Method, device and readable storage medium for debugging memory cell opening tool

Abstract

The application discloses a kind of storage particle open card tool debugging method, storage particle open card tool debugging equipment and computer readable storage medium, the method comprises: when receiving the debugging instruction of open card tool in virtual host, determine the NAND parameter corresponding to the debugging instruction;Virtual storage device is generated based on the NAND parameter, and error storage point position and corresponding error type are determined;According to the error type, set the parameter to be set of the error storage point position, and update the virtual storage device according to the parameter to be set;Control the virtual storage device after updating executes the debugging instruction, and output the execution result of the debugging instruction.Solve the technical problem that the number of fault logs grabbed in the related art is insufficient, affect the debugging effect of open card tool, realize the technical effect that as many business scenarios as possible are covered for debugging logic flow and exception handling of production.

Description

Technical Field

[0001] This application relates to the field of storage devices, and more particularly to a method for debugging a storage chip card opening tool, a device for debugging a storage chip card opening tool, and a computer-readable storage medium. Background Technology

[0002] The memory consists of an MCU (Microcontroller Unit) and NAND flash memory chips. The MCU stores the control program, which controls the memory to perform the corresponding storage operations. NAND flash memory is widely used in various high-capacity devices such as memory cards, USB flash drives, SSDs, and eMMC.

[0003] In related technologies, memory manufacturers purchase NAND flash memory chips from flash memory chip manufacturers and then further manufacture the memory. After the finished product is manufactured, a corresponding card-opening tool is developed for the NAND flash memory chips, and the FTL (Flash Translation Layer) is burned into the NAND flash memory chips using the card-opening tool.

[0004] However, memory manufacturers have a limited number of NAND flash chips available during the debugging process of the card opening tool, resulting in an insufficient number of fault logs captured, which affects the debugging effect of the card opening tool. Summary of the Invention

[0005] This application provides a method for debugging a memory chip card-opening tool, a device for debugging a memory chip card-opening tool, and a computer-readable storage medium. It solves the technical problem in related technologies where memory manufacturers have a limited number of NAND chips available during the debugging process of the card-opening tool, resulting in insufficient bug logs and affecting the debugging effect of the card-opening tool. It achieves the technical effect of covering as many business scenarios as possible for debugging the logic flow and exception handling of mass production.

[0006] This application provides a method for debugging a storage chip unlocking tool, the method comprising:

[0007] When the virtual host receives a debugging instruction from the card opening tool, it determines the NAND parameter corresponding to the debugging instruction;

[0008] A virtual storage device is generated based on the NAND parameters, and the faulty storage point and the corresponding fault type are determined.

[0009] Set the parameters to be set for the error storage point according to the error type, and update the virtual storage device according to the parameters to be set;

[0010] The updated virtual storage device is controlled to execute the debugging instructions, and the execution results of the debugging instructions are output.

[0011] Optionally, the step of determining the NAND parameter corresponding to the debugging instruction when the virtual host receives the debugging instruction from the card opening tool includes:

[0012] When the virtual host receives the debugging instruction, it determines the storage granularity performance file corresponding to the debugging instruction;

[0013] Determine the wear function, performance parameters, and basic attribute parameters corresponding to the storage particle performance file;

[0014] The NAND parameters are determined based on the wear function, the performance parameters, and the basic attribute parameters.

[0015] Optionally, the step of generating a virtual storage device based on the NAND parameters and determining the faulty storage point and the corresponding fault type includes:

[0016] Run a preset generation algorithm to generate the virtual storage device based on the NAND parameters;

[0017] The target storage block is determined based on the wear function;

[0018] The location coordinates corresponding to the target storage block are determined as the error storage point.

[0019] Obtain the error type from the fault log and randomly assign the error type to the error storage point.

[0020] Optionally, the step of setting the parameters to be set for the error storage point according to the error type, and updating the virtual storage device according to the parameters to be set includes:

[0021] Determine the target parameter value corresponding to the error type;

[0022] Set the parameter to be set corresponding to the error storage point according to the target parameter value;

[0023] Determine the target storage particle corresponding to the erroneous storage point, and control the target storage particle to enter the corresponding erroneous state according to the parameters to be set.

