Light emitting device, light emitting method, light detecting device, light spectrum detecting method, and light emitting correction method

Abstract

A light emitting device (12) includes at least a plurality of light emitting elements, each of which emits light (L) having a luminous intensity when supplied with a current density, the current densities being different from each other or some of the current densities being different from each other. A light detection device (1) includes at least four light emitting elements, and the corresponding four light-on and light-off frequencies are selected to be completely different from each other or at least partially the same as each other. The light emitting device (12) and the light detection device (1) are capable of relative rotation with respect to the object (A). A light emitting method, a spectral detection method and a light emitting correction method are provided, which can improve the signal-to-noise ratio, correct the luminous intensity or spectral signal, discard the frequency domain signal of the background noise and leave the frequency domain signal of the spectral signal of the object (A), so as to achieve the filtering effect and improve the test accuracy.

Description

Technical Field

[0001] This invention relates to a light-emitting device, and more particularly to a light-emitting device, a light-emitting method, a light detection device, a spectral detection method, and a light-emitting correction method capable of selecting the wavelength range of light emitted by a light-emitting diode, the range of differences between adjacent light emission peak wavelengths, the range of full-width at half-maximum (FWHM), and the lighting frequency. Background Technology

[0002] A spectrometer can be used to measure transmitted light through an object or reflected light from an object's surface. A traditional spectrophotometer typically includes a light source and a monochromator. The light source can be a tungsten filament lamp filled with halogen gas (halogen tungsten lamp) to produce light with a continuous emission spectrum of approximately 320 nm to 2500 nm in the Vis-near IR (visible-near infrared) range. Then, the monochromator, which is composed of a prism or grating, selects a specific wavelength of monochromatic light for the absorption or reflection of the sample (or analyte). This also includes the ability to continuously scan within a set wavelength range to analyze the absorption or reflection spectrum of the sample. However, in addition to the numerous problems with tungsten filament lamps described in Chinese Invention Patent Grant Announcement CN101236107B, due to the high heat generation and temperature of tungsten filament lamps, when using them as a light source for testing organic products such as agricultural products, food, pharmaceuticals, and petrochemical products, the high temperature can cause qualitative changes in the organic samples, thus severely affecting the test results. The technology disclosed in the aforementioned patent CN101236107B can also be referenced in this invention.

[0003] The aforementioned patent CN101236107B discloses multiple light-emitting diodes (LEDs) as the light source of a spectrometer, with each LED emitting a monochromatic spectrum of a different wavelength range. Besides combining multiple LEDs into a continuous spectrum, it can also be designed so that when only a specific wavelength range of monochromatic light is needed, only the LED corresponding to that wavelength range needs to be lit. Therefore, multiple LEDs can be lit simultaneously to synthesize a continuous spectrum, or the corresponding LEDs can be lit sequentially according to the wavelength range to be scanned. However, the aforementioned patent CN101236107B focuses the emitted light from multiple LEDs onto the entrance slit of the monochromator, thus failing to solve the problems of high cost of monochromators and system complexity. Chinese Utility Model Patent Publication CN205388567U discloses the use of a combination of multiple LEDs and optical fibers to avoid the use of a monochromator, and also uses a total reflection mirror to increase the measurement optical path to improve the efficiency of sample detection. The technology disclosed in the aforementioned patent CN205388567U can also be cited in this invention. In addition, Chinese invention patent publication No. CN109932335A also discloses a similar technology.

[0004] While the aforementioned three patents improve upon the issues of heat generation from the light source and the high cost of monochromators in traditional spectrometers, the wavelength resolution (typically greater than 10 nm) of the spectrometer using an LED array as the light source in the third patent is lower than that of traditional spectrometers using halogen lamps and single-spectrum transducers (typically 1 nm). This raises concerns about the accuracy of the sample spectrum interpretation in these three patents using LED arrays as the light source. Another problem with these three patents is their inability to further improve the signal-to-noise ratio (SNR). The LED arrays in these three patents merely replace halogen lamps as the light source; they do not change other aspects of the light source's operation. Therefore, they clearly do not improve the SNR caused by the light source itself, and thus, these three patents cannot further improve the SNR. Another problem with the aforementioned three patents is that, since multiple LEDs are arranged in rows or columns or in a predetermined manner to form an LED array on a plane, the surface of the object under test (DUT) must be parallel to this plane to ensure measurement accuracy. However, in reality, it is often difficult to keep the surface of the DUT parallel to the plane; for example, the surface of the DUT may be a slightly curved surface. Or, for some reason, the placement of the DUT may prevent its surface from being parallel to the plane, leading to misjudgments of the overall surface or internal composition of the DUT. Even if the surface of the DUT can be kept parallel to the plane, if the surface or internal composition of the DUT is non-uniform across different regions of the DUT, the measurement results of a single measurement of the reflectance spectrum or the absorption spectrum transmitted through the DUT will lead to misjudgments of the overall surface or internal composition of the DUT. The aforementioned three patents also fail to consider the issue of luminous intensity correction due to LED heat dissipation problems. Summary of the Invention

[0005] The main objective of this invention is to provide a rotating light-emitting device composed of multiple LEDs emitting different wavelength ranges from each other, and a photodetector composed of the light-emitting device. The photodetector of this invention provides sample resolution results close to the high-resolution results of a conventional halogen tungsten lamp spectrometer, while simultaneously improving the signal-to-noise ratio in the spectrum of the sample detection results and the correction of luminous intensity. Furthermore, it can obtain accurate measurement results of the surface reflection spectrum or the absorption spectrum transmitted through the sample in a single measurement.

[0006] To achieve the above objectives, a light-emitting device of the present invention comprises at least: a plurality of light-emitting elements, each emitting light having at least one emission peak wavelength and at least one wavelength range; wherein, the plurality of wavelength ranges of two light-emitting elements corresponding to two adjacent emission peak wavelengths partially overlap to form a continuous wavelength range wider than the wavelength range of each of the plurality of light-emitting elements, or the plurality of wavelength ranges of two light-emitting elements corresponding to two adjacent emission peak wavelengths do not overlap; the plurality of light-emitting elements are each supplied with a current density such that the emitted light has a luminous intensity; the plurality of current densities are different from each other, or the plurality of current densities are partially different.

[0007] In one embodiment of the present invention, two adjacent emission peak wavelengths differ from each other by more than or equal to 1 nm, and at least a portion of the emission peak wavelengths correspond to a wavelength half-width greater than 0 nm and less than or equal to 60 nm.

[0008] In one embodiment of the present invention, the light-emitting element is a light-emitting diode, a vertical resonant cavity surface-emitting laser, or a laser diode.

[0009] In one embodiment of the present invention, the plurality of light-emitting elements can each exhibit discontinuous light emission at a flashing frequency. The plurality of flashing frequencies may be the same as each other or different from each other, or the plurality of flashing frequencies may be partially the same or partially different.

[0010] In one embodiment of the present invention, the plurality of light-emitting elements is at least four light-emitting elements, and the four on / off frequencies corresponding to the four light-emitting elements may optionally be completely different from each other or at least partially the same as each other.

[0011] In one embodiment of the present invention, the flashing frequency is between 0.05 times / second and 50,000 times / second.

[0012] In one embodiment of the present invention, the time interval for turning on the light-emitting element in the on / off frequency is between 0.00001 seconds and 10 seconds.

[0013] In one embodiment of the present invention, the time interval for turning off the light-emitting element in the on / off frequency is between 0.00001 seconds and 10 seconds.

[0014] In one embodiment of the present invention, the wavelengths of two adjacent emission peaks differ from each other by a difference of 1 nm to 80 nm.

[0015] In one embodiment of the present invention, the wavelengths of two adjacent emission peaks differ from each other by a difference of 5 nm to 80 nm.

[0016] In one embodiment of the present invention, the half-width at half maximum (WHM) of each emission peak wavelength is between 15 nm and 50 nm.

[0017] In one embodiment of the present invention, the half-width at half maximum (WHM) of each emission peak wavelength is between 15 nm and 40 nm.

[0018] To achieve the above objectives, the present invention further provides a light detection device, comprising at least: a light source controller, a light-emitting device, a light detector, and a calculator; the light source controller is electrically connected to the light-emitting device, and the light detector is electrically connected to the calculator; the light detector receives light emitted from the light-emitting device, and the light forms an optical path along its travel path between the light-emitting device and the light detector; wherein the light-emitting device comprises at least a plurality of light-emitting elements, each emitting light having at least one emission peak wavelength and at least one wavelength range; the plurality of wavelength ranges of two light-emitting elements corresponding to two adjacent emission peak wavelengths partially overlap to form a larger light-emitting element than the plurality of light-emitting elements. The wavelength range of each of the elements is a continuous wavelength range, or the wavelength ranges of the two light-emitting elements corresponding to two adjacent emission peak wavelengths do not overlap; the wavelength difference between two adjacent emission peak wavelengths is greater than or equal to 1 nm, and the wavelength half-width corresponding to at least a portion of the emission peak wavelengths is greater than 0 nm and less than or equal to 60 nm; the multiple light-emitting elements are capable of exhibiting discontinuous emission at a flashing frequency, the multiple light-emitting elements are at least four light-emitting elements, and the four flashing frequencies corresponding to the four light-emitting elements are optionally completely different from each other or at least partially the same as each other.

