A device state detection method and apparatus, an electronic device, and a storage medium

By acquiring and analyzing device signals and characteristic data, the problem of real-time device health detection has been solved, enabling real-time monitoring of device status and early warning of anomalies, thereby improving device stability and user experience.

CN115729785BActive Publication Date: 2026-03-03CHINA AUTOMOTIVE INNOVATION CORP
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Patent Information

Application Number
CN202211525062.5
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-11-30
Publication Date
2026-03-03
Estimated Expiration
2042-11-30

AI Technical Summary

Technical Problem

Existing technologies lack effective means to perform real-time health checks on equipment or related modules during actual operation, resulting in poor timeliness and high costs, making it impossible to detect equipment abnormalities in advance and affecting the stable operation of the equipment.

Method used

By acquiring signal, usage duration, and device status characteristic data of the target device, signal characteristic analysis is performed to determine the characteristic range information corresponding to the current usage duration. Combined with the target signal characteristic information, device status analysis is performed to achieve real-time health detection.

Benefits of technology

It enables the reduction of detection difficulty and cost, early detection of device anomalies, improved device stability, and enhanced user experience without changing the original system architecture.

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Abstract

The present disclosure relates to a device state detection method and device, an electronic device and a storage medium. The method comprises: obtaining a target device signal of a target device in a current running process, a current use duration corresponding to the target device, and device state feature data corresponding to the target device, wherein the device state feature data comprises feature range information corresponding to each of a plurality of preset use durations; performing signal feature analysis on the target device signal to obtain target signal feature information; determining target feature range information corresponding to the current use duration from the feature range information corresponding to each of the plurality of preset use durations; and performing device state analysis on the target device based on the target feature range information and the target signal feature information to obtain a current running state corresponding to the target device. The embodiments of the present disclosure can realize real-time health detection of the target device, realize early discovery of device abnormalities, facilitate making corresponding emergency response measures, reduce the failure rate, and improve user experience.
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Description

Technical Field

[0001] This disclosure relates to the field of equipment testing technology, and in particular to a method, apparatus, electronic device, and storage medium for equipment condition testing. Background Technology

[0002] With the development of the intelligent connected industry, the level of electronicization and penetration rate of devices are increasing, and application scenarios are becoming more and more widespread. The stable operation of electronic devices is a fundamental prerequisite for effective application. However, the aging and damage of related hardware during the use of devices may lead to abnormal operation or even damage. Therefore, it is necessary to effectively detect the physical operating status of electronic devices and related modules.

[0003] In the existing technology, there is a lack of technical means to perform real-time health monitoring of equipment or related modules during actual operation. On the one hand, this is because equipment types are diverse and the testing standards for different equipment or components are different. On the other hand, traditional testing mainly relies on functional testing of the protocol layer and application layer, which is not sensitive to quality changes caused by aging and other issues at the physical layer of the equipment. Often, after the equipment malfunctions, special testing equipment or manual judgment based on experience is required. This results in poor timeliness, high cost, and an inability to detect the health status of the equipment in advance, thus making it impossible to make a correct judgment in time before anomalies occur. Summary of the Invention

[0004] In view of the above-mentioned technical problems, this disclosure proposes a method, apparatus, electronic device and storage medium for equipment status detection.

[0005] According to one aspect of the embodiments of this disclosure, a device status detection method is provided, comprising:

[0006] Acquire the target device signal during the current operation of the target device, the current usage duration of the target device, and the device status feature data of the target device. The device status feature data includes feature range information corresponding to multiple preset usage durations.

[0007] The target device signal is analyzed to obtain target signal feature information;

[0008] From the feature range information corresponding to each of the multiple preset usage durations, determine the target feature range information corresponding to the current usage duration;

[0009] Based on the target feature range information and the target signal feature information, the target device is analyzed to obtain the current operating status of the target device.

[0010] Optionally, the step of performing device status analysis on the target device based on the target feature range information and the target signal feature information to obtain the current operating status of the target device includes:

[0011] The target feature range information and the target signal feature information are compared to obtain the comparison result.

[0012] If the comparison result indicates that the target signal feature information does not belong to the target feature range information, the current operating state is determined to be an abnormal operating state.

