Magnetic field probe and magnetic field detection method

Abstract

The application relates to a magnetic field probe and a magnetic field detection method. The magnetic field probe comprises a first port, a second port and a third port; a first detection loop is formed between the first port and the second port and between the third port and a ground terminal, a second detection loop is formed between the first port and the third port and between the second port and the ground terminal, and the first detection loop and the second detection loop are orthogonal; the first port outputs a first voltage induced by the first detection loop and the second detection loop in a detection area; the second port outputs a second voltage induced by the first detection loop and the second detection loop in the detection area; the third port outputs a third voltage induced by the first detection loop and the second detection loop in the detection area; and the first voltage, the second voltage and the third voltage are used for determining the magnetic field intensity in an x direction and the magnetic field intensity in a y direction in the detection area. The method can detect two magnetic field components at one time, and is highly adaptable to scenes.

Description

Technical Field

[0001] This application relates to the field of magnetic field detection technology, and in particular to a magnetic field probe and a magnetic field detection method. Background Technology

[0002] With the rapid development of large-scale integrated circuits, higher demands are being placed on the miniaturization, high frequency, and high integration of microwave and millimeter-wave electronic systems. Electromagnetic interference between internal components of microwave and millimeter-wave electronic systems has become a significant technical challenge. To study electromagnetic interference between internal components, it is necessary to capture the electromagnetic field information emitted by the interference source.

[0003] Currently, magnetic field probes are used to capture electromagnetic field information emitted by interference sources. However, these probes can only detect a single magnetic field component (Hx or Hy), resulting in poor scene adaptability of existing magnetic field probes. Summary of the Invention

[0004] Therefore, it is necessary to provide a magnetic field probe and magnetic field detection method that can improve the scene adaptability of the magnetic field probe in order to address the above-mentioned technical problems.

[0005] In a first aspect, this application provides a magnetic field probe, which includes a first port, a second port and a third port; a first detection loop is formed between the first port and the second port and between the third port and the grounding terminal, and a second detection loop is formed between the first port and the third port and between the second port and the grounding terminal, wherein the first detection loop and the second detection loop are orthogonal;

[0006] The first port is used to output the first voltage induced in the detection area by the first detection circuit and the second detection circuit;

[0007] The second port is used to output the second voltage induced by the first and second detection circuits in the detection area.

[0008] The third port is used to output the third voltage induced in the detection area by the first and second detection circuits;

[0009] The first voltage, the second voltage, and the third voltage are used to determine the magnetic field strength in the x-direction and the magnetic field strength in the y-direction of the detection region.

[0010] In one embodiment, the magnetic field probe further includes a first coil, a second coil, a third coil, and a fourth coil;

[0011] The first coil is connected to the first port and the second coil respectively, and the second coil is also connected to the second port to form a first detection circuit;

[0012] The third coil is connected to the third port and the fourth coil respectively, and the fourth coil is grounded to form the first detection circuit;

[0013] The first coil is also connected to the third coil to form a second detection circuit;

[0014] The second coil is also connected to the fourth coil to form a second detection circuit.

[0015] In one embodiment, the magnetic field probe further includes a first signal line, a second signal line, a third signal line, a fourth signal line, a fifth signal line, and a first coaxial connector;

[0016] The first port and the first coil are connected via a first signal line;

[0017] The first coil and the second coil are connected via a second signal line;

[0018] The second coil and the second port are connected via a third signal line;

[0019] The third port and the third coil are connected via the fourth signal line;

[0020] The third and fourth coils are connected via the fifth signal line;

[0021] The second and fourth coils are connected via the first coaxial connector.

[0022] In one embodiment, the magnetic field probe further includes a first circuit board, which includes a first body and a first extension that can extend into the detection area;

[0023] Both the first port and the second port are located on the first body, and both the first coil and the second coil are located on the first extension. The first signal line extends from the first port to the first coil, the second signal line extends from the first coil to the second coil, and the third signal line extends from the second port to the second coil.

[0024] In one embodiment, the magnetic field probe further includes a second circuit board, which includes a second body and a second extension that can extend into the detection area;

[0025] The third port is located on the second body, and the third and fourth coils are both located on the second extension. The fourth signal line extends from the third port to the third coil, and the fifth signal line extends from the third coil to the fourth coil.

[0026] In one embodiment, the magnetic field probe further includes two third circuit boards;

[0027] A first circuit board and a second circuit board are disposed between two third circuit boards, and a preset distance is spaced between the third circuit board and the first circuit board or the second circuit board.

[0028] Both third circuit boards are grounded.

[0029] In one embodiment, the magnetic field probe further includes a second coaxial connector and a plurality of third coaxial connectors;

[0030] The fourth coil is connected to the third circuit board via the second coaxial connector;

[0031] The inner cores of multiple third coaxial connectors are connected to the first, third, or fourth signal lines, while the outer cores are connected to two third circuit boards respectively.

