Temperature measurement method and device based on fusion standard sample
By acquiring the radiation-related parameters of the test item and standard sample, and calculating the ambient atmospheric transmittance and radiation intensity, the error problem caused by neglecting the reflection of ambient radiation in traditional temperature measurement methods is solved, and higher precision temperature measurement is achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NATIONAL INSTITUTE OF METROLOGY CHINA
- Filing Date
- 2022-11-29
- Publication Date
- 2026-06-09
AI Technical Summary
Traditional non-contact temperature measurement methods ignore the reflection of environmental radiation by objects, resulting in large temperature measurement errors.
By acquiring the radiation-related parameters of the test item and standard sample, calculating the ambient atmospheric transmittance and ambient radiation intensity, and combining the radiation-related parameters of the test item, the temperature of the test item is obtained, taking into account the influence of ambient radiation reflection.
This reduces temperature measurement errors and improves temperature measurement accuracy.
Smart Images
Figure CN116147778B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of temperature measurement technology, specifically to a temperature measurement method and device based on fused standard samples. Background Technology
[0002] Currently, in the field of temperature measurement, rapid and high-precision non-contact radiation thermometry has a very wide range of important applications. Traditional non-contact temperature measurement methods generally use radiation thermometry equipment such as thermal imagers.
[0003] The radiation intensity received by thermal imagers and other equipment actually includes two parts: the radiation emitted by the object itself and the reflection of radiation from the environment. However, conventional radiation thermometry equipment, when quantifying the temperature of the object being measured, generally assumes a certain emissivity (e.g., 0.98) for the object's own radiation and directly ignores the reflection of radiation from the environment. This results in a discrepancy between the quantified temperature and the actual temperature of the object being measured, leading to a significant measurement error. Summary of the Invention
[0004] This application provides a temperature measurement method and apparatus based on fused standard samples to solve the technical problem that traditional temperature measurement methods directly ignore the reflection of environmental radiation by objects, resulting in a discrepancy between the quantified temperature and the actual temperature of the measured object, leading to a large measurement error.
[0005] In a first aspect, embodiments of this application provide a temperature measurement method based on a fused standard sample, comprising:
[0006] Obtain radiation-related parameters of the test item and standard sample;
[0007] Based on the radiation-related parameters of the standard sample, the ambient atmospheric transmittance and ambient radiation intensity are obtained.
[0008] The temperature of the test item is obtained based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity.
[0009] The test item and the standard sample are in the same environment.
[0010] In one embodiment, obtaining the radiation-related parameters of the item to be tested and the standard sample includes:
[0011] The standard sample includes a first sample, a second sample, and a third sample, wherein the second sample and the third sample are made of the same material and have the same surface roughness.
[0012] The radiation intensity to be processed of the test item, the first radiation intensity of the first sample, and the second radiation intensity of the second sample are obtained at the first location;
[0013] The third radiation intensity of the third sample is obtained at the second position; the observation angle of the first position relative to the second sample is the same as the observation angle of the second position relative to the third sample.
[0014] In one embodiment, obtaining the radiation-related parameters of the test item and the standard sample further includes:
[0015] The emissivity and reflectivity to be processed of the test item, the first emissivity and first reflectivity of the first sample, and the second emissivity and second reflectivity of the second sample are measured.
[0016] In one embodiment, obtaining the ambient atmospheric transmittance and ambient radiation intensity based on the radiation-related parameters of the standard sample includes:
[0017] The ambient atmospheric transmittance is obtained based on the second radiation intensity and the third radiation intensity.
[0018] The ambient radiation intensity is obtained based on the first radiation intensity, the second radiation intensity, the first emissivity, the first reflectivity, the second emissivity, the second reflectivity, and the ambient atmospheric transmittance.
[0019] In one embodiment, obtaining the temperature of the test item based on its radiation-related parameters, the ambient atmospheric transmittance, and the ambient radiation intensity includes:
[0020] Based on the radiation intensity to be processed, the emissivity to be processed, the reflectivity to be processed, the ambient atmospheric transmittance, and the ambient radiation intensity, the specific radiation intensity of the ideal blackbody is obtained; the specific radiation intensity of the ideal blackbody is the radiation intensity when the temperature of the ideal blackbody is the temperature of the object to be tested.
[0021] The temperature of the object to be tested is obtained based on the specific radiation intensity of the ideal blackbody.
[0022] In one embodiment, the distance between the second position and the third sample is twice the distance between the first position and the second sample.
