Processing method and device of flicker pulse, equipment and storage medium

Abstract

The application discloses a scintillation pulse processing method, device, equipment and storage medium. The processing method comprises the following steps: presetting at least two dynamic threshold values, wherein the dynamic threshold value changes with time and has a function relationship positively correlated with time; synchronously and in parallel, comparing the scintillation pulse with the at least two dynamic threshold values, determining at least two jump values corresponding to the at least two dynamic threshold values when the scintillation pulse crosses the dynamic threshold value; based on the at least two jump values, determining at least two jump times corresponding to the at least two jump values by using the function relationship, so as to form a threshold-time pair; and based on the threshold-time pair, determining a target curve representing a pulse waveform of the scintillation pulse. The application can use the dynamic threshold value to perform multi-threshold sampling on the scintillation pulse, the threshold value size can be adjusted according to different pulses, and the curve fitted by the obtained sampling data can better represent the pulse shape of the scintillation pulse.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of data processing, and in particular to a method and device for processing a scintillation pulse, and a storage medium. BACKGROUND

[0002] The multi-voltage threshold (MVT) method is a promising method for digitalizing a scintillation pulse. By digitizing the time when the scintillation pulse crosses a set threshold, a series of threshold-time pair sampling data is obtained. However, the working state of a device (e.g., a component for time digitization sampling) for digitalizing the scintillation pulse changes at different ambient working temperatures, resulting in a deviation in the measured time. Meanwhile, the threshold set by the traditional multi-voltage threshold method is a fixed threshold, which cannot be changed during the entire sampling process. When the amplitude of the scintillation pulse to be measured is much larger than the maximum value of the set threshold, the curve obtained by fitting the sampling data cannot well represent the pulse waveform of the scintillation pulse to be measured. SUMMARY

[0003] The technical problem to be solved by the embodiments of the present application is how to accurately and flexibly sample a scintillation pulse.

[0004] To solve the above problems, the present application discloses a method and device for processing a scintillation pulse, and a storage medium.

[0005] According to a first aspect of the present application, a method for processing a scintillation pulse is provided. The method comprises: presetting at least two dynamic thresholds, wherein the dynamic thresholds vary with time and have a function relationship positively related to time; synchronously and in parallel comparing the scintillation pulse with the at least two dynamic thresholds to determine at least two jump values corresponding to the at least two dynamic thresholds when the scintillation pulse crosses the dynamic thresholds; based on the at least two jump values, determining at least two jump times corresponding to the at least two jump values by using the function relationship to form a threshold-time pair; and determining a target curve representing a pulse waveform of the scintillation pulse based on the threshold-time pair.

[0006] According to some embodiments of the present application, the dynamic thresholds are linearly related to time, and the proportional coefficients of the at least two dynamic thresholds with respect to time are not the same.

[0007] According to some embodiments of the present application, the scintillation pulse includes a rising edge with an amplitude continuously increasing over time and a falling edge continuously connected to the rising edge and having an amplitude continuously decreasing over time, and the scintillation pulse crossing the dynamic thresholds at least includes the falling edge crossing the dynamic thresholds from top to bottom.

[0008] According to some embodiments of the present application, the processing method further comprises: presetting a trigger threshold; comparing the flicker pulse with the trigger threshold to determine a trigger time when the rising edge of the flicker pulse crosses the trigger threshold; and specifying the trigger time as zero time to construct the functional relationship.

[0009] According to some embodiments of the present application, the synchronously parallel comparison of the flicker pulse with the at least two dynamic thresholds comprises: comparing the flicker pulse with the dynamic thresholds in size respectively by at least two comparators arranged in parallel, each of the comparators working independently of each other.

[0010] According to some embodiments of the present application, the at least two dynamic thresholds are set by at least two digital-to-analog converters, the digital-to-analog converters being controlled by preset programs to output dynamic thresholds conforming to the functional relationship and input into the comparators, each of the digital-to-analog converters working independently of each other.

[0011] According to some embodiments of the present application, at least two threshold acquisition units correspond to the at least two digital-to-analog converters respectively, the threshold acquisition units acquiring the jump values of the dynamic thresholds input into the comparators from the digital-to-analog converters when receiving the jump signals output by the comparators indicating that the flicker pulse crosses the dynamic thresholds.

[0012] According to some embodiments of the present application, the determination of the target curve representing the pulse waveform of the flicker pulse based on the threshold-time pairs comprises: obtaining a function model corresponding to the flicker pulse, the function model comprising one or more to-be-fitted parameters; fitting the function model based on the threshold-time pairs related to the at least two dynamic thresholds to determine the one or more to-be-fitted parameters to obtain an expression of the function model; and determining the target curve based on the expression.

[0013] According to some embodiments of the present application, the method further comprises: integrating the target curve to obtain energy information of the flicker pulse.

[0014] According to some embodiments of the present application, the method further comprises: determining a pulse type of the flicker pulse based on the target curve.

[0015] According to a second aspect of the present application, a processing device for a flickering pulse is provided. The device comprises a setting module, a comparing module, a converting module and a determining module. The setting module is configured to preset at least two dynamic thresholds, wherein the dynamic thresholds vary with time and have a function relationship positively correlated with time. The comparing module is configured to synchronously and in parallel compare the flickering pulse with the at least two dynamic thresholds, and determine at least two jump values corresponding to the at least two dynamic thresholds when the flickering pulse crosses the dynamic thresholds. The converting module is configured to determine at least two jump times corresponding to the at least two jump values based on the at least two jump values and the function relationship, so as to form a threshold-time pair. The determining module is configured to determine a target curve representing a pulse waveform of the flickering pulse based on the threshold-time pair.

[0016] According to some embodiments of the present application, the dynamic thresholds are linearly related to time, and the at least two dynamic thresholds have different proportional coefficients with respect to time.

[0017] According to some embodiments of the present application, the flickering pulse comprises a rising edge with an amplitude continuously increasing over time and a falling edge continuously following the rising edge and having an amplitude continuously decreasing over time, and the flickering pulse crossing the dynamic thresholds comprises at least the falling edge crossing the dynamic thresholds from top to bottom.

[0018] According to some embodiments of the present application, the setting module is further configured to preset a trigger threshold, compare the flickering pulse with the trigger threshold, and determine a trigger time when a rising edge of the flickering pulse crosses the trigger threshold, and designate the trigger time as a zero time to construct the function relationship.

[0019] According to some embodiments of the present application, for synchronously and in parallel comparing the flickering pulse with the at least two dynamic thresholds, the comparing module is configured to compare the flickering pulse with the dynamic thresholds in size through at least two comparators arranged in parallel, and each of the comparators works independently of each other.

[0020] According to some embodiments of the present application, the setting module comprises at least two digital-to-analog converters for setting the at least two dynamic thresholds, the digital-to-analog converters are controlled by a preset program to output the dynamic thresholds conforming to the function relationship and input into the comparators, and each of the digital-to-analog converters works independently of each other.

[0021] According to some embodiments of the present application, the comparing module comprises at least two threshold acquisition units corresponding to the at least two digital-to-analog converters respectively, and the threshold acquisition units acquire the jump values of the dynamic thresholds from the digital-to-analog converters for input into the comparators when receiving a jump signal output by the comparators and indicating that the flickering pulse crosses the dynamic thresholds.