[0032] Secondly, this application provides a magnetic field detection method. Applied to a magnetic field probe as described in the first aspect, the method includes:

[0033] Obtain the first voltage output from the first port of the magnetic field probe;

[0034] Obtain the second voltage output from the second port of the magnetic field probe;

[0035] Obtain the third voltage output from the third port of the magnetic field probe;

[0036] The magnetic field strength in the x-direction and the magnetic field strength in the y-direction are determined based on the first voltage, the second voltage, and the third voltage.

[0037] In one embodiment, determining the magnetic field strength in the x-direction and the magnetic field strength in the y-direction based on the first voltage, the second voltage, and the third voltage includes:

[0038] Obtain the voltage matrix, which is used to characterize the relationship between the first voltage and the induced voltage in the x-direction and the induced voltage in the y-direction, the relationship between the second voltage and the induced voltage in the x-direction and the induced voltage in the y-direction, and the relationship between the third voltage and the induced voltage in the x-direction and the induced voltage in the y-direction.

[0039] Based on the voltage matrix, the first voltage, the second voltage, and the third voltage, determine the induced voltage in the x-direction and the induced voltage in the y-direction;

[0040] The magnetic field strength in the x-direction is determined based on the induced voltage in the x-direction.

[0041] The magnetic field strength in the y-direction is determined based on the induced voltage in the y-direction.

[0042] In one embodiment, the method further includes:

[0043] The electromagnetic field suppression ratio is determined based on the magnetic field strength in the x-direction and the magnetic field strength in the y-direction.

[0044] The aforementioned magnetic field probe and magnetic field detection method include a first port, a second port, and a third port. A first detection loop is formed between the first and second ports and between the third port and the grounding terminal. A second detection loop is formed between the first and third ports and between the second port and the grounding terminal. The first and second detection loops are orthogonal. The first port outputs a first voltage induced by the first and second detection loops in the detection area. The second port outputs a second voltage induced by the first and second detection loops in the detection area. The third port outputs a third voltage induced by the first and second detection loops in the detection area. The first, second, and third voltages are used to determine the magnetic field strength in the x-direction and the y-direction in the detection area. This application performs magnetic field detection through orthogonal first and second detection loops, requiring only one detection to detect both magnetic field components, thus exhibiting strong adaptability to various scenarios. Attached Figure Description

[0045] Figure 1a This is one of the schematic diagrams of magnetic field detection in traditional techniques;

[0046] Figure 1b This is the second schematic diagram of magnetic field detection in traditional techniques;

[0047] Figure 2 This is one of the schematic diagrams of a magnetic field probe in one embodiment;

[0048] Figure 3a This is a schematic diagram of the plane where the first detection loop is located in one embodiment;

[0049] Figure 3b This is a schematic diagram of the plane where the second detection loop is located in one embodiment;

[0050] Figure 3c This is a schematic diagram of detecting the magnetic field in the x-direction in one embodiment;

[0051] Figure 3d This is a schematic diagram of detecting the magnetic field in the y-direction in one embodiment;

[0052] Figure 3e This is a schematic diagram of detecting the electric field in the z-direction in one embodiment;

[0053] Figure 4 This is a second schematic diagram of a magnetic field probe in one embodiment;

[0054] Figure 5 This is a schematic diagram of the first circuit board in one embodiment;

[0055] Figure 6 This is a schematic diagram of the second circuit board in one embodiment;

[0056] Figure 7This is a schematic diagram of a third circuit board in one embodiment;

[0057] Figure 8 This is a physical image of a magnetic field probe in one embodiment;

[0058] Figure 9 This is a flowchart illustrating a magnetic field detection method in one embodiment;

[0059] Figure 10 This is a flowchart illustrating the steps for determining the magnetic field strength in the x-direction and the magnetic field strength in the y-direction based on a first voltage, a second voltage, and a third voltage, in another embodiment. Detailed Implementation

[0060] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0061] First, before introducing the technical solutions of the embodiments of this application, the technical background or evolution of the embodiments of this application will be introduced. With the rapid development of large-scale integrated circuits, higher requirements have been placed on the miniaturization, high frequency, and high integration of microwave and millimeter-wave electronic systems. Electromagnetic interference between internal components of microwave and millimeter-wave electronic systems has become an unavoidable technical problem. In order to study electromagnetic interference between internal components, it is necessary to capture the electromagnetic field information emitted by the interference source. Currently, magnetic field probes are used to capture the electromagnetic field information emitted by the interference source. However, such magnetic field probes can only detect a single-component magnetic field (Hx or Hy). Figure 1a and Figure 1b As shown, A is the output port. When it is necessary to measure two magnetic field components (Hx and Hy) simultaneously, the single-component probe must be rotated 0° and 90° respectively to detect the two magnetic field components (Hx and Hy), resulting in poor scene adaptability of existing magnetic field probes. Furthermore, this detection method also doubles the detection time and introduces problems such as mechanical position errors.

