A circuit board withstand voltage test fixture

Abstract

The invention discloses a circuit board withstand voltage test fixture, and the circuit board test field. It includes a device housing, the bottom of the device housing is fixedly installed with support legs at the four corners, positioning slots are provided on both sides of the device housing, a movable slide slot is provided on the device housing, a driving mechanism is installed in the device housing below the movable slide slot, a propulsion mechanism is fixedly installed on the docking legs, a test mechanism is installed in the device housing, a limiting mechanism is fixedly installed on the upper surface of the device housing, and the support legs are fixed to the bottom of the positioning slot by screws. After the connecting armature is separated from the first electromagnet, the second spring will push the test probe to move upward, so that the test probe contacts the contact on the circuit board. After the test probe contacts the contact on the circuit board, it can be powered on for testing. After the test is completed, the first electromagnet can be started to reset the test probe. The entire detection process has a high degree of automation and can reduce safety hazards.

Description

Technical Field

[0001] The invention relates to the field of circuit board testing, and in particular to a circuit board withstand voltage testing fixture. Background Art

[0002] Usually, a conductive pattern made of printed circuits, printed components or a combination of the two on an insulating material according to a predetermined design is called a printed circuit. The conductive pattern that provides electrical connections between components on an insulating substrate is called a printed circuit. In this way, the finished board of a printed circuit or printed circuit is called a printed wiring board, also known as a printed board or printed circuit board. In circuit board production technology, in order to measure the performance and reliability of the circuit board, it is usually necessary to conduct a high-voltage resistance test on the circuit board to evaluate the circuit board's ability to withstand high voltage. The traditional voltage resistance tester uses two probes to manually test the circuit board. The test conditions are: 1500V voltage and test time of 10 seconds. In the prior art, the manual testing of the circuit board has great safety risks due to the excessively high test voltage. Summary of the invention

[0003] The main purpose of the present invention is to provide a circuit board withstand voltage test fixture, which can effectively solve the problems mentioned in the background technology.

[0004] To achieve the above object, the technical solution adopted by the present invention is:

[0005] A circuit board withstand voltage test fixture comprises a device shell, wherein the bottom of the device shell is fixedly installed with supporting legs at four corners, positioning slots are provided on both sides of the device shell, a movable slide slot is provided on the device shell, a driving mechanism is installed in the device shell below the movable slide slot, the driving mechanism comprises a driving screw, a nut seat, a docking screw hole, a docking leg, a positioning bracket and a driving motor, the positioning bracket is fixedly installed in the device shell, a driving screw is movably installed on the positioning bracket, one end of the driving screw is connected to the driving motor, a nut seat is movably installed on the driving screw, a docking leg is fixedly installed on the nut seat, a docking screw hole is provided on the docking leg, a propulsion mechanism is fixedly installed on the docking leg, the propulsion mechanism comprises an entry and exit notch, a movable slider, a first spring, a propulsion plate, a mechanism shell and a positioning base, the positioning base is fixedly installed on the docking leg, a mechanism shell is fixedly installed on the positioning base, an entry and exit notch is provided at the upper end of the mechanism shell, and a movably installed A propulsion plate is provided, a movable slider is fixedly installed at the bottom of the propulsion plate, a first spring is installed in the mechanism shell below the movable slider, a test mechanism is installed in the device shell, the test mechanism includes a test probe, a reset plate, a second spring, a reset guide rod, a connecting armature and a first electromagnet, the test probe is movably installed on the device shell, a reset plate is fixedly installed at the bottom of the test probe, a reset guide rod is fixedly installed at the bottom of the reset plate, a connecting armature is fixedly installed at the lower end of the reset guide rod, a second spring is sleeved on the reset guide rod, a first electromagnet is fixedly installed in the device shell below the connecting armature, a limiting mechanism is fixedly installed on the upper surface of the device shell, the limiting mechanism includes a second electromagnet, a positioning shell, a permanent magnet, a movable block, a movable hole and a limiting rod, a second electromagnet is fixedly installed on the upper end of the positioning shell, a movable hole is opened at the lower end of the positioning shell, a limiting rod is movably installed in the movable hole, a movable block is fixedly installed on the upper end of the limiting rod, and a permanent magnet is fixedly installed on the upper surface of the movable block.

[0006] Furthermore, a coupling is provided at the output end of the driving motor, and one end of the driving screw is connected to the output end of the driving motor through the coupling.

