Condition evaluation method, device and computer equipment for thyristor voltage monitoring board

Abstract

The present application relates to a method, device, computer equipment, storage medium, and computer program product for evaluating the status of a thyristor voltage monitoring board, and relates to the field of electrical technology. The method comprises: obtaining module information of each circuit module in the thyristor voltage monitoring board to be evaluated; determining the test position of the status information test point corresponding to each circuit module based on the module information, and obtaining the test results of the thyristor voltage monitoring board to be evaluated at each test position; determining a status evaluation benchmark for the thyristor voltage monitoring board to be evaluated, evaluating the test results based on the status evaluation benchmark, and obtaining a module status evaluation value for each circuit module in the thyristor voltage monitoring board to be evaluated; and determining a status evaluation result of the thyristor voltage monitoring board to be evaluated based on the module status evaluation value. This method can obtain accurate status evaluation results of the thyristor voltage monitoring board.

Description

Technical Field

[0001] The present application relates to the field of electrical technology, and in particular to a method, device, computer equipment, storage medium, and computer program product for evaluating the status of a thyristor voltage monitoring board. Background Art

[0002] The thyristor voltage monitoring board (TVM) is part of the valve control system, used to detect internal voltage at the valve stage and generate a feedback optical signal. Therefore, the health of the TVM board directly affects the overall reliability of the converter valve.

[0003] The current TVM board status evaluation method determines the status of the TVM board by testing the resistance value of the TVM board's voltage-equalizing resistor and the output pulse width or voltage. This method mainly understands the overall function of the TVM board and cannot accurately and specifically evaluate the status of the TVM board. Summary of the Invention

[0004] Based on this, it is necessary to provide a thyristor voltage monitoring board status evaluation method, device, computer equipment, computer-readable storage medium and computer program product to address the above-mentioned technical problem of being unable to accurately obtain the thyristor voltage detection board status evaluation.

[0005] In a first aspect, the present application provides a method for evaluating the status of a thyristor voltage monitoring board. The method comprises:

[0006] Obtaining module information of each circuit module in the thyristor voltage monitoring board to be evaluated;

[0007] Determine the test position of the status information test point corresponding to each circuit module according to the module information, and obtain the test results of the thyristor voltage monitoring board to be evaluated at each test position;

[0008] Determining a status evaluation benchmark for the thyristor voltage monitoring board to be evaluated, evaluating the test results according to the status evaluation benchmark, and obtaining a module status evaluation value for each circuit module in the thyristor voltage monitoring board to be evaluated;

[0009] A status evaluation result of the thyristor voltage monitoring board to be evaluated is determined according to the module status evaluation value.

[0010] In one embodiment, each circuit module has at least one test position; evaluating the test results according to the status evaluation benchmark to obtain a module status evaluation value of each circuit module in the thyristor voltage monitoring board to be evaluated includes:

[0011] For each circuit module, obtaining test results of each test position corresponding to the circuit module;

[0012] Evaluate the test results of each test position according to the state evaluation benchmark to obtain a test point state evaluation value of each test position;

[0013] A module state evaluation value of the circuit module is determined based on the test point state evaluation values ​​of the respective test positions.

[0014] In one embodiment, the test results include voltage amplitude and pulse amplitude, and evaluating the test results of each test position according to the state evaluation benchmark to obtain the test point state evaluation value of each test position includes:

[0015] For each test position, respectively obtaining the change rate of the voltage amplitude and the pulse amplitude in the test result of the test position relative to the state evaluation benchmark;

[0016] A test point state evaluation value of the test position is determined according to the change rate corresponding to the voltage amplitude and the change rate corresponding to the pulse amplitude.

[0017] In one embodiment, the module information includes connection information between circuit elements in the circuit module and component information of each circuit element, and determining the test position of the status information test point corresponding to each circuit module based on the module information includes:

[0018] For each circuit module, according to the component information of each circuit component in the circuit module, determining a target component that meets a preset condition from the circuit components;

[0019] A test position of a status information test point corresponding to each circuit module is determined according to the connection information and the target component.

[0020] In one embodiment, determining the status evaluation benchmark of the thyristor voltage monitoring board to be evaluated includes:

[0021] Determining the monitoring board type of the thyristor voltage monitoring board to be evaluated according to the module information;

[0022] According to the type of the monitoring board, a state evaluation benchmark of the thyristor voltage monitoring board to be evaluated is determined from a plurality of state evaluation benchmarks; the plurality of state evaluation benchmarks are state evaluation benchmarks corresponding to various types of thyristor voltage monitoring boards.

[0023] In one embodiment, obtaining module information of each circuit module in the thyristor voltage monitoring board to be evaluated includes:

[0024] Obtaining circuit information of the thyristor voltage monitoring board to be evaluated;

[0025] Identifying, based on the circuit information, a circuit module in the thyristor voltage monitoring board to be evaluated, and obtaining an identification result;

[0026] According to the identification result, module information of each circuit module is extracted from the circuit information.