[0023] Secondly, embodiments of this application provide a temperature measurement device based on a fused standard sample, comprising:
[0024] The radiation-related parameter acquisition module is used to acquire radiation-related parameters of the test item and standard sample.
[0025] The environmental parameter acquisition module is used to: obtain the ambient atmospheric transmittance and ambient radiation intensity based on the radiation-related parameters of the standard sample;
[0026] The temperature acquisition module is used to: obtain the temperature of the test item based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity;
[0027] The test item and the standard sample are in the same environment.
[0028] Thirdly, embodiments of this application provide an electronic device, including a processor and a memory storing a computer program, wherein the processor executes the program to implement the steps of the temperature measurement method based on fused standard samples described in the first aspect.
[0029] Fourthly, embodiments of this application provide a computer program product, including a computer program that, when executed by a processor, implements the steps of the temperature measurement method based on fused standard samples described in the first aspect.
[0030] Fifthly, embodiments of this application provide a non-transitory computer-readable storage medium, including a computer program, which, when executed by a processor, implements the steps of the temperature measurement method based on fused standard samples described in the first aspect.
[0031] The temperature measurement method and apparatus based on fused standard samples provided in this application first obtains the radiation-related parameters of the test item and the standard sample. Then, based on the radiation-related parameters of the standard sample, the ambient atmospheric transmittance and ambient radiation intensity are obtained. Finally, based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity, the temperature of the test item is obtained. Since the test item and the standard sample are in the same environment, the ambient atmospheric transmittance and ambient radiation intensity obtained from the standard sample can also be applied to the test item to obtain its temperature. Furthermore, since the ambient radiation intensity is fully considered when quantifying the temperature of the test item, this ambient radiation intensity can be used to characterize the reflection of ambient radiation by the test item. Thus, the radiation of the test item itself and the reflection of ambient radiation by the test item are combined to quantify the temperature of the test item, thereby reducing the error in temperature measurement. Attached Figure Description
[0032] To more clearly illustrate the technical solutions in this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0033] Figure 1 This is one of the flowcharts illustrating the temperature measurement method based on fused standard samples provided in the embodiments of this application;
[0034] Figure 2 This is the second schematic flowchart of the temperature measurement method based on fused standard samples provided in the embodiments of this application;
[0035] Figure 3 This is the third schematic flowchart of the temperature measurement method based on fused standard samples provided in the embodiments of this application;
[0036] Figure 4 This is the fourth flowchart illustrating the temperature measurement method based on fused standard samples provided in the embodiments of this application;
[0037] Figure 5 A schematic diagram of the structure of the temperature measurement device based on fused standard samples provided in the embodiments of this application;
[0038] Figure 6 This is a schematic diagram of the structure of the electronic device provided in the embodiments of this application. Detailed Implementation
[0039] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0040] Figure 1 This is one of the flowcharts illustrating the temperature measurement method based on fused standard samples provided in this application. (Refer to...) Figure 1 This application provides a temperature measurement method based on a fused standard sample, which may include:
[0041] 101. Obtain radiation-related parameters of the test item and standard sample;
[0042] 102. Based on the radiation-related parameters of the standard sample, obtain the ambient atmospheric transmittance and ambient radiation intensity;
[0043] 103. The temperature of the test item is obtained based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity.
[0044] The test item and the standard sample are in the same environment.
[0045] It should be noted that ambient atmospheric transmittance is the transmittance per unit length of air in the ambient atmosphere.
[0046] The temperature measurement method based on fused standard samples provided in this embodiment first obtains the radiation-related parameters of the test item and the standard sample. Then, based on the radiation-related parameters of the standard sample, the ambient atmospheric transmittance and ambient radiation intensity are obtained. Finally, based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity, the temperature of the test item is obtained. Since the test item and the standard sample are in the same environment, the ambient atmospheric transmittance and ambient radiation intensity obtained from the standard sample can also be applied to the test item to obtain its temperature. Furthermore, since the ambient radiation intensity is fully considered when quantifying the temperature of the test item, this ambient radiation intensity can be used to characterize the reflection of ambient radiation by the test item. Thus, the radiation of the test item itself and the reflection of ambient radiation by the test item are combined to quantify the temperature of the test item, thereby reducing the error in temperature measurement.