[0007] Furthermore, the driving screw is movably installed in the device housing through a positioning bracket, the docking foot is movably installed above the driving screw through a nut seat, and the docking foot extends out of the device housing through a movable slide groove.

[0008] Furthermore, the positioning base is provided with screws, and the positioning base is fixed to the docking legs by means of the screws.

[0009] Furthermore, the propulsion plate is movably installed in the mechanism housing through a movable slider, and the propulsion plate extends out of the mechanism housing through an entry and exit notch. One end of the first spring is connected to the bottom of the mechanism housing, and the other end of the first spring is connected to the movable slider.

[0010] Furthermore, a through hole is provided on the device housing, and the test probe is movably installed in the device housing through the through hole.

[0011] Furthermore, the connecting armature is fixed to the bottom of the reset plate through a reset guide rod, one end of the second spring is connected to the reset plate, and the other end of the second spring is connected to the bottom of the device housing.

[0012] Furthermore, a notch is provided on the upper surface of the device housing, and the limiting rod is embedded in a positioning slot on the device housing through the notch.

[0013] Furthermore, the limit rod is movably installed in the positioning housing through a movable block, the limit rod extends out of the positioning housing through a movable hole, a groove is provided on the movable block, and the permanent magnet is installed on the movable block through the groove.

[0014] Furthermore, the supporting legs are fixed to the bottom of the positioning slots by screws.

[0015] Compared with the prior art, the present invention has the following beneficial effects:

[0016] During the test, the user only needs to place the circuit board in the positioning slot. After the circuit board is placed in the positioning slot, the propulsion plate can be released. After the propulsion plate is released, the first spring will push the propulsion plate up to the front end of the circuit board. After the propulsion plate rises to the front end of the circuit board, the drive motor can be started. After the drive motor is started, the drive screw will rotate. After the drive screw rotates, the nut seat can move in a straight line, thereby driving the propulsion plate to move backward. After the propulsion plate moves backward, it will limit the circuit board in the positioning slot. After the circuit board is limited in the positioning slot, the first electromagnet can be closed. After the first electromagnet is closed, the connecting armature will be separated from the first electromagnet. After the connecting armature is separated from the first electromagnet, the second spring will push the test probe to move upward, thereby making the test probe hit the contact on the circuit board. After the test probe hits the contact on the circuit board, power can be turned on for testing. After the test is completed, the first electromagnet can be started to reset the test probe. The entire detection process has a high degree of automation and can reduce safety hazards. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the overall structure of the present invention;

[0018] Figure 2 It is a schematic diagram of the testing mechanism of the present invention;

[0019] Figure 3 It is a schematic diagram of the local structure of the present invention;

[0020] Figure 4 It is a schematic diagram of the driving mechanism of the present invention;

[0021] Figure 5 It is a schematic diagram of the propulsion mechanism of the present invention;

[0022] Figure 6 It is a schematic diagram of the limiting mechanism of the present invention.

[0023] In the figure: 1. positioning slot; 2. movable slide slot; 3. equipment housing; 4. supporting leg; 5. propulsion mechanism; 501. inlet and outlet notch; 502. movable slide block; 503. first spring; 504. propulsion plate; 505. mechanism housing; 506. positioning base; 6. driving mechanism; 601. driving screw; 602. nut seat; 603. docking screw hole; 604. docking leg; 605. positioning bracket; 606. driving motor; 7. testing mechanism; 701. testing probe; 702. reset plate; 703. second spring; 704. reset guide rod; 705. connecting armature; 706. first electromagnet; 8. limiting mechanism; 801. second electromagnet; 802. positioning housing; 803. permanent magnet; 804. movable block; 805. movable hole; 806. limiting rod. DETAILED DESCRIPTION

[0024] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further explained below in conjunction with specific implementation methods.

[0025] like Figure 1 to Figure 6 As shown, a circuit board withstand voltage test fixture includes a device housing 3, support legs 4 are fixedly installed at the four corners of the bottom of the device housing 3, positioning slots 1 are opened on both sides of the device housing 3, a movable slide slot 2 is opened on the device housing 3, a driving mechanism 6 is installed below the movable slide slot 2 in the device housing 3, a propulsion mechanism 5 is fixedly installed on the docking leg 604, a testing mechanism 7 is installed in the device housing 3, a limiting mechanism 8 is fixedly installed on the upper surface of the device housing 3, and the support legs 4 are fixed to the bottom of the positioning slot 1 by screws.

