A rigid-flex board testing method based on a dedicated spring needle clamp

Abstract

The application provides a rigid-flex board testing method based on a special spring needle clamp, which comprises the following steps: after the probe of the clamp assembly is aligned with the pad array, the clamp assembly is fixed and locked with the pad array; the other end of the clamp assembly is communicated with the input end of a multi-channel control board; the multi-channel control board comprises at least two test channels in parallel; the multi-channel control board outputs an excitation signal to the pad array through a wire; the pad array outputs a drive waveform to the multi-channel control board to convert the drive waveform into an electrical signal, and the electrical signal is detected and judged; and the multi-channel control board outputs the test result of the pad array. The special clamp is used to stably and efficiently connect the rigid or flexible metallized through hole or surface mount pad. Compared with the traditional point testing method, the test efficiency of the product is greatly improved; the spring probe and the metallized pad are reliably aligned at the same time, the reliability of the product testing is improved, the electrical signal is converted into a common wire, the standard electrical connector can be connected or directly welded, and various test scenes can be flexibly adapted.

Description

Technical Field

[0001] This invention relates to the field of measurement and testing technology, and specifically to a method for testing rigid-flexural plates based on a dedicated spring needle clamp. Background Technology

[0002] Printed circuit board assemblies typically use standard electrical interfaces, employing electrical connectors or matrix-style pad arrangements. The conventional testing method involves applying control signals to each pad individually using a pointed probe, and then measuring the output signals one by one with an oscilloscope. However, this method is inefficient and unsuitable for large-scale testing.

[0003] Furthermore, when the pad stack structure is relatively fragile, the aforementioned conventional testing methods can easily damage the pads, affecting the reliability of the product after installation; when the pads are non-standard arranged metallized pads, it is impossible to stably connect electrical signals.

[0004] Therefore, a testing method is needed for pads with weak pad stacking structures or non-standard pad arrangements. Summary of the Invention

[0005] This invention addresses the testing problems of pads with weak stacking structures or non-standard pad arrangements by providing a rigid-flex board testing method based on a dedicated spring pin fixture. The method uses a dedicated spring pin fixture to connect the control circuit and the rigid-flex drive board, enabling simultaneous control and measurement of 32 channels.

[0006] This invention provides a method for testing rigid-flexible plates based on a dedicated spring pin clamp, comprising the following steps:

[0007] S1. Assemble one end of the fixture assembly with the pad array of the driver board to be tested, align the probe of the fixture assembly with the pad array, and then fix and lock the fixture assembly and the pad array. The other end of the fixture assembly is a wire, which is connected to the input terminal of the multi-channel control board. The multi-channel control board includes at least two test channels connected in parallel.

[0008] S2. The multi-channel control board outputs a repetitive square wave as an excitation signal to the pad array via wires. The pad array receives the excitation signal and outputs the drive waveform to the multi-channel control board. After receiving the drive waveform, the multi-channel control board converts it back into an electrical signal and performs detection and judgment. The multi-channel control board outputs the test results of the pad array.

[0009] S3. Remove the fixture assembly. Test complete.

[0010] The present invention discloses a method for testing rigid-flexible plates based on a dedicated spring pin clamp. In a preferred embodiment, in step S1, the pad array includes a flexible pad array and / or a rigid pad array, a high-voltage driving circuit is provided in the driver board to be tested, and the number of clamp components is at least two.

[0011] The fixture assembly includes a base, a detachable clamp mounted on the top of the base, a probe array with one end protruding from the clamp and fixed in position, and a wire harness connected to the other end of the probe array. The upper part of the base is provided with a pad array slot, which is a groove. The pad array is placed in the pad array slot. After the probe array and the pad array are aligned, the base fixes the probe array and the pad array.

[0012] The present invention provides a method for testing rigid-flex plates based on a dedicated spring pin clamp. In a preferred embodiment, the base includes a base body, snap fasteners movably connected to both sides of the base body for fixing the clamps, a pad array slot on the upper part of the base body, a printed circuit board output point communicating with one side of the pad array slot, and a positioning pin hole in the base body.

