Thyristor Device Tester

Abstract

The present application aims to propose a thyristor equipment tester. The thyristor equipment tester includes a single-stage test device and a multi-stage test coordination device, wherein: the single-stage test device is used to perform functional tests on a single thyristor stage; the single-stage test device is connected to the multi-stage test coordination device through an interface part, and is used to perform functional tests on multiple thyristor stages at the same time. On the basis of retaining the single thyristor stage test function, the valve assembly level (multiple thyristor stage) test function is added, which can not only meet the needs of single thyristor stage testing and fault analysis, and retain the advantages of light weight and easy carrying, but also meet the needs of simultaneous testing of multiple thyristor stages, improve the efficiency of functional testing during routine annual inspections, shorten the test and maintenance time, and improve DC availability.

Description

Technical Field

[0001] The present application relates to the field of power electronics technology, and in particular to a thyristor device tester. Background Art

[0002] A conventional HVDC converter valve is composed of multiple thyristor stages connected in series. Each thyristor stage mainly includes components such as thyristor, static grading resistor, damping resistor, damping capacitor, thyristor trigger unit (TCU), etc.

[0003] Thyristor is the core device. It can withstand several thousand volts in the off state and can be turned on after receiving the trigger signal at the gate level. Static voltage equalization resistors are used to equalize the voltage between thyristor levels under DC voltage. The main function of damping resistors and damping capacitors is to suppress the reverse voltage overshoot generated on the loop inductance due to the sudden change of current during the thyristor turn-off process. TCU is responsible for the control and protection of the thyristor level. Under normal working conditions, TCU sends a feedback signal IP to the valve control unit (VBE) after taking energy in each power frequency cycle, and triggers the thyristor to turn on after receiving the ignition signal FP sent by VBE. In addition to the normal triggering function, TCU also has forward overvoltage protection and reverse recovery period protection functions. When the thyristor is in the off state or reverse recovery period, TCU detects that the voltage across the thyristor level exceeds the corresponding protection setting value, it will generate a protection trigger pulse, forcibly triggering the thyristor to turn on and protect it from overvoltage damage.

[0004] In order to ensure the stable and reliable operation of the thyristor level and timely discover and eliminate faulty components, thyristor level functional tests need to be carried out at the project site. The test contents include the impedance, withstand voltage, normal triggering and protection triggering of the TCU, etc. The test occasions generally include subsystem tests after the installation of the converter valve, routine annual inspections after formal power transmission, and various abnormal fault repairs. In addition to fault repairs, subsystem tests and routine annual inspections require large-scale testing of the thyristor level in the converter valve. Subsystem tests require functional tests of all items, and routine annual inspections generally only perform impedance and normal low-voltage trigger tests.

[0005] Compared with subsystem testing, routine annual inspections are carried out after a power outage has occurred since power is officially supplied, which requires temporary transfer of high power to other lines. In addition, there is no economic benefit from power transmission at the DC sending end during the annual inspection. Therefore, it is necessary to minimize the power outage time and resume power supply as soon as possible.

[0006] Currently, when performing functional tests, only one thyristor stage can be tested at a time. After the test is completed, the test wiring needs to be moved to the next thyristor stage before the test can continue. Under the condition that the test goes smoothly, it takes about 3 days to complete the test of all thyristor stages of a valve hall during the routine annual inspection, which often becomes the key constraint that prevents the power outage time from being reduced during the annual inspection.

[0007] Therefore, it is necessary to design a solution that, on the basis of retaining the single thyristor level test function, adds the valve assembly level (multiple thyristor level) test function, which can not only meet the needs of single thyristor level testing and fault analysis and retain the advantages of light weight and easy carrying, but also meet the needs of simultaneous testing of multiple thyristor levels, improve the functional test efficiency during routine annual inspections, shorten the test and maintenance time, and improve DC availability.

[0008] The above information disclosed in the Background section is only for enhancement of understanding of the background of the present application and therefore it may contain information that does not constitute the prior art that is already known to a person of ordinary skill in the art. Summary of the invention

[0009] The present application aims to provide a thyristor device tester that is compatible with single thyristor level and multiple thyristor level functional tests.

[0010] According to one aspect of the present application, a thyristor device tester is provided, comprising a single-stage test device and a multi-stage test coordination device, wherein:

[0011] The single-stage test device is used to perform functional testing on a single thyristor stage;

[0012] The single-stage test device is connected to the multi-stage test coordination device via an interface portion, and is used to perform functional tests on a plurality of thyristor stages simultaneously.