[0019] In one embodiment of the present invention, a mathematical analysis module is disposed on the photodetector or the calculator. The mathematical analysis module is electrically or signal-connected to the photodetector, or the mathematical analysis module is electrically or signal-connected to the calculator. The mathematical analysis module is in software or hardware form. The signal collected by the photodetector is transmitted to the mathematical analysis module. During the time interval when the light-emitting element is turned on in the on / off frequency, the signal received by the photodetector is a combination of a spectral signal of a test object and background noise. During the time interval when the light-emitting element is turned off in the on / off frequency, the signal received by the photodetector is the background noise. The spectral signal of the test object and the background noise constitute a time-domain signal of the test object. The mathematical analysis module includes a time-domain-frequency-domain conversion unit that converts the time-domain signal of the test object into a frequency-domain signal of the test object.

[0020] In one embodiment of the present invention, the time-domain to frequency-domain conversion unit is a Fourier conversion unit used to convert the time-domain signal of the test object into the frequency-domain signal of the test object.

[0021] In one embodiment of the present invention, the frequency domain signal of the test object is a frequency domain signal including the spectral signal of the test object and the frequency domain signal of the background noise. The mathematical analysis module is capable of discarding the frequency domain signal of the background noise and retaining the frequency domain signal of the spectral signal of the test object. The mathematical analysis module includes a frequency domain-time domain conversion unit that converts the aforementioned retained frequency domain signal of the spectral signal of the test object into a filtered time domain signal of the test object.

[0022] In one embodiment of the present invention, the frequency-time domain conversion unit is an inverse Fourier conversion unit capable of performing an inverse Fourier conversion on the frequency domain signal of the spectral signal of the analyte left above into the filtered time domain signal of the analyte.

[0023] To achieve the above objectives, the present invention provides a light detection device, comprising at least: a light source controller, a light-emitting device, one or more light detectors, and a calculator; the light source controller is electrically connected to the light-emitting device, the light detector is electrically connected to the calculator, the light detector receives light emitted from the light-emitting device, and the light forms an optical path along the path between the light-emitting device and the light detector; wherein the light-emitting device comprises a plurality of light-emitting elements, each emitting light having at least one emission peak wavelength and at least one wavelength range; a test object is placed in the optical path, and the light-emitting device is rotatable relative to the test object.

[0024] In one embodiment of the present invention, a plurality of the light-emitting elements are capable of revolving around a common axis of rotation.

[0025] In one embodiment of the present invention, the light-emitting device is connected to a rotating device, which drives a plurality of light-emitting elements to revolve around the central axis.

[0026] In one embodiment of the present invention, the rotating device drives a rotating shaft to rotate, one end of the rotating shaft is connected to the light-emitting device, and the rotating shaft is the center of the revolution.

[0027] In one embodiment of the present invention, the rotating device is electrically connected to a microcontroller of the light source controller, and the microcontroller controls the rotating shaft to rotate at a predetermined angle.

[0028] In one embodiment of the present invention, the test object is capable of rotating about a rotation axis.

[0029] The present invention also provides a light emission method, comprising the following steps in sequence: a step of providing light emission elements: providing a plurality of light emission elements, each emitting light having at least one emission peak wavelength and at least one wavelength range, wherein the wavelength ranges of two light emission elements corresponding to two adjacent emission peak wavelengths partially overlap to form a continuous wavelength range wider than the wavelength range of each of the plurality of light emission elements, or the wavelength ranges of two light emission elements corresponding to two adjacent emission peak wavelengths do not overlap; the difference between two adjacent emission peak wavelengths is greater than or equal to 1 nm, and the half-width at half-maximum (WHM) of at least a portion of the emission peak wavelengths is greater than 0 nm and less than or equal to 60 nm; a step of light emission: controlling and causing the plurality of light emission elements to respectively exhibit discontinuous light emission at an on / off frequency, wherein the on / off frequency is between 0.05 times / second and 50,000 times / second, the time interval for turning on the light emission element at the on / off frequency is between 0.00001 seconds and 10 seconds, and the time interval for turning off the light emission element at the on / off frequency is between 0.00001 seconds and 10 seconds.

[0030] The present invention also provides a light-emitting method, comprising the following steps in sequence: a step of providing light-emitting elements: providing a plurality of light-emitting elements, each emitting light having at least one emission peak wavelength and at least one wavelength range. a step of emitting light: causing the plurality of light-emitting elements to emit light. a step of obtaining an initial spectral energy distribution curve: the plurality of light-emitting elements are each supplied with a current density such that the emitted light has a luminous intensity, and an initial spectral energy distribution curve is obtained by supplying the plurality of light-emitting elements with the same current density. a step of adjusting current density: selecting specific values ​​and corresponding light-emitting elements from the plurality of luminous intensities, increasing or decreasing the current density corresponding to the unselected light-emitting elements, so that the luminous intensity corresponding to the unselected light-emitting elements is the same as or close to the luminous intensity corresponding to the selected light-emitting elements.

[0031] In one embodiment of the present invention, the plurality of wavelength ranges of the two light-emitting elements corresponding to two adjacent emission peak wavelengths partially overlap to form a continuous wavelength range wider than the wavelength range of each of the plurality of light-emitting elements, or the plurality of wavelength ranges of the two light-emitting elements corresponding to two adjacent emission peak wavelengths do not overlap; the difference between two adjacent emission peak wavelengths is greater than or equal to 1 nm, and the half-width at half maximum (WHM) of the wavelength corresponding to at least a portion of the plurality of emission peak wavelengths is greater than 0 nm and less than or equal to 60 nm.

[0032] In one embodiment of the present invention, the plurality of light-emitting elements are controlled and made to emit discontinuous light at a flashing frequency, the flashing frequency being between 0.05 times / second and 50,000 times / second, the time interval for turning on the light-emitting element within the flashing frequency being between 0.00001 seconds and 10 seconds, and the time interval for turning off the light-emitting element within the flashing frequency being between 0.00001 seconds and 10 seconds.

[0033] The present invention provides a spectral detection method comprising the aforementioned luminescence method, the spectral detection method further comprising: a filtering step: receiving a spectral signal of a test object and a background noise, wherein the received signal is a combination of the spectral signal of the test object and the background noise during the time interval in which the luminescence element is turned on during the on / off frequency, and the received signal is the background noise during the time interval in which the luminescence element is turned off during the on / off frequency, the spectral signal of the test object and the background noise constituting a time-domain signal of the test object, performing a Fourier transform on the time-domain signal of the test object to a frequency-domain signal of the test object, the frequency-domain signal of the test object being distinguished into the frequency-domain signal of the spectral signal of the test object and the frequency-domain signal of the background noise, and then discarding the frequency-domain signal of the background noise and retaining the frequency-domain signal of the spectral signal of the test object.

[0034] In one embodiment of the present invention, the spectral detection method further includes an inverse conversion step, which involves performing a Fourier inverse Fourier conversion on the frequency domain signal of the spectral signal of the analyte left above to a filtered time domain signal of the analyte.

[0035] The present invention also provides a light emission correction method, comprising the following steps in sequence: a correction relationship acquisition step: providing a plurality of light-emitting elements, each emitting light having at least one emission peak wavelength and at least one wavelength range, wherein each of the plurality of light-emitting elements has a light emission intensity, obtaining a mathematical expression or correspondence table or graph of the light emission intensity or a relative intensity of each light-emitting element and a junction temperature, and also obtaining a mathematical expression or correspondence table or graph of the forward bias voltage of each light-emitting element and the junction temperature. a forward bias voltage measurement step: simultaneously measuring the forward bias voltage of the light-emitting element during the time interval during which the light-emitting element is lit. A proportional relationship acquisition step: The measured forward bias voltage is compared with the aforementioned mathematical relationship, correspondence table, or graph between the forward bias voltage of the light-emitting element and the junction temperature to obtain the junction temperature; then, the calculated junction temperature is compared with the aforementioned mathematical relationship, correspondence table, or graph between the luminous intensity or relative intensity and the junction temperature to obtain the luminous intensity or relative intensity; next, the calculated luminous intensity or relative intensity is compared with the luminous intensity or relative intensity at a specific junction temperature in the mathematical relationship, correspondence table, or graph between the luminous intensity or relative intensity and the junction temperature to obtain a proportional relationship. A correction completion step: The luminous intensity of the wavelength range corresponding to the light-emitting element in the aforementioned initial spectral energy distribution curve is multiplied by the proportional relationship to achieve luminous intensity correction; or, the measured spectral signal related to the wavelength range corresponding to the light-emitting element is multiplied by the proportional relationship to achieve spectral signal correction. Attached Figure Description

[0036] Figure 1 This is a schematic diagram (I) of an embodiment of the light-emitting device and light-detecting device of the present invention.