[0062] This application provides a magnetic field probe, which includes a first port, a second port, and a third port. A first detection loop is formed between the first and second ports and between the third port and a ground terminal, and a second detection loop is formed between the first and third ports and between the second port and the ground terminal. The first and second detection loops are orthogonal. Two magnetic field components (Hx and Hy) can be detected through the first and second detection loops, thereby superimposing the induced voltages and outputting them from the first and second ports respectively. Then, based on the first voltage output from the first port, the second voltage output from the second port, and the third voltage output from the third port, the magnetic field strength in the x-direction and the magnetic field strength in the y-direction can be determined. Using the magnetic field probe of this application embodiment, two magnetic field components (Hx and Hy) can be detected in a single detection, making it highly adaptable to various scenarios. Moreover, since there is no need to rotate the probe, the detection time can be shortened and mechanical position errors can be reduced.

[0063] In one embodiment, such as Figure 2 As shown, this application provides a magnetic field probe. The magnetic field probe includes a first port A, a second port B, and a third port C; a first detection loop is formed between the first port A and the second port B, and between the third port C and a ground terminal; a second detection loop is formed between the first port A and the third port C, and between the second port B and the ground terminal, the first detection loop and the second detection loop being orthogonal; the first port A is used to output a first voltage induced by the first and second detection loops in the detection area; the second port B is used to output a second voltage induced by the first and second detection loops in the detection area; the third port C is used to output a third voltage induced by the first and second detection loops in the detection area; wherein, the first voltage, the second voltage, and the third voltage are used to determine the magnetic field strength in the x-direction and the magnetic field strength in the y-direction of the detection area.

[0064] In this embodiment, the magnetic field probe includes a first port A, a second port B, and a third port C. A first detection loop is formed between the first port A and the second port B, and a first detection loop is formed between the third port C and the ground terminal. The first detection loop is as follows: Figure 3a The patterned surface is shown. A second detection loop is formed between the first port A and the third port C, and a second detection loop is formed between the second port B and the ground terminal. The plane containing the second detection loop is as shown. Figure 3b The grid surface shown. From Figure 3a and Figure 3b It can be seen that the plane containing the first detection loop is perpendicular to the plane containing the second detection loop, that is, the first detection loop and the second detection loop are orthogonal.

[0065] In this embodiment, the first detection circuit is used to detect the magnetic field strength in the x-direction, and the second detection circuit is used to detect the magnetic field strength in the y-direction; or, the first detection circuit is used to detect the magnetic field strength in the y-direction, and the second detection circuit is used to detect the magnetic field strength in the x-direction. This application does not limit the specific implementation; the circuit can be configured according to actual conditions.

[0066] like Figure 3c As shown, the magnetic field Hx in the x-direction of the detection region passes through the first detection loop, inducing a current -I. Hx The induced current I will be excited at ports A and C. Hx It is excited at port B. For example... Figure 3d As shown, the magnetic field Hy in the y-direction passes through the second detection loop, inducing a current I. Hy The induced current -I will be excited at ports A and B. Hy It is excited at port C. For example... Figure 3e As shown, the electric field Ez passes perpendicularly through the bottom of the first and second detection circuits, inducing a current I. Ez It is simultaneously activated at ports A, B, and C.

[0067] The first voltage V output from port A A The second voltage V output from port B B The third voltage Vc output from port C can be the induced voltage Vc of the magnetic field in the x-direction. Hx The induced voltage V of the magnetic field in the y direction Hy The induced voltage V of the electric field in the z-direction Ez This is represented as in formula (1):

[0068]

[0069] Further solving based on formula (1) yields:

[0070]

[0071] Among them, V Hx V is proportional to the magnetic field strength in the x-direction magnetic field Hx. Hy The magnetic field strength is proportional to the magnetic field strength Hy in the y-direction; V can be solved for. Hx and V Hy Then, based on V Hx and V Hy The magnetic field strength in the x-direction and y-direction are determined by a direct proportionality relationship. It should be noted that, using orthogonal first and second detection loops, the magnetic field coupling in the x-direction and y-direction can be extracted separately. The magnitude of the coupling value is determined by the material, size, and shape of the detection loop, and is independent of the detection area.

[0072] In the above embodiments, the magnetic field probe includes a first port, a second port, and a third port; a first detection loop is formed between the first port and the second port, and between the third port and the grounding terminal; a second detection loop is formed between the first port and the third port, and between the second port and the grounding terminal; the first detection loop and the second detection loop are orthogonal; the first port outputs a first voltage induced by the first and second detection loops in the detection area; the second port outputs a second voltage induced by the first and second detection loops in the detection area; the third port outputs a third voltage induced by the first and second detection loops in the detection area; the first voltage, the second voltage, and the third voltage are used to determine the magnetic field strength in the x-direction and the magnetic field strength in the y-direction of the detection area. This application performs magnetic field detection through orthogonal first and second detection loops, requiring only one detection to detect two magnetic field components, thus exhibiting strong scene adaptability.

[0073] In one embodiment, such as Figure 4 As shown, the magnetic field probe also includes a first coil 11, a second coil 12, a third coil 13, and a fourth coil 14; the first coil 11 is connected to the first port A and the second coil 12 respectively, and the second coil 12 is also connected to the second port B to form a first detection circuit; the third coil 13 is connected to the third port C and the fourth coil 14 respectively, and the fourth coil 14 is grounded to form a first detection circuit; the first coil 11 is also connected to the third coil 13 to form a second detection circuit; the second coil 12 is also connected to the fourth coil 14 to form a second detection circuit.

