Method for identifying lunar soil layering based on microwave radiation brightness temperature

Abstract

The application relates to a method for identifying lunar soil layering based on microwave radiation brightness temperature, which comprises the following steps: generating brightness temperature information of a preselected area based on pre-acquired satellite microwave radiometer data; determining the lunar soil layering structure of the preselected area based on the brightness temperature information and electromagnetic wave penetration characteristic information; establishing a layered lunar soil brightness temperature model of the preselected area by a preset heat conduction equation and radiation transmission equation based on the layering structure; determining each layered lunar soil brightness temperature curve based on the layered lunar soil brightness temperature model, inverting the layered lunar soil thickness based on the layered lunar soil brightness temperature curve, calculating the thickness value range of the layered lunar soil, and determining the covering information of the shallow lunar soil. The method for identifying lunar soil layering based on microwave radiation brightness temperature improves the accuracy of identifying the shallow lunar soil layering and reduces the calculation error of the lunar soil thickness.

Description

Technical Field

[0001] This invention relates to the field of microwave remote sensing of the moon, and more particularly to a method, electronic device, and storage medium for identifying lunar soil stratification based on microwave radiation brightness temperature. Background Technology

[0002] The surface soil of the Moon and other atmosphereless celestial bodies is the product of continuous impact craters and various weathering processes. Lunar regolith carries most of the geological and chemical knowledge about the Moon obtained through remote sensing, and the layered structure of lunar regolith is an important means of studying the thickness and compositional characteristics of lunar regolith layers. Therefore, determining the vertical structure of the lunar surface and the layering information of lunar regolith is crucial for understanding the geological conditions of the Moon, and is also of great significance for deepening the current scientific understanding, exploration, and development of lunar resources.

[0003] Currently, in lunar research based on microwave radiometer data, the constructed layered lunar regolith structures mainly include a two-layer structure of lunar regolith-lunar rock, a three-layer structure of lunar dust-lunar regolith-lunar rock, a three-layer structure of lunar rock-lunar regolith-lunar rock, and a four-layer structure of lunar regolith-lunar rock-lunar regolith-lunar rock. These structures are primarily used for forward modeling analysis of microwave radiation brightness temperature in lunar regolith, surface rock areas, and concealed rock areas.

[0004] In existing technologies, researchers generally conduct inversion studies on lunar regolith thickness based on the lunar regolith-lunar rock double-layer structure, using methods such as least squares and multi-channel combined methods. The research object is mainly the entire lunar regolith layer, which has the drawback of not being in-depth in the study of the lunar regolith layer structure. Summary of the Invention

[0005] (a) Technical problems to be solved

[0006] In view of the above-mentioned shortcomings and deficiencies of the prior art, the present invention provides a method for identifying lunar soil stratification based on microwave radiation brightness temperature, which solves the technical problems of inaccurate lunar soil structure and large error in calculating the thickness of stratified lunar soil.

[0007] (II) Technical Solution

[0008] In a first aspect, embodiments of the present invention provide a method for identifying lunar soil stratification based on microwave radiation brightness temperature, comprising:

[0009] 100. Based on pre-acquired satellite microwave radiometer data, generate brightness temperature information for the pre-selected area;

[0010] 101. Based on the brightness temperature information and electromagnetic wave penetration characteristic information, determine the lunar soil layering structure of the pre-selected region;

[0011] 102. Based on the aforementioned lunar soil layering structure, a layered lunar soil brightness temperature model for the pre-selected region is established using preset heat conduction and radiation transfer equations.

[0012] 103. Based on the layered lunar soil brightness temperature model, determine the brightness temperature curve of each layer of lunar soil, and based on the layered lunar soil brightness temperature curve, invert the thickness of the layered lunar soil to calculate the thickness range of the layered lunar soil.

[0013] Optionally, in step 100,

[0014] The pre-acquired satellite microwave radiometer data is data obtained by detecting a pre-selected area; the satellite microwave radiometer data includes detection data at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz and 37 GHz;

[0015] Based on the satellite microwave radiometer data, a lunar surface brightness temperature map is created and brightness temperature information for the pre-selected region is generated.

[0016] Optionally, step 101 includes:

[0017] The brightness temperature information is compared with the pre-acquired reference brightness temperature information to determine the layering characteristics of the lunar soil in the pre-selected region;

[0018] The reference brightness temperature information is generated based on microwave radiometer data from unstratified regions of lunar soil at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz.

[0019] Based on the layered characteristics and the electromagnetic wave penetration properties, the layered structure of the lunar soil in the pre-selected region is determined.

[0020] Optionally, comparing the brightness temperature information with pre-acquired reference brightness temperature information to determine the stratification characteristics of the lunar regolith in the pre-selected region specifically involves:

[0021] Brightness temperature information at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz was compared with reference brightness temperature information.

[0022] If the brightness temperature comparison results of two adjacent frequencies are the same, it is determined that there is no stratification of the lunar soil at the microwave penetration depth of the two adjacent frequencies.

[0023] If the brightness temperature comparison results of two adjacent frequencies are different, it is determined that there is stratification in the lunar soil at the microwave penetration depth of the two adjacent frequencies;

[0024] Based on the brightness temperature comparison results, the stratification characteristics of the lunar soil in the pre-selected region are determined.

[0025] Optionally, step 102 specifically includes:

[0026] 102-1. Based on the aforementioned lunar soil stratification characteristics, establish a stratified structure;

[0027] The layered structure includes the lunar soil - lunar rock layer with microwave penetration depths at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz;

[0028] 102 - 2. Based on the layered structure, a bright temperature model of layered lunar soil is established through a preset heat conduction equation and radiation transfer equation;

[0029] The expression of the bright temperature model of layered lunar soil is:

[0030] ;

[0031] The dTB i ,up is the upward radiation of each layer of lunar soil. When 1 < i < n, the expression is:

[0032] ;

[0033] When i = 1, dTB 1 ,up is the upward radiation of the first layer of lunar soil, and the expression is:

[0034] ;

[0035] The dTB i,dn is the downward radiation of each layer of lunar soil. When i < n, the expression is:

[0036] ;

[0037] When i = n, the dTB rock，up is the upward radiation of the lunar rock layer, and the expression is:

[0038] ;

[0039] Among them, f is the microwave frequency; d i represents the thickness of the i - th layer, with d0 = 0;

[0040] r i is the reflectivity of the upper interface of the i - th layered structure;

[0041] 1 / (1 - L i ) is the multiple reflection coefficient of microwaves in the i - th layer of lunar soil; ;

[0042] is the absorption coefficient of the i - th layer of lunar soil, is the vacuum permeability, is the vacuum absolute permittivity, is the relative permittivity of the i - th layer of lunar soil.

[0043] Optionally, the 103 includes:

[0044] 103-1. Based on the layered lunar soil brightness temperature model, determine the layered lunar soil brightness temperature curve, wherein the layered lunar soil brightness temperature curve is the relationship curve between brightness temperature and lunar soil layer thickness;

[0045] 103-2. Based on the brightness temperature curve of the layered lunar soil, establish a numerical simulation brightness temperature curve of the brightness temperature of the pre-selected area and the thickness d1 of the first layered lunar soil, and invert the thickness of the first layered lunar soil to determine the upper and lower limits of the thickness d1 of the first layered lunar soil.

