A vehicle hardware-in-the-loop testing device and system

Abstract

The embodiment of the present application discloses a vehicle hardware-in-the-loop test device, the device comprises a processing module and a plurality of functional test modules meeting different test requirements, each of the functional test modules comprises a hardware interface with a fixed definition, wherein: the functional test module is used for generating a working condition simulation signal after receiving a control signal, and outputting the working condition simulation signal to a controller through a corresponding hardware interface, so that the controller receives the working condition simulation signal and generates a response signal based on the working condition simulation signal; the processing module is used for receiving the response signal and obtaining a test result according to the response signal. The vehicle hardware-in-the-loop test device is used to improve the compatibility of vehicle hardware-in-the-loop test.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of testing, in particular to a vehicle hardware-in-the-loop testing device and system. BACKGROUND

[0002] With the importance of vehicles in people's daily life increasing, the development and testing of vehicle controllers gradually attract people's attention. In the development and testing process of vehicle controllers, system software and hardware structure are usually designed in parallel. If real hardware is directly used to carry out testing work after the integration of the two, excessive cost consumption will be generated. In this case, hardware-in-the-loop (HIL) testing is widely used. The HIL testing platform can simulate the controlled object of the to-be-tested controller and the running environment of the controlled object, send signals (such as sensor signals) to the controller, so that the controller generates control instructions according to the signals, and the HIL testing platform obtains the test results of the controller according to the control instructions.

[0003] In the prior art HIL testing, a hardware testing platform meeting the current testing requirements is usually first built, a test script corresponding to the current testing requirements is obtained, the vehicle is then tested for the writing of the test script, and finally the testing meeting the current testing requirements is realized. For different testing projects, due to different testing requirements, when the project is replaced, the hardware platform usually needs to be rebuilt, and a new test script needs to be developed again, which requires a long period of time. Therefore, the compatibility of the vehicle hardware-in-the-loop testing in the prior art is poor, and it is difficult to meet different testing requirements. SUMMARY

[0004] Therefore, the embodiments of the present application provide a vehicle hardware-in-the-loop testing device and system to improve the compatibility of vehicle hardware-in-the-loop testing.

[0005] In a first aspect, the embodiments of the present application provide a vehicle hardware-in-the-loop testing device, which comprises a processing module and a plurality of functional testing modules meeting different testing requirements. Each functional testing module comprises a hardware interface with a fixed definition, and wherein:

[0006] The functional testing module is configured to generate a working condition simulation signal after receiving a control signal, and output the working condition simulation signal to a controller through a corresponding hardware interface, so that the controller receives the working condition simulation signal and generates a response signal based on the working condition simulation signal.

[0007] The processing module is configured to receive the response signal and obtain a test result according to the response signal.

[0008] In a possible implementation, the apparatus can further include a storage module, wherein:

[0009] The storage module is configured to store a diagnostic configuration word script meeting different test requirements.

[0010] The processing module is further configured to execute the diagnostic configuration word script to obtain a control signal, so that a function test module corresponding to the control signal receives the control signal.

[0011] In a possible implementation, the plurality of function test modules at least include a virtual test module and a physical test module, and the apparatus further includes a switching module, wherein the switching module is configured to switch the virtual test module and the physical test module in the plurality of function test modules.

[0012] In a possible implementation, the apparatus further includes a fault injection module, wherein the fault injection module is configured to generate, in combination with the function test module, a working condition simulation signal for output to the controller before the function test module outputs the working condition simulation signal through a corresponding hardware interface.

[0013] In a possible implementation, the apparatus further includes a connection cable conforming to a standard interface definition of the apparatus, wherein the hardware interface corresponding to the function test module is connected to the controller through the connection cable.

[0014] In a possible implementation, the plurality of function test modules include a vehicle starting test module, wherein the vehicle starting module includes an intelligent key circuit, and the intelligent key circuit is configured to receive a key trigger signal, so that the vehicle starting test module generates a working condition simulation signal in at least one working condition of vehicle locking, vehicle unlocking, and vehicle seeking after receiving a control signal.

