cases are indispensable. Currently, when testing various aspects of a server, to avoid major bugs (errors / vulnerabilities) later in the testing process, the common method is for the VM (Verify Manager) to allocate different baseline test case data based on their experience within the planned testing time of the project, and then selectively distribute them to the TE (Test Manager). The test engineer conducts the testing to ensure that the project can be completed within the specified time. When using this method to test the server, the test manager (VM), as the decision-maker, relies on his own experience to allocate baseline test cases. In the process of manual configuration, there is often a lack of reliable reference, which can easily lead to bugs not being resolved within the limited time. This makes it impossible to guarantee that the project test can be completed within the specified time, which greatly affects the testing efficiency and test quality.

[0074] One of the core inventive points of this invention is to provide a testing method for baseline test case maturity analysis based on server configuration. First, the baseline test case data, combined with relevant influencing factors, is used to analyze the test maturity of the baseline test cases. Then, by comparing the variance of test maturity, the referenceability of the baseline test cases is further determined. Finally, the baseline test cases are marked according to different levels of reference, which more intuitively displays the reference priority of the baseline test cases. Therefore, this testing method can more efficiently improve the entire testing process and reasonably assist the test manager (VM) in allocating the execution order of baseline test cases according to their test maturity, ensuring that the testing work can be completed within the required time. Compared with manual configuration, this method can greatly improve testing efficiency and quality.

[0075] Reference Figure 1 The diagram illustrates a flowchart of a server configuration testing method provided in an embodiment of the present invention, which may specifically include the following steps:

[0076] Step 101: Obtain the baseline test cases corresponding to the test tasks configured for the server, and the baseline test case data corresponding to the baseline test cases. The baseline test cases are used to describe the test tasks.

[0077] When configuring a server, it is essential to perform multiple tests to ensure its proper functioning during use. Whether manual or automated, server testing relies on specific baseline test cases. Therefore, it is crucial to first obtain and analyze these baseline test cases to assess their reliability. In practice, this involves acquiring the baseline test cases corresponding to the server configuration test tasks, along with the baseline test case data. These baseline test cases can be used to describe the test tasks; specifically, describing the operational steps of the test system in a specific format.

[0078] Test tasks can be test projects configured for servers. A baseline test case can go through multiple different test projects. Therefore, the baseline test case data can be various data generated or calculated during each test project, such as the number of errors, error frequency, and severity level. For a baseline test case, a test maturity level can be calculated for each test project. After a period of testing, a certain number of test maturity levels can be obtained. Then, the test maturity variance corresponding to the baseline test case can be calculated. Finally, by combining the test maturity level and the test maturity variance, the data fluctuation of the baseline test case can be analyzed, thereby further determining the reference value of the baseline test case.

[0079] Meanwhile, the solution proposed in this invention can be applied to a baseline test case maturity analysis platform for test tasks configured on servers, built on frameworks such as Spring (an open-source framework), SpringMVC (an open-source framework for model-view-controller), and MyBatis (an open-source, lightweight data persistence framework).

[0080] It should be noted that, in addition to the commonly used frameworks listed above, the test case maturity analysis platform built by this invention can also be applied to other platforms built on Java language frameworks, such as Spring Boot (a brand new framework), Helidon SE (a micro framework), Ktor (an asynchronous open source framework), Quarkus (a native Java framework for Kubernetes), etc. This invention does not limit these applications.

[0081] Step 102: Calculate the test maturity corresponding to the baseline test case using the baseline test case data. The test maturity is used to characterize the stability of the test task.

[0082] Specifically, after obtaining the baseline test case data corresponding to the baseline test cases, the baseline test case data can be used to calculate and obtain the test maturity corresponding to the baseline test cases. The test maturity is used to characterize the stability of the test task.

[0083] A higher test maturity level indicates a higher priority for the baseline test case. The basic factors influencing the maturity of a baseline test case include the average number of errors occurring based on past baseline test case data, the frequency of each type of error (i.e., different frequencies of occurrence corresponding to different error severity levels), and the severity level of each type of error. The formula for calculating test maturity is: Test Maturity = Average Number of Errors * Sum of Error Frequencies for Each Type of Error * Sum of Severity Levels for Each Type of Error. Thus, the test maturity level corresponding to the baseline test case can be obtained based on past baseline test case data. The longer the testing time and the more test projects involved, the more data is obtained, and the more stable and reliable the value becomes.

[0084] Step 103: If the test maturity is not equal to zero, calculate the current test maturity variance corresponding to the baseline test case based on the test maturity.

[0085] For server testing, a new baseline test case does not necessarily reflect the usability of the current baseline test case; on the contrary, it may reduce the referenceability of the baseline test case. Therefore, when calculating the test maturity of a baseline test case, if the average number of errors (or the number of errors) is zero, the test maturity of the baseline test case will be zero, and its referenceability can be considered low. Conversely, when the test maturity is not zero, the baseline test case can be considered referenceable. However, the specific referenceability can be further determined by calculating the variance of the current test maturity corresponding to the baseline test case, and by comparing the variance of the test maturity, the referenceability of the baseline test case can be further judged.

