Transponder information receiving unit BTM testing device, system and method

Abstract

This disclosure provides a BTM (Browser Transponder) information receiving unit testing apparatus, system, and method, including a controller and logic gate circuits. The controller is configured to send trigger mileage information and basic time-position information to the logic gate circuits according to a test command; and to obtain first time mileage information and second time mileage information from the logic gate circuits, and report the first time mileage information and second time mileage information. The logic gate circuits are configured to send a trigger signal to a simulated transponder according to the trigger mileage information, and send the basic time-position information to the BTM under test; and to receive the first time mileage information of the transponder reported by the BTM, and calculate the second time mileage information of the transponder based on the feedback signal from the simulated transponder. This embodiment provides a BTM testing apparatus, system, and method with high measurement accuracy and accurate test results.

Description

Technical Field

[0001] This disclosure relates to, but is not limited to, the field of transponder information receiving unit (BTM) testing, and in particular to a transponder information receiving unit (BTM) testing apparatus, system, and method. Background Technology

[0002] The BTM (Balise Transmission Module) is an important component of the onboard train control equipment ATP (Automatic Train Protection) system. It is a secure transmission system for transmitting safety-related information between the ground transponder and the ATP. When the onboard BTM antenna passes the ground transponder, in addition to receiving and decoding the transponder's message and sending the user information to the ATP equipment, it also needs to accurately calculate the corresponding time and position information received from the ground transponder based on the time and position information periodically issued by the ATP system, and send it to the ATP equipment. The ATP equipment then corrects the train's position based on the transponder time and position information provided by the BTM.

[0003] Therefore, the time and position accuracy of the ground transponder provided by the BTM is an important indicator for evaluating the performance of BTM equipment. The product design standards for BTM equipment, TB / T 3485 or SUBSET-036, clearly specify the position accuracy requirements that BTMs must meet, as shown below:

[0004] Summary of the Invention

[0005] The following is an overview of the subject matter described in detail herein. This overview is not intended to limit the scope of the claims.

[0006] One embodiment of this disclosure provides a test apparatus for a transponder information receiving unit (BTM), which includes a controller and logic gate circuits.

[0007] The controller is configured to send trigger mileage information and basic time location information to the logic gate circuit according to the test command; and to obtain first time mileage information and second time mileage information from the logic gate circuit, and report the first time mileage information and the second time mileage information.

[0008] The logic gate circuit is configured to send a trigger signal to the simulated transponder according to the trigger mileage information, and send the basic time and location information to the BTM under test; and receive the first time and mileage information of the transponder reported by the BTM, and calculate the second time and mileage information of the transponder according to the feedback signal from the simulated transponder.

[0009] One embodiment of this disclosure also provides a transponder information receiving unit (BTM) testing system, including a simulated transponder, a BTM under test, and a BTM testing apparatus as described in any embodiment of this disclosure.

[0010] This disclosure also provides a BTM (Browser Transponder Information Receiving Unit) testing method in one embodiment, applied to the BTM testing apparatus described in any embodiment of this disclosure, the BTM testing method comprising:

[0011] The controller sends trigger mileage information and basic time and position information to the logic gate circuit according to the test command;

[0012] The logic gate circuit sends a trigger signal to the simulated transponder according to the trigger mileage information, and periodically sends the basic time and position information to the BTM under test;

[0013] The logic gate circuit receives the first time mileage information of the transponder reported by the BTM; and receives the feedback signal of the simulated transponder, and calculates the second time mileage information of the transponder based on the feedback signal;

[0014] The controller obtains the first time-mileage information and the second time-mileage information from the logic gate circuit and reports them.

[0015] Compared with related technologies, the BTM testing device, system and method provided in this disclosure can achieve embedded time and position synchronization, minimize errors caused by non-BTM reasons, and is a BTM testing device, system and method with high measurement accuracy and accurate test results.