[0026] A driving mechanism 6 is installed below the movable slide groove 2 in the equipment housing 3, and the driving mechanism 6 includes a driving screw 601, a nut seat 602, a docking screw hole 603, a docking foot 604, a positioning bracket 605 and a driving motor 606. The positioning bracket 605 is fixedly installed in the equipment housing 3, and the driving screw 601 is movably installed on the positioning bracket 605. One end of the driving screw 601 is connected to the driving motor 606. A nut seat 602 is movably installed on the driving screw 601, and a docking foot 604 is fixedly installed on the nut seat 602. The docking foot 604 is provided with a docking screw hole 603, and a propulsion mechanism 5 is fixedly installed on the docking foot 604. The propulsion mechanism 5 includes an inlet and outlet notch 501, a movable slider 502, a first spring 503, a propulsion plate 504, a mechanism housing 505 and a positioning base 506. The positioning base 506 is fixedly installed on the docking foot 604, and a mechanism The housing 505 and the mechanism housing 505 are provided with an entry and exit notch 501 at the upper end, a propulsion plate 504 is movably installed in the entry and exit notch 501, a movable slider 502 is fixedly installed at the bottom of the propulsion plate 504, and a first spring 503 is installed below the movable slider 502 in the mechanism housing 505. During testing, the user only needs to place the circuit board in the positioning slot 1. After the circuit board is placed in the positioning slot 1, the propulsion plate 504 can be released. After the propulsion plate 504 is released, the first spring 503 will push the propulsion plate 504 to rise to the front end of the circuit board. After the propulsion plate 504 rises to the front end of the circuit board, the drive motor 606 can be started. After the drive motor 606 is started, the drive screw 601 will rotate. After the drive screw 601 rotates, the nut seat 602 can move in a straight line, thereby driving the propulsion plate 504 to move backward. After the propulsion plate 504 moves backward, it will limit the circuit board in the early positioning slot 1.

[0027] A test mechanism 7 is installed in the device housing 3. The test mechanism 7 includes a test probe 701, a reset plate 702, a second spring 703, a reset guide rod 704, a connecting armature 705 and a first electromagnet 706. The test probe 701 is movably installed on the device housing 3. A reset plate 702 is fixedly installed at the bottom of the test probe 701. A reset guide rod 704 is fixedly installed at the bottom of the reset plate 702. A connecting armature 705 is fixedly installed at the lower end of the reset guide rod 704. A second spring 703 is sleeved on the reset guide rod 704. A first electromagnet 706 is fixedly installed below the connecting armature 705 in the device housing 3. After the circuit board is restricted in the positioning slot 1, the first electromagnet 706 can be turned off. After the first electromagnet 706 is turned off, the connecting armature 705 will be detached from the first electromagnet 706. After the connecting armature 705 is detached from the first electromagnet 706, the second spring 703 will push the test probe 701 to move upward, so that the test probe 701 abuts against the contact on the circuit board. After the test probe 701 abuts against the contact on the circuit board, power can be turned on for testing. After the test is completed, the first electromagnet 706 can be started. After the first electromagnet 706 is started, it will attract the connecting armature 705, so that the test probe 701 is reset.

[0028] The upper surface of the device housing 3 is fixedly installed with a limiting mechanism 8, and the limiting mechanism 8 includes a second electromagnet 801, a positioning housing 802, a permanent magnet 803, a movable block 804, a movable hole 805 and a limiting rod 806. The second electromagnet 801 is fixedly installed on the upper end of the positioning housing 802, and a movable hole 805 is opened at the lower end of the positioning housing 802. The limiting rod 806 is movably installed in the movable hole 805, and the movable block 804 is fixedly installed on the upper end of the limiting rod 806. The upper surface of the movable block 804 is fixedly installed with a permanent magnet. Magnet 803, after the test is completed, the second electromagnet 801 can be started, and after the second electromagnet 801 is started, it will attract the permanent magnet 803, and after the permanent magnet 803 is attracted, it will drive the limit rod 806 to move upward, and after the limit rod 806 moves upward, it will be separated from the positioning slot 1, and after the limit rod 806 is separated from the positioning slot 1, the propulsion plate 504 can be controlled to continue to move backward, and after the propulsion plate 504 continues to move backward, the circuit board that has completed the test can be pushed out of the positioning slot 1.

