Method and apparatus for detecting material reflection characteristics, storage medium, and electronic device

Abstract

The application discloses a material reflection characteristic detection method and device, a storage medium and an electronic device. The material reflection characteristic detection method comprises the following steps: controlling a target light beam to irradiate a material surface of a material to be measured in a target incident angle; acquiring a reflection light spot formed by a reflection light beam of the target light beam on a reflection path of the target light beam; controlling a power meter with a single slit on the surface to scan the reflection light spot in a target direction to obtain a power data set; and determining a target material reflection characteristic of the material surface in the target incident angle according to the power data set and beam information of the target light beam, wherein the target material reflection characteristic comprises a target reflectivity characteristic and a target power distribution characteristic, and the target power distribution characteristic is used for indicating a power distribution condition on the reflection light spot. By adopting the technical solution, the problem of low detection efficiency of material reflection characteristics in the related art is solved.

Description

Technical Field

[0001] This application relates to the field of laser technology, and more specifically, to a method and apparatus for detecting the reflective properties of materials, a storage medium, and an electronic device. Background Technology

[0002] In the study of laser-metal coupling, the reflection characteristics of the material can be used to determine the coupling efficiency of the material to the laser, which is crucial for the study of the interaction mechanism between laser and material.

[0003] In the existing technology, the reflective properties of a material may include multiple aspects, such as reflectivity and power distribution of reflected light. The detection of each aspect of reflective properties requires testing with corresponding specialized equipment. After the detection of one reflective property of the material is completed, the material needs to be sent to another laboratory for the detection of other reflective properties. The process is complicated and inefficient.

[0004] There is still no effective solution to the problem of low detection efficiency of material reflection characteristics in related technologies. Summary of the Invention

[0005] This application provides a method and apparatus for detecting the reflective properties of materials, a storage medium, and an electronic device, to at least solve the problem of low detection efficiency of material reflective properties in related technologies.

[0006] According to one embodiment of this application, a method for detecting the reflectivity of a material is provided, comprising:

[0007] The target beam is controlled to illuminate the surface of the material whose reflectivity is to be measured along the target incident angle;

[0008] The reflected spot formed by the reflected beam of the target beam is obtained along the reflection path of the target beam;

[0009] A power meter with a single slit covering its surface is controlled to scan the reflected light spot along the target direction to obtain a power data set. The detection surface of the power meter is larger than the reflected light spot, the single slit is perpendicular to the target direction, the width of the single slit is smaller than the diameter of the reflected light spot, and the power data set includes the power data of each strip light spot formed by the single slit detected by the power meter at each light spot position reached.

[0010] The target material reflection characteristics of the material surface at the target incident angle are determined based on the power data set and the beam information of the target beam. The target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics, and the target power distribution characteristics are used to indicate the power distribution on the reflected light spot.

[0011] Optionally, determining the target material reflection characteristics of the material surface at the target incident angle based on the power data set and the beam information of the target beam includes:

[0012] The target reflectivity characteristics are determined based on the power data set including multiple power data and the target power of the target beam, wherein the beam information of the target beam includes the target power;

[0013] The power normalization intensity of the reflected light spot at each spot location is determined based on each power data included in the power data set to obtain the target power distribution characteristics, wherein the power normalization intensity is used to indicate the power variation at each spot location.

[0014] Optionally, determining the target reflectivity characteristics based on the plurality of power data included in the power data set and the target power of the target beam includes:

[0015] The reflected power corresponding to the reflected light spot is obtained by summing up the multiple power data.

[0016] The ratio between the reflected power and the target power is determined as the target reflectivity characteristic.

[0017] Optionally, determining the normalized power intensity of the reflected light spot at each spot location based on each power data included in the power data set to obtain the target power distribution characteristics includes:

[0018] Extract the largest power data from the power data set as the reference data;

[0019] Calculate the ratio of each power data point in the power data set to the reference data to obtain the corresponding spot position and power normalization intensity;

[0020] The power normalization intensity curve corresponding to the reflected light spot is plotted based on the corresponding light spot position and power normalization intensity as the target power distribution characteristic.

[0021] Optionally, the step of plotting the power normalization intensity curve corresponding to the reflected light spot based on the corresponding light spot position and power normalization intensity as the target power distribution characteristic includes:

[0022] The position of the light spot corresponding to the reference data is determined as the zero coordinate position to construct a position coordinate axis as the horizontal axis, and the power coordinate axis is determined to have a value range of 0 to 1 as the vertical axis to obtain a power change coordinate system.

[0023] Mark the corresponding light spot positions and power normalization intensities in the power variation coordinate system to obtain multiple marker points;

[0024] The plurality of marked points are fitted to the power normalized intensity curve.