[0037] Figure 2 This is the emission spectrum of a light-emitting diode according to the first embodiment of the present invention.

[0038] Figure 3 This is the emission spectrum of a light-emitting diode according to the second embodiment of the present invention.

[0039] Figure 4 This is the emission spectrum of a light-emitting diode according to the third embodiment of the present invention.

[0040] Figure 5A This is a schematic diagram (II) of an embodiment of the light-emitting device and light-detecting device of the present invention.

[0041] Figure 5B This is a schematic diagram (III) of an embodiment of the light-emitting device and light-detecting device of the present invention.

[0042] Figure 6A This is a time-domain signal diagram of the test object measured by the optical detection device of the present invention.

[0043] Figure 6B This is a frequency domain signal diagram of the test object after the optical detection device of the present invention performs Fourier transform on the time domain signal of the test object.

[0044] Figure 6C This is a time-domain signal diagram of the analyte after the optical detection device of the present invention performs an inverse Fourier transform on the frequency domain signal of the spectral signal of the analyte remaining after the filtering effect.

[0045] Figure 7A The image shows the reflectance spectra of zinc oxide and zinc oxide-iron oxide mixture measured using a conventional spectrometer in Comparative Example 1.

[0046] Figure 7B The image shows the reflectance spectra of zinc oxide and zinc oxide mixed with iron oxide measured using the optical detection device of the present invention in Application Example 1.

[0047] Figure 7C Example 2 shows the reflectance spectra of zinc oxide and zinc oxide mixed with iron oxide measured using the optical detection device of the present invention.

[0048] Figure 7D The image shown in Application Example 3 is the reflectance spectrum of zinc oxide and zinc oxide mixed with iron oxide measured using the optical detection device of the present invention.

[0049] Figure 8 This is a flowchart of the light emission method of the present invention.

[0050] Figure 9 This is a flowchart of the steps of the spectral detection method of the present invention.

[0051] Figure 10A This is a schematic diagram of an embodiment of the optical detection device of the present invention, which includes a current controller.

[0052] Figure 10B This is a flowchart of another luminescence method and spectral detection method of the present invention.

[0053] Figure 10C This is the initial spectral energy distribution curve of the light-emitting device of the present invention.

[0054] Figure 10D This is the spectral energy distribution curve after adjusting the first current density according to the present invention.

[0055] Figure 10E This is the spectral energy distribution curve after adjusting other current densities according to the present invention.

[0056] Figure 11A This is a flowchart illustrating the steps of the luminescence correction method, luminescence method, and spectral detection method of the present invention.

[0057] Figure 11BThis is a graph showing the relative intensity of the fourth light-emitting diode of the present invention versus its junction temperature.

[0058] Figure 11C This is a graph showing the correspondence between the forward bias voltage and the junction temperature of the fourth light-emitting diode of the present invention.

[0059] Figure 12A This is a schematic diagram showing the first relative position formed between the first light-emitting diode and the first region according to the present invention.

[0060] Figure 12B This is a schematic diagram showing the second relative position formed between the first light-emitting diode and the first region in this invention.

[0061] Figure 12C This is a schematic diagram illustrating an embodiment of the present invention in which the object under test rotates around its own rotation axis.

[0062] Figure 12D This is a schematic diagram (I) of an embodiment where the surface of the object to be tested cannot be kept parallel to the light-emitting device 12.

[0063] Figure 12E This is a schematic diagram (II) of an embodiment where the surface of the object to be tested cannot be kept parallel to the light-emitting device 12.

[0064] The attached diagram is described below:

[0065] 1. Optical detection device

[0066] 11 Light Source Controller

[0067] 111 Microcontroller

[0068] 112 Clock Generator

[0069] 113 Current Controller

[0070] 12 Light-emitting devices

[0071] 120 circuit board

[0072] 121 First Light Emitting Diode

[0073] 1211 Fourth Light Emitting Diode

[0074] 122 Second LED

[0075] 1221 Fifth LED

[0076] 123 Third LED

[0077] 13. Photodetector

[0078] 14 Calculator

[0079] 15 Rotating device

[0080] 151 Rotating Shaft

[0081] A Test Object

[0082] A0 Rotation axis

[0083] A1 First Area

[0084] A2 Second Area

[0085] L-ray

[0086] M Mathematical Analysis Module

[0087] M1 Time-to-Frequency Conversion Unit

[0088] M2 Frequency-to-Time Conversion Unit

[0089] P01 Steps for obtaining the correction relationship

[0090] P02 Measurement of Forward Bias Voltage Procedure

[0091] Steps for obtaining proportional relationships (P03)

[0092] P04 Complete the calibration steps

[0093] R optical path

[0094] S01 Providing the light-emitting element step

[0095] S02 Light Emission Step

[0096] Steps for obtaining the initial spectral energy distribution curve of S021

[0097] S022 Current Density Adjustment Steps

[0098] S03 Filtering Steps

[0099] S04 Inverse Conversion Step Detailed Implementation

[0100] To facilitate understanding of the technical features, content, advantages, and technical effects of the present invention, the present invention will be described in detail below with reference to the accompanying drawings and embodiments. The accompanying drawings are for illustrative purposes only and to assist in the description. They may not represent the actual proportions and precise configurations of the present invention after implementation. Therefore, the proportions and configurations of the accompanying drawings should not be used to interpret or limit the claims of the present invention in actual implementation.

[0101] First, please refer to Figure 1In a first embodiment, the light-emitting device 12 of the present invention is suitable for a light detection device 1, which includes a light source controller 11, the light-emitting device 12, one or more light detectors 13, and a calculator 14. The light source controller 11 is electrically connected to the light-emitting device 12 and an external power supply (not shown). The light detector 13 is electrically connected to the calculator 14. The light detector 13 receives a light ray L emitted from the light-emitting device 12, and the light ray L forms a light path R along its path between the light-emitting device 12 and the light detector 13. The light detector 13 can be, for example, a photomultiplier tube, a photoconducting detector, or a silicon bolometer. A test object A is placed in the light path R, and the light path R either penetrates the test object A or forms a reflection on the surface of the test object A. Figure 1 In this example, the light path R penetrates the sample A to measure its absorption spectrum. Alternatively, in an embodiment where the light path R forms a reflection on the surface of the sample A, the reflection spectrum of the sample A is measured. Figure 12E The photodetector 13 converts the light L into a spectral signal of the test object and transmits the spectral signal of the test object to the calculator 14. The calculator 14 converts the spectral signal of the test object to form a spectral map of the test object. The calculator 14 is, for example, a personal computer, a laptop computer or a computer server.

[0102] The light-emitting device 12 includes at least a plurality of light-emitting elements, each emitting light having at least one light emission peak wavelength and at least one wavelength range, wherein the light emission peak wavelength or the wavelength range is between 300 nm and 2500 nm. The light-emitting element can be a light-emitting diode (LED), a vertical-cavity surface-emitting laser (VCSEL), or a laser diode (LD). In the following embodiments, the light-emitting element is exemplified by an LED for ease of explanation, and is not intended to limit the invention to the LED exemplified herein. Those skilled in the art will understand that the implementation of the light-emitting element is possible; LEDs, VCSELs, or laser diodes can be substituted for each other in this invention without affecting the actual implementation of the invention. Figure 1In one embodiment, the light-emitting device 12 includes three light-emitting diodes: a first light-emitting diode 121 that emits a first light ray having a first wavelength range, a second light-emitting diode 122 that emits a second light ray having a second wavelength range, and a third light-emitting diode 123 that emits a third light ray having a third wavelength range. The first light ray has a first emission peak wavelength in the first wavelength range, the second light ray has a second emission peak wavelength in the second wavelength range, and the third light ray has a third emission peak wavelength in the third wavelength range. The first light-emitting diode 121, the second light-emitting diode 122, and the third light-emitting diode 123 are electrically connected to a circuit board 120 of the light-emitting device 12. The circuit board 120 is electrically connected to the light source controller 11. In other words, the light source controller 11 is electrically connected to the first light-emitting diode 121, the second light-emitting diode 122, and the third light-emitting diode 123, and the light source controller 11 can control the first light-emitting diode 121, the second light-emitting diode 122, and the third light-emitting diode 123 to be on or off (powered on or off). That is, the light source controller 11 can control the multiple light-emitting diodes to be on or off (powered on or off). Preferably, the light source controller 11 can control the first light-emitting diode 121, the second light-emitting diode 122, and the third light-emitting diode 123 to emit light continuously or discontinuously, that is, the light source controller 11 can control the multiple light-emitting diodes to emit light continuously or discontinuously. Preferably, the light source controller 11 can control and cause the first light-emitting diode 121, the second light-emitting diode 122, and the third light-emitting diode 123 to emit discontinuous light at a flashing frequency, respectively. That is, the light source controller 11 can control and cause multiple light-emitting diodes to emit discontinuous light at a flashing frequency, respectively. The multiple flashing frequencies can be the same or different from each other, or the multiple flashing frequencies can be partially the same or partially different. For example, the light source controller 11 includes a microcontroller unit 111 electrically connected to the external power supply and a clock generator 112 electrically connected to the microcontroller unit 111. The flashing frequency is generated by the clock generator 112 and the signal of the flashing frequency is transmitted to the microcontroller unit 111. The microcontroller unit 111 then turns on or off multiple light-emitting diodes (e.g., the first light-emitting diode 121, the second light-emitting diode 122, and the third light-emitting diode 123) electrically connected to the microcontroller unit 111 according to the flashing frequency.It should be noted that the clock generator 112 can also be a clock generation module integrated into the microcontroller 111 to generate the flashing frequency. This clock generation module can be in software or hardware form, thus eliminating the need for a separate clock generator 112 external to the microcontroller 111. It should also be noted that, according to the technical features of the light source controller 11 described above, multiple LEDs can be turned on or off simultaneously, or only one or some LEDs can be turned on or off selectively, or multiple LEDs can be turned on or off sequentially, or any of the above methods can be used to turn on or off at the flashing frequency. Preferably, multiple LEDs are turned on (emitting light) simultaneously, and the corresponding flashing frequencies are different from each other; preferably, at least four LEDs are turned on simultaneously, and the four flashing frequencies corresponding to the four LEDs can be selectively completely different from each other or at least partially the same.