[0015] In a possible implementation, the plurality of function test modules include an antenna position test module, wherein the antenna position test module includes a shielded antenna submodule and an unshielded antenna submodule, and the shielded antenna submodule and the unshielded antenna submodule are configured to generate a working condition simulation signal based on a relative position between an intelligent key and an antenna after receiving a control signal; the shielded antenna submodule is configured to simulate an antenna that does not receive a signal sent by an intelligent key; and the unshielded antenna submodule is configured to simulate an antenna that receives a signal sent by an intelligent key.

[0016] In a possible implementation, the plurality of functional test modules comprises an electronic steering column lock test module, wherein the electronic steering column lock test module comprises an electronic steering column lock and a Hall sensing element, configured to generate a working condition simulation signal in at least one of an electronic steering column lock open and an electronic steering column lock closed condition after receiving a control signal; and the Hall sensing element is installed on the electronic steering column lock and is configured to obtain the open and closed state of the electronic steering column lock based on a Hall sensing effect.

[0017] In a possible implementation, the plurality of functional test modules comprises a wheel test module, wherein the wheel test module is configured to generate a working condition simulation signal comprising a vehicle speed and / or a wheel speed after receiving a control signal.

[0018] In a second aspect, the embodiments of the present application provide a vehicle hardware-in-the-loop test system, which comprises a vehicle hardware-in-the-loop test device and a controller, wherein:

[0019] The vehicle hardware-in-the-loop test device is configured to generate a working condition simulation signal after receiving a control signal, and output the working condition simulation signal to the controller.

[0020] The controller is configured to receive the working condition simulation signal and generate a response signal based on the working condition simulation signal.

[0021] The vehicle hardware-in-the-loop test device is further configured to receive the response signal and obtain a test result according to the response signal.

[0022] Therefore, the embodiments of the present application can improve the compatibility of vehicle hardware-in-the-loop test. In the embodiments of the present application, the vehicle hardware-in-the-loop test device comprises a plurality of functional test modules meeting different test requirements, each functional test module comprises a hardware interface with a fixed definition; the functional test module is configured to generate a working condition simulation signal after receiving a control signal, and output the working condition simulation signal to the controller through the corresponding hardware interface; the controller generates a response signal based on the received working condition simulation signal; and the processing module receives the response signal and obtains a test result according to the response signal.

[0023] In the embodiment of the present application, since the test device includes multiple functional test modules meeting different test requirements, the functional test modules that are likely to be used are integrated in the test device, when facing different test requirements, the test device does not need to be reconfigured every time the test requirements are changed, and the hardware modification difficulty can be reduced; since the hardware interface has a fixed definition, the working condition simulation signals output by the functional test module through the hardware interface usually do not change with the to-be-tested controller, so when facing different test requirements, a new test script does not need to be redeveloped. In summary, the embodiment of the present application reduces the hardware modification difficulty and reduces the test script development cost, and improves the compatibility of the vehicle hardware-in-the-loop test. BRIEF DESCRIPTION OF DRAWINGS

[0024] Figure 1 A structural schematic diagram of a vehicle hardware-in-the-loop test device provided by the embodiment of the present application is shown in the figure.

[0025] Figure 2 A structural schematic diagram of a vehicle hardware-in-the-loop test system provided by the embodiment of the present application is shown in the figure. DETAILED DESCRIPTION

[0026] In order to facilitate understanding and explaining the technical solutions provided by the embodiments of the present application, the technical terms in the embodiments of the present application will be explained first.

[0027] Hardware-in-the-Loop (HIL) is a controller development and test technology. The HIL test platform simulates the controlled object and the operating environment of the controlled object, or uses a real sample as the controlled object, connects with the to-be-tested controller through a test interface, and realizes the test of the to-be-tested controller. In order to complete the HIL test, it is usually not necessary to use or not necessary to use all real controlled objects and real operating environments of the controlled objects, but a model can be used to simulate the controlled object and the operating environment, or a part of real physical load is connected, and a relatively complete controlled object and operating environment of the controlled object are formed through a virtual simulation model and / or real physical load. Since the cost of directly using real hardware for testing is too high, HIL test is widely used in vehicle controller development and test process.