[0046] 103-3. Based on the thickness of the d1th lunar regolith layer and the brightness temperature curve of the layered lunar regolith, establish the brightness temperature of the pre-selected region and the thickness d of the i-th lunar regolith layer. i The numerical simulation brightness temperature curve is obtained; the thickness of the i-th layer of lunar regolith is inverted to determine the range of the thickness value of the i-th layer of lunar regolith.

[0047] Optionally, 103-2 specifically includes:

[0048] Based on the aforementioned stratified lunar regolith brightness temperature curve, the numerical simulation brightness temperature of the pre-selected region and the thickness d1 of the first stratified lunar regolith were determined. Numerical simulation brightness temperature of the region without layered structure ;

[0049] Calculate using a pre-defined iterative method. = Obtain the upper limit d of the thickness of the first layer of lunar regolith. 1max f is the highest frequency of the microwave radiometer data used; d is the lower limit of the thickness of the first layer of lunar regolith. 1min =0.2cm.

[0050] Optionally, 103-3 specifically includes:

[0051] 103-31: Determine the lower limit d of the thickness of the second lunar regolith layer. 2min ;

[0052] Based on the aforementioned stratified lunar regolith brightness temperature curve, the numerical simulation brightness temperature of the pre-selected region and the thickness d2 of the second stratified lunar regolith were determined. Numerical simulation brightness temperature of the region without layered structure ;

[0053] Calculate using a pre-defined iterative method. = f is the maximum frequency corresponding to the third layer of lunar regolith, and the lower limit d of the thickness of the second layer of lunar regolith is obtained. 2min ;

[0054] 103-32: Determine the upper limit d of the thickness of the second layer of lunar regolith.2max ;

[0055] Based on the aforementioned stratified lunar regolith brightness temperature curve, the numerical simulation brightness temperature of the pre-selected region and the thickness d2 of the second stratified lunar regolith were determined. Numerical simulation brightness temperature of the region without layered structure ;

[0056] Calculate using a pre-defined iterative method. = f is the maximum frequency corresponding to the third layer of lunar regolith, and the upper limit d of the thickness of the second layer of lunar regolith is obtained. 2max ;

[0057] 103-33: Determine the lower limit d of the thickness of the i-th lunar regolith layer. imin ;

[0058] Based on the lower limit of lunar regolith thickness from the first layer to the (i-1)th layer, a pre-defined iterative method is used to calculate... Obtain the lower limit d of the thickness of the i-th lunar soil layer. imin The value of f is the maximum frequency corresponding to the (i+1)th layer of lunar soil.

[0059] 103-34: Determine the upper limit d of the thickness of the i-th lunar regolith layer. imax ;

[0060] Based on the upper limit of lunar regolith thickness from the first layer to the (i-1)th layer, a pre-defined iterative method is used to calculate... Obtain the upper limit d of the thickness of the i-th layer of lunar soil. imax The f is the maximum frequency corresponding to the (i+1)th layer of lunar soil.

[0061] Secondly, embodiments of the present invention also provide an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program stored in the memory to implement the steps of the method for identifying lunar soil stratification based on microwave radiation brightness temperature as described in any of the first aspects.

[0062] Thirdly, embodiments of the present invention also provide a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the method for identifying lunar soil stratification based on microwave radiation brightness temperature as described in any of the first aspects above.

[0063] (III) Beneficial Effects

[0064] This invention provides a method for identifying lunar soil stratification based on microwave radiation brightness temperature. The method uses microwave radiometer data from a satellite to determine the brightness temperature information at different depths of the lunar soil. By combining the brightness temperature information of the lunar soil with the wavelength characteristics of electromagnetic waves, the number of lunar soil stratification layers and the content characteristics of iron oxide and titanium oxide components can be determined, thus improving the accuracy of the stratified lunar soil structure.

[0065] Based on the confirmed stratification characteristics and the pre-established radiative transfer equation, an expression for the stratified lunar soil brightness temperature curve is established; the thickness of the stratified lunar soil is inverted based on the stratified lunar soil brightness temperature curve, which can increase the accuracy of calculating the thickness value of the stratified lunar soil.

[0066] The method for identifying lunar soil stratification based on microwave radiation brightness temperature provided by this invention applies satellite microwave radiometer data and the penetration characteristics of electromagnetic waves. It can effectively determine the stratified structure and composition characteristics of shallow lunar soil by observing the change in brightness temperature with microwave frequency, which is beneficial for the quantitative identification of lunar soil cover. Attached Figure Description

[0067] Figure 1 This is a schematic flowchart of a method for identifying lunar soil stratification based on microwave radiation brightness temperature according to an embodiment of the present invention;

[0068] Figure 2 (a) A schematic diagram of a pre-selected region WAC image provided in another embodiment of the present invention;

[0069] Figure 2 (b) A schematic diagram of the pre-selected region and the content of iron oxide and titanium provided for another embodiment of the present invention;

[0070] Figure 3 (a) is the midday brightness temperature map of the cloud sea area corresponding to microwave radiometer data with an electromagnetic wave frequency of 3.0 GHz;

[0071] Figure 3 (b) is the midday brightness temperature map of the cloud sea area corresponding to microwave radiometer data with an electromagnetic wave frequency of 7.8 GHz;

[0072] Figure 3 (c) is the midday brightness temperature map of the cloud sea area corresponding to microwave radiometer data with an electromagnetic wave frequency of 19.35 GHz;

[0073] Figure 3 (d) is the midday brightness temperature map of the cloud sea area corresponding to microwave radiometer data with an electromagnetic wave frequency of 37 GHz;

[0074] Figure 4 A schematic diagram of a layered lunar soil structure provided for another embodiment of the present invention;

[0075] Figure 5A schematic diagram of a layered lunar soil brightness temperature model for a pre-selected region's layered lunar soil structure, provided as another embodiment of the present invention;

[0076] Figure 6 A schematic diagram of the relationship curves for inverting the thickness of the first layer of lunar regolith, provided for another embodiment of the present invention;

[0077] Figure 7 This is a schematic diagram of an electronic device structure provided in one embodiment of the present invention. Detailed Implementation

[0078] To better explain and facilitate understanding of the present invention, it is described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described below are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, unless otherwise specified, the embodiments and features described in the present invention can be combined with each other; for ease of description, only the parts relevant to the invention are shown in the accompanying drawings.

[0079] The layered structure of lunar regolith is one of the important geological information for studying the evolution of the lunar surface. Researching shallow lunar regolith can help discover new patterns in the evolution of lunar surface material composition. Therefore, this invention proposes a method for identifying lunar regolith layering based on microwave radiation brightness temperature. This method can determine the layering and composition information of lunar regolith through microwave radiometer data and electromagnetic wave penetration characteristics. Figure 1 As shown, Figure 1 This is a schematic flowchart of a method for identifying lunar regolith layers based on microwave radiation brightness temperature, provided in one embodiment of the present invention. The method for identifying lunar regolith layers based on microwave radiation brightness temperature mainly includes the following steps:

[0080] 100. Based on pre-acquired satellite microwave radiometer data, generate brightness temperature information for the pre-selected area;

[0081] 101. Based on the brightness temperature information and electromagnetic wave penetration characteristics information, determine the lunar soil layering structure of the pre-selected region;

[0082] 102. Based on the aforementioned lunar soil layering structure, a layered lunar soil brightness temperature model for the pre-selected region is established using preset heat conduction and radiation transfer equations.

