Test machine data processing method, device and equipment and storage medium

Abstract

The present disclosure provides a test machine data processing method, device, equipment and storage medium, and relates to the technical field of semiconductor testing. The method comprises: obtaining current parameter information of each test machine for a plurality of test machines, wherein the current parameter information comprises a current first set parameter value; storing the current first set parameter value of each test machine into a first database; obtaining the current first set parameter value and corresponding first set parameter update information of each test machine from the first database; determining a plurality of target test machines from the plurality of test machines according to the first set parameter update information of each test machine; statistically processing the current first set parameter value of the plurality of target test machines to obtain a first set parameter value statistical result; and sending a first prompt information if the first set parameter value statistical result comprises a plurality of different current first set parameter values. The method realizes automatic monitoring of the parameters of the semiconductor test machine.

Description

Technical Field

[0001] This disclosure relates to the field of semiconductor testing technology, and more specifically, to a test instrument data processing method, apparatus, electronic device, and readable storage medium. Background Technology

[0002] Semiconductor testing encompasses two stages: wafer probing (CP) and final testing (FT), both requiring semiconductor testing equipment and software. To increase production capacity, semiconductor testing companies often purchase large numbers of semiconductor testing equipment for parallel testing. Over time, after iterative upgrades, inconsistencies frequently arise in the parameters of each semiconductor testing equipment, impacting the testing time and accuracy of integrated circuits (ICs). Therefore, automatically monitoring the parameters of semiconductor testing equipment has become a pressing issue.

[0003] The information disclosed in the background section is only intended to enhance the understanding of the background of this disclosure, and therefore may include information that does not constitute prior art known to those skilled in the art. Summary of the Invention

[0004] The purpose of this disclosure is to provide a test equipment data processing method, apparatus, electronic device, and readable storage medium that can automatically monitor the parameters of a semiconductor test equipment.

[0005] Other features and advantages of this disclosure will become apparent from the following detailed description, or may be learned in part from practice of this disclosure.

[0006] According to one aspect of this disclosure, a test machine data processing method is provided, comprising: being executed by a first client, the first client being installed on the operating system of each of a plurality of test machines; the method comprising: for the plurality of test machines, acquiring current parameter information of each test machine, the current parameter information including a current first set parameter value; storing the current first set parameter value of each test machine in a first database to obtain the current first set parameter value of each test machine and corresponding first set parameter update information from the first database; determining a plurality of target test machines from the plurality of test machines based on the first set parameter update information of each test machine; statistically analyzing the current first set parameter values ​​of the plurality of target test machines to obtain a first set parameter value statistical result; and if the first set parameter value statistical result includes multiple different current first set parameter values, sending a first prompt message.

[0007] According to one embodiment of this disclosure, the first setting parameter update information is information where the first setting parameter value is historical data, or information where the first setting parameter value is updated data; storing the current first setting parameter value of each test machine in a first database to obtain the current first setting parameter value and corresponding first setting parameter update information of each test machine from the first database includes: calling a first network service to store the current first setting parameter value of each test machine in the first database, so that the first network service marks the first setting parameter value of each test machine stored in the first database as historical data, and then compares the current first setting parameter value of each test machine with the first setting parameter value of the corresponding test machine stored in the first database, obtaining the first setting parameter update information of the test machine with different comparison results as updated data, and obtaining the first setting parameter update information of the test machine with the same comparison result as historical data; determining multiple target test machines from the multiple test machines based on the first setting parameter update information of each test machine includes: obtaining the test machine with the first setting parameter value of updated data among the multiple test machines as the target test machine.

[0008] According to one embodiment of this disclosure, the plurality of test benches includes a first test bench; the method further includes: determining whether first test software installed on the operating system of the first test bench needs to be upgraded; if it is determined that the first test software needs to be upgraded, determining whether the first test bench is in a testing state; if it is determined that the first test bench is not in a testing state, then performing an upgrade operation on the first test software.

[0009] According to one embodiment of this disclosure, determining whether a first test software installed on the operating system of the first test machine needs to be upgraded includes: in response to receiving an upgrade instruction for the first test software, determining whether the first test software needs to be upgraded; the method further includes: if it is determined that the first test machine is in a test state, then waiting until the current test is completed before performing an upgrade operation on the first test software.

[0010] According to one embodiment of this disclosure, if it is determined that the first test machine is in a testing state, then wait until the current test ends before performing an upgrade operation on the first test software, including: if it is determined that the first test machine is in a testing state, obtaining the remaining time of the current test; after waiting for the remaining time of the current test, receiving and caching test instructions; stopping the operation of the first test software, and performing an upgrade operation on the first test software; the method further includes: starting the upgraded first test software; and sending the cached test instructions to the upgraded first test software.

[0011] According to one embodiment of this disclosure, the current parameter information further includes the current test progress of the first test corresponding to the first test software and the remaining time of the current test; obtaining the current parameter information of each test machine includes: calling the first instruction corresponding to the first test software to obtain the current test progress of the first test and the remaining time of the current test; determining whether the first test machine is in a test state includes: determining whether the first test machine is in a test state based on the current test progress of the first test.

[0012] According to one embodiment of this disclosure, the current parameter information further includes the current version number of the first test software installed on the operating system of the first test machine; determining whether the first test software installed on the operating system of the first test machine needs to be upgraded includes: calling a second network service to obtain the update version information of the first test software, wherein the update version information of the first test software includes the update version number of the first test software; determining whether the current version number of the first test software installed on the operating system of the first test machine is the same as the update version number of the first test software; if the current version number of the first test software installed on the operating system of the first test machine is different from the update version number of the first test software, then it is determined that the first test software installed on the operating system of the first test machine needs to be upgraded.

[0013] According to one embodiment of this disclosure, the updated version information of the first test software further includes a download address for the updated version of the first test software package; if it is determined that the first test software needs to be upgraded, determining whether the first test machine is in a testing state includes: if it is determined that the first test software needs to be upgraded, downloading the updated version of the first test software package according to the download address of the updated version of the first test software package; determining whether the first test machine is in a testing state; if it is determined that the first test machine is not in a testing state, performing an upgrade operation on the first test software includes: if it is determined that the first test machine is not in a testing state, running the downloaded updated version of the first test software package.

[0014] According to one embodiment of this disclosure, the current first set parameter value includes the current set temperature; obtaining the current parameter information of each test machine includes: communicating with the probes of the corresponding test machine through a general interface bus protocol to obtain the current set temperature of each test machine.