[0013] Optionally, the method further includes:

[0014] If the comparison result indicates that the target signal feature information belongs to the target feature range information, the current operating state is determined to be a normal operating state.

[0015] Optionally, the device status feature data corresponding to the target device may be obtained using the following methods:

[0016] Acquire multiple preset device signals corresponding to any of the preset usage durations;

[0017] Signal feature analysis is performed on the multiple preset device signals to obtain multiple device signal feature information;

[0018] Based on the signal characteristic information of the multiple devices, feature range analysis is performed to obtain the feature range information corresponding to any of the preset usage durations.

[0019] Optionally, acquiring multiple preset device signals corresponding to any of the preset usage durations includes:

[0020] Control multiple initial devices to run for a first preset duration;

[0021] During the operation of the plurality of initial devices, device signals are acquired from the plurality of initial devices to obtain multiple device operation signals;

[0022] From each device's operating signal, filter out the preset device signal corresponding to each preset usage duration;

[0023] The device type of the plurality of initial devices is the same as that of the target device.

[0024] Optionally, the step of performing feature range analysis based on the signal feature information of the multiple devices to obtain feature range information corresponding to any of the preset usage durations includes:

[0025] From the plurality of device signal feature information, a first feature information and a second feature information are selected, wherein the first feature information is the largest feature information among the plurality of device signal feature information, and the second feature information is the smallest feature information among the plurality of device signal feature information;

[0026] Based on the first feature information and the second feature information, the feature range information is determined.

[0027] Optionally, determining the target feature range information corresponding to the current usage duration from the device status feature data includes:

[0028] Search for the current usage duration in the device status feature data;

[0029] If the current usage duration is found, the feature range information corresponding to the current usage duration is used as the target feature range information.

[0030] According to another aspect of the present disclosure, a device for detecting device status is provided, the device comprising:

[0031] The information acquisition module is used to acquire the target device signal during the current operation of the target device, the current usage time of the target device, and the device status feature data of the target device. The device status feature data includes feature range information corresponding to multiple preset usage times.

[0032] The signal feature analysis module is used to perform signal feature analysis on the target device signal to obtain target signal feature information;

[0033] The target feature range information determination module is used to determine the target feature range information corresponding to the current usage duration from the device status feature data;

[0034] The device status analysis module is used to perform device status analysis on the target device based on the target feature range information and the target signal feature information, and to obtain the current operating status of the target device.

[0035] According to another aspect of the present disclosure, an electronic device is provided, comprising: a processor; and a memory for storing processor-executable instructions; wherein the processor is configured to execute the instructions to implement the above-described device state detection method.

[0036] According to another aspect of the present disclosure, a computer-readable storage medium is provided, which, when the instructions in the storage medium are executed by a processor of an electronic device, enables the electronic device to perform the device state detection method described above.

[0037] The technical solutions provided by the embodiments of this disclosure have at least the following beneficial effects:

[0038] This system acquires target device signals, current usage duration, and device status feature data (including feature range information corresponding to multiple preset usage durations) during the current operation of the target device. Signal feature analysis is then performed on the target device signals to obtain target signal feature information, enabling feature extraction. Furthermore, the target feature range information corresponding to the current usage duration is determined from the feature range information corresponding to each of the multiple preset usage durations, thus defining the current target feature range information of the target device. Finally, combining the target feature range information and target signal feature information, device status analysis is performed to obtain the current operating status of the target device. This allows for real-time health monitoring of the target device without altering the original system architecture, reducing detection difficulty and costs. It also enables early detection of device anomalies, facilitating appropriate emergency response measures, reducing failure rates, improving device stability, and enhancing user experience.

[0039] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0040] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure, and are not intended to unduly limit this disclosure.

[0041] Figure 1 This is a flowchart illustrating a device status detection method according to an exemplary embodiment;

[0042] Figure 2 This is a block diagram illustrating a device status detection apparatus according to an exemplary embodiment;

[0043] Figure 3 This is a block diagram illustrating an electronic device for detecting the current operating state of a target device according to an exemplary embodiment;

[0044] Figure 4 This is a block diagram illustrating another electronic device for detecting the current operating state of a target device, according to an exemplary embodiment. Detailed Implementation

[0045] Various exemplary embodiments, features, and aspects of this application will now be described in detail with reference to the accompanying drawings. The same reference numerals in the drawings denote elements that have the same or similar functions. Although various aspects of the embodiments are shown in the drawings, they are not necessarily drawn to scale unless specifically indicated otherwise.