[0025] Optionally, the control surface is covered with a power meter with a single slit, which scans the reflected light spot along the target direction to obtain a power data set, including:

[0026] The power meter, whose surface is covered with a single slit, moves along the target direction on the reflected light spot according to the target step size;

[0027] Record the position of the light spot during each movement and the power data detected by the power meter during each movement to obtain the power data set.

[0028] Optionally, before the power meter, whose control surface is covered with a single slit, moves along the target direction on the reflected light spot in a target step size, the method further includes:

[0029] Measure the diameter of the reflected light spot;

[0030] The width of the single slit and the target step size are determined based on the diameter of the reflected light spot.

[0031] According to another embodiment of the present application, a device for detecting the reflective properties of a material is also provided, comprising:

[0032] The control module is used to control the target beam to irradiate the material surface of the material whose reflectivity is to be measured along the target incident angle;

[0033] The acquisition module is used to acquire the reflected light spot formed by the reflected beam of the target beam along the reflection path of the target beam;

[0034] A scanning module is used to control a power meter with a single slit covering its surface to scan the reflected light spot along the target direction to obtain a power data set. The detection surface of the power meter is larger than the reflected light spot, the single slit is perpendicular to the target direction, the width of the single slit is smaller than the diameter of the reflected light spot, and the power data set includes the power data of each strip light spot formed by the single slit detected by the power meter at each light spot position reached.

[0035] The first determining module is used to determine the target material reflection characteristics of the material surface at the target incident angle based on the power data set and the beam information of the target beam. The target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics, and the target power distribution characteristics are used to indicate the power distribution on the reflected light spot.

[0036] According to another aspect of the embodiments of this application, a computer-readable storage medium is also provided, wherein a computer program is stored in the computer program, and the computer program is configured to execute the above-described method for detecting the material reflection properties when it is run.

[0037] According to another aspect of the embodiments of this application, an electronic device is also provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the above-described method for detecting the material reflection properties through the computer program.

[0038] In this embodiment, a target beam is controlled to irradiate the surface of the material to be measured along a target incident angle; a reflected spot formed by the reflected beam of the target beam is acquired along the reflection path of the target beam; a power meter with a single slit covering its surface is controlled to scan the reflected spot along the target direction to obtain a power data set, wherein the detection surface of the power meter is larger than the reflected spot, the single slit is perpendicular to the target direction, the width of the single slit is smaller than the diameter of the reflected spot, and the power data set includes the power data of each strip-shaped spot formed by the single slit detected by the power meter at each spot position reached; the target material reflection characteristics of the material surface at the target incident angle are determined based on the power data set and the beam information of the target beam, wherein the target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics, and the target power distribution characteristics are used to indicate the power distribution on the reflected spot, i.e., firstly... The method involves controlling a target beam to illuminate the surface of the material to be measured, along a target incident angle. The material surface reflects the target beam, forming a reflected beam. Reflected spots are acquired along the reflection path of the reflected beam. A power meter, with a single slit covering the surface, scans the reflected spots along the target direction, obtaining a power data set. This power data set includes the power data of each strip-shaped spot formed by the single slit at each spot position reached by the power meter. Finally, based on the power data set and the beam information of the target beam, the target material reflection characteristics at the target incident angle are determined. These target material reflection characteristics include target reflectivity and target power distribution characteristics. The target power distribution characteristics indicate the power distribution on the reflected spots. In other words, multiple aspects of the material's reflection characteristics can be detected by acquiring a single set of data, avoiding complex acquisition and detection processes. This technical solution solves the problem of low detection efficiency of material reflection characteristics in related technologies, achieving a significant improvement in the detection efficiency of material reflection characteristics. Attached Figure Description

[0039] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0040] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] Figure 1 This is a schematic diagram of the hardware environment for a method for detecting the reflective properties of a material according to an embodiment of this application;

[0042] Figure 2 This is a flowchart of a method for detecting the reflective properties of a material according to an embodiment of this application;

[0043] Figure 3 This is a schematic diagram of a power normalized intensity curve according to an embodiment of this application;

[0044] Figure 4 This is a schematic diagram of a device for detecting reflection characteristics according to an embodiment of this application;

[0045] Figure 5 This is a schematic diagram of the reflected light power distribution at different incident angles according to embodiments of this application;

[0046] Figure 6 This is a schematic diagram of another device for detecting reflection characteristics according to an embodiment of this application;

[0047] Figure 7 This is a structural block diagram of a material reflection characteristic detection device according to an embodiment of this application. Detailed Implementation

