A measurement method and a measurement system

Abstract

Embodiments of the present application disclose a measurement method and a measurement system, which are used to improve the accuracy of distinguishing structured light patterns, so as to improve the accuracy of measuring three-dimensional information of an object to be measured. The method comprises the following steps: a measurement device acquires a measurement image, the measurement image is formed by photographing an object to be measured, the measurement image comprises N structured light patterns and M marker light patterns, M is a positive integer greater than or equal to 1, and N is a positive integer greater than or equal to 2; the measurement device identifies the N structured light patterns and the M marker light patterns in the measurement image; the measurement device distinguishes each structured light pattern in the N structured light patterns according to the M marker light patterns; and the measurement device acquires three-dimensional information of the object to be measured according to the N distinguished structured light patterns.

Description

Technical Field

[0001] This application relates to the field of optical imaging technology, and in particular to a measurement method and measurement system. Background Technology

[0002] Based on the 3D information of the object under test, 3D reconstruction of the object can be achieved. To measure the 3D information of the object, multi-line structured light can be irradiated onto the surface of the object, and a camera can capture images of the object to obtain measurement images. The measurement device can compare the multi-line structured light included in the measurement image with the multi-line structured light in the template stored in the measurement device. By comparing the changes in the multi-line structured light in the measurement image relative to the multi-line structured light in the template, the purpose of measuring the 3D information of the object under test can be achieved.

[0003] If the shapes of the multi-line structured lights in the measurement image are all the same, the measuring device cannot accurately distinguish them and therefore cannot compare them with the multi-line structured lights in the template. Therefore, the measuring device needs to number the multi-line structured lights in the measurement image sequentially and then compare each numbered multi-line structured light with the multi-line structured lights in the template one by one.

[0004] However, if the line structured light is lost or misaligned due to obstruction by obstacles, it will result in the loss or misalignment of the structured light in the measurement image. This will cause the measuring device to misnumber the multi-line structured light, leading to errors in comparison and reducing the accuracy of measuring the three-dimensional information of the object under test. Summary of the Invention

[0005] This invention provides a measurement method and system for improving the accuracy of distinguishing structured light patterns, thereby improving the accuracy of measuring the three-dimensional information of the object under test.

[0006] A first aspect of this invention provides a measurement method, the method comprising: a measuring device acquiring a measurement image, the measurement image being formed by photographing an object to be measured, the measurement image including N structured light patterns and M marker light patterns, where M is a positive integer greater than or equal to 1 and N is a positive integer greater than or equal to 2; the measuring device identifying the N structured light patterns and the M marker light patterns in the measurement image; the measuring device distinguishing each of the N structured light patterns based on the M marker light patterns; and the measuring device acquiring three-dimensional information of the object to be measured based on the distinguished N structured light patterns.

[0007] As can be seen, based on the marker light pattern, the measuring device can accurately determine the correspondence between each structured light pattern and the template light pattern, improving the accuracy and efficiency of measuring the three-dimensional information of the object under test. Moreover, even if the structured light pattern is lost or misaligned, the measuring device can still ensure that the structured light pattern is accurately compared with the corresponding template light pattern to achieve the measurement of three-dimensional information, thus ensuring the robustness of the three-dimensional information measurement.

[0008] Based on the first aspect, in an optional implementation, before the measuring device acquires the measurement image, the method further includes: a projection device emitting structured light onto the object to be measured to illuminate the N structured light patterns on the surface of the object to be measured; the projection device emitting marker light onto the object to be measured to illuminate the M marker light patterns on the surface of the object to be measured; an image acquisition device capturing images of the object to be measured to acquire the measurement image; and the image acquisition device sending the measurement image to the measuring device.

[0009] As can be seen, the image acquisition device can capture images of the object under test to obtain measurement images including N structured light patterns and M marker light patterns, so as to ensure that the measurement device can measure the three-dimensional information of the object under test based on the measurement images from the image acquisition device.

[0010] Based on the first aspect, in an optional implementation, the projection device emitting marking light onto the object under test includes: the projection device determining the light intensity of the M marking light patterns illuminating the surface of the object under test according to the state corresponding to the object under test.

[0011] As can be seen, the projection device can dynamically adjust the light intensity of the M marker light patterns illuminating the surface of the object under test according to the state of the object under test, so as to ensure that the marker light patterns included in the measurement image are clear, ensure the accuracy of determining the corresponding marker light patterns and template light patterns based on the marker light patterns, and ensure the accuracy of measuring three-dimensional information.

[0012] Based on the first aspect, in an optional implementation, one of the target identification light patterns among the M identification light patterns and one of the target structured light patterns among the N structured light patterns satisfy one of the following conditions: the target identification light pattern is connected to the target structured light pattern; the target identification light pattern partially overlaps with the target structured light pattern; or the distance between the target identification light pattern and the target structured light pattern is less than or equal to a preset value.

[0013] It is evident that, based on the conditions satisfied by the target structured light pattern and the target identification light pattern, the measuring device can accurately ensure that the target identification light pattern can be distinguished from the N structured light patterns.

[0014] Based on the first aspect, in an optional implementation, the M marker light patterns correspond to N template light patterns, and the measuring device obtains the three-dimensional information of the object under test based on the distinguished N structured light patterns, including: the measuring device obtains the N template light patterns corresponding to the N structured light patterns based on the M marker light patterns; the measuring device obtains the three-dimensional information of the object under test based on the changes of the N structured light patterns relative to the N template light patterns.

[0015] As can be seen, based on the marker light pattern, the measuring device can accurately determine the correspondence between each structured light pattern and the template light pattern, compare the changes of the structured light pattern and the corresponding template light pattern to achieve the measurement of three-dimensional information, thereby improving the accuracy and efficiency of measuring the three-dimensional information of the object under test. Moreover, even if the structured light pattern is lost or misaligned, the measuring device can still ensure that the changes of the structured light pattern are accurately compared with the corresponding template light pattern to achieve the measurement of three-dimensional information, ensuring the robustness of the three-dimensional information measurement.

[0016] Based on the first aspect, in an optional implementation, the measuring device obtaining the N template light patterns corresponding to the N structured light patterns based on the M identifier light patterns includes: the measuring device obtaining an identifier list, the identifier list including the correspondence between the identifier light patterns and identifier serial numbers, the identifier list also including the correspondence between the identifier serial numbers and the template light patterns, and different identifier serial numbers corresponding to different template light patterns; the measuring device obtaining the N identifier serial numbers corresponding to the M identifier light patterns based on the identifier list; and the measuring device obtaining the N template light patterns corresponding to the N identifier serial numbers based on the identifier list.

[0017] It is evident that the measuring device can determine the identifier number corresponding to each identifier light pattern, and then accurately obtain the template light pattern corresponding to each structured light pattern based on the template light pattern corresponding to each identifier number, thereby improving the accuracy of measuring three-dimensional information.

[0018] Based on the first aspect, in an optional implementation, the measuring device acquiring the N template light patterns corresponding to the N structured light patterns based on the M identifier light patterns includes: the measuring device acquiring M template identifier light patterns corresponding to the M identifier light patterns, the M template identifier light patterns being used to distinguish each template light pattern among the N template light patterns, each of the M identifier light patterns being at least partially identical to the corresponding template identifier light pattern; and the measuring device acquiring the N template light patterns corresponding to the M template identifier light patterns.

[0019] It is evident that the measuring device can determine the template light pattern corresponding to each marker light pattern, and then accurately obtain the template light pattern corresponding to each structured light pattern based on the template light pattern corresponding to each template light pattern, thereby improving the accuracy of measuring three-dimensional information.

[0020] Based on the first aspect, in an optional implementation, M is equal to N, each of the M identification light patterns corresponds to an identification information, different identification light patterns correspond to different identification information, and the identification information is an identification sequence number or a template identification light pattern.

[0021] It can be seen that when M equals N, the measuring device can accurately obtain the template light pattern corresponding to each structured light pattern according to the one-to-one correspondence between the marker light pattern and the structured light pattern, thereby improving the accuracy of measuring three-dimensional information.

[0022] Based on the first aspect, in an optional implementation, M is greater than N, and among the M identification light patterns, at least two of the identification light patterns jointly correspond to one identification information, wherein the identification information is an identification sequence number or a template identification light pattern.

[0023] As can be seen, when M is greater than N, two or more identification light patterns correspond to one identification information, which effectively ensures the success rate of identification light patterns in distinguishing structured light patterns and avoids the situation where structured light patterns cannot be distinguished due to the loss of identification light patterns.

[0024] Based on the first aspect, in an optional implementation, M is less than N, and the M identification light patterns include a first identification light pattern and a second identification light pattern that are adjacent in position; the first identification light pattern corresponds to first identification information; the second identification light pattern corresponds to second identification information; among the N identification information arranged in sequence, a third identification information is further included between the first identification information and the second identification information, and the first identification light pattern and the second identification light pattern jointly correspond to the third identification information, wherein the identification information is an identification sequence number or a template identification light pattern.

[0025] It can be seen that when M is less than N, the measuring device can identify N structured light patterns based on M marker light patterns. Even with a reduced number of marker light patterns, it can still accurately distinguish N structured light patterns, thereby reducing the light power of the marker light emitted by the projection device.

[0026] Based on the first aspect, in an optional implementation, the measuring device obtains the N template light patterns corresponding to the N structured light patterns according to the M identifier light patterns, including: the measuring device identifies the styles corresponding to the M identifier light patterns in the measurement image, wherein the styles of the identifier light patterns corresponding to different structured light patterns are different; the measuring device determines the N template light patterns corresponding to the N structured light patterns according to the styles corresponding to the M identifier light patterns.

[0027] It is evident that the measuring device can determine the correspondence between N structured light patterns and N template light patterns based on the patterns of M marker light patterns, thereby improving the accuracy of measuring three-dimensional information.

[0028] Based on the first aspect, in an optional implementation, the measuring device obtains the N template light patterns corresponding to the N structured light patterns according to the M identifier light patterns, including: the measuring device identifying the encoding information carried by the M identifier light patterns in the measurement image, wherein the encoding information carried by the identifier light patterns corresponding to different structured light patterns is different; the measuring device determining the N template light patterns corresponding to the N structured light patterns according to the encoding information carried by the M identifier light patterns.

[0029] It is evident that the measuring device can determine the correspondence between N structured light patterns and N template light patterns based on the encoded information carried by M marker light patterns, thereby improving the accuracy of measuring three-dimensional information.

[0030] Based on the first aspect, in one optional implementation, the encoding information includes multiple encoding values, the identification light pattern has multiple sub-patterns, and at least one of the brightness or color of each of the multiple sub-patterns corresponds to the encoding value.