[0027] In a second aspect, the present application also provides a device for evaluating the status of a thyristor voltage monitoring board. The device comprises:

[0028] An information acquisition module is used to obtain module information of each circuit module in the thyristor voltage monitoring board to be evaluated;

[0029] A testing module, configured to determine, based on the module information, a test position of a status information test point corresponding to each circuit module, and obtain test results of the thyristor voltage monitoring board to be evaluated at each test position;

[0030] a circuit module evaluation module, configured to determine a status evaluation benchmark for the thyristor voltage monitoring board to be evaluated, evaluate the test results according to the status evaluation benchmark, and obtain a module status evaluation value for each circuit module in the thyristor voltage monitoring board to be evaluated;

[0031] The status evaluation module is used to determine the status evaluation result of the thyristor voltage monitoring board to be evaluated according to the module status evaluation value.

[0032] In a third aspect, the present application further provides a computer device. The computer device includes a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the following steps are performed:

[0033] Obtaining module information of each circuit module in the thyristor voltage monitoring board to be evaluated;

[0034] Determine the test position of the status information test point corresponding to each circuit module according to the module information, and obtain the test results of the thyristor voltage monitoring board to be evaluated at each test position;

[0035] Determining a status evaluation benchmark for the thyristor voltage monitoring board to be evaluated, evaluating the test results according to the status evaluation benchmark, and obtaining a module status evaluation value for each circuit module in the thyristor voltage monitoring board to be evaluated;

[0036] A status evaluation result of the thyristor voltage monitoring board to be evaluated is determined according to the module status evaluation value.

[0037] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the following steps:

[0038] Obtaining module information of each circuit module in the thyristor voltage monitoring board to be evaluated;

[0039] Determine the test position of the status information test point corresponding to each circuit module according to the module information, and obtain the test results of the thyristor voltage monitoring board to be evaluated at each test position;

[0040] Determining a status evaluation benchmark for the thyristor voltage monitoring board to be evaluated, evaluating the test results according to the status evaluation benchmark, and obtaining a module status evaluation value for each circuit module in the thyristor voltage monitoring board to be evaluated;

[0041] A status evaluation result of the thyristor voltage monitoring board to be evaluated is determined according to the module status evaluation value.

[0042] In a fifth aspect, the present application further provides a computer program product. The computer program product includes a computer program that, when executed by a processor, implements the following steps:

[0043] Obtaining module information of each circuit module in the thyristor voltage monitoring board to be evaluated;

[0044] Determine the test position of the status information test point corresponding to each circuit module according to the module information, and obtain the test results of the thyristor voltage monitoring board to be evaluated at each test position;

[0045] Determining a status evaluation benchmark for the thyristor voltage monitoring board to be evaluated, evaluating the test results according to the status evaluation benchmark, and obtaining a module status evaluation value for each circuit module in the thyristor voltage monitoring board to be evaluated;

[0046] A status evaluation result of the thyristor voltage monitoring board to be evaluated is determined according to the module status evaluation value.

[0047] The aforementioned thyristor voltage monitoring board status evaluation method, apparatus, computer device, storage medium, and computer program product collect status information from test locations on the thyristor voltage monitoring board as test results, evaluate the status of the circuit modules in the thyristor voltage monitoring board based on the test results, and thereby provide a comprehensive and accurate evaluation of the thyristor voltage monitoring board based on the status of the circuit modules. This method achieves the goal of determining the status of each node and circuit module on the thyristor voltage monitoring board, thereby better determining the specific status of the thyristor voltage monitoring board. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] Figure 1 A diagram illustrating an application environment of a method for evaluating a state of a thyristor voltage monitoring board according to an embodiment;

[0049] Figure 2 1 is a flow chart of a method for evaluating the status of a thyristor voltage monitoring board according to an embodiment;

[0050] Figure 3 A flowchart of a step for determining a module status evaluation value in one embodiment is shown;

[0051] Figure 4 A schematic diagram of a complete flow chart of a method for evaluating the state of a thyristor voltage monitoring board in another embodiment;

[0052] Figure 5 is a principle block diagram of a thyristor voltage monitoring board in one embodiment;

[0053] Figure 6 FIG1 is a partial circuit connection diagram of a negative voltage detection circuit module in a thyristor voltage monitoring board to be evaluated in one embodiment;

[0054] Figure 7 A structural block diagram of a state evaluation device for a thyristor voltage monitoring board according to one embodiment;

[0055] Figure 8 FIG. 1 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0056] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0057] The state evaluation method of the thyristor voltage monitoring board provided in the embodiment of the present application can be applied to Figure 1 In the application environment shown, a control terminal 104 is connected to an AC power supply and a thyristor voltage monitoring board 102; the control terminal 104 includes a data storage device and a processor. The AC power supply inputs current to the thyristor voltage monitoring board 102 via a circuit connection. The control terminal 104 obtains module information of the circuit modules in the thyristor voltage monitoring board 102 and sets multiple test points. The AC power supply is then activated to input current to the thyristor voltage monitoring board 102. The control terminal 104 obtains the test results reported by the thyristor voltage monitoring board 102 from each test point and evaluates the status of the thyristor voltage monitoring board 102 based on the test results. The control terminal 102 can be, but is not limited to, various personal computers, laptops, smartphones, and tablet computers.