[0022] According to some embodiments of the present application, the determining module is configured to: obtain a function model corresponding to the scintillation pulse, the function model comprising one or more fitting parameters; fit the function model based on the at least two dynamic threshold-related threshold-time pairs to determine the one or more fitting parameters to obtain an expression of the function model; and determine the target curve based on the expression.

[0023] According to some embodiments of the present application, the apparatus further comprises an obtaining module configured to integrate the target curve to obtain energy information of the scintillation pulse.

[0024] According to some embodiments of the present application, the apparatus further comprises a discriminating module configured to determine a pulse type of the scintillation pulse based on the target curve.

[0025] According to a third aspect of the present application, there is provided a scintillation pulse processing apparatus. The apparatus comprises a scintillation pulse processing circuit board configured to perform a multi-threshold sampling operation on the scintillation pulse and implement the scintillation pulse processing method as described above.

[0026] According to a fourth aspect of the present application, there is provided a processing device. The processing device comprises the scintillation pulse processing apparatus as described above.

[0027] According to a fifth aspect of the present application, there is provided a processing device. The processing device comprises a memory, a processor, and a computer program stored in the memory and executable on the processor, the computer program, when executed by the processor, implements the steps of the method as described above.

[0028] According to a sixth aspect of the present application, there is provided a computer readable storage medium. The storage medium stores a computer program, the computer program, when executed by a processor, implements the steps of the method as described above.

[0029] The scintillation pulse processing method disclosed in the present application can use a dynamic threshold to perform a multi-threshold sampling on a scintillation pulse, the threshold size can be adjusted according to different pulses, and the curve obtained by fitting the sampling data can better represent the pulse shape of the scintillation pulse. BRIEF DESCRIPTION OF DRAWINGS

[0030] The present application will be further described in the form of exemplary embodiments, which will be described in detail with reference to the accompanying drawings. These embodiments are not limiting, and in these embodiments, the same reference numbers represent the same structures, wherein:

[0031] Figure 1 is an exemplary flowchart of a method of processing a flicker pulse according to some embodiments of the present application;

[0032] Figure 2 is an exemplary flowchart of a method of determining a target curve according to some embodiments of the present application;

[0033] Figure 3 is an exemplary schematic diagram of a pulse waveform of a flicker pulse according to some embodiments of the present application;

[0034] Figure 4 is an exemplary schematic diagram of threshold setting of a flicker pulse according to some embodiments of the present application;

[0035] Figure 5 is an exemplary module diagram of a data processing system for flicker pulse processing according to some embodiments of the present application;

[0036] Figure 6 is an exemplary functional block diagram of a data processing system for flicker pulse processing according to some embodiments of the present application;

[0037] Figure 7 is another exemplary functional block diagram of a data processing system for flicker pulse processing according to some embodiments of the present application. DETAILED DESCRIPTION

[0038] In order to make the above objectives, features and advantages of the present application more clear and comprehensible, specific embodiments of the present application will be described below in detail with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. It will be apparent, however, to one skilled in the art that the present application can be practiced without some or all of these specific details. In other instances, well known process operations have not been described in detail in order to not unnecessarily obscure the present application.

[0039] It is to be understood that when an element is referred to as being "on" another element, it can be directly on the other element or intervening elements can also be present. In addition, it will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements can also be present. As used herein the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0040] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application pertains. The terms used herein in the specification of this application are for the purpose of describing specific embodiments only and are not intended to limit this application. The terms "and / or" or "and / or" as used herein include any and all combinations of one or more of the associated listed items.

[0041] Some preferred embodiments of the present application are described below with reference to the accompanying drawings. It should be noted that the following description is for illustrative purposes only and is not intended to limit the scope of protection of the present application.

[0042] Figure 1 1 is an exemplary flow chart of a method for processing scintillation pulses according to some embodiments of the present application. In some embodiments, the method 100 for processing scintillation pulses can be executed by the data processing system 500. For example, the method 100 for processing scintillation pulses can be stored in a storage device (such as a built-in storage unit of the data processing system 500 or an external storage device) in the form of a program or instruction. When the program or instruction is executed, the method 100 for processing scintillation pulses can be implemented. Figure 1 As shown, the scintillation pulse processing method 100 may include the following steps.

[0043] Step 110: Preset at least two dynamic thresholds that satisfy different functional relationships.

[0044] In some embodiments, the at least two dynamic thresholds satisfying different functional relationships can be used for comparison with the amplitude of the scintillation pulse. The comparison results can be used for time sampling to determine the time points at which the amplitude of the scintillation pulse crosses the dynamic thresholds. These time points, after matching with the corresponding thresholds, can be used for waveform recovery during subsequent processing (e.g., image reconstruction). The recovered waveform can be used to determine the energy information of the scintillation pulse.

[0045] In some embodiments, the scintillation pulses can be obtained by a radiation detection device. The radiation detection device may include a scintillation detector. The scintillation detector may include a scintillation crystal and a photoelectric conversion device coupled to each other. The scintillation crystal (e.g., BGO, PWO, LYSO:Ce, GAGG:Ce, NaI:TI, CsI:TI, LaBr3:Ce, BaF2, etc.) is used to convert the detected high-energy rays (e.g., gamma rays, neutron rays, etc.) into a visible light signal, and the photoelectric conversion device (e.g., a photomultiplier tube PMT, a silicon photomultiplier tube SiPM, etc.) is used to convert the visible light signal into an electrical signal, which is output in the form of a scintillation pulse through an electronic device connected to the photoelectric conversion device.

[0046] It is understandable that the scintillation pulse can have a variety of forms, including but not limited to electric pulse signals, acoustic pulse signals, thermal pulse signals or pressure wave signals. When the scintillation pulse is an electric pulse signal, its corresponding characteristics can be the voltage, current, and energy of the electric pulse signal. Therefore, the amplitude of the scintillation pulse can be voltage, current, and energy; when the pulse signal is an acoustic pulse signal, its corresponding characteristics can be the sound intensity of the acoustic pulse signal. Therefore, the amplitude of the scintillation pulse can be sound intensity. When the pulse signal is a pressure wave signal, its corresponding characteristics can be the pressure of the pressure wave signal. Therefore, the amplitude of the scintillation pulse can be pressure. And so on, no further details will be given here. In addition, the scintillation pulse signal in the present application can be expanded to a continuous signal. Usually, the continuous signal only needs to be regarded as a pulse signal arranged in a certain period, and the present application does not impose any specific restrictions.