[0074] In this embodiment, the magnetic field probe further includes a first coil 11, a second coil 12, a third coil 13, and a fourth coil 14. The first coil 11, the second coil 12, and the third coil 13 can capture the radio frequency signal formed by the magnetic field radiated by the interference source in the near field region.

[0075] The first port A is connected to the first coil 11, the first coil 11 is connected to the second coil 12, and the second coil 12 is connected to the second port B. The first port A, the first coil 11, the second coil 12, and the second port B are connected sequentially to form a first detection loop. The third coil 13 is connected to the third port C, the third coil 13 is connected to the fourth coil 14, and the fourth coil 14 is grounded. The third port C, the third coil 13, the fourth coil 14, and the ground terminal are connected sequentially to form another first detection loop. The first coil 11 is also connected to the third coil 13, and the second coil 12 is also connected to the fourth coil 14. The first port A, the first coil 11, the third coil 13, and the third port C are connected sequentially to form a second detection loop. The ground terminal, the fourth coil 14, the second coil 12, and the second port B are connected sequentially to form another second detection loop. The plane containing the first detection loop is perpendicular to the plane containing the second detection loop; that is, the first and second detection loops are orthogonal to each other.

[0076] In the above embodiments, the magnetic field probe further includes a first coil, a second coil, a third coil, and a fourth coil. The first coil is connected to a first port and a second coil, respectively, and the second coil is also connected to a second port to form a first detection loop. The third coil is connected to a third port and a fourth coil, respectively, and the fourth coil is grounded to form a first detection loop. The first coil is also connected to the third coil to form a second detection loop. The second coil is also connected to the fourth coil to form a second detection loop. This embodiment of the application, through the connection relationships between the first coil, the second coil, the first port, and the second port; the connection relationships between the third coil, the fourth coil, and the third port; the connection relationships between the second coil and the third coil; and the connection relationships between the second coil and the fourth coil, forms mutually orthogonal first and second detection loops. This allows for the simultaneous detection of two magnetic field components through two detection loops, which not only provides strong scene adaptability but also saves detection time and reduces mechanical position errors.

[0077] In one embodiment, such as Figure 4 As shown, the magnetic field probe also includes a first signal line 21, a second signal line 22, a third signal line 23, a fourth signal line 24, a fifth signal line 25, and a first coaxial connector 31; the first port A and the first coil 11 are connected through the first signal line 21; the first coil 11 and the second coil 12 are connected through the second signal line 22; the second coil 12 and the second port B are connected through the third signal line 23; the third port C and the third coil 13 are connected through the fourth signal line 24; the third coil 13 and the fourth coil 14 are connected through the fifth signal line 25; and the second coil 12 and the fourth coil 14 are connected through the first coaxial connector 31.

[0078] In this embodiment, the magnetic field probe further includes a first signal line 21, a second signal line 22, a third signal line 23, a fourth signal line 24, a fifth signal line 25, and a first coaxial connector 31. The first port A and the first coil 11 are connected via the first signal line 21; the first coil 11 and the second coil 12 are connected via the second signal line 22; the second coil 12 and the second port B are connected via the third signal line 23; and the third port C and the third coil 13 are connected via the fourth signal line 24. Thus, the first port A, the first signal line 21, the first coil 11, the second signal line 22, the second coil 12, the third signal line 23, and the second port B are sequentially connected to form a first detection loop. The grounding terminal, the fourth coil 14, the fifth signal line 25, the third coil 13, the fourth signal line 24, and the third port C are sequentially connected to form another first detection loop.

[0079] The first coil 11 and the second coil 12 are connected via the second signal line 22. The second coil 12 and the fourth coil 14 are connected via the first coaxial connector 31. The third coil 13 and the fourth coil 14 are connected via the fifth signal line 15, which is equivalent to connecting the first coil 11 and the third coil 13. In this way, the first port A, the first signal line 21, the first coil 11, the third coil 13, and the second port C are connected in sequence to form a second detection loop. The second port B, the third signal line 23, the second coil 12, the first coaxial connector 31, the fourth coil 14, and the ground terminal are connected in sequence to form another second detection loop.

[0080] In the above embodiments, the magnetic field probe further includes a first signal line, a second signal line, a third signal line, a fourth signal line, a fifth signal line, and a first coaxial connector. The first port and the first coil are connected via the first signal line; the first coil and the second coil are connected via the second signal line; the second coil and the second port are connected via the third signal line; the third port and the third coil are connected via the fourth signal line; the third coil and the fourth coil are connected via the fifth signal line; and the second coil and the fourth coil are connected via the first coaxial connector. In this embodiment, the connection between coils and between coils and ports is achieved through signal lines and coaxial connectors, thereby forming a first detection loop and a second detection loop that are orthogonal to each other. This allows for the simultaneous detection of two magnetic field components, providing strong adaptability to various scenarios and saving detection time while reducing mechanical position errors.