[0015] According to another aspect of this disclosure, a test machine data processing method is provided, comprising: being executed by an extraction, conversion, and loading tool, including: obtaining the current first setting parameter value and corresponding first setting parameter update information of each test machine in a plurality of test machines from a first database; determining a plurality of target test machines from the plurality of test machines based on the first setting parameter update information of each test machine; statistically analyzing the current first setting parameter values ​​of the plurality of target test machines to obtain a first setting parameter value statistical result; and sending a first prompt message if the first setting parameter value statistical result includes multiple different current first setting parameter values.

[0016] According to one embodiment of this disclosure, the first setting parameter update information is information where the first setting parameter value is historical data, or the first setting parameter update information is information where the first setting parameter value is updated data; determining multiple target test stations from the multiple test stations based on the first setting parameter update information of each test station includes: obtaining the test station among the multiple test stations where the first setting parameter value is updated data as the target test station.

[0017] According to one embodiment of this disclosure, obtaining the current first setting parameter value and corresponding first setting parameter update information of each test machine in a plurality of test machines from a first database includes: obtaining the current first setting parameter value and corresponding first setting parameter update information corresponding to each of the plurality of first setting parameter names of each test machine in the plurality of test machines from the first database; statistically analyzing the current first setting parameter values ​​of the plurality of target test machines to obtain a statistical result of the first setting parameter values, including: counting the number of current first setting parameter values ​​and the number of target test machines corresponding to each current first setting parameter value according to each first setting parameter name; if the statistical result of the first setting parameter values ​​includes multiple different current first setting parameter values, then sending a first prompt message, including: if the number of current first setting parameter values ​​corresponding to a first setting parameter name is multiple, then sending the first prompt message according to the first setting parameter name, wherein the first prompt message includes the number of target test machines corresponding to different current first setting parameter values.

[0018] According to another aspect of this disclosure, a test machine data processing device is provided, comprising: executed by a first client, the first client being installed on the operating system of each of a plurality of test machines; the device comprising: an acquisition module, configured to acquire current parameter information of each of the plurality of test machines, the current parameter information including a current first set parameter value; and a storage module, configured to store the current first set parameter value of each test machine in a first database, to obtain the current first set parameter value of each test machine and corresponding first set parameter update information from the first database, and to determine a plurality of target test machines from the plurality of test machines based on the first set parameter update information of each test machine, to perform statistics on the current first set parameter values ​​of the plurality of target test machines to obtain a first set parameter value statistical result, and if the first set parameter value statistical result includes a plurality of different current first set parameter values, then sending a first prompt message.

[0019] According to another aspect of this disclosure, an electronic device is provided, comprising: a memory, a processor, and executable instructions stored in the memory and executable in the processor, wherein the processor, when executing the executable instructions, implements any of the methods described above.

[0020] According to another aspect of this disclosure, a computer-readable storage medium is provided that stores computer-executable instructions thereon, which, when executed by a processor, implement any of the methods described above.

[0021] The test machine data processing method provided in the embodiments of this disclosure is executed by a first client installed on the operating system of each of multiple test machines. By acquiring the current parameter information of each test machine, including the current first set parameter value, the current first set parameter value of each test machine is stored in a first database. This allows extraction, conversion, and loading tools to obtain the current first set parameter value and corresponding first set parameter update information of each test machine from the first database. Based on the first set parameter update information of each test machine, multiple target test machines are determined from the multiple test machines. The current first set parameter values ​​of the multiple target test machines are statistically analyzed to obtain the first set parameter value statistical result. If the first set parameter value statistical result includes multiple different current first set parameter values, a first prompt message is sent, thereby enabling automated monitoring of the parameters of each test machine.

[0022] It should be understood that the above general description and the following detailed description are merely exemplary and do not limit this disclosure. Attached Figure Description

[0023] The above and other objects, features and advantages of this disclosure will become more apparent from a detailed description of exemplary embodiments thereof with reference to the accompanying drawings.

[0024] Figure 1A An exemplary system architecture is shown that can be applied to the test machine data processing method or test machine data processing apparatus of this disclosure.

[0025] Figure 1B according to Figure 1A A schematic diagram of a user interface is shown.

[0026] Figure 1C according to Figure 1A A diagram showing the parameter display interface of a test machine is provided.

[0027] Figure 2 A flowchart illustrating a test equipment data processing method according to an embodiment of this disclosure is shown.

[0028] Figure 3 A flowchart illustrating another test equipment data processing method in an embodiment of this disclosure is shown.

[0029] Figure 4 A flowchart illustrating another test equipment data processing method in an embodiment of this disclosure is shown.

[0030] Figure 5 It shows Figure 4 The step S402 shown is a schematic diagram of the processing procedure in one embodiment.

[0031] Figure 6 It shows Figure 4 The diagram shows steps S402 and S4042 in another embodiment of the processing procedure.

[0032] Figure 7 It shows Figure 4 The step S4064 shown is a schematic diagram of the processing procedure in one embodiment.

[0033] Figure 8 It is based on Figures 4 to 7 The diagram shows the process of automatically upgrading the machine testing software.

[0034] Figure 9 This is a flowchart illustrating yet another test equipment data processing method according to an exemplary embodiment.

[0035] Figure 10 It is based on Figure 9 The flowchart shown is another data processing method for a test machine.

[0036] Figure 11 It is based on Figure 10 The diagram shows a distribution of machine tool setting parameter values.

[0037] Figure 12A block diagram of a test machine data processing apparatus is shown in an embodiment of the present disclosure.

[0038] Figure 13 A block diagram of another test machine data processing apparatus is shown in an embodiment of this disclosure.

[0039] Figure 14 A block diagram of another test machine data processing apparatus is shown in an embodiment of the present disclosure.

[0040] Figure 15 A schematic diagram of the structure of an electronic device according to an embodiment of the present disclosure is shown. Detailed Implementation

[0041] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, they are provided so that this disclosure will be more comprehensive and complete, and will fully convey the concept of the exemplary embodiments to those skilled in the art. The drawings are merely illustrative of this disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and therefore repeated descriptions of them will be omitted.

[0042] Furthermore, the described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. Numerous specific details are provided in the following description to give a thorough understanding of embodiments of this disclosure. However, those skilled in the art will recognize that the technical solutions of this disclosure can be practiced with one or more of the specific details omitted, or other methods, apparatuses, steps, etc., can be employed. In other instances, well-known structures, methods, apparatuses, implementations, or operations are not shown or described in detail to avoid obscuring various aspects of this disclosure.

