An apparatus and method for evaluating performance of an optical module equalizer

Abstract

The application discloses a device and method for evaluating the performance of an optical module equalizer, and the device comprises a bit error rate tester, a power supply, an optical module test board and a host computer, the optical module test board is used for connecting an optical module to be tested; the host computer is used for scanning and controlling the EQ position of the bit error rate tester and the EQ position of the measured optical module, performing combination test on all the EQ positions of the EQ position of the bit error rate tester and the EQ position of the measured optical module, recording all the test data and analyzing the optimal EQ position of the optical module. Through the application, the overall EQ capability of the optical module can be tested, and the EQ performance of the optical module under different channels or different application environments can be quantified and analyzed according to the test data, so as to solve the problems of how to select the optimal EQ position of the optical module, how to screen the products with qualified EQ capability and how to solve the signal integrity problem frequently occurring in the application scene of the optical module.

Description

Technical Field

[0001] This invention relates to the field of optical module testing, and more specifically to an apparatus and method for evaluating the performance of an optical module equalizer. Background Technology

[0002] Users' demands for internet quality and speed are constantly increasing. Many aspects of our work and daily life have now adopted "fiber-to-the-home" (FTTH) technology, with optical modules being the core components of optical communication. Electrical signals experience a certain amount of loss during transmission within the optical module. To ensure the integrity of the optical module's signal, the equalization (EQ) value needs to be adjusted to compensate for the signal loss during transmission.

[0003] As signal rates increase, high-frequency signal loss at transmission and connectors becomes increasingly significant. To address signal integrity, the optical communication industry uses equalizers to compensate for this high-frequency signal attenuation. However, the degree of high-frequency signal attenuation is intricately related to factors such as signal cable length, material, return current, and shielding, and varies greatly depending on the application scenario. Therefore, the degree of equalizer compensation (EQ value tuning and testing) has become a crucial aspect of high-speed optical module R&D, production management, and on-site installation.

[0004] In the research and development and production of optical modules, selecting the optimal EQ setting and screening products with qualified EQ capabilities raises several questions regarding how to better ensure the signal integrity of optical modules:

[0005] 1. Selecting the optimal EQ setting during the R&D process involves choosing the setting from the optical module that best accommodates the most EQ settings of the bit error rate analyzer. This requires identifying the optimal EQ range for the optical module. Selecting the optimal EQ range requires varying the EQ settings of both the optical module and the bit error rate analyzer, recording the bit error rate during testing. The optical module has 16 EQ settings from 0 to 15, while the bit error rate analyzer has 8 settings from 0 to 7. Alternating these settings results in 16*8 sets of data that need to be tested, necessitating the accumulation of a large amount of data for analysis and comparison. Manually searching for these settings would not only waste significant manpower and time but also inevitably lead to errors in measurement and analysis.

[0006] 2. In signal transmission, high-frequency losses occur not only in optical modules but also in switches. Since losses exist, compensation is necessary. Currently, there are many different switch models on the market, each with different compensation parameters. Optical modules adapting to different switches mean they need to be compatible with different EQ settings. Finding the appropriate EQ setting for different switches typically requires continuous on-site adjustments and cannot be qualitatively analyzed.

[0007] 3. To generate a better data model that guarantees the EQ performance of optical modules, a detailed understanding of the differences and problems in the internal EQ performance of the optical module is necessary for subsequent improvements and mitigation. However, even with the same optical module, the signal compensation effect will vary depending on the channel, temperature, voltage, or different compensation scheme. Extensive test data comparison is required to obtain the characteristics of the optical module's EQ performance.

