Power device electric stress impact circuit, control method and multi-station circuit

Abstract

The application provides a power device electric stress impact circuit, a control method and a multi-station circuit, and the power device electric stress impact circuit comprises a driving circuit, a charging circuit, a current source circuit, an energy storage circuit, a load circuit and a voltage measurement circuit. Through the power device electric stress impact circuit of the embodiment of the application, the charging circuit charges the energy storage circuit, stores electric energy, and the load circuit forms an electric stress impact pulse current between the source and the drain of the measured device in the conduction process under the action of the energy storage circuit, realizes the overlap of the voltage and the current when the power device is turned on, simulates the real turn-on and off state of the power device, excites the real current collapse effect characteristics of the power device, so as to accurately obtain the dynamic characteristics of the power device in actual application, thereby accurately evaluating the turn-on characteristics of the device.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of power electronics, in particular to a power device electric stress impact circuit, a control method and a multi-station circuit. BACKGROUND

[0002] Gallium nitride power devices are a new type of semiconductor material, which has a large band gap, a high breakdown field, a high electron saturation drift velocity, a small dielectric constant and good chemical stability, and other unique characteristics, and has greater output power and better frequency characteristics. Gallium nitride is widely used, as a key core device supporting the construction of "new infrastructure", its downstream applications hit the main fields of 5G base stations, extra-high voltage, new energy charging piles, intercity high-speed rail and other fields in "new infrastructure". With the increasing demand for gallium nitride in different fields, the electrical property testing of gallium nitride is very important. The electrical property testing of gallium nitride currently mainly includes static DC parameters, dynamic resistance and dynamic threshold voltage parameters. Regarding dynamic resistance measurement, in gallium nitride devices, the current collapse effect caused by electron capture or release can be considered as a transient phenomenon, which can be compensated by reducing current consumption after applying high voltage.

[0003] Because the current collapse effect limits the performance and reliability of gallium nitride devices in actual applications, researchers pay great attention to it. Therefore, how to more accurately obtain the dynamic characteristics of gallium nitride power devices in actual applications in order to accurately evaluate the on-state characteristics of the devices is a technical problem to be solved. SUMMARY

[0004] Therefore, the embodiments of the present application provide a power device electric stress impact circuit, a control method and a multi-station circuit to more accurately obtain the dynamic characteristics of power devices in actual applications; the multi-station circuit solves the multi-station testing problem in large-scale mass production testing process, and realizes efficient and economical evaluation of the current collapse effect of power devices.

[0005] According to a first aspect, embodiments of the present application provide a power device electrical stress impact circuit, comprising: a driving circuit, a charging circuit, a current source circuit, an energy storage circuit, a load circuit and a voltage measurement circuit; the driving circuit is connected between a source electrode and a gate electrode of a measured power device, for driving the measured power device to turn on or off; the charging circuit and the current source circuit are connected in parallel to the source electrode and the drain electrode of the measured power device, respectively, for providing voltage and current between the source electrode and the drain electrode of the measured power device, respectively; the energy storage circuit is connected in parallel to the charging circuit, for storing electrical energy; the load circuit is connected between the charging circuit and the drain electrode, for forming an electrical stress impact pulse current between the source electrode and the drain electrode of the measured power device in a conduction process under the action of the energy storage circuit; the voltage measurement circuit is connected in parallel to the source electrode and the drain electrode of the measured power device, for measuring the voltage between the source electrode and the drain electrode of the measured power device.

[0006] Optionally, the load circuit comprises an inductive circuit.

[0007] Optionally, the load circuit further comprises a resistance connected in parallel to the inductive circuit; the inductive circuit comprises a first control switch and a first inductor.

[0008] Optionally, the inductive circuit comprises a plurality of first inductors connected in series or in parallel.

[0009] Optionally, the energy storage circuit comprises a first capacitor.

[0010] Optionally, the energy storage circuit comprises a plurality of first capacitors connected in series or in parallel.

[0011] Optionally, the energy storage circuit further comprises a second control switch connected in series to the first capacitor.

[0012] Optionally, the capacity of the first capacitor is adapted to the characteristics of the measured power device.

[0013] Optionally, a third control switch is connected in series between the charging circuit and the load circuit; the charging circuit comprises a voltage source and a current limiting circuit connected in series, or a voltage source with current clamping function, or a current source with voltage clamping function.