[0031] Based on the first aspect, in an optional implementation, the measuring device identifying the N structured light patterns and the M marker light patterns in the measurement image includes: the measuring device identifying M feature information corresponding to each of the M marker light patterns in the measurement image, wherein the feature information corresponding to different structured light patterns is different; the measuring device obtaining the N template light patterns corresponding to the N structured light patterns based on the M marker light patterns includes: the measuring device determining the N template light patterns corresponding to the N structured light patterns based on artificial intelligence (AI) and the feature information corresponding to each of the M marker light patterns.

[0032] It is evident that the measuring device can determine the correspondence between N structured light patterns and N template light patterns based on the M feature information corresponding to the M marker light patterns, thereby improving the accuracy of measuring three-dimensional information.

[0033] Based on the first aspect, in an optional implementation, the measuring device acquires the three-dimensional information of the object under test based on the N distinguished structured light patterns, comprising: the measuring device acquiring a target identification light pattern, the target identification light pattern being located between a first identification light pattern and a second identification light pattern, the first identification light pattern, the target identification light pattern, and the second identification light pattern being used to sequentially distinguish three adjacent structured light patterns among the N structured light patterns; the measuring device acquiring first identification information, the first identification information being the identification information corresponding to the target identification light pattern; the measuring device acquiring second identification information, the second identification information being located between the identification information corresponding to the first identification light pattern and the identification information corresponding to the second identification light pattern among the N sequentially arranged identification information, the identification information being an identification sequence number or a template identification light pattern; when the first identification information and the second identification information are at least partially identical, the measuring device acquires the three-dimensional information of the object under test based on the N distinguished structured light patterns.

[0034] It is evident that the measuring device can determine the accuracy of the correspondence between the N structured light patterns and the N template light patterns based on the first and second identification information. Only when the measuring device determines that the correspondence between the N structured light patterns and the N template light patterns is accurate will the three-dimensional information be measured, thus improving the accuracy of the three-dimensional information measurement.

[0035] A second aspect of this invention provides a measurement system, the measurement system including a measuring device, the measuring device being configured to: acquire a measurement image, the measurement image being formed by photographing an object to be measured, the measurement image including N structured light patterns and M marker light patterns, where M is a positive integer greater than or equal to 1 and N is a positive integer greater than or equal to 2; identify the N structured light patterns and the M marker light patterns in the measurement image; distinguish each of the N structured light patterns according to the M marker light patterns; and acquire three-dimensional information of the object to be measured based on the distinguished N structured light patterns.

[0036] The measurement system shown in this aspect is used to perform the measurement method shown in any of the first aspects above. For a description of the beneficial effects, please refer to the first aspect, which will not be elaborated further.

[0037] Based on the second aspect, in an optional implementation, the measurement system further includes a projection device and an image acquisition device. The projection device is used to emit structured light onto the object under test to illuminate the N structured light patterns on the surface of the object under test; and to emit marker light onto the object under test to illuminate the M marker light patterns on the surface of the object under test. The image acquisition device is used to photograph the object under test to obtain the measurement image and to send the measurement image to the measurement device.

[0038] Based on the second aspect, in an optional implementation, the projection device is further configured to determine the light intensity of the M marker light patterns illuminating the surface of the object under test according to the state corresponding to the object under test.

[0039] Based on the second aspect, in an optional implementation, one of the target identification light patterns among the M identification light patterns and one of the target structured light patterns among the N structured light patterns satisfy one of the following conditions:

[0040] The target identification light pattern is connected to the target structured light pattern; the target identification light pattern and the target structured light pattern partially overlap; or the distance between the target identification light pattern and the target structured light pattern is less than or equal to a preset value.

[0041] Based on the second aspect, in an optional implementation, the M marker light patterns correspond to N template light patterns, and the measuring device is further configured to: obtain the N template light patterns corresponding to the N structured light patterns based on the M marker light patterns; and obtain the three-dimensional information of the object to be measured based on the changes of the N structured light patterns relative to the N template light patterns.

[0042] Based on the second aspect, in an optional implementation, the measuring device is further configured to: obtain an identifier list, the identifier list including the correspondence between the identifier light patterns and the identifier serial numbers, the identifier list also including the correspondence between the identifier serial numbers and the template light patterns, and different identifier serial numbers corresponding to different template light patterns; obtain N identifier serial numbers corresponding to the M identifier light patterns according to the identifier list; and obtain N template light patterns corresponding to the N identifier serial numbers according to the identifier list.

[0043] Based on the second aspect, in an optional implementation, the measuring device is further configured to acquire M template identification light patterns corresponding to the M identification light patterns, the M template identification light patterns being used to distinguish each template light pattern among the N template light patterns, each of the M identification light patterns being at least partially identical to the corresponding template identification light pattern; and to acquire the N template light patterns corresponding to the M template identification light patterns.

[0044] Based on the second aspect, in an optional implementation, M is equal to N, each of the M identification light patterns corresponds to an identification information, different identification light patterns correspond to different identification information, and the identification information is an identification sequence number or a template identification light pattern.

[0045] Based on the second aspect, in an optional implementation, M is greater than N, and among the M identification light patterns, at least two of the identification light patterns jointly correspond to one identification information, wherein the identification information is an identification sequence number or a template identification light pattern.

[0046] Based on the second aspect, in an optional implementation, M is less than N, and the M identification light patterns include a first identification light pattern and a second identification light pattern that are adjacent in position; the first identification light pattern corresponds to first identification information; the second identification light pattern corresponds to second identification information; among the N identification information arranged in sequence, a third identification information is also included between the first identification information and the second identification information, and the first identification light pattern and the second identification light pattern jointly correspond to the third identification information, wherein the identification information is an identification sequence number or a template identification light pattern.

[0047] Based on the second aspect, in an optional implementation, the measuring device is further configured to identify the patterns corresponding to the M marker light patterns in the measuring image, wherein the patterns of the marker light patterns corresponding to different structured light patterns are different; the measuring device is further configured to determine the N template light patterns corresponding to the N structured light patterns according to the patterns corresponding to the M marker light patterns.

[0048] Based on the second aspect, in an optional implementation, the measuring device is further configured to identify the encoding information carried by the M marker light patterns in the measuring image, wherein the encoding information carried by the marker light patterns corresponding to different structured light patterns is different; and determine the N template light patterns corresponding to the N structured light patterns based on the encoding information carried by the M marker light patterns.

[0049] Based on the second aspect, in an optional implementation, the encoding information includes multiple encoding values, the identification light pattern has multiple sub-patterns, and at least one of the brightness or color of each of the multiple sub-patterns corresponds to the encoding value.

[0050] Based on the second aspect, in an optional implementation, the measuring device is further configured to identify M feature information corresponding to the M marker light patterns in the measuring image, wherein the feature information of the marker light patterns corresponding to different structured light patterns is different; and based on artificial intelligence (AI), determine the N template light patterns corresponding to the N structured light patterns according to the feature information corresponding to the M marker light patterns.

[0051] Based on the second aspect, in an optional implementation, the measuring device is further configured to acquire a test identification light pattern, the test identification light pattern being located between a first identification light pattern and a second identification light pattern, the first identification light pattern, the test identification light pattern, and the second identification light pattern being used to sequentially distinguish three adjacent structured light patterns among the N structured light patterns; acquire first identification information, the first identification information being the identification information corresponding to the test identification light pattern; acquire second identification information, the second identification information being located between the identification information corresponding to the first identification light pattern and the identification information corresponding to the second identification light pattern among the N sequentially arranged identification information, the identification information being an identification sequence number or a template identification light pattern; when the first identification information and the second identification information are at least partially the same, acquire the three-dimensional information of the test object based on the distinguished N structured light patterns. Attached Figure Description

[0052] Figure 1 This is a structural example diagram of one embodiment of the measurement system provided in this application;

[0053] Figure 2 This is a flowchart illustrating the steps of a first embodiment of the measurement method provided in this application;

[0054] Figure 3 Example diagram of the first scenario provided in this application;

[0055] Figure 4a This is a first structural example diagram of the identification light pattern provided in this application;

[0056] Figure 4b This is a second structural example diagram of the identification light pattern provided in this application;

[0057] Figure 4c This is a third structural example of the identification light pattern provided in this application;

[0058] Figure 5 Example diagram of the second scenario provided in this application;

[0059] Figure 6 A flowchart illustrating the steps of a second embodiment of the measurement method provided in this application;

[0060] Figure 7a This is a fourth structural example of the identification light pattern provided in this application;

[0061] Figure 7b This is a fourth structural example of the identification light pattern provided in this application;

[0062] Figure 8 A flowchart illustrating the steps of a third embodiment of the measurement method provided in this application;

[0063] Figure 9 A flowchart illustrating the steps of a fourth embodiment of the measurement method provided in this application;

[0064] Figure 10 Example diagram of the third scenario provided in this application;

[0065] Figure 11 A flowchart illustrating the steps of a fifth embodiment of the measurement method provided in this application;

[0066] Figure 12 Example diagram of the fourth scenario provided in this application;

[0067] Figure 13 This is a flowchart illustrating the steps of a sixth embodiment of the measurement method provided in this application. Detailed Implementation

[0068] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0069] To better understand the method shown in this embodiment, the following will first combine... Figure 1 The structure of the measurement system provided in this application is illustrated. Figure 1 This is a structural example diagram of one embodiment of the measurement system provided in this application.

[0070] The measurement system shown in this embodiment includes a projection device 101, an image acquisition device 102, and a measuring device 103. This embodiment does not limit the number of physical devices included in the measurement system. For example, the projection device 101, image acquisition device 102, and measuring device 103 shown in this embodiment can be encapsulated in the same product housing, and the measurement system exists as a single physical device. Alternatively, the projection device 101 can be encapsulated in one product housing to form a structured light transmitting device, while the image acquisition device 102 and measuring device 103 can be encapsulated in the same product housing to form a structured light receiving device; in this case, the measurement system exists as two independent physical devices. Or, the projection device 101 and measuring device 103 can be encapsulated in one product housing, while the image acquisition device 102 is encapsulated in another product housing; in this case, the measurement system exists as two independent physical devices.

[0071] The projection device 101 shown in this embodiment specifically includes a light source and an imaging module. The light source can send a laser beam to the imaging module. This embodiment does not limit the specific type of light source; for example, the light source can be a laser, a light-emitting diode (LED), or a laser diode (LD), etc. The imaging module shown in this embodiment is located in the optical path of the laser beam emitted by the light source to ensure that the imaging module can successfully receive the laser beam from the light source. The imaging module can convert the laser beam into structured light to emit the structured light towards the object 104 under test. For example, the imaging module can be a grating with multiple light-transmitting areas pre-set on it; the laser beam can emit multiple structured light patterns onto the surface of the object under test through these multiple light-transmitting areas. Alternatively, the imaging module can be a light deflector, a device that can change the transmission direction of a laser beam in space according to a certain rule. The light deflector can be a galvanometer, a rotating mirror, or an acousto-optic deflector, etc.