[0086] Step 104: Obtain the reference test maturity variance corresponding to the baseline test case, and determine the target display style for the baseline test case based on the current test maturity variance and the reference test maturity variance, and mark the baseline test case based on the target display style;

[0087] In practical implementation, a baseline test case that has been used for a certain period of time can be pre-defined as a reference baseline test case or a standard baseline test case. Since the reference baseline test case has been tested for a certain period of time, various data (especially test maturity and test maturity variance) have become stable and have high reference value, thus it can be used as a reference test case for stability comparison.

[0088] Therefore, after obtaining the current test maturity variance corresponding to the baseline test cases of the current test, the reference test maturity variance corresponding to the baseline test cases can be obtained. Based on the current test maturity variance and the reference test maturity variance, the target display style for the baseline test cases can be determined, and the baseline test cases can be marked based on the target display style. By comparing the current test maturity variance with the reference test maturity variance, the stability of the current test baseline test cases can be further determined. The higher the stability, the higher the referenceability and reference priority. After obtaining the comparison results, the baseline test cases can be marked according to the comparison results. Thus, the test manager (VM) can more intuitively understand the current test status of the baseline test cases based on the target display style corresponding to the marking, thereby further improving test efficiency and test quality.

[0089] Step 105: Display the marked baseline test cases and the test maturity corresponding to the baseline test cases.

[0090] After the baseline test cases are marked with the target display style, the marked baseline test cases and their corresponding test maturity levels can be displayed on the server's display interface for the test manager (VM) to refer to. The test manager (VM) can then more rationally arrange the priority and execution order of the baseline test cases based on their test maturity levels and the corresponding display styles, and adjust the test plan in a timely manner to ensure test efficiency and test quality. This can greatly reduce the risk of major errors occurring later in the test project that could lead to project delays.

[0091] It should be noted that the embodiments of the present invention include, but are not limited to, the examples described above. It is understood that those skilled in the art can make further settings according to actual needs under the guidance of the ideas in the embodiments of the present invention, and the present invention does not limit such settings.

[0092] In this embodiment of the invention, a testing method for baseline test case maturity analysis based on server configuration is provided. First, the test maturity of the baseline test cases is analyzed using baseline test case data and relevant influencing factors. Then, the referenceability of the baseline test cases is further determined by comparing the variance of test maturity. Finally, the baseline test cases are marked according to different levels of reference, which more intuitively displays the reference priority of the baseline test cases. This testing method can more efficiently improve the entire testing process and reasonably assist the test manager (VM) in allocating the execution order of baseline test cases according to their test maturity, ensuring that the testing work can be completed within the required time. Compared with manual configuration, this method greatly improves testing efficiency and quality.

[0093] Reference Figure 2 The diagram illustrates a flowchart of a server configuration testing method provided in an embodiment of the present invention, which may specifically include the following steps:

[0094] Step 201: Obtain the baseline test cases corresponding to the test tasks configured for the server, and the baseline test case data corresponding to the baseline test cases. The baseline test cases are used to describe the test tasks.

[0095] Specifically, the baseline test cases corresponding to the test tasks configured for the server can be obtained, as well as the baseline test case data corresponding to the baseline test cases. The baseline test cases are used to describe the test tasks. Since the relevant content of this part has been explained in detail in the previous embodiments, it will not be repeated here.

[0096] Step 202: Calculate the test maturity corresponding to the baseline test case using the baseline test case data. The test maturity is used to characterize the stability of the test task.

[0097] Specifically, after obtaining the baseline test case data corresponding to the baseline test cases, the baseline test case data can be used to calculate and obtain the test maturity corresponding to the baseline test cases. The test maturity is used to characterize the stability of the test task.

[0098] The higher the test maturity, the higher the priority of the baseline test case. The basic factors affecting the maturity of a baseline test case can include the average number of errors in the data of previous baseline test cases, the frequency of error occurrence for each type of error (i.e., different frequencies of occurrence according to different error severity levels), and the severity level of each type of error.

[0099] In one optional embodiment, the baseline test case data may include the average number of errors, the error frequency of each type of error, and the severity level of each type of error. The test maturity corresponding to the baseline test case can be calculated using the baseline test case data.

[0100] Furthermore, the formula for calculating test maturity can be: Test Maturity = Average Number of Errors * Sum of Error Frequencies for Each Type of Error * Sum of Severity Levels for Each Type of Error. As an example, assuming a baseline test case has an average number of errors of 200, and five types of errors occurred during this test, with frequencies of 0.15, 0.2, 0.2, 0.3, and 0.1 respectively, and severity levels of 0.25, 0.2, 0.4, 0.5, and 0.7 respectively, then the test maturity can be calculated as 200 * (0.15 + 0.2 + 0.2 + 0.3 + 0.1) * (0.25 + 0.2 + 0.4 + 0.5 + 0.7) = 389.5. Thus, based on previous baseline test case data, the test maturity corresponding to this baseline test case can be obtained. The longer the testing period and the more test items involved, the more data is obtained, the more stable the value becomes, and the higher its reliability.