[0028] Script: is a kind of code, code is program. Script serves other languages. Script is a specific descriptive language, an executable file (pure text saved executable file) written according to a certain format, which can usually be called and executed by an application program. Test script is computer readable instruction for automatically executing test process (or part of test process). Test script can be created (recorded) or automatically generated by using test automation tool, or programmed by using programming language to complete, or a combination of the above three methods can be used to complete.

[0029] For the convenience of understanding the technical solutions provided by the embodiments of the present application, the vehicle hardware-in-the-loop test device and system provided by the embodiments of the present application are described below with reference to the drawings.

[0030] Although the exemplary embodiments of the present application are shown in the drawings, it should be understood that the present application can be implemented in various forms and should not be limited by the embodiments described herein. Based on the embodiments in the present application, other embodiments obtained by those skilled in the art without making creative contributions are within the scope of protection of the present application.

[0031] In the claims and specification and drawings of the present application, the terms "first", "second", etc. are used to distinguish different objects, not to describe a specific order; the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion.

[0032] In the embodiments of the present application, the vehicle hardware-in-the-loop test device includes a plurality of functional test modules meeting different test requirements, each functional test module includes a hardware interface with a fixed definition; the functional test module is used to generate a working condition simulation signal after receiving a control signal, and output the working condition simulation signal to the controller through the corresponding hardware interface; the controller generates a response signal based on the received working condition simulation signal; the processing module receives the response signal and obtains a test result according to the response signal. Since the test device includes a plurality of functional test modules meeting different test requirements, the functional test modules that may be used are integrated in the test device, and when facing different test requirements, it is not necessary to reconfigure the test device every time the test requirements are changed, which can reduce the difficulty of hardware modification; since the hardware interface has a fixed definition, the working condition simulation signal output by the functional test module through the hardware interface generally does not change with the tested controller, so when facing different test requirements, it is not necessary to develop a new test script. In summary, the embodiments of the present application improve the compatibility of vehicle hardware-in-the-loop test by reducing the difficulty of hardware modification and reducing the development cost of test script.

[0033] Please refer to Figure 1 , Figure 1 is a structural schematic diagram of a vehicle hardware-in-the-loop test device provided by the embodiments of the present application. As Figure 1 shown, the vehicle hardware-in-the-loop test device 100 in the embodiments of the present application includes a processing module 101, and a plurality of functional test modules meeting different test requirements, Figure 1 For example, the device 100 includes functional test module 102, functional test module 103 and functional module 104, and in actual application, the device can also include two functional test modules, or more than three devices, and the embodiments of the present application do not limit the specific number of functional test modules.

[0034] Each of the functional test modules includes a hardware interface with a fixed definition. Specifically, functional test module 102 has a fixed hardware interface 105, functional test module 103 has a fixed hardware interface 106, and functional test module 104 has a fixed hardware interface 107. In practical applications, if the device further includes other functional test modules, each of the functional test modules includes a hardware interface with a fixed definition, which will not be described in detail here.

[0035] Regarding the functional test modules, functional test module 102 is used as an example here, and the same applies to other functional test modules. Functional test module 102 is used to generate a working condition simulation signal after receiving a control signal, and to output the working condition simulation signal to the controller through hardware interface 105, so that the controller receives the working condition simulation signal and generates a response signal based on the working condition simulation signal;

[0036] The processing module 101 is used to receive the response signal and obtain the test result based on the response signal.

[0037] The controller refers to the controller under test, which is used for HIL testing. The HIL test result of the controller is obtained through the device described in the embodiments of this application.

[0038] The device includes multiple functional testing modules to meet different testing requirements. The specific functional testing modules included in the device can be determined according to actual testing requirements, and this application embodiment does not limit this.

[0039] The hardware interface of a functional test module has a fixed definition, meaning that the functional test module outputs the same signals through the hardware interface. A fixed hardware interface definition indicates that the functional test module has a fixed output, which reduces the need to redevelop test scripts when facing different testing requirements. For example, to test the controller's control over vehicle lights, the test device may include a vehicle light test module. The fixed definition of the hardware interface of the vehicle light test module can be to output a high level or a low level, with the high level corresponding to the vehicle light being on and the low level corresponding to the vehicle light being off, respectively. When facing different testing requirements, such as changing the controller under test (DUT), because the output of the functional test module is fixed, it is not necessary to redevelop all the test scripts to test the new DUT. The scripts that meet the testing requirements of the new DUT can be used, reducing the need to redevelop test scripts and thus improving the compatibility of HIL testing.