[0058] In one embodiment, Figure 2 As shown in the figure, a state evaluation method of a thyristor voltage monitoring board is provided. Figure 1 Taking the control terminal 104 in FIG. 1 as an example, the method includes the following steps:

[0059] Step 201: Obtain module information of each circuit module in the thyristor voltage monitoring board to be evaluated.

[0060] Among them, the circuit module includes a negative voltage monitoring circuit module, a forward voltage monitoring circuit module and a forward overvoltage monitoring circuit module, etc.

[0061] For example, after the control terminal 104 obtains the overall circuit information of the thyristor voltage monitoring board 102 to be evaluated (i.e., the connection relationship between circuit elements and the component information of the circuit elements), it identifies each circuit module from the circuit information, and then extracts the module information of the corresponding circuit module from the overall circuit information.

[0062] Step 202 : Determine the test position of the status information test point corresponding to each circuit module according to the module information, and obtain the test results of the thyristor voltage monitoring board to be evaluated at each test position.

[0063] The status information of the thyristor voltage monitoring board can be obtained from the test point, specifically the electrical information output by the component nodes of the thyristor voltage monitoring board.

[0064] Furthermore, when different voltage values ​​are input to the thyristor voltage monitoring board, the thyristor voltage monitoring board will output corresponding feedback information in different circuit modules.

[0065] For example, the control terminal 104 can analyze the module information of each circuit module according to user-preset requirements and determine the test location of the test point corresponding to each circuit module. The control terminal 104 then controls the AC power supply to transmit power to the thyristor voltage monitoring board 102 for testing. Each circuit module requires a different test current, so at least three power transmission tests are required. Finally, the control terminal 104 collects the output status information from each test point, i.e., the test results.

[0066] Step 203 : determining a status evaluation benchmark of the thyristor voltage monitoring board to be evaluated, evaluating the test results according to the status evaluation benchmark, and obtaining a module status evaluation value of each circuit module in the thyristor voltage monitoring board to be evaluated.

[0067] The condition evaluation benchmark is obtained by testing a new thyristor voltage monitoring board. Furthermore, multiple tests can be performed, with the average of the results used as the final condition evaluation benchmark. It should be noted that the new thyristor voltage monitoring board must be the same type as the one being evaluated.

[0068] Exemplarily, the control terminal 104 determines a state evaluation benchmark that meets the requirements from the database based on the thyristor voltage monitoring board to be evaluated, and then evaluates the test results obtained at each test position according to the state evaluation benchmark based on the evaluation conditions set by the user to obtain an evaluation result; based on the evaluation result of each test position, the module state evaluation value of the corresponding circuit module is determined. The module state can be divided into normal, degraded and faulty, and the corresponding state evaluation values ​​are 0, 1 and 2.

[0069] Step 204 : determining a status evaluation result of the thyristor voltage monitoring board to be evaluated according to the module status evaluation value.

[0070] For example, the control terminal 104 obtains the correspondence between the module status set by the user and the status of the thyristor voltage monitoring board, and determines the status evaluation result of the thyristor voltage monitoring board to be evaluated based on the module status evaluation value. For example, the status evaluation results of the thyristor voltage monitoring board can be divided into healthy, first-level sub-healthy, second-level sub-healthy, and faulty. The status evaluation value of the thyristor voltage monitoring board is determined based on the status evaluation values ​​of the three circuit modules in the thyristor voltage monitoring board, and the status evaluation result of the thyristor voltage monitoring board is further determined based on the status evaluation value.

[0071] In the aforementioned thyristor voltage monitoring board status evaluation method, status information is collected from test locations on the thyristor voltage monitoring board as test results. Based on the test results, the status of the circuit modules in the thyristor voltage monitoring board is evaluated. This allows for a comprehensive and accurate evaluation of the thyristor voltage monitoring board based on the status of the circuit modules. This method achieves the goal of determining the status of each node and circuit module on the thyristor voltage monitoring board, enabling a better assessment of the specific status of the thyristor voltage monitoring board.

[0072] In one embodiment, each circuit module has at least one test location, such as Figure 3 As shown, the above step 203 evaluates the test results according to the state evaluation benchmark to obtain the module state evaluation value of each circuit module in the thyristor voltage monitoring board to be evaluated, which can also be achieved by the following steps:

[0073] Step 301: For each circuit module, obtain the test results of each test position corresponding to the circuit module.

[0074] Step 302 : Evaluate the test results of each test position according to the state evaluation benchmark to obtain the test point state evaluation value of each test position.

[0075] Step 303: Determine the module status evaluation value of the circuit module based on the test point status evaluation value of each test position.