[0083] 103. Based on the layered lunar soil brightness temperature model, determine the brightness temperature curve of each layer of lunar soil, and based on the layered lunar soil brightness temperature curve, invert the thickness of the layered lunar soil to calculate the thickness range of the layered lunar soil.

[0084] The method for identifying lunar soil stratification based on microwave radiation brightness temperature provided in this embodiment can accurately determine the number of layers and the titanium oxide content characteristics of the stratified lunar soil by combining the brightness temperature information of the lunar soil with the penetration depth of electromagnetic waves, thereby improving the accuracy of obtaining the stratified lunar soil structure. By applying satellite microwave radiometer data and combining it with the stratified lunar soil structure, the calculation error of the lunar soil thickness can be reduced.

[0085] The pre-acquired satellite microwave radiometer data refers to data obtained from the detection of a pre-selected area; the satellite microwave radiometer data may include detection data at frequencies such as 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz.

[0086] In practical applications, satellite microwave radiometer data in other frequency bands can also be used according to actual needs. In this study, the corresponding observation frequency can be used, which is not a limitation here.

[0087] Based on the satellite microwave radiometer data, lunar surface brightness temperature mapping is performed, and brightness temperature information for the pre-selected region is generated. For example, in one embodiment, based on the satellite microwave radiometer data, a conventional lunar surface brightness temperature mapping method can be used to create a 4-channel brightness temperature image.

[0088] In another embodiment, step 101 is performed based on the brightness temperature information, specifically by comparing the brightness temperature information with pre-acquired reference brightness temperature information to determine the stratification characteristics of the lunar regolith in the pre-selected region; the reference brightness temperature information is generated based on microwave radiometer data from unstratified lunar regolith regions at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz. In practical applications, the unstratified lunar regolith regions exhibit a characteristic of stable brightness temperature variation with frequency.

[0089] Electromagnetic wave penetration characteristics show that microwaves can penetrate to depths of 10 to 20 times their wavelength on the lunar surface. For example, a microwave frequency of 7.8 GHz has a penetration depth of approximately 38.5-77 cm; a microwave frequency of 19.35 GHz has a penetration depth of approximately 15.5-31 cm; and a microwave frequency of 37 GHz has a penetration depth of approximately 8.1-16.2 cm, and so on. Furthermore, brightness temperature information is positively correlated with the iron-titanium oxide (FTA) content in the lunar soil; areas with higher brightness temperatures have higher FTA content, while areas with lower brightness temperatures have lower FTA content.

[0090] Therefore, the brightness temperatures (TB) of microwaves (electromagnetic waves with wavelengths of 1 mm to 1 m) at frequencies of 7.8 GHz, 19.35 GHz, and 37 GHz represent lunar regolith compositional characteristics at penetration depths of approximately 8.1 cm to approximately 77 cm; while the brightness temperature (TB) of microwaves at a frequency of 3.0 GHz (10 cm wavelength) represents lunar regolith compositional characteristics at depths of approximately 1–2 m.

[0091] Based on the aforementioned layering characteristics and the electromagnetic wave penetration properties, the layering structure of the lunar soil in the pre-selected region can be determined.

[0092] Furthermore, the brightness temperature information is compared with pre-acquired reference brightness temperature information to determine the layering characteristics of the lunar regolith in the pre-selected region, specifically as follows:

[0093] Brightness temperature information at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz was compared with reference brightness temperature information.

[0094] If the brightness temperature comparison results of two adjacent frequencies are the same, it is determined that there is no stratification of the lunar soil at the microwave penetration depth of the two adjacent frequencies.

[0095] If the brightness temperature comparison results of two adjacent frequencies are different, it is determined that there is stratification in the lunar soil at the microwave penetration depth of the two adjacent frequencies.

[0096] Based on the brightness temperature comparison results, the stratification characteristics of the lunar soil in the pre-selected region are determined.

[0097] In one embodiment, specifically implemented as follows:

[0098] First, the brightness temperature information of the pre-selected region A and the lunar soil unstratified region B at 37 GHz is compared to obtain the 37 GHz brightness temperature comparison result.

[0099] Next, the brightness temperature information of the pre-selected region A and the lunar regolith without stratification region B at 19.35 GHz is compared to obtain the 19.35 GHz brightness temperature comparison result. The 19.35 GHz brightness temperature comparison result is then compared with the 37 GHz brightness temperature comparison result. If the 19.35 GHz brightness temperature comparison result differs from the 37 GHz brightness temperature comparison result, it is determined that there is stratification between the lunar regolith at the 19.35 GHz microwave penetration depth and the lunar regolith at the 37 GHz microwave penetration depth.

[0100] The brightness temperature information of the pre-selected region A and the lunar regolith without stratification region B at the 7.8 GHz frequency is compared to obtain the 7.8 GHz brightness temperature comparison result. The 7.8 GHz brightness temperature comparison result is compared with the 19.35 GHz brightness temperature comparison result. If the 7.8 GHz brightness temperature comparison result is different from the 19.35 GHz brightness temperature comparison result, it is determined that there is stratification between the lunar regolith at the 7.8 GHz microwave penetration depth and the lunar regolith at the 19.35 GHz microwave penetration depth.

[0101] The brightness temperature information of the pre-selected region A and the lunar regolith region B without stratification is compared at a frequency of 3.0 GHz to obtain the brightness temperature comparison result at 3.0 GHz. The brightness temperature comparison result at 3.0 GHz is compared with the brightness temperature comparison result at 7.8 GHz. If the brightness temperature comparison result at 3.0 GHz is different from the brightness temperature comparison result at 7.8 GHz, it is determined that there is stratification between the lunar regolith at the microwave penetration depth of 3.0 GHz and the lunar regolith at the microwave penetration depth of 7.8 GHz.

[0102] Based on the above determination of whether or not the soil is layered, we can address the most possible layering scenarios in lunar soil under frequency conditions of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz. We can also merge layers corresponding to two or more frequencies based on the actual data, such as merging detection layers at adjacent frequencies with the same comparison results, thereby determining the layered structure of the region.

[0103] In one embodiment, the brightness temperature of the pre-selected region at frequencies of 7.8 GHz, 19.35 GHz, and 37 GHz is higher than the reference brightness temperature information. Since the brightness temperature comparison results are the same, the detection layer at the penetration depths of 7.8 GHz, 19.35 GHz, and 37 GHz is a non-layered structure. The brightness temperature at the 3.0 GHz frequency is lower than the reference brightness temperature information. Since the comparison results are different, it is determined that the detection layer of the pre-selected region in the 7.8 GHz-19.35 GHz-37 GHz range is layered with the 3.0 GHz detection layer.