[0014] According to a second aspect, embodiments of the present application provide a circuit control method, applied to the power device electrical stress impact circuit of the first aspect or any of the embodiments of the first aspect, comprising: controlling the driving circuit and the current source circuit to be disconnected, and controlling the charging circuit to be turned on for a first preset time length; controlling the driving circuit and the load circuit to be connected, and the pre-stored electrical energy of the energy storage circuit charges the load circuit, so that the current flowing through the load circuit overlaps with the voltage between the source and the drain of the measured power device, so that the measured power device forms an electrical stress impact pulse current between the source and the drain in the conduction process; after a second preset time length, the load current is controlled to be disconnected, and the driving circuit and the current source circuit are controlled to be connected, and the real-time current and real-time voltage between the source and the drain of the measured power device are measured.

[0015] Optionally, before the step of controlling the driving circuit and the load circuit to be connected, the method further comprises: controlling the driving circuit and the current source circuit to be connected for a third preset time length, and measuring the first voltage and the first current between the source and the drain of the measured power device; and obtaining the first dynamic resistance of the measured power device according to the first voltage and the first current.

[0016] Optionally, the method further comprises: obtaining the second dynamic resistance of the measured power device according to the real-time voltage and the real-time current; and determining whether the measured power device is qualified according to the first dynamic resistance and the second dynamic resistance.

[0017] According to a third aspect, embodiments of the present application provide a multi-station power device electrical stress impact circuit, comprising: a plurality of power device electrical stress impact circuits connected in parallel to both ends of a charging circuit, each of the power device electrical stress impact circuits corresponding to applying electrical stress impact to a measured power device; the power device electrical stress impact circuit comprises a driving circuit, a current source circuit, an energy storage circuit, a load circuit and a voltage measurement circuit; the driving circuit is connected between the source and the gate of the measured power device, and is used to drive the conduction or disconnection of the measured power device; the charging circuit and the current source circuit are connected in parallel to the source and the drain of the measured power device, respectively, and are used to provide voltage and current between the source and the drain of the measured power device, respectively; the energy storage circuit is connected in parallel to both ends of the charging circuit, and is used to store electrical energy; the load circuit is connected between the charging circuit and the drain of the measured power device, and is used to form an electrical stress impact pulse current between the source and the drain of the measured power device in the conduction process under the action of the energy storage circuit; and the voltage measurement circuit is connected in parallel to the source and the drain of the measured power device, and is used to measure the voltage between the source and the drain of the measured power device.

[0018] According to a fourth aspect, the embodiments of the present application provide a multi-station power device electrical stress impact circuit, comprising a plurality of power device electrical stress impact circuits as described in the first aspect or any of the embodiments of the first aspect, and the plurality of power device electrical stress impact circuits are arranged on the same circuit board.

[0019] The technical scheme of the embodiments of the present application has at least the following advantages:

[0020] 1. The power device electrical stress impact circuit of the embodiments of the present application, the drive circuit is connected between the source and the gate of the measured power device, and is used to drive the turn-on or turn-off of the measured power device; the charging circuit and the current source circuit are respectively connected in parallel to the source and the drain of the measured power device, and are used to respectively provide voltage and current between the source and the drain of the measured power device; the energy storage circuit is connected in parallel to the charging circuit, and is used to store electrical energy; the load circuit is connected between the charging circuit and the drain of the measured power device, and is used to form an electrical stress impact pulse current between the source and the drain of the measured power device in the conduction process under the action of the energy storage circuit; and the voltage measurement circuit is connected in parallel to the source and the drain of the measured power device, and is used to measure the voltage between the source and the drain of the measured power device. Through the power device electrical stress impact circuit of the embodiments of the present application, the charging circuit charges the energy storage circuit, stores electrical energy, and the load circuit forms an electrical stress impact pulse current between the source and the drain of the measured power device in the conduction process under the action of the energy storage circuit, so as to realize the overlap of voltage and current when the power device is turned on, simulate the real turn-on and turn-off state of the power device, excite the real current collapse effect characteristics of the power device, and accurately obtain the dynamic characteristics of the power device in actual application, so as to accurately evaluate the turn-on characteristics of the device.