[0101] In one optional embodiment, relevant data that can be directly statistically obtained during the testing process or preset by the testers can be acquired first, such as the number of errors, the number of test case references, and the probability coefficient of occurrence. Then, based on the acquired data, the average number of errors, the frequency of each type of error, and the severity level of each type of error corresponding to the baseline test cases can be further obtained through calculation. Specifically, the calculation process can be as follows: First, acquire the number of errors, the number of test case references, the probability coefficient of each type of error, the number of occurrences of each type of error, the severity coefficient of each type of error, and the number of occurrences of each type of error corresponding to the baseline test cases. Then, calculate the average number of errors using the number of errors and the number of test case references. Calculate the frequency of each type of error using the number of errors, the probability coefficient of each type of error, and the number of occurrences of each type of error. Calculate the severity level of each type of error using the number of errors, the severity coefficient of each type of error, and the number of occurrences of each type of error. Then, use the average number of errors, the frequency of each type of error, and the severity level of each type of error as the baseline test case data corresponding to the baseline test cases, so as to calculate the test maturity and test maturity variance of the baseline test cases in the subsequent process.

[0102] Furthermore, the formula for calculating the average number of errors can be: Average number of errors = Number of errors / Number of test case references. Here, the number of errors can be the total number of all types of errors that occur in a baseline test case throughout the entire testing process, and the number of test case references can be the number of times the baseline test case is used throughout the entire testing process. As an example, assuming that a baseline test case has 1000 errors and 5 references, the average number of errors corresponding to the baseline test case can be calculated to be 200.

[0103] The formula for calculating the frequency of a single type of error is: Probability coefficient of the error type * Number of occurrences of the error type / Number of errors. Here, the probability coefficient represents the probability of the error type occurring. The value of the probability coefficient can be set according to the actual situation, such as: conditionally reproducible (coefficient 1), conditionally probable (coefficient 0.8), difficult to reproduce (coefficient 0.2), and only once (coefficient 0.1). The number of occurrences of a single type of error can be the number of times that type of error occurs in a baseline test case throughout the entire testing process. As an example, suppose a baseline test case has 1000 error occurrences. If the probability coefficient for type A error is 0.8 and the number of occurrences of type A error is 100, the probability coefficient for type B error is 0.2 and the number of occurrences of type B error is 10, and the probability coefficient for type C error is 0.8 and the number of occurrences of type C error is 150, then the frequency of occurrence of type A error can be calculated as 0.08, the frequency of occurrence of type B error is 0.002, and the frequency of occurrence of type C error is 0.12. This method can be used to calculate the error frequency corresponding to each type of error in the baseline test case, and further, the sum of the error frequencies of each type of error can be obtained. In this example, the sum of the error frequencies of types A, B, and C errors is 0.202.

[0104] The formula for calculating the severity level of a single type of error is: Severity level coefficient of the error type * Number of occurrences of the error type / Number of errors. When submitting errors, testers can classify the errors found during testing according to the testing standards and determine the severity level coefficient based on the error level. For example, the severity level coefficients can be set as: Fatal (coefficient 1), Severe (coefficient 0.8), Normal (coefficient 0.2), and Warning (coefficient 0.1). The number of occurrences of a single type of error can be the number of times that type of error occurs in a baseline test case throughout the entire testing process. Using the above example as an illustration, assuming the severity level coefficient for type A error is 0.2, the severity level coefficient for type B error is 0.8, and the severity level coefficient for type C error is 0.2, then the severity level of type A error can be calculated as 0.02, the severity level of type B error as 0.008, and the severity level of type C error as 0.03. Thus, the severity level corresponding to each type of error in the baseline test case can be calculated in this way, and the sum of the severity levels of each type of error can be obtained. For example, in this example, the sum of the severity levels of types A, B, and C errors is 0.058.

[0105] In one optional embodiment, in response to the baseline test case library creation operation for the test task, a new baseline test case library corresponding to the test task can be created, and the baseline test cases and baseline test case data can be stored in the baseline test case library. By establishing the baseline test case library, the various data of the baseline test cases can be better managed and maintained, and the data can be obtained more quickly during the test process, thus speeding up the test.

[0106] It should be noted that the examples listed above are merely illustrative. For ease of explanation, the data has been simplified. In practical applications, the types of errors that occur during a baseline test case are far more numerous than those listed in the examples, and the number of errors will vary depending on the actual application scenario. Furthermore, those skilled in the art can set the error probability coefficient and severity coefficient according to actual needs. In addition, the baseline test case library can be established not only for test tasks but also for server configurations, or for different baseline test cases. It is understood that this invention does not impose any limitations on these aspects.

[0107] Step 203: If the test maturity is not equal to zero, calculate the current test maturity variance corresponding to the baseline test case based on the test maturity.

[0108] Specifically, if the test maturity corresponding to the baseline test case is not equal to zero, the variance of the current test maturity corresponding to the baseline test case can be calculated based on the test maturity.

[0109] For a baseline test case, each time a test project is completed, a test maturity level corresponding to the test project can be obtained based on the test results. In other words, each time a test project is completed, a test maturity variance can be obtained. For example, when conducting the first project test, the first test maturity level can be obtained, and then the first test maturity variance corresponding to the baseline test case can be obtained (equivalent to calculating the variance of a constant, the obtained variance is zero). When conducting the second project test, the second test maturity level can be obtained, and then the variance of the first test maturity level and the second test maturity level can be calculated to obtain the second test maturity variance corresponding to the baseline test case. And so on, each time a test project is completed, the test maturity variance corresponding to the baseline test case and the test project can be obtained.