[0048] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0049] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or units is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0050] The methods and embodiments provided in this application can be executed on a computer terminal, device terminal, or similar computing device. Taking running on a computer terminal as an example, Figure 1 This is a schematic diagram of the hardware environment for a method for detecting the reflective properties of a material according to an embodiment of this application. For example... Figure 1 As shown, a computer terminal may include one or more ( Figure 1 Only one is shown in the diagram. A processor 102 (which may include, but is not limited to, a microprocessor MCU or a programmable logic device FPGA, etc.) and a memory 104 for storing data are also shown. In one exemplary embodiment, the computer terminal may further include a transmission device 106 for communication functions and an input / output device 108. Those skilled in the art will understand that... Figure 1 The structure shown is for illustrative purposes only and does not limit the structure of the computer terminal described above. For example, the computer terminal may also include components that are more complex than those described above. Figure 1 The more or fewer components shown, or having the same Figure 1 Equivalent functions or ratios shown Figure 1 The functions shown have more different configurations.

[0051] The memory 104 can be used to store computer programs, such as application software programs and modules, like the computer program corresponding to the message push sending method in this embodiment of the invention. The processor 102 executes various functional applications and data processing by running the computer programs stored in the memory 104, thereby implementing the above-described method. The memory 104 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include memory remotely located relative to the processor 102, and these remote memories can be connected to a computer terminal via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0052] The transmission device 106 is used to receive or send data via a network. Specific examples of the network described above may include a wireless network provided by a communication provider for the computer terminal. In one example, the transmission device 106 includes a Network Interface Controller (NIC), which can connect to other network devices via a base station to communicate with the Internet. In another example, the transmission device 106 may be a Radio Frequency (RF) module used for wireless communication with the Internet.

[0053] This embodiment provides a method for detecting the reflectivity of a material, applied to the aforementioned computer terminal. Figure 2 This is a flowchart of a method for detecting the reflective properties of a material according to an embodiment of this application, as shown below. Figure 2 As shown, the process includes the following steps:

[0054] Step S202: Control the target beam to irradiate the material surface of the material whose reflection properties are to be measured along the target incident angle;

[0055] Step S204: Obtain the reflected spot formed by the reflected beam of the target beam along the reflection path of the target beam;

[0056] Step S206: Control the power meter with a single slit covering its surface to scan the reflected light spot along the target direction to obtain a power data set, wherein the detection surface of the power meter is larger than the reflected light spot, the single slit is perpendicular to the target direction, the width of the single slit is smaller than the diameter of the reflected light spot, and the power data set includes the power data of each strip light spot formed by the single slit detected by the power meter at each light spot position reached;

[0057] Step S208: Determine the target material reflection characteristics of the material surface at the target incident angle based on the power data set and the beam information of the target beam. The target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics. The target power distribution characteristics are used to indicate the power distribution on the reflected light spot.

[0058] Through the above steps, firstly, the target beam is controlled to illuminate the surface of the material to be measured along the target incident angle. The material surface reflects the target beam to form a reflected beam. A reflected spot is acquired along the reflection path of the reflected beam. A power meter covered with a single slit is controlled to scan the reflected spot along the target direction, obtaining a power data set. The power data set includes the power data of each strip-shaped spot formed by the single slit detected by the power meter at each reached spot position. Finally, based on the power data set and the beam information of the target beam, the target material reflection characteristics at the target incident angle are determined. These target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics. The target power distribution characteristics indicate the power distribution on the reflected spot. In other words, multiple aspects of the material reflection characteristics can be detected by acquiring a single set of data, avoiding complex acquisition and detection processes. This technical solution solves the problem of low detection efficiency of material reflection characteristics in related technologies, achieving the technical effect of improving the detection efficiency of material reflection characteristics.

[0059] In the technical solution provided in step S202 above, the detection of the surface reflection characteristics of a material is usually performed by irradiating the material surface with a laser. Taking the laser detection of a metal material surface as an example, the detected material reflection characteristics are related to many factors when the metal material surface is irradiated with a laser, such as the wavelength of the incident laser, the incident angle of the incident laser, the metal material, the surface roughness of the metal material, the degree of oxidation, and the temperature. That is to say, different incident angles may result in different detected material reflection characteristics. Therefore, the incident angle is first adjusted to the target incident angle to study the material reflection characteristics of the material surface at the target incident angle. Subsequently, the laser incident angle can be adjusted to study the material reflection characteristics of the material surface at different incident angles.

[0060] In the technical solution provided in step S204 above, the target beam illuminates the material surface, the material surface reflects the target beam to generate a reflected beam, and the reflected spot formed by the reflected beam can be obtained on the reflection path. Subsequently, the relevant parameters of the reflected spot are detected to obtain the material reflection characteristics of the material surface.