[0021] 2. The circuit control method provided by the embodiments of the present application comprises the following steps: controlling the drive circuit and the current source circuit to be turned off, and controlling the charging circuit to be turned on for a first preset time length; controlling the drive circuit and the load circuit to be turned on, and controlling the energy storage circuit to store electrical energy for the load circuit, so as to make the stored current of the load circuit overlap with the high voltage between the source and the drain of the measured power device, and form an electrical stress impact pulse current between the source and the drain of the measured power device in the conduction process; after a second preset time length, controlling the load circuit to be turned off, and controlling the drive circuit and the current source circuit to be turned on, so as to measure the real-time current and the real-time voltage between the source and the drain of the measured power device. Through the circuit control method of the embodiments of the present application, the charging circuit charges the energy storage circuit, stores electrical energy, and the load circuit forms an electrical stress impact pulse current between the source and the drain of the measured power device in the conduction process under the action of the energy storage circuit, so as to realize the overlap of voltage and current when the power device is turned on, simulate the real turn-on and turn-off state of the power device, excite the real current collapse effect characteristics of the power device, and accurately obtain the dynamic characteristics of the power device in actual application, so as to accurately evaluate the turn-on characteristics of the device.

[0022] 3. The embodiment of the present application provides a multi-station power device electrical stress impact circuit, comprising a plurality of power device electrical stress impact circuits connected in parallel to both ends of a charging circuit, each of the power device electrical stress impact circuits corresponding to applying electrical stress impact to a measured power device; the power device electrical stress impact circuit comprises a driving circuit, a current source circuit, an energy storage circuit, a load circuit and a voltage measurement circuit; the driving circuit is connected between the source electrode and the gate electrode of the measured power device, and is used for driving the measured power device to turn on or turn off; the charging circuit and the current source circuit are connected in parallel to the source electrode and the drain electrode of the measured power device respectively, and are used for providing voltage and current between the source electrode and the drain electrode of the measured power device respectively; the energy storage circuit is connected in parallel to both ends of the charging circuit, and is used for storing electrical energy; the load circuit is connected between the charging circuit and the drain electrode, and is used for forming an electrical stress impact pulse current between the source electrode and the drain electrode of the measured power device in the conduction process under the action of the energy storage circuit; the voltage measurement circuit is connected in parallel to the source electrode and the drain electrode of the measured power device, and is used for measuring the voltage between the source electrode and the drain electrode of the measured power device. The multi-station power device electrical stress impact circuit of the embodiment of the present application can realize one-station multi-station measurement, improve the circuit test efficiency, and save the cost.

[0023] 4. The embodiment of the present application provides a multi-station power device electrical stress impact circuit, comprising a plurality of power device electrical stress impact circuits, and the plurality of power device electrical stress impact circuits are arranged on the same circuit board, so that the circuit test efficiency is improved, and the cost is saved. BRIEF DESCRIPTION OF DRAWINGS

[0024] In order to more clearly illustrate the specific embodiments of the present application or the technical solutions in the prior art, the following will briefly introduce the drawings needed to be used in the specific embodiments or the prior art description. Obviously, the drawings in the following description are some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0025] Figure 1 It is a circuit schematic diagram of the power device electrical stress impact circuit according to the embodiment of the present application;

[0026] Figure 2 It is a schematic diagram of the circuit control method according to the embodiment of the present application;

[0027] Figure 3 It is a double-pulse timing diagram of the circuit control method according to the embodiment of the present application;

[0028] Figure 4 It is a schematic diagram of the electrical stress impact pulse current according to the embodiment of the present application;

[0029] Figure 5 A multi-pulse timing diagram for the circuit control method according to an embodiment of the present application;

[0030] Reference numerals: 11 - driving circuit, 12 - charging circuit, 13 - current source circuit, 14 - energy storage circuit, 15 - load circuit, 16 - voltage measurement circuit. DETAILED DESCRIPTION

[0031] The technical solutions of the present application will be described clearly and completely below in conjunction with the drawings. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0032] In the description of the present application, it should be noted that the terms "first", "second", "third" are only for the purpose of description, and cannot be understood as indicating or implying relative importance.