[0043] Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this disclosure, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified. The symbol " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0044] In this disclosure, unless otherwise expressly specified and limited, the term "connection" and similar terms should be interpreted broadly, for example, it can refer to an electrical connection or the ability to communicate with each other; it can refer to a direct connection or an indirect connection through an intermediate medium. Those skilled in the art can understand the specific meaning of the above terms in this disclosure according to the specific circumstances.

[0045] As mentioned above, inconsistencies in the parameters of semiconductor testing equipment often occur after iterative upgrades, which may affect testing time and the accuracy of test results. Therefore, this disclosure provides a testing equipment data processing method. By installing a first client on the operating system of each of multiple testing equipment, the method obtains current parameter information for each testing equipment, including the current first set parameter value. The current first set parameter values ​​of each testing equipment are stored in a first database. Extraction, conversion, and loading tools can then obtain the current first set parameter values ​​and corresponding first set parameter update information from the first database. Based on the first set parameter update information of each testing equipment, multiple target testing equipment are identified from the multiple testing equipment. The current first set parameter values ​​of the multiple target testing equipment are statistically analyzed to obtain statistical results. If the statistical results of the first set parameter values ​​include multiple different current first set parameter values, a first prompt message is sent. This method enables automated monitoring of the parameters of each testing equipment, avoiding the impact of inconsistent testing equipment parameters on testing time and the accuracy of test results.

[0046] Figure 1A An exemplary system architecture is shown that can be applied to the test machine data processing method or test machine data processing apparatus of this disclosure.

[0047] like Figure 1A As shown, the system architecture 10 may include multiple clients connected to the first web service 104, such as first client 1022, second client 1024... Nth client 102, as well as a first database (DB) 106, an extract, transform, and load (ETL) tool 108, and a mail server 110. The first web service 104, the first database 106, the ETL tool 108, and the mail server 110 are sequentially connected via network communication.

[0048] Each client, operating on its corresponding test machine, can communicate with the first network service 104 via the network. Each client can call the first network service 104 to store the current first set parameter value of the corresponding test machine into the first database 106.

[0049] ETL tool 108 can obtain the current first setting parameter value and the corresponding first setting parameter update information of each test machine from the first database 106, and determine multiple target test machines from multiple test machines based on the first setting parameter update information of each test machine.

[0050] ETL tool 108 can also perform statistics on the current first set parameter values ​​of multiple target test equipment to obtain the statistical results of the first set parameter values. If the statistical results of the first set parameter values ​​include multiple different current first set parameter values, a first prompt message is sent through mail server 110.

[0051] Users can access (S1002) the first network service 104 to view multiple parameters of each test machine on the user interface, and can manually upgrade the test software installed on the operating system of each test machine. (Refer to...) Figure 1B and Figure 1C , Figure 1B according to Figure 1A A schematic diagram of a user interface is shown. Figure 1C according to Figure 1A A diagram showing the parameter display interface of a test machine is provided.

[0052] like Figure 1B As shown, Figure 1B The system lists the machine version (current version), target version (latest version), upgrade status, release time, completion time, and number of verification lots (after upgrade) for test software with Tester IDs (CPTA 101 to CPTA 108). Users can quickly view the current test software version number of all machines, click the "Upgrade" button to upgrade the machines, and view the upgrade status and the number of verified lots after the upgrade.

[0053] like Figure 1C As shown, Figure 1C The system displays the status (running status), corresponding machine test temperature (Temp), stage (test site; PRH, PRL, and PRB in the diagram are example site names), probe card information, Lot ID, Product ID, Program, Test Flow, Progress, and Remaining Time (min) for the Tester IDs CPTA 105, CPTA 121, CPTA 112, CPTA 126, CPTA 141, CPTA 129, CPTA 124, CPTA 133, and CPTA 111 in a list format. Users can view the number of tests currently performed and the number of tests remaining in the Progress column, and the remaining time column shows the remaining test time for ongoing tests. Users can monitor the machine's test information in real time through the backend page.

[0054] It should be understood that Figure 1A The number of clients and network services shown is merely illustrative. Depending on implementation needs, any number of clients and network services can be included.

[0055] Figure 2 This is a flowchart illustrating a data processing method for a test equipment according to an exemplary embodiment. Figure 2 The method shown can be applied, for example, to... Figure 1A The various clients in the system.

[0056] refer to Figure 2 The method 20 provided in this embodiment may include the following steps.

[0057] In step S202, for multiple test equipment, the current parameter information of each test equipment is obtained, including the current first set parameter value.

[0058] In some embodiments, the current parameter information may include information on various parameters of the test equipment, such as time, test software version, operating system version, memory size, CPU information, etc. The client can periodically collect various parameters of the equipment it is using.

[0059] In some embodiments, the first set parameter value includes a set temperature, which can be obtained by communicating with the probes of the corresponding test equipment via the General Purpose Interface Bus (GPIB) protocol to obtain the current set temperature of each test equipment.

[0060] In some embodiments, the machine status can be obtained by calling the instructions provided by the tester vendor. For example, with Advan T5833, the fsstat command can be called to obtain machine status information.

[0061] In step S204, the current first setting parameter value of each test machine is stored in the first database to obtain the current first setting parameter value and corresponding first setting parameter update information of each test machine from the first database. Based on the first setting parameter update information of each test machine, multiple target test machines are determined from multiple test machines. The current first setting parameter values ​​of the multiple target test machines are statistically analyzed to obtain the first setting parameter value statistical result. If the first setting parameter value statistical result includes multiple different current first setting parameter values, a first prompt message is sent.

[0062] In some embodiments, the client can report the collected machine parameter information to the server and store the parameter information in a first database.

[0063] In some embodiments, the first setting parameter update information may be information where the first setting parameter value is historical data, or the first setting parameter update information may be information where the first setting parameter value is updated data. This can be achieved by... Figure 1A The first network service 104 obtains the first setting parameter update information based on the current first setting parameter value, that is, it marks the updated parameter item as updated data, and then the ETL tool 106 counts the number of settable values ​​of the parameter item corresponding to the updated data. For detailed implementation, please refer to... Figure 3 , Figure 10 and Figure 11 .

[0064] According to the test equipment data processing method provided in this disclosure embodiment, the parameters of the test equipment can be automatically collected according to the user's needs, the differences of the test equipment parameters can be compared, the equipment with differences can be automatically identified and an alarm can be triggered, and the parameters of each test equipment can be automatically monitored, which can avoid the impact of inconsistent test equipment parameters on the test time and the accuracy of test results.