[0046] The term “exemplary” as used herein means “serving as an example, embodiment, or illustration.” Any embodiment illustrated herein as “exemplary” is not necessarily to be construed as superior to or better than other embodiments.

[0047] Furthermore, to better illustrate this application, numerous specific details are provided in the following detailed embodiments. Those skilled in the art should understand that this application can be implemented without certain specific details. In some instances, methods, means, components, and circuits well-known to those skilled in the art have not been described in detail in order to highlight the main points of this application.

[0048] Please see Figure 1 , Figure 1 This is a flowchart illustrating a device status detection method according to an exemplary embodiment. For example... Figure 1 As shown, this device status detection method can be used in electronic devices such as terminals or servers, and specifically includes the following steps:

[0049] In step S101, the target device signal, the current usage time of the target device, and the device status characteristic data of the target device during the current operation are obtained.

[0050] In one specific embodiment, the target device can refer to the device whose current operating status is to be detected. The target device may include electrical equipment or energy storage equipment, etc.

[0051] In a specific embodiment, the target device signal can refer to the output or input signal of the target device during its current operation. The target device signal can include electrical signals such as voltage or current signals. Specifically, during the current operation of the target device, the target device signal can be obtained by collecting signals from the target device's operation. For example, the time length corresponding to the target device signal can be 0.1h to 0.5h. It is understood that by collecting signals from the target device operating for a period of time, the target device signal can be obtained, ensuring that the collected target device signal contains features that reflect the current operating state.

[0052] In a specific embodiment, the current usage duration of the target device can refer to the duration from the time the target device was put into use to the current time.

[0053] In one specific embodiment, relevant information about the target device can be pre-selected and stored in a preset memory. This relevant information may include the target device's usage time and the identification information corresponding to its device type. The usage time of the target device can refer to the time when the target device is put into use; the identification information of the device type may include the device model, etc. Accordingly, by obtaining the target device's usage time from the preset memory and combining it with the current time, the current usage duration of the target device can be determined.

[0054] In one specific embodiment, the device status characteristic data may include feature range information corresponding to multiple preset usage durations. The feature range information corresponding to each preset usage duration can characterize the signal characteristic range of the target device when it has been running for that preset usage duration and is in normal operating condition. The feature range information corresponding to each preset usage duration may include range information corresponding to at least one feature type, wherein the feature type may include the number of rising edges, the number of falling edges, peak fluctuation frequency, or peak fluctuation characteristics, etc. Specifically, the preset usage duration can be set according to actual needs; optionally, the preset usage duration may include 1 year, 2 years, or 3 years, etc.

[0055] In one specific embodiment, device status feature data corresponding to multiple device types can be stored in a preset memory in advance. Accordingly, the identification information corresponding to the device type of the target device can be obtained from the preset memory, and based on the identification information, the device status feature data corresponding to the device type of the target device can be obtained from the preset memory.

[0056] In a specific embodiment, the device status feature data corresponding to the target device mentioned above may be obtained in the following ways:

[0057] Acquire multiple preset device signals corresponding to any preset usage duration;

[0058] Signal feature analysis is performed on multiple preset device signals to obtain signal feature information for multiple devices;

[0059] Based on the signal characteristic information of multiple devices, feature range analysis is performed to obtain the feature range information corresponding to any preset usage duration.

[0060] In a specific embodiment, the preset device signal corresponding to any preset usage duration can refer to the signal of a device of the same type as the target device running for a second preset duration after the aforementioned preset usage duration. Here, a device of the same type as the target device can refer to a device of the same type as the target device. Specifically, the second preset duration can be set according to actual needs; optionally, the value range of the second preset duration can be 0.5h to 2h, and for example, the second preset duration can be 1h.

[0061] In a specific embodiment, the above-mentioned acquisition of multiple preset device signals corresponding to any preset usage duration may include:

[0062] Control multiple initial devices to run for a first preset duration;

[0063] During the operation of multiple initial devices, device signals are acquired from each initial device to obtain multiple device operation signals;

[0064] From the operating signals of each device, filter out the preset device signals corresponding to each preset usage duration.