[0033] In the description of the present application, it should be noted that, unless otherwise explicitly specified and limited, the terms "connected", "connected" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or integrally connected; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0034] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0035] Embodiment 1

[0036] The embodiments of the present application provide a power device electric stress impact circuit, as shown in the figure, which comprises a driving circuit 11, a charging circuit 12, a current source circuit 13, an energy storage circuit 14, a load circuit 15 and a voltage measurement circuit 16. Figure 1

[0037] Specifically, the driving circuit 11 is connected between the source and the gate of the measured power device, for driving the measured power device to turn on or off. The measured power device here can be a gallium nitride power device. In combination with the Figure 1 ​As shown, the drive circuit 11 may include a control switch K0 and a driver. The charging circuit 12 is connected in parallel across the source and drain of the power device under test. When the power device under test is turned on, the charging circuit 12 provides voltage between the source and drain of the power device under test, and also supplies power to the energy storage circuit 14 connected in parallel, so that the energy storage circuit 14 can store electrical energy. The current source circuit 13 is connected in parallel across the source and drain of the power device under test, and can provide current between the source and drain of the power device under test. The load circuit 15 is connected between the charging circuit and the drain of the power device under test. Under the action of the energy storage circuit 14, the load circuit 15 can cause the power device under test to generate an electrical stress impact pulse current between the source and drain during the turn-on process, thereby more accurately simulating the dynamic characteristics of the power device under test from turn-on to turn-off. When the current source circuit 13 is turned on, the voltage measurement circuit 16 connected in parallel across the source and drain terminals of the power device under test measures the voltage between the source and drain terminals of the power device under test, which facilitates the evaluation of the dynamic characteristics of the power device under test.

[0038] In the power device electrical stress impact circuit of this embodiment, the charging circuit 12 charges the energy storage circuit 14 to store electrical energy. Under the action of the energy storage circuit 14, the load circuit 15 causes the device under test to generate an electrical stress impact pulse current between the source and drain during the conduction process. This achieves voltage and current overlap when the power device is turned on, simulating the actual on and off states of the power device and stimulating the actual current collapse effect characteristics of the power device. This allows for accurate acquisition of the dynamic characteristics of the power device in practical applications, thereby accurately evaluating the device's conduction characteristics. This conduction characteristic can be the on-resistance of the power device under test, the on-voltage drop, the difference between multiple measurements of on-resistance or on-voltage drop, or other calculated results.

[0039] In some alternative implementations, the charging circuit 12 and the load circuit 15 are connected in series via a third control switch K1, thereby facilitating the control of the charging circuit 12's on or off state. The charging circuit 12 can be a voltage source and a current limiting circuit connected in series, or it can be a voltage source with current clamping function, or it can be a current source with voltage clamping function; this embodiment is not limited to these.

[0040] In some alternative implementations, the current source circuit 13 includes an isolating switch circuit and a freewheeling circuit. For example... Figure 1As shown, the series connection of diode D1 and control switch K3 constitutes an isolation switch circuit, and the series connection of current source, inductor L2, control switch K4 and diode D2 constitutes a freewheeling circuit. The purpose of the isolation switch circuit is to control the on or off between the freewheeling circuit and the source and drain of the measured power device when the driving circuit is on. The isolation switch circuit can have various forms, and the embodiment is not limited in this regard. The purpose of the freewheeling circuit is to charge the inductor L2, so that the inductor L2 provides a supplemental current for the source and drain of the measured power device when the source and drain of the measured power device are on, and the current loop between the source and drain of the measured power device can be quickly established. The freewheeling circuit can also have various forms, and the embodiment is not limited in this regard.

[0041] In some optional implementations, the energy storage circuit 14 is a first capacitor C1, or a plurality of first capacitors C1 can be connected in parallel or in series according to actual circuit requirements, and the embodiment is not limited in this regard. In another optional implementation, the energy storage circuit can also be constituted by the series connection of a second control switch K5 and a first capacitor C1.

[0042] The capacity of the first capacitor C1 can be adapted to the characteristics of the measured power device, that is, the capacity of the first capacitor C1 can be selected according to the dynamic resistance of the measured power device, so that the subsequent dynamic resistance measurement is more accurate.

[0043] In some optional implementations, the load circuit 15 includes an inductor circuit. For example, the load circuit 15 can be a first inductor, or a plurality of first inductors connected in series or in parallel, or can include an inductor circuit and a resistor connected in parallel with the inductor circuit. As shown, Figure 1 As shown, the inductor circuit includes a resistor R1, a first inductor L1 connected in parallel with the resistor R1, and a first control switch K2. After the energy storage circuit is charged, the energy storage circuit can release energy to the first inductor L1. When the first control switch K2 is closed, the first inductor L1 can form an electric stress impact pulse current between the source and drain of the measured power device when the source and drain of the measured power device are on, so as to more realistically simulate the state of the power device from on to off in actual application, and excite the real current collapse effect characteristics of the power device. It can be understood that the above examples of the load circuit 15 are only for illustrating the technical solutions of the embodiments, and the embodiments are not limited in this regard.