[0013] According to some embodiments, the interface portion includes a power transmission channel, a signal transmission channel and a mechanical locking mechanism, which are used for power transmission, signal interaction and mechanical locking between the single-stage test device and the multi-stage test matching device.

[0014] According to some embodiments, the single-stage test device includes a human-computer interaction module, a core control circuit, a single-stage impedance test circuit, a single-stage trigger test circuit, a first output control circuit and a first interface part.

[0015] According to some embodiments, the multi-stage test coordination device includes an auxiliary control circuit, a multi-stage impedance test circuit, a multi-stage trigger test circuit, a second output control circuit and a second interface part.

[0016] According to some embodiments, the human-computer interaction module displays a single-stage test interface when only the single-stage test device is present; after the single-stage test device and the multi-stage test coordination device are assembled, the multi-stage test interface can be automatically identified or manually selected.

[0017] According to some embodiments, the first output control circuit and the second output control circuit each include a plurality of switching switches for switching the test circuit;

[0018] The second output control circuit also includes a plurality of selection switches for controlling the number of the single-stage trigger test circuits connected in series.

[0019] According to some embodiments, the single-stage impedance test circuit outputs an excitation voltage including direct current or alternating current, and the multi-stage impedance test circuit outputs an excitation voltage including direct current or alternating current.

[0020] According to some embodiments, the single-stage trigger test circuit includes a transformer and a current-limiting resistor, and the output excitation voltage is AC.

[0021] According to some embodiments, the multi-stage trigger test circuit includes at least two of the single-stage trigger test circuits connected in series.

[0022] According to some embodiments, a wiring is led out between two adjacent single-stage trigger test circuits in the multi-stage trigger test circuit to electrically connect the selection switch of the second output control circuit.

[0023] According to some embodiments, the tester can set the number of levels to be tested, control the selection switch of the second output control circuit according to the number of levels to be tested, and control the number of single-stage trigger test circuits in the multi-stage trigger test circuit to be put into use to be equal to the number of levels to be tested.

[0024] According to some embodiments, by controlling the opening and closing of a switch, the switching switch of the second output control circuit switches the multi-stage impedance test circuit to operate or the multi-stage trigger test circuit to operate.

[0025] According to some embodiments, the tester comprises a first test mode and a second test mode, wherein:

[0026] In the first test mode, the tester and the converter valve under test are connected via an optical path and an electrical circuit, or only via an electrical circuit;

[0027] In the second test mode, the tester and the tested converter valve are connected only through an electrical circuit.

[0028] According to some embodiments, the tester is used to perform a single-stage test on a single thyristor stage in the first test mode or the second test mode; and

[0029] The tester is used for performing a multi-stage test on a plurality of thyristor stages only in the second test mode.

[0030] According to some embodiments, in the second test mode, the positive and negative output terminals of the tester are led from the multi-stage test matching device or the positive output terminal is led from the multi-stage test matching device and the negative output terminal is led from the single-stage test device.

[0031] It should be understood that the foregoing general description and the following detailed description are exemplary only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] By describing in detail exemplary embodiments thereof with reference to the accompanying drawings, the above and other objects, features and advantages of the present application will become more apparent. The accompanying drawings described below are only some embodiments of the present application, and are not intended to limit the present application.

[0033] Figure 1 A system architecture diagram showing a thyristor device tester according to an exemplary embodiment of the present application;

[0034] Figure 2 A single-stage trigger test circuit of a thyristor device tester according to an exemplary embodiment of the present application is shown;

[0035] Figure 3 A circuit diagram showing a multi-stage test coordination device of a thyristor device tester according to an exemplary embodiment of the present application;

[0036] Figure 4 A test connection diagram showing a single thyristor level test mode of an exemplary embodiment of the present application;

[0037] Figure 5 Another embodiment of the test connection diagram of the exemplary single thyristor level test mode of the present application is shown;

[0038] Figure 6 A test connection diagram showing a polythyristor level test mode according to an exemplary embodiment of the present application. DETAILED DESCRIPTION

[0039] Example embodiments will now be described more fully with reference to the accompanying drawings. However, example embodiments can be implemented in many forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this application will be comprehensive and complete and will fully convey the concepts of the example embodiments to those skilled in the art. The same reference numerals in the figures represent the same or similar parts, and thus their repeated description will be omitted.

[0040] The described features, structures or characteristics may be combined in one or more embodiments in any suitable manner. In the following description, many specific details are provided to provide a full understanding of the embodiments of the present disclosure. However, those skilled in the art will appreciate that the technical solutions of the present disclosure may be practiced without one or more of these specific details, or other modes, components, materials, devices or the like may be adopted. In these cases, known structures, methods, devices, implementations, materials or operations will not be shown or described in detail.