[0076] Exemplarily, the test location of each test point is within the location range of one of the circuit modules, thereby establishing a corresponding relationship. For a circuit module, the test results output by each test location are obtained as raw data for the circuit module status evaluation. The test results of each test location are evaluated according to a status evaluation benchmark to obtain a test point evaluation result, which is classified as healthy, degraded, and faulty. The test point status evaluation value (corresponding to 0, 1, and 2, respectively) is then determined for each test location based on the test point status evaluation result. The maximum status evaluation value among the test point status evaluation values ​​of each test location is then determined as the module status evaluation value of the corresponding circuit module. That is, if any test point status evaluation result of a test location in the circuit module is faulty, the status evaluation result of the circuit module is also faulty. If no test point status evaluation result of a test location in the circuit module is faulty, but a test point status evaluation result is degraded, the status evaluation result of the circuit module is degraded. The status evaluation result of the circuit module is healthy only when all test points in the circuit module have healthy status evaluation results.

[0077] In this embodiment, by obtaining the test results of the test positions set in the circuit module to evaluate the module status of the circuit module, an accurate circuit module status evaluation value can be obtained, and then the status evaluation value of the entire thyristor voltage monitoring board can be obtained subsequently, and a hierarchical evaluation result of the thyristor voltage monitoring board can be obtained, and node management of the thyristor voltage monitoring board can be realized.

[0078] In one embodiment, the test results include voltage amplitude and pulse amplitude. Step 302 evaluates the test results of each test position according to the state evaluation benchmark to obtain the test point state evaluation value of each test position. This can also be achieved by the following steps:

[0079] Step 1: for each test position, obtain the change rate of the voltage amplitude and pulse amplitude in the test results of the test position relative to the state evaluation benchmark;

[0080] Step 2: Determine the test point state evaluation value of the test position according to the change rate corresponding to the voltage amplitude and the change rate corresponding to the pulse amplitude.

[0081] Exemplarily, the test results output by each test point include voltage amplitude and pulse amplitude, and the corresponding state evaluation benchmarks include voltage amplitude benchmark and pulse amplitude benchmark. The rate of change of the voltage amplitude and pulse amplitude relative to the state evaluation benchmark is obtained, and the test point state evaluation value is determined based on the user-preset rate of change evaluation range. For example, when the rate of change of the voltage amplitude and pulse amplitude does not exceed 10%, the test point state is determined to be healthy, and the corresponding test point state evaluation value is 0; when the rate of change of the voltage amplitude or pulse amplitude is greater than 10% but less than 50%, the test point state is determined to be degraded, and the corresponding test point state evaluation value is 1; when the rate of change of the voltage amplitude or pulse amplitude is greater than 50%, the test point state is determined to be faulty, and the corresponding test point state evaluation value is 2.

[0082] In this embodiment, based on the status evaluation benchmark, the rate of change of the voltage amplitude and pulse amplitude in the test results is determined. At the same time, according to the rate of change evaluation range set by the user, the accurate test point status evaluation value of the test position is obtained, so as to subsequently determine the module status evaluation value of the circuit module, thereby realizing hierarchical evaluation and node management of the thyristor voltage monitoring board.

[0083] In one embodiment, the module information includes connection information between circuit elements in the circuit module and component information of each circuit element. The above step 202 determines the test position of the status information test point corresponding to each circuit module based on the module information, which can also be achieved by the following steps:

[0084] Step 1: for each circuit module, according to the component information of each circuit component in the circuit module, determine the target component that meets the preset conditions from each circuit component;

[0085] Step 2: Determine the test position of the status information test point corresponding to each circuit module according to the connection information and the target component.

[0086] For example, the user predefines target circuit elements in each circuit module that have a significant impact on the entire circuit module, or circuit elements that have a high degradation or failure frequency in historical data. Target elements that meet these requirements are identified in each circuit module. Then, based on the connection information between the circuit elements in the circuit module, the specific locations of the target elements are determined, thereby determining the test locations of the corresponding status information test points in the circuit module, so that the test results output by the test locations can reflect the status of the target elements.

[0087] In this embodiment, the test position of the state information test point in the circuit module is determined by the set target component, so that the state information of the target component can be obtained, and thus an accurate circuit module state evaluation result can be obtained.

[0088] In one embodiment, the above step 203 of determining the status evaluation benchmark of the thyristor voltage monitoring board to be evaluated can also be implemented by the following steps:

[0089] Step 1: Determine the monitoring board type of the thyristor voltage monitoring board to be evaluated based on the module information;

[0090] Step 2: Determine the status evaluation benchmark of the thyristor voltage monitoring board to be evaluated from a plurality of status evaluation benchmarks according to the type of monitoring board; the plurality of status evaluation benchmarks are status evaluation benchmarks corresponding to various types of thyristor voltage monitoring boards.

