Gsg radio frequency probe maintenance welding jig

Abstract

The application discloses a GSG radio frequency probe maintenance welding jig and belongs to the technical field of probe maintenance equipment. The GSG radio frequency probe maintenance welding jig comprises oppositely arranged probe fixing frames and probe welding platforms, the probe welding platforms are located on swing sliding tables, the swing sliding tables are located on rotating tables, and the probe fixing frames are located on position adjusting devices. The GSG radio frequency probe maintenance welding jig has the beneficial effects that the needle tip is welded to the probe main body by using soldering paste through heating by a heating rod, and probe repair is completed; through probe repair, the service life of the probe is prolonged, and the production cost is reduced.

Description

TECHNICAL FIELD

[0001] The application relates to a GSG radio frequency probe maintenance welding jig and belongs to the technical field of probe maintenance equipment. BACKGROUND

[0002] With the rapid development of 5G, GSG radio frequency probes are applied more and more, and the radio frequency probes are mainly imported at present, the cost is high, the service life of the radio frequency probes is short, and after the service life, new products can only be purchased, and the cost is high. SUMMARY

[0003] In order to solve the defects in the prior art, the purpose of the application is to provide a GSG radio frequency probe maintenance welding jig which can repair probes, prolong the service life of probes and reduce cost.

[0004] The technical scheme of the application is: a GSG radio frequency probe maintenance welding jig, comprising a probe fixing frame and a probe welding platform arranged oppositely, the probe welding platform is located on a swing sliding table, the swing sliding table is located on a rotating table, and the probe fixing frame is located on a position adjusting device.

[0005] The probe rod assembly is detachably fixed on the probe fixing frame through screws.

[0006] A groove for accommodating a positioning needle tip is formed on the probe welding platform, and a heating rod is arranged below the groove.

[0007] The swing sliding table comprises a sliding part, a fixed part and a swing adjusting knob for controlling the swing angle of the sliding part, the bottom of the sliding part is provided with an arc surface in sliding cooperation with the fixed part, the middle part of the arc surface is provided with an adjusting screw thread extending along the arc surface, a screw rod is engaged with the adjusting screw thread, and the screw rod is connected with the swing adjusting knob.

[0008] The rotating table comprises a fixed end, a movable end and a rotary micrometer for adjusting the rotation angle of the movable end, the movable end is rotatably connected with the fixed end, the movable end is connected with the fixed part at the top, and the rotary micrometer on the fixed end is connected with the movable end.

[0009] The fixed end is located on the base.

[0010] The position adjusting device is an XYZ direction position adjusting device, comprising an X direction guide rail fixed on a base, an X direction sliding table slidingly connected to the X direction guide rail, an X direction micrometer provided on the side of the X direction guide rail, and an end of the X direction micrometer connected to the X direction sliding table; a Y direction guide rail is provided on the X direction sliding table, a Y direction sliding table slidingly connected to the Y direction guide rail, a Y direction micrometer provided on the side of the Y direction guide rail, and an end of the Y direction micrometer connected to the Y direction sliding table; a Z direction connecting frame is provided on the Y direction sliding table, a Z direction guide rail provided on the Z direction connecting frame, a Z direction sliding table slidingly connected to the Z direction guide rail, a Z direction micrometer provided on the side of the Z direction guide rail, and an end of the Z direction micrometer connected to the Z direction sliding table, and the Z direction sliding table connected to the probe fixing frame.

[0011] The probe is repaired by heating the probe tip with the soldering paste on the probe body through the heating rod, the service life of the probe is prolonged, and the production cost is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0012] Figure 1 is a structural diagram of the present application;

[0013] Figure 2 is a partial enlargement of the present application Figure One ;

[0014] Figure 3 is a partial enlargement of the present application Figure Two ;

[0015] Figure 4 is a partial view of the probe;

[0016] Figure 5 is Figure 4 a partial enlargement.