[0024] Optionally, the step of controlling the updated virtual storage device to execute the debugging instructions and outputting the execution results of the debugging instructions includes:

[0025] The control file corresponding to the virtual storage device is determined based on the card activation tool;

[0026] Update the virtual microcontroller unit according to the control file;

[0027] The virtual microcontroller unit is controlled to execute the debugging instructions and output the execution results of the debugging instructions.

[0028] Optionally, the step of determining the control file corresponding to the storage particle model based on the card opening tool includes:

[0029] Run the card activation tool to obtain a map of the virtual storage particles in the virtual storage device;

[0030] The control file is generated based on the NAND parameters and the error storage point, according to the map.

[0031] Optionally, the step of controlling the virtual microcontroller unit to execute the debugging instructions and outputting the execution results of the debugging instructions includes:

[0032] The virtual microcontroller unit performs read / write tests on the virtual flash memory chip according to the control file;

[0033] When an error occurs during the read / write test, an error report corresponding to the read / write test is output.

[0034] In addition, this application also proposes a memory chip card opening tool debugging device, which includes a memory, a processor, and a memory chip card opening tool debugging program stored in the memory and executable on the processor. When the processor executes the memory chip card opening tool debugging program, it implements the steps of the memory chip card opening tool debugging method as described above.

[0035] In addition, this application also proposes a computer-readable storage medium storing a memory chip card opening tool debugging program, which, when executed by a processor, implements the steps of the memory chip card opening tool debugging method as described above.

[0036] One or more technical solutions provided in the embodiments of this application have at least the following technical effects or advantages:

[0037] 1. By employing a method that, upon receiving a debugging command from the card-opening tool on the virtual host, determines the NAND parameters corresponding to the debugging command; generates a virtual storage device based on the NAND parameters, and determines the erroneous storage point and its corresponding error type; sets the parameters to be set for the erroneous storage point according to the error type, and updates the virtual storage device according to the parameters to be set; controls the updated virtual storage device to execute the debugging command, and outputs the execution result of the debugging command, this method effectively solves the technical problem in related technologies where the number of NAND chips obtained by memory manufacturers during the debugging process of the card-opening tool is limited, resulting in insufficient bug logs and affecting the debugging effect of the card-opening tool. This method achieves the technical effect of covering as many business scenarios as possible for debugging the logic flow and exception handling of mass production. Attached Figure Description

[0038] Figure 1 This is a flowchart illustrating an embodiment of the debugging method for the memory chip card opening tool of this application;

[0039] Figure 2 This is a detailed flowchart illustrating step S120 of the first embodiment of the debugging method for the memory chip card opening tool of this application.

[0040] Figure 3 This is a schematic diagram of the hardware structure involved in the embodiment of the storage particle card opening tool debugging device of this application. Detailed Implementation

[0041] In related technologies, memory manufacturers have a limited number of NAND flash memory chips available during the debugging process of card-opening tools, resulting in insufficient bug logs and affecting the debugging effectiveness of the tools. Furthermore, regular debugging requires frequent read and write operations on the NAND flash memory, impacting its lifespan. The main technical solution adopted in this application is as follows: obtaining the NAND parameters corresponding to the memory chips and generating a corresponding virtual storage device; identifying bad blocks in the virtual memory chips within the virtual storage device as error storage points; updating the virtual storage device based on the error storage points; controlling the updated virtual storage device to execute the debugging instructions and outputting the execution results of the debugging instructions. This achieves a logical flow and exception handling mechanism that covers as many business scenarios as possible for debugging mass production.

[0042] To better understand the above technical solutions, exemplary embodiments of this application will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of this application are shown in the drawings, it should be understood that this application can be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of this application and to fully convey the scope of this application to those skilled in the art.

[0043] Example 1

[0044] Embodiment 1 of this application discloses a method for debugging a memory chip unlocking tool, referring to... Figure 1 The debugging method for the storage chip unlocking tool includes:

[0045] Step S110: When the virtual host receives the debugging instruction from the card opening tool, determine the NAND parameter corresponding to the debugging instruction;

[0046] In this embodiment, the card-opening tool is used to open a storage device, such as a solid-state drive (SSD), enabling the SSD to function properly. The NAND parameters are the parameters of the storage chips corresponding to the debugging commands. The virtual host runs on a terminal, such as a computer, and can call the computer's processor to execute corresponding operations.