[0103] Please refer to the following: Figure 2 The wavelength ranges of two adjacent light-emitting diodes corresponding to two light-emitting peak wavelengths partially overlap to form a continuous wavelength range wider than the wavelength range of each of the plurality of light-emitting diodes, wherein the continuous wavelength range is between 300 nm and 2500 nm. Figure 2There are three emission peak wavelengths and their corresponding wavelength ranges: the first wavelength range corresponding to the first emission peak wavelength (734nm) of the first light, the second wavelength range corresponding to the second emission peak wavelength (810nm) of the second light, and the third wavelength range corresponding to the third emission peak wavelength (882nm) of the third light. The first and second emission peak wavelengths are adjacent, and similarly, the second and third emission peak wavelengths are also adjacent. The first wavelength range corresponding to the first emission peak wavelength is between 660nm and 780nm, and the second wavelength range corresponding to the second emission peak wavelength of the second light is between 710nm and 850nm. The first and second wavelength ranges partially overlap between 710nm and 780nm, thus forming a continuous wavelength range between 660nm and 850nm. Similarly, the second wavelength range corresponding to the second emission peak wavelength is between 710 nm and 850 nm, and the third wavelength range corresponding to the third emission peak wavelength of the third light is between 780 nm and 940 nm. The second and third wavelength ranges partially overlap between 780 nm and 850 nm, thus forming a continuous wavelength range between 710 nm and 940 nm. In this invention, the less overlap between the multiple wavelength ranges of the two light-emitting diodes corresponding to two adjacent emission peak wavelengths, the better. Of course, the multiple wavelength ranges of the two light-emitting diodes corresponding to two adjacent emission peak wavelengths may not overlap, as will be explained later.

[0104] The wavelength difference between two adjacent emission peaks is greater than or equal to 1 nm, preferably between 1 nm and 80 nm, and more preferably between 5 nm and 80 nm. Figure 2 In this embodiment, the adjacent first emission peak wavelength (734 nm) and the second emission peak wavelength (810 nm) differ from each other by 76 nm, and the adjacent second emission peak wavelength (810 nm) and the third emission peak wavelength (882 nm) differ from each other by 72 nm. Unless otherwise specified, the numerical ranges defined in this invention and the claims always include end values. For example, the aforementioned difference between two adjacent emission peak wavelengths being between 5 nm and 80 nm means greater than or equal to 5 nm and less than or equal to 80 nm.

[0105] Please refer to the following: Figure 3The second embodiment is a derivative embodiment of the first embodiment, therefore, the similarities between the second and first embodiments will not be repeated. The difference between the second and first embodiments lies in that the light-emitting device 12 in the second embodiment includes five light-emitting diodes: a first light-emitting diode 121, a fourth light-emitting diode 1211 emitting a fourth ray with a fourth wavelength range, a second light-emitting diode 122, a fifth light-emitting diode 1221 emitting a fifth ray with a fifth wavelength range, and a third light-emitting diode 123. The fourth ray has a fourth emission peak wavelength (772nm) within the fourth wavelength range, and the fifth ray has a fifth emission peak wavelength (854nm) within the fifth wavelength range. Figure 3 In the figure, the emission peak wavelengths, in ascending order, are the first emission peak wavelength (734nm), the fourth emission peak wavelength (772nm), the second emission peak wavelength (810nm), the fifth emission peak wavelength (854nm), and the third emission peak wavelength (882nm). The adjacent first emission peak wavelength (734nm) and the fourth emission peak wavelength (772nm) differ from each other by 38nm, the adjacent fourth emission peak wavelength (772nm) and the second emission peak wavelength (810nm) differ from each other by 38nm, the adjacent second emission peak wavelength (810nm) and the fifth emission peak wavelength (854nm) differ from each other by 44nm, and the adjacent fifth emission peak wavelength (854nm) and the third emission peak wavelength (882nm) differ from each other by 28nm.

[0106] Please refer to the following: Figure 4 The third embodiment is a derivative embodiment of the first and second embodiments; therefore, the similarities between the third embodiment and the first and second embodiments will not be repeated. The difference between the third embodiment and the first embodiment is that the light-emitting device 12 in the second embodiment includes 12 light-emitting diodes. Figure 4In this embodiment, the peak emission wavelengths of the 12 light-emitting diodes, from smallest to largest, are 734nm (the first peak emission wavelength), 747nm, 760nm, 772nm (the fourth peak emission wavelength), 785nm, 798nm, 810nm (the second peak emission wavelength), 824nm, 839nm, 854nm (the fifth peak emission wavelength), 867nm, and 882nm (the third peak emission wavelength). The difference between adjacent peak emission wavelengths of these 12 light-emitting diodes is sequentially 13nm, 13nm, 12nm, 13nm, 13nm, 12nm, 14nm, 15nm, 15nm, 13nm, and 15nm. If the light-emitting element in Embodiments 1, 2, and 3 is replaced with a laser diode, the difference between adjacent peak emission wavelengths can be greater than or equal to 1nm, for example, 1nm.

[0107] At least a portion of the multiple emission peak wavelengths have a half-width at half-maximum (WHM) greater than 0 nm and less than or equal to 60 nm. Preferably, the WHM of each emission peak wavelength is greater than 0 nm and less than or equal to 60 nm. For example, in the aforementioned Embodiments 1, 2, and 3, the emission peak wavelengths, in ascending order, are 734 nm (the first emission peak wavelength), 747 nm, 760 nm, 772 nm (the fourth emission peak wavelength), 785 nm, 798 nm, 810 nm (the second emission peak wavelength), 824 nm, 839 nm, 854 nm (the fifth emission peak wavelength), 867 nm, and 882 nm (…). The full width at half maximum (FWHM) of the wavelengths corresponding to the first emission peak wavelength of the first ray, the second emission peak wavelength of the second ray, the third emission peak wavelength of the third ray, the fourth emission peak wavelength of the fourth ray, and the fifth emission peak wavelength of the fifth ray are greater than 0 nm and less than or equal to 60 nm, preferably between 15 nm and 50 nm, and more preferably between 15 nm and 40 nm. The FWHM of the wavelengths corresponding to the emission peak wavelengths of 747 nm, 760 nm, 785 nm, 798 nm, 824 nm, 839 nm, and 867 nm (not specified) are also specified. Figure 4 The wavelength is greater than 0 nm and less than or equal to 60 nm, preferably between 15 nm and 50 nm, and more preferably between 15 nm and 40 nm. In the experimental operation of this invention, the half-width at half maximum (WHM) of the wavelength corresponding to the emission peak wavelength in the aforementioned Examples 1, 2, and 3 is 55 nm; if the light-emitting element is a laser diode, the WHM of the wavelength corresponding to each emission peak wavelength is greater than 0 nm and less than or equal to 60 nm, for example, 1 nm.

[0108] The wavelength ranges of the two light-emitting diodes corresponding to the two adjacent emission peak wavelengths may not overlap. For example, if the half-width at half maximum (WHM) of each emission peak wavelength in Embodiments 1, 2, and 3 is 15 nm, the width of the wavelength range corresponding to each emission peak wavelength (i.e., the difference between the maximum and minimum values ​​of the wavelength range) is 40 nm, and the wavelength ranges of two adjacent emission peak wavelengths differ from each other by 80 nm. Alternatively, if the light-emitting element is a laser diode, the WHM of each emission peak wavelength is 1 nm, the width of the wavelength range is 4 nm, and the wavelength ranges of two adjacent emission peak wavelengths differ from each other by 5 nm, then the wavelength ranges of the two light-emitting elements (laser diodes) corresponding to the two adjacent emission peak wavelengths do not overlap.