[0008] 4. In mass production, speed and accuracy are essential. However, testing the EQ performance of optical modules requires scanning the EQ levels one by one to determine the EQ performance of the optical modules, which inevitably consumes a lot of time. Summary of the Invention

[0009] In view of the technical defects and drawbacks existing in the prior art, embodiments of the present invention provide an apparatus and method for evaluating the performance of optical module equalizers to overcome the above problems or at least partially solve the above problems, the specific solution of which is as follows:

[0010] As a first aspect of the present invention, an apparatus for evaluating the performance of an optical module equalizer is provided. The apparatus includes a bit error rate tester, a power supply, an optical module test board, and a host computer. The power supply is electrically connected to the optical module test board and is used to supply power to the optical module test board. The optical module test board is also electrically connected to the bit error rate tester and the host computer, respectively. The host computer is also electrically connected to the bit error rate tester.

[0011] The optical module test board is used to connect the optical module to be tested.

[0012] The host computer is used to scan and control the EQ settings of the bit error rate tester and the optical module under test, perform combined tests of all EQ settings of the bit error rate tester and the optical module under test, record all test data, and analyze the optimal EQ setting of the optical module.

[0013] Furthermore, the optical module test board communicates with the computer via an IIC-to-USB converter, and is also electrically connected to the bit error rate tester via a high-speed signal line. The bit error rate tester is electrically connected to the computer via USB.

[0014] Furthermore, the host computer is also used to set the bit error rate, code pattern, and test time for each EQ level of the bit error rate tester.

[0015] Furthermore, the test data includes the bit error rate of different EQ settings. The host computer analyzes the bit error rate of different EQ settings of the bit error rate meter to obtain the setting with the strongest EQ adaptability of the optical module, that is, the optimal EQ setting of the optical module, and uses this setting as the initial default EQ setting of the optical module.

[0016] Furthermore, the host computer is also used to find the optimal operating range in the optical module by analyzing the bit error rate of different bit error rate EQ levels in the scanning results.

[0017] Furthermore, the host computer is also used to compare the test data of optical modules of the same type after measuring multiple optical modules, filter the optical module SN as a series, the optical module channel as the X-axis, and the bit error rate as the Y-axis, and find the bit error threshold value of each combination of different channels, which is used as the bit error threshold value for subsequent testing of optical modules.

[0018] Here, SN (serial number) refers to the optical module's serial number; different SNs indicate different optical modules. Channel refers to the four signal transmission channels within a high-speed optical module, each with its own unique EQ level. After testing a large number of similar optical modules and obtaining data, the required module EQ levels and bit error rate tester EQ levels are filtered out. The filtered test data is then divided into four groups based on channel, and the data with the highest bit error rate in each group is selected as the bit error threshold for that channel and level. This selection method is then used to test the threshold values ​​for other channels and other levels sequentially.

[0019] As a second aspect of the present invention, a method for evaluating the performance of an optical module equalizer is provided, comprising the apparatus for evaluating the performance of an optical module equalizer as described in any of the above descriptions, the method comprising:

[0020] Insert the optical module to be tested into the optical module test board;

[0021] By scanning and controlling the EQ settings of the bit error rate tester and the optical module under test through the host computer, a combination test of all EQ settings of the bit error rate tester and the optical module under test is performed, all test data are recorded, and the optimal EQ setting of the optical module is analyzed.

[0022] Furthermore, the test data includes the bit error rate of different EQ settings. By analyzing the bit error rate of different bit error rate tester EQ settings, the setting with the strongest EQ adaptability of the optical module is obtained, that is, the optimal EQ setting of the optical module, and this setting is used as the initial default EQ setting of the optical module.

[0023] Furthermore, the method also includes: identifying the optimal operating range in the optical module by analyzing the bit error rate of different bit error rate meter EQ settings in the scanning results.

[0024] Furthermore, the method also includes: after measuring multiple optical modules, comparing the test data of optical modules of the same type, using the SN as a series, the optical module channel as the X-axis, and the bit error rate as the Y-axis for filtering, and finding the bit error threshold value for each combination of different channels, which is then used as the bit error threshold value for subsequent testing of optical modules.

[0025] The present invention has the following beneficial effects:

[0026] 1. This invention can automatically scan optical modules, store the results, and analyze the data. This allows for rapid evaluation of the product's EQ performance, finding the most suitable EQ setting for the optical module, and providing a basis for solving signal integrity problems encountered in optical module applications.