[0040] The operating condition simulation signal is output from the functional test module to the controller; it represents the signal generated by the controlled object under a specific operating environment; it can be generated by simulating the controlled object and its operating environment, or it can be generated by connecting a real physical load. That is, the controlled object can be a real physical load or a simulated one, and the operating environment of the controlled object can be real or simulated. Each functional test module outputs its own operating condition simulation signal through its own hardware interface, but the operating condition simulation signal output by the device can be determined according to the current test requirements.

[0041] The response signal is the control command signal generated by the controller upon receiving the operating condition simulation signal, which refers to the control command signal generated by the controller for the controlled object during actual operation.

[0042] The processor generates test results based on the response signal, which means that the processor receives the control command signal issued by the controller and directly obtains or obtains the test HIL result of the controller through processing and / or analysis.

[0043] Furthermore, in this embodiment, the controller may include an air conditioning control unit, a seat control unit, a window control unit, a trailer control unit, an airbag control unit, an electronic steering lock control unit, etc. The HIL testing device provided in this embodiment can be used to test domain control units, such as air conditioning control units, seat control units, window control units, trailer control units, airbag control units, electronic steering lock control units, etc., or to perform system-level testing of each domain controller, or vehicle-level collaborative testing. It can also reserve hardware resources for future testing needs.

[0044] Furthermore, the device also includes a storage module, wherein: the storage module is used to store diagnostic configuration word scripts that meet different test requirements; the processing module is also used to execute the diagnostic configuration word scripts to obtain control signals, so that the functional test module corresponding to the control signals receives the control signals.

[0045] The execution of the diagnostic configuration word script is to activate the corresponding functions of the controller, achieving full functional coverage of the controller under test to a certain extent. In existing technologies, to meet current testing requirements, configuration words need to be manually set in the test script, and then manually set again when testing requirements change. For example, first, the configuration word corresponding to a higher configuration is manually set, and after the high-configuration test is completed, the configuration word corresponding to a lower configuration is manually set for low-configuration testing, resulting in poor compatibility for testing requirements of different configurations. In this embodiment, diagnostic configuration word scripts that meet different testing requirements can be developed, resulting in a large number of automated diagnostic configuration word test scripts. When executing the automated diagnostic configuration word test scripts, the corresponding functions of the controller can be activated, achieving full functional coverage of the controller under test to a certain extent, improving the test scope and test quality. Setting configuration word test scripts that meet different testing requirements can complete tests for multiple configurations, reducing multiple manual configurations and re-flashes caused by different configuration testing requirements, and improving the compatibility of HIL tests. Furthermore, corresponding CAPL script programs can be written using CANOE to implement diagnostic configuration word reading and writing, as well as controller security authentication.

[0046] Furthermore, the plurality of functional test modules may include at least one virtual test module and one physical test module, and the device further includes a switching module; wherein the switching module is used to switch between the virtual test module and the physical test module among the plurality of functional test modules.

[0047] The virtual test module can be a functional test module that obtains operating condition simulation signals through model simulation or partial simulation; the physical test module can be the actual physical load of the controller. The controller can be connected to a real load such as a light or windshield wiper, for example, directly connected to a real component. The control commands of the controller are acquired through the I / O acquisition resources of the test device, and the controller's actions are simulated and judged according to the control commands, thereby completing the test of the controller's function. The specific number of the virtual test module and the physical test module is not limited in this application. If it is necessary to switch between physical load and virtual load, the multiple functional test modules can include at least one virtual test module and one physical test module. Furthermore, since it can switch between real and virtual samples, the test device can be used as both an experimental test bench and an automated test bench.