[0065] Figure 3 This is a flowchart illustrating another test equipment data processing method according to an exemplary embodiment. Figure 3 and Figure 2 The difference is that, Figure 3 This illustrates the interaction between the client, network service, database, and ETL tools. For example... Figure 3 The method shown can be applied, for example, to... Figure 1A The system in the middle.

[0066] refer to Figure 3 The method 30 provided in this embodiment may include the following steps.

[0067] In step S302, the client calls the first network service to store the current first setting parameter values ​​of each test machine into the first database.

[0068] In step S304, the first network service marks the first setting parameter values ​​of each test machine stored in the first database as historical data.

[0069] In some embodiments, after the tester-client has collected the data, it can call a web service. The web service first sets the Flag (is_newest field) of all previous parameter records of the tester to 0 (indicating historical data), then inserts the new parameter information of the tester into the tester_param table, and sets the Flag (is_newest field) of the currently inserted record to 1 (indicating the latest data).

[0070] In step S306, the extraction, conversion and loading tool compares the current first setting parameter value of each test machine with the first setting parameter value of the corresponding test machine stored in the first database. If the comparison result is different, the corresponding first setting parameter update information is information with the first setting parameter value being updated data. If the comparison result is the same, the corresponding first setting parameter update information is information with the first setting parameter value being historical data.

[0071] In step S308, the extraction, conversion and loading tool obtains the test machine with the first set parameter value of the updated data from multiple test machines as the target test machine.

[0072] In some embodiments, the ETL tool first filters out the most recent parameter setting records. For example, in MySQL, the SQL statement is as follows:

[0073] SELECT param_name,param_value,COUNT(*)SettingCount from tester_param

[0074] where is_newest=1GROUP BY param_name,param_value

[0075] In step S310, the extraction, conversion and loading tool performs statistics on the current first set parameter values ​​of multiple target test equipment to obtain the statistical results of the first set parameter values.

[0076] In some embodiments, SQL statements can be used to perform queries and statistics in MySQL. Specific implementation methods can be found in [reference needed]. Figure 10 .

[0077] In step S312, if the statistical results of the first set parameter value include multiple different current first set parameter values, the extraction, conversion and loading tool sends a first prompt message.

[0078] In some embodiments, the setting value of the same parameter should be consistent across all machines in principle. If there are multiple setting values ​​for the same parameter, the ETL tool can issue an alarm through the Mail server.

[0079] According to the method provided in this disclosure, a tester-client tool is deployed on the tester. This tool periodically collects parameter setting information from the testers and calls a web service to store the data in a database. The ETL (Extended Test Layer) periodically analyzes the differences in tester parameter settings and then sends email alerts to testers with anomalies. By summarizing and comparing the tester parameters, it is determined whether there are inconsistencies in the tester parameters, preventing test anomalies caused by incorrect parameter settings.

[0080] Figure 4 This is a flowchart illustrating another test equipment data processing method according to an exemplary embodiment. Figure 4 and Figure 2 The difference is that, Figure 4 Used to automatically upgrade machine testing software. For example... Figure 4 The method shown can be applied, for example, to... Figure 1A The various clients in the system.

[0081] refer to Figure 4 The method 40 provided in this embodiment may include the following steps.

[0082] In step S402, it is determined whether the first test software installed on the operating system of the first test machine needs to be upgraded.

[0083] In some embodiments, the first test station is one of a plurality of test stations. It can determine whether the first test software needs to be upgraded in response to receiving an upgrade command for the first test software.

[0084] For example, the upgrade command for the first test software can be obtained in response to the user clicking the "Upgrade" button on the interactive interface. See the following for details. Figure 1B .

[0085] For example, it is possible to set up a timed update command for the first test software to periodically check for updates and automatically upgrade.

[0086] In some embodiments, the current version number of the first test software installed on the operating system of the first test machine can be obtained through the current parameter information, and it can be automatically upgraded when the current version number is not the latest version number. For specific implementation details, please refer to [reference needed]. Figure 5 .

[0087] In step S4042, if it is determined that the first test software needs to be upgraded, it is determined whether the first test machine is in the test state.

[0088] In some embodiments, after determining that the first test software needs to be upgraded, the latest version of the first test software package can be downloaded first, and then the first test software package can be run to upgrade the first test software when the corresponding machine is idle. For specific implementation details, please refer to [link to implementation details]. Figure 6 .

[0089] In step S4062, if it is determined that the first test machine is not in a test state, the first test software is upgraded.

[0090] In step S4064, if it is determined that the first test machine is in a test state, then wait until the current test is completed before upgrading the first test software.

[0091] In some embodiments, if a test command is received during the upgrade process, the received test command can be cached and executed only after the upgrade is complete. For specific implementation details, please refer to [reference needed]. Figure 7 .

[0092] Due to changes in business needs, it is sometimes necessary to upgrade and update the test software version. However, the equipment cannot be upgraded immediately during the testing process, and can only be upgraded manually after the test is completed.

[0093] According to the method provided in this disclosure, the test software version of the test machine is managed using a web page, and the software is automatically upgraded and updated after the test completion event is automatically monitored through communication with the test software.

[0094] Figure 5 It shows Figure 4 The step S402 shown is a schematic diagram of the processing procedure in one embodiment. (See attached diagram.) Figure 5 As shown in the present embodiment, step S402 may further include the following steps.

[0095] Step S502: Call the second network service to obtain the update version information of the first test software. The update version information of the first test software includes the update version number of the first test software.

[0096] In some embodiments, the second network service may be the same as or different from the first network service.

[0097] In some embodiments, the update version number of the first test software can be the latest version number currently released for the first test software.

[0098] In some embodiments, version information may include a version number, as well as a version download address, the version's MD5 value, an upgrade time limit, and so on.

[0099] In some embodiments, the frequency can be preset, such as every 12 hours, or daily, or weekly, to obtain the updated version information of the first test software so as to check for updates at regular intervals.

[0100] Step S504: Determine whether the current version number of the first test software installed on the operating system of the first test machine is the same as the updated version number of the first test software.

[0101] Step S506: If the current version number of the first test software installed on the operating system of the first test machine is different from the updated version number of the first test software, then it is determined that the first test software installed on the operating system of the first test machine needs to be upgraded.

[0102] In some embodiments, if the current version number of the first test software installed on the operating system of the first test machine is the same as the updated version number of the first test software, then the current version is the latest version, and it is determined that the first test software installed on the operating system of the first test machine does not need to be upgraded, and the process can return to step S502.