[0047] Figure 2 This is the second schematic flowchart of the temperature measurement method based on fused standard samples provided in the embodiments of this application. (Refer to...) Figure 2 In one embodiment, obtaining radiation-related parameters of the test item and the standard sample may include:
[0048] The standard samples include a first sample, a second sample, and a third sample. The second and third samples are made of the same material and have the same surface roughness.
[0049] 201. At the first location, obtain the radiation intensity to be processed of the test item, the first radiation intensity of the first sample, and the second radiation intensity of the second sample;
[0050] 202. Obtain the third radiation intensity of the third sample at the second location;
[0051] The observation angle of the first position relative to the second sample is the same as the observation angle of the second position relative to the third sample.
[0052] 203. Measure the emissivity and reflectivity of the test item, the first emissivity and first reflectivity of the first sample, and the second emissivity and second reflectivity of the second sample.
[0053] In step 202, ensuring that the observation angle of the first position relative to the second sample is the same as the observation angle of the second position relative to the third sample is to ensure that the difference between the second radiation intensity and the third radiation intensity is only affected by the difference between the first distance and the second distance (the first distance is the distance between the first position and the second sample, and the second distance is the distance between the second position and the third sample), and is not affected by the changes in other parameters caused by the difference in observation angle.
[0054] It should be noted that since the second and third samples are made of the same material and have the same surface roughness, their emissivity and reflectivity are the same.
[0055] In practical applications, there is no strict time sequence between steps 201, 202 and 203; that is, they can be executed simultaneously or any one step can be executed first, depending on the actual needs, and no restrictions are made here.
[0056] This embodiment obtains the radiation intensity of the test item and sample, and measures the emissivity and reflectivity of the test item and sample, which helps to establish the quantitative relationship between the parameters to obtain the temperature of the test item.
[0057] Figure 3 This is the third schematic flowchart of the temperature measurement method based on fused standard samples provided in the embodiments of this application. (Refer to...) Figure 3 In one embodiment, obtaining the ambient atmospheric transmittance and ambient radiation intensity based on the radiation-related parameters of a standard sample may include:
[0058] 301. Based on the second and third radiation intensities, the ambient atmospheric transmittance is obtained;
[0059] 302. The ambient radiation intensity is obtained based on the first radiation intensity, the second radiation intensity, the first emissivity, the first reflectivity, the second emissivity, the second reflectivity, and the ambient atmospheric transmittance.
[0060] In step 301, the second radiation intensity can be expressed by the following formula:
[0061] L2=τ(ε2L(T am )+ρ2L u (3-1)
[0062] Where L2 is the second radiation intensity, τ is the ambient atmospheric transmittance, ε2 is the second emissivity, and L(T) am The temperature of an ideal blackbody is T. am Radiation intensity at time T am It is the ambient temperature, ρ2 is the second reflectance, and L u It refers to the intensity of environmental radiation.
[0063] Since the difference between the second and third radiation intensities is only affected by the difference between the first and second distances, and the difference between the first and second distances will cause a difference in the length of air the radiation penetrates, and since the third sample has the same emissivity and the same reflectance as the second sample, the third radiation intensity can be expressed by the following formula:
[0064] L3=τ n (ε2L(T am )+ρ2L u (3-2)
[0065] Where L3 is the third radiation intensity, τ is the ambient atmospheric transmittance, n is the ratio of the second distance to the first distance, ε2 is the second emissivity, and L(T) am The temperature of an ideal blackbody is T. am Radiation intensity at time T am It is the ambient temperature, ρ2 is the second reflectance, and L u It refers to the intensity of environmental radiation.
[0066] Dividing formula (3-2) by formula (3-1), we get:
[0067]
[0068] That is, the ambient atmospheric transmittance is
[0069] In step 302, the first radiation intensity can be expressed similarly using the following formula:
[0070] L1=τ(ε1L(T am )+ρ1L u (3-4)
[0071] Where L1 is the first radiation intensity, τ is the ambient atmospheric transmittance, ε1 is the first emissivity, and L(T) am The temperature of an ideal blackbody is T. am Radiation intensity at time T am It is the ambient temperature, ρ1 is the first reflectance, and L u It refers to the intensity of environmental radiation.