[0048] The switching module can be a three-way switching board, which switches between the virtual test module and the physical test module. This application embodiment provides a structure and connection method for a three-way switching board: the three-way switching board can have a signal output channel, a first signal input channel, and a second signal input channel. The three-way switching board is used to switch between the input signals in the first signal input channel and the second signal input channel. The signal output channel is connected to a controller, the first input channel is connected to a physical test module, and the second input channel is connected to a virtual test module of the controller. The three-way switching board enables the vehicle hardware-in-the-loop device to meet the switching requirements under real and virtual conditions during the control of the controller. The physical test module is the real load component, and the virtual test module is a non-real controlled object simulated by the hardware-in-the-loop device and provided to the controller. Virtual switching signals can be provided to the controller through the input / output board of the device, or real switching signals can be provided to the controller through the three-way switching board. When the test objective is for the controller to control a real load, the input channel of the three-way switching board can be switched to the first input channel, connecting the controller and the physical test module, thus enabling testing of the controller under the connected physical test module conditions. However, if a real physical load cannot be provided during controller testing, the virtual test module in the vehicle hardware-in-the-loop device provides the necessary simulation signal to the controller to complete the test. The switching process can be implemented through software configuration, using the three-way switching board to switch between the real physical sample and the virtual sample, meeting different testing requirements. It is understood that whether the device includes the switching module, and whether the switching module is a three-way switching board, does not affect the implementation of the embodiments of this application.

[0049] Furthermore, the device may also include a fault injection module; wherein the fault injection module is used to generate a working condition simulation signal for output to the controller in conjunction with the functional test module before the functional test module outputs the working condition simulation signal through the corresponding hardware interface.

[0050] The fault injection module simulates fault conditions, including electrical faults such as unreasonable signals, open circuits in the comfort domain controller, and short circuits, meeting fault diagnosis testing requirements. When testing the controller's function under normal operating conditions, multiple functional test modules are used. When testing the controller's function under fault conditions, the fault injection module, in conjunction with the multiple functional test modules, generates a fault condition simulation signal and outputs it to the controller. The number and specific structure of the fault input modules can be set according to actual needs. Numerous automated fault injection test scripts can be developed, combined with fault injection boards to achieve automated fault injection testing of multiple channels of the controller under test. For example, a fault injection board can be used to provide the controller under test with a fault condition simulation signal. The fault injection board is connected in series between the controller under test and the load to simulate fault conditions during the controller's function of controlling the load, evaluating the controller's performance during fault handling. Considering that many controllers are high-power loads, up to 20 high-current fault injection channels can be configured. Fault types may include current faults such as right low beam headlight open circuit, license plate light open circuit, historical faults such as rearview mirror open circuit, and current faults such as hood switch short circuit to ground. It is understood that whether or not the device includes a fault injection module does not affect the implementation of the embodiments of this application.

[0051] Furthermore, the device may also include a connection cable conforming to the standard interface definition of the device, wherein the hardware interface corresponding to the functional test module is connected to the controller via the connection cable. Since the hardware interface definition is fixed, the interface definition of the controller under test may differ for different test requirements. In this case, manufacturing the connection cable according to the HIL test device standard interface definition enables rapid switching of the hardware platform. The connection cable can be an adapter cable. It is understood that whether the device includes the connection cable does not affect the implementation of the embodiments of this application.

[0052] Furthermore, the plurality of functional test modules may include a vehicle start test module, wherein the vehicle start module includes a smart key circuit; wherein the smart key circuit is used to receive a button trigger signal, so that the vehicle start test module generates a working condition simulation signal for at least one working condition of vehicle locking, vehicle unlocking, and vehicle locating after receiving a control signal.

[0053] The multiple functional test modules may include a vehicle start-up test module, meaning that one of the multiple functional test modules can be the vehicle start-up test module. Typically, in scenarios where a smart key is used to open a vehicle, a high-frequency infrared signal receiver receives a high-frequency signal of 443.92MHz and determines whether the key and sensor belong to the vehicle, then transmits the signal to the controller to execute unlock / lock commands, or to implement a series of functions such as tire pressure warning. To simulate keyless entry, it is usually necessary to damage the remote control and connect it to the digital output of the real-time system, allowing for automatic control. To meet the above-mentioned automatic testing requirements, the vehicle keyless entry control (PEPS) key needs to be disassembled, and the switch input on the key needs to be simulated through a test platform to achieve automatic testing of PEPS. In this embodiment, the test device can allocate button I / O signals and integrate them with the smart key circuit, adding external signal triggering without damaging the original mechanical button function to simulate the vehicle keyless entry control condition. It is understood that whether the multiple functional test modules include a vehicle start-up test module does not affect the implementation of this embodiment.