[0110] After a certain period of time (i.e., after a certain number of test projects), the baseline test cases have obtained a certain amount of test maturity. At this point, a relatively stable test maturity variance can be obtained through variance calculation (i.e., the data fluctuates less during the testing process and gradually tends to stabilize).

[0111] Therefore, the baseline test case data can include the historical test maturity of the baseline test cases in different testing phases (also known as different test tasks or test projects). The specific process for calculating the test maturity variance of the baseline test cases can be as follows: calculate using each historical test maturity to obtain the test maturity variance corresponding to the baseline test cases.

[0112] By calculating the variance of test maturity, the test maturity variance corresponding to the baseline test cases can be obtained. The most recently calculated test maturity variance can be used as the current test maturity variance for comparison with the reference test maturity variance. Based on the comparison results, the priority and reference value of the baseline test cases can be further determined.

[0113] Step 204: Obtain the reference test maturity variance corresponding to the baseline test case. If the current test maturity variance is less than or equal to the reference test maturity variance, determine the target display style for the baseline test case as the first preset display style, and mark the baseline test case with the first preset display style.

[0114] Specifically, a baseline test case that has been used for a certain period of time can be pre-defined as a reference baseline test case or a standard baseline test case. Since the reference baseline test case has been tested for a certain period of time, the various data (especially test maturity and test maturity variance) have become stable and have high reference value, so it can be used as a reference test case for stability comparison.

[0115] After calculating the variance of the current test maturity corresponding to the baseline test case, the reference test maturity variance corresponding to the baseline test case can be obtained. If the current test maturity variance is less than or equal to the reference test maturity variance, the baseline test case can be considered to be stable, with small data fluctuations and high reference value. Then, the target display style for the baseline test case can be determined as the first preset display style, and the baseline test case can be marked with the first preset display style.

[0116] As an example, the first preset display style can be set to red, and baseline test cases can be marked with red. When the test manager (VM) sees the baseline test cases marked with red, he / she can directly determine that the data of the baseline test cases has been accumulated over a long period of time, the maturity is stable, and the reference value is high. He / she can then prioritize them to further improve test efficiency and test quality.

[0117] Step 205: If the current test maturity variance is greater than the reference test maturity variance, then the target display style for the baseline test case is determined to be the second preset display style, and the baseline test case is marked with the second preset display style.

[0118] If the current test maturity variance is greater than the reference test maturity variance, it can be considered that although the baseline test cases have a certain reference value, the data fluctuation is still large and not stable enough. Therefore, the target display style for the baseline test cases can be determined as the second preset display style, and the baseline test cases can be marked with the second preset display style.

[0119] As an example, the second preset display style can be set to yellow, and baseline test cases can be marked with yellow. When the test manager (VM) sees the baseline test cases marked with yellow, he / she can directly determine that the data of the baseline test cases is still in the accumulation stage and the stability is not yet sufficient. It has a certain reference value and can be properly arranged to further improve test efficiency and test quality.

[0120] In one alternative embodiment, during the testing of server configuration, there may be cases where baseline test cases have never been referenced, or where the baseline test cases have been referenced but the number of errors is zero. In such cases, the test maturity can be calculated to be zero, and the cause of the zero test maturity needs to be further determined.

[0121] Therefore, if the test maturity is zero, the test case reference count can be extracted from the baseline test case data. If the test case reference count is zero, it means that the baseline test case has never been referenced. In this case, the target display style for the baseline test case can be determined as the third preset display style, and the baseline test case can be marked with the third preset display style. If the test case reference count is not zero, it means that although the baseline test case has been referenced, the number of errors is zero. In this case, the target display style for the baseline test case can be determined as the fourth preset display style, and the baseline test case can be marked with the fourth preset display style.

[0122] As an example, the third preset display style can be set to gray and the fourth preset display style can be set to green. When the test maturity of the baseline test case is determined to be zero, the reference count of the test case can be extracted. When the reference count of the test case is zero, the baseline test case can be marked with a gray mark. When the test manager (VM) sees the baseline test case marked with a gray mark, he can directly determine that the baseline test case has not been referenced and has low reference value. He can then postpone the test case to further improve test efficiency and test quality.

[0123] When the number of references to a test case is not zero, the baseline test case can be marked with a green icon. When the test manager (VM) sees a baseline test case marked with a green icon, they can directly determine that although the baseline test case has been referenced, the number of errors is zero, and its reference value is low. They can then be scheduled for later to further improve testing efficiency and test quality.

[0124] It should be noted that the examples listed above are merely examples. In practical applications, in addition to using red, yellow, green, and gray colors to mark the baseline test cases as grade markers based on their different reference values, those skilled in the art can set the display style according to specific circumstances, such as using different symbols, numbers, or other display styles that can be used to distinguish different results as grade markers. It is understood that the present invention does not impose any limitations on this.

[0125] Step 206: Display the marked baseline test cases and the test maturity corresponding to the baseline test cases.