[0103] According to the method provided in this disclosure, the software version of the testing equipment can be automatically checked periodically to determine whether an upgrade is needed. Users can also view the software version of each equipment through a web service page and upgrade the software of specific equipment as needed.

[0104] Figure 6 It shows Figure 4 The diagram illustrates steps S402 and S4042 in another embodiment. Figure 6 As shown in the embodiments of this disclosure, steps S402 and S4042 may further include the following steps.

[0105] Step S602: If it is determined that the first test software needs to be upgraded, then download the updated version of the first test software package according to the download address of the updated version of the first test software package.

[0106] In some embodiments, the obtained update version information of the first test software may include the download address of the updated version of the first test package.

[0107] In some embodiments, the updated version of the first test package can be the latest version of the first test package. The latest version of the first test package can be downloaded to the local disk.

[0108] Step S604: Determine whether the first test machine is in the test state.

[0109] In some embodiments, the current test progress and remaining time of the first test corresponding to the first test software can be obtained from the current parameter information.

[0110] In some embodiments, a first instruction corresponding to the first testing software can be invoked to obtain the current test progress and remaining time of the first test, and then the current test progress can be used to determine whether the first testing machine is in a testing state. Taking the testing software Advan T5833 as an example, the fsstat command can be invoked to obtain the current test progress and remaining time of the current test.

[0111] Step S606: If it is determined that the first test machine is not in the test state, then run the downloaded updated version of the first test software package.

[0112] According to the method provided in this disclosure embodiment, when the test software needs to be upgraded, the latest version of the test software can be downloaded to the local machine first, and then the machine status can be monitored. If the machine is in a testing state, the machine continues to wait. When the machine is in an idle (not being tested) state, the upgrade is performed automatically immediately.

[0113] Figure 7 It shows Figure 4 The step S4064 shown is a schematic diagram of the processing procedure in one embodiment. (See attached diagram.) Figure 7 As shown in the present embodiment, step S4064 may further include the following steps.

[0114] Step S702: If it is determined that the first test machine is in the test state, obtain the remaining time of the current test.

[0115] Step S704: After waiting for the remaining time of the current test, receive and cache the test instructions.

[0116] In some embodiments, test instructions sent by the Manufacturing Execution System (MES) during the upgrade process can be cached and executed after the upgrade is completed.

[0117] Step S706: Stop running the first test software and upgrade the first test software.

[0118] In some embodiments, after the upgrade is completed, the upgraded first test software is started, and the cached test instructions are sent to the upgraded first test software for testing.

[0119] According to the method provided in this disclosure, by taking over the MES testing instructions, the sent testing instructions are cached and then resent to the testing software after the testing software is upgraded, thereby realizing the automatic upgrade of the machine-side testing software and preventing the occurrence of missed test instructions during the upgrade process.

[0120] Figure 8 It is based on Figures 4 to 7The diagram illustrates the process of automatically upgrading the machine testing software. Figure 8 As shown, refer to Figures 4 to 7 The automatic upgrade process for machine testing software may include the following steps S802 to S824.

[0121] Step S802, process begins.

[0122] Step S804: Obtain the latest version information of the test software. The test software may be, for example, the first test software; for specific implementation details, please refer to step S502.

[0123] Step S806: Obtain the current version number of the test software on the machine.

[0124] Step S808: Determine if the current version number of the test software on the machine is the same as the latest version number. If they are the same, return to step S804.

[0125] Step S810: If the current version number of the test software on the machine is different from the latest version number, then download the latest version of the test software package.

[0126] Step S812: Unzip the latest version of the test software package.

[0127] Step S814: Wait for the current test to finish (lotend).

[0128] Step S816: Cache the MES test command (i.e., the test command). For specific implementation details, please refer to steps S702 and S704.

[0129] Step S818: Stop the software test and begin the upgrade.

[0130] Step S820: Start the updated test software.

[0131] Step S822: Determine whether the test order is cached. If the test order is not cached, return to step S804.

[0132] Step S824: If the test instruction is cached, the cached test instruction is sent to the updated test software to execute the test instruction.

[0133] Figure 9 This is a flowchart illustrating yet another test equipment data processing method according to an exemplary embodiment. Figure 9 and Figure 2 The difference is, such as Figure 9 The method shown can be applied, for example, to... Figure 1A Tools for extracting, transforming, and loading from the system.

[0134] refer to Figure 9The method 90 provided in this embodiment may include the following steps.

[0135] In step S902, the current first setting parameter value and the corresponding first setting parameter update information of each test machine in the multiple test machines are obtained from the first database.

[0136] In step S904, multiple target test stations are determined from multiple test stations based on the first set parameter update information of each test station.

[0137] In some embodiments, the first setting parameter update information is information where the first setting parameter value is historical data, or information where the first setting parameter value is updated data. The test machine from among multiple test machines whose first setting parameter value is updated data is selected as the target test machine.

[0138] In step S906, the current first set parameter values ​​of multiple target test equipment are statistically analyzed to obtain the statistical results of the first set parameter values.

[0139] In step S908, if the statistical results of the first set parameter value include multiple different current first set parameter values, then a first prompt message is sent.

[0140] Figure 9 For the specific implementation details of each step, please refer to... Figure 1A The details will not be repeated here.

[0141] Figure 10 It is based on Figure 9 The flowchart illustrates another data processing method for a testing machine. For example... Figure 10 The method shown can be applied, for example, to... Figure 1A Tools for extracting, transforming, and loading from the system.

[0142] refer to Figure 10 The method 100 provided in this embodiment may include the following steps.

[0143] In step S1002, the current first setting parameter value and the corresponding first setting parameter update information of each of the multiple first setting parameter names of the multiple test machines are obtained from the first database.

[0144] In step S1004, multiple target test stations are determined from multiple test stations based on the first set parameter update information of each test station.

[0145] In step S1006, the number of current first setting parameter values ​​and the number of target test machines corresponding to the current first setting parameter values ​​are counted according to the names of each first setting parameter.