[0013] The upper and lower surfaces of the base body are both flat. The printed circuit board exit is used to place the printed circuit board lines connected to the pad array. The pad array slot is suitable for both rigid and flexible pad arrays. The pad array slot and the pad array are tightly fitted.

[0014] The present invention discloses a rigid-flex plate testing method based on a dedicated spring needle clamp. In a preferred embodiment, the base is made of insulating material, the wiring harness is enameled wire, and the wiring harness and probe array are integrally crimped together.

[0015] The rigid-flex plate testing method based on a dedicated spring pin clamp described in this invention, as a preferred embodiment, uses high-voltage bakelite as the material for both the base and the clamp, and both the base and the clamp are machined by a CNC machine tool.

[0016] The rigid-flex plate testing method based on a dedicated spring needle clamp described in this invention, as a preferred embodiment, has a plate structure with an opening at the connection between the fixing clamp and the probe array, and the fixing clamp and the probe array are fixed with epoxy resin.

[0017] Positioning pins are provided on both sides of the bottom of the fixing clamp, and the positioning accuracy between the positioning pins and the positioning pin holes is 0.2mm;

[0018] The rear of the fixing clip is provided with a perforated fixing plate for fixing the wire harness.

[0019] The present invention discloses a rigid-flex plate testing method based on a dedicated spring pin clamp. In a preferred embodiment, the probe array is a spring pin array, which includes high-frequency spring pins disposed on both sides and current-carrying spring pins disposed in the middle. Both the high-frequency spring pins and the current-carrying spring pins pass through a fixing clamp. The retraction stroke stop lines of both the high-frequency spring pins and the current-carrying spring pins are located below the lower surface of the fixing clamp. The high-frequency spring pins are used to transmit excitation signals and drive waveforms, and the current-carrying spring pins are used to meet the voltage and current power supply requirements of the test drive board.

[0020] The present invention discloses a method for testing rigid-flexible plates based on a dedicated spring pin clamp. In a preferred embodiment, the number of high-frequency spring pins is 32 and the number of current-carrying spring pins is 8. The ends of both the high-frequency and current-carrying spring pins are tapered gold-plated contacts. The retraction stroke stop lines of both the high-frequency and current-carrying spring pins are located 2.2 mm below the lower surface of the clamp.

[0021] The present invention discloses a method for testing rigid-flexural plates based on a dedicated spring pin clamp. In a preferred embodiment, in step S1, the multi-channel control board includes at least two input ports, a control circuit connected to the input ports, and a power supply circuit connected to both the input ports and the control circuit. The input ports are connected in parallel, and the input ports are electrically connected to the clamp assembly. A logic chip is provided in the control circuit.

[0022] The rigid-flex plate testing method based on a dedicated spring pin clamp described in this invention, as a preferred embodiment, has 32 input ports, the control circuit synchronously generates 32 excitation signals, the power supply circuit outputs 50VDC, the excitation signal is a square wave with a repetition frequency of 1kHz and a standard LVTTL level, the amplitude of the driving waveform is 50VDC, and the electrical signal is an LVTTL signal.

[0023] The technical solution adopted by this invention to solve the above-mentioned technical problems is: a testing method for rigid-flex boards, comprising a dedicated fixture and a multi-channel control board. The dedicated fixture includes a base, a spring probe array, a fixing clamp, and a wiring harness. This invention is adaptable to the metallized through-hole pads and metallized surface mount pads of rigid boards, rigid-flex boards, and flexible boards as a testing interconnection means, and the shape of the dedicated fixture can be customized according to specific user needs to meet diverse requirements.

[0024] The present invention has the following advantages:

[0025] (1) The present invention designs a test method for rigid-flex plates, which can stably and efficiently connect rigid or flexible metallized through holes or surface mount pads through special fixtures, which greatly improves the test efficiency of products compared with traditional point test methods.

[0026] (2) The present invention integrates 40 spring probes in a 1cm×1cm area. Through mechanical processing, the spring probes and metallized pads are reliably aligned at the same time, which improves the reliability of product testing.