[0029] It should be noted that the present invention is a circuit board withstand voltage test fixture. In actual use, the circuit board is first placed in the positioning slot 1. After the circuit board is placed in the positioning slot 1, the push plate 504 can be released. Since the push plate 504 is movably installed in the mechanism housing 505 through the movable slider 502, the push plate 504 extends out of the mechanism housing 505 through the inlet and outlet notch 501. One end of the first spring 503 is connected to the bottom of the mechanism housing 505, and the other end of the first spring 503 is connected to the movable slider 502. Therefore, after the push plate 504 is released, the first spring 503 will push the push plate 504 to rise to the front end of the circuit board. After the push plate 504 rises to the front end of the circuit board, the drive motor 6 can be started. 06, since the output end of the driving motor 606 is provided with a coupling, one end of the driving screw 601 is connected to the output end of the driving motor 606 through the coupling, the driving screw 601 is movably installed in the device housing 3 through the positioning bracket 605, and the docking foot 604 is movably installed above the driving screw 601 through the nut seat 602, and the docking foot 604 extends out of the device housing 3 through the movable slide slot 2, so after the driving motor 606 is started, the driving screw 601 will rotate, and after the driving screw 601 rotates, the nut seat 602 can move linearly, thereby driving the propulsion plate 504 to move backward. After the propulsion plate 504 moves backward, it will limit the circuit board in the early positioning slot 1, and the circuit board is limited in the positioning slot 1, the first electromagnet 706 can be closed after that. Since a through hole is provided on the device housing 3, the test probe 701 is movably installed in the device housing 3 through the through hole. The connecting armature 705 is fixed to the bottom of the reset plate 702 through the reset guide rod 704. One end of the second spring 703 is connected to the reset plate 702, and the other end of the second spring 703 is connected to the bottom of the device housing 3. Therefore, after the first electromagnet 706 is closed, the connecting armature 705 will be separated from the first electromagnet 706. After the connecting armature 705 is separated from the first electromagnet 706, the second spring 703 will push the test probe 701 to move upward, so that the test probe 701 abuts against the contact on the circuit board. After the test probe 701 abuts against the contact on the circuit board, The test can be powered on. After the test is completed, the first electromagnet 706 can be started. After the first electromagnet 706 is started, it will attract the connected armature 705, so that the test probe 701 is reset. After the test is completed, the second electromagnet 801 can be started. Since the limit rod 806 is movably installed in the positioning shell 802 through the movable block 804, the limit rod 806 extends out of the positioning shell 802 through the movable hole 805, and a groove is provided on the movable block 804. The permanent magnet 803 is installed on the movable block 804 through the groove. Therefore, after the second electromagnet 801 is started, it will attract the permanent magnet 803. After the permanent magnet 803 is attracted, it will drive the limit rod 806 to move upward. After the limit rod 806 moves upward, it will be separated from the positioning slot 1.After the limit rod 806 is separated from the positioning slot 1, the push plate 504 can be controlled to continue to move backward. After the push plate 504 continues to move backward, the tested circuit board can be pushed out of the positioning slot 1. The entire detection process is highly automated and can reduce safety hazards.