[0072] The structured light emitted from the projection device 101 can illuminate the surface of the object under test 104 to project a specific structured light pattern onto the surface of the object under test 104. This embodiment does not limit the specific type of structured light pattern. For example, the structured light pattern can be any shape, such as a linear light pattern or a planar light pattern. This application uses a linear light pattern as an example for illustrative purposes.

[0073] Image acquisition device 102 captures images of the object under test 104 to obtain measurement images, which include each structured light pattern imaged on the surface of the object under test 104. This embodiment does not limit the type of image acquisition device 102, as long as it can utilize optical imaging principles to capture images of the object under test 104 to obtain measurement images. For example, the image acquisition device 102 can be any device with image capture capabilities, such as a charge-coupled element image sensor or a complementary metal-oxide-semiconductor image sensor. The laser beam shown in this embodiment can be a visible light beam or an infrared light beam; the specific beam type is not limited, as long as the image acquisition device 102 can successfully capture the structured light pattern imaged by the laser beam on the surface of the object under test.

[0074] The measuring device 103 acquires the measurement image from the image acquisition device 102. Based on the measurement image, the measuring device 103 calculates the three-dimensional information of the object 104 to be measured, and performs three-dimensional reconstruction of the object 104 based on this information, i.e., real-time three-dimensional reconstruction of the object 104 in the real three-dimensional world. This three-dimensional reconstruction of the object 104 can be applied to autonomous driving, virtual reality, visual navigation, film and television entertainment, etc. For example, it can enable real-time detection, recognition, defect detection, and intelligent grasping of the object 104. Furthermore, if the object 104 is a human body, the three-dimensional reconstruction can enable facial recognition and various human-computer interactions based on different detected human movements. Similarly, if the object 104 is the road conditions in front of a vehicle, the three-dimensional reconstruction can enable visual navigation, intelligent driving, etc., without further limitations.

[0075] This embodiment does not limit the type of measuring device 103. For example, the measuring device 103 may be one or more chips or one or more integrated circuits. For example, the measuring device 103 may be one or more field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), system-on-chips (SoCs), central processing units (CPUs), network processors (NPs), digital signal processors (DSPs), microcontroller units (MCUs), programmable logic devices (PLDs), or other integrated chips, or any combination of the above chips or processors.

[0076] Based on the above overview of the measurement system, the specific process of the measurement system executing the measurement method is described below:

[0077] Example 1

[0078] This embodiment combines Figure 2 The execution process of the measurement method is illustrated below, in which, Figure 2 This is a flowchart illustrating the steps of a first embodiment of the measurement method provided in this application.

[0079] Step 201: The projection device emits structured light onto the object to be tested, so as to illuminate N structured light patterns on the surface of the object to be tested.

[0080] The projection device shown in this embodiment includes an imaging module that emits structured light onto the object under test. For a detailed description of the imaging module, please refer to [link to documentation]. Figure 1 The explanation shown is not detailed here. The structured light emitted by the imaging module can illuminate N structured light patterns on the surface of the object under test. Here, N is any positive integer greater than or equal to 2.

[0081] For example Figure 3 As shown, where, Figure 3 This is an example diagram of a first scenario provided in this application. In this example, structured light emitted from a projection device can image eight structured light patterns on the surface of the object under test, i.e. Figure 3The structural light patterns a1, a2 to a8 shown. In this embodiment, the structural light pattern is taken as a linear structural light pattern for exemplary illustration. In other examples, each structural light pattern can be a planar structural light pattern or any other shape.

[0082] Step 202: The projection device emits identification light towards the object to be measured, so as to irradiate M identification light patterns on the surface of the object to be measured.

[0083] Specifically, the imaging module included in the projection device emits the identification light towards the object to be measured, and the identification light can irradiate M identification light patterns on the surface of the object to be measured. Here, M is any positive integer greater than or equal to 1.

[0084] Each of the M identification light patterns shown in this embodiment can distinguish each structural light pattern in N structural light patterns. Also refer to Figure 3 As shown, the identification light emitted by the projection device can form 8 identification light patterns on the surface of the object to be measured. In this example, it is taken that the number of identification light patterns is equal to the number of structural light patterns for exemplary illustration (i.e., M = N). It can be seen that one identification light pattern is used to distinguish one structural light pattern, and different identification light patterns are used to distinguish different structural light patterns. In other examples, one identification light pattern can also be used to distinguish multiple different structural light patterns (i.e., M < N), or multiple identification light patterns can be used to distinguish one structural light pattern (i.e., M > N).

[0085] As Figure 3 shown, the identification light pattern 301 is used to distinguish the structural light pattern a1, the identification light pattern 302 is used to distinguish the structural light pattern a2, the identification light pattern 303 is used to distinguish the structural light pattern a3, the identification light pattern 304 is used to distinguish the structural light pattern a4, the identification light pattern 305 is used to distinguish the structural light pattern a5, the identification light pattern 306 is used to distinguish the structural light pattern a6, the identification light pattern 307 is used to distinguish the structural light pattern a7, and the identification light pattern 308 is used to distinguish the structural light pattern a8.

[0086] Hereinafter, taking the target identification light pattern and the target structural light pattern as examples, the positional relationship between the identification light pattern and the structural light pattern on the surface of the object to be measured will be described. Among them, the target identification light pattern is any identification light pattern imaged on the surface of the object to be measured, and the target structural light pattern is the structural light pattern distinguished by the target identification light pattern. Specifically, taking the target identification light pattern as the identification light pattern 301 as an example, then, the target structural light pattern is the structural light pattern 301.

[0087] When the marker light pattern 301 is used to distinguish the structured light pattern a1, the marker light pattern 301 and the structured light pattern a1 are connected. It can be understood that two different marker light patterns are connected to two different structured light patterns respectively, to ensure that different marker light patterns are used to distinguish different structured light patterns. For example, marker light pattern 301 is connected to structured light pattern a1, while marker light pattern 302 is connected to structured light pattern a2, and so on.

[0088] This example does not limit the specific position of the marker light pattern 301 connected to the structured light pattern a1. For example, the marker light pattern 301 can be connected to any end of the structured light pattern a1. Figure 3 The example shown uses the marker light pattern 301 connected to the starting end of the structured light pattern a1. In other examples, the marker light pattern 301 may also be connected to the middle or end of the structured light pattern a1.

[0089] This example illustrates the connection between a target identification light pattern and a target structured light pattern. In other examples, the target identification light pattern may partially overlap with the target structured light pattern. It is understood that different target identification light patterns partially overlap with different structured light patterns to ensure that different identification light patterns can be distinguished from different structured light patterns. For example, identification light pattern 301 partially overlaps with structured light pattern a1, while identification light pattern 302 partially overlaps with structured light pattern a2, and so on. For an explanation of the overlapping position of the target identification light pattern and the target structured light pattern, please refer to the above description of the position of the target identification light pattern connected to the target structured light pattern; further details will not be repeated here.

[0090] Optionally, in other examples, the target identification light pattern and the target structured light pattern may not be in a connected or partially overlapping positional relationship, and the distance between the target identification light pattern and the target structured light pattern may be less than or equal to a preset value. This embodiment does not limit the specific size of this preset value, as long as the target identification light pattern can distinguish the target structured light pattern when the distance between the target identification light pattern and the target structured light pattern is less than or equal to the preset value, and different target identification light patterns can distinguish different target structured light patterns.

[0091] This embodiment does not limit the execution order between steps 201 and 202. For example, the projection device can execute step 201 first and then step 202. Alternatively, the projection device can execute steps 201 and 202 simultaneously. There is no specific limitation, as long as the N structured light patterns and M marker light patterns can image the above positional relationship on the surface of the object to be measured.

[0092] Step 203: The image acquisition device captures images of the object to be measured to obtain measurement images.

[0093] In this embodiment, the image acquisition device captures a measurement image of the object under test. This measurement image includes N structured light patterns and M marker light patterns imaged on the surface of the object. The following describes how the method shown in this embodiment ensures that the measurement image captured by the image acquisition device includes complete structured light patterns:

[0094] The measuring device shown in this embodiment needs to control the exposure time of the image acquisition device to ensure that the image acquisition device can successfully capture the measurement image. Exposure time refers to the time interval from when the shutter of the image acquisition device opens to when it closes. During this exposure time, N structured light patterns and M marker light patterns on the surface of the object under test leave images on the film to form the measurement image. In this embodiment, the duration of the exposure time is greater than or equal to the duration of the emission time, and the start time of the exposure time is earlier than or equal to the start time of the emission time. The emission time refers to the time it takes for the projection device to emit the N structured light patterns and M marker light patterns.

[0095] This embodiment uses the example of an exposure time duration equal to the emission time duration, and an exposure time start time equal to an emission time start time, for illustrative purposes. It can be seen that when this condition is met, the projection device can ensure that the structured light and marker light emitted by the projection device can be imaged within the exposure time of the image acquisition device, thus avoiding the loss of the structured light pattern and marker light pattern.

[0096] The marker light patterns shown in this embodiment are used to improve the accuracy of measuring the three-dimensional information of the object under test. Therefore, it is necessary to ensure that the measurement images captured by the image acquisition device can clearly capture the marker light patterns. The projection device shown in this embodiment can determine the light intensity of the M marker light patterns illuminating the surface of the object under test according to the corresponding state of the object, so as to ensure the clarity of the M marker patterns in the image.

[0097] For example, the state corresponding to the object under test can be the distance between the object under test and the projection device. Specifically, if the distance between the projection device and the object under test is relatively large, then more light power will be lost during the process of the marker light emitted from the projection device illuminating the object under test. Therefore, the light intensity of the marker light pattern imaged on the surface of the object under test is low. In the measurement image formed by the image acquisition device capturing the marker light pattern, the light intensity of the marker light pattern is low, and the measurement device cannot accurately distinguish each structured light pattern based on the marker light pattern with low light intensity.

[0098] Therefore, the projection device can reduce the area of ​​the marker light pattern imaged on the surface of the object under test. It can be understood that the smaller the area of ​​the marker light pattern formed on the object under test by the marker light emitted from the projection device, the higher the brightness of the marker light pattern. Thus, the image acquisition device can obtain a measurement image with higher light intensity of the marker light pattern when capturing its image. Specifically, if the projection device includes a light deflector, this light deflector can adjust the size of the marker light pattern formed on the object under test.