[0081] In one embodiment, such as Figure 5As shown, the magnetic field probe also includes a first circuit board 41, which includes a first body 411 and a first extension 412 that can extend into the detection area; both the first port A and the second port B are disposed on the first body 411, both the first coil 11 and the second coil 12 are disposed on the first extension 412, the first signal line 21 extends from the first port A to the first coil 11, the second signal line 22 extends from the first coil 11 to the second coil 12, and the third signal line 23 extends from the second port B to the second coil 12.

[0082] In this embodiment, the magnetic field probe further includes a first circuit board 41, which includes a first body 411 and a first extension 412. The first extension 412 is elongated and can extend into the detection area. This embodiment does not limit the length and width of the first extension; they can be set according to actual conditions.

[0083] Both the first port A and the second port B are located on the first main body 411, and the first port A and the second port B can be spaced at a preset distance to avoid signal interference between the ports.

[0084] The first coil 11 and the second coil 12 are both disposed on the first extension 412.

[0085] The first signal line 21, the second signal line 22, and the third signal line 23 are all disposed on the first circuit board 41. Furthermore, the first signal line 21 extends from the first port A disposed on the first main body 411 to the first coil 11 disposed on the first extension portion 412, thereby realizing the connection between the first port A and the first coil 11.

[0086] The second signal line 22 extends from the first coil 11 to the second coil 12, thereby connecting the first coil 11 and the second coil 12.

[0087] The third signal line 31 extends from the second port B provided on the first main body 411 to the second coil 12 provided on the first extension 412, thereby realizing the connection between the second port B and the second coil 12.

[0088] In the above embodiments, the magnetic field probe further includes a first circuit board, which includes a first body and a first extension that can extend into the detection area. A first port and a second port are both disposed on the first body, and a first coil and a second coil are both disposed on the first extension. A first signal line extends from the first port to the first coil, a second signal line extends from the first coil to the second coil, and a third signal line extends from the second port to the second coil. The embodiments of this application, through the first circuit board, can easily realize the configuration of the first port, the second port, the first coil, and the second coil, the connection between the first port and the first coil, and the connection between the second port and the second coil, thereby providing a foundation for realizing a magnetic field probe.

[0089] In one embodiment, such as Figure 6 As shown, the magnetic field probe also includes a second circuit board 42, which includes a second body 421 and a second extension 422 that can extend into the detection area; a third port C is disposed on the second body 421, and a third coil 13 and a fourth coil 14 are both disposed on the second extension 422; a fourth signal line 24 extends from the third port C to the third coil 13, and a fifth signal line extends from the third coil to the fourth coil.

[0090] In this embodiment, the magnetic field probe further includes a second circuit board 42, which includes a second body 421 and a second extension 422. The second extension 422 is elongated and can extend into the detection area. Optionally, the second circuit board 42 has the same shape and size as the first circuit board 41.

[0091] The third port C is located on the second main body 421, and the third coil 13 and the fourth coil 14 are both located on the second extension 422. The fourth signal line 24 extends from the third port C to the third coil 13, realizing the connection between the third port C and the third coil 13.

[0092] The fifth signal line 25 extends from the third coil 13 to the fourth coil 14, realizing the connection between the third coil 13 and the fourth coil 14.

[0093] In the above embodiments, the magnetic field probe further includes a second circuit board, which includes a second main body and a second extension that can extend into the detection area. A third port is disposed on the second main body, and both a third coil and a fourth coil are disposed on the second extension. A fourth signal line extends from the third port to the third coil, and a fifth signal line extends from the third coil to the fourth coil. The embodiments of this application can easily realize the setting of the third port, the third coil, and the fourth coil, as well as the connection between the third port and the third coil, and between the third coil and the fourth coil, through the second circuit board, thereby providing a foundation for realizing a magnetic field probe.

[0094] In one embodiment, such as Figure 7 As shown, the magnetic field probe also includes two third circuit boards 43; a first circuit board 41 and a second circuit board 42 are disposed between the two third circuit boards 43, and the third circuit board 43 is spaced apart from the first circuit board 41 or the second circuit board 42 by a preset distance; both third circuit boards 43 are grounded.

[0095] In this embodiment, the magnetic field probe further includes two third circuit boards 43, with the first circuit board 41 and the second circuit board 42 disposed between the two third circuit boards 43. The spacing between any two circuit boards of the first circuit board 41, the second circuit board 42, and the two third circuit boards 43 may be the same or different; this embodiment does not limit the spacing.

[0096] In the above embodiments, the magnetic field probe further includes two third circuit boards; a first circuit board and a second circuit board are disposed between the two third circuit boards, and a preset distance is maintained between the third circuit boards and the first or second circuit board; both third circuit boards are grounded. This embodiment achieves shielding through the two third circuit boards, preventing the magnetic field from affecting the current transmitted through the signal line, thereby improving the accuracy of magnetic field detection.

