A test system, method and control device

Abstract

Embodiments of the present invention relate to a test system, method, and control device, including: a switching device, a PXI measurement and control device, and a test switching cable; the switching device includes: a power module, a unit circuit board, and a plurality of connectors and test modules are provided on the unit circuit board; the PXI measurement and control device includes: a controller module, a plurality of modules under test, and a multiplexer; each module under test is connected to a corresponding connector via a test switching cable; the multiplexer is connected to the plurality of connectors and is used to control the on / off state of each connector and the corresponding module under test; the controller module is connected to the power module and is used to control the power module to output a target signal, so as to control the test module to test the module under test through the target signal. This enables parallel testing of the PXI measurement and control device and free selection of test items, enabling automatic testing of a single item, automatic switching of multiple items, and continuous testing, thereby improving test efficiency and test diversity.

Description

Technical Field

[0001] The embodiments of the present invention relate to the field of automated testing technology, and in particular to a testing system, method, and control device. Background Art

[0002] With the development of electronic equipment, the current testing methods of PXI measurement and control equipment are still immature.

[0003] It is often necessary to manually build a platform to test PXI measurement and control equipment one by one, and it is impossible to switch between multiple devices during testing. Therefore, the existing testing methods have major flaws in terms of safety and reliability, and testing one by one takes a lot of time and is inefficient.

[0004] Therefore, how to improve the testing efficiency of PIX measurement and control equipment has become an urgent problem to be solved. Summary of the Invention

[0005] In view of this, in order to solve the above technical problems or part of the technical problems, the embodiments of the present invention provide a testing system, method and control device.

[0006] In a first aspect, an embodiment of the present invention provides a test system, comprising: a switching device, a PXI0 measurement and control device, and a test switching cable;

[0007] The switching device includes: a power supply module, a unit circuit board, and the unit circuit board is provided with a plurality of connectors and a test module;

[0008] The PXI measurement and control equipment includes: a controller module, a plurality of modules under test and a multiplexer;

[0009] Each of the modules under test is connected to the corresponding connector via the test adapter cable; 5 the multiplexer is connected to the plurality of connectors for controlling each of the connectors and

[0010] The on / off status of the corresponding module under test;

[0011] The controller module is connected to the power module and is used to control the power module to output a target signal, so as to control the test module to test the module under test through the target signal.

[0012] In one possible implementation, the test module includes: a self-test unit;

[0013] The self-test unit is used to complete the self-test function of the serial communication board and the 1553 communication board, and to complete the data sending test and the data receiving test between channels.

[0014] In a possible implementation, the test module further includes: an AD acquisition unit, a switch conversion unit, and a pulse generation unit;

[0015] The switch conversion unit is used to divide the target signal into a first target signal and a second target signal, convert the first target signal into a digital signal and send it to the AD acquisition unit, and send the second target signal to the pulse generation unit;

[0016] The AD acquisition unit is used to collect data from the AD module in the module under test based on the digital signal;

[0017] The pulse generating unit is configured to control the timing measurement module in the module under test to test the module under test based on the second target signal.

[0018] In a possible implementation, the controller module is connected to each of the modules under test via a backplane bus of the PXI measurement and control device, and receives test data generated by each of the modules under test.

[0019] In one possible implementation, the controller module is connected to the multiplexer via a backplane bus of the PXI measurement and control device;

[0020] sending a control signal to the multiplexer via the backplane bus;

[0021] The multiplexer controls the connection and disconnection of each connector and the corresponding module under test according to the control signal.

[0022] In a possible implementation, the controller module is connected to the power module via an RS232 interface, and controls the power module to output an excitation source signal as the target signal via RS232 communication.

[0023] In a second aspect, an embodiment of the present invention provides a testing method, including:

[0024] The controller module in the PXI measurement and control device sends the target signal to the test module in the switching device;

[0025] Controlling the test module based on the target signal to test multiple modules under test in the PXI measurement and control device;

[0026] The controller module receives the test results returned by the plurality of tested modules.