[0091] For example, although the circuit module divisions of different types of thyristor voltage monitoring boards are the same, the specific module information may differ (i.e., the connection relationships between circuit components or component information may differ). Therefore, for the same input current, the output of different types of thyristor voltage monitoring boards may differ. Therefore, users need to conduct power transmission tests in advance to determine the status evaluation benchmarks of different types of thyristor voltage monitoring boards and store them in a database. For the thyristor voltage monitoring board to be evaluated, the monitoring board type of the thyristor voltage monitoring board to be evaluated is determined based on the module information of the thyristor voltage monitoring board to be evaluated. Based on the monitoring board type, the corresponding status evaluation benchmark is screened from the database, thereby achieving status evaluation of the thyristor voltage monitoring board to be evaluated.

[0092] In this embodiment, an accurate thyristor voltage monitoring board state evaluation result is obtained by screening out a state evaluation benchmark corresponding to the thyristor voltage monitoring board to be evaluated from a database.

[0093] In one embodiment, the above step 201 of obtaining module information of each circuit module in the thyristor voltage monitoring board to be evaluated can also be implemented by the following steps:

[0094] Step 1: Obtain circuit information of the thyristor voltage monitoring board to be evaluated;

[0095] Step 2: Identify the circuit module in the thyristor voltage monitoring board to be evaluated based on the circuit information and obtain an identification result;

[0096] Step three: extract module information of each circuit module from the circuit information according to the identification result.

[0097] For example, the connection status between each circuit element in the thyristor voltage monitoring board to be evaluated can be obtained through non-destructive means such as X-ray detection, connectivity testing, and impedance testing, or through destructive means such as printed circuit board grinding by the user. The component information of each circuit element in the thyristor voltage monitoring board to be evaluated can then be determined through measurement or visual inspection by the user. The connection status between each circuit element in the thyristor voltage monitoring board to be evaluated and the component information of each circuit element constitute the circuit information of the thyristor voltage monitoring board to be evaluated. Based on the identification criteria of the circuit modules, each circuit module is identified from the circuit information of the thyristor voltage monitoring board to be evaluated, and the corresponding local circuit information is extracted from the circuit information as the corresponding circuit module information.

[0098] In this embodiment, by obtaining the circuit information of the thyristor voltage monitoring board to be evaluated, the module information of each circuit module is determined, so that the thyristor voltage monitoring board to be evaluated can be decomposed from the whole to the part, and then converted from the local state to the overall state accordingly, thereby achieving accurate evaluation of the thyristor voltage monitoring board to be evaluated.

[0099] In another embodiment, Figure 4 As shown, a method for evaluating the status of a thyristor voltage monitoring board is provided, comprising the following steps:

[0100] Step 401 : obtaining circuit information of a thyristor voltage monitoring board to be evaluated; identifying circuit modules in the thyristor voltage monitoring board to be evaluated based on the circuit information, and obtaining an identification result.

[0101] Step 402: extract module information of each circuit module from the circuit information according to the identification result.

[0102] Step 403 : for each circuit module, according to the component information of each circuit component in the circuit module, determine a target component that meets the preset conditions from each circuit component.

[0103] Step 404 : Determine the test position of the status information test point corresponding to each circuit module according to the connection information and the target component.

[0104] Step 405 : Obtain test results of the thyristor voltage monitoring board to be evaluated at various test positions.

[0105] Step 406: Determine the monitoring board type of the thyristor voltage monitoring board to be evaluated based on the module information.

[0106] Step 407 : Determine a status evaluation benchmark for the thyristor voltage monitoring board to be evaluated from a plurality of status evaluation benchmarks according to the type of the monitoring board; the plurality of status evaluation benchmarks are status evaluation benchmarks corresponding to various types of thyristor voltage monitoring boards.

[0107] Step 408 : For each circuit module, obtain the test results of each test position corresponding to the circuit module.

[0108] Step 409 : For each test position, respectively obtain the change rate of the voltage amplitude and the pulse amplitude in the test result of the test position relative to the state evaluation benchmark.

[0109] Step 410 : Determine a test point state evaluation value of the test location according to the change rate corresponding to the voltage amplitude and the change rate corresponding to the pulse amplitude.

[0110] Step 411 : determining a module status evaluation value of the circuit module based on the test point status evaluation values ​​of the respective test positions.

[0111] Step 412: Determine the status evaluation result of the thyristor voltage monitoring board to be evaluated according to the module status evaluation value.

[0112] In order to facilitate those skilled in the art to understand the embodiments of the present application, the present application is described below with reference to the specific examples of the accompanying drawings. Figure 5 The thyristor voltage monitoring board shown in the figure is used as an example for explanation, where:

[0113] The thyristor voltage monitoring board primarily consists of circuit modules, including an AC voltage divider, DC voltage equalizer, negative voltage monitoring, forward voltage monitoring, forward overvoltage monitoring, a pulse generator, and an electro-optical transmitter. Under various operating conditions, the capacitive impedance in the AC voltage divider is connected in series with the capacitors that control the pulse width of the transmitted signals in the negative voltage monitoring, forward voltage monitoring, and forward overvoltage monitoring circuit modules. The varying capacitance values ​​in these three circuits result in varying pulse widths under different operating conditions. The negative voltage monitoring circuit module transmits signals to the electro-optical transmitter via a pulse generator circuit module, while the forward voltage monitoring circuit module and the forward overvoltage monitoring circuit module share a pulse generator circuit module to transmit signals to the electro-optical transmitter. During actual operation, the thyristor voltage monitoring board monitors the voltage across the thyristor and transmits three different pulse width feedback signals. The pulse width of the feedback signal from the thyristor voltage monitoring board is used to identify and determine the thyristor's operating status.