[0126] After baseline test cases are marked with the target display style, the marked baseline test cases and their corresponding test maturity levels can be displayed on the server's display interface for the test manager (VM) to refer to. For example, the display interface can show baseline test cases highlighted in red and their corresponding test maturity levels, indicating that the baseline test cases have high reference value and stability. Alternatively, the display interface can show baseline test cases highlighted in green and their corresponding test maturity levels, indicating that the baseline test cases have been referenced but have never encountered errors, and therefore have relatively low reference value and stability. Thus, the test manager (VM) can more rationally prioritize and execute baseline test cases based on their test maturity levels and the corresponding display styles, and adjust the test plan in a timely manner to ensure testing efficiency and quality. This can significantly reduce the risk of major errors occurring later in the project, leading to project delays.

[0127] It should be noted that the embodiments of the present invention include, but are not limited to, the examples described above. It is understood that those skilled in the art can make further settings according to actual needs under the guidance of the ideas in the embodiments of the present invention, and the present invention does not limit such settings.

[0128] In this embodiment of the invention, a testing method for baseline test case maturity analysis based on server configuration is provided. First, the baseline test case data, combined with relevant influencing factors, is used to analyze the test maturity of the baseline test cases. Next, the referenceability of the baseline test cases is further determined by comparing the variance of test maturity. Finally, the baseline test cases are marked according to different levels of reference, more intuitively displaying their reference priority. This testing method can more efficiently improve the entire testing process and reasonably assist the test manager (VM) in allocating the execution order of baseline test cases according to their test maturity, ensuring that the testing work is completed within the required time. Compared to manual configuration, this significantly improves testing efficiency and quality.

[0129] To enable those skilled in the art to better understand the technical solutions of the embodiments of the present invention, an example is provided below for explanation and illustration:

[0130] Reference Figure 3This illustration shows a flowchart of a server configuration testing method provided in an embodiment of the present invention. This example is only used as an example to illustrate the maturity analysis process of baseline test cases. For ease of explanation, the first preset display style is set to red, the second preset display style is set to yellow, the third preset display style is set to gray, and the fourth preset display style is set to green. It should be understood that the present invention does not limit this.

[0131] 1. Test begins;

[0132] 2. Obtain the baseline test cases corresponding to the test tasks configured for the server, and the baseline test case data corresponding to the baseline test cases;

[0133] 3. Calculate the test maturity level corresponding to the baseline test cases based on the baseline test case data;

[0134] 4. Determine if the test maturity level is 0. If it is not 0, proceed to steps 5 to 7. If it is 0, proceed to steps 8 to 10.

[0135] 5. Calculate the current test maturity variance D(X) of the baseline test cases based on the test maturity, and obtain the reference test maturity variance D(Y);

[0136] 6. If the current test maturity variance D(X) is less than or equal to the reference test maturity variance D(Y), then the test maturity of the baseline test cases will be marked in red.

[0137] 7. If the current test maturity variance D(X) is greater than the reference test maturity variance D(Y), then the test maturity of the baseline test cases will be marked in yellow.

[0138] 8. Extract the test case reference count from the baseline test case data;

[0139] 9. If the test case is referenced 0 times, the test maturity of the baseline test case will be marked in gray.

[0140] 10. If the number of references for a test case is not 0, then mark the test maturity of the baseline test case as green;

[0141] 11. Display the color-coded indicators and maturity values ​​of the baseline test cases on the server's display interface, and the test ends.

[0142] It should be noted that, for the sake of simplicity, the method embodiments are all described as a series of actions. However, those skilled in the art should understand that the embodiments of the present invention are not limited to the described order of actions, because according to the embodiments of the present invention, some steps can be performed in other orders or simultaneously. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions involved are not necessarily essential to the embodiments of the present invention.

[0143] Reference Figure 4 The diagram illustrates a structural block diagram of a server configuration testing device provided in an embodiment of the present invention, which may specifically include the following modules:

[0144] The baseline test case acquisition module 401 is used to acquire the baseline test cases corresponding to the test tasks configured for the server, and the baseline test case data corresponding to the baseline test cases. The baseline test cases are used to describe the test tasks.

[0145] The test maturity generation module 402 is used to calculate the test maturity corresponding to the baseline test cases using the baseline test case data. The test maturity is used to characterize the stability of the test task.

[0146] The current test maturity variance calculation module 403 is used to calculate the current test maturity variance corresponding to the baseline test case based on the test maturity if the test maturity is not equal to zero.

[0147] The baseline test case marking module 404 is used to obtain the reference test maturity variance corresponding to the baseline test case, and determine the target display style for the baseline test case based on the current test maturity variance and the reference test maturity variance, and mark the baseline test case based on the target display style;

[0148] The test maturity display module 405 is used to display the marked baseline test cases and the test maturity corresponding to the baseline test cases.

[0149] In one alternative embodiment, the baseline test case marking module 404 includes:

[0150] The first preset display style determination module is used to determine the target display style for the baseline test case as the first preset display style if the current test maturity variance is less than or equal to the reference test maturity variance, and to mark the baseline test case with the first preset display style.

[0151] The second preset display style determination module is used to determine the target display style for the baseline test case as the second preset display style if the current test maturity variance is greater than the reference test maturity variance, and to mark the baseline test case with the second preset display style.