[0097] In one embodiment, the fourth coil 14 is connected to the third circuit board 43 via a second coaxial connector; the inner cores of the plurality of third coaxial connectors are connected to the first signal line 21 or the third signal line 23 or the fourth signal line, and the outer cores are connected to the two third circuit boards 43 respectively.

[0098] In this embodiment, the fourth coil 14 is connected to the third circuit board 43 via the second coaxial connector, thereby grounding the fourth coil 14.

[0099] The magnetic field probe also includes multiple third coaxial connectors. The inner core of some third coaxial connectors is connected to the first signal line 21, and the inner core of some third coaxial connectors is connected to the third signal line 23. The inner core of another part of the third coaxial connectors is connected to the fourth signal line 23, and the outer core of all third coaxial connectors is connected to two third circuit boards 43.

[0100] Among them, the physical magnetic field probe is as follows: Figure 8 As shown.

[0101] In the above embodiments, the magnetic field probe further includes a second coaxial connector and multiple third coaxial connectors; the fourth coil is connected to the third circuit board via the second coaxial connector; the inner cores of the multiple third coaxial connectors are connected to the first signal line, the third signal line, or the fourth signal line, and the outer cores are respectively connected to two third circuit boards. In this application example, the fourth coil is grounded using the second coaxial connector, and the transmission reliability of the first, third, and fourth signal lines can be improved using multiple third coaxial connectors.

[0102] In one embodiment, such as Figure 9 As shown, this application provides a magnetic field detection method. Taking the application of this method to the magnetic field probe described in the above embodiments as an example, the embodiments of this application may include the following steps:

[0103] Step 501: Obtain the first voltage output from the first port of the magnetic field probe;

[0104] Step 502: Obtain the second voltage output from the second port of the magnetic field probe;

[0105] Step 503: Obtain the third voltage output from the third port of the magnetic field probe;

[0106] Step 504: Determine the magnetic field strength in the x-direction and the magnetic field strength in the y-direction based on the first voltage, the second voltage, and the third voltage.

[0107] In this embodiment, the x-direction magnetic field Hx of the detection region passes through the first detection loop, the y-direction magnetic field Hy passes through the second detection loop, and the z-direction electric field Ez passes perpendicularly through the bottom of the first and second detection loops. The first port superimposes the induced voltages of the x-direction magnetic field, y-direction magnetic field, and z-direction electric field, and outputs a first voltage; the second port superimposes the induced voltages of the x-direction magnetic field, y-direction magnetic field, and z-direction electric field, and outputs a second voltage; the third port superimposes the induced voltages of the x-direction magnetic field, y-direction magnetic field, and z-direction electric field, and outputs a third voltage.

[0108] Since the first voltage output from the first port is related to the induced voltage of the magnetic field in the x and y directions, the second voltage output from the second port is related to the induced voltage of the magnetic field in the x and y directions, and the third voltage output from the third port is related to the induced voltage of the magnetic field in the x and y directions, the induced voltage of the magnetic field in the x and y directions can be calculated based on the above correlations. Therefore, the magnetic field strength of the magnetic field in the x and y directions can be determined based on the induced voltage of the magnetic field in the x and y directions.

[0109] In practical applications, the first, second, and third ports of the magnetic field probe can be connected to the input terminals of a spectrum analyzer. The spectrum analyzer acquires the first voltage output from the first port, the second voltage output from the second port, and the third voltage output from the third port of the magnetic field probe. Based on the first, second, and third voltages, it determines the induced voltages of the magnetic fields in the x and y directions, and also determines the magnetic field strengths in the x and y directions. It should be noted that the device for determining the magnetic field strength is not limited to a spectrum analyzer; other devices can also be used, and this application does not limit this.

[0110] In the above embodiments, a first voltage output from the first port of the magnetic field probe is acquired; a second voltage output from the second port of the magnetic field probe is acquired; a third voltage output from the third port of the magnetic field probe is acquired; and the magnetic field strength in the x-direction and the magnetic field strength in the y-direction are determined based on the first voltage, the second voltage, and the third voltage. In this embodiment, the first voltage is correlated with the magnetic field in the x-direction and the magnetic field in the y-direction, the second voltage is correlated with the magnetic field in the x-direction and the magnetic field in the y-direction, and the third voltage is correlated with the magnetic field in the x-direction and the magnetic field in the y-direction. Therefore, two magnetic field components can be detected at once using the first voltage, the second voltage, and the third voltage, which not only has strong scene adaptability but also saves detection time and reduces mechanical position errors.

[0111] In one embodiment, such as Figure 10 As shown, the process of determining the magnetic field strength in the x-direction and the magnetic field strength in the y-direction based on the first voltage, the second voltage, and the third voltage may include the following steps:

[0112] Step 601: Obtain the voltage matrix.

[0113] The voltage matrix is ​​used to characterize the relationship between the first voltage and the induced voltage in the x-direction and the induced voltage in the y-direction, the relationship between the second voltage and the induced voltage in the x-direction and the induced voltage in the y-direction, and the relationship between the third voltage and the induced voltage in the x-direction and the induced voltage in the y-direction.