[0041] The flowcharts shown in the accompanying drawings are only exemplary and do not necessarily include all the contents and operations / steps, nor must they be executed in the order described. For example, some operations / steps can be decomposed, and some operations / steps can be combined or partially combined, so the actual execution order may change according to actual conditions.

[0042] The terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices.

[0043] Those skilled in the art will appreciate that the drawings are merely schematic diagrams of example embodiments, and the modules or processes in the drawings are not necessarily necessary for implementing the present application, and therefore cannot be used to limit the scope of protection of the present application.

[0044] The following describes an apparatus embodiment of the present application, which can be used to execute the method embodiment of the present application. For details not disclosed in the apparatus embodiment of the present application, reference can be made to the method embodiment of the present application.

[0045] Figure 1 A system architecture diagram of a thyristor device tester according to an exemplary embodiment of the present application is shown.

[0046] like Figure 1 As shown, the thyristor device tester in this embodiment includes a single-stage test device and a multi-stage test coordination device.

[0047] See also Figure 1 The single-stage test device includes a human-computer interaction module 101, a core control circuit 109, a single-stage impedance test circuit 105, a single-stage trigger test circuit 103, an output control circuit 107 and an interface part 1, and the multi-stage test coordination device includes an auxiliary control circuit 209, a multi-stage impedance test circuit 203, a multi-stage trigger test circuit 205, an output control circuit 207 and an interface part 2.

[0048] like Figure 1As shown, the human-computer interaction module 101 is connected to the core control circuit 109, the core control circuit 109 is connected to the single-stage trigger test circuit 103 and the single-stage impedance test circuit 105, the core control circuit 109 is connected to the interface part 1, and the core control circuit 109 is connected to the output control circuit 107. The single-stage trigger test circuit 103 is connected to the output control circuit 107, and the single-stage impedance test circuit 105 is connected to the output control circuit 107. The output control circuit 107 is connected to the interface part 1.

[0049] like Figure 1 As shown, the interface part 1 is connected to the interface part 2. The interface part 2 is connected to the auxiliary control circuit 209. The auxiliary control circuit 209 is connected to the multi-stage impedance test circuit 203 and the multi-stage trigger test circuit 205, and the auxiliary control circuit 209 is connected to the output control circuit 207. The multi-stage impedance test circuit 203 is connected to the output control circuit 207, and the multi-stage trigger test circuit 205 is connected to the output control circuit 207. The output control circuit 207 is connected to the interface part 2.

[0050] According to the exemplary embodiment, the interface part 1 and the interface part 2 are in the form of male and female heads that match each other in structure, and each includes a respective power transmission channel, a signal transmission channel and a mechanical locking mechanism. The thyristor device tester in this embodiment is assembled from a single-stage test device and a multi-stage test matching device, and the assembly work is achieved by connecting the interface part 1 of the single-stage test device and the interface part 2 of the multi-stage test matching device.

[0051] According to the example embodiment, the human-computer interaction module 101 is displayed as a single-stage test interface when there is only a single-stage test device; after the single-stage test device and the multi-stage test matching device are assembled, it can be automatically identified as a multi-stage test interface, and the number of thyristor stages in series of the valve under test can be input on the interface.

[0052] According to an example embodiment, the output control circuit 107 and the output control circuit 207 each include a plurality of switching switches, and the output control circuit 207 further includes a plurality of selection switches.

[0053] Figure 2 A single-stage trigger test circuit of a thyristor device tester according to an exemplary embodiment of the present application is shown.

[0054] like Figure 2 As shown, the output excitation voltage of the single-stage impedance test circuit includes DC and AC, and the output voltage amplitude is a settable voltage amplitude, for example, the output voltage amplitude is 30 V. The single-stage trigger test circuit includes a 220V / 380V power frequency transformer and a current limiting resistor.

[0055] Figure 3 A circuit diagram of a multi-stage test coordination device of a thyristor device tester according to an exemplary embodiment of the present application is shown.

[0056] like Figure 3 As shown, the multi-stage trigger test circuit includes at least two single-stage trigger test circuits connected in series.

[0057] According to an exemplary embodiment, four single-stage trigger test circuits connected in series are taken as an example. Figure 3 The multi-stage trigger test circuit includes four single-stage trigger test circuits connected in series. The output control circuit 2 includes four selection switches. Three terminals are drawn between two adjacent single-stage trigger test circuits of the multi-stage trigger test circuit, which are respectively used to connect to one end of the selection switches K3, K4, and K5. The other ends of K3, K4, and K5 are connected to form a common end, and the selection switch K6 is connected between the common end and the single-stage trigger test circuit on the edge.