[0047] Figure 3 FIG. 1 shows an exemplary schematic diagram of a pulse waveform of a scintillation pulse according to some embodiments of the present application. Figure 3 As shown, taking an electrical pulse as an example, the shape of the waveform used to characterize the scintillation pulse 300 includes a rising edge whose amplitude increases continuously over time and a falling edge that is continuous with the rising edge and whose amplitude decreases continuously over time. This shape can be described by a mathematical function. For example, a linear exponential function, an exponential function, a bi-exponential function, a triangular wave function, a sine wave function, a cosine wave function, etc. The amplitude of the scintillation pulse 300 at the starting moment can be a baseline value corresponding to the radiation source that generates high-energy rays. For example, if the scintillation pulse 300 is an electrical pulse signal, then this baseline value can also be called a baseline voltage. The amplitude of the scintillation pulse 300 can start to rise after the minimum value persists for a period of time. The rising moment can be considered as the time when the radiation detector captures the high-energy particles that generate the scintillation pulse 300, and can also be called the arrival time of the scintillation pulse 300, or the zero time.

[0048] In some embodiments, the dynamic threshold may be a threshold whose size changes over time. Exemplarily, the dynamic threshold may have a functional relationship that is positively correlated with time. As time passes, the dynamic threshold also gradually increases. In some embodiments, the dynamic threshold may be linearly correlated with time. This correlation may be represented by the functional relationship y=kx+b, that is, the transformation between the dynamic threshold and time may be represented by a functional relationship. Wherein, x represents time, y represents the size of the dynamic threshold, k represents the proportional coefficient between the dynamic threshold and time, and b represents a constant term. k is greater than zero, and the proportional coefficients between different dynamic thresholds and time are different. For example, the proportional coefficient may be set to achieve a relatively slow, intermediate, or faster change in the size of the dynamic threshold.

[0049] In some embodiments, the type of the at least two dynamic thresholds can be determined according to the manifestation of the scintillation pulse. As an example, the scintillation pulse can be an electrical pulse signal, an acoustic pulse signal, a thermal pulse signal, or a pressure wave signal, etc. The energy index for manifesting the scintillation pulse can be voltage, current, acoustic intensity, heat, pressure, etc. The dynamic threshold can then be a voltage threshold, a current threshold, an acoustic intensity threshold, a heat threshold, a pressure threshold, etc.

[0050] In some embodiments, the setting of the at least two dynamic thresholds can be based on the zero time. That is, the at least two dynamic thresholds can be linearly increased with time positively from the zero time. In order to determine the zero time, and in order to eliminate the interference of noise signals, a trigger threshold can be set. For example, a trigger threshold slightly higher than the maximum amplitude of the noise signal can be set. Taking the electrical pulse signal as an example, based on the analysis of the prior data, the maximum voltage of all noise signals appearing in the scintillation pulse detection process can be obtained. Then a trigger threshold higher than the maximum voltage by 20-30 mV can be set. For another example, a trigger threshold slightly higher than the baseline value can be set. Again taking the electrical pulse signal as an example, based on the waveform analysis of the scintillation pulse according to the prior information, the baseline value (i.e. baseline voltage) can be obtained. Then a trigger threshold higher than the baseline voltage by 50-60 mV can be set. It should be noted that 20-30 mV or 50-60 mV in the above examples are for illustration purposes only and are not specifically limited.

[0051] In some embodiments, after the trigger threshold is set, the trigger time when the rising edge of the scintillation pulse crosses the trigger threshold can be determined by comparing the scintillation pulse with the trigger threshold. For a threshold with a size within the maximum amplitude range of the scintillation pulse, the scintillation pulse can cross the threshold twice. In combination with the pulse waveform of the scintillation pulse, the first time can be when the rising edge of the scintillation pulse crosses the threshold from small to large, and the second time can be when the falling edge of the scintillation pulse crosses the threshold from large to small. The zero time is the arrival time of the scintillation pulse, and the amplitude of the scintillation pulse will increase after the zero time. In the time range of nanoseconds, the trigger time when the scintillation pulse crosses the trigger threshold slightly higher than the maximum amplitude of the noise signal or slightly higher than the baseline value can be designated as the zero time of the scintillation pulse.

[0052] In some embodiments, after the zero time is determined, a functional relationship between the dynamic threshold and time can be constructed with the zero time as the origin. Figure 4 is described. Figure 4 is an exemplary schematic diagram of the threshold setting of the scintillation pulse according to some embodiments of the present application. As shown in Figure 4 , taking the scintillation pulse as an electrical signal pulse for example, V crepresents the trigger threshold, t0represents the time at which the rising edge of the scintillation pulse crosses the trigger threshold V c , i.e. the zero time. With the zero time as the origin, the four dynamic thresholds can be represented as V i = k i t + V c , i = 1, 2, 3, 4. k i are all different. For example, Figure 4 , k1> k2> k3> k4. From t0= 0, the four dynamic thresholds are all equal to V c . As time increases, the four dynamic thresholds will increase.

[0053] It should be understood that when the dynamic thresholds are set, the scaling factors k i are larger, the rising edge of the scintillation pulse can repeatedly cross the dynamic thresholds, or can be below the dynamic thresholds. When the dynamic thresholds are set, the scaling factors k i are generally smaller, the falling edge of the scintillation pulse will cross these dynamic thresholds at a smaller amplitude. Therefore, in general, the skilled person can reasonably set the scaling factors of the dynamic thresholds according to limited experiments, so that the size of the threshold changes reasonably. In general, 2-4 dynamic thresholds are selected, the information collected is closer to the true state, which can accurately restore the pulse shape while reducing the number of channels, improving data processing efficiency, which will not be described here.

[0054] Step 120, synchronously and in parallel compare the scintillation pulse with the at least two dynamic thresholds, and determine at least two jump values corresponding to the at least two dynamic thresholds when the scintillation pulse crosses the dynamic thresholds.

[0055] The following will be described with reference to Figure 4 . Over time, the falling edge of the scintillation pulse first crosses the dynamic threshold V 1 from top to bottom, and the jump value obtained is V1. Subsequently, the falling edge of the scintillation pulse crosses the dynamic threshold V 2 from top to bottom, and the jump value obtained is V2. In turn, the falling edge of the scintillation pulse continues to cross the dynamic thresholds V 3 and V 4 from top to bottom, and the corresponding jump values are V3 and V4.

[0056] In some embodiments, the synchronization of the comparison of the scintillation pulse with the at least two dynamic thresholds can be based on at least two comparators arranged in parallel. The scintillation pulse can be synchronously input into the at least two comparators, respectively. The number of comparators can correspond to the number of the at least two dynamic thresholds, one dynamic threshold corresponding to one comparator. Meanwhile, the dynamic threshold can be input into the corresponding comparator for comparison with the amplitude of the scintillation pulse. The comparators work independently of each other without interference. For example, four comparators correspond to four dynamic thresholds and are arranged in parallel, the scintillation pulse is input into the corresponding comparators through the parallel structure, the dynamic threshold corresponding to each comparator is different, and the amplitude of the received scintillation pulse can be compared with the size of the corresponding dynamic threshold. After receiving the scintillation pulse, different comparators work synchronously and independently of each other without interference. In some embodiments, the at least two comparators can be implemented by a circuit including a low-voltage differential signaling (LVDS) comparator.