[0047] Optionally, step S110 includes:

[0048] Step S111: When the virtual host receives the debugging instruction, determine the storage granular performance file corresponding to the debugging instruction;

[0049] Step S112: Determine the wear function, performance parameters, and basic attribute parameters corresponding to the storage particle performance file;

[0050] Step S113: Determine the NAND parameters based on the wear function, the performance parameters, and the basic attribute parameters.

[0051] As an optional implementation, when the virtual host receives a debugging command, it determines the storage chip model corresponding to the debugging command. Based on the model, it determines the storage chip performance file; it then determines the wear function and performance parameters corresponding to the storage chip performance file, wherein the wear function is the theoretical wear curve of the storage chip, and the performance parameters are the theoretical performance indicators of the storage chip; finally, it determines the NAND parameters based on the wear function and the performance parameters.

[0052] As another optional implementation, the memory chip model corresponding to the debugging command is determined, and the memory chip performance file is determined according to the model; the wear function, performance parameters, and basic attribute parameters corresponding to the memory chip performance file are determined; wherein the basic attribute parameters include NAND block size, page length, number of pages, NAND basic operation commands, etc.; a preset parameter generation model is obtained, and NAND dynamic parameters are generated using the wear function and performance parameters as variables of the model, and then NAND parameters are generated based on the NAND dynamic parameters combined with the basic attribute parameters.

[0053] Step S120: Generate a virtual storage device based on the NAND parameters, and determine the faulty storage point and the corresponding fault type;

[0054] In this embodiment, the virtual storage device includes a virtual microcontroller unit and virtual storage particles.

[0055] Optional, refer to Figure 2 Step S120 includes:

[0056] Step S121: Run a preset generation algorithm to generate the virtual storage device based on the NAND parameters;

[0057] Step S122: Determine the target storage block based on the wear function;

[0058] Step S123: Determine the location coordinates corresponding to the target storage block as the error storage point;

[0059] Step S124: Obtain the error type from the fault log and randomly assign the error type to the error storage point.

[0060] As an optional implementation, a preset generation algorithm is run to generate a virtual storage device based on NAND parameters, wherein the virtual microcontroller unit can control the virtual storage particles to perform corresponding read and write operations; according to the wear function, a preset number of target storage particles are randomly selected from the virtual storage particles; the location coordinates of the target storage block corresponding to the target storage particle in the map table corresponding to the virtual storage particle are determined; the location coordinates are used as the fault storage point; the error record in the fault log is obtained; and an error type is randomly assigned and bound to the fault storage point, wherein different fault storage points can have the same error type.

[0061] For example, a target storage block is randomly selected, and an error type is assigned to the target storage block.

[0062] Step S130: Set the parameters to be set for the error storage point according to the error type, and update the virtual storage device according to the parameters to be set;

[0063] In this embodiment, by setting the parameters of the storage particle corresponding to the erroneous storage point, the storage particle is made to enter the working state corresponding to the parameters.

[0064] Optionally, step S130 includes:

[0065] Step S131: Determine the target parameter value corresponding to the error type;

[0066] Step S132: Set the parameter to be set corresponding to the error storage point according to the target parameter value;

[0067] Step S133: Determine the target storage particle corresponding to the erroneous storage point, and control the target storage particle to enter the corresponding erroneous state according to the parameters to be set.

[0068] As an optional implementation, a target parameter value corresponding to the error type is determined, and the parameter to be set for the target storage particle corresponding to the error storage point is modified to the target parameter value, so that the target storage particle enters the error state corresponding to the error type; until all error storage points are set.

[0069] Step S140: Control the updated virtual storage device to execute the debugging instructions and output the execution results of the debugging instructions.

[0070] As an optional implementation, a control file is generated based on the virtual storage device using an activation tool, and the control file is sent to the virtual storage particle for storage. When the virtual storage device is simulated to be powered on, the virtual storage particle sends the control file to the virtual microcontroller unit; executes the corresponding debugging actions, and outputs the debugging results.

[0071] The technical solutions described in the embodiments of this application above have at least the following technical effects or advantages:

[0072] This approach effectively solves the technical problem in related technologies where the limited number of NAND chips obtained by memory manufacturers during the debugging process of card opening tools leads to insufficient bug logs and affects the debugging effect of card opening tools. It achieves the technical effect of covering as many business scenarios as possible for debugging mass production logic flows and exception handling. Specifically, it involves: determining the NAND parameters corresponding to the debugging command when the virtual host receives the debugging command; generating a virtual storage device based on the NAND parameters and determining the erroneous storage point and corresponding error type; setting the parameters to be set for the erroneous storage point according to the error type; updating the virtual storage device according to the parameters to be set; controlling the updated virtual storage device to execute the debugging command; and outputting the execution result of the debugging command.