[0109] Preferably, when the spectrometer 1 is operated in Embodiments 1, 2, and 3 to detect the analyte A and generate the analyte spectrum, as described above, the light source controller 11 can control and cause the plurality of light-emitting diodes to emit discontinuous light at the respective on / off frequencies. The plurality of on / off frequencies can be the same or different from each other, or they can be partially the same or partially different. The aforementioned on / off frequencies are between 0.05 times / second and 50,000 times / second. The time interval during which the light-emitting diode is turned on (lit) within the on / off frequency is between 0.00001 seconds and 10 seconds. The time interval for turning off the LED is between 0.00001 seconds and 10 seconds. The period of the on / off frequency refers to the sum of the time interval for continuously turning on (lighting up) the LED and the time interval for turning off (turning off) the LED. The period of the on / off frequency is the reciprocal of the on / off frequency. In other words, the period of the on / off frequency can be understood as the sum of a lighting time interval followed by an immediate and uninterrupted turning off time interval for multiple LEDs. The lighting time interval is between 0.00001 seconds and 10 seconds, and the turning off time interval is between 0.00001 seconds and 10 seconds. Preferably, the on / off frequency is between 0.5 times / second and 50,000 times / second; more preferably, the on / off frequency is between 5 times / second and 50,000 times / second. The discontinuous emission of multiple light-emitting diodes (LEDs) significantly reduces the impact of the heat energy emitted by the light on the analyte A, preventing qualitative changes in the analyte A containing organic matter. Therefore, it is particularly suitable for heat-sensitive analytes A, and especially suitable when the light emitted by the LEDs is near-infrared. A mathematical analysis module M is located in the photodetector 13 (…). Figure 5A ) or the calculator 14 ( Figure 5B The mathematical analysis module M is related to the photodetector 13. Figure 5A Electrical or signal connection, or the mathematical analysis module M is connected to the calculator 14 ( Figure 5B The optical detector 13 is electrically or signal-connected, and the mathematical analysis module M can be in software or hardware form. The signal collected by the photodetector 13 is transmitted to the mathematical analysis module M. When the spectrometer 1 is operated to detect the analyte A to generate the analyte spectrum, multiple light-emitting diodes (LEDs) can be turned on or off simultaneously at the same on / off frequency. During the time interval when the LEDs are turned on (lit up) within the on / off frequency, the signal received by the photodetector 13 is a combination of the analyte spectrum signal and background noise (or background noise). During the time interval when the LEDs are turned off (extinguished) within the on / off frequency, the signal received by the photodetector 13 is the background noise. Please refer to [further details omitted]. Figure 6A The spectrometer 1 operates in a discontinuous emission mode with the flashing frequency to detect the analyte A. The combination of the analyte spectral signal and background noise, along with the background noise, forms a time-domain signal and a time-domain signal graph of the analyte. The analyte spectral signal and background noise collected by the photodetector 13 are transmitted to the mathematical analysis module M. The mathematical analysis module M processes the analyte time-domain signal and discards the background noise. For example, the mathematical analysis module M includes a time-domain to frequency-domain conversion unit M1 that converts the analyte time-domain signal into a analyte frequency-domain signal. Figure 5A The time-domain to frequency-domain conversion unit M1 can be a Fourier transform unit used to perform a Fourier transform on the time-domain signal of the test object to obtain a frequency-domain signal of the test object. Please refer to the diagram of the transformed frequency-domain signal of the test object and a graph of the frequency-domain signal of the test object. Figure 6B The frequency domain signal of the analyte can be easily distinguished into the frequency domain signal of the analyte's spectral signal and the frequency domain signal of the background noise. Figure 6B In the above context, the frequency domain signal with a peak value at 0Hz or a frequency domain signal with a peak value lower than that flare frequency is the frequency domain signal of the background noise; while... Figure 6BIn the spectrum, apart from the frequency domain signal with a peak at 0Hz (the frequency domain signal of the background noise), the remaining peak signals are the frequency domain signals of the spectral signal of the analyte. Preferably, in the frequency domain signal of the analyte, the frequency domain signals greater than or equal to the flare frequency are the frequency domain signals of the spectral signal of the analyte. The mathematical analysis module M discards the frequency domain signal of the background noise and retains the frequency domain signal of the spectral signal of the analyte to achieve a filtering effect. Since the mathematical analysis module M discards the frequency domain signal of the background noise, the remaining frequency domain signal of the spectral signal of the analyte belongs entirely to the analyte and does not contain the background signal. Therefore, compared with traditional spectrometers, the optical detection device 1 of the present invention not only improves the signal-to-noise ratio of the analyte in the spectrum, but also achieves a background noise-free spectrum by discarding the frequency domain signal of the background noise for filtering. Please refer again. Figure 5A and Figure 5B The microcontroller 111 of the light source controller 11 can be electrically or signal-connected to the mathematical analysis module M to synchronously transmit the on / off frequency, the time interval during which the light-emitting diode is turned on (lit) within the on / off frequency, and the time interval during which the light-emitting diode is turned off (extinguished) within the on / off frequency to the mathematical analysis module M. This allows the microcontroller 111 to turn on or off multiple light-emitting diodes electrically connected to the microcontroller 111 according to the on / off frequency, the time interval during which the light-emitting diode is turned on (lit) within the on / off frequency, and the time interval during which the light-emitting diode is turned off (extinguished) within the on / off frequency. In this case, the mathematical analysis module M can correspond the time interval during which the light-emitting diode is turned on (lit) within the on / off frequency to the spectral signal of the analyte, and the mathematical analysis module M can correspond the time interval during which the light-emitting diode is turned off (extinguished) within the on / off frequency to the background noise.

[0110] It should be noted that the waveform of multiple LEDs exhibiting discontinuous light emission at this on / off frequency is a square wave, a sine wave, or a negative sine wave.

[0111] Furthermore, the mathematical analysis module M can also process the frequency domain signal of the spectral signal of the test object remaining after the aforementioned filtering effect, converting the frequency domain signal of the spectral signal of the test object into a filtered time domain signal of the test object and a filtered time domain signal graph of the test object. The filtered time domain signal of the test object contains only the filtered spectral signal of the test object and does not contain the background noise. For example, the mathematical analysis module M includes a frequency-time domain conversion unit M2 that converts the frequency domain signal of the spectral signal of the test object remaining after the aforementioned filtering into a filtered time domain signal of the test object. Figure 5BThe frequency-to-time conversion unit M2 can be an inverse Fourier transform unit used to perform an inverse Fourier transform on the frequency domain signal of the spectral signal of the analyte obtained above, resulting in a filtered time domain signal of the analyte. Please refer to the diagram of the filtered time domain signal of the analyte. Figure 6C .Compare Figure 6A and Figure 6C It is obvious that, Figure 6C In the filtered time-domain signal graph of the test object, only the spectral signal of the test object exists and it exhibits a square wave. Furthermore, no background noise is present in the filtered time-domain signal graph. In other words, in Figure 6C Since the background signal is zero, dividing the filtered spectral signal of the analyte by the background signal will result in an infinitely large signal-to-noise ratio (SNR). Therefore, this invention improves the SNR in the spectral image of the sample (analyte) detection result, achieving accurate testing. It is particularly noteworthy that the mathematical analysis module M, the time-domain-frequency-domain conversion unit M1, and the frequency-domain-time-domain conversion unit M2 can be software or hardware, or a combination of both. The mathematical analysis module M, the time-domain-frequency-domain conversion unit M1, and the frequency-domain-time-domain conversion unit M2 are electrically or signal-connected to each other.

[0112] Wavelength resolution testing in comparative and application examples

[0113] Comparative Example 1 uses a conventional spectrometer, model SE-2020-050-VNIR, manufactured by Taiwan Advanced Micro Optics Co., Ltd., which uses a halogen tungsten lamp as the light source and a grating to achieve a wavelength resolution of 1 nm. It detects the reflectance spectral signals of two different materials: a 5cm long, 5cm wide, and 0.2mm thick sheet of PVC (polyvinyl chloride) coated with zinc oxide, and a 5cm long, 5cm wide, and 0.2mm thick sheet of PVC coated with a mixture of zinc oxide and iron oxide. Based on the acquired spectral image data, similarity (difference) analysis technology, namely spectral angle matching (SAM), is used to analyze the similarity between the two materials. The SAM analysis result is 96.00%. Figure 7A ).