[0027] 2. This invention uses optical module data generated during the R&D phase to identify optimal test points. Using these optimal test points during production allows for the precise identification of optical modules with substandard EQ performance, improving production efficiency and product quality.

[0028] 3. When making subsequent changes to the optical module or comparing its performance with other optical modules, this invention allows for precise understanding of whether the replacement of materials or processes has a positive impact on the product's EQ performance through EQ test data. It also enables comparison with different types of optical modules to understand the differences in EQ performance between different types.

[0029] 4. The instruments used in this invention are simple; only a bit error rate tester, power supply, power board, and computer are needed to form a testing environment. All the equipment used is existing equipment from production testing and no additional equipment is required. Attached Figure Description

[0030] Figure 1 A structural diagram of a device for evaluating the performance of an optical module equalizer is provided in an embodiment of the present invention;

[0031] Figure 2 This is a schematic diagram of the test data process provided in an embodiment of the present invention;

[0032] Figure 3 This is a schematic diagram of the test results provided in an embodiment of the present invention;

[0033] Figure 4 The filtering error threshold value provided in the embodiments of the present invention;

[0034] Figure 5 This is a process diagram for obtaining the optimal test point according to an embodiment of the present invention. Detailed Implementation

[0035] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the present invention, and not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0036] As a first embodiment of the present invention, an apparatus for evaluating the performance of an optical module equalizer is provided, such as... Figure 1As shown, to implement this device, the required equipment includes a bit error rate tester, a power supply, an optical module test board, and a host PC. During testing, the optical module to be tested is inserted into the powered optical module test board. The optical module test board communicates with the computer via an IIC-to-USB converter and is simultaneously connected to the bit error rate tester via a high-speed signal cable. The bit error rate tester is also connected to the computer via USB.

[0037] like Figure 2 The host computer is used to connect to the optical module test board and the bit error rate (BER) meter during testing. It sets the BER meter's rate, code type, and EQ settings for each test level. It also changes the BER meter's EQ level to simulate different EQ levels of a switch, scanning and controlling the combination of the BER meter's EQ level and the EQ level of the optical module under test. Each combination is held for the same amount of time (e.g., 10 seconds), and the BER rate for each level is recorded. All test data is saved to a database, and the optimal EQ level is analyzed. The test results are as follows: Figure 3 As shown.

[0038] Preferably, the analysis of the optimal EQ setting for the optical module includes: arranging all data into series based on SN and channel, using different EQ settings as the X-axis and the bit error rate as the Y-axis, filtering and screening the channels separately, and obtaining the EQ setting with the strongest adaptability of the optical module according to a specific algorithm. This is the optimal EQ setting for the optical module, and this setting is used as the initial default EQ setting for the optical module.

[0039] The filtering process involves first separating the data according to the channel, then selecting the bit error rate meter EQ and optical module EQ as the X-axis and the bit error rate as the Y-axis to find the interval with the lowest bit error rate, and then taking the median value. The resulting gear is the gear with the best EQ adaptability in this channel. The algorithm refers to the filtering algorithm in the host computer.

[0040] Preferably, the optimal operating range of the optical module can be found by analyzing the bit error rate in the scanning results. A result of 0 indicates no bit error, and data with a background color other than white indicates that the bit error rate exceeds the bit error threshold (the initial threshold is 0.01).

[0041] Preferably, after accumulating a large amount of data, data from optical modules of the same type are compared. The serial number (SN) is used as a series, the optical module channel is plotted on the X-axis, and the bit error rate (BER) is plotted on the Y-axis for filtering. This allows for the identification of the BER threshold value for each combination of channels, such as... Figure 4 As shown.

[0042] After setting the error threshold, save the threshold setting. When testing the optical module later, you can directly import the threshold and check if there is any data with a background that is not white in the test results. If it exists, the optical module is unqualified; if it does not exist, the optical module is qualified. This can quickly distinguish the pass / fail status of the optical module EQ. After testing for a period of time, the threshold setting also needs to be adjusted appropriately.