[0027] (3) This invention utilizes the elasticity of spring pins to lock the clamp, selects an appropriate contraction stroke, and ensures that spring probes of different specifications can be stably connected. It reduces the disadvantages of conventional clamps that use screws for locking, such as complex mechanism and excessive clamping force. It is safe and convenient to use and is more suitable for flexible board interconnection.

[0028] (4) The signal spring pin selected in this invention is a high-frequency spring pin, which can meet the transmission requirements of the 8GHz control signal of the rigid-flex drive board.

[0029] (5) The power supply spring pin selected in this invention is a current-carrying spring pin, which can meet the power supply requirements of 50VDC high voltage and 2A current of rigid-flex drive board.

[0030] (6) After matching non-standard arranged metallized pads, the present invention converts electrical signals into ordinary wires and leads them out, which can be connected to standard electrical connectors or directly soldered, and flexibly adapts to a variety of test scenarios. Attached Figure Description

[0031] Figure 1 This is a flowchart of a rigid-flex plate testing method based on a dedicated spring pin clamp;

[0032] Figure 2 This is a structural connection diagram of a rigid-flex plate testing method based on a dedicated spring needle clamp;

[0033] Figure 3 A three-dimensional model of a rigid-flex plate for a rigid-flex plate testing method based on a dedicated spring pin clamp;

[0034] Figure 4 This is a schematic diagram of a special fixture structure for a rigid-flex plate testing method based on a special spring pin clamp;

[0035] Figure 5 This is a schematic diagram of the spring pin array and fixing clamp structure in a rigid-flex plate testing method based on a dedicated spring pin clamp;

[0036] Figure 6 This is a top view of the base of a rigid-flex plate testing method based on a dedicated spring pin clamp.

[0037] Figure label:

[0038] 1. Fixture assembly; 11. Base; 111. Base body; 112. Buckle; 113. Pad array slot; 114. Printed board lead-out point; 115. Positioning pin hole; 12. Fixing clamp; 13. Probe array; 131. High-frequency spring pin; 132. Current-carrying spring pin; 14. Wire harness; 2. Multi-channel control board; 21. Input port; 22. Control circuit; 23. Power supply circuit. Detailed Implementation

[0039] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

[0040] Example 1

[0041] like Figures 1-2 As shown, a method for testing rigid-flexible plates based on a dedicated spring pin clamp includes the following steps:

[0042] S1. Assemble one end of the fixture assembly 1 with the pad array of the driver board to be tested, align the probe of the fixture assembly 1 with the pad array, and then fix and lock the fixture assembly 1 and the pad array. The other end of the fixture assembly 1 is a wire, which is connected to the input terminal of the multi-channel control board 2. The multi-channel control board 2 includes at least two test channels connected in parallel.

[0043] S2. The multi-channel control board 2 outputs a repetitive square wave as an excitation signal to the pad array through wires. The pad array receives the excitation signal and outputs the drive waveform to the multi-channel control board 2. After receiving the drive waveform, the multi-channel control board 2 converts it back to an electrical signal and performs detection and judgment. The multi-channel control board 2 outputs the test results of the pad array.

[0044] S3. Remove fixture assembly 1; test complete.

[0045] In step S1, such as Figure 3 As shown, the pad array includes a flexible pad array and / or a rigid pad array, a high-voltage drive circuit is provided in the driver board to be tested, and the number of fixture components 1 is at least two;

[0046] like Figures 4-5 As shown, the fixture assembly 1 includes a base 11, a detachable fixing clip 12 disposed above the base 11, a probe array 13 with one end protruding from the fixing clip 12 and fixed in position, and a wire harness 14 connected to the other end of the probe array 13. The upper part of the base 11 is provided with a pad array slot, which is a groove. The pad array is placed in the pad array slot. After the probe array 13 is aligned with the pad array, the base 11 fixes the probe array 13 and the pad array.