[0072] According to formulas (3-4) and (3-1), we can obtain:
[0073]
[0074] That is, the ambient radiation intensity is:
[0075] An ideal blackbody is an idealized object that absorbs all incoming electromagnetic radiation without any reflection or transmission. The formula for calculating the radiation intensity of an ideal blackbody is Planck's formula, and it is related to the temperature of the blackbody. An ideal blackbody in the laboratory can be manufactured using the following method:
[0076] First, find an opaque object and create a cavity inside it. Then, connect the outside world to the cavity with a small hole. When light enters the cavity, it will be continuously reflected and absorbed inside, and the probability of it escaping through the small hole is extremely low. In this way, the interior of the cavity can be considered an ideal black body.
[0077] It should be noted that, generally, in temperature calculations, it is assumed that the object being measured is an ideal diffuse reflector or a Lambertian surface, and ε is given. i =1-ρ i , where ε i Let ρ be the emissivity of object i. i Let ε be the reflectance of object i. This equation could further simplify the above formula, but this is not actually the case. Although according to the law of conservation of energy, the total emissivity of an object = total absorptivity = 1 - reflectance, this only means that the integral value of energy over all wavelengths conforms to this formula. However, at a specific wavelength, the formula does not hold. Therefore, in this embodiment, ε i ≠1-ρ i .
[0078] This embodiment calculates the ambient atmospheric transmittance by measuring the radiation intensity of the sample, and then calculates the ambient radiation intensity based on the sample's radiation intensity, emissivity, reflectance, and ambient atmospheric transmittance. This yields two environmental parameters: ambient atmospheric transmittance and ambient radiation intensity. These parameters are helpful in subsequent temperature calculations for the test item, i.e., incorporating the reflection of ambient radiation by the test item.
[0079] Figure 4 This is the fourth schematic flowchart of the temperature measurement method based on fused standard samples provided in the embodiments of this application. (Refer to...) Figure 4 In one embodiment, obtaining the temperature of the test item based on its radiation-related parameters, ambient atmospheric transmittance, and ambient radiation intensity may include:
[0080] 401. Based on the radiation intensity to be processed, the emissivity to be processed, the reflectivity to be processed, the ambient atmospheric transmittance, and the ambient radiation intensity, the specific radiation intensity of the ideal blackbody is obtained.
[0081] The specific radiation intensity of an ideal blackbody is the radiation intensity when the temperature of the ideal blackbody is equal to the temperature of the object being measured.
[0082] 402. The temperature of the object to be tested is obtained based on the specific radiation intensity of an ideal blackbody.
[0083] In step 401, the radiation intensity to be treated can be expressed by the following formula:
[0084] L x =τ(ε x L(T)+ρ x L u(4-1)
[0085] Among them, L x τ is the radiation intensity to be treated, ε is the ambient atmospheric transmittance, and τ is the radiation intensity to be treated. x L(T) is the emissivity to be processed, L(T) is the radiation intensity of an ideal blackbody at temperature T, T is the temperature of the object being tested, and ρ is the emissivity to be processed. x It is the reflectance to be processed, L u It refers to the intensity of environmental radiation.
[0086] According to formula (3-5), we can obtain:
[0087]
[0088] Substituting formulas (3-3) and (4-2) into formula (4-1), we get:
[0089]
[0090] Then we have:
[0091]
[0092] L(T) is the specific radiation intensity of an ideal blackbody.
[0093] In step 402, since L(T) is Planck's formula, T, i.e. the temperature of the object to be measured, can be solved numerically.
[0094] This embodiment obtains the specific radiation intensity of an ideal blackbody based on the radiation intensity, emissivity, reflectivity, atmospheric transmittance, and ambient radiation intensity of the test object, and then obtains the temperature of the test object. The product of reflectivity and ambient radiation intensity is used to measure the reflection of ambient radiation by the test object, and the product of the specific radiation intensity and emissivity of the ideal blackbody is used to measure the radiation of the test object itself. This allows for the combination of the reflection of ambient radiation and the radiation of the test object itself to quantify the temperature of the test object, reducing measurement errors.
[0095] In one embodiment, the distance between the second position and the third sample is twice the distance between the first position and the second sample. In this case, n in formula (3-2) is 2, and formula (3-3) can be simplified to:
[0096] τ=L3 / L2 (4-3)
[0097] L(T) can be simplified to
[0098]
[0099] This embodiment simplifies the expression for a specific radiation intensity of an ideal blackbody and improves the calculation speed of the temperature of the object under test by setting the distance between the second position and the third sample to twice the distance between the first position and the second sample.
[0100] The following describes the temperature measurement device based on fused standard samples provided in the embodiments of this application. The temperature measurement device based on fused standard samples described below and the temperature measurement method based on fused standard samples described above can be referred to and correspond to each other.