[0104] In other embodiments, the method further includes determining whether the lunar regolith surface is composed of independent layers based on visible light data. Specifically, the content of iron-titanium oxide (FTA) is used as the criterion. In existing technologies, in WAC (Wide Angle Camera) visible light images, lighter-toned areas have lower FTA content, while darker-toned areas have higher FTA content. In existing technologies, brightness temperature information is positively correlated with FTA content.

[0105] Specifically, such as Figure 2 Examples shown in (a) and (b) are images of basalt material composition analysis in a cloud sea area. Figure 2 (a) shows a schematic diagram of the WAC image in this embodiment. Figure 2 (b) shows a schematic diagram of the iron oxide titanium content in the region.

[0106] As shown in the figure, the color of the IIf unit is lighter than that of the western IIIh unit. Based on Clementine UV-VIS ultraviolet data and the FTA content obtained using the Lucey method, the FTA of the IIf unit is lower than that of the western IIIh unit.

[0107] like Figure 3 As shown in (a), (b), (c), and (d), it is... Figure 2 (a) Schematic diagram of midday brightness temperature information for a pre-selected region in the embodiment. The electromagnetic wave frequencies of the microwave radiometer are selected as 3.0 GHz, 7.8 GHz, 19.35 GHz and 37 GHz, respectively. Figure 3 (a) is a midday brightness temperature map of the cloud sea area corresponding to microwave radiometer data at an electromagnetic wave frequency of 3.0 GHz. Figure 3 (b) is the midday brightness temperature map of the cloud sea area corresponding to microwave radiometer data with an electromagnetic wave frequency of 7.8 GHz. Figure 3 (c) is the midday brightness temperature map of the cloud sea area corresponding to microwave radiometer data at an electromagnetic wave frequency of 19.35 GHz. Figure 3 (d) is a midday brightness temperature map of the cloud sea area corresponding to microwave radiometer data at an electromagnetic wave frequency of 37 GHz. The black lines in the figure represent geological units delineated according to existing technology.

[0108] from Figure 3 As can be seen from (a), (b), (c), and (d), the brightness temperature information of the IIIh unit changes little with the microwave frequency. Therefore, in this embodiment, the IIIh unit is used as a standard region without a layered structure.

[0109] right Figure 3 A comparison of the IIf and IIIh cells in (a), (b), (c), and (d) shows that at 3.0 GHz, the brightness temperature of the IIf cell is lower than that of the western IIIh cell; however, in the brightness temperature maps at 7.8 GHz, 19.35 GHz, and 37 GHz, the brightness temperature of the IIf cell is significantly higher than that of the western IIIh cell.

[0110] Based on the positive correlation between brightness temperature information and iron oxide titanium content, it can be seen that the higher brightness temperature maps at 7.8 GHz, 19.35 GHz, and 37 GHz indicate that the iron oxide titanium FTA content of the IIf unit is relatively high; while the lower brightness temperature at 3.0 GHz indicates that the iron oxide titanium FTA content of the IIf unit is relatively low. It is determined that in this embodiment, the surface layer of the pre-selected region is an independent layer with a thickness close to zero, and the lunar soil composition of the IIf unit varies complexly with depth.

[0111] Therefore, considering the deep penetration characteristics of electromagnetic waves, it can be concluded that the lunar regolith in the IIf unit region of this embodiment exhibits stratification. This is detailed in Table 1 below:

[0112]

[0113] Table 1

[0114] In some other embodiments, there may be a deep lunar regolith layer between the lunar rock layer and the 3.0 GHz probe layer, exceeding the microwave penetration depth, with a thickness set to infinity, which is not considered a limitation here.

[0115] Furthermore, in another embodiment, after obtaining the stratification of the lunar soil, step 102-1 is performed: based on the stratification characteristics of the lunar soil, a stratification structure is established, the stratification structure including lunar soil stratification-lunar rock layer with microwave penetration depths at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz and 37 GHz.

[0116] like Figure 4 As shown, Figure 4 A schematic diagram of a layered lunar regolith structure provided for another embodiment of the present invention includes three layers of lunar regolith and a conventional lunar rock layer.

[0117] Of course, in practical applications, there may be a combination of possible combinations, such as the visible light layer iron oxide titanium oxide exhibiting the same behavior as the 7.8GHz, 19.35GHz, and 37GHz probe layers iron oxide titanium oxide, or the 7.8GHz, 19.35GHz, and 37GHz probe layers iron oxide titanium oxide exhibiting the same behavior as the 3.0GHz probe layer iron oxide titanium oxide. The layered lunar regolith structure should be confirmed based on the actual brightness temperature information and visible light layer information, such as a two-layer structure of lunar regolith-lunar rock or a structure of lunar dust-lunar regolith-lunar rock, etc. This is not considered a limitation here.

[0118] Further, in step 102-2, based on the layered structure, a layered lunar soil brightness temperature model is established using preset heat conduction equations and radiation transfer equations.

[0119] like Figure 5 As shown, Figure 5 This is a schematic diagram of a layered lunar regolith brightness temperature model for a pre-selected region's layered lunar regolith structure, provided as another embodiment of the present invention. Based on the heat conduction equation and the radiative transfer equation, and combined with the aforementioned layered lunar regolith structure, a model is constructed as follows: Figure 5 The schematic diagram of the layered lunar regolith brightness temperature model shown includes the brightness temperature TBmodel detected by the microwave radiometer. This model comprises brightness temperature contributions dTB1, dTB2, and dTB3 from the three layers of lunar regolith (Layer 1, Layer 2, Layer 3) and the underlying lunar rock layer (Layer 4), as well as dTB4 (i.e., dTB4) from the rock layer. rock It consists of dTB1, dTB2, and dTB3, all of which include uplink radiation dTB. 1up dTB 2up dTB 3up and downward radiative brightness temperature contribution dTB 1dn dTB 2dn dTB 3dn dTB4 only includes uplink radiated dTB4up (dTB rock，up )。

[0120] The expression of the layered lunar regolith brightness temperature model is:

[0121] ;

[0122] The dTB i ,up is the upward radiation of each layer of lunar regolith. When 1 < i < n, the expression is:

[0123] ;

[0124] When i = 1, the dTB 1 ,up is the upward radiation of the first layer of lunar regolith, and the expression is:

[0125] ;

[0126] The dTB i,dn is the downward radiation of each layer of lunar regolith. When i < n, the expression is:

[0127] ;

[0128] When i = n, it is the lunar rock layer. The dTB rock，up is the upward radiation of the lunar rock layer, and the expression is:

[0129] ;

[0130] For example, in one embodiment, the lunar regolith with microwave penetration depths of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz are all independently layered. Then the expression of the layered lunar regolith brightness temperature model is:

[0131] ;

[0132] In another embodiment, the microwave radiometer data is the monitoring data of a satellite, and the angle is 0 degrees. Then the dTB 1,up is the upward radiation of the first-layer visible-light-layer lunar regolith, and the expression is:

[0133] ;

[0134] The dTB 1,dn is the downward radiation of the first layer of lunar regolith, and the expression is:

[0135] [[ID=7?]] ;

[0136] The dTB 2,up is the upward radiation of the second layer of lunar regolith, and the expression is:

[0137] ;

[0138] The dTB 2,dn The downward radiation of the second-layer lunar regolith is expressed as:

[0139] ;

[0140] The dTB 3,up The expression for the upward radiation of the third layer of lunar regolith is:

[0141] ;

[0142] The dTB 3,dn The expression for the downward radiation of the third layer of lunar regolith is:

[0143] ;

[0144] The dTB 4,up The expression for the ascending radiation of the fourth layer of lunar regolith is:

[0145] ;

[0146] The dTB 4,dn The downward radiation of the fourth layer of lunar regolith is expressed as:

[0147] ;

[0148] Where f is the microwave frequency; d i Let d be the thickness of the i-th layer of lunar regolith. During the calculation process, d0 may occur. In this embodiment, d0 can be taken as 0.