[0057] In some embodiments, the dynamic threshold can be set by a digital-to-time converter (DAC). Each dynamic threshold can be set by a digital-to-time converter and input into a comparator. That is, the number of digital-to-time converters can correspond to the number of the at least two dynamic thresholds, one dynamic threshold corresponding to one digital-to-time converter. The digital-to-time converters work independently of each other without interference. Each digital-to-time converter can be controlled by a preset program to output a dynamic threshold meeting the function relationship. In combination with the foregoing example, assuming that there are four digital-to-time converters, the four digital-to-time converters output dynamic thresholds according to V1, V2, V3, and V4, respectively, and the dynamic thresholds are input into four comparators arranged in parallel for comparison with the scintillation pulse. i i x+V c The dynamic outputs four different dynamic thresholds, and the four dynamic thresholds change according to the slopes of k1, k2, V3, and k4, and are input into four comparators arranged in parallel for comparison with the scintillation pulse, respectively. As an example, the scintillation pulse generated by the radiation detection device can be input into the positive input end of the LVDS comparator, and the dynamic threshold output by the DAC can be input into the negative input end of the LVDS comparator, to complete the circuit connection between the above three components.

[0058] ​In some embodiments, the at least two transition values ​​can be determined by at least two threshold value acquisition units. The at least two threshold value acquisition units can correspond to the at least two digital-to-analog converters, respectively. That is, one digital-to-analog converter can be connected to one threshold value acquisition unit. At the same time, the threshold value acquisition unit can also be connected to the comparator corresponding to the digital-to-analog converter. When the comparator compares the amplitude of the flicker pulse with the size of the dynamic threshold, it will output an output. For example, assuming that the amplitude of the flicker pulse is greater than the size of the dynamic threshold, it can output 1. Conversely, when the amplitude of the flicker pulse is less than the size of the dynamic threshold, it can output 0. When the output of the comparator changes from 1 to 0, it can be considered that the falling edge of the flicker pulse has crossed the dynamic threshold at that time from top to bottom. After receiving the signal output by the comparator, the threshold value acquisition unit can determine the size of the dynamic threshold output by the digital-to-analog converter, that is, the transition value of the dynamic threshold. When all the threshold value acquisition units have determined the size of their corresponding dynamic thresholds, step 120 can end.

[0059] It should be understood that in actual situations, the pulse waveform is not as Figure 4 The smoothness shown in the figure will be more volatile, which is actually Figure 4 The waveform shown fluctuates upward or downward within the upper and lower ranges. Figure 2 The smoothed waveform shown is for ease of illustration. Therefore, when performing threshold comparisons, the waveform may cross the dynamic threshold multiple times within a very short period of time. In this case, the average of the multiple crossings of the dynamic threshold within a certain time window or time period is used as the jump value of the dynamic threshold. This is easily implemented by those skilled in the art based on the teachings of this application and will not be further described here.

[0060] Step 130: Based on the at least two transition values, determine at least two transition times corresponding to the at least two transition values ​​using the functional relationship to form a threshold-time pair.

[0061] In some embodiments, the at least two jump values ​​can be substituted into the corresponding functional relationship for calculation to determine at least two jump times. For example, when the dynamic threshold value received by the comparator changes according to the functional relationship determined above, it will inevitably produce an intersection with the pulse amplitude, that is, a jump occurs. Assuming that the jump values ​​of the four dynamic thresholds are V1, V2, V3 and V4, when a jump occurs, the four DACs are respectively based on different V i =k i t+V c (i=1,2,3,4) is output. Since the four dynamic thresholds are determined by the four threshold acquisition units corresponding to the four DACs, then for V1, it can be substituted into V 1 =k1t+V cV1= V 1 The corresponding time t1 can be determined, which is the jump time corresponding to V1. For V2, V 2 = k2t + V c The corresponding jump time t2 can be determined. In this way, the jump time t3 corresponding to V3 and the jump time t4 corresponding to V4 can be obtained. The jump values of the dynamic thresholds and the corresponding jump times can constitute the threshold-time pairs of (V i , t i ).

[0062] At step 140, based on the threshold-time pairs, a target curve representing the pulse waveform of the scintillation pulse is determined.

[0063] As can be known from the foregoing description, the shape of the pulse waveform of the scintillation pulse is represented by a curve corresponding to a certain function model. Therefore, the pulse waveform of the scintillation pulse can be displayed by prior information of the scintillation pulse, for example, by digital oscilloscope sampling of the scintillation pulse. By comparing whether the pulse waveform of the scintillation pulse conforms to a certain function model, the function model conforming to the pulse waveform of the scintillation pulse is determined. For example, assuming that the pulse waveform of the scintillation pulse collected by the digital oscilloscope conforms to a double exponential function model, the function model can be determined as a double exponential function.

[0064] In some embodiments, the threshold-time pairs can be used to fit the function model of the scintillation pulse to determine one or more parameters included in the function model. The curve of the function model after the parameters are determined is the target curve. The shape of the target curve can be used to represent the pulse waveform of the scintillation pulse. For specific description of determining the pulse waveform of the scintillation pulse, reference can be made to the Figure 1 part of the present application.

[0065] The above steps can also be referred to as the sampling process (steps 110-130) and the waveform recovery process (step 140) of the scintillation pulse. By setting the threshold value and comparing the scintillation pulse with the threshold value to determine the time when the scintillation pulse crosses the threshold value, the threshold-time pairs are obtained. Compared with the traditional multi-threshold sampling method, the present application replaces the fixed threshold value with the dynamic threshold value, which can adjust the threshold value according to the maximum amplitude of the scintillation pulse, so that the curve fitted by the sampling data obtained by sampling is closer to the actual waveform of the scintillation pulse.

[0066] It should be noted that the above description of each step in the Figure 1 is only for example and illustration, and does not limit the scope of the present application. Those skilled in the art can make modifications to the Figure 2Various modifications and changes can be made as to the specific processing steps illustrated in the Figures. However, such modifications and changes are also within the scope of the present description.

[0067] The method for processing a scintillation pulse disclosed in the present application can make the sampling of the pulse more flexible by setting a variable threshold. The sampling points obtained by the sampling can represent the actual pulse waveform better than the sampling points obtained by the fixed threshold fitting curve. In addition, the sampling of the scintillation pulse is mainly concentrated on the falling edge of the pulse, and the falling edges of the scintillation pulses caused by different high-energy particles are obviously different. The present application can be applied to the discrimination of the scintillation pulses caused by different high-energy particles.

[0068] Figure 2 is an exemplary flowchart of a method for determining a pulse waveform of a scintillation pulse according to some embodiments of the present application. In some embodiments, the method for determining a pulse waveform of a scintillation pulse 200 can be performed by the determining module 540 of the data processing system 500. As shown in Figure 2 The method for determining a pulse waveform of a scintillation pulse 200 can include the following steps.

[0069] At step 210, a function model corresponding to the scintillation pulse is obtained.

[0070] In some embodiments, the pulse waveform of the scintillation pulse can be characterized by a function model. The function model can be one or a combination of a linear function model, an exponential function model, a double exponential function model, a triangular wave function model, a sine wave function model, a cosine wave function model, etc. For example, the pulse waveform of the scintillation pulse can be represented by an exponential function, such as a Gaussian function model. For another example, the rising edge of the pulse waveform of the scintillation pulse can be represented by a linear function model, and the falling edge can be represented by an exponential function.