[0114] Specifically, steps 401 and 402 may include obtaining the connection status of each circuit component in the thyristor voltage monitoring board to be evaluated through non-destructive means such as X-ray detection, connectivity testing, and impedance testing, or through destructive means such as printed circuit board grinding by the user. Component information of each circuit component in the thyristor voltage monitoring board to be evaluated is then determined through measurement or visual inspection. The connection status of each circuit component in the thyristor voltage monitoring board to be evaluated and the component information of each circuit component constitute the circuit information of the thyristor voltage monitoring board to be evaluated. Based on the circuit module identification criteria, each circuit module is identified from the circuit information of the thyristor voltage monitoring board to be evaluated, and corresponding local circuit information is extracted from the circuit information as the corresponding circuit module information.

[0115] Specifically, steps 403 and 404 may involve the user pre-setting circuit elements within each circuit module that have a significant impact on the entire circuit module as target elements, or circuit elements that have a high degradation or failure frequency as determined by historical data. Target elements that meet these requirements are then determined within each circuit module. The specific locations of the target elements are then determined based on the connection information between the circuit elements within the circuit module, thereby determining the test locations of the corresponding status information test points within the circuit module. This ensures that the test results output by these test locations reflect the status of the target elements.

[0116] Specifically, steps 405-407 may involve the following: when different voltage values ​​are input to the thyristor voltage monitoring board, the thyristor voltage monitoring board will output corresponding feedback information in different circuit modules. For example, when the forward voltage input to the thyristor voltage monitoring board reaches 500-700V, the thyristor voltage monitoring board returns a 6-8µs wide feedback pulse through the forward overvoltage monitoring circuit module. When the negative voltage input to the thyristor voltage monitoring board reaches -150--200V, the thyristor voltage monitoring board returns a 2-3µs wide feedback pulse through the negative voltage monitoring circuit module. When the forward overvoltage input to the thyristor voltage monitoring board reaches 6500-7500V, the thyristor voltage monitoring board returns a 12-15µs wide feedback pulse through the forward voltage monitoring circuit module. Based on the above characteristics, each type of thyristor voltage monitoring board is tested using at least three new thyristor voltage monitoring boards to determine the status evaluation benchmarks for different types of thyristor voltage monitoring boards and store them in a database. For the thyristor voltage monitoring board to be evaluated, the board type is determined based on its module information. The corresponding condition evaluation benchmark is then selected from the database based on the board type. Voltages of -200V, 500V, and 6500V are then input three times to obtain the return information from the three circuit modules. The circuit modules are then evaluated based on the condition evaluation benchmark.

[0117] Steps 408 to 410 may specifically be, for example, Figure 5 In the negative voltage detection circuit module, a local circuit somewhere is connected as shown in FIG. Figure 6 As shown, test point A is set at Figure 6 The position shown. A voltage amplitude test result of 20mV was obtained from test point A. The voltage amplitude condition evaluation benchmark for test point A is -561mV. It was determined that the rate of change of the test result at test point A relative to the condition evaluation benchmark exceeded 50%. Based on the condition evaluation rate change range (less than 10% indicates healthy, greater than 10% but less than 50% indicates degraded, and greater than 50% indicates faulty), the test point condition evaluation of test point A is determined to be faulty, and the corresponding test point condition evaluation value is 2.

[0118] Specifically, step 411 may be to take the maximum value of the corresponding test point status evaluation values ​​for each circuit module as the module status evaluation value of the circuit module. For example, if the test point status evaluation value of test point A is 2, then the module status evaluation value of the negative voltage monitoring circuit module is 2.

[0119] Specifically, step 412 may be, after obtaining all module status evaluation values, determining the status evaluation result of the thyristor voltage monitoring board to be evaluated according to the following rules. The specific rules are: ① If the module status evaluation values ​​of the three circuit modules are all 0, indicating that the key components are performing normally and operating well, the status evaluation result is healthy, indicating that the thyristor voltage monitoring board has high reliability; ② If the sum of the module status evaluation values ​​of the three circuit modules is 1 or 2, but the status evaluation values ​​of each individual module are less than 2, indicating that the key components have no obvious performance abnormalities and are operating well, the status evaluation result is level 1 sub-healthy, indicating that the reliability of the thyristor voltage monitoring board is acceptable; ③ If the module status evaluation values ​​of the three circuit modules are all 1, indicating that the key components have no obvious performance abnormalities but are operating well, the status evaluation result is level 2 sub-healthy, indicating that the reliability of the thyristor voltage monitoring board is fair and requires maintenance; ④ If the module status evaluation value of one of the circuit modules is 2, indicating that the key components have obvious performance abnormalities and cannot operate, the status evaluation result is faulty, indicating that the reliability of the thyristor voltage monitoring board is poor and requires immediate maintenance.