[0027] In one possible implementation, the method further includes:

[0028] The controller module sends a control signal to the multiplexer in the PXI measurement and control device;

[0029] Controlling the multiplexer to adjust the on and off of the plurality of modules under test through the control signal;

[0030] Controlling the test module to test the module under test;

[0031] Receive the test result returned by the module under test.

[0032] In one possible implementation, the method further includes:

[0033] The self-test unit in the test module is controlled to complete the data transmission test and data reception test between the channels of the PXI measurement and control device and the switching device.

[0034] In a third aspect, an embodiment of the present invention provides a control device, comprising: a processor and a memory, wherein the processor is configured to execute a test program stored in the memory to implement the test method described in any one of the second aspects above.

[0035] The test system provided by the embodiment of the present invention includes: a switching device, a PXI measurement and control device and a test switching cable; the switching device includes: a power module, a unit circuit board, and the unit circuit board is provided with multiple connectors and test modules; the PXI measurement and control device includes: a controller module, multiple modules under test and a multiplexer; each module under test is connected to a corresponding connector via the test switching cable; the multiplexer is connected to the multiple connectors and is used to control the on and off of each connector and the corresponding module under test; the controller module is connected to the power module and is used to control the power module to output a target signal, so as to control the test module to test the module under test through the target signal. In this way, the free selection and matching combination of test items for parallel testing of the PXI measurement and control device can be achieved, which not only enables the automatic testing of a single test item, but also enables the automatic switching and continuous testing of multiple test items, thereby improving the test efficiency and test diversity. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 This is a schematic structural diagram of a test system according to an embodiment of the present invention;

[0037] Figure 2 A schematic diagram of the structure of a unit circuit board provided in an embodiment of the present invention;

[0038] Figure 3 A flow chart of a testing method provided in an embodiment of the present invention;

[0039] Figure 4 A schematic structural diagram of a control device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0040] To make the objectives, technical solutions, and advantages of the embodiments of the present invention more clear, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0041] To facilitate understanding of the embodiments of the present invention, specific embodiments will be further explained below with reference to the accompanying drawings. The embodiments do not limit the embodiments of the present invention.

[0042] Figure 1 FIG. 1 is a schematic diagram of a structure of a test system according to an embodiment of the present invention. Figure 1 As shown, the system specifically includes:

[0043] Transfer device 1, PXI measurement and control device 2 and test transfer cable 3;

[0044] The switching device includes: a power module 4, a unit circuit board 5, and a plurality of connectors 6 and a test module are provided on the unit circuit board;

[0045] The PXI measurement and control equipment includes: a controller module 7, a plurality of modules under test 8 and a multiplexer 9.

[0046] Each module under test is connected to a corresponding connector via a test adapter cable, and a multiplexer is connected to the multiple connectors. The multiplexer may include, but is not limited to, a multi-way switch for controlling the on / off between each connector and the corresponding module under test. Specifically, the multiplexer may control the on / off of the module under test to select the module under test to be tested.

[0047] The controller module is connected to the power module and is used to control the power module to output a target signal so as to control the test module to test the module under test through the target signal. The controller may be an embedded controller and the power module may be a programmable power supply.

[0048] Specifically, in this embodiment, the adapter device may be provided with multiple connectors for connecting to the modules under test, as well as multiple connectors for connecting to multiplexers. The multiplexers are connected to the connectors of the tooling modules on the adapter device, and are controlled by control signals sent by the controller module to control the multiplexers so as to control the on / off state of each connector connected to the modules under test. The multiplexers can be inserted into the PXI measurement and control device. The unit circuit board and power module are placed in a fixed area of the adapter device. The adapter device is connected to the various functional modules in the PXI measurement and control device via test adapter cables. The controller module exchanges data with the various modules under test via the backplane bus. The controller is connected to the multiplexer via the backplane bus. The controller is connected to the power module via an RS232 interface, controlling the power module to output an excitation source signal via RS232 to provide a measurement method, providing an excitation source for the interface response measurement channel, and implementing data communication with the adapter device, data acquisition, switch control, timing measurement, and other test contents. By replacing the unit circuit board and test adapter cables, comprehensive testing of different PXI measurement and control devices can be achieved.