[0054] Furthermore, the plurality of functional test modules may include an antenna position test module, wherein the antenna position test module includes a shielded antenna submodule and an unshielded antenna submodule, used to generate a working condition simulation signal based on the relative position between the smart key and the antenna after receiving a control signal; wherein the shielded antenna submodule is used to simulate an antenna that has not received a signal from the smart key; and the unshielded antenna submodule is used to simulate an antenna that has received a signal from the smart key.

[0055] Keyless entry typically refers to triggering a switch, for example, at the door handle, to activate the controller, which locates the smart car key and receives its radio frequency signal via a location antenna. The aforementioned multiple functional testing modules may include a dedicated antenna location testing module. This module simulates the relative positions of the smart car key and the location antennas to demonstrate a keyless entry scenario, thus testing the controller under this condition. The antenna location testing module may include shielded and unshielded antenna submodules. For example, antenna groups may represent different location antennas, corresponding to antennas located at different positions on the vehicle in a real-world scenario. Antenna shielding can be implemented using a shielding circuit, which is program-controlled to provide the necessary shielding and unshielding for different location antennas. Furthermore, switching between the real antenna and the shielded antenna can simulate various operating conditions of the smart key inside and outside the vehicle. It is understood that whether or not the multiple functional testing modules include the antenna location testing module does not affect the implementation of this embodiment.

[0056] Furthermore, the plurality of functional test modules may include an electronic steering column lock test module, wherein the electronic steering column lock test module may include an electronic steering column lock and a Hall sensor element, for generating a working condition simulation signal under at least one working condition of electronic steering column lock open and electronic steering column lock closed after receiving a control signal; wherein the Hall sensor element is installed on the electronic steering column lock, for obtaining the on / off state of the electronic steering column lock based on the Hall effect.

[0057] Regarding the control of the Electronic Steering Column Lock (ESCL), hardware-in-the-loop testing requires monitoring the power supply to the ESCL and its lock status, which refers to whether the lock is open or closed. For monitoring the ESCL power supply, power supply information can be acquired through an analog input channel. Monitoring the lock status mainly involves determining the state of the latch, which can be achieved using the following method: A Hall effect sensor is installed on the ESCL, utilizing the Hall effect to determine the latch status. This Hall effect sensor is installed near the ESCL keyhole and can be called a proximity switch (a switch used to determine whether the latch is close to the keyhole). This application provides an implementation scheme that uses an Omron proximity switch. Utilizing the Hall effect, when a metal object approaches the proximity switch within a certain distance, the output of the Hall effect sensor changes. Based on the output signal of the Hall effect sensor, the state of the latch can be determined, thereby determining whether the ESCL is open or closed. This application embodiment enables more convenient durability testing of the ESCL. It is understood that whether the multiple functional test modules include the electronic steering column lock test module does not affect the implementation of this application embodiment.

[0058] Furthermore, the plurality of functional test modules may include a wheel test module, wherein the wheel sub-module is used to generate a working condition simulation signal including vehicle speed and / or wheel speed after receiving a control signal. The working condition simulation signal generated by the vehicle test module includes vehicle speed and / or wheel speed, which can better replace the real sample to complete the test. For example, simulation tests of signals such as vehicle speed, wheel speed, and engine speed can be realized through CAN bus signal Checksum (CRC check) and Rolling Counter (rolling check) models. It is understood that whether the plurality of functional test modules include a wheel test module does not affect the implementation of the embodiments of this application.

[0059] Furthermore, in this embodiment, the test script may include a script composed of a modular function library. The script, composed of a modular function library, allows for quick switching between different projects when test requirements change, thereby improving the overall hardware-in-the-loop compatibility. The function library enables repeatedly executed operations to be implemented within the same function, and modularity, by constructing purpose-built modules, allows for use in multiple projects, reducing the workload of script writing when switching projects, accelerating the iteration speed of automated test scripts, and thus improving the compatibility of HIL testing.