[0152] In one alternative embodiment, the device further includes:

[0153] The test case reference count extraction module is used to extract the test case reference count from the baseline test case data if the test maturity is equal to zero.

[0154] The third preset display style determination module is used to determine the target display style for the baseline test case as the third preset display style if the number of references of the test case is equal to zero, and to mark the baseline test case with the third preset display style;

[0155] The fourth preset display style determination module is used to determine the target display style for the baseline test case as the fourth preset display style if the number of references of the test case is not equal to zero, and to mark the baseline test case with the fourth preset display style.

[0156] In one optional embodiment, the baseline test case data includes the average number of errors, the error frequency of each type of error, and the severity level of each type of error. The test maturity generation module 402 is specifically used for:

[0157] The test maturity corresponding to the baseline test cases is obtained by calculating the average number of errors, the error frequency of each type of error, and the severity level of each type of error.

[0158] In one alternative embodiment, the device further includes:

[0159] The baseline test case data acquisition module is used to acquire the number of errors occurring, the number of test case references, the probability coefficient of each type of error, the number of errors occurring, the severity coefficient of each type of error, and the number of errors occurring for each type of error.

[0160] The average number of errors generated is used to calculate the average number of errors by using the number of errors and the number of times the test cases are referenced.

[0161] The error occurrence frequency generation module is used to calculate the error occurrence frequency of each type of error by using the number of errors, the probability coefficient of each type of error, and the number of occurrences of each type of error.

[0162] The error severity level generation module is used to calculate the severity level of each type of error by using the number of times the error occurred, the severity level coefficient of each type of error, and the number of times each type of error occurred.

[0163] The baseline test case data determination module is used to take the average number of errors, the error frequency of each type of error, and the severity level of each type of error as the baseline test case data corresponding to the baseline test case.

[0164] In one alternative embodiment, the device further includes:

[0165] The baseline test case library creation module is used to create a new baseline test case library corresponding to the test task in response to the baseline test case library creation operation for the test task.

[0166] The baseline test case data storage module is used to store the baseline test cases and the baseline test case data in the baseline test case library.

[0167] In one optional embodiment, the baseline test case data includes the historical test maturity of the baseline test cases at different testing phases, and the apparatus further includes:

[0168] The test maturity variance generation module is used to calculate the test maturity variance corresponding to the baseline test cases by using the historical test maturity values.

[0169] As the device embodiment is basically similar to the method embodiment, the description is relatively simple, and relevant parts can be found in the description of the method embodiment.

[0170] In addition, this invention also provides an electronic device, including: a processor, a memory, and a computer program stored in the memory and executable on the processor. When the computer program is executed by the processor, it implements the various processes of the test method embodiment of the server configuration described above and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0171] This invention also provides a computer-readable storage medium storing a computer program. When executed by a processor, the computer program implements the various processes of the test method embodiment described above, achieving the same technical effect. To avoid repetition, it will not be described again here. The computer-readable storage medium may be a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk.

[0172] Figure 5 A schematic diagram of the hardware structure of an electronic device for implementing various embodiments of the present invention.

[0173] The electronic device 500 includes, but is not limited to, components such as: a radio frequency unit 501, a network module 502, an audio output unit 503, an input unit 504, a sensor 505, a display unit 506, a user input unit 507, an interface unit 508, a memory 509, a processor 510, and a power supply 511. Those skilled in the art will understand that the electronic device structure involved in the embodiments of the present invention does not constitute a limitation on the electronic device. An electronic device may include more or fewer components than illustrated, or combine certain components, or have different component arrangements. In the embodiments of the present invention, the electronic device includes, but is not limited to, mobile phones, tablet computers, laptops, PDAs, in-vehicle terminals, wearable devices, and pedometers.

[0174] It should be understood that, in this embodiment of the invention, the radio frequency unit 501 can be used for receiving and transmitting signals during information transmission or calls. Specifically, it receives downlink data from the base station and processes it with the processor 510; additionally, it transmits uplink data to the base station. Typically, the radio frequency unit 501 includes, but is not limited to, an antenna, at least one amplifier, a transceiver, a coupler, a low-noise amplifier, a duplexer, etc. Furthermore, the radio frequency unit 501 can also communicate with networks and other devices through a wireless communication system.

[0175] The electronic device provides users with wireless broadband internet access through the network module 502, such as helping users send and receive emails, browse web pages, and access streaming media.

[0176] The audio output unit 503 can convert audio data received by the radio frequency unit 501 or the network module 502 or stored in the memory 509 into audio signals and output them as sound. Furthermore, the audio output unit 503 can also provide audio output related to specific functions performed by the electronic device 500 (e.g., call signal reception sound, message reception sound, etc.). The audio output unit 503 includes a speaker, a buzzer, and a receiver, etc.

[0177] Input unit 504 is used to receive audio or video signals. Input unit 504 may include a graphics processing unit (GPU) 5041 and a microphone 5042. The GPU 5041 processes image data of still images or videos acquired by an image capture device (such as a camera) in video capture mode or image capture mode. The processed image frames can be displayed on display unit 506. The image frames processed by GPU 5041 can be stored in memory 509 (or other storage medium) or transmitted via radio frequency unit 501 or network module 502. Microphone 5042 can receive sound and process such sound into audio data. The processed audio data can be converted into a format that can be transmitted to a mobile communication base station via radio frequency unit 501 in telephone call mode.