[0049] Figure 2 A schematic diagram of a unit circuit board structure provided by an embodiment of the present invention is shown in FIG. Figure 2 Said unit circuit board comprises: a test module;

[0050] The test module can be a test module originally included in the PIX measurement and control equipment, installed in the adapter device. It is used to receive the target signal sent by the power module and test the module under test based on the target signal. The test module may include, but is not limited to: a self-test unit, an AD acquisition unit, a switch conversion unit, and a pulse generation unit. The self-test unit is used to perform the self-test function of the serial communication board and the 1553 communication board, as well as to perform data transmission and reception tests between channels. The switch conversion unit is used to divide the target signal into a first target signal and a second target signal, convert the first target signal into a digital signal and send it to the AD acquisition unit, and send the second target signal to the pulse generation unit; the AD acquisition unit is used to collect data from the AD module in the module under test based on the digital signal; and the pulse generation unit is used to control the timing measurement module in the module under test based on the second target signal to test the module under test.

[0051] Specifically, the self-test unit is mainly composed of differential circuits, which are used to complete the self-test function of the serial communication board and the 1553 communication board. The differential circuits are directly connected to each other through the mutual sending and receiving between channels to complete the sending data test and the receiving data test between channels.

[0052] The power module is remotely controlled via the RS232 protocol and can be programmed to output different voltage signals. The power module transmits the power signal as the target signal to the switching unit, which then splits the target signal into two target signals: a first target signal and a second target signal. The first target signal is first transmitted to the digital output module as its input signal. The digital output module then configures and converts the first target signal into a digital signal. The digital signal is then controlled by the switching unit, split, and sent to the AD acquisition unit. The AD acquisition unit then sends the digital signal to the AD module in the module under test for acquisition and interpretation. After conversion by the switching unit, the power module outputs a dynamic voltage signal as the second target signal, which is sent to the pulse generation unit. This pulse generation unit then inputs the timing measurement module of the module under test. The module then configures its state based on the voltage changes in the second target signal.

[0053] The test system provided by the present invention solves the problem of comprehensive testing of PXI measurement and control equipment, providing a compact, multifunctional, and portable automated test adapter. This device combines the module under test with other PXI modules to form an integrated system, allowing for joint testing of PXI measurement and control equipment. The system is controlled via a soft panel, and test data is monitored and saved in real time. This system enables parallel testing of PXI measurement and control equipment, reduces the use of testing resources such as cables, implements automatic channel switching among multiple modules, frees up human resources, and provides a relatively reliable and stable testing environment, significantly improving testing efficiency and shortening production cycles.

[0054] Figure 3 A flow chart of a testing method provided by an embodiment of the present invention is shown as follows: Figure 3 As shown, the method specifically includes:

[0055] S31. The controller module in the PXI measurement and control device sends a target signal to the test module in the switching device.

[0056] The test method provided in this embodiment is applied to the controller module in a PXI measurement and control device. This controller module is an embedded controller that connects to the module under test via the device's backplane bus and exchanges data. The control module controls the power module to output an excitation source signal via RS232. This output signal is then sent as the target signal to the test module in the adapter device, enabling data communication, data acquisition, switch control, and timing measurement with the adapter device. By replacing the unit circuit board and test adapter cables, comprehensive testing of different PXI measurement and control devices can be achieved.

[0057] S32. Control the test module based on the target signal to test multiple modules under test in the PXI measurement and control device; and receive test results returned by the multiple modules under test by the controller module.