[0114] Application Examples 1, 2, and 3 respectively use the light-emitting device and light-detection device of Examples 1, 2, and 3. The on / off frequency is approximately 90.90 times / second, the time interval for turning on (lighting up) the light-emitting diode within this on / off frequency is 1 millisecond (1 ms), and the time interval for turning off (extinguishing) the light-emitting diode within this on / off frequency is 10 milliseconds (10 ms). A photodetector identical to the SE-2020-050-VNIR model from Taiwan Supermicro Optics Co., Ltd. was used to detect the reflectance spectral signals of two different materials: a 5cm long, 5cm wide, and 0.2mm thick sheet of PVC board coated with zinc oxide paint, and a 5cm long, 5cm wide, and 0.2mm thick sheet of PVC board coated with a mixture of zinc oxide and iron oxide paint. Then, based on the obtained spectral image data, SAM processing analysis technology was used to perform similarity analysis on the two different materials, zinc oxide and zinc oxide / iron oxide. The SAM analysis results were 97.69% (…). Figure 7B ), 97.48% Figure 7C ) and 96.54% Figure 7D The wavelength resolution of the light-emitting devices and light-detecting devices in Examples 1, 2, and 3 is close to 96.00% of that of the conventional spectrometer in Comparative Example 1. Therefore, the wavelength resolution characteristics of the light-emitting devices and light-detecting devices in Examples 1, 2, and 3 used in Examples 1, 2, and 3 can replace the wavelength resolution characteristics of the conventional spectrometer.

[0115] Therefore, based on the aforementioned light-emitting device 12 and light-detecting device 1, please refer to... Figure 8 The present invention provides a light-emitting method, which sequentially includes the following steps: providing a light-emitting element S01 and a light-emitting step S02.

[0116] Step S01 of providing the light-emitting element involves providing a plurality of light-emitting elements, each emitting light having at least one emission peak wavelength and at least one wavelength range. The wavelength ranges of two adjacent light-emitting elements corresponding to two adjacent emission peak wavelengths partially overlap to form a continuous wavelength range wider than the wavelength range of each of the plurality of light-emitting elements; alternatively, the wavelength ranges of two adjacent light-emitting elements corresponding to two adjacent emission peak wavelengths do not overlap. The difference between two adjacent emission peak wavelengths is greater than or equal to 1 nm, and the half-width at half-maximum (WHM) of each emission peak wavelength is greater than 0 nm and less than or equal to 60 nm. The light-emitting element can be a light-emitting diode, a vertical-cavity surface-emitting laser, or a laser diode. Preferably, the difference between two adjacent emission peak wavelengths is between 1 nm and 80 nm, and preferably between 5 nm and 80 nm. Preferably, the WHM of each emission peak wavelength is between 15 nm and 50 nm, and preferably between 15 nm and 40 nm.

[0117] The light-emitting step S02 involves controlling and causing the plurality of light-emitting elements to emit discontinuous light at a flashing frequency. This flashing frequency is between 0.05 times / second and 50,000 times / second. The time interval for turning on the light-emitting element within this flashing frequency is between 0.00001 seconds and 10 seconds, and the time interval for turning off the light-emitting element within this flashing frequency is also between 0.00001 seconds and 10 seconds. Preferably, the flashing frequency is between 0.5 times / second and 50,000 times / second; more preferably, the flashing frequency is between 5 times / second and 50,000 times / second.

[0118] Please also refer to the aforementioned light-emitting device 12, light-detecting device 1, and light-emitting method. Figure 9 The present invention provides a spectral detection method, which, in addition to the step of providing a light-emitting element S01 and the light-emitting step S02 of the light-emitting method in sequence, also includes a filtering step S03 and an inverse conversion step S04 in sequence after the light-emitting step S02.

[0119] The filtering step S03 involves receiving a spectral signal of a test object and background noise. During the time interval when the light-emitting element is turned on (lit) in the on / off frequency, the received signal is a combination of the spectral signal of the test object and the background noise. During the time interval when the light-emitting element is turned off (extinguished) in the on / off frequency, the received signal is the background noise. The spectral signal of the test object and the background noise constitute a time domain signal of the test object. The time domain signal of the test object is Fourier transformed into a frequency domain signal of the test object. The frequency domain signal of the test object is distinguished into the frequency domain signal of the spectral signal of the test object and the frequency domain signal of the background noise. Then, the frequency domain signal of the background noise is discarded and the frequency domain signal of the spectral signal of the test object is retained to achieve the filtering effect.

[0120] The inverse transformation step S04: Perform an inverse Fourier transform on the frequency domain signal of the spectral signal of the analyte left above to obtain a filtered time domain signal of the analyte.

[0121] [Information-to-Novelty Ratio Test]

[0122] Application Example 4 uses the light-emitting device and light detection device of Example 3. The on / off frequency is approximately 100 times / second. The time interval for turning on (lighting up) the light-emitting diode within this on / off frequency is 5 milliseconds (5ms), and the time interval for turning off (extinguishing) the light-emitting diode within this on / off frequency is also 5 milliseconds (5ms). Therefore, the period of this on / off frequency is 10 milliseconds (10ms). Using the same photodetector as the SE-2020-050-VNIR model from Taiwan Supermicro Optics Co., Ltd., the reflectance spectral signal of a 5cm long, 5cm wide, and 0.2mm thick sheet of PVC board coated with zinc oxide is detected according to the aforementioned spectral detection method. The time-domain signal of the test object, composed of the spectral signal of the test object and the background noise, and the time-domain signal graph of the test object are shown below. Figure 6A The waveform of multiple LEDs exhibiting discontinuous illumination at the on / off frequency is a square wave. Next, the time-domain signal of the test object is converted into a frequency-domain signal and a frequency-domain signal graph of the test object through the Fourier transform in filtering step S03, as shown in the figure. Figure 6B The frequency domain signal of the analyte can be easily distinguished into the frequency domain signal of the analyte's spectral signal and the frequency domain signal of the background noise. For example, the period of the flashing frequency is 10ms, therefore the corresponding frequency is 100Hz. Figure 6BThe frequency domain signal with a frequency greater than or equal to 100Hz is the frequency domain signal of the spectral signal of the analyte, while the frequency domain signal at 0Hz or less than 100Hz is the frequency domain signal of the background noise. In filtering step S03, the frequency domain signal of the background noise is discarded, and the frequency domain signal of the spectral signal of the analyte is retained. Next, inverse conversion step S04 performs an inverse Fourier transform on the previously retained frequency domain signal of the analyte's spectral signal to obtain the filtered time domain signal of the analyte. Figure 6C The discontinuous square wave in the image and the time-domain signal of the object under test after filtering are shown in the figure. Figure 6C Obviously in Figure 6C Since no background signal is present (or the background signal can be considered zero), the signal-to-noise ratio will be infinitely large, thus achieving the effect of accurate testing.

[0123] The plurality of light-emitting diodes are each supplied with a current density such that the emitted light has a luminous intensity; the plurality of current densities may be the same or different from each other, or the plurality of current densities may be partially the same or partially different; alternatively, the plurality of luminous intensities may be the same or different from each other, or the plurality of luminous intensities may be partially the same or partially different. Preferably, the plurality of current densities are different from each other, or the plurality of current densities are partially different. Another method to improve the signal-to-noise ratio is also described in detail below. Figure 10A The light source controller 11 also includes a current controller 113 electrically connected to the microcontroller 111. The current density is generated by the current controller 113 and the current density signal is transmitted to the microcontroller 111. The microcontroller 111 then provides a corresponding current density to a plurality of light-emitting diodes electrically connected to the microcontroller 111, such as the first light-emitting diode 121, the second light-emitting diode 122, the third light-emitting diode 123, the fourth light-emitting diode 1211, and the fifth light-emitting diode 1221. For example, a first current density is supplied so that the first light emitted by the first LED 121 has a first luminous intensity; a second current density is supplied so that the second light emitted by the second LED 122 has a second luminous intensity; a third current density is supplied so that the third light emitted by the third LED 123 has a third luminous intensity; a fourth current density is supplied so that the fourth light emitted by the fourth LED 1211 has a fourth luminous intensity; and a fifth current density is supplied so that the fifth light emitted by the fifth LED 1221 has a fifth luminous intensity. It is particularly noteworthy that the current controller 113 can also be a current density module integrated within the microcontroller 111 to generate the current density. This current density module can be in software or hardware form, thus eliminating the need for a separate current controller 113 external to the microcontroller 111.

[0124] In practical operation, another light emission method can be used. This method, in addition to sequentially including the aforementioned steps S01 (providing the light-emitting element) and S02 (light emission step), further includes, after S02, a step S021 (obtaining an initial spectral energy distribution curve) and a current density adjustment step S022. The aforementioned spectral detection method can be modified so that, after the current density adjustment step S022, it can also sequentially include a filtering step S03 and a reverse conversion step S04. Please refer to [link to relevant documentation]. Figure 10B .