[0149] 1 / (1-L) i ) is the multiple reflection coefficient of microwaves in the i-th layer of lunar soil; ;

[0150] It is the absorption coefficient of the i-th layer of lunar soil. It is the vacuum permeability. It is the absolute permittivity of vacuum. It is the relative permittivity of the i-th lunar soil layer.

[0151] r i Let r1 be the reflectance of the interface on the i-th layer structure. In the embodiment, r1 is the reflectance of the vacuum and the first layer of lunar regolith, r2 is the reflectance of the first layer of lunar regolith and the second layer of lunar regolith, r3 is the reflectance of the second layer of lunar regolith and the third layer of lunar regolith, r4 is the reflectance of the third layer of lunar regolith and the fourth layer of lunar regolith, and r5 is the reflectance of the interface on the lunar rock layer.

[0152] In the case of vertical observation,

[0153] , i=1,2,3,4,5.

[0154] In this embodiment, the value of i can be 5. In practical applications, the value of i should be determined according to the actual needs and the layering situation. This is not a limitation.

[0155] Specifically, the dielectric constant It is an important parameter of lunar soil, the real part of the dielectric constant of lunar soil and lunar rocks ( It is mainly related to the bulk density, and the loss tangent ( The value is closely related to the bulk density and the content of iron titanium oxide (FeO+TiO2) (S%).

[0156] In one embodiment, the dielectric constant is solved. The process includes:

[0157] A1. Determine the bulk density of lunar regolith based on a pre-constructed hyperbolic density formula. ;

[0158] A2, the volume density Substituting the pre-constructed dielectric constant-volume density relationship and loss tangent calculation formula, the dielectric constant is determined. .

[0159] The pre-constructed hyperbolic density formula is as follows:

[0160] ;

[0161] Z represents the depth of the lunar soil.

[0162] The pre-constructed dielectric constant-volume density relationship is as follows:

[0163] ;

[0164] is the real part of the dielectric constant.

[0165] The formula for calculating the loss tangent is:

[0166] ;

[0167] .

[0168] Furthermore, based on the pre-constructed heat conduction equation, the sum of the upward and downward radiant energy of each layer of lunar regolith and the physical temperature of the lunar rock layer were calculated and determined. .

[0169] In one embodiment, the material distribution in the local lateral direction on the lunar surface is considered uniform. Assuming that only vertical heat conduction exists in the lunar regolith below the lunar surface, the following one-dimensional heat conduction equation is solved to obtain the calculated results. :

[0170] ;

[0171] ;

[0172] .

[0173] In the formula, Represents the lunar soil temperature profile at time t. This indicates the heat flow inside the lunar soil. Indicates time, Indicates specific heat capacity. Indicates thermal conductivity, This represents the Stephen Boltzmann constant. Indicates the angle of incidence of the sun. Indicates emissivity, Indicates lunar surface albedo. This represents the solar irradiance on the lunar surface at time t.

[0174] The TSI refers to a timely lunar surface that takes into account the lunar surface topography slope and lunar-solar distance.

[0175] The key issue in the inversion of layered lunar regolith is the setting of parameters for each layer of lunar regolith. Based on the layered lunar regolith brightness temperature model, the brightness temperature curve of the layered lunar regolith is determined. By substituting the above parameters into the brightness temperature curve of the layered lunar regolith, the numerical simulation brightness temperature of each layer of lunar regolith structure can be obtained.

[0176] Furthermore, based on the numerically simulated brightness temperature of each layer of lunar regolith structure, and compared with the brightness temperature of a region without layering, the thickness of each layer of lunar regolith is inverted. In one embodiment, this is specifically implemented as step 103, including:

[0177] 103-1. Based on the layered lunar soil brightness temperature model, determine the layered lunar soil brightness temperature curve, wherein the layered lunar soil brightness temperature curve is the relationship curve between brightness temperature and lunar soil layer thickness;

[0178] 103-2. Based on the brightness temperature curve of the layered lunar soil, establish a numerical simulation brightness temperature curve of the brightness temperature of the pre-selected area and the thickness d1 of the first layered lunar soil, and invert the thickness of the first layered lunar soil to determine the upper and lower limits of the thickness d1 of the first layered lunar soil.

[0179] 103-3. Based on the thickness of the first layer of lunar soil and the brightness temperature curve of the layered lunar soil, establish a numerical simulation brightness temperature curve of the brightness temperature of the pre-selected area and the thickness d2 of the second layer of lunar soil; perform inversion on the thickness of the second layer of lunar soil to determine the thickness value of the second layer of lunar soil; and so on, until the range of the thickness value of the i-th layer of lunar soil is determined.

[0180] Furthermore, the 103-2 specifically includes:

[0181] Based on the aforementioned stratified lunar regolith brightness temperature curve, the numerical simulation brightness temperature of the pre-selected region and the thickness d1 of the first stratified lunar regolith were determined. Numerical simulation brightness temperature of the region without layered structure ;

[0182] Calculate using a pre-defined iterative method. Obtain the upper limit d of the thickness of the first layer of lunar regolith. 1max The frequency f is the highest frequency of the microwave radiometer data used. Since the penetration depth of visible light is extremely shallow, approaching 0, the lower limit d of the thickness of the first layer of lunar regolith is set. 1min Approaching zero, considering the penetration depth of the microwave radiometer and the calculation requirements, the minimum thickness d of the first layer is taken. 1min =0.2 cm, which is the thickness of the lunar dust layer commonly used in current lunar science research.