[0146] In some embodiments, ETL tools can group parameters by parameter name (param_name) and parameter value (param_value), then further group the records by parameter name to calculate the number of distinct values ​​for each parameter. For example, in MySQL, the SQL statement is as follows:

[0147] Select param_name,count(*)SettingCount from (

[0149] SELECT param_name,param_value from tester_param

[0150] where is_newest=1 / / Select the latest parameter setting record

[0151] GROUP BY param_name, param_value / / Grouping

[0152] )as t1

[0153] Group by param_name

[0154] Having count(*)>1 / / Group statistics by parameter name

[0155] In step S1008, if there are multiple current first setting parameter values ​​corresponding to a first setting parameter name, then a first prompt message is sent according to the first setting parameter name. The first prompt message includes the number of target test machines corresponding to different current first setting parameter values.

[0156] In some embodiments, the distribution of the number of machines with set parameter values ​​can be displayed. Figure 11 It is based on Figure 10 This diagram illustrates a distribution of machine tool setting parameter values. For example... Figure 11 As shown, the horizontal axis is grouped according to parameter name and parameter setting value. Parameters A, B, and C each have two setting values. Parameter A has two setting values, A1 and A2; parameter B has two setting values, B1 and B2; and parameter C has two setting values, C1 and C2. The vertical axis represents the number of machines corresponding to each setting value. If the same parameter is set with different values ​​on different machines, the system backend will issue an alarm.

[0157] The test equipment data processing method provided in this disclosure can automatically monitor the equipment parameters and update the test equipment software without the user's awareness, which can reduce a lot of costs for enterprises.

[0158] Figure 12 This is a block diagram illustrating a test machine data processing apparatus according to an exemplary embodiment. Figure 12 The device shown can be applied, for example, to... Figure 1A The various clients in the system.

[0159] refer to Figure 12 The apparatus 120 provided in this embodiment may include an acquisition module 1202 and a storage module 1204.

[0160] The acquisition module 1202 can be used to acquire the current parameter information of each of the multiple test equipments. The current parameter information includes the current first set parameter value.

[0161] The storage module 1204 can be used to store the current first setting parameter value of each test machine into the first database, so as to obtain the current first setting parameter value and the corresponding first setting parameter update information of each test machine from the first database, and determine multiple target test machines from multiple test machines according to the first setting parameter update information of each test machine, perform statistics on the current first setting parameter values ​​of multiple target test machines, obtain the first setting parameter value statistics result, and if the first setting parameter value statistics result includes multiple different current first setting parameter values, then send a first prompt message.

[0162] Figure 13 This is a block diagram illustrating another test equipment data processing apparatus according to an exemplary embodiment. Figure 13 The device shown can be applied, for example, to... Figure 1A The various clients in the system.

[0163] refer to Figure 13 The apparatus 130 provided in this embodiment may include an acquisition module 1302, a storage module 1304, and an upgrade module 1306.

[0164] The acquisition module 1302 can be used to acquire the current parameter information of each of the multiple test equipments, including the current first set parameter value.

[0165] The current parameter information may also include the current test progress and remaining time of the first test corresponding to the first test software.

[0166] The current parameter information may also include the current version number of the first test software installed on the operating system of the first test machine.

[0167] The acquisition module 1302 can also be used to call the first instruction corresponding to the first test software to obtain the current test progress and the remaining time of the current test; and to determine whether the first test machine is in the test state, including: determining whether the first test machine is in the test state based on the current test progress of the first test.

[0168] The acquisition module 1302 can also be used to communicate with the probes of the corresponding test equipment through the general interface bus protocol to obtain the current set temperature of each test equipment.

[0169] The storage module 1304 can be used to store the current first setting parameter value of each test machine into the first database, so as to obtain the current first setting parameter value and the corresponding first setting parameter update information of each test machine from the first database, and determine multiple target test machines from multiple test machines according to the first setting parameter update information of each test machine, perform statistics on the current first setting parameter values ​​of multiple target test machines, obtain the first setting parameter value statistics result, and if the first setting parameter value statistics result includes multiple different current first setting parameter values, then send a first prompt message.

[0170] The first setting parameter update information can be information where the first setting parameter value is historical data, or information where the first setting parameter value is updated data.

[0171] Multiple test stations may include the first test station.

[0172] The first set parameter value includes the current set temperature.

[0173] The storage module 1304 can also be used to call the first network service to store the current first setting parameter value of each test machine into the first database. After the first network service marks the first setting parameter value of each test machine stored in the first database as historical data, it compares the current first setting parameter value of each test machine with the first setting parameter value of the corresponding test machine stored in the first database. If the comparison result is different, the corresponding first setting parameter update information of the test machine is information with the first setting parameter value as updated data. If the comparison result is the same, the corresponding first setting parameter update information of the test machine is information with the first setting parameter value as historical data.

[0174] The upgrade module 1306 can be used to determine whether the first test software installed on the operating system of the first test machine needs to be upgraded; if it is determined that the first test software needs to be upgraded, it determines whether the first test machine is in the test state; if it is determined that the first test machine is not in the test state, it performs the upgrade operation on the first test software.

[0175] The upgrade module 1306 can also be used to respond to receiving an upgrade command for the first test software and determine whether the first test software needs to be upgraded; if it is determined that the first test machine is in a test state, it waits until the current test is completed before performing the upgrade operation on the first test software.

[0176] The upgrade module 1306 can also be used to obtain the remaining time of the current test if it is determined that the first test machine is in the test state; after waiting for the remaining time of the current test, receive and cache test instructions; stop running the first test software and perform an upgrade operation on the first test software; the method also includes: starting the upgraded first test software; and sending the cached test instructions to the upgraded first test software.

[0177] The upgrade module 1306 can also be used to call the second network service to obtain the update version information of the first test software, which includes the update version number of the first test software; determine whether the current version number of the first test software installed on the operating system of the first test machine is the same as the update version number of the first test software; if the current version number of the first test software installed on the operating system of the first test machine is different from the update version number of the first test software, then it is determined that the first test software installed on the operating system of the first test machine needs to be upgraded.

[0178] The updated version information for the first test software may also include the download address for the updated version of the first test software package.

[0179] The upgrade module 1306 can also be used to download the updated version of the first test software package according to the download address of the updated version of the first test software package if it is determined that the first test software needs to be upgraded; determine whether the first test machine is in the test state; and if it is determined that the first test machine is not in the test state, run the downloaded updated version of the first test software package.

[0180] Figure 14 This is a block diagram illustrating another test machine data processing apparatus according to an exemplary embodiment. Figure 14 The device shown can be applied, for example, to... Figure 1A Extraction, conversion, and loading tools within the system.

[0181] refer to Figure 14 The apparatus 140 provided in this embodiment may include an acquisition module 1402, a determination module 1404, a statistics module 1406, and a sending module 1408.