[0060] Furthermore, the device also includes a test panel, wherein operating the controls on the test panel can provide operating condition simulation signals to the controller under test (DUT) or acquire the output signals of the DUT. During the testing of the controller, Veristand automated testing software can be used to visualize the testing process. By associating Veristand's board resources with the switch inputs and drive outputs required by the DUT, the simulation of switch signals and the acquisition of output signals can be achieved through Veristand controls, thereby completing the hardware-in-the-loop testing process. The switch inputs are the simulation inputs required by the DUT and are provided by the device. It is understood that whether the device includes the test panel does not affect the implementation of this embodiment.

[0061] Furthermore, embodiments of this application can utilize automated testing software to complete the automated test sequence construction and execution process. For example, an automated test execution software, TAE (Intelligent Test Executor System), developed based on Eclipse RCP, can be used. TAE is a general-purpose test execution software compatible with different simulation systems, and possesses a range of controller testing-related functions, including fault injection, calibration, testing, diagnosis, and surface model-in-the-loop testing. Using TAE test case execution software, users have high flexibility in executing test cases. Repeated tests can be performed as needed, such as on weekends or evenings when no intervention is required, thereby increasing test depth and coverage within a limited time, saving test time and costs. It is understood that whether or not the TAE software is used does not affect the implementation of this embodiment.

[0062] Furthermore, the device may also include other modules, for example, the device may also include:

[0063] 220V power switch, used to supply 220V power to the HIL cabinet;

[0064] The 12V power supply and board are used to power the analog controller. The power supply is adjustable from 9V to 16V and is used to simulate the power required by electrical control units such as KL30, KL15, and KL50. It has controller current protection function.

[0065] Industrial control computer is used for industrial control. It installs the software required for HIL testing (such as TAE, Veristand, CANOE and other testing software) and communicates with the real-time machine and controls the PXI board through the internal local area network.

[0066] The signal conditioning unit is used to convert the input and output signals of the ECU to different levels, and then input them into the corresponding PXI board for simulation testing.

[0067] Real-time machine and PXI boards: The real-time machine is built based on NI's PXI Express technology and includes a chassis, real-time processor and various I / O boards. It is used for loading and parsing body DBC, LDF and other files, simulating input signals and acquiring output signals required by the ECU, and performing hardware-in-the-loop simulation tests.

[0068] Load benches are used to integrate real switches and loads of the controller under test, making HIL testing closer to real operating conditions, thereby improving the reliability of test results.

[0069] Furthermore, the device can be configured with a multi-functional data acquisition board to provide AD, DA, PWM and other types of resource channels for the controller under test, thereby meeting the testing needs of the controller under test and enabling hard-wired signal simulation and acquisition functions.

[0070] Furthermore, the device can be configured with CAN and LIN bus transceiver boards, directly import DBC and LDF files, support the simulation of message signals and the parsing of acquired signals, and, in conjunction with a test system, meet the testing requirements for bus signal functions and sleep / wake-up functions, thus possessing bus signal simulation and acquisition capabilities.

[0071] Furthermore, all of the above functions of the device support the invocation of automated test management software, enabling the graphical creation, editing, execution, and automatic generation of reports for automated test scripts;

[0072] Furthermore, it can be built on NI's flexible hardware and software platform, providing device interfaces in PXI / PXIe and other bus formats, which can meet the electrical connection needs of users' existing equipment and support subsequent upgrade and expansion needs.

[0073] Please see Figure 2 , Figure 2 This is a schematic diagram of the structure of a vehicle hardware-in-the-loop testing system provided in an embodiment of this application. Figure 2As shown, the vehicle hardware-in-the-loop testing system 200 in this embodiment includes a vehicle hardware-in-the-loop testing device 201 and a controller 202, wherein:

[0074] The vehicle hardware-in-the-loop test device 201 is used to generate a working condition simulation signal after receiving a control signal, and to output the working condition simulation signal to the controller.

[0075] The controller 202 is used to receive the operating condition simulation signal and generate a response signal based on the operating condition simulation signal;

[0076] The vehicle hardware-in-the-loop test device 201 is also used to receive the response signal and obtain test results based on the response signal.

[0077] The structure, connection relationship, and functions that the vehicle hardware-in-the-loop test device and controller in the system have been discussed above and will not be repeated here.