[0071] In some embodiments, the scintillation pulse can be sampled by a digital oscilloscope to display the waveform of the scintillation pulse. By comparing whether the waveform of the scintillation pulse displayed by the digital oscilloscope matches the shape of the curve presented by each function model, the function model that can characterize the pulse waveform of the scintillation pulse can be determined. For example, by comparing whether the pulse waveform of the scintillation pulse conforms to the characteristics of the curve presented by the function model. For example, the Gaussian function model is a symmetrical curve, and if the waveform of the scintillation pulse displayed by the digital oscilloscope is also symmetrical, it can be considered that the function model of the scintillation pulse is the Gaussian function model. Exemplarily, the function model can be as follows:

[0072]

[0073] where y(t) represents the amplitude of the pulse waveform, t represents time, t0=0, a, b1, and b2 are the to-be-fitted parameters of the function model. When the to-be-fitted parameters are determined, the expression of the function model can also be determined, and the shape of the presented curve can be used to characterize the pulse shape of the scintillation pulse.

[0074] In step 220, the function model is fitted based on the at least two threshold-time pairs related to the dynamic threshold, and the one or more to-be-fitted parameters are determined to obtain the expression of the function model.

[0075] In some embodiments, the solving of the function model (i.e., the determination of the one or more to-be-fitted parameters) can be implemented by using a curve fitting operation. For example, the curve fitting operation can be implemented based on a least square method, an interpolation method, or a polishing method. For example, an existing calculation algorithm / software can be called to implement the curve fitting operation based on multiple data pairs. The data pairs are the at least two threshold-time pairs related to the dynamic threshold (V i ,t i ). By inputting the multiple data pairs into the calculation algorithm / software, the expression of the function model can be directly obtained. For example, the values of a, b1, and b2 are determined, and then the expression of the function model is determined.

[0076] In step 230, the target curve is determined based on the expression.

[0077] It can be understood that a function model determined by one parameter can represent a definite curve. The shape of the curve can be used to characterize the pulse waveform of the scintillation pulse.

[0078] In some embodiments, after the target curve characterizing the pulse waveform of the scintillation pulse is determined, the target curve can be integrated to obtain energy information of the scintillation pulse. The obtained energy information can be used for image reconstruction (e.g., PET image reconstruction) or substance confirmation (e.g., confirmation of element composition of a geological layer in geological exploration).

[0079] In some embodiments, the target curve can also be used to determine the pulse type of the scintillation pulse. It can be known that scintillation pulses are generated by high energy particles, such as alpha particles / rays, beta particles / rays, gamma photons / rays, neutrons, mesons, neutrinos, protons, etc. The pulse shape of the generated pulse signal is also different. For example, the pulse shape of the pulse signal generated by gamma photons is different from the pulse shape of the pulse signal generated by neutrons in the falling edge part. The falling rate of the pulse shape of the pulse signal generated by gamma photons is faster. Therefore, the curve characterizing the pulse shape of the pulse signal of different pulse types is different. The pulse type of the scintillation pulse can be determined by comparing the difference between the target curve and these curves.

[0080] It should be noted that the above description of the steps in Figure 2 is only for example and illustration, and does not limit the scope of the present specification. Those skilled in the art can make various modifications and changes to the steps in Figure 5 under the guidance of the present specification. However, these modifications and changes are still within the scope of the present specification.

[0081] Figure 5 is an exemplary block diagram of a data processing system according to some embodiments of the present specification. The data processing system can implement sampling of scintillation pulses and data processing. As shown in Figures 1-2 , the data processing system 500 can include a setting module 510, a comparison module 520, a conversion module 530, a determination module 540, an acquisition module 550, and a discrimination module 560.

[0082] The setting module 510 can be used to preset at least two dynamic thresholds as shown in step 110 above. The at least two dynamic thresholds can be used to compare with the amplitude of the scintillation pulse. The comparison result can be used for time sampling to determine the time point at which the amplitude of the scintillation pulse crosses the dynamic threshold. The dynamic threshold can have a function relationship positively related to time. Over time, the dynamic threshold also gradually increases. The setting module 510 can include digital-to-time converters (DACs). The number of digital-to-time converters can correspond to the number of the at least two dynamic thresholds. One dynamic threshold corresponds to one digital-to-time converter. Each digital-to-time converter works independently of each other without interference. Each digital-to-time converter can be controlled by a preset program to output a dynamic threshold that meets the function relationship.

[0083] The comparison module 520 can be used for the synchronization parallel comparison of the scintillation pulse and the at least two dynamic thresholds as shown in step 120, to determine at least two jump values corresponding to the at least two dynamic thresholds when the scintillation pulse crosses the dynamic thresholds. The comparison module 520 can include at least two comparators arranged in parallel. The number of comparators can correspond to the number of the at least two dynamic thresholds, one dynamic threshold corresponding to one comparator. The scintillation pulse can be synchronously input into the at least two comparators respectively, while the at least two dynamic thresholds can be input into the corresponding comparators respectively for amplitude comparison with the scintillation pulse. The comparators work independently of each other without interference. For example, four comparators correspond to four dynamic thresholds respectively and are arranged in parallel, the scintillation pulse is input into the corresponding comparators through the parallel structure, the dynamic threshold corresponding to each comparator is different, and the amplitude of the received scintillation pulse can be compared with the size of the corresponding dynamic threshold. After receiving the scintillation pulse, different comparators work synchronously and independently without interference. In some embodiments, the at least two comparators can be realized by a circuit including a low-voltage differential signaling (LVDS) comparator. As an example, the scintillation pulse generated by the radiation detection device can be input to the positive input end of the LVDS comparator, and the dynamic threshold output by the DAC can be input to the negative input end of the LVDS comparator, to complete the circuit connection between the above three components. The comparison module 520 can also include at least two threshold acquisition units. The at least two threshold units can correspond to the at least two digital-to-analog converters respectively. That is, one digital-to-analog converter can be connected to one threshold acquisition unit. At the same time, the threshold acquisition unit can also be connected to the comparator corresponding to the digital-to-analog converter. When comparing the amplitude of the scintillation pulse with the size of the dynamic threshold, the comparator will have an output. For example, assuming that the amplitude of the scintillation pulse is greater than the size of the dynamic threshold, 1 can be output. Conversely, when the amplitude of the scintillation pulse is less than the size of the dynamic threshold, 0 can be output. When the output of the comparator changes from 1 to 0, it can be considered that the falling edge of the scintillation pulse crosses the dynamic threshold at this time from top to bottom. After receiving the signal output by the comparator, the threshold acquisition unit can determine the size of the dynamic threshold output by the digital-to-analog converter, that is, the jump value of the dynamic threshold.

[0084] The conversion module 530 can be used for determining at least two jump times corresponding to the at least two jump values based on the function relationship to form threshold-time pairs as shown in step 130. The conversion module 530 can substitute the at least two jump values into the corresponding function relationship respectively for calculation to determine at least two jump times.