[0073] Example 2

[0074] Based on Embodiment 1, Embodiment 2 of this application proposes a method for debugging a memory chip unlocking tool, wherein step S140 includes:

[0075] Step S210: Determine the control file corresponding to the virtual storage device based on the card opening tool;

[0076] Optionally, step S210 includes:

[0077] Step S211: Run the card opening tool to obtain a map of the virtual storage particles in the virtual storage device;

[0078] Step S212: Based on the NAND parameters and the error storage point, generate the control file according to the map.

[0079] As an optional implementation, the card opening tool is run to obtain a three-dimensional map of the virtual storage particles, and the target storage particle can be determined based on the three-dimensional coordinates; the control file is generated based on the storage particle model corresponding to the NAND parameters, the storage particle performance parameters, the card opening tool model, and the error type corresponding to the erroneous storage point.

[0080] Step S220: Update the virtual microcontroller unit according to the control file;

[0081] Optionally, step S220 includes:

[0082] Step S221: Compile the control file into a binary file and send the binary file to the virtual storage particle;

[0083] Step S222: When the virtual storage device receives the working instruction, it controls the virtual storage particle to send the binary file to the virtual microcontroller unit.

[0084] As an optional implementation, after generating the control file, the control file is sent to the virtual storage particle; when the virtual storage device receives the working instruction for the first time, the binary file is sent from the virtual storage particle to the virtual microcontroller unit to update the master control of the virtual microcontroller unit according to the control file.

[0085] Step S230: Control the virtual microcontroller unit to execute the debugging instructions and output the execution results of the debugging instructions.

[0086] Optionally, step S230 includes:

[0087] Step S231: The virtual microcontroller performs read / write tests on the virtual flash memory chip according to the control file;

[0088] Step S232: When an error occurs in the read / write test, output the error report corresponding to the read / write test.

[0089] As an optional implementation, after receiving the control file, the virtual microcontroller sends read and write commands corresponding to the debugging command to the virtual storage particle to control the virtual storage particle to respond to and execute the corresponding read and write operations; when errors occur in the above read and write operations, the corresponding error report is output.

[0090] For example, when performing read and write operations, the virtual storage granules use the computer's RAM on which the virtual storage device is running; at the same time, the files being read and written are compressed to speed up the test and improve test efficiency.

[0091] The technical solutions described in the embodiments of this application above have at least the following technical effects or advantages:

[0092] By employing a method that determines the control file corresponding to the virtual storage device based on the card-opening tool, updates the virtual microcontroller unit according to the control file, controls the virtual microcontroller unit to execute the debugging instructions, and outputs the execution results of the debugging instructions, this method effectively solves the technical problem in related technologies where frequent reading and writing of NAND chips during the debugging of card-opening tools leads to a significant reduction in lifespan. This achieves the goal of not affecting the lifespan of NAND chips while improving the debugging efficiency of the card-opening tool.

[0093] This application also proposes a debugging device for memory chip unlocking tools, referring to... Figure 3 , Figure 3 This is a schematic diagram of the hardware operating environment, specifically the debugging device for the memory chip unlocking tool, involved in the embodiments of this application.

[0094] like Figure 3 As shown, the memory chip unlocking tool debugging device may include: a processor 1001, such as a central processing unit (CPU), a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. The communication bus 1002 is used to enable communication between these components. The user interface 1003 may include a display screen and an input unit such as a keyboard; optionally, the user interface 1003 may also include a standard wired interface or a wireless interface. The network interface 1004 may optionally include a standard wired interface or a wireless interface (such as a Wi-Fi interface). The memory 1005 may be a high-speed random access memory (RAM) or a stable non-volatile memory (NVM), such as a disk drive. Optionally, the memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0095] Those skilled in the art will understand that Figure 3The structure shown does not constitute a limitation on the memory chip card opening tool debugging device, and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0096] Optionally, the memory 1005 is electrically connected to the processor 1001. The processor 1001 can be used to control the operation of the memory 1005 and can also read the data in the memory 1005 to enable the debugging of the memory chip card opening tool.