[0044] In other implementations, the load circuit 15 can also form an electric stress impact pulse current between the source and drain of the measured power device under the action of the energy storage circuit 14 in other states, and the embodiment is not limited in this regard.

[0045] In some optional implementations, the voltage measurement circuit 16 is configured to collect the voltage value between the drain and the source of the power device under test when the power device under test is turned on. In other implementations, the voltage measurement circuit 16 can include a voltage measurement device and a clamping circuit, where the voltage measurement device and the clamping circuit are connected in series, and the clamping circuit is configured to clamp the high voltage of the drain of the power device under test, for example, the clamping circuit can be an attenuator. The voltage measurement device can be a voltmeter, for example.

[0046] In some optional implementations, the power device electric stress impact circuit of the embodiment of the present application further includes a control module, which can be configured to time control the respective control switches in the impact circuit, and can also be configured to realize synchronous control of the closing or opening of the respective control switches. The control module can be an FPGA, an MCU, or the like, and the embodiment is not limited in this regard.

[0047] Through the power device electric stress impact circuit of the embodiment of the present application, the charging circuit 12 charges the storage circuit 14 to store electric energy, and the load circuit 15 causes the power device under test to form an electric stress impact pulse current between the source and the drain when the power device under test is turned on under the action of the storage circuit 14, so as to realize the overlap of the voltage and the current when the power device is turned on, simulate the real turn-on and turn-off states of the power device, excite the real current collapse effect characteristics of the power device, and thus accurately obtain the dynamic characteristics of the power device in actual application, so as to accurately evaluate the turn-on characteristics of the device.

[0048] Embodiment 2

[0049] In order to more clearly illustrate the control process of the power device electric stress impact circuit of the embodiment of the present application, the embodiment of the present application provides a circuit control method, which is applied to the impact circuit in Embodiment 1 described above. As shown in Figure 2 The method includes the following steps:

[0050] Step S201: control the driving circuit and the current source circuit to be disconnected, and control the charging circuit to be turned on for a first preset time length;

[0051] In some optional implementations, before the step, the method further includes: controlling the driving circuit and the current source circuit to be connected for a third preset time length, and measuring the first voltage and the first current between the source and the drain of the power device under test; and obtaining the first dynamic resistance Ron1 of the power device under test according to the first voltage and the first current.

[0052] Step S202: control the driving circuit and the load circuit to be connected, and control the storage circuit to store the pre-stored electric energy for the load circuit, so as to cause the current flowing through the load circuit to overlap with the voltage between the source and the drain of the power device under test, and cause the power device under test to form an electric stress impact pulse current between the source and the drain when the power device under test is turned on;

[0053] Step 203: After the second preset time duration, the load current is turned off, the drive circuit and the current source circuit are turned on, and the real-time current and real-time voltage between the source and the drain of the measured power device are measured.

[0054] According to the real-time voltage and real-time current, the second dynamic resistance Ron2 of the measured power device can be calculated. According to the first dynamic resistance Ron1 and the second dynamic resistance Ron2, the conduction characteristics of the measured power device can be evaluated. Since the measured power device forms an electric stress impact pulse current between the source and the drain in the conduction process in step S202, the real state of the device conduction and turn-off can be simulated, and the real current collapse effect characteristics of the measured power device can be excited. Therefore, the dynamic resistance of the measured power device measured by the method is more accurate, and the conduction characteristic evaluation is also more accurate.

[0055] As shown in the timing diagram, the combination is as follows: Figure 3

[0056] In the test preparation stage: K4 is closed, and the current source charges the inductor L2;

[0057] In the first test stage: at time t0, K3 is closed, the gate of the enhancement mode power device is applied with a positive voltage of 30V, the device is turned on, the current source applies a current to the source and the drain of the measured power device, and the inductor L2 provides a supplemental current to the measured power device, which lasts until time t1 (such as a duration of 100us). The voltage measurement circuit measures the voltage between the source and the drain of the measured power device, and the dynamic resistance Ron1 is calculated by the current source current and the measured voltage;