[0047] like Figure 6 As shown, the base 11 includes a base body 111, a buckle 112 movably connected to both sides of the base body 111 for fixing the fixing clip 12, a pad array slot 113 disposed on the upper part of the base body 111, a printed circuit board output 114 communicating with one side of the pad array slot 113, and a positioning pin hole 115 disposed in the base body 111.

[0048] The upper and lower surfaces of the base body 111 are both flat. The printed circuit board exit 114 is used to place the printed circuit board lines connected to the pad array. The pad array slot 113 is applicable to both rigid and flexible pad arrays. The pad array slot 113 and the pad array are tightly fitted.

[0049] The base 11 is made of insulating material, the wire harness 14 is enameled wire, and the wire harness 14 is integrally crimped with the probe array 13;

[0050] Both the base 11 and the fixing clamp 12 are made of high-voltage bakelite, and both the base 11 and the fixing clamp 12 are machined by CNC machine tools;

[0051] The connection between the fixing clip 12 and the probe array 13 is a flat plate structure with openings, and the fixing clip 12 and the probe array 13 are fixed with epoxy glue.

[0052] Positioning pins are provided on both sides of the bottom of the fixing clamp 12, and the positioning accuracy between the positioning pins and the positioning pin holes 115 is 0.2mm;

[0053] The rear of the fixing clip 12 is provided with an opening fixing plate for fixing the wire harness 14;

[0054] The probe array 13 is a spring pin array, which includes high-frequency spring pins 131 on both sides and current-carrying spring pins 132 in the middle. Both the high-frequency spring pins 131 and the current-carrying spring pins 132 pass through the fixing clamp 12. The retraction stroke stop lines of the high-frequency spring pins 131 and the current-carrying spring pins 132 are located below the lower surface of the fixing clamp 12. The high-frequency spring pins 131 are used to transmit excitation signals and drive waveforms, and the current-carrying spring pins 132 are used to meet the voltage and current power supply requirements of the test drive board.

[0055] There are 32 high-frequency spring pins 131 and 8 current-carrying spring pins 132. The ends of both high-frequency spring pins 131 and current-carrying spring pins 132 are tapered gold-plated contacts. The retraction stroke stop line of both high-frequency spring pins 131 and current-carrying spring pins 132 is located 2.2mm below the lower surface of the fixing clamp 12.

[0056] In step S1, the multi-channel control board 2 includes at least two input ports 21, a control circuit 22 connected to the input ports 21, and a power supply circuit 23 connected to both the input ports 21 and the control circuit 22. The input ports 21 are connected in parallel, and the input ports 21 are electrically connected to the fixture assembly 1. A logic chip is set in the control circuit 22.

[0057] The number of input ports 21 is 32. The control circuit 22 synchronously generates 32 excitation signals. The power supply circuit outputs 50VDC. The excitation signal is a square wave with a repetition frequency of 1kHz and a standard LVTTL level. The amplitude of the drive waveform is 50VDC and the electrical signal is an LVTTL signal.

[0058] Figure 2 This is a connection diagram of a rigid-flex drive board testing method based on a dedicated spring pin clamp provided in an embodiment of the present invention. It includes a dedicated clamp 1 and a multi-channel control board 2. The dedicated clamp 1 is used to connect non-standard arranged metallized pads, and the multi-channel control board 2 is used to synchronously generate 32 control signals, provide +50VDC power supply, and detect the drive signals output by the rigid-flex drive board.

[0059] Figure 3 This is a three-dimensional perspective view of a rigid-flex drive board provided in an embodiment of the present invention. This rigid-flex drive board is the test object of the present invention. Its characteristics include a board thickness of only 0.2mm at the flexible area pad array, and a single-layer PP dielectric at the flexible end with double-sided metallized through-hole pads. Therefore, the overall pad stack structure is relatively fragile, and conventional manual point testing methods can easily damage the pads. This rigid-flex printed circuit board is laminated twice, with unequal thickness in the rigid area. The thickness at the rigid area pad array is 1.8mm, while the thickness of the rigid board area for the high-voltage drive chip and peripheral circuits is 0.6mm. Considering the mobility of the flexible area, common integrated tooling cannot be used to fix and clamp the entire rigid-flex board. The present invention uses a special fixture 1 to electrically connect the rigid area pad array and the flexible area pad array respectively.