[0099] For example, the state corresponding to the object under test can be the brightness of the environment in which the object is located. Specifically, if the brightness of the environment in which the object is located is higher, then in order to ensure that the image acquisition device can successfully capture the marker light pattern on the surface of the object, the projection device can increase the light intensity of the marker light pattern. If the brightness of the environment in which the object is located is lower, then in order to reduce the power consumption of the projection device, the projection device can reduce the light intensity of the marker light pattern. The specific methods by which the measuring device increases the light intensity of the structured light pattern can be found above, and will not be elaborated further.

[0100] It is known that the marker light pattern imaged on the surface of the object under test can match the ambient brightness of the environment where the object is located, avoiding interference from the ambient brightness on the marker light pattern captured by the image acquisition device. This ensures that the measurement image captured by the image acquisition device can clearly display the marker light pattern, thereby improving the accuracy and efficiency of obtaining the three-dimensional information of the object under test based on the measurement image.

[0101] Step 204: The image acquisition device sends the measurement image to the measuring device.

[0102] Step 205: The measuring device identifies N structured light patterns and M marker light patterns in the measurement image.

[0103] The measuring device shown in this embodiment receives a measurement image from an image acquisition device. The measuring device identifies N structured light patterns and M marker light patterns from the measurement image using image processing methods. For example, the measuring device can perform boundary detection on the measurement image based on image processing methods such as Hough transform, thereby achieving the goal of identifying N structured light patterns and M marker light patterns in the measurement image.

[0104] To improve the efficiency and accuracy of image recognition, the measuring device can first perform image binarization processing on the measurement image to convert it into a binary image. The measuring device then identifies N structured light patterns and M marker light patterns in the binary image.

[0105] Step 206: The measuring device distinguishes each of the N structured light patterns based on the M identification light patterns.

[0106] The measuring device shown in this embodiment can distinguish each of the N structured light patterns based on the received M identification light patterns, thereby establishing a correspondence between the M identification light patterns and the N structured light patterns.

[0107] See also Figure 3 In the example shown, taking the measurement image 300 acquired by the measuring device as an example, the measuring device can establish a correspondence between the marker light pattern 301 and the structured light pattern a1, and so on, the measuring device can establish a correspondence between the marker light pattern 308 and the structured light pattern a8. Specifically, the measuring device shown in this embodiment can determine the correspondence between the target marker light pattern and the target structured light pattern based on the positional relationship between the target marker light pattern and the target structured light pattern in the measurement image 300. For a detailed explanation of the positional relationship between the target marker light pattern and the target structured light pattern, please refer to step 202, which will not be elaborated further.

[0108] Step 207: The measuring device obtains the first identifier list.

[0109] The measuring device shown in this embodiment needs to acquire a template image for measuring the object to obtain its three-dimensional information. The projection device in this embodiment emits structured light onto the object according to the template image. Specifically, the structured light emitted by the projection device follows the pattern of N template light patterns included in the template image. After the structured light illuminates the object, it deforms due to the shape of the object's surface, thus forming N structured light patterns on the surface of the object. It can be seen that the N structured light patterns have a certain degree of deformation relative to the N template light patterns.

[0110] See also Figure 3 As shown, the projection device emits structured light onto the object under test according to the template image 310. The template image 310 includes eight template light patterns, namely template light pattern b1, template light pattern b2 to template light pattern b8. It can be seen that the projection device emits structured light according to the shape of template light pattern b1, template light pattern b2 to template light pattern b8 respectively. After the structured light shines on the object under test, it is deformed by the shape of the surface of the object under test, so as to form eight structured light patterns on the surface of the object under test, namely structured light pattern a1, structured light pattern a2 to structured light pattern a8.

[0111] After acquiring the measurement image 300, the measuring device can determine the template light pattern corresponding to each structured light pattern included in the measurement image 300 in the template image 310 based on the stored template image 310. Specifically, the measuring device can determine the template light pattern b1 in the template image 310 corresponding to the structured light pattern a1 included in the measurement image 300 based on the marker light pattern 301; the measuring device can determine the template light pattern b2 in the template image 310 corresponding to the structured light pattern a2 included in the measurement image 300 based on the marker light pattern 302; and so on. Similarly, the measuring device can determine the template light pattern b8 in the template image 310 corresponding to the structured light pattern a8 included in the measurement image 308 based on the marker light pattern 308. The measuring device can acquire the template light patterns corresponding to each structured light pattern, thereby achieving the measurement of the three-dimensional information of the object under test.

[0112] To acquire template light patterns corresponding to each structured light pattern, the measuring device needs to obtain a pre-stored first identifier list. This first identifier list includes identifier serial numbers, identifier light pattern styles, template light patterns, and the correspondence between structured light patterns. The measuring device compares the changes in the identifier light pattern and the structured light pattern corresponding to the same identifier serial number to measure the three-dimensional information of the object under test.

[0113] Combination Figure 3 As shown, the first list of identifiers can be found in Table 1 below:

[0114] Table 1

[0115] Identifier serial number The style of the light pattern Template light pattern Structured light patterns 1 Style 1 of the light pattern 301 b1 a1 2 Style 2 of the light pattern 302 b2 a2 3 Style 3 of the light pattern 303 b3 a3 …… …… …… …… 8 Style 8 of the light pattern 308 b8 a8

[0116] It can be seen that the style of the marker light pattern 301, the template light pattern b1, and the structured light pattern a1 all correspond to the marker number 1. The style of the marker light pattern 302, the template light pattern b2, and the structured light pattern a2 all correspond to the marker number 2. Similarly, the style of the marker light pattern 308, the template light pattern b8, and the structured light pattern a8 all correspond to the marker number 8.

[0117] Step 208: The measuring device obtains the corresponding N identification serial numbers based on the patterns of the M identification light patterns.

[0118] The measuring device shown in this embodiment can obtain N corresponding identifier serial numbers based on the patterns of the M identifier light patterns respectively included in the measured image. The specific process is as follows:

[0119] First, the measuring device identifies the pattern corresponding to each marker light pattern in the measuring image, wherein different structured light patterns correspond to different patterns of marker light patterns.

[0120] For example Figure 4a As shown, where, Figure 4a This is a first structural example diagram of the identification light pattern provided in this application. This example illustrates different styles corresponding to different identification light patterns: the number of sub-patterns included in different structured light patterns varies. For example, identification light pattern 301 corresponding to structured light pattern a1 includes one sub-pattern, identification light pattern 302 corresponding to structured light pattern a2 includes two sub-patterns, and identification light pattern 303 corresponding to structured light pattern a3 includes three sub-patterns. This example uses horizontal stripe light patterns as an example for illustration; in other examples, the sub-patterns can also be dotted light patterns, arc-shaped light patterns, or any other arbitrary shape. This example uses the same structure for different sub-patterns as an example for illustration; in other examples, the shapes of the different sub-patterns can also be different.

[0121] For example Figure 4b As shown, where, Figure 4b This is a second structural example of the identification light pattern provided in this application. This example illustrates different styles corresponding to different identification light patterns: the shapes of the different identification light patterns are different. For example... Figure 4b As shown, the shape of the marker light pattern 301 corresponding to the structured light pattern a1 is a triangle, the shape of the marker light pattern 302 corresponding to the structured light pattern a2 is a square, and the shape of the marker light pattern 303 corresponding to the structured light pattern a3 is a circle. The description of the shape of each marker light pattern in this example is optional and not limited. In other examples, the shape of the marker light pattern can also be any shape such as trapezoid, irregular shape, T-shape, rhombus, etc.

[0122] For example Figure 4c As shown, where, Figure 4c This is a third structural example of the identification light pattern provided in this application. This example shows different styles corresponding to different identification light patterns: the lengths of the different identification light patterns are different. For example... Figure 4c As shown, the length of the marker light pattern refers to the number of pixels included in the marker light pattern along the Y direction. The length of marker light pattern 301 corresponding to structured light pattern a1 is L1, the length of marker light pattern 302 corresponding to structured light pattern a2 is L2, and the length of marker light pattern 303 corresponding to structured light pattern a3 is L3, wherein L1, L2, and L3 increase sequentially. This example illustrates the different lengths of the marker light patterns and is not limiting. In other examples, the width of each marker light pattern may be different, wherein the width of the marker light pattern refers to the number of pixels included in the marker light pattern along the X direction, where the X and Y directions are perpendicular to each other, and each structured light pattern extends along the Y direction.

[0123] The measuring device determines the identifier number corresponding to the pattern of each identifier's light pattern based on the first identifier list shown in Table 1. Combined with... Figure 4a , Figure 4b or Figure 4c In any example, style 1 of the light pattern 301 corresponds to identifier number 1, style 2 of the light pattern 302 corresponds to identifier number 2, and similarly, style 3 of the light pattern 303 corresponds to identifier number 3.

[0124] Similarly, the measuring device can determine the identification number corresponding to each identification light pattern in the measured image. This embodiment takes M=N as an example for illustrative purposes. When M is greater than N, that is, when two or more identification light patterns correspond to the same structured light pattern, the identification numbers corresponding to the two or more identification light patterns corresponding to the same structured light pattern are the same.

[0125] Step 209: The measuring device obtains N template light patterns corresponding to N identifier serial numbers according to the first identifier list.

[0126] Specifically, the measuring device shown in this embodiment can retrieve the template light pattern corresponding to each identifier number based on the first identifier list shown in Table 1. Combined with... Figures 4a to 4c As shown in the example, identifier number 1 corresponds to template light pattern b1, identifier number 2 corresponds to template light pattern b2, and so on.

[0127] Step 210: The measuring device acquires the three-dimensional information of the object under test based on the changes of N structured light patterns relative to N template light patterns.

[0128] In this embodiment, the measuring device compares the changes between the structured light pattern and the template light pattern corresponding to the same identifier number to obtain the three-dimensional information of the object under test.

[0129] The following combination Figure 5 The beneficial effects of the measurement method provided in this application are illustrated below:

[0130] The projection device emits structured light according to the template image 500. In this example, each template light image is a line pattern, and the template image 500 includes 8 template light patterns, which are arranged in a four-row, four-column manner.

[0131] In existing solutions, when measuring the 3D information of an object under test, the projection device emits structured light according to eight template light patterns as shown in template image 500. This structured light can image eight structured light patterns on the surface of the object under test, as shown in measurement image 501. The measuring device compares the changes in the template light patterns and structured light patterns corresponding to the positions in measurement image 501 and template image 500 to measure the 3D information. For example, the measuring device compares the changes in the first row of structured light patterns in measurement image 501 relative to the first row of template light patterns in template image 500, and so on, comparing the changes in the fourth column of structured light patterns in measurement image 501 relative to the fourth column of template light patterns in template image 500 to obtain the 3D information of the object under test.