[0085] The determining module 540 can be configured to determine a target curve representing the pulse shape of the scintillation pulse based on the threshold-time pairs as shown in step 140. The determining module 540 can obtain a function model corresponding to the scintillation pulse. The function model can be used to represent the pulse shape of the scintillation pulse. The scintillation pulse can be sampled by a digital oscilloscope to display the pulse shape of the scintillation pulse. The function model representing the pulse shape of the scintillation pulse can be determined by comparing the shape of the curve presented by the function model with the pulse shape of the scintillation pulse displayed by the digital oscilloscope. For example, if the pulse shape of the scintillation pulse displayed by the digital oscilloscope is symmetric, the function model representing the pulse shape of the scintillation pulse can be a Gaussian function model. The function model can include one or more parameters to be fitted. The determining module 540 can fit the function model based on the threshold-time pairs of the at least two dynamic threshold values to determine the one or more parameters to be fitted to obtain an expression of the function model. The function model (i.e., the determination of the one or more parameters to be fitted) can be solved by a curve fitting operation. For example, the curve fitting operation can be based on a least square method, an interpolation method or a polishing method. For example, an existing calculation algorithm / software can be called to perform the curve fitting operation based on the threshold-time pairs of the at least two dynamic threshold values. The threshold-time pairs can be input into the calculation algorithm / software to directly obtain the expression of the function model. The determining module 540 can determine the target curve based on the expression. The function model with the determined parameters can represent a specific curve. The shape of the curve can be used to represent the pulse shape of the scintillation pulse.

[0086] The obtaining module 550 can be configured to integrate the target curve to obtain energy information of the scintillation pulse. The obtained energy information can be used for image reconstruction (e.g., PET image reconstruction) or substance identification (e.g., identification of elements of a geological layer in geological exploration).

[0087] The discriminating module 560 can be configured to determine the pulse type of the scintillation pulse based on the target curve. The target curve can also be used to determine the pulse type of the scintillation pulse. The pulse shapes of curves representing different pulse types are different. The discriminating module 560 can determine the pulse type by comparing the difference between the target curve and the curves.

[0088] Further descriptions of the above modules can be referred to the flowchart section of the present application, for example, Figure 5 .

[0089] It should be understood that, Figure 6The illustrated system and its modules can be implemented in various ways. For instance, in some embodiments, the system and its modules can be implemented in hardware, software, or a combination of software and hardware. The hardware components can be implemented with special logic, while the software components can be stored in memory and executed by a suitable instruction execution system, such as a

[0090] It should be noted that the above description of the modules is for the convenience of description only, and should not limit the scope of the present specification to the embodiments described. It can be understood by those skilled in the art that, after understanding the principles of the system, various modules can be combined or connected with other modules to form a subsystem without departing from the principles. For example, the modules can share a storage module, and each module can have its own storage module. Variations such as these are within the scope of the present specification.

[0091] The digital processing system in the present application can also be implemented based on a Field Programmable Gate Array (FPGA) chip. Figure 6 An exemplary functional block diagram of a data processing system according to some embodiments of the present specification is shown. As shown in FIG. 1, the data processing system includes a plurality of modules, including a data receiving module 101, a data processing module 102, a data storage module 103, a data output module 104, and a data transmission module 105. The data receiving module 101 is configured to receive data from a data source. The data processing module 102 is configured to process the data received by the data receiving module 101. The data storage module 103 is configured to store the data processed by the data processing module 102. The data output module 104 is configured to output the data stored in the data storage module 103. The data transmission module 105 is configured to transmit the data output by the data output module 104 to a data sink. Figure 7As shown, the scintillation pulses inputted by the radiation detection device can be inputted into four LVDS comparators (C, including C1, C2, C3 and C4) respectively. Meanwhile, four different dynamic thresholds are inputted into the above LVDS comparators by four DACs (D, including D1, D2, D3 and D4) respectively. In the present application, the setting module 510 can be implemented by the DACs. The four DACs output dynamic thresholds based on time variation according to a preset threshold-time function relationship. In addition, the four different dynamic thresholds will also be inputted into four threshold acquisition modules O (including O1, O2, O3 and O4) corresponding to the four DACs respectively. After receiving the input of the scintillation pulses and the dynamic thresholds, the four comparators will compare the scintillation pulses and the received dynamic thresholds independently respectively, and output a comparison result at the same time. The comparison result can indicate whether the scintillation pulse has crossed the dynamic threshold inputted by the DAC. The dynamic threshold will also be inputted into the corresponding threshold acquisition module. Meanwhile, the threshold acquisition module can also receive the comparison result outputted by the comparator. When the comparison result shows that the scintillation pulse has crossed the dynamic threshold inputted by the DAC, the threshold acquisition module can take the dynamic threshold inputted by the DAC at this time as a jump value. In the present application, the comparison module 520 can be implemented by the LVDS comparators and the threshold acquisition modules O. The threshold acquisition modules O can input the jump value into the processing unit P. The processing unit P determines the jump time corresponding to the jump value based on the threshold-time function relationship. And the pulse waveform of the scintillation pulse is fitted and curve integrated to obtain the energy information by using these data. The processing unit P can be the part of the FPGA chip that can implement data processing. In the present application, the conversion module 530, the determination module 540, the acquisition module 550 and the discrimination module 560 can be implemented by the processing unit P.

[0092] Figure 7 is an exemplary block diagram of a processing device according to some embodiments of the present application. The processing device 700 can include any component used to implement the system described in the embodiments of the present application. For example, the processing device 700 can be implemented by hardware, software program, firmware or a combination thereof. For example, the processing device 700 can implement the data processing system 500. For the sake of convenience, only one processing device is drawn in the figure, but the computing functions described in the embodiments of the present application can be implemented in a distributed manner, by a group of similar platforms, to distribute the processing load of the system.

[0093] In some embodiments, the processing device 700 can include a processor 710, a memory 720, an input / output component 730, and a communication port 740. In some embodiments, the processor (e.g., CPU) 710 can execute program instructions in the form of one or more processors. In some embodiments, the memory 720 includes different forms of program memory and data memory, such as hard disks, read-only memory (ROM), random access memory (RAM), etc., for storing a variety of data files processed and / or transmitted by the computer. In some embodiments, the input / output component 730 can be used to support input / output between the processing device 700 and other components. In some embodiments, the communication port 740 can be connected with a network for enabling data communication. An exemplary processing device can include program instructions stored in read-only memory (ROM), random access memory (RAM), and / or other types of non-transitory storage media that are executed by the processor 710. The methods and / or processes of the embodiments of the present specification can be implemented in the form of program instructions. The processing device 700 can also receive programs and data disclosed in the present application through network communication.

[0094] For the sake of convenience, Figure 7 Only one processor is shown in the processing device 700 in the present specification. However, it should be noted that the processing device 700 in the present specification can include multiple processors, and thus the operations and / or methods described in the present specification as being implemented by one processor can also be implemented by multiple processors collectively or independently. For example, if the processor of the processing device 700 performs step 1 and step 2 in the present specification, it should be understood that step 1 and step 2 can also be performed collectively or independently by two different processors of the processing device 700 (e.g., a first processor performs step 1, a second processor performs step 2, or the first and second processors collectively perform step 1 and step 2).