[0043] Through the above screening, one or more optimal test points common to all defective optical modules can be identified. These test points are recorded, and only these test points and corresponding threshold settings need to be used during production. Figure 5 As shown.

[0044] After each change in optical module materials, a batch of optical modules is manufactured for EQ performance testing. Comparing the test data with previous data reveals whether the new materials affect the module's performance. During the R&D verification phase, the acquired test data can be compared and filtered using a host computer to examine differences between different channels of the same type of optical module, as well as differences between different optical module types. Furthermore, during production, EQ test data can be compared with standard part EQ data to identify problematic products early.

[0045] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A device for evaluating the performance of an optical module equalizer, characterized in that, The device includes a bit error rate tester, a power supply, an optical module test board, and a host computer. The power supply is electrically connected to the optical module test board and is used to supply power to the optical module test board. The optical module test board is also electrically connected to the bit error rate tester and the host computer, and the host computer is also electrically connected to the bit error rate tester. The optical module test board is used to connect the optical module to be tested. The host computer is used to scan and control the EQ settings of the bit error rate tester and the EQ settings of the optical module under test, perform combination tests of all EQ settings of the bit error rate tester and the optical module under test, record all test data and analyze the optimal EQ setting of the optical module. The test data includes the bit error rate of different EQ settings. The host computer analyzes the bit error rate of different bit error rate tester EQ settings to obtain the EQ setting with the strongest adaptability of the optical module, that is, the best EQ setting of the optical module, and uses this setting as the initial default EQ setting of the optical module. The host computer is also used to identify the optimal operating range of the optical module by analyzing the bit error rate of different EQ levels of the bit error rate meter in the scanning results; the host computer is also used to compare the test data of the same type of optical modules after measuring multiple optical modules, filter the optical module SN as a series, the optical module channel as the X-axis and the bit error rate as the Y-axis, and find the bit error threshold value of each combination level under different channels, which will be used as the bit error threshold value for subsequent testing of optical modules.

2. The apparatus for evaluating the performance of an optical module equalizer according to claim 1, characterized in that, The optical module test board communicates with the computer via an IIC-to-USB converter and is also electrically connected to the bit error rate tester via a high-speed signal line. The bit error rate tester is electrically connected to the computer via USB.

3. The apparatus for evaluating the performance of an optical module equalizer according to claim 1, characterized in that, The host computer is also used to set the bit error rate, code type, and test time for each EQ level of the bit error rate tester.

4. A method for evaluating the performance of an optical module equalizer, comprising the apparatus for evaluating the performance of an optical module equalizer as described in any one of claims 1-3, characterized in that, The method includes: Insert the optical module to be tested into the optical module test board; By scanning and controlling the EQ settings of the bit error rate tester and the optical module under test through the host computer, a combination test of all EQ settings of the bit error rate tester and the optical module under test is performed, all test data are recorded, and the optimal EQ setting of the optical module is analyzed.

5. The method for evaluating the performance of an optical module equalizer according to claim 4, characterized in that, The test data includes the bit error rate of different EQ settings. By analyzing the bit error rate of different bit error rate tester EQ settings, the setting with the strongest EQ adaptability of the optical module is obtained, which is the optimal EQ setting of the optical module. This setting is then used as the initial default EQ setting of the optical module.

6. The method for evaluating the performance of an optical module equalizer according to claim 5, characterized in that, The method further includes: identifying the optimal operating range in the optical module by analyzing the bit error rate of different bit error rate meter EQ settings in the scanning results.

7. The method for evaluating the performance of an optical module equalizer according to claim 6, characterized in that, The method further includes: after measuring multiple optical modules, comparing the test data of optical modules of the same type, using the SN as a series, the optical module channel as the X-axis, and the bit error rate as the Y-axis for filtering, and finding the bit error threshold value for each combination of different channels, which is then used as the bit error threshold value for subsequent testing of optical modules.

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