[0060] Figure 4 This is a schematic diagram of the special fixture provided in this embodiment of the invention. The special fixture 1 includes a base 11, a fixing clamp 12, a spring probe array 13, and a wire harness 14. Rigid printed circuit board fixtures commonly use polytetrafluoroethylene (PTFE) as the material, but its precision and stability are insufficient for rigid-flex drive boards. In this invention, the base 11 and the fixing clamp 12 are made of high-voltage bakelite, which ensures electrical insulation under +50VDC. Furthermore, the high-voltage bakelite used in this invention can be CNC machined with high precision on a machine tool, exhibiting good dimensional stability after machining and resisting deformation over long-term use. The fixing clamp 12 secures the spring probe array 13, the wire harness 14, and the positioning pins, and locks it to the base 11. The spring probe array 13 is secured with epoxy resin. The positioning pins are used to improve the center alignment accuracy between the spring pins and the pads; in this invention, this alignment accuracy is 0.2mm. Two clips 112 are installed on the opposite side of the base 11, using the elasticity of the spring pins to lock the fixing clamp 12 in place. This design requires selecting an appropriate retraction stroke to ensure stable connection of spring probes of different specifications without bottoming out. Conventional integrated clamps use screw locking, which has a complex locking mechanism and can easily damage the flexible area pad array due to excessive clamping force. For the minimum 1.5mm pad pitch, wire harness 14 uses a thinner 0.1mm enameled wire and is integrally crimped with the spring probe.

[0061] Figure 5This is a schematic diagram of the spring pin array of the special fixture provided in this embodiment of the invention. The spring probe array 13 includes 32 high-frequency spring pins, which can meet the transmission requirements of control signals, with a repetition frequency of up to 8GHz; and 8 current-carrying spring pins, which can meet the power supply requirements of 50VDC high voltage and 2A current. Both types of spring pins use tapered gold-plated contacts at their ends, and are compatible with both through-hole metallized pads and surface-mount metallized pads. Spring probes of different lengths are aligned coplanarly with a stop line at the end of their retraction stroke, ensuring that after insertion and retraction, the spring pins do not touch the bottom and remain within the elastic range, protecting the flexible area of ​​the pad array. The stop line of this invention is located 2.2mm from the bottom surface of the fixing clamp 12.

[0062] Figure 6 This is a schematic diagram of the base 11 of the special fixture provided in this embodiment of the invention. The base 11 has a groove cut out to conform to the shape of the rigid-flex plate in the pad area, and a lead-out point 114 for the flexible plate is provided. The groove 113 and the rigid-flex plate are tightly fitted with a positive tolerance of 0.1mm. Since the base 11 is made of insulating material, it ensures that the metallized pads will not short-circuit, eliminating the need for further insulating fixation.

[0063] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.

Claims

1. A method for testing rigid-flexible plates based on a dedicated spring pin clamp, characterized in that: Includes the following steps: S1. Assemble one end of the fixture assembly (1) with the pad array of the driver board to be tested, align the probe of the fixture assembly (1) with the pad array, and then fix and lock the fixture assembly (1) and the pad array. The other end of the fixture assembly (1) is a wire, which is connected to the input terminal of the multi-channel control board (2). The multi-channel control board (2) includes at least two test channels connected in parallel. The pad array includes a flexible pad array and / or a rigid pad array, the driver board to be tested is provided with a high voltage driving circuit, and the number of the fixture assembly (1) is at least two; The clamp assembly (1) includes a base (11), a detachable fixing clip (12) disposed above the base (11), a probe array (13) with one end protruding from the fixing clip (12) and fixed in position, and a wire harness (14) connected to the other end of the probe array (13). The upper part of the base (11) is provided with a pad array slot, which is a groove. The pad array is placed in the pad array slot. After the probe array (13) is aligned with the pad array, the base (11) fixes the probe array (13) and the pad array. The probe array (13) is a spring pin array, which includes high-frequency spring pins (131) on both sides and current-carrying spring pins (132) in the middle. Both the high-frequency spring pins (131) and the current-carrying spring pins (132) pass through the fixing clamp (12). The retraction stroke stop lines of the high-frequency spring pins (131) and the current-carrying spring pins (132) are located below the lower surface of the fixing clamp (12). The high-frequency spring pins (131) are used to transmit excitation signals and drive waveforms, and the current-carrying spring pins (132) are used to meet the voltage and current power supply requirements of the test drive board. S2. The multi-channel control board (2) outputs a repetitive square wave as an excitation signal to the pad array through the wire. The pad array receives the excitation signal and outputs the driving waveform to the multi-channel control board (2). The multi-channel control board (2) receives the driving waveform, converts it back to an electrical signal, and performs detection and judgment. The multi-channel control board (2) outputs the test results of the pad array. S3. Remove the fixture assembly (1) to complete the test.