[0030] Finally, it should be noted that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or replace some of the technical features therein by equivalents. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A circuit board withstand voltage test fixture, characterized by: The invention comprises a device housing (3), wherein the bottom of the device housing (3) is fixedly provided with supporting legs (4) at four corners, positioning slots (1) are provided on both sides of the device housing (3), a movable slide slot (2) is provided on the device housing (3), a driving mechanism (6) is installed below the movable slide slot (2) in the device housing (3), the driving mechanism (6) comprises a driving screw (601), a nut seat (602), a docking screw hole (603), a docking leg (604), a positioning bracket (605) and a driving motor (606), the positioning bracket (605) is fixedly installed in the device housing (3), a driving screw (601) is movably installed on the positioning bracket (605), and the driving screw (601) is The end of the driving screw (601) is connected to a driving motor (606); a nut seat (602) is movably mounted on the driving screw (601); a docking support leg (604) is fixedly mounted on the nut seat (602); a docking screw hole (603) is provided on the docking support leg (604); a propulsion mechanism (5) is fixedly mounted on the docking support leg (604); the propulsion mechanism (5) comprises an inlet and outlet notch (501), a movable slider (502), a first spring (503), a propulsion plate (504), a mechanism housing (505) and a positioning base (506); the positioning base (506) is fixedly mounted on the docking support leg (604); a mechanism housing (505) is fixedly mounted on the positioning base (506); the mechanism housing (505) 05) is provided with an inlet and outlet notch (501) at the upper end, a propulsion plate (504) is movably installed in the inlet and outlet notch (501), a movable slider (502) is fixedly installed at the bottom of the propulsion plate (504), a first spring (503) is installed below the movable slider (502) in the mechanism housing (505), a test mechanism (7) is installed in the device housing (3), the test mechanism (7) comprises a test probe (701), a reset plate (702), a second spring (703), a reset guide rod (704), a connecting armature (705) and a first electromagnet (706), the test probe (701) is movably installed on the device housing (3), a reset plate (702), a second spring (703), a reset guide rod (704), a connecting armature (705) and a first electromagnet (706), the test probe (701) is movably installed on the device housing (3), and a reset plate (504) is fixedly installed at the bottom of the test probe (701) The reset plate (702) is fixedly mounted with a reset guide rod (704) at the bottom, a connecting armature (705) is fixedly mounted at the lower end of the reset guide rod (704), a second spring (703) is sleeved on the reset guide rod (704), a first electromagnet (706) is fixedly mounted below the connecting armature (705) in the device housing (3), a limiting mechanism (8) is fixedly mounted on the upper surface of the device housing (3), the limiting mechanism (8) comprises a second electromagnet (801), a positioning housing (802), a permanent magnet (803), a movable block (804), a movable hole (805) and a limiting rod (806), a second electromagnet (801) is fixedly mounted on the upper end of the positioning housing (802),The lower end of the positioning housing (802) is provided with a movable hole (805), a limit rod (806) is movably installed in the movable hole (805), a movable block (804) is fixedly installed on the upper end of the limit rod (806), and a permanent magnet (803) is fixedly installed on the upper surface of the movable block (804).

2. A circuit board withstand voltage test fixture according to claim 1, characterized in that: The output end of the driving motor (606) is provided with a coupling, and one end of the driving screw (601) is connected to the output end of the driving motor (606) through the coupling.

3. A circuit board withstand voltage test fixture according to claim 2, characterized in that: The driving screw (601) is movably mounted in the device housing (3) via a positioning bracket (605); the docking support foot (604) is movably mounted above the driving screw (601) via a nut seat (602); and the docking support foot (604) extends out of the device housing (3) via a movable slide groove (2).

4. A circuit board withstand voltage test fixture according to claim 3, characterized in that: The positioning base (506) is provided with screws, and the positioning base (506) is fixed to the docking legs (604) by means of the screws.

5. A circuit board withstand voltage test fixture according to claim 4, characterized in that: The propulsion plate (504) is movably installed in the mechanism housing (505) through a movable slider (502); the propulsion plate (504) extends out of the mechanism housing (505) through an inlet and outlet notch (501); one end of the first spring (503) is connected to the bottom of the mechanism housing (505); and the other end of the first spring (503) is connected to the movable slider (502).

6. A circuit board withstand voltage test fixture according to claim 5, characterized in that: The device housing (3) is provided with a through hole, and the test probe (701) is movably installed in the device housing (3) through the through hole.

7. A circuit board withstand voltage test fixture according to claim 6, characterized in that: The connecting armature (705) is fixed to the bottom of the reset plate (702) via a reset guide rod (704); one end of the second spring (703) is connected to the reset plate (702); and the other end of the second spring (703) is connected to the bottom of the device housing (3).

8. A circuit board withstand voltage test fixture according to claim 7, characterized in that: The upper surface of the device housing (3) is provided with a notch, and the limiting rod (806) is embedded in the positioning slot (1) on the device housing (3) through the notch.

9. A circuit board withstand voltage test fixture according to claim 8, characterized in that: The limiting rod (806) is movably installed in the positioning shell (802) through the movable block (804); the limiting rod (806) extends out of the positioning shell (802) through the movable hole (805); a groove is provided on the movable block (804); and the permanent magnet (803) is installed on the movable block (804) through the groove.

10. A circuit board withstand voltage test fixture according to claim 9, characterized in that: The supporting legs (4) are fixed to the bottom of the positioning slot (1) by means of screws.

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