[0132] However, obstacles may exist in the optical path of the structured light emitted from the projection device, causing the loss of the structured light pattern imaged on the surface of the object under test. For example, if the obstacle blocks the optical path of the structured light corresponding to the template light pattern in the third column of the template image 500, causing the structured light to be lost, then the measurement image acquired by the measuring device is measurement image 502. It can be seen that, relative to the template image 500, the template light image in the third column of the measurement image 502 cannot be imaged on the surface of the object under test. Therefore, the measuring device cannot compare the changes of the lost structured light pattern relative to the template light image in the third column of the template image 500, resulting in low accuracy of the measuring device in measuring three-dimensional information.

[0133] Using the measurement method shown in this embodiment, the measurement image acquired by the measuring device is measurement image 503. The measuring device determines the corresponding first column of structured light patterns based on the marker light pattern 511 of measurement image 503, and determines that the first column of structured light patterns in measurement image 503 corresponds to the first column of template light patterns in the template image. Based on the marker light pattern 512 of measurement image 503, the measuring device determines the corresponding second column of structured light patterns, and determines that the second column of structured light patterns in measurement image 503 corresponds to the second column of template light patterns in the template image. Based on the marker light pattern 514 of measurement image 503, the measuring device determines the corresponding fourth column of structured light patterns, and determines that the fourth column of structured light patterns in measurement image 503 corresponds to the fourth column of template light patterns in the template image. During the comparison of template image 500 and measurement image 503, if the measuring device cannot identify the marker light pattern corresponding to the third column of template light images in template image 500 based on measurement image 503, then the measuring device can determine that the third column of template light images has been lost, resulting in the structured light patterns corresponding to the third column of template light images not being imaged on the surface of the object to be measured. Therefore, when the measuring device determines that the structured light pattern has been lost, it will not compare the changes between the lost structured light pattern and the template light pattern, thus improving the accuracy of measuring the three-dimensional information of the object under test.

[0134] The above example illustrates the situation where structured light is lost, preventing the template light pattern from being imaged on the surface of the object under test. In other examples, misalignment of the structured light pattern may also occur. For instance, the first and second rows of template light patterns in the template image may be imaged as the second row of structured light patterns and the first row of structured light patterns, respectively, in the measurement image. Since each structured light pattern in this embodiment corresponds to a marker light pattern, the measuring device determines and compares the change of the second row of structured light patterns relative to the first row of template light patterns in the template image based on the marker light pattern corresponding to the second row of structured light patterns. Similarly, the measuring device determines and compares the change of the first row of structured light patterns relative to the second row of template light patterns in the template image based on the marker light pattern corresponding to the first row of structured light patterns. Therefore, even if the structured light pattern is misaligned, the measurement method shown in this embodiment can still effectively ensure the accuracy of the measured three-dimensional information.

[0135] As can be seen, the measurement method shown in this embodiment, based on the marker light pattern, can accurately determine the correspondence between each structured light pattern and the template light pattern, thus improving the accuracy of measuring the three-dimensional information of the object under test. Because the measuring device directly determines the correspondence between the structured light pattern and the template light pattern based on the marker light pattern, the efficiency of measuring three-dimensional information is improved. Using the method shown in this embodiment, even if the structured light pattern is lost or misaligned, the measuring device can still ensure that the structured light pattern is accurately compared with the corresponding template light pattern to achieve the measurement of three-dimensional information, ensuring the robustness of the three-dimensional information measurement.

[0136] Example 2

[0137] In Embodiment 1, the measuring device determines the correspondence between each structured light pattern and each template light pattern by identifying the pattern's shape. However, in the measurement method shown in this embodiment, the measuring device determines the correspondence between each structured light pattern and each template light pattern by using the encoded information carried by the identified light pattern. For the specific execution process, please refer to [link to specific details]. Figure 6 As shown, where, Figure 6 This is a flowchart illustrating the steps of a second embodiment of the measurement method provided in this application.

[0138] Step 601: The projection device emits structured light onto the object to be tested, so as to illuminate N structured light patterns on the surface of the object to be tested.

[0139] Step 602: The projection device emits marking light to the object to be tested, so as to illuminate M marking light patterns on the surface of the object to be tested.

[0140] Step 603: The image acquisition device captures images of the object to be measured to obtain measurement images.

[0141] Step 604: The image acquisition device sends the measurement image to the measuring device.

[0142] Step 605: The measuring device identifies N structured light patterns and M marker light patterns in the measurement image.

[0143] Step 606: The measuring device distinguishes each of the N structured light patterns based on the M identification light patterns.

[0144] For a detailed explanation of the execution process of steps 601 to 606 shown in this embodiment, please refer to steps 201 to 206 shown in Embodiment 1. Further details will not be elaborated upon.

[0145] Step 607: The measuring device obtains the second identifier list.

[0146] The measuring device shown in this embodiment needs to acquire a template image for measuring the three-dimensional information of the object under test in order to obtain the three-dimensional information of the object. For a description of the template image, please refer to Embodiment 1; details will not be repeated here. To accurately measure the three-dimensional information of the object under test, it is necessary to accurately determine the template light pattern corresponding to each structured light pattern. For this purpose, the measuring device can acquire a pre-stored second identifier list. This second identifier list includes the correspondence between encoded information, template light patterns, and structured light patterns. The measuring device compares the changes in the identifier light pattern and the structured light pattern corresponding to the same encoded information to achieve the measurement of the three-dimensional information of the object under test. Combined with... Figure 3 As shown, the second identifier list can be found in Table 2 below. It should be clearly stated that the description of the values ​​of the encoded information included in the second identifier list shown in Table 2 is an optional example and is not limited.

[0147] Table 2

[0148]

[0149]

[0150] It can be seen that template light pattern b1 and structured light pattern a1 both correspond to the encoding information 0111, template light pattern b2 and structured light pattern a2 both correspond to the encoding information 1110, and so on, template light pattern b8 and structured light pattern a8 both correspond to the encoding information 1000.

[0151] Step 608: The measuring device determines the N template light patterns corresponding to the N structured light patterns according to the second identifier list.

[0152] The identification light pattern shown in this embodiment carries coded information. Based on the coded information carried by the identification light pattern, the measuring device can determine the N template light patterns corresponding to the N structured light patterns.

[0153] First, combined Figure 7a The diagram illustrates how the light pattern carries encoded information. Figure 7a This is a fourth structural example diagram of the identification light pattern provided in this application. The structured light emitted from the projection device images eight structured light patterns on the surface of the object under test, namely structured light pattern a1, structured light pattern a2 to structured light pattern a8. For a detailed description of structured light pattern a1, structured light pattern a2 to structured light pattern a8, please refer to [link to relevant documentation]. Figure 3 As shown, the specifics will not be elaborated further. This example uses M equal to N as an example. Each structured light pattern is connected to one marker light pattern. Therefore, the eight marker light patterns imaged on the surface of the object under test include marker light pattern 301, marker light patterns 302 to 308. For an explanation of the relative positions of the structured light patterns and the marker light patterns, please refer to Example 1, which will not be elaborated further.

[0154] The identification light pattern shown in this embodiment has multiple sub-patterns. Each sub-pattern corresponds to a brightness-based encoding value. The identification light pattern carries encoding information through the multiple encoding values ​​corresponding to the multiple sub-patterns. That is, the encoding information carried by the identification light pattern includes the multiple encoding values ​​corresponding to the identification light pattern.

[0155] Combination Figure 7b The specific structure of the identification light pattern is illustrated by example, such as... Figure 7b As shown, the marking light pattern includes sub-patterns 701, 702, 703, and 704. The four sub-patterns form a rectangular structure. It should be clearly stated that the description of the number of sub-patterns and the arrangement of the sub-patterns in this embodiment is an optional example and is not limited.

[0156] This embodiment uses the brightness of each sub-pattern as an example for illustration. For instance, if the brightness value of sub-pattern 701 is greater than or equal to a preset value, then the encoding value carried by the sub-pattern is 0. If the brightness value of sub-pattern 701 is less than the preset value, then the encoding value carried by the sub-pattern is 1. The brightness shown in this example refers to the brightness of the sub-pattern, and the unit is cd / m2 (candela per square meter).

[0157] Combination Figure 7a and Figure 7bAs shown, if the brightness value of sub-pattern 701 of the identification light pattern 301 is greater than or equal to a preset value, the measuring device determines that the encoding value carried by sub-pattern 701 of the identification light pattern 301 is 0. If the brightness value of sub-pattern 702 of the identification light pattern 301 is less than the preset value, the measuring device determines that the encoding value carried by sub-pattern 702 of the identification light pattern 301 is 1. And so on, the measuring device can determine that the encoding values ​​carried by the four sub-patterns of the identification light pattern 301 are 0, 1, 1, 1 respectively. Therefore, the encoding information carried by the identification light pattern is 0111.

[0158] Similarly, the coding information carried by the identification light pattern 302 is 1110, the coding information carried by the identification light pattern 303 is 1001, the coding information carried by the identification light pattern 304 is 0011, and so on, the coding information carried by the identification light pattern 308 is 1000.

[0159] When the measuring device acquires the encoded information carried by each marker light pattern included in the measurement image, the measuring device can obtain the template light pattern and structured light pattern corresponding to each encoded information by referring to Table 2. It can be seen that when the encoded information carried by the marker light pattern is 0111, the measuring device determines the template light pattern b1 and structured light pattern a1 corresponding to the encoded information 0111. Similarly, when the encoded information carried by the marker light pattern is 1000, the measuring device determines the template light pattern b8 and structured light pattern a8 corresponding to the encoded information 1000.

[0160] This embodiment uses the example of a sub-pattern of an identifying light pattern carrying an encoded value through its brightness value for illustrative purposes. In other examples, the sub-patterns of an identifying light pattern may also carry encoded values ​​through their colors, resulting in sub-patterns carrying different encoded values ​​having different colors. Furthermore, the sub-patterns of an identifying light pattern may carry encoded values ​​through both color and brightness value, resulting in sub-patterns carrying different encoded values ​​having different colors and brightness values.

[0161] This embodiment uses M=N as an example for illustrative purposes. It can be seen that each structured light pattern is connected to an identification light pattern, and different identification light patterns carry different encoded information. When M is greater than N, that is, two or more identification light patterns correspond to the same structured light pattern, the identification information carried by the two or more identification light patterns corresponding to the same structured light pattern is the same.

[0162] Step 609: The measuring device acquires the three-dimensional information of the object under test based on the changes of N structured light patterns relative to N template light patterns.

[0163] For a detailed explanation of step 609 shown in this embodiment, please refer to step 210 shown in Embodiment 1. Further details will not be repeated here.