[0065] In one specific embodiment, the initial device can refer to a device of the same type as the target device, which is factory qualified and has not been put into use. Specifically, the first preset duration can be set according to actual needs. Optionally, the value range of the first preset duration can be 1h to 10h. For example, the first preset duration can be 2h.

[0066] In one specific embodiment, to ensure that the signals acquired from the initial devices closely resemble those during actual operation, the simulated operating environment of the initial devices can be made to approximate the actual operating environment. Then, within the simulated operating environment, the different initial devices are controlled to run for a first preset duration. It should be noted that the operation of the different initial devices can be performed simultaneously or not simultaneously; this disclosure does not impose any limitations.

[0067] In one specific embodiment, the device operation signal may refer to the signal of the device during its initial operation.

[0068] In one specific embodiment, during the operation of each initial device, device signals can be acquired to obtain the device operation signal. Specifically, an aging test can be performed on the initial device, and the device operation signal can be acquired during the aging test. The duration corresponding to the device operation signal can be greater than a second preset duration. For example, during the aging process of each initial device, the signal during the aging process can be acquired as the device operation signal. Then, based on the correspondence between different aging times and preset usage durations in the device operation signal, preset device signals corresponding to different preset usage durations can be extracted from the device operation signal.

[0069] In one specific embodiment, any device signal feature information can characterize the signal characteristics of any preset device signal. Any device signal feature information may include feature information corresponding to at least one feature type.

[0070] In one specific embodiment, linear discriminant analysis can be performed on any preset device signal to obtain the feature information of that device signal. Specifically, the feature information of any preset device signal can be obtained by projecting it into a low-dimensional space and performing classification processing.

[0071] In a specific embodiment, the above-mentioned feature range analysis based on multiple device signal feature information to obtain feature range information corresponding to any preset usage duration may include:

[0072] From the signal characteristic information of multiple devices, the first characteristic information and the second characteristic information are selected;

[0073] Based on the first feature information and the second feature information, the feature range information is determined.

[0074] In one specific embodiment, the first feature information can be the largest feature information among multiple device signal feature information. The first feature information may include the largest feature information corresponding to at least one feature type. The second feature information can be the smallest feature information among multiple device signal feature information. The second feature information may include the smallest feature information corresponding to at least one feature type.

[0075] In a specific embodiment, from multiple device signal feature information, multiple feature information corresponding to any feature type can be filtered out first. Then, from the multiple feature information corresponding to any feature type, the largest feature information can be found to obtain the largest feature information corresponding to any feature type. Accordingly, the first feature information can be generated based on the largest feature information corresponding to each feature type.

[0076] In a specific embodiment, from multiple device signal feature information, multiple feature information corresponding to any feature type can be first filtered out. Then, from the multiple feature information corresponding to any feature type, the smallest feature information can be found to obtain the smallest feature information corresponding to any feature type. Accordingly, a second feature information can be generated based on the smallest feature information corresponding to each feature type.

[0077] In a specific embodiment, threshold analysis can be performed based on the first feature information to obtain a first feature threshold corresponding to each feature type. Then, threshold analysis can be performed based on the second feature information to obtain a second feature threshold corresponding to each feature type. Finally, feature range information is generated based on the first feature threshold and the second feature threshold corresponding to each feature type. Specifically, the statistical information of multiple feature information corresponding to any feature type in the first feature information can be used as the first feature threshold corresponding to that feature type. Similarly, the statistical information of multiple feature information corresponding to any feature type in the second feature information can be used as the second feature threshold corresponding to that feature type. Optionally, the statistical information of the multiple feature information can refer to the maximum, minimum, or average value of the multiple feature information.

[0078] In the above embodiments, by acquiring multiple preset device signals corresponding to any preset usage duration, performing signal feature analysis on the multiple preset device signals to obtain multiple device signal feature information, and performing feature range analysis based on the multiple device signal feature information to obtain feature range information corresponding to any preset usage duration, it is possible to analyze and obtain device status feature data of different devices, which can improve the adaptability of the device status detection method to different devices, thereby improving the accuracy of device status detection.

[0079] In step S103, signal feature analysis is performed on the target device signal to obtain target signal feature information.

[0080] In one specific embodiment, linear discriminant analysis of the target device signal can yield target signal feature information. Specifically, target signal feature information can be obtained by projecting the target device signal into a low-dimensional space and performing classification processing.