[0114] Step 602: Determine the induced voltage in the x-direction and the induced voltage in the y-direction based on the voltage matrix, the first voltage, the second voltage, and the third voltage.

[0115] Step 603: Determine the magnetic field strength in the x-direction based on the induced voltage in the x-direction.

[0116] Step 604: Determine the magnetic field strength in the y-direction based on the induced voltage in the y-direction.

[0117] In this embodiment of the application, the voltage matrix can be expressed as formula (1), in formula (1), V A The first voltage output from port A, V B The second voltage output from port B, V C The third voltage output from the third port C, V Hx The induced voltage V in the magnetic field in the x-direction. Hy V is the induced voltage of the magnetic field in the y-direction. Ez Let be the induced voltage of the electric field in the z-direction.

[0118] After constructing the voltage matrix, the relationship between the induced voltage in the x-direction and the first, second, and third voltages can be calculated, as well as the relationship between the induced voltage in the y-direction and the first, second, and third voltages, as shown in formula (2).

[0119] After obtaining the first voltage output from the first port and the second voltage output from the second port, the first voltage, the second voltage and the third voltage are substituted into formula (2) to solve for the induced voltage in the x direction and the induced voltage in the y direction.

[0120] Since the induced voltage in the x-direction is linearly proportional to the magnetic field strength in the x-direction, the magnetic field strength in the x-direction can be determined based on the induced voltage in the x-direction. Similarly, the induced voltage in the y-direction is linearly proportional to the magnetic field strength in the y-direction, therefore, the magnetic field strength in the y-direction can be determined based on the induced voltage in the y-direction.

[0121] In the above embodiments, a voltage matrix is ​​obtained, and the induced voltage in the x-direction and the induced voltage in the y-direction are determined based on the voltage matrix, the first voltage, the second voltage, and the third voltage; the magnetic field strength in the x-direction is determined based on the induced voltage in the x-direction; and the magnetic field strength in the y-direction is determined based on the induced voltage in the y-direction. This embodiment of the application, through the correlation between the first voltage and the magnetic fields in the x-direction and y-direction, the correlation between the second voltage and the magnetic fields in the x-direction and y-direction, and the correlation between the third voltage and the magnetic fields in the x-direction and y-direction, can detect two magnetic field components simultaneously. This not only provides strong scene adaptability but also saves detection time and reduces mechanical position errors.

[0122] In one embodiment, the present application may further include: determining the electromagnetic field suppression ratio based on the magnetic field strength in the x-direction and the magnetic field strength in the y-direction.

[0123] In this embodiment of the application, the difference between the magnetic field strength in the x-direction and the magnetic field strength in the y-direction can be calculated to obtain the electromagnetic field suppression ratio.

[0124] In the above embodiments, the electromagnetic field suppression ratio is determined based on the magnetic field strength in the x-direction and the magnetic field strength in the y-direction. This facilitates subsequent processing using the electromagnetic field suppression ratio, thereby reducing electromagnetic interference.

[0125] In one embodiment, the present application may further include: obtaining a detection signal by acquiring a magnetic field probe to detect a microstrip line of a preset width; and determining the spatial resolution of the magnetic field probe based on the detection signal.

[0126] In this embodiment, the magnetic field probe is placed perpendicular to the microstrip line, meaning the plane of the microstrip line is perpendicular to the direction of the electric field detected by the magnetic field probe. The magnetic field probe detects microstrip lines of different widths, obtaining multiple detection signals, i.e., outputting multiple first voltages, multiple second voltages, and multiple third voltages. For any detection signal, if the magnetic field strength generated by the microstrip line can be determined based on the detection signal, then the magnetic field probe can detect the magnetic field of a microstrip line of the corresponding width. If the magnetic field strength generated by the microstrip line cannot be determined based on the detection signal, then the magnetic field probe cannot detect the magnetic field of a microstrip line of the corresponding width.

[0127] By analogy, the width range of the microstrip line that the magnetic field probe can detect can be determined, and this width range can be defined as the spatial resolution of the magnetic field probe.

[0128] In the above embodiments, the magnetic field probe detects a microstrip line of a preset width to obtain a detection signal; the spatial resolution of the magnetic field probe is determined based on the detection signal. This embodiment determines the spatial resolution of the magnetic field probe, allowing it to be applied to a suitable detection range, thereby ensuring detection accuracy.

[0129] In one embodiment, the present application may further include: obtaining a detection signal by acquiring a magnetic field probe to detect a microstrip line of a preset width; and calibrating the magnetic field probe according to the detection signal and a preset mapping relationship.

[0130] In this embodiment, the magnetic field probe is placed perpendicular to the microstrip line, meaning the plane of the microstrip line is perpendicular to the direction of the electric field detected by the magnetic field probe. The magnetic field probe detects the microstrip line of a preset width to obtain a detection signal. The magnetic field strength generated by the microstrip line is determined based on the detection signal, and this magnetic field strength is calibrated according to a preset mapping relationship to obtain the calibrated magnetic field strength.