[0164] As can be seen, the measurement method shown in this embodiment, based on the encoded information carried by the marker light pattern, can accurately determine the correspondence between each structured light pattern and the template light pattern, thereby improving the accuracy and efficiency of measuring the three-dimensional information of the object under test, and ensuring the robustness of the measured three-dimensional information.

[0165] Example 3

[0166] The measurement method shown in this embodiment can determine the correspondence between each structured light pattern and each template light pattern based on artificial intelligence (AI). For the specific execution process, please refer to [link to relevant documentation]. Figure 8 As shown, where, Figure 8 This is a flowchart illustrating the steps of a third embodiment of the measurement method provided in this application.

[0167] Step 801: The projection device emits structured light onto the object to be tested, so as to illuminate N structured light patterns on the surface of the object to be tested.

[0168] Step 802: The projection device emits marking light to the object to be tested, so as to illuminate M marking light patterns on the surface of the object to be tested.

[0169] Step 803: The image acquisition device captures images of the object to be measured to obtain measurement images.

[0170] Step 804: The image acquisition device sends the measurement image to the measuring device.

[0171] Step 805: The measuring device identifies N structured light patterns and M marker light patterns in the measurement image.

[0172] Step 806: The measuring device distinguishes each of the N structured light patterns based on the M identification light patterns.

[0173] For a detailed explanation of the execution process of steps 801 to 806 shown in this embodiment, please refer to steps 201 to 206 shown in Embodiment 1. Further details will not be elaborated upon.

[0174] Step 807: The measuring device identifies the M feature information corresponding to the M marker light patterns in the measurement image.

[0175] The feature information corresponding to the identification light pattern shown in this embodiment is used to characterize the morphological characteristics of the identification light pattern. This embodiment does not limit the feature information. For example, the feature information corresponding to the identification light pattern may include at least one of the following:

[0176] The shape of the light pattern, the area of ​​the light pattern, the position of the center of gravity of the light pattern, the center position of the light pattern, the perimeter of the light pattern, and the ratio of the main axis of the light pattern, etc.

[0177] Step 808: Based on the target model, the measuring device determines the N template light patterns corresponding to the N structured light patterns according to the M feature information.

[0178] Specifically, the measuring device shown in this embodiment can be trained based on AI to obtain the target model by analyzing the feature information of the identified light pattern and the correspondence between the feature information and the identification serial number of the identified light pattern. For an explanation of the identification serial number, please refer to the explanation of the identification serial number in Embodiment 1; further details will not be provided here.

[0179] When the measuring device identifies the feature information of each marker light pattern from the measured image, the measuring device inputs the feature information of each marker light pattern into the target model, which can output the marker number corresponding to each marker light pattern.

[0180] When the measuring device obtains the identification number, it can obtain the structured light pattern and template light pattern corresponding to the identification number. For an explanation of the correspondence between the identification number, the structured light pattern and the template light pattern, please refer to Example 1, which will not be elaborated further.

[0181] Step 809: The measuring device acquires the three-dimensional information of the object under test based on the changes of N structured light patterns relative to N template light patterns.

[0182] For a detailed description of the execution process of step 809 shown in this embodiment, please refer to step 210 in embodiment one, which will not be repeated here.

[0183] This embodiment uses M=N as an example for illustrative purposes. It shows that each structured light pattern is connected to a marker light pattern, and the marker sequence numbers corresponding to the feature information of different marker light patterns are different. When M is greater than N, that is, two or more marker light patterns correspond to the same structured light pattern, the marker sequence numbers corresponding to the feature information of the two or more marker light patterns corresponding to the same structured light pattern are the same.

[0184] The measuring device in this embodiment can determine the structured light pattern and template light pattern corresponding to each marker light pattern based on AI, thereby improving the efficiency and accuracy of measuring the three-dimensional information of the object under test.

[0185] Example 4

[0186] In Examples 1 to 3, the purpose of measuring the three-dimensional information of the object under test is achieved through N template patterns included in the template image. In this example, the purpose of measuring the three-dimensional information of the object under test is achieved through N template light patterns and M template marker light patterns included in the template image. The following will combine... Figure 9 The diagram illustrates the process of performing the measurement method in this embodiment, wherein, Figure 9 This is a flowchart illustrating the steps of a fourth embodiment of the measurement method provided in this application.

[0187] Step 901: The projection device emits structured light onto the object to be tested, so as to illuminate N structured light patterns on the surface of the object to be tested.

[0188] Step 902: The projection device emits marking light to the object to be tested, so as to illuminate M marking light patterns on the surface of the object to be tested.

[0189] Step 903: The image acquisition device captures images of the object to be measured to obtain measurement images.

[0190] Step 904: The image acquisition device sends the measurement image to the measuring device.

[0191] Step 905: The measuring device identifies N structured light patterns and M marker light patterns in the measurement image.

[0192] Step 906: The measuring device distinguishes each of the N structured light patterns based on the M identification light patterns.

[0193] For a detailed explanation of the execution process of steps 901 to 906 shown in this embodiment, please refer to steps 201 to 206 shown in Embodiment 1. Further details will not be elaborated upon.

[0194] Step 907: The measuring device acquires the M template identification light patterns corresponding to the M identification light patterns.

[0195] The measuring device shown in this embodiment compares the M identified light patterns with the template identified light patterns in the template image to obtain the template identified light pattern corresponding to each identified light pattern.

[0196] See Figure 10As shown, the projection device emits structured light according to the template image 1010 to obtain the measurement image 1020. This example assumes that the template image 1010 includes three template light patterns, namely template light pattern b1, template light pattern b2, and template light pattern b3. The measurement image 1020 includes three structured light patterns, namely structured light pattern a1, structured light pattern a2, and structured light pattern a3. It should be clearly stated that this embodiment, using the description of the number of template light images included in the template image and the number of measurement images included in the measurement image, is an optional example and is not limited.

[0197] In the template images 1010 shown in this embodiment, each template image 1010 is connected to a template identification light pattern. That is, template light pattern b1 is connected to template identification light pattern 1011, template light pattern b2 is connected to template identification light pattern 1012, and template light pattern b3 is connected to template identification light pattern 1013. It should be noted that the description of the positional relationship between the template identification light patterns and the template light patterns in this embodiment can be found in the description of the positional relationship between the identification light pattern and the structured light pattern shown in Embodiment 1, and will not be repeated here. It can be seen that the measuring device can create a correspondence between template light pattern b1 and template identification light pattern 1011, a correspondence between template light pattern b2 and template identification light pattern 1012, and a correspondence between template light pattern b3 and template identification light pattern 1013 based on the template images.

[0198] In this embodiment, the shapes of the different template identification light patterns are different. For a description of the shapes of the template identification light patterns, please refer to the description of the shapes of the identification light patterns shown in Embodiment 1. Specific details will not be repeated here. Specifically, this embodiment takes template identification light pattern 1011 as a rectangle, template identification light pattern 1012 as a circle, and template identification light pattern 1013 as a rhombus as examples.

[0199] In other examples, different template marker light patterns can carry different encoded information. For an explanation of the encoded information carried by the template marker light patterns, please refer to Embodiment 2, which will not be elaborated further. Alternatively, different template marker light patterns can also have different feature information, enabling the measuring device to determine the correspondence with different template light patterns based on their different feature information. For an explanation of the process of determining the corresponding template light pattern based on the feature information of the template marker light pattern, please refer to Embodiment 3, which describes the process of determining the corresponding structured light pattern based on the feature information of the marker light pattern, which will not be elaborated further.

[0200] In this embodiment, the measuring device compares M identified marker light patterns from the measurement image with M template marker light patterns identified from the template image to determine the correspondence between the structured light patterns and the template light patterns. For example, the measuring device identifies marker light pattern 1021 connected to structured light pattern a1, marker light pattern 1022 connected to structured light pattern a2, and marker light pattern 1023 connected to structured light pattern a3 in the measurement image 1020. The measuring device compares the similarity between marker light pattern 1021 and each template marker light pattern in the template image 1010. The measuring device determines a correspondence where the marker light patterns and template marker light patterns are at least partially identical. For example, if both marker light pattern 1021 and template marker light pattern 1011 are rectangles, the measuring device can determine that marker light pattern 1021 corresponds to template marker light pattern 1011. Similarly, if both marker light pattern 1023 and template marker light pattern 1013 are rhombuses, the measuring device can determine that marker light pattern 1023 corresponds to template marker light pattern 1013.

[0201] Step 908: The measuring device obtains N template light patterns corresponding to N structured light patterns based on M marker light patterns and M template marker light patterns.

[0202] Since each template identification light pattern shown in this embodiment corresponds to a template light pattern, and each identification light pattern corresponds to a structured light pattern, when the measuring device determines a pair of corresponding template identification light patterns and identification light patterns, the corresponding structured light patterns and template light patterns can be determined.

[0203] For example, taking the correspondence between the marker light pattern 1023 and the template marker light pattern 1013 as an example, the structure light pattern a3 corresponding to the marker light pattern 1023 corresponds to the template light pattern b3 corresponding to the template marker light pattern 1013. Thus, it can be seen that the measuring device can determine the template light pattern corresponding to each marker light pattern based on the template marker light pattern and the marker light pattern.

[0204] Step 909: The measuring device acquires the three-dimensional information of the object under test based on the changes of N structured light patterns relative to N template light patterns.

[0205] For a detailed explanation of the execution process of step 909 shown in this embodiment, please refer to step 210 in embodiment one, which will not be repeated here.

[0206] The measurement method shown in this embodiment allows the measuring device to directly determine the corresponding structured light pattern and template light pattern based on the similarity between the template marker light pattern and the marker light pattern, thereby improving the accuracy of measuring the three-dimensional information of the object under test.

[0207] Example 5

[0208] In Examples 1 to 4, the value of M is any value greater than or equal to N. This example describes how the three-dimensional information of the object under test is measured when the value of M is less than N. The following is a description of the process. Figure 11 As shown, where, Figure 11 This is a flowchart illustrating the steps of a fifth embodiment of the measurement method provided in this application.

[0209] Step 1101: The projection device emits structured light onto the object to be tested, so as to illuminate N structured light patterns on the surface of the object to be tested.

[0210] Step 1102: The projection device emits marking light onto the object to be tested, so as to illuminate M marking light patterns on the surface of the object to be tested.

[0211] Step 1103: The image acquisition device captures images of the object to be measured to obtain measurement images.

[0212] Step 1104: The image acquisition device sends the measurement image to the measuring device.

[0213] Step 1105: The measuring device identifies N structured light patterns and M marker light patterns in the measurement image.

[0214] Step 1106: The measuring device distinguishes each of the N structured light patterns based on the M identification light patterns.