[0125] The initial spectral energy distribution curve is obtained in step S021: First, the current is supplied to multiple light-emitting diodes at the same current density. Figure 10A In the absence of the analyte A, the initial spectral energy distribution curve of the light-emitting device 12 is measured by the photodetector 13 and the calculator 14 as follows: Figure 10C As shown. In Figure 10C The image shows the first wavelength range corresponding to the first emission peak wavelength (734 nm) of the first light beam, with a corresponding first emission intensity of 6.8 x 10⁶ (au); and the fourth wavelength range corresponding to the fourth emission peak wavelength (772 nm) of the fourth light beam, with a corresponding fourth emission intensity of 17.7 x 10⁷ (au). Since the background noise is a fixed value and the fourth emission intensity is greater than the first emission intensity, the signal-to-noise ratio (SNR) of the fourth wavelength range is obviously higher than that of the first wavelength range.

[0126] The current density adjustment step S022: Next, a specific value and the corresponding light-emitting diode are selected from a plurality of light-emitting intensities, usually the one with the largest value, for example in... Figure 10C The fourth luminous intensity and the corresponding fourth light-emitting diode 1211 are then considered. Next, the current density corresponding to the unselected light-emitting diode is increased or decreased, so that the luminous intensity corresponding to the unselected light-emitting diode is the same as or close to the luminous intensity corresponding to the selected light-emitting diode. Figure 10C For example, if the unselected LED is the first LED 121, the first current density corresponding to the first LED 121 is increased so that the first luminous intensity corresponding to the unselected first LED 121 is the same as or close to the fourth luminous intensity corresponding to the selected fourth LED 1211, which is 17.7 x 10⁷ (au). This improves the signal-to-noise ratio in the first wavelength range. Please refer to [link to relevant documentation]. Figure 10D The diagram shows the spectral energy distribution curve after adjusting the first current density. Alternatively, the current density corresponding to each of the other unselected LEDs can be increased or decreased so that the luminous intensity of each unselected LED is the same as or close to the luminous intensity of the selected LED, for example, the same as or close to the fourth luminous intensity of the selected fourth LED 1211, which is 17.7 x 10⁷ (au). This improves the signal-to-noise ratio (SNR) of each unselected LED in that wavelength range and makes the SNR of multiple wavelength ranges nearly uniform. Please refer to [link to relevant documentation]. Figure 10E The image shows the spectral energy distribution curves after adjusting the current density of each of the other unselected LEDs.

[0127] Since the luminous intensity of each LED is inversely related to its junction temperature, and considering the heat dissipation issue, the junction temperature increases with the continuous operating time at the current density, leading to a decrease in luminous intensity. Therefore, it is necessary to correct the luminous intensity using a luminous intensity correction method. This luminous intensity correction method sequentially includes a correction relationship acquisition step P01, a forward bias voltage measurement step P02, a proportional relationship acquisition step P03, and a correction completion step P04. This luminous intensity correction method can be continued after the luminous intensity correction method. The filtering step S03 and the inverse conversion step S04 of the aforementioned spectral detection method are followed by the luminous intensity correction method. Please refer to [link to relevant documentation]. Figure 11A .

[0128] Correction relationship acquisition step P01: Obtain the mathematical formula, corresponding table, or graph of the luminous intensity or relative intensity of each LED versus the junction temperature. This is typically provided by the LED manufacturer. Please refer to [link to relevant documentation]. Figure 11B The diagram shows the relative intensity of the fourth LED 1211 versus the junction temperature. The peak wavelength of the fourth LED 1211 at a junction temperature of 25 degrees Celsius is 772 nm, and the relative intensity is calculated at 100%. Additionally, mathematical expressions, tables, or graphs relating the forward voltage of each LED to the junction temperature are also provided. The peak wavelength of the fourth LED 1211 at a junction temperature of 25 degrees Celsius is 772 nm, and the forward bias is 2 volts. Please refer to [link / reference]. Figure 11CThe diagram shows the relationship between the forward bias voltage and the junction temperature of the fourth light-emitting diode 1211. The mathematical formulas, tables, or diagrams relating the luminous intensity or relative intensity to the junction temperature, and the mathematical formulas, tables, or diagrams relating the forward bias voltage of the light-emitting diode to the junction temperature, can be obtained by referring to the method disclosed in [Journal of Science and Engineering Technology, Vol.3, No.4, pp.99-103 (2007)] and Taiwan Patent Publication No. 200818363, therefore, they will not be elaborated here.

[0129] The forward bias voltage measurement step P02 involves simultaneously measuring the forward bias voltage of the LED during the time interval during which the LED is turned on (lit), for example, during the time interval of the on / off frequency. For example, in the aforementioned embodiments two and three, the on / off frequency of the fourth LED 1211 is approximately 90.90 times / second, the time interval during which the LED is turned on (lit) at the on / off frequency is 1 millisecond (1 ms), and the time interval during which the LED is turned off (extinguished) at the on / off frequency is 10 milliseconds (10 ms). During the time interval during which the fourth LED 1211 is turned on (lit) at the on / off frequency, the forward bias voltage of the fourth LED 1211 is measured to be 1.9 volts.

[0130] Step P03 for obtaining the proportional relationship: The measured forward bias voltage is compared with the aforementioned mathematical formula, table, or graph relating the forward bias voltage of the LED to the junction temperature to calculate the junction temperature. For example, if the measured forward bias voltage of the fourth LED 1211 is 1.9 volts, and the value is compared with… Figure 11C The temperature of the junction was determined to be 50 degrees Celsius. Next, the calculated junction temperature was compared with the aforementioned mathematical relationship, table, or graph between the luminous intensity or relative intensity and the junction temperature to calculate the luminous intensity or relative intensity. For example, given the junction temperature of 50 degrees Celsius, the luminous intensity or relative intensity was calculated... Figure 11B The relative intensity of the fourth LED 1211 is then determined to be 83%. Further, this calculated luminous intensity or relative intensity is compared with the luminous intensity or relative intensity at a specific junction temperature, as shown in the mathematical relationship, correspondence table, or graph between the luminous intensity or relative intensity and the junction temperature, to obtain a proportional relationship. For example, if the specific junction temperature is 25 degrees Celsius, and the relative intensity of the fourth LED 1211 at 25 degrees Celsius is 100%, dividing this 100% relative intensity at 25 degrees Celsius by the 83% relative intensity at 50 degrees Celsius yields a ratio of 1.20.

[0131] The completion of correction step P04 involves multiplying the luminous intensity of the light-emitting diode (LED) within the wavelength range in the initial spectral energy distribution curve by the proportional relationship to correct the luminous intensity; or, multiplying the measured spectral signal related to the wavelength range of the LED by the proportional relationship to correct the spectral signal. The spectral signal within the wavelength range can be the time-domain signal of the analyte, composed of the spectral signal of the analyte and the background noise. For example, the photodetector 13 or the calculator 14 multiplies the fourth luminous intensity 17.7 x 10⁷ (au) corresponding to the fourth LED 1211 by the proportional relationship of 1.20, and the resulting luminous intensity can be considered as the luminous intensity of the fourth LED 1211 at that specific junction temperature (25 degrees Celsius).

[0132] Specifically, this invention involves sequentially or simultaneously performing the light emission correction method on at least one, a portion of, or all of the plurality of light-emitting diodes in the light-emitting device 12. Preferably, this invention performs the light emission correction method on all the light-emitting diodes simultaneously, so that the resulting spectral energy distribution curve can be regarded as the spectral energy distribution curve at that specific junction temperature (25 degrees Celsius), and the resulting spectral signal can be regarded as the spectral signal at that specific junction temperature (25 degrees Celsius).

[0133] For accurate measurement of the entire surface or internal composition of the object under test, please refer to the following: Figure 12A and Figure 12B The light-emitting device 12 of the light detection device 1 is rotatable relative to the object A being tested. Please refer to [link / reference]. Figure 12AThe light-emitting device 12 can also be connected to a rotating device 15. The rotating device 15 drives multiple light-emitting elements to revolve around a central axis, thus causing the light-emitting device 12 to rotate relative to the object under test A. This central axis can be a physical axis or a virtual axis. In other words, the light-emitting device 12 is capable of rotation. For example, the rotating device 15 can be a motor electrically connected to the microcontroller 111. The rotating device 15 drives a rotating shaft 151 to rotate. One end of the rotating shaft 151 is connected to the circuit board 120 of the light-emitting device 12. Therefore, the rotating shaft 151 can be regarded as the central axis. At least some of the multiple light-emitting elements are not in the extension direction of the central axis. Therefore, the multiple light-emitting elements not in the extension direction of the central axis revolve around the central axis. If multiple regions of the test object A have slightly different components, for example, a first region A1 and a second region A2 of the test object A have slightly different components, when the first light-emitting diode 121 forms a first relative position with the first region A1 ( Figure 12A In other words, the light-emitting device 12 and the test object A form the first relative position. The first light-emitting diode 121 is relatively close to the first region A1 and relatively far from the second region A2. The first light emitted by the first light-emitting diode 121, having the first wavelength range, penetrates both the first region A1 and the second region A2 and is received by the photodetector 13. The photodetector 13 converts the received first light into a spectral signal of the test object at the first relative position and transmits this spectral signal to the calculator 14. Please refer to... Figure 12B When the first light-emitting diode 121 revolves around its axis of rotation and forms a second relative position with the first region A1, that is, when the light-emitting device 12 and the object to be tested A form this second relative position, the first light-emitting diode 121 is closer to the second region A2 and farther from the first region A1. The first light emitted by the first light-emitting diode 121, having the first wavelength range, penetrates both the first region A1 and the second region A2 and is received by the photodetector 13. The photodetector 13 converts the received first light into a spectral signal of the object to be tested at the second relative position and transmits this spectral signal to the calculator 14. The calculator 14 calculates the average value of the spectral signals of the object to be tested at the first and second relative positions to obtain the aforementioned spectral signal of the object to be tested. Similarly, the second light-emitting diode 122 also revolves from the first relative position to the second relative position around its axis of rotation. In this way, there will be no problem of distortion of the spectral signal of the analyte A due to the presence of slightly different components in multiple regions.

