Method for evaluating comprehensive stress resistance of plants by using photosynthetic reduction curve of detached leaves
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- UNIV OF JINAN
- Filing Date
- 2023-03-14
- Publication Date
- 2026-05-12
AI Technical Summary
Existing methods for testing the overall stress resistance of plants are time-consuming, labor-intensive, and costly, making it difficult to efficiently evaluate a plant's ability to resist harsh environments.
By measuring the photosynthetic rate reduction curve of detached leaves, the overall stress resistance of plants is evaluated using the parameters of the photosynthetic rate reduction curve function, including parameters such as net photosynthetic rate, Euler number, constant α, time τ, respiration rate, and residual photosynthetic rate. These parameters are simplified to the photosynthetic rate reduction curve function PN=e-αt[PA+PAcos(ωt+τ)](1+αt)+PR(1+βt) or PN=e-αt[PA+PAcos(ωt-τ)](1+βt), and the plant stress resistance is evaluated using analytical parameters.
It enables rapid and low-cost evaluation of plant comprehensive stress resistance, improves efficiency, saves manpower and resources, and simplifies the testing process.
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