[0131] For example, if the calculated magnetic field strength is 'a', and the preset mapping relationship is that magnetic field strength 'a' corresponds to magnetic field strength 'b', then the actual magnetic field strength detected by the magnetic field probe can be determined to be 'b', thus achieving the calibration of the detection results.

[0132] In the above embodiments, the magnetic field probe detects a microstrip line of a preset width to obtain a detection signal; based on the detection signal and a preset mapping relationship, the magnetic field probe is calibrated. This embodiment of the application improves the detection accuracy of the magnetic field probe through calibration.

[0133] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0134] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0135] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0136] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A magnetic field probe, characterized by The magnetic field probe includes a first port, a second port, and a third port; a first detection loop is formed between the first port and the second port and between the third port and the grounding terminal; a second detection loop is formed between the first port and the third port and between the second port and the grounding terminal; the first detection loop and the second detection loop are orthogonal. The first port is used to output the first voltage induced in the detection area by the first detection circuit and the second detection circuit; The second port is used to output the second voltage induced in the detection area by the first detection circuit and the second detection circuit; The third port is used to output the third voltage induced by the first detection circuit and the second detection circuit in the detection area; The first voltage, the second voltage, and the third voltage are used to determine the magnetic field strength in the x-direction and the magnetic field strength in the y-direction of the detection region.

2. The magnetic field probe of claim 1, wherein, The magnetic field probe also includes a first coil, a second coil, a third coil, and a fourth coil; The first coil is connected to the first port and the second coil respectively, and the second coil is also connected to the second port to form the first detection circuit; The third coil is connected to the third port and the fourth coil respectively, and the fourth coil is grounded to form the first detection circuit; The first coil is also connected to the third coil to form the second detection circuit; The second coil is also connected to the fourth coil to form the second detection circuit.

3. The magnetic field probe of claim 2, wherein, The magnetic field probe also includes a first signal line, a second signal line, a third signal line, a fourth signal line, a fifth signal line, and a first coaxial connector; The first port and the first coil are connected via the first signal line; The first coil and the second coil are connected via the second signal line; The second coil and the second port are connected via the third signal line; The third port and the third coil are connected via the fourth signal line; The third coil and the fourth coil are connected via the fifth signal line; The second coil and the fourth coil are connected via the first coaxial connector.

4. The magnetic field probe of claim 3, wherein, The magnetic field probe also includes a first circuit board, which includes a first body and a first extension that can extend into the detection area. Both the first port and the second port are disposed on the first body, both the first coil and the second coil are disposed on the first extension, the first signal line extends from the first port to the first coil, the second signal line extends from the first coil to the second coil, and the third signal line extends from the second port to the second coil.

5. The magnetic field probe of claim 4, wherein, The magnetic field probe also includes a second circuit board, which includes a second body and a second extension that can extend into the detection area. The third port is disposed on the second main body, the third coil and the fourth coil are both disposed on the second extension, the fourth signal line extends from the third port to the third coil, and the fifth signal line extends from the third coil to the fourth coil.

6. The magnetic field probe of claim 5, wherein, The magnetic field probe also includes two third circuit boards; The first circuit board and the second circuit board are disposed between the two third circuit boards, and the third circuit board is spaced apart from the first circuit board or the second circuit board by a preset distance; Both of the aforementioned third circuit boards are grounded.

7. The magnetic field probe of claim 6, wherein, The magnetic field probe also includes a second coaxial connector and multiple third coaxial connectors; The fourth coil is connected to the third circuit board via the second coaxial connector; The inner cores of the plurality of third coaxial connectors are connected to the first signal line, the third signal line, or the fourth signal line, and the outer cores are respectively connected to the two third circuit boards.

8. A magnetic field detection method, characterized by, Applied to the magnetic field probe as described in any one of claims 1-7, the method comprises: Obtain the first voltage output from the first port of the magnetic field probe; Obtain the second voltage output from the second port of the magnetic field probe; Obtain the third voltage output from the third port of the magnetic field probe; The magnetic field strength in the x-direction and the magnetic field strength in the y-direction are determined based on the first voltage, the second voltage, and the third voltage.

9. The method of claim 8, wherein, The step of determining the magnetic field strength in the x-direction and the magnetic field strength in the y-direction based on the first voltage, the second voltage, and the third voltage includes: Obtain a voltage matrix, which is used to characterize the relationship between the first voltage and the induced voltage in the x-direction and the induced voltage in the y-direction, the relationship between the second voltage and the induced voltage in the x-direction and the induced voltage in the y-direction, and the relationship between the third voltage and the induced voltage in the x-direction and the induced voltage in the y-direction. Based on the voltage matrix, the first voltage, the second voltage, and the third voltage, determine the induced voltage in the x-direction and the induced voltage in the y-direction; The magnetic field strength in the x-direction is determined based on the induced voltage in the x-direction; The magnetic field strength in the y-direction is determined based on the induced voltage in the y-direction.

10. The method of claim 8, wherein, The method further includes: The electromagnetic field suppression ratio is determined based on the magnetic field strength in the x-direction and the magnetic field strength in the y-direction.

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