[0061] Optionally, in this embodiment, the method for obtaining the reflected spot formed by the reflected beam of the target beam on the reflection path of the target beam may be, but is not limited to, setting a receiving surface on the reflection path, and the reflected beam forming a reflected spot on the receiving surface.

[0062] In the technical solution provided in step S206 above, after obtaining the reflected light spot, the relevant data of the reflected light spot are measured and collected. Since the material reflection characteristics include multiple aspects, such as reflectivity characteristics and power distribution characteristics, the detection surface of the power meter is generally larger than the diameter of the reflected light spot. In order to study the power distribution characteristics, a single slit is first covered on the surface of the power meter. The power meter only allows the measurement of the power data of the strip light spot that passes through the single slit. Since the width of the strip light spot is much smaller than the diameter of the reflected light spot, the power distribution of the reflected light spot is studied by detecting the power data of the strip light spot at different spot positions. Thus, while detecting the reflectivity characteristics of the material surface, the power distribution characteristics of the material surface can also be detected.

[0063] In one exemplary embodiment, a power meter with a single slit covering its surface can be controlled to scan the reflected light spot along a target direction to obtain a power data set by, but not limited to, the following: controlling the power meter with a single slit covering its surface to move along the target direction on the reflected light spot according to a target step size; recording the position of the light spot at each movement and the power data detected by the power meter at each movement to obtain the power data set.

[0064] Optionally, in this embodiment, the power meter with a single slit covering its surface moves along the target direction on the reflected light spot according to the target step size. Each time it moves, the position of the corresponding strip light spot and the power data detected by the power meter at each move can be obtained. The above process can be regarded as dividing the reflected light spot into N strip light spots and detecting them one by one to obtain the corresponding light spot positions and power data.

[0065] In one exemplary embodiment, before the power meter, whose control surface is covered by a single slit, moves along the target direction on the reflected light spot in accordance with a target step size, the diameter of the reflected light spot may be measured in the following manner, but is not limited to: determining the width of the single slit and the target step size based on the diameter of the reflected light spot.

[0066] Optionally, in this embodiment, the above process can be viewed as dividing the reflected light spot into N strip-shaped light spots for individual detection, obtaining corresponding spot positions and power data. Therefore, the fineness of the segmentation also affects the accuracy of the results. Since the power meter can only detect the power data of the beam passing through a single slit at a time, the width of the single slit directly determines the width of the strip-shaped light spot, and the target step size directly affects the number of strip-shaped light spots into which the reflected light spot is divided. Therefore, the width of the single slit and the target step size are first determined based on the diameter of the reflected light spot. This ensures that the segmentation scheme matches the accuracy of the detection results. For example, when the spot diameter is small, the width of the single slit and the target step size can be appropriately reduced.

[0067] In the technical solution provided in step S208 above, the target reflectivity characteristics and target power distribution characteristics of the material surface under the target incident angle are determined according to the power data set and the beam information of the target beam. In other words, the target reflectivity characteristics and target power distribution characteristics can be obtained simultaneously by combining the power data set collected once with the beam information of the target beam, thereby improving the efficiency of obtaining the reflectivity characteristics of the target material.

[0068] In one exemplary embodiment, the target material reflection characteristics of the material surface at the target incident angle can be determined, but is not limited to, by means of the power data set and the beam information of the target beam in the following manner: determining the target reflectivity characteristics based on a plurality of power data included in the power data set and the target power of the target beam, wherein the beam information of the target beam includes the target power; determining the power normalized intensity of the reflected light spot at each light spot position based on each power data included in the power data set to obtain the target power distribution characteristics, wherein the power normalized intensity is used to indicate the power variation at each light spot position.

[0069] Optionally, in this embodiment, the target reflectivity characteristic may refer to, but is not limited to, the reflectivity of the material surface. Therefore, the target reflectivity characteristic is the ratio of the reflected power of the reflected beam to the target power of the target beam. The reflected power of the reflected beam can be determined based on multiple power data included in the power data set.

[0070] Optionally, in this embodiment, the target power distribution characteristics are used to indicate the power distribution of the reflected light spot. Therefore, the target power distribution characteristics can be obtained by determining the normalized power intensity of the reflected light spot at each spot location based on each power data included in the power data set.

[0071] In one exemplary embodiment, the target reflectivity characteristic can be determined, but is not limited to, by the following method based on a plurality of power data included in the power data set and the target power of the target beam: summing the plurality of power data to obtain the reflection power corresponding to the reflected spot; and determining the ratio between the reflection power and the target power as the target reflectivity characteristic.