[0097] Optionally, such as Figure 3 As shown, the memory 1005, which serves as a storage medium, may include an operating system, a data storage module, a network communication module, a user interface module, and a debugging program for the memory chip card opening tool.

[0098] Optionally, in Figure 3 In the storage chip unlocking tool debugging device shown, the network interface 1004 is mainly used for data communication with other devices; the user interface 1003 is mainly used for data interaction with the user; the processor 1001 and memory 1005 in the storage chip unlocking tool debugging device of this application can be set in the storage chip unlocking tool debugging device.

[0099] like Figure 3 As shown, the memory chip unlocking tool debugging device calls the memory chip unlocking tool debugging program stored in the memory 1005 through the processor 1001, and executes the relevant steps of the memory chip unlocking tool debugging method provided in this application embodiment:

[0100] When the virtual host receives a debugging instruction from the card opening tool, it determines the NAND parameter corresponding to the debugging instruction;

[0101] A virtual storage device is generated based on the NAND parameters, and the faulty storage point and the corresponding fault type are determined.

[0102] Set the parameters to be set for the error storage point according to the error type, and update the virtual storage device according to the parameters to be set;

[0103] The updated virtual storage device is controlled to execute the debugging instructions, and the execution results of the debugging instructions are output.

[0104] Optionally, the processor 1001 can call the memory chip card opening tool debugging program stored in the memory 1005, and also perform the following operations:

[0105] When the virtual host receives the debugging instruction, it determines the storage granularity performance file corresponding to the debugging instruction;

[0106] Determine the wear function, performance parameters, and basic attribute parameters corresponding to the storage particle performance file;

[0107] The NAND parameters are determined based on the wear function, the performance parameters, and the basic attribute parameters.

[0108] Optionally, the processor 1001 can call the memory chip card opening tool debugging program stored in the memory 1005, and also perform the following operations:

[0109] Run a preset generation algorithm to generate the virtual storage device based on the NAND parameters;

[0110] The target storage block is determined based on the wear function;

[0111] The location coordinates corresponding to the target storage block are determined as the error storage point.

[0112] Obtain the error type from the fault log and randomly assign the error type to the error storage point.

[0113] Optionally, the processor 1001 can call the memory chip card opening tool debugging program stored in the memory 1005, and also perform the following operations:

[0114] Determine the target parameter value corresponding to the error type;

[0115] Set the parameter to be set corresponding to the error storage point according to the target parameter value;

[0116] Determine the target storage particle corresponding to the erroneous storage point, and control the target storage particle to enter the corresponding erroneous state according to the parameters to be set.

[0117] Optionally, the processor 1001 can call the memory chip card opening tool debugging program stored in the memory 1005, and also perform the following operations:

[0118] The control file corresponding to the virtual storage device is determined based on the card activation tool;

[0119] Update the virtual microcontroller unit according to the control file;

[0120] The virtual microcontroller unit is controlled to execute the debugging instructions and output the execution results of the debugging instructions.

[0121] Optionally, the processor 1001 can call the memory chip card opening tool debugging program stored in the memory 1005, and also perform the following operations:

[0122] Run the card activation tool to obtain a map of the virtual storage particles in the virtual storage device;

[0123] The control file is generated based on the NAND parameters and the error storage point, according to the map.

[0124] Optionally, the processor 1001 can call the memory chip card opening tool debugging program stored in the memory 1005, and also perform the following operations:

[0125] The control file is compiled into a binary file, and the binary file is sent to the virtual storage granules;

[0126] When the virtual storage device receives a working instruction, it controls the virtual storage particle to send the binary file to the virtual microcontroller unit.

[0127] Optionally, the processor 1001 can call the memory chip card opening tool debugging program stored in the memory 1005, and also perform the following operations:

[0128] The virtual microcontroller unit performs read / write tests on the virtual flash memory chip according to the control file;

[0129] When an error occurs during the read / write test, an error report corresponding to the read / write test is output.

[0130] Furthermore, this application also proposes a computer-readable storage medium storing a memory chip card opening tool debugging program. When the memory chip card opening tool debugging program is executed by a processor, it implements the relevant steps of any embodiment of the memory chip card opening tool debugging method described above.