[0081] In step S105, the target feature range information corresponding to the current usage duration is determined from the feature range information corresponding to each of the multiple preset usage durations.

[0082] In one specific embodiment, the target feature range information may refer to the feature range information corresponding to the current usage duration among multiple preset usage durations of feature range information. The target feature range information may include range information corresponding to at least one feature type.

[0083] In one specific embodiment, step S105 above may include:

[0084] Find the current usage duration in the device status characteristic data;

[0085] If the current usage duration is found, the feature range information corresponding to the current usage duration is used as the target feature range information.

[0086] In one specific embodiment, based on the current usage duration of the target device, it is matched against multiple preset usage durations in the device status feature data corresponding to the target device. If any preset usage duration is matched, the feature range information corresponding to that preset usage duration can be used as the target feature range information. For example, assuming the actual usage duration of the target device is 1.9 years, the current usage duration of the target device can be determined to be 2 years. The feature range information with a preset usage duration of 2 years can be matched in the device status feature data corresponding to the target device, and this feature range information can be used as the target feature range information.

[0087] In step S107, based on the target feature range information and the target signal feature information, the target device is analyzed to obtain the current operating status of the target device.

[0088] In a specific embodiment, the current operating state of the target device can be used to characterize whether the target device may be malfunctioning. The current operating state of the target device can include normal operation and abnormal operation. The normal operation state of the target device indicates that the current operation process is normal; the abnormal operation state of the target device indicates that the target device may be malfunctioning, and a warning signal can be issued to remind maintenance personnel to check. It is understood that the target device may be in an abnormal operation state due to an inherent malfunction in the device itself, or it may be due to incorrect usage or environmental conditions that accelerate the aging of the device and cause malfunctions.

[0089] In one specific embodiment, step S107 above may include:

[0090] The target feature range information and target signal feature information are compared to obtain the comparison results.

[0091] If the comparison results indicate that the target signal feature information does not belong to the target feature range, the current operating state is determined to be an abnormal operating state.

[0092] In one specific embodiment, the comparison result may include a first comparison result and a second comparison result. The first comparison result can be used to indicate that at least one feature type in the target signal feature information belongs to the target feature range information; the second comparison result can be used to indicate that any feature type in the target signal feature information does not belong to the target feature range information.

[0093] In one specific embodiment, if the comparison result is the second comparison result, it can be determined that the current operating state of the target device is an abnormal operating state.

[0094] In one specific embodiment, the above method may further include:

[0095] If the comparison results indicate that the target signal feature information belongs to the target feature range information, the current operating state is determined to be the normal operating state.

[0096] In a specific embodiment, if the comparison result is the first comparison result, it can be determined that the current operating state of the target device is the normal operating state.

[0097] In the above embodiments, the target device signal during its current operation, the current usage time of the target device, and the device status feature data of the target device, including feature range information corresponding to multiple preset usage times, are obtained. Signal feature analysis is performed on the target device signal to obtain target signal feature information, enabling feature extraction of the target device signal. Then, from the feature range information corresponding to the multiple preset usage times, the target feature range information corresponding to the current usage time is determined, enabling the determination of the target device's current target feature range information. Finally, combining the target feature range information and the target signal feature information, device status analysis is performed on the target device to obtain its current operating status. This allows for real-time health monitoring of the target device without changing the original system architecture, reducing detection difficulty and costs. Furthermore, it enables early detection of device anomalies, facilitating appropriate emergency response measures, reducing failure rates, improving device stability, and enhancing user experience.

[0098] Figure 2 This is a block diagram illustrating a device status detection apparatus according to an exemplary embodiment. Figure 2 As shown, the device may include:

[0099] Information acquisition module 110 can be used to acquire the target device signal during the current operation of the target device, the current usage time of the target device, and the device status feature data of the target device. The device status feature data includes feature range information corresponding to multiple preset usage times.

[0100] The signal feature analysis module 120 can be used to perform signal feature analysis on the target device signal to obtain target signal feature information;

[0101] The target feature range information determination module 130 can be used to determine the target feature range information corresponding to the current usage time from the device status feature data;

[0102] The equipment status analysis module 140 can be used to perform equipment status analysis on the target equipment based on the target feature range information and the target signal feature information, and obtain the current operating status of the target equipment.