[0058] like Figure 3 As shown, the multi-stage impedance test circuit is connected in parallel with the output control circuit 2, and the converter valve under test is connected in parallel with the output control circuit 2. Switching switches K1 and K2 are turned on and off to put the multi-stage trigger test circuit or the multi-stage impedance test circuit into operation to detect whether the thyristor stage of the converter valve under test works normally.

[0059] According to an exemplary embodiment, the output excitation voltage of the multi-stage impedance test circuit includes direct current and alternating current, and the output voltage amplitude is a settable voltage amplitude, for example, the output voltage amplitude is 120V.

[0060] Figure 4 A test connection diagram showing a single thyristor level test mode according to an exemplary embodiment of the present application.

[0061] like Figure 4 As shown, the tester and the tested converter valve are connected via an optical path and an electrical circuit.

[0062] According to the example embodiment, the tester is responsible for applying the voltage excitation required for the test to the tested converter valve through the circuit connection; receiving the feedback signal of the tested converter valve through the optical path connection, and outputting a trigger signal to the converter valve through the optical path connection to control its conduction.

[0063] According to some embodiments, when a single thyristor stage is functionally tested, the single-stage test device is carried onto a lifting platform and the single-stage test device is placed on the lifting platform. Figure 4 Connect the tester to the converter valve to be tested and start the test.

[0064] Figure 5 Another embodiment of a test connection diagram of an exemplary single thyristor level test mode of the present application is shown.

[0065] See also Figure 5The tester and the converter valve under test are only connected by circuit, and the tester applies the voltage excitation required for the test to the converter valve under test through the circuit connection.

[0066] According to an exemplary embodiment, an optical path is connected between the converter valve under test and the valve control device VBE. After receiving a feedback signal from the converter valve, the valve control device VBE outputs a trigger signal to the converter valve to control its conduction.

[0067] According to some embodiments, when a single thyristor stage is functionally tested, the single-stage test device is carried onto a lifting platform and the single-stage test device is placed on the lifting platform. Figure 5 Connect the tester to the converter valve to be tested and start the test.

[0068] According to some embodiments, when performing a single-stage test, two test modes may be selected: Test Mode 1, such as Figure 4 As shown and test mode 2, Figure 5 shown.

[0069] Figure 6 A test connection diagram showing a polythyristor level test mode according to an exemplary embodiment of the present application.

[0070] like Figure 6 As shown, the tester and the tested converter valve are only connected by circuit, and the tester applies the voltage excitation required for the test to the tested converter valve through the circuit connection; there is an optical path connection between the tested converter valve and the valve control device VBE, and after the valve control device VBE receives the feedback signal from the converter valve, it outputs a trigger signal to the converter valve to control its conduction.

[0071] According to the example embodiment, when it is necessary to perform functional tests on multiple thyristor stages connected in series at the same time, the single-stage test device and the multi-stage test matching device are respectively carried to the lifting platform, the single-stage test device is placed on the multi-stage test matching device, and the male and female heads are aligned and plugged in using the gravity of the single-stage test device. The plugging can also be done manually, so that the power channel and signal link between the interface parts 1 and 2 of the two devices are connected, and the two devices are locked by the locking structure. After assembly, power transmission and signal interaction between the two devices can be realized, and a whole can be formed, so as to achieve the purpose of stable structure and beautiful appearance.

[0072] According to the example embodiment, taking the test of 4 thyristor stages as an example, the tester and the tested converter valve are connected, and the number of test levels is set to 4 on the human-computer interaction module of the single-stage test device. At this time, the tester selects test mode 2 by default, and the core control circuit of the single-stage test device transmits the control instructions to the auxiliary control circuit of the multi-stage test coordination device through interface part 1 and interface part 2.

[0073] According to the exemplary embodiment, the auxiliary control circuit controls the selection switches K3 - K5 of the output control circuit 2 to be all opened and K6 to be closed, so that the number of the single-stage trigger test circuits in series in the multi-stage trigger test circuit is 4.

[0074] According to an exemplary embodiment, when a multi-level impedance test is selected, K1 is closed and K2 is opened; when a multi-level trigger test is selected, K1 is opened and K2 is closed.

[0075] According to an example embodiment, the final test stimulus of the tester is led out through a multi-stage test mating chassis.