[0120] In this embodiment, by quantitatively analyzing the performance status of each node and each level in the thyristor voltage monitoring board, not only can the hidden dangers in each node be identified, but also accurate thyristor voltage monitoring board status evaluation results can be obtained, thereby ensuring the reliable operation of the thyristor voltage monitoring board.

[0121] It should be understood that, although the various steps in the flowcharts involved in the various embodiments described above are displayed in sequence according to the instructions of the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least a portion of the steps in the flowcharts involved in the various embodiments described above can include multiple steps or multiple stages, and these steps or stages are not necessarily executed and completed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0122] Based on the same inventive concept, embodiments of the present application also provide a thyristor voltage monitoring board status evaluation device for implementing the aforementioned thyristor voltage monitoring board status evaluation method. The solution provided by this device is similar to the solution described in the aforementioned method. Therefore, the specific limitations of one or more thyristor voltage monitoring board status evaluation device embodiments provided below can be found in the aforementioned limitations of the thyristor voltage monitoring board status evaluation method and will not be further elaborated here.

[0123] In one embodiment, Figure 7 As shown, a state evaluation device for a thyristor voltage monitoring board is provided, comprising: an information acquisition module 701, a test module 702, a circuit module evaluation module 703, and a state evaluation module 704, wherein:

[0124] The information acquisition module 701 is used to obtain module information of each circuit module in the thyristor voltage monitoring board to be evaluated;

[0125] A testing module 702 is configured to determine the test position of the status information test point corresponding to each circuit module based on the module information, and obtain the test results of the thyristor voltage monitoring board to be evaluated at each test position;

[0126] The circuit module evaluation module 703 is used to determine the status evaluation benchmark of the thyristor voltage monitoring board to be evaluated, evaluate the test results according to the status evaluation benchmark, and obtain the module status evaluation value of each circuit module in the thyristor voltage monitoring board to be evaluated;

[0127] The state evaluation module 704 is used to determine the state evaluation result of the thyristor voltage monitoring board to be evaluated according to the module state evaluation value.

[0128] In one embodiment, each circuit module has at least one test position, and the above-mentioned circuit module evaluation module 703 is also used to obtain the test results of each test position corresponding to the circuit module for each circuit module; evaluate the test results of each test position according to the status evaluation benchmark to obtain the test point status evaluation value of each test position; and determine the module status evaluation value of the circuit module based on the test point status evaluation value of each test position.

[0129] In one embodiment, the test results include voltage amplitude and pulse amplitude. The above-mentioned circuit module evaluation module 703 is also used to obtain, for each test position, the rate of change of the voltage amplitude and pulse amplitude in the test results of the test position relative to the state evaluation benchmark; and determine the test point state evaluation value of the test position based on the rate of change corresponding to the voltage amplitude and the rate of change corresponding to the pulse amplitude.

[0130] In one embodiment, the circuit module evaluation module 703 is further configured to determine the monitoring board type of the thyristor voltage monitoring board to be evaluated based on the module information; and to determine the state evaluation benchmark of the thyristor voltage monitoring board to be evaluated from a plurality of state evaluation benchmarks based on the monitoring board type; the plurality of state evaluation benchmarks are state evaluation benchmarks corresponding to various types of thyristor voltage monitoring boards.

[0131] In one embodiment, the module information includes connection information between each circuit element in the circuit module and component information of each circuit element. The above-mentioned test module 702 is also used to, for each circuit module, determine the target element that meets the preset conditions from each circuit element based on the component information of each circuit element in the circuit module; and determine the test position of the status information test point corresponding to each circuit module based on the connection information and the target element.

[0132] In one embodiment, the information acquisition module 701 is further used to obtain circuit information of the thyristor voltage monitoring board to be evaluated; identify the circuit modules in the thyristor voltage monitoring board to be evaluated based on the circuit information to obtain an identification result; and extract module information of each circuit module from the circuit information based on the identification result.

[0133] Each module in the aforementioned thyristor voltage monitoring board status evaluation device can be implemented in whole or in part through software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in hardware form, or can be stored in a computer device memory in software form, so that the processor can call and execute the corresponding operations of each module.

[0134] In one embodiment, a computer device is provided. The computer device may be a terminal, and its internal structure diagram may be as follows: Figure 8As shown. The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. The processor, the memory and the input / output interface are connected via a system bus, and the communication interface, the display unit and the input device are connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be achieved through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a method for evaluating the status of a thyristor voltage monitoring board is implemented. The display unit of the computer device is used to form a visually visible picture, which can be a display screen, a projection device or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covering the display screen, or a button, trackball or touchpad set on the computer device casing, or an external keyboard, touchpad or mouse.