[0095] It should be understood that ​The system and its modules shown can be implemented in various ways. For example, in some embodiments, the system and its modules can be implemented by hardware, software, or a combination of software and hardware. The hardware part can be implemented by using special logic; the software part can be stored in a memory and executed by a suitable instruction execution system, such as a microprocessor or a specially designed hardware. Those skilled in the art can understand that the above method and system can be implemented by using computer executable instructions and / or contained in processor control code, such as provided on a carrier medium, such as a magnetic disk, CD or DVD-ROM, a programmable memory, such as a read-only memory (firmware), or a data carrier, such as an optical or electronic signal carrier. The system and its modules of the present specification can not only be implemented by hardware circuit, such as ultra-large scale integrated circuit or gate array, semiconductor, such as logic chip, transistor, or programmable hardware device, such as field programmable gate array, programmable logic device, but also by software, such as executed by various types of processors, and also by a combination of the above hardware circuit and software (for example, firmware).

[0096] It should be noted that the above description of the modules is for the convenience of description and cannot limit the scope of the present specification to the embodiments. It can be understood that, for those skilled in the art, after understanding the principle of the system, the modules can be combined or connected with other modules to form a subsystem without departing from the principle. For example, the modules can share a storage module, and each module can have its own storage module. Such variations are within the scope of the present specification.

[0097] The scintillation pulse processing method provided in the present application can be specifically used in photon detection, and can be applied to various fields, such as medical imaging technology, high-energy physics, laser radar, autonomous driving, precision analysis, optical communication, etc. In a specific example, the scintillation pulse processing method and device, detector, electronic equipment and storage medium provided in the present application can be applied to positron emission computed tomography (PET). In the PET system, the photon data can be collected by using the scheme according to the embodiments of the present application, and then image reconstruction is performed. In other specific examples of the present application, the scintillation pulse processing method and device, detector, electronic equipment and storage medium provided in the present application can be applied to various digital devices, such as CT devices, MRI devices, radiation detection devices, oil detection devices, weak light detection devices, SPECT devices, security inspection devices, gamma cameras, X-ray devices, DR devices, and other devices using high-energy ray conversion principle, and other photoelectric conversion application devices.

[0098] Having now described the basic concept, it will be apparent to those skilled in the art that many modifications, adaptations, and variations of the specific embodiments described can be used without departing from the spirit and scope of the description. For example, the specific dimensions and configurations described are illustrative only and other dimensions and configurations can be utilized without departing from the spirit of the description. Accordingly, the scope of the description is intended to be limited only by the spirit and scope of the appended claims, along with the full scope of equivalents to which such claims are entitled. It is therefore intended that the description be interpreted to be broad enough to include all such modifications, adaptations, and variations that fall within the spirit and scope of the description.

[0099] Moreover, the specific language used herein has been selected for the purpose of clarity, and any modifications that come within the spirit of the description are intended to be within the scope of the description. It is therefore intended that the description be interpreted to be broad enough to encompass all such modifications.

[0100] Furthermore, it is to be understood that the aspects of the description can be carried out by a number of different kinds of systems or in a number of different kinds of contexts, including any new and useful arrangements of processes, machines, products, or subject matter, or any new and useful improvements thereof. Accordingly, the aspects of the description can be practiced in a variety of system configurations, including hand-held devices, consumer electronics, general- or specific-use computing devices, and the like. The aspects of the description can also be practiced within a variety of computing systems, including but not limited to a mobile telephone, a desktop computer, a laptop computer, a notebook computer, a tablet computer, a personal digital assistant (PDA), a server, a handheld gaming device, a media player, a gaming console, and the like. The aspects of the description can also be practiced within a variety of computing environments, including a multi-processor system, a distributed computing environment, a cloud computing environment, a grid computing environment, and the like. Any and all implementations of one or more such computing systems and computing environments are intended to come within the scope of the description.

[0101] Computer storage media can include volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information, such as computer readable instructions, data structures, program modules, or other data. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, solid state drives (SSDs), flash memory, phase-change (PC) memory, optical disks, magnetic disks, or other magnetic storage devices, or any other medium which can be used to store the desired information, and which can be accessed by an instruction execution system. Note that the computer storage media can be integrated within, or external to, a given instruction execution system.

[0102] Computer program code for carrying out operations of the aspects of the present specification can be written in any combination of one or more programming languages, including an object oriented programming language such as Java, Scala, Smalltalk, Eiffel, JADE, Emerald, C++, C#, VB.NET, Python, and others, conventional procedural programming languages, such as the "C" programming language, Visual Basic, Fortran 3003, Perl, COBOL 3002, PHP, ABAP, dynamic programming languages such as Python, Ruby and Groovy, or other programming languages. The program code can execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the latter scenario, the remote computer can be connected to the user's computer through any form of network, such as a local area network (LAN) or a wide area network (WAN), or the connection can be made to an external computer (for example, through the Internet using an Internet Service Provider) or cloud computing environment or as a service such as Software as a Service (SaaS).

[0103] Furthermore, the order of presentation of the matters of description of the present specification, use of nomenclature, or other terminology used herein is not intended to be limiting, unless expressly set forth in the claims. While the above disclosed embodiments have been described in connection with various examples thereof, it will be understood that the benefits of the application are not limited to those embodiments. On the contrary, the benefits of the application are intended to include all embodiments of the application and those equivalents thereof which fall within the scope of the appended claims, whenever and wherever claimed. For example, although the system components described above can be implemented by hardware devices, they can also be implemented by software solutions only, such as installing the described system on an existing server or mobile device.

[0104] Accordingly, it is to be understood that the above description is intended to be illustrative and not restrictive. Many embodiments of the application will be apparent to those of skill in the art upon reviewing the above description. The scope of the application should, therefore, be determined not with reference to the above description, but should instead be determined with reference to the appended claims, along with their full scope of equivalents. For example, although the system components described above can be implemented by hardware devices, they can also be implemented by software solutions only, such as installing the described system on an existing server or mobile device.

[0105] In some embodiments, numbers are used to describe the quantity of components and attributes. It should be understood that such numbers used in the description of the embodiments are modified by the modifiers "about", "approximately" or "substantially" in some examples. Unless otherwise stated, "about", "approximately" or "substantially" indicate that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in the description and claims are approximate values, which may change according to the required characteristics of individual embodiments. In some embodiments, the numerical parameters should take into account the specified significant digits and adopt the general method of retaining digits. Although the numerical domains and parameters used to confirm the breadth of their range in some embodiments of this specification are approximate values, in specific embodiments, the settings of such numerical values ​​are as accurate as possible within the feasible range.

[0106] Each patent, patent application, patent application publication, and other materials, such as articles, books, specifications, publications, and documents, cited in this specification is hereby incorporated by reference in its entirety. This includes application history documents that are inconsistent with or conflict with the content of this specification, as well as documents (currently or subsequently attached to this specification) that limit the broadest scope of the claims of this specification. It should be noted that if the descriptions, definitions, and / or terminology used in the accompanying materials are inconsistent or conflicting with the content of this specification, the descriptions, definitions, and / or terminology used in this specification will control.