[0182] The acquisition module 1402 can be used to acquire the current first setting parameter value and the corresponding first setting parameter update information of each test machine in multiple test machines from the first database.

[0183] The first setting parameter update information can be information where the first setting parameter value is historical data, or information where the first setting parameter value is updated data.

[0184] The acquisition module 1402 can also be used to acquire from the first database the current first setting parameter value and the corresponding first setting parameter update information corresponding to the multiple first setting parameter names of each test machine in the multiple test machines.

[0185] The determination module 1404 can be used to determine multiple target test stations from multiple test stations based on the first set parameter update information of each test station.

[0186] The determination module 1404 can also be used to identify the test machine with the first set parameter value of the update data among multiple test machines as the target test machine.

[0187] The statistics module 1406 can be used to perform statistics on the current first set parameter values ​​of multiple target test equipment to obtain the statistical results of the first set parameter values.

[0188] The statistics module 1406 can also be used to count the number of current first set parameter values ​​and the number of target test machines corresponding to the current first set parameter values ​​according to the names of each first set parameter; if the statistics result of the first set parameter values ​​includes multiple different current first set parameter values.

[0189] The sending module 1408 can be used to send a first prompt message if the statistical result of the first set parameter value includes multiple different current first set parameter values.

[0190] The sending module 1408 can also be used to send a first prompt message according to the first setting parameter name if there are multiple current first setting parameter values ​​corresponding to a first setting parameter name. The first prompt message includes the number of target test machines corresponding to different current first setting parameter values.

[0191] The specific implementation of each module in the device provided in this embodiment can be referred to the content of the above method, and will not be repeated here.

[0192] Figure 15 A schematic diagram of the structure of an electronic device according to an embodiment of this disclosure is shown. It should be noted that... Figure 15 The devices shown are merely examples of computer systems and should not be construed as limiting the functionality and scope of use of the embodiments disclosed herein.

[0193] like Figure 15As shown, device 1500 includes a central processing unit (CPU) 1501, which can perform various appropriate actions and processes according to a program stored in read-only memory (ROM) 1502 or a program loaded from storage section 1508 into random access memory (RAM) 1503. The RAM 1503 also stores various programs and data required for the operation of device 1500. CPU 1501, ROM 1502, and RAM 1503 are interconnected via bus 1504. Input / output (I / O) interface 1505 is also connected to bus 1504.

[0194] The following components are connected to I / O interface 1505: an input section 1506 including a keyboard, mouse, etc.; an output section 1507 including a cathode ray tube (CRT), liquid crystal display (LCD), etc., and speakers, etc.; a storage section 1508 including a hard disk, etc.; and a communication section 1509 including a network interface card such as a LAN card, modem, etc. The communication section 1509 performs communication processing via a network such as the Internet. A drive 1510 is also connected to I / O interface 1505 as needed. Removable media 1511, such as a disk, optical disk, magneto-optical disk, semiconductor memory, etc., are installed on drive 1510 as needed so that computer programs read from them can be installed into storage section 1508 as needed.

[0195] In particular, according to embodiments of this disclosure, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments of this disclosure include a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via communication section 1509, and / or installed from removable medium 1511. When the computer program is executed by central processing unit (CPU) 1501, it performs the functions defined above in the system of this disclosure.

[0196] It should be noted that the computer-readable medium disclosed herein may be a computer-readable signal medium or a computer-readable storage medium, or any combination thereof. A computer-readable storage medium may be, for example,—but not limited to—an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of a computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this disclosure, a computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, apparatus, or device. In this disclosure, a computer-readable signal medium may include a data signal propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such propagated data signals may take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. Computer-readable signal media can also be any computer-readable medium other than computer-readable storage media, which can send, propagate, or transmit a program for use by or in connection with an instruction execution system, apparatus, or device. The program code contained on the computer-readable medium can be transmitted using any suitable medium, including but not limited to: wireless, wire, optical fiber, RF, etc., or any suitable combination thereof.

[0197] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of this disclosure. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of code containing one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those indicated in the drawings. For example, two consecutively indicated blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in a block diagram or flowchart, and combinations of blocks in a block diagram or flowchart, may be implemented using a dedicated hardware-based system that performs the specified function or operation, or using a combination of dedicated hardware and computer instructions.

[0198] The modules described in the embodiments of this disclosure can be implemented in software or hardware. The described modules can also be housed in a processor; for example, a processor may be described as including a data acquisition module and a storage module. The names of these modules do not necessarily limit the module itself; for example, an acquisition module may also be described as "a module that acquires parameter information of the test equipment".

[0199] In another aspect, this disclosure also provides a computer-readable medium, which may be included in the device described in the above embodiments; or it may exist independently and not assembled into the device. The computer-readable medium carries one or more programs, which, when executed by the device, cause the device to include:

[0200] For multiple test stations, the current parameter information of each test station is obtained, including the current first set parameter value; the current first set parameter value of each test station is stored in the first database, so as to obtain the current first set parameter value and the corresponding first set parameter update information of each test station from the first database, and multiple target test stations are determined from the multiple test stations according to the first set parameter update information of each test station, and the current first set parameter values ​​of the multiple target test stations are statistically analyzed to obtain the first set parameter value statistical result. If the first set parameter value statistical result includes multiple different current first set parameter values, then a first prompt message is sent.

[0201] Exemplary embodiments of this disclosure have been specifically shown and described above. It should be understood that this disclosure is not limited to the detailed structures, arrangements, or implementations described herein; rather, this disclosure is intended to cover various modifications and equivalent arrangements contained within the spirit and scope of the appended claims.

Claims

1. A method for processing test machine data, characterized in that, Executed by a first client, which is installed on the operating system of each of the multiple test machines, the method includes: For multiple test equipment, obtain the current parameter information of each test equipment, wherein the current parameter information includes the current first set parameter value; The current first setting parameter value of each test machine is stored in the first database to obtain the current first setting parameter value and the corresponding first setting parameter update information of each test machine from the first database. Based on the first setting parameter update information of each test machine, multiple target test machines are determined from the multiple test machines. The current first setting parameter values ​​of the multiple target test machines are statistically analyzed to obtain the first setting parameter value statistical result. If the first setting parameter value statistical result includes multiple different current first setting parameter values, a first prompt message is sent. Wherein, the first setting parameter update information is information where the first setting parameter value is historical data, or the first setting parameter update information is information where the first setting parameter value is updated data; The current first setting parameter values ​​of each test instrument are stored in the first database to obtain the current first setting parameter values ​​of each test instrument and the corresponding first setting parameter update information from the first database, including: The first network service is invoked to store the current first setting parameter value of each test machine into the first database. After the first network service marks the first setting parameter value of each test machine stored in the first database as historical data, it compares the current first setting parameter value of each test machine with the first setting parameter value of the corresponding test machine stored in the first database. If the comparison result is different, the corresponding first setting parameter update information of the test machine is information with the first setting parameter value as updated data. If the comparison result is the same, the corresponding first setting parameter update information of the test machine is information with the first setting parameter value as historical data. Based on the first set parameter update information of each test station, multiple target test stations are determined from the plurality of test stations, including: The test machine whose first set parameter value is the updated data among the plurality of test machines is the target test machine.