[0017] The reference signs in the drawings are as follows: 1, probe fixing frame, 2, probe welding platform, 3, rotating table, 3.1, fixed end, 3.2, movable end, 3.3, rotating micrometer, 4, probe rod assembly, 5, swinging sliding table, 5.1, sliding part, 5.2, fixed part, 5.3, swinging adjusting knob, 6, needle tip, 7, groove, 8, heating rod, 9, base, 10.1, X direction guide rail, 10.2, X direction sliding table, 10.3, X direction micrometer, 11.1, Y direction guide rail, 11.2, Y direction sliding table, 11.3, Y direction micrometer, 12.1, Z direction connecting frame, 12.2, Z direction guide rail, 12.3, Z direction sliding table, and 12.4, Z direction micrometer. DETAILED DESCRIPTION

[0018] The present application will be further described below with reference to the accompanying drawings Figures 1-5 The present application will be further described below with reference to the accompanying drawings

[0019] The utility model provides a kind of GSG radio frequency probe maintenance welding jig, including oppositely arranged probe fixing frame 1 and probe welding platform 2, the probe welding platform 2 is located on swing sliding table 5, the swing sliding table 5 is located on rotating table 3, the probe fixing frame 1 is located on position adjusting device.Probe rod assembly 4 of the probe to be repaired is detachably fixed on the probe fixing frame 1 by screw.The probe welding platform 2 is provided with groove 7 for accommodating positioning needle tip 6, and heating rod 8 is arranged below the groove 7.

[0020] The swing sliding table 5 includes a sliding portion 5.1, a fixed portion 5.2, and a swing adjustment knob 5.3 for controlling the swing angle of the sliding portion. The bottom of the sliding portion 5.1 is provided with an arc surface that slides with the fixed portion 5.2. The middle of the arc surface is provided with an adjustment screw thread that extends along the arc surface. A screw rod engages with the adjustment screw thread, and the screw rod is connected with the swing adjustment knob 5.3.

[0021] The rotating table 3 includes a fixed end 3.1, a movable end 3.2, and a rotary micrometer 3.3 for adjusting the rotation angle of the movable end 3.2. The movable end 3.2 is rotatably connected to the fixed end 3.1 at the bottom, and is connected to the fixed portion 5.2 at the top. The rotary micrometer 3.3 on the fixed end 3.1 is connected to the movable end 3.2. The fixed end 3.1 is located on the base 9.

[0022] The position adjusting device is an XYZ-position adjusting device, which includes an X-direction guide rail 10.1 fixed on the base 9, an X-direction sliding table 10.2 slidingly connected to the X-direction guide rail 10.1, an X-direction micrometer 10.3 provided on the side of the X-direction guide rail 10.1, and an end of the X-direction micrometer 10.3 connected to the X-direction sliding table 10.2. An Y-direction guide rail 11.1 is provided on the X-direction sliding table 10.2, an Y-direction sliding table 11.2 slidingly connected to the Y-direction guide rail 11.1, an Y-direction micrometer 11.3 provided on the side of the Y-direction guide rail 11.1, and an end of the Y-direction micrometer 11.3 connected to the Y-direction sliding table 11.2. A Z-direction connecting frame 12.1 is provided on the Y-direction sliding table 11.2, a Z-direction guide rail 12.2 provided on the Z-direction connecting frame 12.1, a Z-direction sliding table 12.3 slidingly connected to the Z-direction guide rail 12.2, a Z-direction micrometer 12.4 provided on the side of the Z-direction guide rail 12.2, and an end of the Z-direction micrometer 12.4 connected to the Z-direction sliding table 12.3. The Z-direction sliding table 12.3 is connected to the probe fixing frame 1.