[0058] In this embodiment, the controller module remotely controls the power module via the RS232 protocol, and the programmable control power module outputs different voltage signals as target signals. The target signal is divided into two paths through a switch conversion unit (multi-way switch). The first path is the first target signal, which provides an input signal for the digital output module. The digital output module configures the input first target signal and converts it into a digital signal and returns it to the switch conversion unit. The digital signal is controlled by the switch conversion unit and then divided into two paths and enters the AD acquisition unit. The AD acquisition unit mainly outputs a voltage signal or a current signal through a signal source, and the AD module is collected and interpreted by the AD acquisition unit. On the other hand, after the power module is configured by the switch conversion unit, it outputs a dynamic voltage signal as the second target signal, which is input to the timing measurement module. The module configures the state according to the change in voltage.

[0059] In one possible implementation, the controller module sends a control signal to a multiplexer in the PXI measurement and control device; controls the multiplexer through the control signal to adjust the on and off of multiple modules under test; controls the test module to test the modules under test; and receives the test results returned by the modules under test.

[0060] Specifically, the module under test is set in the PXI measurement and control equipment, and the adapter device is provided with multiple groups of connectors for connecting to the objects under test and multiple connectors for connecting to the multiplexers; the multiplexer is connected to the connector of the tooling module on the adapter device, and the multiplexer is inserted into the PXI measurement and control equipment. The unit circuit board and the power supply module are placed in the fixed area of the adapter device. The adapter device is connected to each module in the PXI measurement and control equipment through the test adapter cable. The controller module exchanges data with each module through the backplane bus, controls the output excitation source signal of the programmable power supply through RS232 to provide a measurement means, and provides an excitation source for the interface response measurement channel. The controller module generates a control signal according to the module under test that needs to be tested, and controls the on and off of the connector connected to the module under test according to the control signal to realize the test of the module under test. The controller module receives the test results of the module under test and stores and analyzes them.

[0061] In one possible implementation, a self-test unit in the control and test module performs data transmission and reception testing between channels of the PXI measurement and control device and the adapter. The self-test unit primarily utilizes differential circuitry to perform self-test functions for serial communication boards and 1553 communication boards. This circuitry directly connects the channels for transmission and reception, enabling testing of data transmission and reception between channels.

[0062] The testing method provided by an embodiment of the present invention uses a controller module in a PXI measurement and control device to send a target signal to a test module in a switching device. Based on the target signal, the test module is controlled to test multiple modules under test in the PXI measurement and control device. The controller module receives test results returned by the multiple modules under test, thereby resolving the inconvenience of testing each individual board during the test process. Manual data recording is eliminated during the test process, reducing the impact of human factors, and test records can be automatically generated.

[0063] Figure 4 A schematic diagram of the structure of a control device provided by an embodiment of the present invention is provided. Figure 4 The control device 400 shown includes: at least one processor 401, a memory 402, at least one network interface 404 and another user interface 403. The various components in the control device 400 are coupled together via a bus system 405. It is understood that the bus system 405 is used to achieve connection and communication between these components. In addition to including a data bus, the bus system 405 also includes a power bus, a control bus, and a status signal bus. However, for the sake of clarity, the bus system 405 is not shown in FIG. Figure 4 Various buses are labeled as bus system 405 .

[0064] The user interface 403 may include a display, a keyboard, or a pointing device (eg, a mouse, a trackball, a touchpad, or a touch screen).

[0065] It is understood that the memory 402 in the embodiment of the present invention can be a volatile memory or a non-volatile memory, or can include both volatile and non-volatile memories. Among them, the non-volatile memory can be a read-only memory (ROM), a programmable read-only memory (PROM), an erasable programmable read-only memory (EPROM), an electrically erasable programmable read-only memory (EEPROM), or a flash memory. The volatile memory can be a random access memory (RAM), which is used as an external cache. By way of example and not limitation, many forms of RAM are available, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate synchronous DRAM (DDRSDRAM), enhanced synchronous DRAM (ESDRAM), synchronous link DRAM (SLDRAM), and direct RAM bus random access memory (DRRAM). The memory 402 described herein is intended to include, but is not limited to, these and any other suitable types of memory.