[0072] Optionally, in this embodiment, the target reflectivity characteristic is the ratio of the reflected power of the reflected beam to the target power of the target beam. The reflected light spot is divided into N strip-shaped light spots, and the power data records the power of each strip-shaped light spot in the N strip-shaped light spots. Therefore, the reflected power is the sum of the power data. Finally, the ratio between the reflected power and the target power is determined as the target reflectivity characteristic.

[0073] In one exemplary embodiment, the target power distribution characteristic can be obtained by determining the normalized power intensity of the reflected light spot at each light spot location based on each power data included in the power data set, in the following manner: extracting the largest power data from the power data set as reference data; calculating the ratio of each power data in the power data set to the reference data to obtain a corresponding light spot location and normalized power intensity; and plotting the power normalized intensity curve corresponding to the reflected light spot based on the corresponding light spot location and normalized power intensity as the target power distribution characteristic.

[0074] Optionally, in this embodiment, taking the power data set {(position 1, 200), (position 2, 400), (position 3, 700), (position 4, 1000), (position 5, 700), (position 6, 400), (position 7, 200)} as an example, the largest power data 1000 is extracted from the power data set as reference data. The ratio of each power data in the power data set to the reference data is calculated to obtain the corresponding spot positions and power normalized intensities {(position 1, 0.2), (position 2, 0.4), (position 3, 0.7), (position 4, 1.0), (position 5, 0.7), (position 6, 0.4), (position 7, 0.2)}. Finally, the power normalized intensity curve corresponding to the reflected spot is plotted based on the corresponding spot positions and power normalized intensities as the target power distribution characteristics.

[0075] In an exemplary embodiment, the power normalization intensity curve corresponding to the reflected light spot can be plotted as the target power distribution characteristic based on the corresponding light spot position and power normalization intensity in the following manner: the light spot position corresponding to the reference data is determined as the zero coordinate position to construct a position coordinate axis as the horizontal axis, and the power coordinate axis is determined to have a value range of 0 to 1 as the vertical axis to obtain a power variation coordinate system; the corresponding light spot position and power normalization intensity are marked in the power variation coordinate system to obtain multiple marked points; the multiple marked points are fitted to the power normalization intensity curve.

[0076] Optionally, in this embodiment, Figure 3 This is a schematic diagram of a power normalized intensity curve according to an embodiment of this application, such as... Figure 3As shown, taking the power data set {(position 1, 200), (position 2, 400), (position 3, 700), (position 4, 1000), (position 5, 700), (position 6, 400), (position 7, 200)} as an example, the position of the light spot (position 4) corresponding to the reference data (1000) is determined as the zero coordinate position to construct the position coordinate axis as the horizontal axis, and the power coordinate axis is determined to have a value range of 0 to 1 as the vertical axis, thus obtaining the power change coordinate system. The reference data (1000) is used as the zero coordinate position to construct the position coordinate axis as the horizontal axis. The power normalized intensity corresponding to 00) takes a value of 1 on the vertical axis. The corresponding spot positions and power normalized intensities are marked in the power variation coordinate system to obtain multiple marked points. The multiple marked points are fitted to the power normalized intensity curve. In addition, by changing the target incident angle, multiple corresponding power normalized intensity curves can be obtained. The target incident angle 1 corresponds to the power normalized intensity curve 1, the target incident angle 2 corresponds to the power normalized intensity curve 2, and the target incident angle 3 corresponds to the power normalized intensity curve 3.

[0077] To better understand the process of detecting the reflective properties of the above-mentioned materials, the detection method of the reflective properties of the above-mentioned materials will be described below in conjunction with optional embodiments, but it is not intended to limit the technical solution of the embodiments of this application.

[0078] Step 1: Prepare the testing device for the material's reflectivity. Figure 4 This is a schematic diagram of a reflection characteristic detection device according to an embodiment of this application, as shown below. Figure 4 As shown, it includes a QCS laser source, a reflective template, a support frame, a horizontal turntable, a power meter, an aperture with a slit, and a stepper motor.

[0079] Step 2: Fix the reflective sample vertically on the support frame. Do not touch the reflective surface with your hands during the process of taking it out and putting it in, as this will affect the measurement results.

[0080] Step 3: Fix the power meter target onto the stepper motor. To improve measurement accuracy, attach an aperture with a slit to the target.

[0081] Step 4: Maintain constant light output parameters to enable continuous low-power laser output, calibrate the initial incident power P0, and fix the QCS output head of the laser source on a horizontal turntable to make the laser incident angle adjustable.