[0023] When repairing the probe, first, under the microscope, the needle tip 6 is put into the groove 7 which matches the size of the needle tip 6, and after the needle tip 6 is placed in position in the groove 7, the relative positions of the two are consistent; the probe to be repaired is fixed on the probe fixing frame 1, the swing sliding table 5 is adjusted so that the needle tip 6 is horizontal, the XYZ position adjusting device and the rotating table 3 are adjusted so that the end of the probe rod 4 is above the needle tip 6, the heating rod 8 is an electric heating rod, the electric heating rod switch is turned on, the needle tip 6 is heated, the solder pre-prepared on the needle tip 6 is melted, the Z-thousandth ruler 12.4 is adjusted so that the probe rod 4 moves downward and contacts the solder and the needle tip 6, the electric heating rod is turned off, the solder is cooled, the needle tip 6 and the probe rod 4 are fixed together through the solder, the probe repair is completed, the XYZ position adjusting device is adjusted, the needle tip 6 is separated from the groove 7, the screw is screwed, and then the probe rod assembly 4 can be detached from the probe fixing frame 1.

[0024] The above only describes the preferred embodiments of the present application, and it should be noted that for ordinary skilled in the art, without departing from the technical principles of the present application, several improvements and modifications can be made, and these improvements and modifications should be considered as the protection scope of the present application.

Claims

1. A GSG radio frequency probe repair welding jig, characterized by, The probe fixing frame (1) and the probe welding platform (2) are oppositely arranged, the probe welding platform (2) is located on the swing sliding table (5), the swing sliding table (5) is located on the rotating table (3), and the probe fixing frame (1) is located on the position adjusting device; The probe rod assembly (4) is detachably fixed on the probe fixing frame (1) through screws; The probe welding platform (2) is provided with a groove (7) for accommodating a positioning needle tip (6), and a heating rod (8) is arranged below the groove (7); The swing sliding table (5) comprises a sliding part (5.1), a fixed part (5.2) and a swing adjusting knob (5.3) for controlling the swing angle of the sliding part, the bottom of the sliding part (5.1) is provided with an arc surface in sliding fit with the fixed part (5.2), and the middle part of the arc surface is provided with an adjusting screw thread extending along the arc surface, a screw rod is engaged with the adjusting screw thread, and the screw rod is connected with the swing adjusting knob (5.3). The rotating table (3) comprises a fixed end (3.1), a movable end (3.2) and a rotating micrometer (3.3) for adjusting the rotation angle of the movable end (3.2), the movable end (3.2) is rotatably connected with the fixed end (3.1) at the bottom, the movable end (3.2) is connected with the fixed part (5.2) at the top, and the rotating micrometer (3.3) located on the fixed end (3.1) is connected with the movable end (3.2).

2. The GSG RF probe repair welding fixture of claim 1, wherein, The fixed end (3.1) is located on the base (9).

3. The GSG RF probe repair welding fixture of claim 1, wherein, The position adjusting device is an XYZ position adjusting device, which comprises an X-direction guide rail (10.1) fixed on the base (9), an X-direction sliding table (10.2) slidably connected to the X-direction guide rail (10.1), an X-direction micrometer (10.3) arranged on the side of the X-direction guide rail (10.1), and an end of the X-direction micrometer (10.3) connected with the X-direction sliding table (10.2); the X-direction sliding table (10.2) is provided with a Y-direction guide rail (11.1), a Y-direction sliding table (11.2) slidably connected to the Y-direction guide rail (11.1), a Y-direction micrometer (11.3) arranged on the side of the Y-direction guide rail (11.1), and an end of the Y-direction micrometer (11.3) connected with the Y-direction sliding table (11.2); the Y-direction sliding table (11.2) is provided with a Z-direction connecting frame (12.1), the Z-direction connecting frame (12.1) is provided with a Z-direction guide rail (12.2), a Z-direction sliding table (12.3) slidably connected to the Z-direction guide rail (12.2), a Z-direction micrometer (12.4) arranged on the side of the Z-direction guide rail (12.2), and an end of the Z-direction micrometer (12.4) connected with the Z-direction sliding table (12.3), and the Z-direction sliding table (12.3) is connected with the probe fixing frame (1).

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