[0103] In one specific embodiment, the device status analysis module 140 described above may include:

[0104] The comparison processing module can be used to compare target feature range information and target signal feature information to obtain comparison results;

[0105] The first operating status determination module can be used to determine the current operating status as an abnormal operating status when the comparison result indicates that the target signal feature information does not belong to the target feature range information.

[0106] In one specific embodiment, the above-described apparatus may further include:

[0107] The second operating status determination module can be used to determine the current operating status as normal operating status when the comparison result indicates that the target signal feature information belongs to the target feature range information.

[0108] In one specific embodiment, the above-described apparatus may further include:

[0109] The preset device signal acquisition module can be used to acquire multiple preset device signals corresponding to any preset usage duration;

[0110] The device signal feature information acquisition module can be used to perform signal feature analysis on multiple preset device signals to obtain multiple device signal feature information;

[0111] The feature range analysis module can be used to perform feature range analysis based on the signal feature information of multiple devices to obtain the feature range information corresponding to any preset usage time.

[0112] In one specific embodiment, the aforementioned preset device signal acquisition module may include:

[0113] The execution module can be used to control multiple initial devices to run for a first preset duration;

[0114] The signal acquisition module can be used to acquire equipment signals from multiple initial devices during their operation, thereby obtaining multiple device operation signals.

[0115] The signal filtering module can be used to filter out the preset device signals corresponding to each preset usage time from the operating signals of each device; wherein, the device type of multiple initial devices is the same as the device type of the target device.

[0116] In one specific embodiment, the above-mentioned feature range analysis module may include:

[0117] The information filtering module can be used to filter out first feature information and second feature information from multiple device signal feature information. The first feature information is the largest feature information among multiple device signal feature information, and the second feature information is the smallest feature information among multiple device signal feature information.

[0118] The feature range information determination module can be used to determine feature range information based on the first feature information and the second feature information.

[0119] In one specific embodiment, the target feature range information determination module 130 described above may include:

[0120] The search module can be used to find the current usage time in the device status feature data;

[0121] The target feature range information acquisition module can be used to obtain the feature range information corresponding to the current usage duration as the target feature range information when the current usage duration is found.

[0122] Regarding the apparatus in the above embodiments, the specific manner in which each module and unit performs its operations has been described in detail in the embodiments related to the method, and will not be elaborated upon here.

[0123] Figure 3 This is a block diagram illustrating an electronic device for detecting the current operating state of a target device according to an exemplary embodiment. The electronic device may be a server, and its internal structure diagram may be as follows: Figure 3 As shown, the electronic device includes a processor, memory, and a network interface connected via a system bus. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The network interface is used to communicate with external terminals via a network connection. When the computer program is executed by the processor, it implements a device status detection method.

[0124] Figure 4 This is a block diagram illustrating another electronic device for detecting the current operating state of a target device according to an exemplary embodiment. The electronic device may be a terminal, and its internal structure diagram may be as follows: Figure 4 As shown, the electronic device includes a processor, memory, network interface, display screen, and input devices connected via a system bus. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage medium. The network interface is used to communicate with external terminals via a network connection. When the computer program is executed by the processor, it implements a device status detection method. The display screen can be a liquid crystal display (LCD) or an e-ink display. The input devices can be a touch layer covering the display screen, buttons, a trackball, or a touchpad mounted on the device's casing, or an external keyboard, touchpad, or mouse.

[0125] Those skilled in the art will understand that Figure 3 or Figure 4 The structure shown is merely a block diagram of a portion of the structure related to the present disclosure and does not constitute a limitation on the electronic device to which the present disclosure is applied. A specific electronic device may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0126] In an exemplary embodiment, an electronic device is also provided, including: a processor; and a memory for storing processor-executable instructions; wherein the processor is configured to execute the instructions to implement the device state detection method as described in the embodiments of this disclosure.

[0127] In an exemplary embodiment, a computer-readable storage medium is also provided, wherein when the instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to perform the device state detection method of the present disclosure embodiments.

[0128] In an exemplary embodiment, a computer program product including instructions is also provided, which, when run on a computer, causes the computer to execute the device state detection method of the present disclosure embodiments.