[0066] In some embodiments, the memory 402 stores the following elements, executable units or data structures, or a subset thereof, or an extended set thereof: an operating system 4021 and application programs 4022 .

[0067] The operating system 4021 includes various system programs, such as a framework layer, a core library layer, and a driver layer, for implementing various basic services and handling hardware-based tasks. Application programs 4022 include various application programs, such as a media player and a browser, for implementing various application services. Programs implementing the methods of the embodiments of the present invention may be included in application programs 4022.

[0068] In an embodiment of the present invention, by calling a program or instruction stored in the memory 402, specifically, a program or instruction stored in the application 4022, the processor 401 is configured to execute the method steps provided in each method embodiment, for example, including:

[0069] The controller module in the PXI measurement and control device sends the target signal to the test module in the switching device;

[0070] Controlling the test module based on the target signal to test multiple modules under test in the PXI measurement and control device;

[0071] The controller module receives the test results returned by the plurality of tested modules.

[0072] In one possible implementation, the method further includes:

[0073] The controller module sends a control signal to the multiplexer in the PXI measurement and control device;

[0074] Controlling the multiplexer to adjust the on and off of the plurality of modules under test through the control signal;

[0075] Controlling the test module to test the module under test;

[0076] Receive the test result returned by the module under test.

[0077] In one possible implementation, the method further includes:

[0078] The self-test unit in the test module is controlled to complete the data transmission test and data reception test between the channels of the PXI measurement and control device and the switching device.

[0079] The methods disclosed in the above embodiments of the present invention can be applied to or implemented by processor 401. Processor 401 may be an integrated circuit chip with signal processing capabilities. During implementation, each step of the above method can be completed by hardware integrated logic circuits in processor 401 or by software instructions. The above processor 401 may be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. The methods, steps, and logic block diagrams disclosed in the embodiments of the present invention can be implemented or executed. The general-purpose processor may be a microprocessor or any conventional processor. The steps of the methods disclosed in conjunction with the embodiments of the present invention can be directly implemented and executed by a hardware decoding processor, or by a combination of hardware and software units in the decoding processor. The software units can be located in storage media well-known in the art, such as random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, etc. The storage medium is located in the memory 402 , and the processor 401 reads the information in the memory 402 and completes the steps of the above method in combination with its hardware.

[0080] It is understood that the embodiments described herein may be implemented using hardware, software, firmware, middleware, microcode, or a combination thereof. For hardware implementation, the processing unit may be implemented in one or more application-specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field-programmable gate arrays (FPGAs), general-purpose processors, controllers, microcontrollers, microprocessors, other electronic units for performing the functions described herein, or a combination thereof.

[0081] For software implementation, the technology described herein can be implemented by a unit that performs the functions described herein. The software code can be stored in a memory and executed by a processor. The memory can be implemented in the processor or outside the processor.

[0082] The control device provided in this embodiment may be Figure 4 The control device shown in FIG. 1 may execute the following Figure 3 All steps of the test method in order to achieve Figure 3 For technical effects of the test method shown, please refer to Figure 3 For the sake of brevity, the relevant description will not be repeated here.

[0083] An embodiment of the present invention further provides a storage medium (computer-readable storage medium). The storage medium stores one or more programs. The storage medium may include volatile memory, such as random access memory; the memory may also include non-volatile memory, such as read-only memory, flash memory, hard disk, or solid-state drive; and the memory may also include a combination of the aforementioned types of memory.

[0084] When one or more programs in the storage medium can be executed by one or more processors, the above-mentioned test method executed on the control device side is implemented.