[0134] When the light-emitting device 12 and the test object A form the first relative position, as mentioned above, multiple light-emitting diodes can be turned on or off simultaneously according to actual needs, or one or some of the light-emitting diodes can be turned on or off selectively, or multiple light-emitting diodes can be turned on or off sequentially, or any of the above methods can be turned on or off in the manner of the on / off frequency. The photodetector 13 converts the received light L into the spectral signal of the test object at the first relative position and transmits the spectral signal of the test object at the first relative position to the calculator 14. Next, when the light-emitting device 12 and the object A to be tested form the second relative position, similarly, multiple light-emitting diodes can be turned on or off simultaneously according to actual needs, or only one or some of the light-emitting diodes can be turned on or off selectively, or multiple light-emitting diodes can be turned on or off sequentially, or any of the above methods can be turned on or off at the on / off frequency. The photodetector 13 converts the received light L into a spectral signal of the object to be tested at the second relative position and transmits the spectral signal of the object to be tested at the second relative position to the calculator 14. The calculator 14 calculates the average value of the spectral signal of the object to be tested at the first relative position and the spectral signal of the object to be tested at the second relative position to obtain the aforementioned spectral signal of the object to be tested.

[0135] To more accurately measure the object A, in practical applications, the light-emitting device 12 and the object A can form multiple relative positions. At each relative position, multiple light-emitting diodes can be turned on or off simultaneously according to actual needs, or one or some light-emitting diodes can be turned on or off selectively, or multiple light-emitting diodes can be turned on or off sequentially, or any of the above methods can be turned on or off at the specified on / off frequency. The photodetector 13 converts the received light L into a spectral signal of the object A at the relative position and transmits this spectral signal to the calculator 14. The calculator 14 calculates the average value of the spectral signals of the object A at the multiple relative positions to obtain the aforementioned spectral signal of the object A. For example, the microcontroller 111 controls the rotation of the rotating shaft 151 of the rotating device 15, so that the multiple light-emitting elements of the light-emitting device 12 rotate at a predetermined angle around the revolution axis. For example, each 10-degree rotation is a relative position. Therefore, there are a total of 36 relative positions in the entire 360-degree revolution. The calculator 14 calculates the average value of the spectral signals of the test object at the 36 relative positions to obtain the aforementioned spectral signal of the test object.

[0136] Similarly, please refer to the following: Figure 12CAlternatively, the object to be tested A can be connected to the rotating device 15, which drives the object to be tested A to rotate around a rotation axis A0, thus causing the light-emitting device 12 to rotate relative to the object to be tested A. The rotation axis A0 can be a physical rotation axis or a virtual rotation axis. Figure 12C The rotating device 15 drives the rotating shaft 151 to rotate, and the rotating shaft 151 drives the test object A to rotate via gears. The normal to the center of the test object A is the virtual axis of rotation, namely the axis of rotation A0. Similarly, for example, the microcontroller 111 controls the rotation of the rotating device 15, so that the test object A moves in 10-degree increments around the axis of rotation A0. Therefore, there are a total of 36 relative positions in a full 360-degree rotation. The calculator 14 calculates the average value of the spectral signals of the test object at the 36 relative positions to obtain the aforementioned spectral signal of the test object.

[0137] Even if multiple regions of the test object A contain the same composition, if the surface of the test object A cannot be kept parallel to the light-emitting device 12, the distances between the first light-emitting diode 121 and the second light-emitting diode 122 and the test object A will be different. This will cause distortion of the spectral signal of the test object generated by the first light from the first light-emitting diode 121 and the second light from the second light-emitting diode 122. Please refer to [further details omitted]. Figure 12D The light-emitting device 12 of this invention is rotatable relative to the object A under test, and the light-emitting device 12 and the object A under test can form multiple relative positions. The photodetector 13 converts the received light L into a spectral signal of the object under test at each relative position and transmits this spectral signal to the calculator 14. The calculator 14 calculates the average value of the spectral signals of the object under test at multiple relative positions to obtain the aforementioned spectral signal of the object under test. Thus, the problem of distortion of the spectral signal of the object under test caused by the different distances between the multiple light-emitting elements of the light-emitting device 12 and the object A under test is avoided.

[0138] Similarly, please refer to the following: Figure 12EThe light-emitting device 12 and the photodetector 13 are disposed on the same side of the object to be tested A. For example, the light-emitting device 12 and the photodetector 13 are disposed above the object to be tested A to measure the reflectance spectral signal of the object to be tested A. The distances between the first light-emitting diode 121 and the second light-emitting diode 122 and the object to be tested A are not the same, which will cause distortion of the spectral signal of the object to be tested generated by the first light ray of the first light-emitting diode 121 and the second light ray of the second light-emitting diode 122. The light-emitting device 12 of the present invention can rotate relative to the object to be tested A. For example, two rotating devices 15 are provided, so that the plurality of light-emitting elements revolve around the revolution axis (the rotation axis 151), and the object to be tested A rotates around the rotation axis A0. The light-emitting device 12 and the object A to be tested can form multiple relative positions. The photodetector 13 converts the received light L into a spectral signal of the object A at each relative position and transmits this spectral signal to the calculator 14. The calculator 14 calculates the average of the spectral signals of the object A at multiple relative positions to obtain the aforementioned spectral signal of the object A. This avoids the problem of spectral signal distortion caused by the different distances between the multiple light-emitting elements of the light-emitting device 12 and the object A to be tested.

[0139] As can be seen from the above description, compared with the prior art and products, the light-emitting device, light-emitting method, light detection device, spectral detection method and light-emitting correction method provided by the present invention provide sample resolution results that are close to the high-resolution results of using a traditional halogen tungsten lamp spectrometer, and at the same time improve the signal-to-noise ratio in the spectrum of the sample detection results, thus achieving the effect of accurate testing.

[0140] In summary, the light-emitting device, light-emitting method, light detection device, spectral detection method, and light-emitting correction method of the present invention can achieve the expected technical effects. Furthermore, since the present invention was not disclosed before the application, it fully complies with the provisions and requirements of the patent law. The illustrations and descriptions disclosed above are merely preferred embodiments of the present invention and are not intended to limit the scope of protection of the present invention. Any other equivalent changes or modifications made by those skilled in the art based on the feature scope of the present invention should be considered as not departing from the design scope of the present invention.

Claims

1. A method for correcting luminescence, comprising the following steps in sequence: A step for obtaining a correction relationship (P01): Provide a plurality of light-emitting components, each emitting light having at least one emission peak wavelength and at least one wavelength range. Each of the plurality of light-emitting components has a light emission intensity. Obtain a mathematical expression or correspondence table or graph of the light emission intensity or a relative intensity of each light-emitting component and a junction temperature. Also obtain a mathematical expression or correspondence table or graph of a forward bias voltage of each light-emitting component and the junction temperature. Step 1 for measuring forward bias voltage (P02): During the time interval when the light-emitting component is lit, the forward bias voltage of the light-emitting component is measured simultaneously; Step (P03) for obtaining a proportional relationship: The measured forward bias voltage is compared with the aforementioned mathematical relationship, correspondence table, or graph between the forward bias voltage of the light-emitting component and the junction temperature to obtain the junction temperature; then, the obtained junction temperature is compared with the aforementioned mathematical relationship, correspondence table, or graph between the luminous intensity or relative intensity and the junction temperature to obtain the luminous intensity or relative intensity; then, the obtained luminous intensity or relative intensity is compared with the luminous intensity or relative intensity at a specific junction temperature in the mathematical relationship, correspondence table, or graph between the luminous intensity or relative intensity and the junction temperature to obtain a proportional relationship; One step to complete the calibration (P04): multiply the luminous intensity of the wavelength range corresponding to the light-emitting component in an initial spectral energy distribution curve by the proportional relationship to achieve calibration of the luminous intensity; or, multiply the measured spectral signal related to the wavelength range corresponding to the light-emitting component by the proportional relationship to achieve calibration of the spectral signal.

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