2. The method according to claim 1, characterized in that, The plurality of test equipment includes a first test equipment; The method further includes: Determine whether the first test software installed on the operating system of the first test machine needs to be upgraded; If it is determined that the first test software needs to be upgraded, determine whether the first test machine is in a test state; If it is determined that the first test machine is not in a testing state, then the first test software will be upgraded.

3. The method according to claim 2, characterized in that, Determine whether the first test software installed on the operating system of the first test machine needs to be upgraded, including: In response to receiving an upgrade instruction for the first test software, determine whether the first test software needs to be upgraded; The method further includes: If the first test machine is determined to be in a testing state, then wait until the current test is completed before upgrading the first test software.

4. The method according to claim 3, characterized in that, If the first test machine is determined to be in a testing state, then wait until the current test is completed before performing an upgrade operation on the first test software, including: If it is determined that the first test machine is in a testing state, the remaining time of the current test is obtained; After waiting for the remaining time of the current test, receive and cache the test instructions; Stop running the first test software and upgrade the first test software; The method further includes: Start the first test software after the upgrade; Send the cached test commands to the upgraded first test software.

5. The method according to claim 4, characterized in that, The current parameter information also includes the current test progress of the first test corresponding to the first test software and the remaining time of the current test; Obtain the current parameter information of each test machine, including: The first instruction corresponding to the first test software is invoked to obtain the current test progress and the remaining time of the current test. Determining whether the first test machine is in a testing state includes: Determine whether the first test machine is in a testing state based on the current test progress of the first test.

6. The method according to claim 2, characterized in that, The current parameter information also includes the current version number of the first test software installed on the operating system of the first test machine; Determine whether the first test software installed on the operating system of the first test machine needs to be upgraded, including: The update version information of the first test software is obtained by calling the second network service, and the update version information of the first test software includes the update version number of the first test software; Determine whether the current version number of the first test software installed on the operating system of the first test machine is the same as the updated version number of the first test software; If the current version number of the first test software installed on the operating system of the first test machine is different from the updated version number of the first test software, then it is determined that the first test software installed on the operating system of the first test machine needs to be upgraded.

7. The method according to claim 2, characterized in that, The update version information of the first test software also includes the download address of the updated version of the first test software package; If it is determined that the first test software needs to be upgraded, determine whether the first test machine is in a testing state, including: If it is determined that the first test software needs to be upgraded, then download the updated version of the first test software package according to the download address of the updated version of the first test software package; Determine whether the first test machine is in a testing state; If it is determined that the first testing machine is not in a testing state, then the first testing software is upgraded, including: If it is determined that the first test machine is not in a testing state, then the downloaded updated version of the first test software package is run.

8. The method according to claim 1, characterized in that, The current first set parameter value includes the current set temperature; Obtain the current parameter information of each test machine, including: The system communicates with the probes of the corresponding test equipment via a universal interface bus protocol to obtain the current set temperature of each test equipment.

9. A method for processing test machine data, characterized in that, Performed by extraction, transformation, and loading tools, including: Retrieve the current first setting parameter value and the corresponding first setting parameter update information of each test machine in the first database; Multiple target test stations are determined from the plurality of test stations based on the first set parameter update information of each test station; The current first set parameter values ​​of multiple target test equipment are statistically analyzed to obtain the statistical results of the first set parameter values; If the statistical results of the first set parameter value include multiple different current first set parameter values, then a first prompt message is sent.

10. The method according to claim 9, characterized in that, The first setting parameter update information is information where the first setting parameter value is historical data, or the first setting parameter update information is information where the first setting parameter value is updated data; Based on the first set parameter update information of each test station, multiple target test stations are determined from the plurality of test stations, including: The test machine whose first set parameter value is the updated data among the plurality of test machines is the target test machine.

11. The method according to claim 9, characterized in that, Retrieve the current first setting parameter values ​​and corresponding first setting parameter update information for each test machine from multiple test machines in the first database, including: Retrieve from the first database the current first setting parameter values ​​and corresponding first setting parameter update information for each of the multiple first setting parameter names of each test machine in the multiple test machines; The current first set parameter values ​​of multiple target testing machines are statistically analyzed to obtain the statistical results of the first set parameter values, including: Count the number of current first setting parameter values ​​and the number of target test machines corresponding to each current first setting parameter value according to the name of each first setting parameter; If the statistical results of the first set parameter value include multiple different current first set parameter values, then a first prompt message is sent, including: If there are multiple current first setting parameter values ​​corresponding to a first setting parameter name, then the first prompt information is sent according to the first setting parameter name. The first prompt information includes the number of target test machines corresponding to different current first setting parameter values.

12. A data processing device for a testing machine, characterized in that, Executed by a first client, which is installed on the operating system of each of the multiple test machines, the device includes: The acquisition module is used to acquire the current parameter information of each of the multiple test machines, wherein the current parameter information includes the current first set parameter value; The storage module is used to store the current first setting parameter values ​​of each test machine into a first database, so as to obtain the current first setting parameter values ​​and corresponding first setting parameter update information of each test machine from the first database, and determine multiple target test machines from the multiple test machines according to the first setting parameter update information of each test machine, perform statistics on the current first setting parameter values ​​of the multiple target test machines, obtain the first setting parameter value statistics result, and if the first setting parameter value statistics result includes multiple different current first setting parameter values, then send a first prompt message.

13. An electronic device, comprising: A memory, a processor, and executable instructions stored in the memory and executable in the processor, characterized in that the processor, when executing the executable instructions, implements the method as described in any one of claims 1-8 or 9-11.

14. A computer-readable storage medium having computer-executable instructions stored thereon, characterized in that, When the executable instructions are executed by the processor, they implement the method as described in any one of claims 1-8 or 9-11.

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