[0085] The processor is configured to execute a test program stored in the memory to implement the following steps of the test method executed on the control device side:

[0086] The controller module in the PXI measurement and control device sends the target signal to the test module in the switching device;

[0087] Controlling the test module based on the target signal to test multiple modules under test in the PXI measurement and control device;

[0088] The controller module receives the test results returned by the plurality of tested modules.

[0089] In one possible implementation, the method further includes:

[0090] The controller module sends a control signal to the multiplexer in the PXI measurement and control device;

[0091] Controlling the multiplexer to adjust the on and off of the plurality of modules under test through the control signal;

[0092] Controlling the test module to test the module under test;

[0093] Receive the test result returned by the module under test.

[0094] In one possible implementation, the method further includes:

[0095] The self-test unit in the test module is controlled to complete the data transmission test and data reception test between the channels of the PXI measurement and control device and the switching device.

[0096] Professionals should also be further aware that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0097] The steps of the methods or algorithms described in conjunction with the embodiments disclosed herein may be implemented using hardware, a software module executed by a processor, or a combination of the two. The software module may be placed in a random access memory (RAM), a memory, a read-only memory (ROM), an electrically programmable ROM, an electrically erasable programmable ROM, a register, a hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.

[0098] The specific implementation methods described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific implementation method of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A testing system, characterized in that: include: Switching equipment, PXI measurement and control equipment, and test switching cables; The switching device includes: a power supply module, a unit circuit board, and the unit circuit board is provided with a plurality of connectors and a test module; The PXI measurement and control equipment includes: a controller module, a plurality of modules under test and a multiplexer; Each of the modules under test is connected to the corresponding connector via the test adapter cable; The multiplexer is connected to the plurality of connectors and is used to control the connection between each connector and the corresponding module under test; The controller module is connected to the power module and is used to control the power module to output a target signal, so as to control the test module to test the module under test through the target signal; The test module also includes: an AD acquisition unit, a switch conversion unit, and a pulse generation unit; The switch conversion unit is used to divide the target signal into a first target signal and a second target signal, convert the first target signal into a digital signal and send it to the AD acquisition unit, and send the second target signal to the pulse generation unit; The AD acquisition unit is used to collect data from the AD module in the module under test based on the digital signal; The pulse generating unit is configured to control the timing measurement module in the module under test to test the module under test based on the second target signal.

2. The system according to claim 1, wherein: The test module includes: a self-test unit; The self-test unit is used to complete the self-test function of the serial communication board and the 1553 communication board, and to complete the data sending test and the data receiving test between channels.

3. The system according to claim 1, wherein: The controller module is connected to each of the modules under test via the backplane bus of the PXI measurement and control device, and receives test data generated by each of the modules under test.

4. The system according to claim 1, wherein: The controller module is connected to the multiplexer via the backplane bus of the PXI measurement and control device; sending a control signal to the multiplexer via the backplane bus; The multiplexer controls the connection and disconnection of each connector and the corresponding module under test according to the control signal.

5. The system according to claim 1, wherein: The controller module is connected to the power module via an RS232 interface, and controls the power module to output an excitation source signal as the target signal via an RS232 communication method.

6. A testing method, characterized in that: Applied to the system of claim 1, the method comprises: The controller module in the PXI measurement and control device sends the target signal to the test module in the switching device; Controlling the test module based on the target signal to test multiple modules under test in the PXI measurement and control device; The controller module receives the test results returned by the plurality of tested modules.

7. The method according to claim 6, characterized in that The method further comprises: The controller module sends a control signal to the multiplexer in the PXI measurement and control device; Controlling the multiplexer to adjust the on and off of the plurality of modules under test through the control signal; Controlling the test module to test the module under test; Receive the test result returned by the module under test.

8. The method according to claim 7, characterized in that The method further comprises: The self-test unit in the test module is controlled to complete the data transmission test and data reception test between the channels of the PXI measurement and control device and the switching device.

9. A control device, characterized in that: include: A processor and a memory, wherein the processor is configured to execute a test program stored in the memory to implement the test method according to any one of claims 6 to 8.

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