2. The method for testing rigid-flexible plates based on a dedicated spring pin clamp according to claim 1, characterized in that: The base (11) includes a base body (111), buckles (112) movably connected to both sides of the base body (111) for fixing the fixing clip (12), a pad array slot (113) provided on the upper part of the base body (111), a printed circuit board exit point (114) communicating with one side of the pad array slot (113), and a positioning pin hole (115) provided in the base body (111). The upper and lower surfaces of the base body (111) are both flat. The printed circuit board exit (114) is used to place the printed circuit board lines connected to the pad array. The pad array slot (113) can be used for rigid pad arrays and flexible pad arrays. The pad array slot (113) is tightly fitted with the pad array.

3. The method for testing rigid-flexible plates based on a dedicated spring pin clamp according to claim 1, characterized in that: The base (11) is made of insulating material, the wire harness (14) is enameled wire, and the wire harness (14) is integrally crimped with the probe array (13).

4. The method for testing rigid-flexible plates based on a dedicated spring pin clamp according to claim 3, characterized in that: The base (11) and the fixing clamp (12) are both made of high-voltage bakelite, and both the base (11) and the fixing clamp (12) are processed by CNC machine tools.

5. The method for testing rigid-flexible plates based on a dedicated spring pin clamp according to claim 1, characterized in that: The connection between the fixing clip (12) and the probe array (13) is a flat plate structure with openings, and the fixing clip (12) and the probe array (13) are fixed with epoxy glue; The bottom sides of the fixing clamp (12) are provided with positioning pins, and the positioning accuracy of the positioning pins and the positioning pin holes (115) is 0.2mm. The rear of the fixing clip (12) is provided with an opening fixing plate for fixing the wire harness (14).

6. The method for testing rigid-flexible plates based on a dedicated spring pin clamp according to claim 1, characterized in that: The number of high-frequency spring pins (131) is 32, and the number of current-carrying spring pins (132) is 8. The ends of the high-frequency spring pins (131) and the current-carrying spring pins (132) are tapered gold-plated contacts. The retraction stroke stop line of the high-frequency spring pins (131) and the current-carrying spring pins (132) is located 2.2 mm below the lower surface of the fixing clamp (12).

7. The method for testing rigid-flexible plates based on a dedicated spring pin clamp according to claim 1, characterized in that: In step S1, the multi-channel control board (2) includes at least two input ports (21), a control circuit (22) connected to the input ports (21), and a power supply circuit (23) connected to both the input ports (21) and the control circuit (22). The input ports (21) are connected in parallel, and the input ports (21) are electrically connected to the fixture assembly (1). A logic chip is provided in the control circuit (22).

8. The method for testing rigid-flexible plates based on a dedicated spring pin clamp according to claim 7, characterized in that: The number of input ports (21) is 32. The control circuit (22) synchronously generates 32 excitation signals. The power supply circuit outputs 50VDC. The excitation signal is a square wave with a repetition frequency of 1kHz and a standard LVTTL level. The amplitude of the driving waveform is 50VDC. The electrical signal is an LVTTL signal.

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