[0078] The above description of the disclosed embodiments enables those skilled in the art to make or use this application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A vehicle hardware-in-the-loop testing device, characterized in that, The device includes a processing module, a switching module, and multiple functional test modules to meet different testing requirements. Each functional test module includes a hardware interface with a fixed definition, wherein: The functional testing module includes at least one virtual testing module and one physical testing module. After receiving a control signal, it simulates the controlled object and its operating environment using the virtual testing module, or generates a working condition simulation signal based on the physical load connected to the physical testing module. The module then outputs the working condition simulation signal to the controller via a corresponding hardware interface with a fixed definition. The controller receives the working condition simulation signal and generates a response signal based on it. The response signal is the controller's control command signal for the controlled object. The hardware interface has a fixed definition, and the working condition simulation signal output by the functional testing module through the hardware interface typically does not change with the controller under test. Therefore, no new test scripts need to be developed for different testing requirements. The switching module is used to switch between the virtual test module and the physical test module among the plurality of functional test modules; The processing module is used to receive the response signal and obtain the test result based on the response signal.

2. The apparatus according to claim 1, characterized in that, The device further includes a storage module, wherein: The storage module is used to store diagnostic configuration scripts that meet different testing requirements; The processing module is further configured to execute the diagnostic configuration word script to obtain a control signal, so that the functional test module corresponding to the control signal receives the control signal.

3. The apparatus according to claim 1, characterized in that, The device further includes a fault injection module; wherein... The fault injection module is used to generate a working condition simulation signal for output to the controller in conjunction with the functional test module before the functional test module outputs the working condition simulation signal through the corresponding hardware interface.

4. The apparatus according to claim 1, characterized in that, The device also includes a connection cable conforming to the device's standard interface definition, wherein... The hardware interface corresponding to the functional test module is connected to the controller via the connecting cable.

5. The apparatus according to claim 1, characterized in that, The multiple functional test modules include a vehicle start-up test module, wherein: The vehicle start-up test module includes a smart key circuit; wherein, the smart key circuit is used to receive button trigger signals, so that the vehicle start-up test module generates working condition simulation signals for at least one working condition of vehicle locking, vehicle unlocking, and vehicle locating after receiving control signals.

6. The apparatus according to claim 1, characterized in that, The multiple functional test modules include an antenna position test module, wherein... The antenna position testing module includes a shielded antenna submodule and an unshielded antenna submodule, used to generate a working condition simulation signal based on the relative position between the smart key and the antenna after receiving the control signal; wherein, The shielded antenna submodule is used to simulate an antenna that has not received a signal from the smart key; the unshielded antenna submodule is used to simulate an antenna that has received a signal from the smart key.

7. The apparatus according to claim 1, characterized in that, The multiple functional test modules include an electronic steering column lock test module, wherein... The electronic steering column lock test module includes an electronic steering column lock and a Hall effect sensor, which is used to generate a working condition simulation signal for at least one working condition of electronic steering column lock open and electronic steering column lock closed after receiving a control signal; wherein, the Hall effect sensor is installed on the electronic steering column lock and is used to obtain the on / off state of the electronic steering column lock based on the Hall effect.

8. The apparatus according to claim 1, characterized in that, The multiple functional test modules include a wheel test module, wherein... The wheel test module is used to generate a working condition simulation signal including vehicle speed and / or wheel speed after receiving a control signal.

9. A vehicle hardware-in-the-loop testing system, characterized in that, The system includes the vehicle hardware-in-the-loop testing apparatus and controller as described in claim 1, wherein: The vehicle hardware-in-the-loop testing device is used to simulate the controlled object and the operating environment of the controlled object according to the virtual test module after receiving the control signal, or to generate the working condition simulation signal according to the physical load connected to the physical test module, and output the working condition simulation signal to the controller. The vehicle hardware-in-the-loop testing device is also used to switch between the virtual testing module and the physical testing module; The controller is configured to receive the operating condition simulation signal and generate a response signal based on the operating condition simulation signal, wherein the response signal is a control command signal of the controller for the controlled object; The vehicle hardware-in-the-loop testing device is also used to receive the response signal and obtain test results based on the response signal.

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