[0135] Those skilled in the art will understand that Figure 8 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0136] In one embodiment, a computer device is further provided, including a memory and a processor. The memory stores a computer program, and the processor implements the steps in the above method embodiments when executing the computer program.

[0137] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0138] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0139] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with the relevant laws, regulations and standards of relevant countries and regions.

[0140] Those skilled in the art will appreciate that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, database or other media used in the embodiments provided in this application may include at least one of non-volatile and volatile memory. Non-volatile memory may include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory may include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in the various embodiments provided herein may include at least one of a relational database and a non-relational database. Non-relational databases may include, but are not limited to, distributed databases based on blockchains. The processor involved in the various embodiments provided herein may be, but are not limited to, a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic unit, a data processing logic unit based on quantum computing, and the like.

[0141] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0142] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A method for evaluating the status of a thyristor voltage monitoring board, characterized in that: The method comprises: Obtaining circuit information of a thyristor voltage monitoring board to be evaluated, identifying circuit modules in the thyristor voltage monitoring board to be evaluated based on the circuit information, obtaining an identification result, and extracting module information of each circuit module from the circuit information based on the identification result; each circuit module has at least one test position; the module information includes connection information between circuit elements in the circuit module and element information of each circuit element; For each circuit module, based on the component information of each circuit component in the circuit module, determine a target component that meets preset conditions from the circuit components, and determine a test position of a status information test point corresponding to the circuit module based on the connection information and the target component; Obtaining test results of the thyristor voltage monitoring board to be evaluated at various test positions; Determining a status evaluation benchmark for the thyristor voltage monitoring board to be evaluated; For each circuit module, obtaining test results for each test position corresponding to the circuit module, respectively obtaining, for each test position, the rate of change of the voltage amplitude and the pulse amplitude in the test results of the test position relative to the state evaluation benchmark, determining a test point state evaluation value for the test position based on the rate of change corresponding to the voltage amplitude and the rate of change corresponding to the pulse amplitude, and determining a module state evaluation value for the circuit module based on the test point state evaluation values ​​for each test position; the test results including the voltage amplitude and the pulse amplitude; A status evaluation result of the thyristor voltage monitoring board to be evaluated is determined according to the module status evaluation value.

2. The method according to claim 1, characterized in that Determining a status evaluation benchmark of the thyristor voltage monitoring board to be evaluated includes: Determining the monitoring board type of the thyristor voltage monitoring board to be evaluated according to the module information; According to the type of the monitoring board, a state evaluation benchmark of the thyristor voltage monitoring board to be evaluated is determined from a plurality of state evaluation benchmarks.

3. The method according to claim 2, characterized in that The multiple status evaluation benchmarks are status evaluation benchmarks corresponding to multiple types of new thyristor voltage monitoring boards.

4. The method according to claim 1, wherein The status evaluation results include at least health, first-level sub-health, second-level sub-health and failure.

5. A state evaluation device for a thyristor voltage monitoring board, characterized in that: The device comprises: an information acquisition module configured to acquire circuit information of a thyristor voltage monitoring board to be evaluated, identify circuit modules in the thyristor voltage monitoring board to be evaluated based on the circuit information, obtain an identification result, and extract module information of each circuit module from the circuit information based on the identification result; each circuit module has at least one test position; the module information includes connection information between circuit elements in the circuit module and element information of each circuit element; a testing module configured to, for each circuit module, determine, based on component information of each circuit component in the circuit module, a target component that meets preset conditions from among the circuit components; determine, based on the connection information and the target component, a test position of a status information test point corresponding to the circuit module; and obtain test results of the thyristor voltage monitoring board to be evaluated at each test position; a circuit module evaluation module configured to determine a state evaluation benchmark for the thyristor voltage monitoring board to be evaluated; for each circuit module, obtaining test results for each test position corresponding to the circuit module; for each test position, obtaining the rate of change of the voltage amplitude and pulse amplitude in the test results of the test position relative to the state evaluation benchmark; determining a test point state evaluation value for the test position based on the rate of change corresponding to the voltage amplitude and the rate of change corresponding to the pulse amplitude; and determining a module state evaluation value for the circuit module based on the test point state evaluation values ​​for each test position; the test results including the voltage amplitude and the pulse amplitude; The status evaluation module is used to determine the status evaluation result of the thyristor voltage monitoring board to be evaluated according to the module status evaluation value.

6. The device according to claim 5, characterized in that The circuit module evaluation module is further configured to determine the monitoring board type of the thyristor voltage monitoring board to be evaluated based on the module information; and determine the status evaluation benchmark of the thyristor voltage monitoring board to be evaluated from a plurality of status evaluation benchmarks based on the monitoring board type.

7. The device according to claim 6, characterized in that The multiple status evaluation benchmarks are status evaluation benchmarks corresponding to multiple types of new thyristor voltage monitoring boards.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 4 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.

10. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 4 are implemented.

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