[0058] In the second test stage: at time t1, K0 and K3 are opened, K1 and K5 are closed, the charging circuit 12 applies a voltage to the measured power device, and at the same time, charges the capacitor C1. After a period of time, at time t2, K0 and K2 are closed, the measured power device is turned on, and the inductor L1 stores a current that forms an electric stress impact pulse current between the source and the drain of the measured power device in the conduction process, as shown in Figure 4 , which simulates the real state of the device switching on and off;

[0059] In the third test stage: at time t3, K2 is opened, K0 is closed, K3 is closed, and K4 is opened. The current source applies a current to the source and the drain of the measured power device, and the inductor L2 provides a supplemental current to the measured power device, which lasts until time t4 (such as a duration of 100us). The voltage measurement circuit measures the voltage between the source and the drain of the measured power device, and the dynamic resistance Ron2 is calculated by the current source current and the measured voltage. According to whether the ratio of Ron2 / Ron1 is within a preset threshold range, it is determined whether the measured gallium nitride power device is qualified. ​

[0060] It should be noted that the circuit control method of the embodiment can be applied not only to the enhancement mode power device but also to the depletion mode power device, and the embodiment of the application is not limited in this way.

[0061] In addition, the embodiment of the application provides double-pulse timing control, and the circuit control method of the embodiment can also use multi-pulse timing control, for example, 4-pulse, 6-pulse, etc. The multi-pulse timing control is a repeated execution of the double-pulse timing control, as shown in the following figure, and the embodiment will not be described again. Figure 5

[0062] By using the circuit control method of the embodiment of the application, the charging circuit is controlled to charge the energy storage circuit, the electrical energy is stored, and the load circuit causes the measured device to form the electrical stress impact pulse current between the source and the drain in the conduction process under the action of the energy storage circuit, so that the voltage and the current overlap when the power device is turned on, the real turn-on and turn-off states of the power device are simulated, the real current collapse effect characteristics of the power device are excited, the dynamic characteristics of the power device in actual application are accurately obtained, and thus the turn-on characteristics of the device are accurately evaluated.

[0063] Embodiment 3

[0064] The embodiment of the application provides a multi-station power device electrical stress impact circuit, which comprises a plurality of power device electrical stress impact circuits connected in parallel to both ends of a charging circuit 12, each of the power device electrical stress impact circuits being used to apply electrical stress impact to a measured power device.

[0065] The power device electrical stress impact circuit comprises a driving circuit 11, a current source circuit 13, an energy storage circuit 14, a load circuit 15, and a voltage measurement circuit 16.

[0066] The driving circuit 11 is connected between the source and the gate of the measured power device and is used to drive the turn-on or turn-off of the measured power device; the charging circuit 12 and the current source circuit 13 are respectively connected in parallel to the source and the drain of the measured power device and are used to respectively provide voltage and current between the source and the drain of the measured power device; the energy storage circuit 14 is connected in parallel to both ends of the charging circuit and is used to store electrical energy; the load circuit 15 is connected between the charging circuit and the drain of the measured power device and is used to form the electrical stress impact pulse current between the source and the drain of the measured power device in the conduction process under the action of the energy storage circuit 14; and the voltage measurement circuit 16 is connected in parallel to the source and the drain of the measured power device and is used to measure the voltage between the source and the drain of the measured power device.

[0067] By using the multi-station power device electrical stress impact circuit of the embodiment of the application, one-station multi-station measurement can be realized, that is, a plurality of power devices can be measured at the same time, the circuit test efficiency is improved, and the cost is saved. ​

[0068] In some optional embodiments, a multi-station power device electrical stress impact circuit includes a plurality of the power device electrical stress impact circuits as described in any of the implementation manners of the above embodiment 1, and the plurality of power device electrical stress impact circuits are arranged on the same circuit board, i.e., a plurality of power devices can be measured at the same time, thereby improving the efficiency of circuit testing and saving costs.

[0069] Obviously, the above embodiments are merely exemplary and are not intended to limit the implementation manners. Based on the description above, other apparent changes and variations can be made by those skilled in the art. It is not necessary to list all the implementation manners. The changes and variations made by those skilled in the art should still fall within the protection scope of the present application.