[0082] Step 5: Adjust the optical path to ensure that the incident surface, the reflecting surface, and the receiving surface of the power meter target are at the same height.

[0083] Step Six: Adjust the incident angle θ of the laser using a horizontal turntable. After the laser source is turned on, the beam hits the reflective sample at an incident angle θ and is then reflected. At this time, start the stepper motor, which drives the laser power target surface to move and measures the power of the reflected light.

[0084] Step 7: Change the laser incident angle θ, adjust the sample position, and repeat step 6 to obtain the laser reflection power at different incident angles.

[0085] Step 8: After the measurement is completed, export the data sampled by the power meter. Obtain the reflected power P by integration and summation, and its mathematical expression is as follows:

[0086]

[0087] Where P1 is the power value measured by the power meter at the starting point of the stepper motor, and Pn is the power value measured by the power meter at the ending point of the stepper motor.

[0088] Therefore, at the incident angle θ, the surface reflectance of this material is (P / P0)×100%.

[0089] Step 9: Perform power normalization processing on the power meter sampling data to obtain the distribution of reflected light under different incident angles θ. Figure 5 This is a schematic diagram of the reflected light power distribution at different incident angles according to embodiments of this application, as shown below. Figure 5 As shown, the reflection power of the high-reflectivity mirror hardly changes with the incident angle, while for other roughness conditions, the reflection power changes with the incident angle.

[0090] Based on the above steps, another device for detecting reflection characteristics is also proposed. Figure 6 This is a schematic diagram of another reflection characteristic detection device according to an embodiment of this application, as shown below. Figure 6 As shown, with Figure 4 The difference in the device for detecting the reflection characteristics is that a plano-convex lens is added between the reflection sample and the power meter target. The function of this lens is to focus the emitted light and improve the accuracy of the measurement method.

[0091] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods of the various embodiments of this application.

[0092] Figure 7 This is a structural block diagram of a material reflection characteristic detection device according to an embodiment of this application; as shown... Figure 7 As shown, it includes:

[0093] Control module 702 is used to control the target beam to irradiate the material surface of the material whose reflection properties are to be measured along the target incident angle;

[0094] The acquisition module 704 is used to acquire the reflected light spot formed by the reflected beam of the target beam along the reflection path of the target beam;

[0095] The scanning module 706 is used to control a power meter with a single slit covering its surface to scan the reflected light spot along the target direction to obtain a power data set. The detection surface of the power meter is larger than the reflected light spot, the single slit is perpendicular to the target direction, the width of the single slit is smaller than the diameter of the reflected light spot, and the power data set includes the power data of each strip light spot formed by the single slit detected by the power meter at each light spot position reached.

[0096] The first determining module 708 is used to determine the target material reflection characteristics of the material surface at the target incident angle based on the power data set and the beam information of the target beam. The target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics, and the target power distribution characteristics are used to indicate the power distribution on the reflected light spot.

[0097] In the above embodiments, firstly, a target beam is controlled to irradiate the surface of the material to be measured along the target incident angle. The material surface reflects the target beam to form a reflected beam. A reflected spot is acquired along the reflection path of the reflected beam. A power meter with a single slit covering the surface is controlled to scan the reflected spot along the target direction to obtain a power data set. The power data set includes the power data of each strip-shaped spot formed by the single slit detected by the power meter at each spot position reached. Finally, the target material reflection characteristics at the target incident angle are determined based on the power data set and the beam information of the target beam. The target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics. The target power distribution characteristics are used to indicate the power distribution on the reflected spot. In other words, multiple aspects of the material reflection characteristics can be detected by acquiring a single set of data, avoiding a complex acquisition and detection process. By adopting the above technical solution, the problem of low detection efficiency of material reflection characteristics in related technologies is solved, and the technical effect of improving the detection efficiency of material reflection characteristics is achieved.

[0098] In an exemplary embodiment, the first determining module includes:

[0099] The first determining unit is configured to determine the target reflectivity characteristics based on the plurality of power data included in the power data set and the target power of the target beam, wherein the beam information of the target beam includes the target power;

[0100] The second determining unit is configured to determine the power normalization intensity of the reflected light spot at each light spot location based on each power data included in the power data set, thereby obtaining the target power distribution characteristics, wherein the power normalization intensity is used to indicate the power variation at each light spot location.

[0101] In an exemplary embodiment, the first determining unit is further configured to:

[0102] The reflected power corresponding to the reflected light spot is obtained by summing up the multiple power data.

[0103] The ratio between the reflected power and the target power is determined as the target reflectivity characteristic.