[0076] According to an example embodiment, if a thyristor level fault is found through a multi-level test, a single-level test is performed on the group of thyristors and re-tested.

[0077] According to an example embodiment, functional tests are performed on multiple thyristor stages simultaneously, and test mode 2 is selected. The positive output terminal and the negative output terminal of the tester are both led out from the multi-stage test matching device, or the positive output terminal is led out from the multi-stage test matching device and the negative output terminal is led out from the single-stage test device.

[0078] It should be clearly understood that the present application describes how to form and use specific examples, but the present application is not limited to any details of these examples. On the contrary, based on the teaching of the content disclosed in the present application, these principles can be applied to many other embodiments.

[0079] In addition, it should be noted that the above figures are only schematic illustrations of the processes included in the method according to the exemplary embodiments of the present application, and are not intended to be limiting. It is easy to understand that the processes shown in the above figures do not indicate or limit the time sequence of these processes. In addition, it is also easy to understand that these processes can be performed synchronously or asynchronously, for example, in multiple modules.

[0080] The exemplary embodiments of the present application are specifically shown and described above. It should be understood that the present application is not limited to the detailed structures, configurations or implementations described herein; on the contrary, the present application is intended to cover various modifications and equivalent configurations included in the spirit and scope of the appended claims.

Claims

1. A thyristor device tester, characterized in that: It includes single-stage test device and multi-stage test matching device, wherein: The single-stage test device is used to perform functional testing on a single thyristor stage; The single-stage test device is connected to the multi-stage test coordination device via an interface portion, and is used to perform functional tests on a plurality of thyristor stages simultaneously; The tester includes a first test mode and a second test mode, wherein: In the first test mode, the tester and the converter valve under test are connected via an optical path and an electrical circuit, or only via an electrical circuit; In the second test mode, the tester and the tested converter valve are connected only through an electrical circuit; The tester is used to perform a single-stage test on a single thyristor stage in the first test mode or the second test mode; and to perform a multi-stage test on a plurality of thyristor stages in the second test mode; In the second test mode, the positive and negative output terminals of the tester are led out from the multi-stage test matching device or the positive output terminal is led out from the multi-stage test matching device and the negative output terminal is led out from the single-stage test device.

2. The tester according to claim 1, characterized in that: The interface part includes a power transmission channel, a signal transmission channel and a mechanical locking mechanism, which are used for power transmission, signal interaction and mechanical locking between the single-stage test device and the multi-stage test matching device.

3. The tester according to claim 1, characterized in that: The single-stage test device comprises a human-computer interaction module, a core control circuit, a single-stage impedance test circuit, a single-stage trigger test circuit, a first output control circuit and a first interface part.

4. The tester according to claim 3, characterized in that: The multi-stage test coordination device comprises an auxiliary control circuit, a multi-stage impedance test circuit, a multi-stage trigger test circuit, a second output control circuit and a second interface part.

5. The tester according to claim 3, characterized in that: The human-computer interaction module displays a single-stage test interface when only the single-stage test device is provided; after the single-stage test device and the multi-stage test coordination device are assembled, the multi-stage test interface can be automatically identified or manually selected.

6. The tester according to claim 4, characterized in that: The first output control circuit and the second output control circuit each include a plurality of switching switches for switching the test circuit; The second output control circuit also includes a plurality of selection switches for controlling the number of the single-stage trigger test circuits connected in series.

7. The tester according to claim 4, characterized in that: The single-stage impedance test circuit outputs an excitation voltage including direct current or alternating current, and the multi-stage impedance test circuit outputs an excitation voltage including direct current or alternating current.

8. The tester according to claim 3, characterized in that: The single-stage trigger test circuit comprises a transformer and a current-limiting resistor, and the output excitation voltage is an alternating current.

9. The tester according to claim 4, characterized in that: The multi-stage trigger test circuit includes at least two single-stage trigger test circuits connected in series.

10. The tester according to claim 6, characterized in that: A wiring is led out between two adjacent single-stage trigger test circuits in the multi-stage trigger test circuit to electrically connect the selection switch of the second output control circuit.

11. The tester according to claim 10, characterized in that: The tester can set the number of stages to be tested, control the selection switch of the second output control circuit according to the number of stages to be tested, and control the number of single-stage trigger test circuits in the multi-stage trigger test circuit to be put into use to be equal to the number of stages to be tested.

12. The tester according to claim 6, characterized in that: By controlling the opening and closing of the switch, the switching switch of the second output control circuit switches the operation of the multi-stage impedance test circuit or the operation of the multi-stage trigger test circuit.

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