[0183] Optionally, 103-3 specifically includes:

[0184] 103-31: Determine the lower limit d of the thickness of the second lunar regolith layer. 2min ;

[0185] Based on the aforementioned stratified lunar regolith brightness temperature curve, the numerical simulation brightness temperature of the pre-selected region and the thickness d2 of the second stratified lunar regolith were determined. Numerical simulation brightness temperature of the region without layered structure ;

[0186] Calculate using a pre-defined iterative method. = f is the maximum frequency corresponding to the third layer of lunar regolith, and the lower limit d of the thickness of the second layer of lunar regolith is obtained. 2min ;

[0187] 103-32: Determine the upper limit d of the thickness of the second layer of lunar regolith. 2max ;

[0188] Based on the aforementioned stratified lunar regolith brightness temperature curve, the numerical simulation brightness temperature of the pre-selected region and the thickness d2 of the second stratified lunar regolith were determined. Numerical simulation brightness temperature of the region without layered structure ;

[0189] Calculate using a pre-defined iterative method. = f is the maximum frequency corresponding to the third layer of lunar regolith, and the upper limit d of the thickness of the second layer of lunar regolith is obtained. 2max ;

[0190] 103-33: Determine the lower limit d of the thickness of the i-th lunar regolith layer. imin ;

[0191] Based on the lower limit of lunar regolith thickness from the first layer to the (i-1)th layer, a pre-defined iterative method is used to calculate... Obtain the lower limit d of the thickness of the i-th lunar soil layer. imin The value of f is the maximum frequency corresponding to the (i+1)th layer of lunar soil.

[0192] 103-34: Determine the upper limit d of the thickness of the i-th lunar regolith layer. imax ;

[0193] Based on the upper limit of lunar regolith thickness from the first layer to the (i-1)th layer, a pre-defined iterative method is used to calculate... Obtain the upper limit d of the thickness of the i-th layer of lunar soil. imax The value of f is the maximum frequency corresponding to the (i+1)th layer of lunar regolith. The above steps allow for the calculation of the upper and lower limits of lunar regolith thickness, determining the thickness range of the lunar regolith and increasing the accuracy of the layered lunar regolith structure.

[0194] To better describe the technical solution of the present invention, a more specific embodiment will be used for illustration.

[0195] In one embodiment, the IIf unit (unit A) is pre-selected as the detection area. Its brightness temperature varies significantly with microwave frequency, indicating a geological unit with the aforementioned four-layered structure. The layers include a surface layer, a first layer of 37 GHz, 19.35 GHz, and 7.8 GHz detection layers, a second layer of 3.0 GHz detection layer, and a lunar rock layer. The IIIh unit (unit B) serves as a standard region; its brightness temperature does not change with frequency, indicating a geological unit without a layered structure. Based on the brightness temperature curves of the lunar regolith in each layer, the thicknesses of the surface layer and the first layer of lunar regolith are inverted.

[0196] In the above embodiments, the visible light detection results represent the polar surface layer, that is, the value of the titanium iron oxide content (FTA) in the first layer parameters is the visible light inversion result; the second layer of lunar regolith, based on its brightness temperature performance, should have a high FTA, and combined with the values ​​of basalt units with similar brightness temperatures in the study area, it represents high-iron-titanium content basalt covered by the shallow layer; therefore, under low-frequency conditions, the brightness temperature of the IIf unit is less than that of the IIIh unit, and the FTA value of the third layer of lunar regolith is very small, but it is difficult to determine the specific value. In practical applications, the FTA content of the lunar regolith or the smallest FTA content value of the IIf unit can be referenced.

[0197] Specifically, the brightness temperature of the cloud sea IIf unit is numerically simulated as a function of the first lunar regolith thickness d1. Based on the brightness temperature curve of the layered lunar regolith, the numerically simulated brightness temperature of the pre-selected area and the surface lunar regolith thickness d1 is determined. Assuming that the second layer thickness d2 and the third layer thickness d3 are infinite, the numerically simulated brightness temperature under the condition of frequency f is obtained. A represents the cloud sea IIf unit.

[0198] Furthermore, based on the brightness temperature curves of the layered lunar regolith, the numerically simulated brightness temperature of the region without layering was determined. The brightness temperature of the IIIh unit varies little with microwave frequency, and the lunar regolith composition varies uniformly with depth. Assuming the thickness d1 of the first layer of lunar regolith in this unit is infinite, the brightness temperature under frequency f was obtained. B represents the Cloud Sea IIIh unit.

[0199] Calculate using a pre-defined iterative method. = f takes values ​​of 37 GHz, 19.35 GHz, and 7.8 GHz, which are the maximum frequencies of the probe layer, i.e., f = 37 GHz. d1 is the upper limit of the surface lunar regolith thickness d. 1max .

[0200] Alternatively, in some embodiments, a brightness temperature curve of the first layer of lunar regolith can be plotted to provide a basis for numerical simulation of the change in brightness temperature with the thickness of the first layer of lunar regolith, such as... Figure 6 The numerical simulation brightness temperatures of the IIf and IIIh elements at microwave frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz are shown. Figure 6 As shown, the dashed lines from top to bottom represent the simulated brightness temperatures of the IIIh element at 37 GHz, 19.35 GHz, 7.8 GHz, and 3.0 GHz, respectively, while the solid lines from top to bottom represent the simulated brightness temperatures of the IIf element at 37 GHz, 19.35 GHz, 7.8 GHz, and 3.0 GHz, respectively.

[0201] Among them, when the numerical simulation brightness temperature of the IIf element is greater than that of the IIIh element under the conditions of 7.8 GHz, 19.35 GHz and 37 GHz, the corresponding maximum lunar regolith thickness is the intersection of the dashed and solid lines at 37 GHz.

[0202] Using a pre-defined iterative method, only calculations are performed. = To determine the upper limit d of the surface lunar regolith thickness. 1max .

[0203] Because the content of iron oxide titanium in the IIf unit is very low based on visible light results, the thickness of the lunar regolith that can be penetrated by visible light data is on the order of micrometers, close to 0 m. Therefore, d 1min It is greater than the thickness of the polar lunar regolith represented by visible light data, which is approximately 0 m.

[0204] Further, after obtaining the upper and lower limits of the surface lunar regolith, the upper and lower limits of the lunar regolith in the 7.8 GHz, 19.35 GHz, and 37 GHz probe layers are calculated and determined. Specifically, 103-2, based on the brightness temperature curves of d1 and the layered lunar regolith, numerical simulation brightness temperature curves of the brightness temperature of the pre-selected region and the lunar regolith thickness d2 of the 7.8 GHz, 19.35 GHz, and 37 GHz probe layers are established; the lunar regolith thickness values ​​of the 7.8 GHz, 19.35 GHz, and 37 GHz probe layers are inverted to determine the lunar regolith thickness values ​​of the probe layers.

[0205] Specifically, since the surface lunar regolith thickness is a range value, the lunar regolith thickness d2 of the probe layer at 7.8 GHz, 19.35 GHz, and 37 GHz can be considered in the following two cases:

[0206] 103-21. When the thickness d1 of the first layer of lunar regolith is at its minimum, the lower limit d of the lunar regolith thickness of the probe layer at 7.8 GHz, 19.35 GHz, and 37 GHz is determined. 2min ;

[0207] Based on the aforementioned layered lunar regolith brightness temperature curves, the numerical simulation brightness temperatures of the pre-selected region and the lunar regolith thickness d2 of the probe layer at 7.8 GHz, 19.35 GHz, and 37 GHz were determined. Numerical simulation brightness temperature of the region without layered structure .

[0208] Calculate using a pre-defined iterative method. = f is taken as the maximum frequency of the 3.0 GHz probe layer, i.e., f = 3.0 GHz, and d2 is the lower limit of the thickness of the second layer of lunar regolith. 2min .