[0178] The electronic device 500 also includes at least one sensor 505, such as a light sensor, a motion sensor, and other sensors. Specifically, the light sensor includes an ambient light sensor and a proximity sensor. The ambient light sensor can adjust the brightness of the display panel 5061 according to the ambient light level, and the proximity sensor can turn off the display panel 5061 and / or backlight when the electronic device 500 is moved to the ear. As a type of motion sensor, an accelerometer sensor can detect the magnitude of acceleration in various directions (generally three axes). When stationary, it can detect the magnitude and direction of gravity and can be used to identify the posture of the electronic device (such as landscape / portrait switching, related games, magnetometer posture calibration), vibration recognition related functions (such as pedometer, tapping), etc. The sensor 505 may also include a fingerprint sensor, pressure sensor, iris sensor, molecular sensor, gyroscope, barometer, hygrometer, thermometer, infrared sensor, etc., which will not be described in detail here.

[0179] The display unit 506 is used to display information input by the user or information provided to the user. The display unit 506 may include a display panel 5061, which may be configured in the form of a liquid crystal display (LCD), an organic light-emitting diode (OLED), or the like.

[0180] User input unit 507 can be used to receive input numerical or character information, and to generate key signal inputs related to user settings and function control of electronic devices. Specifically, user input unit 507 includes a touch panel 5071 and other input devices 5072. Touch panel 5071, also known as a touch screen, can collect touch operations performed by the user on or near it (such as operations performed by the user using a finger, stylus, or any suitable object or accessory on or near touch panel 5071). Touch panel 5071 may include two parts: a touch detection device and a touch controller. The touch detection device detects the user's touch position and the signal generated by the touch operation, and transmits the signal to the touch controller; the touch controller receives touch information from the touch detection device, converts it into touch point coordinates, and sends it to the processor 510, which receives and executes commands from the processor 510. In addition, touch panel 5071 can be implemented using various types such as resistive, capacitive, infrared, and surface acoustic wave. Besides touch panel 5071, user input unit 507 may also include other input devices 5072. Specifically, other input devices 5072 may include, but are not limited to, physical keyboards, function keys (such as volume control buttons, power buttons, etc.), trackballs, mice, joysticks, etc., which will not be described in detail here.

[0181] Furthermore, the touch panel 5071 may cover the display panel 5061. When the touch panel 5071 detects a touch operation on or near it, it transmits the information to the processor 510 to determine the type of touch event. Subsequently, the processor 510 provides corresponding visual output on the display panel 5061 according to the type of touch event. It is understood that in one embodiment, the touch panel 5071 and the display panel 5061 are implemented as two independent components to realize the input and output functions of the electronic device. However, in some embodiments, the touch panel 5071 and the display panel 5061 can be integrated to realize the input and output functions of the electronic device. The specific implementation is not limited here.

[0182] Interface unit 508 serves as an interface for connecting external devices to electronic device 500. For example, external devices may include a wired or wireless headphone port, an external power supply (or battery charger) port, a wired or wireless data port, a memory card port, a port for connecting a device with an identification module, an audio input / output (I / O) port, a video I / O port, a headphone port, and so on. Interface unit 508 can be used to receive input from external devices (e.g., data, power, etc.) and transmit the received input to one or more components within electronic device 500, or it can be used to transmit data between electronic device 500 and external devices.

[0183] The memory 509 can be used to store software programs and various data. The memory 509 may primarily include a program storage area and a data storage area. The program storage area may store the operating system, applications required for at least one function (such as sound playback, image playback, etc.), etc.; the data storage area may store data created based on the use of the mobile phone (such as audio data, phonebook, etc.). Furthermore, the memory 509 may include high-speed random access memory, and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other volatile solid-state storage device.

[0184] The processor 510 is the control center of the electronic device. It connects various parts of the electronic device via various interfaces and lines. By running or executing software programs and / or modules stored in the memory 509, and by calling data stored in the memory 509, it performs various functions and processes data, thereby providing overall monitoring of the electronic device. The processor 510 may include one or more processing units; preferably, the processor 510 may integrate an application processor and a modem processor. The application processor mainly handles the operating system, user interface, and applications, while the modem processor mainly handles wireless communication. It is understood that the modem processor may not be integrated into the processor 510.

[0185] The electronic device 500 may also include a power supply 511 (such as a battery) for supplying power to various components. Preferably, the power supply 511 can be logically connected to the processor 510 through a power management system, thereby enabling functions such as managing charging, discharging, and power consumption through the power management system.

[0186] In addition, the electronic device 500 includes some functional modules not shown, which will not be described in detail here.

[0187] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0188] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0189] The embodiments of the present invention have been described above with reference to the accompanying drawings. However, the present invention is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of the present invention without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of the present invention.

[0190] Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed in this invention can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementations should not be considered beyond the scope of this invention.

[0191] Those skilled in the art will understand that, for the sake of convenience and brevity, the specific working processes of the systems, devices, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here.

[0192] In the embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0193] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0194] In addition, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit.