[0107] Finally, it should be understood that the embodiments described in this specification are intended only to illustrate the principles of the embodiments of this specification. Other variations may also fall within the scope of this specification. Therefore, by way of example and not limitation, alternative configurations of the embodiments of this specification may be considered consistent with the teachings of this specification. Accordingly, the embodiments of this specification are not limited to the embodiments explicitly described and illustrated in this specification.

Claims

1. A method of processing a flicker pulse, characterized by, The processing method comprises: presetting at least two dynamic thresholds, wherein the dynamic thresholds vary with time and are linearly related to time, and the proportional coefficients of the at least two dynamic thresholds to time are not the same; synchronously and in parallel comparing the scintillation pulse with the at least two dynamic thresholds to determine at least two jump values corresponding to the at least two dynamic thresholds when the scintillation pulse crosses the dynamic thresholds, wherein the scintillation pulse crossing the dynamic thresholds at least comprises a falling edge crossing the dynamic thresholds from top to bottom; based on the at least two jump values, determining at least two jump times corresponding to the at least two jump values by using a function relationship to form a threshold-time pair; based on the threshold-time pair, determining a target curve representing a pulse waveform of the scintillation pulse; the processing method further comprises: presetting a trigger threshold; comparing the scintillation pulse with the trigger threshold to determine a trigger time when a rising edge of the scintillation pulse crosses the trigger threshold; designating the trigger time as a zero time to construct the function relationship.

2. The method of processing flicker pulses according to claim 1, characterized in that, The scintillation pulse comprises a rising edge with an amplitude continuously increasing over time and a falling edge continuously connected to the rising edge with an amplitude continuously decreasing over time.

3. The method of processing flicker pulses according to claim 1, wherein, The synchronous and parallel comparison of the scintillation pulse with the at least two dynamic thresholds comprises: comparing the scintillation pulse with the dynamic thresholds in size by at least two comparators arranged in parallel, and each of the comparators works independently of each other.

4. The method of processing flicker pulses according to claim 3, characterized in that, The at least two dynamic thresholds are set and realized by at least two digital-to-analog converters, the digital-to-analog converters are controlled by a preset program to output dynamic thresholds conforming to the function relationship and input into the comparators, and each of the digital-to-analog converters works independently of each other.

5. The method of processing flicker pulses according to claim 4, characterized in that, At least two threshold acquisition units correspond to the at least two digital-to-analog converters respectively, and the threshold acquisition unit acquires a jump value of a dynamic threshold for input into the comparator from the digital-to-analog converter when receiving a jump signal output by the comparator indicating that the scintillation pulse crosses the dynamic threshold.

6. The method of processing flicker pulses according to claim 1, wherein, The determination of the target curve representing the pulse waveform of the scintillation pulse based on the threshold-time pair comprises: acquiring a function model corresponding to the scintillation pulse, wherein the function model comprises one or more to-be-fitted parameters; based on the threshold-time pairs related to the at least two dynamic thresholds, fitting the function model to determine the one or more to-be-fitted parameters to acquire an expression of the function model; determining the target curve based on the expression.

7. The method of processing a scintillation pulse according to claim 1, wherein, The processing method further comprises: integrating the target curve to acquire energy information of the scintillation pulse.

8. The method of processing flicker pulses according to claim 1, wherein, The processing method further comprises: based on the target curve, determining a pulse type of the scintillation pulse.

9. A processing device of a flicker pulse, characterized by, The processing device comprises: a setting module configured to preset at least two dynamic thresholds, wherein the dynamic thresholds vary with time and have a function relationship positively related to time; a comparison module configured to synchronously and in parallel compare the scintillation pulse with the at least two dynamic thresholds, determine at least two jump values corresponding to the at least two dynamic thresholds when the scintillation pulse crosses the dynamic thresholds, the dynamic thresholds being linearly related to time, the at least two dynamic thresholds having different proportional coefficients with respect to time, the scintillation pulse crossing the dynamic thresholds at least including a falling edge crossing the dynamic thresholds from top to bottom; a conversion module configured to determine at least two jump times corresponding to the at least two jump values based on the function relationship, to form threshold-time pairs; a determination module configured to determine a target curve representing a pulse waveform of the scintillation pulse based on the threshold-time pairs; the setting module is further configured to: preset a trigger threshold; compare the scintillation pulse with the trigger threshold, determine a trigger time when a rising edge of the scintillation pulse crosses the trigger threshold; assign the trigger time as a zero time to construct the function relationship.

10. The scintillation pulse processing apparatus of claim 9, wherein, The scintillation pulse includes a rising edge with an amplitude continuously increasing over time and a falling edge continuously connected to the rising edge with an amplitude continuously decreasing over time.

11. The scintillation pulse processing apparatus of claim 9, wherein, To synchronously and in parallel compare the scintillation pulse with the at least two dynamic thresholds, the comparison module is configured to: compare the scintillation pulse with the dynamic thresholds in size through at least two comparators arranged in parallel, each of the comparators working independently of each other.

12. The scintillation pulse processing apparatus of claim 11, wherein, The setting module includes at least two digital-to-analog converters for setting the at least two dynamic thresholds, the digital-to-analog converters being controlled by a preset program to output dynamic thresholds conforming to the function relationship and input into the comparators, each of the digital-to-analog converters working independently of each other.

13. The scintillation pulse processing apparatus of claim 12, wherein, The comparison module includes at least two threshold acquisition units corresponding to the at least two digital-to-analog converters respectively, the threshold acquisition units acquiring the jump values of the dynamic thresholds for input into the comparators from the digital-to-analog converters when receiving jump signals output by the comparators indicating that the scintillation pulse crosses the dynamic thresholds.

14. The scintillation pulse processing apparatus of claim 9, wherein, To determine a target curve representing a pulse waveform of the scintillation pulse based on the threshold-time pairs, the determination module is configured to: acquire a function model corresponding to the scintillation pulse, the function model including one or more to-be-fitted parameters; fit the function model based on the threshold-time pairs related to the at least two dynamic thresholds, determine the one or more to-be-fitted parameters to acquire an expression of the function model; determine the target curve based on the expression.

15. The scintillation pulse processing apparatus of claim 9, wherein, The processing device further includes an acquisition module configured to: integrate the target curve to acquire energy information of the scintillation pulse.

16. The scintillation pulse processing apparatus of claim 9, wherein, The device further includes a discrimination module configured to: determine a pulse type of the scintillation pulse based on the target curve.

17. A processing device of a flicker pulse, characterized by, The device includes a scintillation pulse processing circuit board, the processing circuit board being configured to perform a multi-threshold sampling operation on the scintillation pulse and implement the processing method of the scintillation pulse as claimed in any one of claims 1-8.

18. A processing device, comprising: including: The scintillation pulse processing device as claimed in claim 17 or in any one of claims 9 to 16.

19. A processing device, comprising: Comprising: a memory, a processor and a computer program stored on the memory and executable on the processor, which, when executed by the processor, implements the steps of the processing method as claimed in any one of claims 1 to 8.

20. A computer-readable storage medium, characterized in that, a computer program stored on the storage medium, which, when executed by a processor, implements the steps of the processing method as claimed in any one of claims 1 to 8.

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