[0215] For an explanation of the execution process of steps 1101 to 1106 shown in this embodiment, please refer to steps 201 to 206 shown in Embodiment 1. Detailed explanations will not be repeated here.

[0216] The following combination Figure 12 The measurement image 1220 and template image 1210 of this embodiment will be described below. The projection device emits structured light according to the patterns of the template light patterns included in the template image 1210, and can image eight structured light patterns on the surface of the object to be measured. For a description of the template light patterns included in the template image 1210 and the structured light patterns included in the measurement image 1220, please refer to [link to documentation]. Figure 3 As shown, the specifics will not be elaborated further.

[0217] The number of marker light patterns imaged on the surface of the object under test by the marker light emitted by the projection device shown in this embodiment is less than the number of structured light patterns imaged on the surface of the object under test by the structured light emitted by the projection device. For example Figure 12 As shown, the marking light emitted by the projection device forms five marking light patterns on the surface of the object to be tested.

[0218] Specifically, the measurement image 1220 includes a first marker light pattern 1221 and a second marker light pattern 1222 that are adjacent in position. "Adjacent in position" means that there are no other marker light patterns between the first marker light pattern 1221 and the second marker light pattern 1222. The first marker light pattern 1221 is used to distinguish structured light pattern a1 among the eight structured light patterns, and the second marker light pattern 1222 is used to distinguish structured light pattern a3 among the eight structured light patterns. For a detailed explanation of how the marker light patterns distinguish structured light patterns, please refer to any of the embodiments from Embodiment 1 to Embodiment 4; further details will not be elaborated here.

[0219] This embodiment uses the identification number corresponding to each structured light pattern shown in Embodiment 1 as an example for illustrative purposes. The difference from the above embodiment is that the first identification light pattern 1221 and the second identification light pattern 1222 shown in this embodiment are also used to distinguish the structured light pattern a2. That is, in the above embodiment, two or more identification light patterns are required to distinguish two different structured light patterns, while this embodiment can distinguish three different structured light patterns with only two identification light patterns.

[0220] As shown in Table 1 of Embodiment 1, the identifier number corresponding to the first identifier light pattern 1221 is 1, and the identifier number corresponding to the second identifier light pattern 1222 is 3. The measuring device has pre-stored the first identifier list as shown in Table 1, indicating that the eight identifier numbers stored in the measuring device are 1, 2, 3 to 8. The measuring device can determine the first identifier light pattern 1221 corresponding to identifier number 1, and can also determine the second identifier light pattern 1222 corresponding to identifier number 3. However, the measuring image 1220 does not include the identifier light pattern corresponding to identifier number 3. Therefore, the third structured light pattern a2 located between the first structured light pattern a1 and the second structured light pattern a3 corresponds to identifier number 2. The first structured light pattern a1 is connected to the first identifier light pattern 1221, and the second identifier light pattern 1222 is connected to the second identifier light pattern 1222. Thus, the measuring device can determine the corresponding identifier numbers 1, 2, and 3 based on the first identifier light pattern 1221 and the second identifier light pattern 1222. Similarly, marker light patterns 1222 and 1223 are used together to correspond to structured light patterns a3, a4, and a5, and marker light patterns 1224 and 1225 are used together to correspond to structured light patterns a6, a7, and a8. Details will not be elaborated further.

[0221] Step 1107: The measuring device acquires N template light patterns corresponding to N identifier serial numbers.

[0222] In this embodiment, if the measuring device has obtained the corresponding N identification serial numbers based on the M identification light patterns, the processing device can obtain the corresponding N template light patterns based on the N identification serial numbers. For a detailed explanation of the execution process, please refer to step 209 in Embodiment 1. The specific execution process will not be elaborated further.

[0223] Step 1108: The measuring device acquires the three-dimensional information of the object under test based on the changes of N structured light patterns relative to N template light patterns.

[0224] For the specific execution process of step 1108 in this embodiment, please refer to step 210 in embodiment one. The specific execution process will not be described in detail.

[0225] The method described in this embodiment can effectively reduce the number of marker light patterns imaged on the surface of the object under test, thereby reducing the power consumption of the projection device for emitting marker light. Moreover, even with the reduction in the number of marker light patterns imaged on the surface of the object under test, the measuring device can still accurately achieve the purpose of measuring the three-dimensional information of the object under test.

[0226] Example 6

[0227] As shown in Embodiments 1 to 5 above, in order to accurately measure the three-dimensional information of the object under test, the measuring device needs to precisely determine the template light pattern corresponding to each structured light pattern. This embodiment illustrates how to effectively ensure the accuracy of the correspondence between the template light pattern and each structured light pattern. This embodiment combines... Figure 13 The following is an explanation, in which, Figure 13 This is a flowchart illustrating the steps of a sixth embodiment of the measurement method provided in this application.

[0228] Step 1301: The projection device emits structured light onto the object to be tested, so as to illuminate N structured light patterns on the surface of the object to be tested.

[0229] Step 1302: The projection device emits marking light to the object to be tested, so as to illuminate M marking light patterns on the surface of the object to be tested.

[0230] Step 1303: The image acquisition device captures images of the object to be measured to obtain measurement images.

[0231] Step 1304: The image acquisition device sends the measurement image to the measuring device.

[0232] Step 1305: The measuring device identifies N structured light patterns and M marker light patterns in the measurement image.

[0233] Step 1306: The measuring device distinguishes each of the N structured light patterns based on the M identification light patterns.

[0234] Step 1307: The measuring device obtains the first identifier list.

[0235] Step 1308: The measuring device obtains the corresponding N identification serial numbers based on the patterns of the M identification light patterns.

[0236] Step 1309: The measuring device obtains N template light patterns corresponding to N identifier serial numbers according to the first identifier list.

[0237] For a description of the execution process of steps 1301 to 1309 shown in this embodiment, please refer to steps 201 to 209 in Embodiment 1, which will not be repeated here. It should be clarified that this embodiment uses the method shown in Embodiment 1 to obtain the correspondence between the structured light pattern and the template light pattern as an example for illustrative purposes. In other examples, the measuring device shown in this embodiment can also obtain the correspondence between the structured light pattern and the template light pattern through the method shown in any one of Embodiments 2 to 5. For a detailed explanation, please refer to any one of Embodiments 2 to 5, which will not be repeated here.

[0238] The difference from Embodiment 1 is that, after obtaining the correspondence between N structured light patterns and N template light patterns, this embodiment does not perform the process of measuring the three-dimensional information of the object under test as shown in Embodiment 1. Instead, it needs to verify whether the correspondence between the N structured light patterns and N template light patterns obtained by the measuring device is accurate. Only when the measuring device determines that the correspondence between the N structured light patterns and N template light patterns is accurate will the measuring device perform the process of measuring the three-dimensional information of the object under test. The following describes the process by which the measuring device in this embodiment verifies the accuracy of the correspondence between the N structured light patterns and N template light patterns:

[0239] Step 1310: The measuring device acquires the light pattern of the mark to be measured.

[0240] The measuring device selects one of the M marker light patterns included in the measurement image as the marker light pattern to be measured. In this embodiment, the marker light pattern to be measured is located between the first marker light pattern and the second marker light pattern. For a detailed description of the first and second marker light patterns, please refer to Embodiment Five, which describes the first and second marker light patterns; further details will not be repeated here.

[0241] The measuring device shown in this embodiment is based on a first identification light pattern. The identification light pattern to be measured and the second identification light pattern can sequentially distinguish three adjacent structured light patterns among the N structured light patterns. For a detailed explanation of the distinction process, please refer to Embodiment 5, which will not be elaborated here.

[0242] To verify the accuracy of the N structured light patterns and N template light patterns obtained by the measuring device, this embodiment can verify the accuracy of the identification number corresponding to the structured light pattern. If the identification number corresponding to the structured light pattern is accurate, since the identification number already corresponds to the template light pattern, it can be known that if the identification number corresponding to the structured light pattern is accurate, then the correspondence between the structured light pattern and the template light pattern is also accurate.

[0243] Step 1311: The measuring device acquires the first identification information.

[0244] In this embodiment, the first identification information is taken as the first identification number. The first identification number is the identification number obtained by the measuring device from N identification numbers that corresponds to the light pattern of the identification to be tested. For example, as shown in Table 1, if the light pattern of the identification to be tested determined by the measuring device is identification light pattern 302, then the first identification number is 2.

[0245] Step 1312: The measuring device acquires the second identification information.

[0246] In this embodiment, the second identification information is taken as the second identification number. The second identification number, among the N sequentially arranged identification numbers, is located between the identification number corresponding to the first identification light pattern and the identification number corresponding to the second identification light pattern. Continuing with Table 1, when the first identification light pattern is identification light pattern 301 and the second identification light pattern is identification light pattern 303, the measuring device determines, based on Table 1, that the identification number corresponding to identification light pattern 301 is 1 and the identification number corresponding to identification light pattern 303 is 3. Therefore, among the determined N identification numbers, the measuring device determines that the identification number located between identification number 1 and identification number 3 is 2.

[0247] Step 1313: The measuring device determines whether the first identification information and the second identification information are the same. If yes, proceed to step 1314; otherwise, return to step 1305.

[0248] If the measuring device determines that the first identifier number and the second identifier number are the same, then the correspondence between the structured light pattern and the template light pattern distinguished by the identifier light pattern under test is accurate, and the measuring device can proceed to step 1314. If the measuring device determines that the first identifier number and the second identifier number are different, then the correspondence between the structured light pattern and the template light pattern distinguished by the identifier light pattern under test is incorrect, and it is necessary to return to step 1305 to re-identify N structured light patterns and M identifier light patterns in the measurement image. It should be noted that this embodiment uses the example of returning to step 1305 when the first identifier number and the second identifier number are different for illustrative purposes, and is not limited thereto. For example, it is also possible to return to steps 1301 and 1302 so that the projection device can re-emit the structured light and identifier light.

[0249] If the measuring device determines that the first identifier number and the second identifier number are different, then the correspondence between the structured light pattern and the template light pattern distinguished by the light pattern to be tested is incorrect. This embodiment does not limit the number of light patterns to be tested. If the measuring device determines that there are multiple light patterns to be tested, then the measuring device performs steps 1310 to 1313 as described above for each light pattern to be tested until the measuring device determines that the first identifier number and the determined second identifier number of each light pattern to be tested are the same, at which point step 1314 is executed. If, among multiple light patterns to be tested, the measuring device determines that the first identifier number and the determined second identifier number of one or more light patterns to be tested are different, then it needs to return to step 1305.

[0250] Step 1314: The measuring device acquires the three-dimensional information of the object under test based on the changes of N structured light patterns relative to N template light patterns.