[0104] In one exemplary embodiment, the second determining unit is further configured to:

[0105] Extract the largest power data from the power data set as the reference data;

[0106] Calculate the ratio of each power data point in the power data set to the reference data to obtain the corresponding spot position and power normalization intensity;

[0107] The power normalization intensity curve corresponding to the reflected light spot is plotted based on the corresponding light spot position and power normalization intensity as the target power distribution characteristic.

[0108] In one exemplary embodiment, the second determining unit is further configured to:

[0109] The position of the light spot corresponding to the reference data is determined as the zero coordinate position to construct a position coordinate axis as the horizontal axis, and the power coordinate axis is determined to have a value range of 0 to 1 as the vertical axis to obtain a power change coordinate system.

[0110] Mark the corresponding light spot positions and power normalization intensities in the power variation coordinate system to obtain multiple marker points;

[0111] The plurality of marked points are fitted to the power normalized intensity curve.

[0112] In one exemplary embodiment, the scanning module includes:

[0113] A control unit is used to control the power meter, whose surface is covered with a single slit, to move along the target direction on the reflected light spot according to a target step size;

[0114] A recording unit is used to record the position of the light spot during each movement and the power data detected by the power meter during each movement, thereby obtaining the power data set.

[0115] In one exemplary embodiment, the apparatus further includes:

[0116] A measurement module is used to measure the diameter of the reflected light spot before the power meter, which covers the control surface with a single slit, moves along the target direction in a target step size on the reflected light spot.

[0117] The second determining module is used to determine the width of the single slit and the target step size based on the diameter of the reflected light spot.

[0118] Embodiments of this application also provide a storage medium including a stored program, wherein the program executes any of the methods described above when it is run.

[0119] Optionally, in this embodiment, the storage medium may be configured to store program code for performing the following steps:

[0120] S1, control the target beam to irradiate the material surface of the material whose reflection properties are to be measured along the target incident angle;

[0121] S2, acquire the reflected spot formed by the reflected beam of the target beam on the reflection path of the target beam;

[0122] S3, a power meter with a single slit covering its surface is controlled to scan the reflected light spot along the target direction to obtain a power data set, wherein the detection surface of the power meter is larger than the reflected light spot, the single slit is perpendicular to the target direction, the width of the single slit is smaller than the diameter of the reflected light spot, and the power data set includes the power data of each strip light spot formed by the single slit detected by the power meter at each light spot position reached;

[0123] S4, determine the target material reflection characteristics of the material surface at the target incident angle based on the power data set and the beam information of the target beam, wherein the target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics, and the target power distribution characteristics are used to indicate the power distribution on the reflected light spot.

[0124] Embodiments of this application also provide an electronic device including a memory and a processor, wherein the memory stores a computer program and the processor is configured to run the computer program to perform the steps in any of the above method embodiments.

[0125] Optionally, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor and the input / output device is connected to the processor.

[0126] Optionally, in this embodiment, the processor can be configured to perform the following steps via a computer program:

[0127] S1, control the target beam to irradiate the material surface of the material whose reflection properties are to be measured along the target incident angle;

[0128] S2, acquire the reflected spot formed by the reflected beam of the target beam on the reflection path of the target beam;

[0129] S3, a power meter with a single slit covering its surface is controlled to scan the reflected light spot along the target direction to obtain a power data set, wherein the detection surface of the power meter is larger than the reflected light spot, the single slit is perpendicular to the target direction, the width of the single slit is smaller than the diameter of the reflected light spot, and the power data set includes the power data of each strip light spot formed by the single slit detected by the power meter at each light spot position reached;

[0130] S4, determine the target material reflection characteristics of the material surface at the target incident angle based on the power data set and the beam information of the target beam, wherein the target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics, and the target power distribution characteristics are used to indicate the power distribution on the reflected light spot.

[0131] Optionally, in this embodiment, the storage medium may include, but is not limited to, various media capable of storing program code, such as USB flash drives, read-only memory (ROM), random access memory (RAM), portable hard drives, magnetic disks, or optical disks.

[0132] Optionally, specific examples in this embodiment can refer to the examples described in the above embodiments and optional implementations, and will not be repeated here.

[0133] Obviously, those skilled in the art should understand that the modules or steps of this application described above can be implemented using general-purpose computing devices. They can be centralized on a single computing device or distributed across a network of multiple computing devices. Optionally, they can be implemented using computer-executable program code, thereby storing them in a storage device for execution by a computing device. In some cases, the steps shown or described can be performed in a different order than those presented here, or they can be fabricated as separate integrated circuit modules, or multiple modules or steps can be fabricated as a single integrated circuit module. Thus, this application is not limited to any particular combination of hardware and software.