Claims

1. A power device electrical stress impact circuit, characterized in that, include: Drive circuit, charging circuit, current source circuit, energy storage circuit, load circuit and voltage measurement circuit; The driving circuit is connected between the source and gate of the power device under test and is used to drive the power device under test to turn on or off. The charging circuit and the current source circuit are connected in parallel to the source and drain of the power device under test, respectively, to provide voltage and current between the source and drain of the power device under test. The energy storage circuit is connected in parallel across the two ends of the charging circuit and is used to store electrical energy; The load circuit is connected between the charging circuit and the drain of the power device under test, and is used to cause the power device under test to generate an electrical stress impact pulse current between the source and drain during the conduction process under the action of the energy storage circuit. A voltage measurement circuit is connected in parallel to the source and drain of the power device under test, and is used to measure the voltage between the source and drain of the power device under test.

2. The power device electrical stress impact circuit according to claim 1, characterized in that, The load circuit includes an inductor circuit.

3. The power device electrical stress impact circuit according to claim 2, characterized in that, The load circuit also includes a resistor connected in parallel with the inductor circuit; The inductor circuit includes a first control switch and a first inductor.

4. The power device electrical stress impact circuit according to claim 3, characterized in that, The inductor circuit includes a plurality of first inductors, which are connected in series or in parallel.

5. The power device electrical stress impact circuit according to claim 1, characterized in that, The energy storage circuit includes a first capacitor.

6. The power device electrical stress impact circuit according to claim 5, characterized in that, The energy storage circuit includes a plurality of the first capacitors, which are connected in series or in parallel.

7. The power device electrical stress impact circuit according to claim 5 or 6, characterized in that, The energy storage circuit also includes a second control switch, which is connected in series with the first capacitor.

8. The power device electrical stress impact circuit according to claim 5, characterized in that, The capacitance of the first capacitor is adapted to the characteristics of the power device under test.

9. The power device electrical stress impact circuit according to claim 1, characterized in that, A third control switch is connected in series between the charging circuit and the load circuit; The charging circuit includes a voltage source and a current limiting circuit connected in series, or a voltage source with current clamping function, or a current source with voltage clamping function.

10. A circuit control method applied to the power device electrical stress impact circuit according to any one of claims 1-9, characterized in that, include: The drive circuit and the current source circuit are disconnected, and the charging circuit is turned on for a first preset duration; The drive circuit and the load circuit are connected, and the electrical energy stored in the energy storage circuit is used to charge the load circuit. This causes the current flowing through the load circuit to overlap with the voltage between the source and drain of the power device under test, so that the power device under test forms an electrical stress impact pulse current between the source and drain during the conduction process. After a second preset duration, the load circuit is disconnected, and the drive circuit and the current source circuit are connected to measure the real-time current and real-time voltage between the source and drain of the power device under test.

11. The circuit control method according to claim 10, characterized in that, Prior to the step of controlling the connection of the drive circuit and the load circuit, the method further includes: The drive circuit and the current source circuit are connected and maintained for a third preset duration to measure the first voltage and the first current between the source and drain of the power device under test. Based on the first voltage and the first current, obtain the first dynamic resistance of the power device under test; The method further includes: The second dynamic resistance of the power device under test is obtained based on the real-time voltage and the real-time current. The test power device is deemed qualified based on the first dynamic resistance and the second dynamic resistance.

12. A multi-station power device electrical stress impact circuit, characterized in that, include: Multiple power device electrical stress impact circuits are connected in parallel across the two ends of the charging circuit, and each power device electrical stress impact circuit applies electrical stress impact to a power device under test. The power device electrical stress impact circuit includes a drive circuit, a current source circuit, an energy storage circuit, a load circuit, and a voltage measurement circuit; the drive circuit is connected between the source and gate of the power device under test and is used to drive the power device under test to turn on or off. The charging circuit and the current source circuit are connected in parallel to the source and drain of the power device under test, respectively, to provide voltage and current between the source and drain of the power device under test. The energy storage circuit is connected in parallel across the two ends of the charging circuit and is used to store electrical energy; The load circuit is connected between the charging circuit and the drain of the power device under test, and is used to cause the power device under test to generate an electrical stress impact pulse current between the source and drain during the conduction process under the action of the energy storage circuit. The voltage measurement circuit is connected in parallel to the source and drain of the power device under test, and is used to measure the voltage between the source and drain of the power device under test.

13. A multi-station power device electrical stress impact circuit, characterized in that, It includes multiple power device electrical stress impact circuits as described in any one of claims 1-9, wherein the multiple power device electrical stress impact circuits are disposed on the same circuit board.

Images