[0131] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0132] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0133] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0134] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0135] It should be noted that any reference signs placed between parentheses in the claims should not be construed as limiting the claims. The word "comprising" does not exclude the presence of components or steps not listed in the claims. The word "a" or "an" preceding a component does not exclude the presence of a plurality of such components. This application can be implemented by means of hardware comprising several different components and by means of a suitably programmed computer. In a unit claim enumerating several means, several of these means may be embodied by the same item of hardware. The use of the words first, second, and third, etc., does not indicate any order. These words can be interpreted as names.

[0136] Although preferred embodiments of this application have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments as well as all changes and modifications falling within the scope of this application.

[0137] Obviously, those skilled in the art can make various modifications and variations to this application without departing from the spirit and scope of this application. Therefore, if such modifications and variations fall within the scope of the claims of this application and their equivalents, this application also intends to include such modifications and variations.

Claims

1. A method for debugging a memory chip unlocking tool, characterized in that, The debugging method for the storage chip unlocking tool includes: When the virtual host receives a debugging instruction from the card opening tool, it determines the NAND parameter corresponding to the debugging instruction; A virtual storage device is generated based on the NAND parameters, and the faulty storage points and corresponding fault types are determined. Set the parameters to be set for the error storage point according to the error type, and update the virtual storage device according to the parameters to be set; Control the updated virtual storage device to execute the debugging instructions and output the execution results of the debugging instructions; The steps of controlling the updated virtual storage device to execute the debugging instructions and outputting the execution results of the debugging instructions include: Run the card activation tool to obtain a map of the virtual storage particles in the virtual storage device; Based on the NAND parameters and the faulty storage point, a control file corresponding to the virtual storage device is generated according to the map. Update the virtual microcontroller unit according to the control file; The virtual microcontroller unit is controlled to execute the debugging instructions and output the execution results of the debugging instructions.

2. The method for debugging the memory chip unlocking tool as described in claim 1, characterized in that, The step of determining the NAND parameter corresponding to the debugging command when the virtual host receives the debugging command from the card opening tool includes: When the virtual host receives the debugging instruction, it determines the storage granularity performance file corresponding to the debugging instruction; Determine the wear function, performance parameters, and basic attribute parameters corresponding to the storage particle performance file; The NAND parameters are determined based on the wear function, the performance parameters, and the basic attribute parameters.

3. The method for debugging the memory chip card opening tool as described in claim 2, characterized in that, The steps of generating a virtual storage device based on the NAND parameters and determining the faulty storage point and the corresponding fault type include: Run a preset generation algorithm to generate the virtual storage device based on the NAND parameters; The target storage block is determined based on the wear function; The location coordinates corresponding to the target storage block are determined as the error storage point. Obtain the error type from the fault log and randomly assign the error type to the error storage point.

4. The method for debugging the memory chip card opening tool as described in claim 1, characterized in that, The step of setting the parameters to be set for the error storage point according to the error type, and updating the virtual storage device according to the parameters to be set includes: Determine the target parameter value corresponding to the error type; Set the parameter to be set corresponding to the error storage point according to the target parameter value; Determine the target storage particle corresponding to the erroneous storage point, and control the target storage particle to enter the corresponding erroneous state according to the parameters to be set.

5. The method for debugging the memory chip card opening tool as described in claim 1, characterized in that, The step of updating the virtual microcontroller unit according to the control file includes: The control file is compiled into a binary file, and the binary file is sent to the virtual storage granules; When the virtual storage device receives a working instruction, it controls the virtual storage particle to send the binary file to the virtual microcontroller unit.

6. The method for debugging the memory chip unlocking tool as described in claim 1, characterized in that, The steps of controlling the virtual microcontroller unit to execute the debugging instructions and outputting the execution results of the debugging instructions include: The virtual microcontroller unit performs read / write tests on the virtual storage particles according to the control file; When an error occurs during the read / write test, an error report corresponding to the read / write test is output.

7. A device for debugging a memory chip card opening tool, characterized in that, The device includes a memory, a processor, and a memory chip unlocking tool debugging program stored on the memory and executable on the processor. When the processor executes the memory chip unlocking tool debugging program, it implements the steps of the memory chip unlocking tool debugging method as described in any one of claims 1 to 6.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a memory chip card opening tool debugging program, which, when executed by a processor, implements the steps of the memory chip card opening tool debugging method as described in any one of claims 1 to 6.

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