[0134] The above description is only a preferred embodiment of this application. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of this application, and these improvements and modifications should also be considered within the scope of protection of this application.

Claims

1. A method for detecting the reflectivity of a material, characterized in that, include: The target beam is controlled to illuminate the surface of the material whose reflectivity is to be measured along the target incident angle; The reflected spot formed by the reflected beam of the target beam is obtained along the reflection path of the target beam; A power meter with a single slit covering its surface is controlled to scan the reflected light spot along the target direction to obtain a power data set. The detection surface of the power meter is larger than the reflected light spot, the single slit is perpendicular to the target direction, the width of the single slit is smaller than the diameter of the reflected light spot, and the power data set includes the power data of each strip light spot formed by the single slit detected by the power meter at each light spot position reached. The target material reflection characteristics of the material surface at the target incident angle are determined based on the power data set and the beam information of the target beam. The target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics, and the target power distribution characteristics are used to indicate the power distribution on the reflected light spot.

2. The method according to claim 1, characterized in that, Determining the target material reflection characteristics of the material surface at the target incident angle based on the power data set and the beam information of the target beam includes: The target reflectivity characteristics are determined based on the power data set including multiple power data and the target power of the target beam, wherein the beam information of the target beam includes the target power; The power normalization intensity of the reflected light spot at each spot location is determined based on each power data included in the power data set to obtain the target power distribution characteristics, wherein the power normalization intensity is used to indicate the power variation at each spot location.

3. The method according to claim 2, characterized in that, Determining the target reflectivity characteristics based on the power data set including multiple power data points and the target power of the target beam includes: The reflected power corresponding to the reflected light spot is obtained by summing up the multiple power data. The ratio between the reflected power and the target power is determined as the target reflectivity characteristic.

4. The method according to claim 2, characterized in that, The step of determining the normalized power intensity of the reflected light spot at each spot location based on each power data included in the power data set, to obtain the target power distribution characteristics, includes: Extract the largest power data from the power data set as the reference data; Calculate the ratio of each power data point in the power data set to the reference data to obtain the corresponding spot position and power normalization intensity; The power normalization intensity curve corresponding to the reflected light spot is plotted based on the corresponding light spot position and power normalization intensity as the target power distribution characteristic.

5. The method according to claim 4, characterized in that, The step of plotting the power normalization intensity curve corresponding to the reflected light spot based on the corresponding light spot position and power normalization intensity as the target power distribution characteristic includes: The position of the light spot corresponding to the reference data is determined as the zero coordinate position to construct a position coordinate axis as the horizontal axis, and the power coordinate axis is determined to have a value range of 0 to 1 as the vertical axis to obtain a power change coordinate system. Mark the corresponding light spot positions and power normalization intensities in the power variation coordinate system to obtain multiple marker points; The plurality of marked points are fitted to the power normalized intensity curve.

6. The method according to claim 1, characterized in that, The control surface is covered with a power meter with a single slit, which scans the reflected light spot along the target direction to obtain a set of power data, including: The power meter, whose surface is covered with a single slit, moves along the target direction on the reflected light spot according to the target step size; Record the position of the light spot during each movement and the power data detected by the power meter during each movement to obtain the power data set.

7. The method according to claim 6, characterized in that, Before the power meter, whose control surface is covered with a single slit, moves along the target direction on the reflected light spot in a target step size, the method further includes: Measure the diameter of the reflected light spot; The width of the single slit and the target step size are determined based on the diameter of the reflected light spot.

8. A device for detecting the reflectivity of a material, characterized in that, include: The control module is used to control the target beam to irradiate the material surface of the material whose reflectivity is to be measured along the target incident angle; The acquisition module is used to acquire the reflected light spot formed by the reflected beam of the target beam along the reflection path of the target beam; A scanning module is used to control a power meter with a single slit covering its surface to scan the reflected light spot along the target direction to obtain a power data set. The detection surface of the power meter is larger than the reflected light spot, the single slit is perpendicular to the target direction, the width of the single slit is smaller than the diameter of the reflected light spot, and the power data set includes the power data of each strip light spot formed by the single slit detected by the power meter at each light spot position reached. The first determining module is used to determine the target material reflection characteristics of the material surface at the target incident angle based on the power data set and the beam information of the target beam. The target material reflection characteristics include target reflectivity characteristics and target power distribution characteristics, and the target power distribution characteristics are used to indicate the power distribution on the reflected light spot.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes a stored program, wherein the program, when executed, performs the method of any one of claims 1 to 7.

10. An electronic device comprising a memory and a processor, characterized in that, The memory stores a computer program, and the processor is configured to execute the method of any one of claims 1 to 7 through the computer program.

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