[0101] Figure 5 A schematic diagram of the temperature measurement device based on a fused standard sample provided in an embodiment of this application. (Refer to...) Figure 5 This application provides a temperature measurement device based on a fused standard sample, which may include:
[0102] The radiation-related parameter acquisition module 501 is used to: acquire radiation-related parameters of the test item and standard sample;
[0103] The environmental parameter acquisition module 502 is used to: obtain the ambient atmospheric transmittance and ambient radiation intensity based on the radiation-related parameters of the standard sample;
[0104] The temperature acquisition module 503 is used to: obtain the temperature of the test item based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity;
[0105] The test item and the standard sample are in the same environment.
[0106] The temperature measurement device based on fused standard samples provided in this embodiment first acquires the radiation-related parameters of the test item and the standard sample. Then, based on the radiation-related parameters of the standard sample, it obtains the ambient atmospheric transmittance and ambient radiation intensity. Finally, based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity, it obtains the temperature of the test item. Since the test item and the standard sample are in the same environment, the ambient atmospheric transmittance and ambient radiation intensity obtained from the standard sample can also be applied to the test item to obtain its temperature. Furthermore, since the ambient radiation intensity is fully considered when quantifying the temperature of the test item, this ambient radiation intensity can be used to characterize the reflection of ambient radiation by the test item. Thus, the device combines the radiation of the test item itself with the reflection of ambient radiation to quantify the temperature of the test item, thereby reducing the error in temperature measurement.
[0107] In one embodiment, the radiation-related parameter acquisition module 501 is specifically used for:
[0108] The standard sample includes a first sample, a second sample, and a third sample, wherein the second sample and the third sample are made of the same material and have the same surface roughness.
[0109] The radiation intensity to be processed of the test item, the first radiation intensity of the first sample, and the second radiation intensity of the second sample are obtained at the first location;
[0110] The third radiation intensity of the third sample is obtained at the second position; the observation angle of the first position relative to the second sample is the same as the observation angle of the second position relative to the third sample.
[0111] In one embodiment, the radiation-related parameter acquisition module 501 is specifically used for:
[0112] The emissivity and reflectivity to be processed of the test item, the first emissivity and first reflectivity of the first sample, and the second emissivity and second reflectivity of the second sample are measured.
[0113] In one embodiment, the environmental parameter acquisition module 502 is specifically used for:
[0114] The ambient atmospheric transmittance is obtained based on the second radiation intensity and the third radiation intensity.
[0115] The ambient radiation intensity is obtained based on the first radiation intensity, the second radiation intensity, the first emissivity, the first reflectivity, the second emissivity, the second reflectivity, and the ambient atmospheric transmittance.
[0116] In one embodiment, the temperature acquisition module 503 is specifically used for:
[0117] Based on the radiation intensity to be processed, the emissivity to be processed, the reflectivity to be processed, the ambient atmospheric transmittance, and the ambient radiation intensity, the specific radiation intensity of the ideal blackbody is obtained; the specific radiation intensity of the ideal blackbody is the radiation intensity when the temperature of the ideal blackbody is the temperature of the object to be tested.
[0118] The temperature of the object to be tested is obtained based on the specific radiation intensity of the ideal blackbody.
[0119] In one embodiment, the distance between the second position and the third sample is twice the distance between the first position and the second sample.
[0120] Figure 6 An example is a schematic diagram of the physical structure of an electronic device, such as... Figure 6As shown, the electronic device may include a processor 610, a communication interface 620, a memory 630, and a communication bus 640, wherein the processor 610, the communication interface 620, and the memory 630 communicate with each other via the communication bus 640. The processor 610 can call a computer program in the memory 630 to execute steps of a temperature measurement method based on a fused standard sample, such as including:
[0121] Obtain radiation-related parameters of the test item and standard sample;
[0122] Based on the radiation-related parameters of the standard sample, the ambient atmospheric transmittance and ambient radiation intensity are obtained.
[0123] The temperature of the test item is obtained based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity.
[0124] The test item and the standard sample are in the same environment.
[0125] Furthermore, the logical instructions in the aforementioned memory 630 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.
[0126] On the other hand, embodiments of this application also provide a computer program product, which includes a computer program that can be stored on a non-transitory computer-readable storage medium. When the computer program is executed by a processor, the computer can perform the steps of the temperature measurement method based on fused standard samples provided in the above embodiments, such as including:
[0127] Obtain radiation-related parameters of the test item and standard sample;
[0128] Based on the radiation-related parameters of the standard sample, the ambient atmospheric transmittance and ambient radiation intensity are obtained.