[0209] In practical applications, d 1min Approaching 0, for ease of calculation, the d... 1min Possible values ​​include 0.02m, etc.

[0210] 103-22. When d1 is at its maximum, determine the upper limit d of the lunar regolith thickness of the probe layer at 7.8 GHz, 19.35 GHz, and 37 GHz. 2max ;

[0211] Based on the aforementioned layered lunar regolith brightness temperature curves, the numerical simulation brightness temperatures of the pre-selected region and the lunar regolith thickness d2 of the probe layer at 7.8 GHz, 19.35 GHz, and 37 GHz were determined. Numerical simulation brightness temperature of the region without layered structure ;

[0212] Calculate using a pre-defined iterative method. = f=3.0GHz, and d2 is the upper limit d of the lunar regolith thickness of the probe layer at 7.8 GHz, 19.35 GHz, and 37 GHz. 2max .

[0213] This embodiment takes into account the calculation of the thickness of the visible light layer. In practical applications, the visible light layer can be disregarded and is not considered here as a limitation.

[0214] In this embodiment, the pre-obtained iterative calculation method is the Newton-Raphson iteration method. In other embodiments, the iterative calculation method may also be the least squares method, the Gauss-Seidel iteration method, etc.

[0215] Furthermore, the aforementioned layered lunar regolith brightness temperature model and layered lunar regolith thickness inversion process are applicable to the study of occult and pseudo-lunar maria on the lunar surface. The values ​​of the layered lunar regolith parameters for different regions should be specifically analyzed based on their brightness temperature characteristics and the corresponding lunar maria magma evolution features; no restrictions are imposed here.

[0216] The method for identifying lunar regolith stratification based on microwave radiation brightness temperature provided in this invention can determine the stratified structure of lunar regolith based on microwave radiometer data and generated brightness temperature information, improving the accuracy of constructing stratified lunar regolith structures. By referencing brightness temperature information from unstratified areas, a stratified lunar regolith brightness temperature model is constructed to invert the lunar regolith thickness, reducing calculation errors in stratified lunar regolith thickness. Based on the penetrating characteristics of electromagnetic waves, geological units on the lunar surface with significantly varying brightness temperatures with frequency are detected. Combined with parameters of the polar regolith represented by visible light, multi-frequency microwave radiometer data reflects lunar regolith conditions with different stratified structures.

[0217] The technical solution of this invention can track lunar regolith covered by shallow lunar ejecta, detect lunar maria covered by shallow lunar highland material and pseudo-maria covered by shallow lunar maria material, which is beneficial for the study of hidden and pseudo-maria on the lunar surface. Based on the brightness temperature characteristics of different regions and the corresponding lunar maria magma evolution features, specific analyses can be conducted to determine the values ​​of layered lunar regolith parameters. This is beneficial for further tracing the evolution history of lunar maria magma.

[0218] Furthermore, embodiments of the present invention also provide an electronic device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program stored in the memory to implement the steps of the method for identifying lunar soil stratification based on microwave radiation brightness temperature as described in any of the first aspects above.

[0219] like Figure 7 , Figure 7 This is a schematic diagram of the architecture of an electronic device according to another embodiment of the present invention.

[0220] Figure 7 The illustrated electronic device may include at least one processor 101, at least one memory 102, at least one network interface 104, and other user interfaces 103. The various components of the electronic device are coupled together via a bus system 105. It is understood that the bus system 105 is used to implement communication between these components. In addition to a data bus, the bus system 105 also includes a power bus, a control bus, and a status signal bus. However, for clarity, in… Figure 7 The general labeled all buses as Bus System 105.

[0221] The user interface 103 may include a display, keyboard, or clicking device (e.g., mouse, trackball, or touchpad).

[0222] It is understood that the memory 102 in this embodiment can be volatile memory or non-volatile memory, or may include both volatile and non-volatile memory. The non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), or flash memory. The volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDRSDRAM), Enhanced Synchronous Dynamic Random Access Memory (ESDRAM), Synchlink Dynamic Random Access Memory (SLDRAM), and Direct Rambus RAM (DRRAM). The memory 102 described herein is intended to include, but is not limited to, these and any other suitable types of memory.

[0223] In some implementations, memory 102 stores elements, executable units or data structures, or subsets thereof, or extended sets thereof: operating system 1021 and application program 1022.

[0224] The operating system 1021 includes various system programs, such as a framework layer, a core library layer, and a driver layer, used to implement various basic business functions and handle hardware-based tasks. The application program 1022 includes various applications used to implement various application functions. Programs implementing the methods of this embodiment of the invention can be included in the application program 1022.

[0225] In this embodiment of the invention, the processor 101 executes the method steps provided in the first aspect by calling the program or instructions stored in the memory 102, specifically the program or instructions stored in the application program 1022.

[0226] The methods disclosed in the above embodiments of the present invention can be applied to processor 101, or implemented by processor 101. Processor 101 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the integrated logic circuit of the hardware in processor 101 or by instructions in the form of software. The processor 101 may be a general-purpose processor, digital signal processor, application-specific integrated circuit, off-the-shelf programmable gate array or other programmable logic device, discrete gate or transistor logic device, or discrete hardware component. It can implement or execute the methods, steps and logic block diagrams disclosed in the embodiments of the present invention. The general-purpose processor may be a microprocessor or any conventional processor. The steps of the methods disclosed in the embodiments of the present invention can be directly embodied as being executed by a hardware decoding processor, or executed by a combination of hardware and software units in the decoding processor. The software units may be located in random access memory, flash memory, read-only memory, programmable read-only memory or electrically erasable programmable memory, registers and other mature storage media in the art. The storage medium is located in memory 102, and processor 101 reads the information in memory 102 and completes the steps of the above method in combination with its hardware.

[0227] In addition, in conjunction with the method for identifying lunar soil stratification based on microwave radiation brightness temperature in the above embodiments, this embodiment of the invention also provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the method for identifying lunar soil stratification based on microwave radiation brightness temperature as described in any of the first aspects above.

[0228] This invention provides a method for identifying lunar regolith layers based on microwave radiation brightness temperature. This method can accurately invert the thickness information of layered lunar regolith, which is beneficial for exploring the evolution pattern of lunar surface material composition, effectively identifying lunar maria (basaltic lunar regolith covered by ejected lunar continental material) and pseudomaria (anthracite lunar regolith covered by ejected lunar maria material), and tracing the physical characteristics of shallowly covered geological bodies. This method has important scientific significance.

[0229] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, as well as combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions.

[0230] In this specification, the illustrative expressions of the terms used do not necessarily refer to the same embodiments or examples. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of those different embodiments or examples, without contradiction.

[0231] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the claims should be interpreted to include both the preferred embodiments and all changes and modifications falling within the scope of the invention.

[0232] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, then this invention should also include these modifications and variations.