[0251] For an explanation of the execution process of step 1314 shown in this embodiment, please refer to step 210 in embodiment one; details will not be repeated here.

[0252] It should be clearly stated that this embodiment uses the identification number as an example for illustrative purposes. The identification information shown in this embodiment can also be the encoding information described in embodiment two or the template identification light pattern shown in embodiment four. If the identification information is a template identification light pattern, then the measuring device can perform the step of measuring the three-dimensional information of the object to be measured when it determines that the first identification information and the second identification information are at least partially the same.

[0253] Using the method shown in this embodiment, the measuring device can verify whether the correspondence between the structured light pattern and the template light pattern is accurate, so that the measuring device will only measure the three-dimensional information of the structured light pattern and the template light pattern with accurate correspondence, effectively ensuring the accuracy of the three-dimensional information of the object under test and ensuring the robustness of the three-dimensional information measurement.

[0254] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A measurement method, characterized in that, The method includes: The projection device emits structured light onto the object under test to illuminate N structured light patterns on the surface of the object under test, where N is a positive integer greater than or equal to 2. The projection device determines the light intensity of M identification light patterns illuminating the surface of the object under test according to the state of the object under test, and emits M identification lights to the object under test according to the light intensity of the M identification light patterns, so as to illuminate the M identification light patterns on the surface of the object under test, where M is a positive integer greater than or equal to 1. The measuring device acquires a measuring image, which is formed by photographing the object under test. The measuring image includes the N structured light patterns and the M marker light patterns. The measuring device identifies the N structured light patterns and the M marker light patterns in the measured image; The measuring device distinguishes each of the N structured light patterns based on the M identification light patterns; The measuring device acquires the three-dimensional information of the object under test based on the N distinguished structured light patterns.

2. The method according to claim 1, characterized in that, Before the measuring device acquires the measurement image, the method further includes: The image acquisition device captures the object under test to obtain the measurement image; The image acquisition device sends the measurement image to the measuring device.

3. The method according to claim 1 or 2, characterized in that, One of the target identification light patterns from the M identification light patterns and one of the target structured light patterns from the N structured light patterns satisfy one of the following conditions: The target identification light pattern is connected to the target structured light pattern; the target identification light pattern and the target structured light pattern partially overlap; or the distance between the target identification light pattern and the target structured light pattern is less than or equal to a preset value.

4. The method according to claim 1 or 2, characterized in that, The M marker light patterns correspond to N template light patterns, and the measuring device acquires the three-dimensional information of the object under test based on the distinguished N structured light patterns, including: The measuring device obtains the N template light patterns corresponding to the N structured light patterns based on the M identification light patterns; The measuring device acquires the three-dimensional information of the object under test based on the changes of the N structured light patterns relative to the N template light patterns.

5. The method according to claim 4, characterized in that, The measuring device obtains the N template light patterns corresponding to the N structured light patterns based on the M identifier light patterns, including: The measuring device acquires a list of identifiers, which includes the correspondence between the identifier light patterns and the identifier serial numbers. The list also includes the correspondence between the identifier serial numbers and the template light patterns, and different identifier serial numbers correspond to different template light patterns. The measuring device obtains the N identifier serial numbers corresponding to the M identifier light patterns according to the identifier list; The measuring device obtains N template light patterns corresponding to the N identifier serial numbers according to the identifier list.

6. The method according to claim 4, characterized in that, The measuring device obtains the N template light patterns corresponding to the N structured light patterns based on the M identifier light patterns, including: The measuring device acquires M template identification light patterns corresponding to the M identification light patterns. The M template identification light patterns are used to distinguish each template light pattern among the N template light patterns. Each of the M identification light patterns is at least partially the same as the corresponding template identification light pattern. The measuring device acquires N template light patterns corresponding to the M template identification light patterns.

7. The method according to claim 5 or 6, characterized in that, M is equal to N, and each of the M identification light patterns corresponds to an identification information. Different identification light patterns correspond to different identification information, and the identification information is an identification serial number or a template identification light pattern.

8. The method according to claim 5 or 6, characterized in that, M is greater than N, and among the M identification light patterns, at least two of the identification light patterns correspond to one identification information, which is an identification serial number or a template identification light pattern.

9. The method according to claim 5 or 6, characterized in that, M is less than N, and the M identification light patterns include a first identification light pattern and a second identification light pattern that are adjacent in position. The first identification light pattern corresponds to the first identification information; The second identification light pattern corresponds to the second identification information; Among the N identifiers arranged in sequence, there is a third identifier between the first identifier and the second identifier. The first identifier light pattern and the second identifier light pattern jointly correspond to the third identifier. The identifier is an identifier serial number or a template identifier light pattern.

10. The method according to claim 5 or 6, characterized in that, The measuring device obtains the N template light patterns corresponding to the N structured light patterns based on the M identifier light patterns, including: The measuring device identifies the patterns corresponding to the M marker light patterns in the measuring image, wherein different structured light patterns correspond to different patterns of marker light patterns; The measuring device determines the N template light patterns corresponding to the N structured light patterns based on the patterns corresponding to the M identification light patterns.

11. The method according to claim 5 or 6, characterized in that, The measuring device obtains the N template light patterns corresponding to the N structured light patterns based on the M identifier light patterns, including: The measuring device identifies the encoded information carried by the M marker light patterns in the measuring image, wherein the encoded information carried by the marker light patterns corresponding to different structured light patterns is different; The measuring device determines the N template light patterns corresponding to the N structured light patterns based on the encoding information carried by the M identification light patterns respectively.

12. The method according to claim 11, characterized in that, The encoding information includes multiple encoding values, and the identification light pattern has multiple sub-patterns, with at least one of the brightness or color of each of the multiple sub-patterns corresponding to the encoding value.

13. The method according to claim 5 or 6, characterized in that, The measuring device identifies the N structured light patterns and the M marker light patterns in the measured image, including: The measuring device identifies M feature information corresponding to the M marker light patterns in the measuring image, wherein the feature information of the marker light patterns corresponding to different structured light patterns is different. The measuring device obtains the N template light patterns corresponding to the N structured light patterns based on the M identifier light patterns, including: The measuring device is based on artificial intelligence (AI) and determines the N template light patterns corresponding to the N structured light patterns according to the feature information corresponding to the M identifier light patterns.

14. The method according to claim 5 or 6, characterized in that, The measuring device acquires the three-dimensional information of the object under test based on the N differentiated structured light patterns, including: The measuring device acquires the target light pattern, which is located between the first and second target light patterns. The first target light pattern, the target light pattern, and the second target light pattern are used to sequentially distinguish three adjacent structured light patterns among the N structured light patterns. The measuring device acquires first identification information, which is the identification information corresponding to the light pattern of the identification to be measured. The measuring device acquires second identification information, which is located between the identification information corresponding to the first identification light pattern and the identification information corresponding to the second identification light pattern in N sequentially arranged identification information. The identification information is an identification number or a template identification light pattern. When the first identification information and the second identification information are at least partially the same, the measuring device acquires the three-dimensional information of the object under test based on the N distinguished structured light patterns.

15. A measurement system, characterized in that, The measurement system includes a projection device and a measurement device. The projection device is used for: Structured light is emitted toward the object under test to illuminate N structured light patterns on the surface of the object under test, where N is a positive integer greater than or equal to 2; Based on the state of the object under test, determine the light intensity of M identification light patterns illuminating the surface of the object under test, and emit M identification lights to the object under test according to the light intensity of the M identification light patterns, so as to illuminate the M identification light patterns on the surface of the object under test, where M is a positive integer greater than or equal to 1. The measuring device is used for: Acquire a measurement image, which is formed by taking a picture of the object to be measured. The measurement image includes the N structured light patterns and the M marker light patterns, where M is a positive integer greater than or equal to 1 and N is a positive integer greater than or equal to 2. The N structured light patterns and the M identification light patterns are identified in the measurement image; Each of the N structured light patterns is distinguished based on the M identification light patterns; The three-dimensional information of the object under test is obtained based on the N structured light patterns that have been distinguished.

16. The measurement system according to claim 15, characterized in that, The projection device is used to emit structured light onto the object under test to illuminate the N structured light patterns on the surface of the object under test; it is also used to emit marking light onto the object under test to illuminate the M marking light patterns on the surface of the object under test. The image acquisition device is used to capture images of the object under test to obtain the measurement image; it is also used to send the measurement image to the measurement device.

17. The measurement system according to claim 15 or 16, characterized in that, The M identification light patterns correspond to the N template light patterns, and the measuring device is also used for: Based on the M identifier light patterns, obtain the N template light patterns corresponding to the N structured light patterns; The three-dimensional information of the object under test is obtained based on the changes of the N structured light patterns relative to the N template light patterns.

18. The measurement system according to claim 17, characterized in that, The measuring device is also used for: Based on the M identifier light patterns, obtaining the N template light patterns corresponding to the N structured light patterns includes: Obtain an identifier list, the identifier list including the correspondence between the identifier light patterns and the identifier serial numbers, the identifier list also including the correspondence between the identifier serial numbers and the template light patterns, and different identifier serial numbers correspond to different template light patterns; Based on the identifier list, obtain the N identifier serial numbers corresponding to the M identifier light patterns; Based on the identifier list, obtain the N template light patterns corresponding to the N identifier serial numbers.

19. The measurement system according to claim 17, characterized in that, The measuring device is also used for: Obtain M template identification light patterns corresponding to the M identification light patterns. The M template identification light patterns are used to distinguish each template light pattern among the N template light patterns. Each of the M identification light patterns is at least partially the same as the corresponding template identification light pattern. Obtain the N template light patterns corresponding to the M template identifier light patterns.

20. The measurement system according to claim 18 or 19, characterized in that, The measuring device is also used for: The patterns corresponding to the M marker light patterns are identified in the measurement image, wherein different structured light patterns correspond to different patterns of marker light patterns; Based on the styles corresponding to the M identification light patterns, determine the N template light patterns corresponding to the N structured light patterns.

21. The measurement system according to claim 18 or 19, characterized in that, The measuring device is also used for: The encoded information carried by the M marker light patterns is identified in the measurement image, wherein the encoded information carried by the marker light patterns corresponding to different structured light patterns is different; Based on the encoded information carried by the M identification light patterns, the N template light patterns corresponding to the N structured light patterns are determined.

22. The measurement system according to claim 18 or 19, characterized in that, The measuring device is also used for: In the measurement image, M feature information corresponding to the M marker light patterns are identified respectively, wherein the feature information of the marker light patterns corresponding to different structured light patterns is different; Based on artificial intelligence (AI), the N template light patterns corresponding to the N structured light patterns are determined according to the feature information corresponding to the M identifier light patterns.

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