[0129] The temperature of the test item is obtained based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity.
[0130] The test item and the standard sample are in the same environment.
[0131] On the other hand, embodiments of this application also provide a processor-readable storage medium storing a computer program for causing a processor to perform the steps of the methods provided in the above embodiments, such as including:
[0132] Obtain radiation-related parameters of the test item and standard sample;
[0133] Based on the radiation-related parameters of the standard sample, the ambient atmospheric transmittance and ambient radiation intensity are obtained.
[0134] The temperature of the test item is obtained based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity.
[0135] The test item and the standard sample are in the same environment.
[0136] The processor-readable storage medium can be any available medium or data storage device that the processor can access, including but not limited to magnetic memory (e.g., floppy disk, hard disk, magnetic tape, magneto-optical disk (MO)), optical memory (e.g., CD, DVD, BD, HVD), and semiconductor memory (e.g., ROM, EPROM, EEPROM, non-volatile memory (NAND FLASH), solid-state drive (SSD)).
[0137] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs. Those skilled in the art can understand and implement this without any creative effort.
[0138] Through the above description of the embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus necessary general-purpose hardware platforms, and of course, it can also be implemented by hardware. Based on this understanding, the above technical solutions, in essence or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disk, etc., and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute the methods described in the various embodiments or some parts of the embodiments.
[0139] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this application.
Claims
1. A temperature measurement method based on fused standard samples, characterized in that, include: Obtain radiation-related parameters for the test item and standard samples, including: The standard sample includes a first sample, a second sample, and a third sample, wherein the second sample and the third sample are made of the same material and have the same surface roughness. The radiation intensity to be processed of the test item, the first radiation intensity of the first sample, and the second radiation intensity of the second sample are obtained at the first location; The third radiation intensity of the third sample is obtained at the second position; the observation angle of the first position relative to the second sample is the same as the observation angle of the second position relative to the third sample; The emissivity and reflectivity to be processed of the test item, the first emissivity and first reflectivity of the first sample, and the second emissivity and second reflectivity of the second sample are measured. Based on the radiation-related parameters of the standard sample, the ambient atmospheric transmittance and ambient radiation intensity are obtained. Based on the radiation intensity to be processed, the emissivity to be processed, the reflectivity to be processed, the atmospheric transmittance, and the ambient radiation intensity of the test object, the specific radiation intensity of the ideal blackbody is obtained; the specific radiation intensity of the ideal blackbody is the radiation intensity when the temperature of the ideal blackbody is the temperature of the test object. The temperature of the object to be tested is obtained based on the specific radiation intensity of the ideal blackbody. The test item and the standard sample are in the same environment.
2. The temperature measurement method based on fused standard samples according to claim 1, characterized in that, The step of obtaining the ambient atmospheric transmittance and ambient radiation intensity based on the radiation-related parameters of the standard sample includes: The ambient atmospheric transmittance is obtained based on the second radiation intensity and the third radiation intensity. The ambient radiation intensity is obtained based on the first radiation intensity, the second radiation intensity, the first emissivity, the first reflectivity, the second emissivity, the second reflectivity, and the ambient atmospheric transmittance.
3. The temperature measurement method based on fused standard samples according to claim 1, characterized in that: The distance between the second position and the third sample is twice the distance between the first position and the second sample.
4. A temperature measurement device based on fused standard samples, characterized in that, The method for performing temperature measurement based on fused standard samples as described in claim 1 includes: The radiation-related parameter acquisition module is used to acquire radiation-related parameters of the test item and standard sample. The environmental parameter acquisition module is used to: obtain the ambient atmospheric transmittance and ambient radiation intensity based on the radiation-related parameters of the standard sample; The temperature acquisition module is used to: obtain the temperature of the test item based on the radiation-related parameters of the test item, the ambient atmospheric transmittance, and the ambient radiation intensity; The test item and the standard sample are in the same environment.
5. An electronic device comprising a processor and a memory storing a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the temperature measurement method based on fused standard samples as described in any one of claims 1 to 3.
6. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the steps of the temperature measurement method based on fused standard samples as described in any one of claims 1 to 3.
7. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the steps of the temperature measurement method based on fused standard samples as described in any one of claims 1 to 3.