[0195] If the aforementioned functions are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this invention, essentially, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, ROM, RAM, magnetic disks, or optical disks.

[0196] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method for testing server configuration, characterized in that, include: Obtain the baseline test cases corresponding to the test tasks configured for the server, and the baseline test case data corresponding to the baseline test cases, wherein the baseline test cases are used to describe the test tasks; The baseline test case data is used to calculate and obtain the test maturity corresponding to the baseline test case. The test maturity is used to characterize the stability of the test task. If the test maturity is not equal to zero, then calculate the current test maturity variance corresponding to the baseline test case based on the test maturity. Obtain the reference test maturity variance corresponding to the baseline test case, and determine the target display style for the baseline test case based on the current test maturity variance and the reference test maturity variance, and mark the baseline test case based on the target display style; Display the marked baseline test cases and the corresponding test maturity levels of the baseline test cases; If the test maturity is zero, then extract the test case reference count from the baseline test case data; If the number of references to the test case is zero, then the target display style for the baseline test case is determined to be the third preset display style, and the baseline test case is marked with the third preset display style; If the number of references to the test case is not equal to zero, then the target display style for the baseline test case is determined to be the fourth preset display style, and the baseline test case is marked with the fourth preset display style; The baseline test case data includes the average number of errors, the error frequency of each type of error, and the severity level of each type of error. The calculation of the test maturity corresponding to the baseline test cases using the baseline test case data includes: The test maturity corresponding to the baseline test cases is obtained by calculating the average number of errors, the error frequency of each type of error, and the severity level of each type of error.

2. The method according to claim 1, characterized in that, The step of determining the target display style for the baseline test cases based on the current test maturity variance and the reference test maturity variance, and marking the baseline test cases based on the target display style, includes: If the current test maturity variance is less than or equal to the reference test maturity variance, then the target display style for the baseline test case is determined to be the first preset display style, and the baseline test case is marked with the first preset display style; If the current test maturity variance is greater than the reference test maturity variance, then the target display style for the baseline test case is determined to be the second preset display style, and the baseline test case is marked with the second preset display style.

3. The method according to claim 1, characterized in that, Also includes: Obtain the number of errors occurring, the number of test case references, the probability coefficient of each type of error, the number of occurrences of each type of error, the severity coefficient of each type of error, and the number of occurrences of each type of error corresponding to the baseline test case; The average number of errors is calculated using the number of errors occurring and the number of test case references. The error frequency of each type of error is obtained by calculating the number of errors that occur, the probability coefficient of each type of error, and the number of errors that occur for each type of error. The severity level of each type of error is obtained by calculating the number of errors that occurred, the severity level coefficient of each type of error, and the number of errors that occurred for each type of error. The average number of errors, the frequency of each type of error, and the severity level of each type of error are used as the baseline test case data corresponding to the baseline test cases.

4. The method according to claim 2, characterized in that, Also includes: In response to the baseline test case library creation operation for the test task, a new baseline test case library corresponding to the test task is created. The baseline test cases and their data are stored in the baseline test case library.

5. The method according to claim 1, characterized in that, The baseline test case data includes the historical test maturity of the baseline test cases at different testing phases, and the method further includes: The test maturity variance corresponding to the baseline test cases is obtained by calculating the historical test maturity levels.

6. A test apparatus for server configuration, characterized in that, The device includes: The baseline test case acquisition module is used to acquire the baseline test cases corresponding to the test tasks configured for the server, as well as the baseline test case data corresponding to the baseline test cases. The baseline test cases are used to describe the test tasks. The test maturity generation module is used to calculate the test maturity corresponding to the baseline test cases using the baseline test case data. The test maturity is used to characterize the stability of the test task. The current test maturity variance calculation module is used to calculate the current test maturity variance corresponding to the baseline test case based on the test maturity if the test maturity is not equal to zero. The baseline test case marking module is used to obtain the reference test maturity variance corresponding to the baseline test case, and determine the target display style for the baseline test case based on the current test maturity variance and the reference test maturity variance, and mark the baseline test case based on the target display style; The test maturity display module is used to display the marked baseline test cases and the test maturity corresponding to the baseline test cases; The test case reference count extraction module is used to extract the test case reference count from the baseline test case data if the test maturity is equal to zero. The third preset display style determination module is used to determine the target display style for the baseline test case as the third preset display style if the number of references of the test case is equal to zero, and to mark the baseline test case with the third preset display style; The fourth preset display style determination module is used to determine the target display style for the baseline test case as the fourth preset display style if the number of references of the test case is not equal to zero, and to mark the baseline test case with the fourth preset display style; The baseline test case data includes the average number of errors, the error frequency of each type of error, and the severity level of each type of error; The test maturity generation module is specifically used to: calculate the test maturity corresponding to the baseline test cases by using the average number of errors, the error frequency of each type of error, and the severity level of each type of error.

7. An electronic device, characterized in that, It includes a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory communicate with each other through the communication bus; The memory is used to store computer programs; When the processor executes a program stored in the memory, it implements the method as described in any one of claims 1-5.

8. A computer-readable storage medium having instructions stored thereon that, when executed by one or more processors, cause the processors to perform the method as described in any one of claims 1-5.

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