[0129] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. This computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM), etc.

[0130] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the following claims.

[0131] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A device state detection method characterized by, The method comprises: obtaining a target device signal of a target device in a current running process, a current use duration corresponding to the target device, and device state feature data corresponding to the target device, the device state feature data comprising feature range information corresponding to each of a plurality of preset use durations; performing signal feature analysis on the target device signal to obtain target signal feature information; determining target feature range information corresponding to the current use duration from the feature range information corresponding to each of the plurality of preset use durations; performing device state analysis on the target device based on the target feature range information and the target signal feature information to obtain a current running state corresponding to the target device; the device state feature data corresponding to the target device is obtained in the following manner: obtaining a plurality of preset device signals corresponding to any of the preset use durations; performing signal feature analysis on the plurality of preset device signals to obtain a plurality of device signal feature information; based on the plurality of device signal feature information, performing feature range analysis to obtain feature range information corresponding to any of the preset use durations, comprising: from the plurality of device signal feature information, screening out first feature information and second feature information, the first feature information being the largest feature information in the plurality of device signal feature information, and the second feature information being the smallest feature information in the plurality of device signal feature information; based on the first feature information and the second feature information, determining the feature range information.

2. The method of claim 1, wherein, The device state analysis on the target device based on the target feature range information and the target signal feature information to obtain a current running state corresponding to the target device comprises: performing comparison processing on the target feature range information and the target signal feature information to obtain a comparison result; in a case where the comparison result indicates that the target signal feature information does not belong to the target feature range information, determining that the current running state is an abnormal running state.

3. The method of claim 2, wherein, The method further comprises: in a case where the comparison result indicates that the target signal feature information belongs to the target feature range information, determining that the current running state is a normal running state.

4. The method of claim 1, wherein, The obtaining of the plurality of preset device signals corresponding to any of the preset use durations comprises: controlling a plurality of initial devices to run for a first preset duration; during the running of the plurality of initial devices, performing device signal collection on the plurality of initial devices respectively to obtain a plurality of device running signals; from each device running signal, screening out preset device signals corresponding to each preset use duration; wherein the device types of the plurality of initial devices are the same as the device type of the target device.

5. The method of claim 1, wherein, The determination of the target feature range information corresponding to the current use duration from the feature range information corresponding to each of the plurality of preset use durations comprises: finding the current use duration in the feature range information corresponding to each of the plurality of preset use durations; in a case where the current use duration is found, taking the feature range information corresponding to the current use duration as the target feature range information.

6. An apparatus state detection device characterized by comprising: The device comprises: The information acquisition module is configured to acquire a target device signal of a target device in a current running process, a current use duration corresponding to the target device, and device state feature data corresponding to the target device, wherein the device state feature data comprises feature range information corresponding to each of a plurality of preset use durations; The signal feature analysis module is configured to perform signal feature analysis on the target device signal to obtain target signal feature information; The target feature range information determination module is configured to determine target feature range information corresponding to the current use duration from the feature range information corresponding to each of the plurality of preset use durations; The device state analysis module is configured to perform device state analysis on the target device based on the target feature range information and the target signal feature information to obtain a current running state corresponding to the target device; The device further comprises: The preset device signal acquisition module is configured to acquire a plurality of preset device signals corresponding to any of the preset use durations; The device signal feature information acquisition module is configured to perform signal feature analysis on the plurality of preset device signals to obtain a plurality of device signal feature information; The feature range analysis module is configured to perform feature range analysis based on the plurality of device signal feature information to obtain feature range information corresponding to any of the preset use durations; The feature range analysis module comprises: The information screening module is configured to screen first feature information and second feature information from the plurality of device signal feature information, wherein the first feature information is the largest feature information in the plurality of device signal feature information, and the second feature information is the smallest feature information in the plurality of device signal feature information; The feature range information determination module is configured to determine the feature range information based on the first feature information and the second feature information.

7. An electronic device, comprising: comprises: a processor; a memory for storing processor-executable instructions; wherein the processor is configured to execute the executable instructions to implement the device state detection method of any one of claims 1 to 5.

8. A non-transitory computer readable storage medium having stored thereon computer program instructions, wherein, The computer program instructions, when executed by the processor, implement the device state detection method of any one of claims 1 to 5.

Citation Information

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