Claims

1. A method for identifying lunar regolith stratification based on microwave radiation brightness temperature, characterized in that, Includes the following steps:

100. Based on pre-acquired satellite microwave radiometer data, generate brightness temperature information for the pre-selected area; 101. Based on the brightness temperature information and electromagnetic wave penetration characteristic information, determine the lunar soil layering structure of the pre-selected region; 102. Based on the aforementioned lunar soil layering structure, a layered lunar soil brightness temperature model for the pre-selected region is established using preset heat conduction and radiation transfer equations.

103. Based on the layered lunar soil brightness temperature model, determine the brightness temperature curve of each layer of lunar soil, and based on the layered lunar soil brightness temperature curve, invert the thickness of the layered lunar soil to calculate the thickness range of the layered lunar soil.

2. The method according to claim 1, characterized in that, In step 100, The pre-acquired satellite microwave radiometer data is data obtained by detecting a pre-selected area; the satellite microwave radiometer data includes detection data at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz and 37 GHz; Based on the satellite microwave radiometer data, a lunar surface brightness temperature map is created and brightness temperature information for the pre-selected region is generated.

3. The method according to claim 2, characterized in that, Step 101 includes: The brightness temperature information is compared with the pre-acquired reference brightness temperature information to determine the layering characteristics of the lunar soil in the pre-selected region; The reference brightness temperature information is generated based on microwave radiometer data from unstratified regions of lunar soil at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz. Based on the layered characteristics and the electromagnetic wave penetration properties, the layered structure of the lunar soil in the pre-selected region is determined.

4. The method according to claim 3, characterized in that, The step of comparing the brightness temperature information with pre-acquired reference brightness temperature information to determine the stratification characteristics of the lunar regolith in the pre-selected region specifically involves: Brightness temperature information at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz was compared with reference brightness temperature information. If the brightness temperature comparison results of two adjacent frequencies are the same, it is determined that there is no stratification of the lunar soil at the microwave penetration depth of the two adjacent frequencies. If the brightness temperature comparison results of two adjacent frequencies are different, it is determined that there is stratification in the lunar soil at the microwave penetration depth of the two adjacent frequencies; Based on the brightness temperature comparison results, the stratification characteristics of the lunar soil in the pre-selected region are determined.

5. The method according to claim 4, characterized in that, Step 102 specifically includes: 102-1. Based on the aforementioned lunar soil stratification characteristics, establish a stratified structure; The layered structure includes lunar regolith layers with microwave penetration depths at frequencies of 3.0 GHz, 7.8 GHz, 19.35 GHz, and 37 GHz. 102-2. Based on the aforementioned layered structure, a layered lunar regolith brightness temperature model is established using preset heat conduction and radiation transfer equations. The expression for the stratified lunar regolith brightness temperature model is as follows: ； The dTB i ,up is the upward radiation of each stratified lunar soil. When 1 < i < n, the expression is: ； When i=1, dTB 1 ,up The upward radiation of the first layer of lunar regolith is expressed as: ； The dTB i,dn is the downward radiation of each layered lunar soil, where i < n, and the expression is: ； When i=n, ​​the dTB rock，up The expression for the upward radiation of lunar rock layers is: ； Where f is the microwave frequency; d i This represents the thickness of the i-th layer, where d0 = 0; r i Let be the reflectivity of the interface on the i-th layer structure; 1 / (1-L) i ) is the multiple reflection coefficient of microwaves in the i-th layer of lunar soil; ; It is the absorption coefficient of the i-th layer of lunar soil. It is the vacuum permeability. It is the absolute permittivity of vacuum. It is the relative permittivity of the i-th layer of lunar soil.

6. The method according to claim 1, characterized in that, The 103 includes: 103-1. Based on the layered lunar soil brightness temperature model, determine the layered lunar soil brightness temperature curve, wherein the layered lunar soil brightness temperature curve is the relationship curve between brightness temperature and lunar soil layer thickness; 103-2. Based on the brightness temperature curve of the layered lunar soil, establish a numerical simulation brightness temperature curve of the brightness temperature of the pre-selected area and the thickness d1 of the first layered lunar soil, and invert the thickness of the first layered lunar soil to determine the upper and lower limits of the thickness d1 of the first layered lunar soil. 103-3. Based on the thickness d1 of the first layer of lunar regolith and the brightness temperature curve of the layered lunar regolith, establish the brightness temperature of the pre-selected region and the thickness d1 of the i-th layer of lunar regolith. i The numerical simulation brightness temperature curve is obtained; the thickness of the i-th layer of lunar regolith is inverted to determine the range of the thickness value of the i-th layer of lunar regolith.

7. The method according to claim 6, characterized in that, The 103-2 specifically includes: Based on the aforementioned stratified lunar regolith brightness temperature curve, the numerical simulation brightness temperature of the pre-selected region and the thickness d1 of the first stratified lunar regolith were determined. Numerical simulation brightness temperature of regions without stratification ; Calculate using a pre-defined iterative method. = Obtain the upper limit d of the thickness of the first layer of lunar regolith. 1max f is the highest frequency of the microwave radiometer data used; The lower limit of the thickness of the first layer of lunar regolith d 1min =0.2cm.

8. The method according to claim 7, characterized in that, The 103-3 specifically includes: 103-31: Determine the lower limit d of the thickness of the second lunar regolith layer. 2min ; Based on the aforementioned stratified lunar regolith brightness temperature curve, the numerical simulation brightness temperature of the pre-selected region and the thickness d2 of the second stratified lunar regolith were determined. Numerical simulation brightness temperature of the region without layered structure The calculation is performed using a preset iterative method. = f is the maximum frequency corresponding to the third layer of lunar regolith, and the lower limit d of the thickness of the second layer of lunar regolith is obtained. 2min ; 103-32: Determine the upper limit d of the thickness of the second layer of lunar regolith. 2max ; Based on the aforementioned stratified lunar regolith brightness temperature curve, the numerical simulation brightness temperature of the pre-selected region and the thickness d2 of the second stratified lunar regolith were determined. Numerical simulation brightness temperature of the region without layered structure ; Calculate using a pre-defined iterative method. = f is the maximum frequency corresponding to the third layer of lunar regolith, and the upper limit d of the thickness of the second layer of lunar regolith is obtained. 2max ; 103-33: Determine the lower limit d of the thickness of the i-th lunar regolith layer. imin ; Based on the lower limit of lunar regolith thickness from the first layer to the (i-1)th layer, a pre-defined iterative method is used to calculate... Obtain the lower limit d of the thickness of the i-th lunar soil layer. imin The value of f is the maximum frequency corresponding to the (i+1)th layer of lunar soil. 103-34: Determine the upper limit d of the thickness of the i-th lunar regolith layer. imax ; Based on the upper limit of lunar regolith thickness from the first layer to the (i-1)th layer, a pre-defined iterative method is used to calculate... Obtain the upper limit d of the thickness of the i-th layer of lunar soil. imax The f is the maximum frequency corresponding to the (i+1)th layer of lunar soil.

9. An electronic device, characterized in that, The method includes a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program stored in the memory to implement the steps of the method for identifying lunar soil stratification based on microwave radiation brightness temperature as described in any one of claims 1 to 8.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the method for identifying lunar soil stratification based on microwave radiation brightness temperature as described in any one of claims 1 to 8.

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