[0016] After reading and understanding the accompanying diagrams and detailed descriptions, the other aspects can be understood. Attached Figure Description

[0017] Figure 1 Product architecture diagram for processing time and location information for BTM;

[0018] Figure 2 A logical diagram for calculating transponder time and location information for BTM;

[0019] Figure 3 This is a schematic diagram of a BTM testing apparatus according to an embodiment of the present disclosure;

[0020] Figure 4 This is a schematic diagram illustrating the calculation of actual time and position information using a BTM testing device according to an embodiment of this disclosure;

[0021] Figure 5 This is a flowchart of the DSP software operation in a BTM testing device according to an embodiment of the present disclosure;

[0022] Figure 6 This is a flowchart illustrating the communication between the DSP and FPGA of a BTM test apparatus according to an embodiment of this disclosure;

[0023] Figure 7 This is a flowchart illustrating the communication between the BTM test apparatus DSP and LTMS according to an embodiment of this disclosure;

[0024] Figure 8 This is a schematic diagram of a BTM testing system according to an embodiment of the present disclosure;

[0025] Figure 9 This is a flowchart of a BTM testing method according to an embodiment of the present disclosure. Detailed Implementation

[0026] This disclosure describes several embodiments, but these descriptions are exemplary and not limiting, and it will be apparent to those skilled in the art that many more embodiments and implementations are possible within the scope of the embodiments described herein. Although many possible combinations of features are shown in the drawings and discussed in the detailed description, many other combinations of the disclosed features are also possible. Unless specifically limited, any feature or element of any embodiment may be used in combination with, or may replace, any feature or element of any other embodiment.

[0027] This disclosure includes and contemplates combinations of features and elements known to those skilled in the art. The embodiments, features, and elements disclosed in this disclosure may also be combined with any conventional features or elements to form a unique inventive scheme as defined by the claims. Any feature or element of any embodiment may also be combined with features or elements from other inventive schemes to form another unique inventive scheme as defined by the claims. Therefore, it should be understood that any feature shown and / or discussed in this disclosure may be implemented individually or in any suitable combination. Therefore, the embodiments are not limited except by the limitations imposed by the appended claims and their equivalents. Furthermore, various modifications and changes may be made within the scope of the appended claims.

[0028] Furthermore, in describing representative embodiments, the specification may have presented methods and / or processes as a specific sequence of steps. However, the method or process should not be limited to the specific order of steps described herein, to the extent that the method or process does not depend on the specific order of steps described herein. As will be understood by those skilled in the art, other sequences of steps are also possible. Therefore, the specific order of steps set forth in the specification should not be construed as a limitation of the claims. Moreover, the claims relating to the method and / or process should not be limited to the steps performed in the order written, and those skilled in the art will readily understand that these orders can be varied and still remain within the spirit and scope of the embodiments disclosed herein.

[0029] Figure 1 This is a product architecture diagram for BTM devices processing transponder time and location information in the vehicle control system. Figure 2 A logical diagram illustrating the calculation and processing of transponder time and location information for BTM equipment. Figure 2 The valid transponder signal shown refers to the signal that characterizes whether the signal strength is valid, formed based on the signal amplitude of the transponder message.

[0030] Depend on Figure 1 and Figure 2 It is known that the ATP periodically sends updated time and location information and train speed information to the BTM at set time intervals T. The BTM uses the latest received time and location information as the starting point to calculate the transponder's time and location information. The formula for calculating the transponder's time information is T. B =T2 + ΔT + t / 2; The formula for calculating the position information of the transponder is L B =L2+ΔL+s / 2, and send the final calculated time and location information to the ATP device according to the communication protocol.

[0031] It is evident that the errors in the time and location information reported by the BTM to the ATP originate from the velocity sensor, errors generated by the ATP calculations, fluctuations in the ATP data transmission cycle, data transmission delays, errors generated by the BTM calculations, signal delays within the BTM, and the deviation between the electrical and geometric centers of the coupling between the BTM antenna and the transponder.

[0032] Assuming we use a real ATP device and an onboard simulation system (providing a simulated transponder scenario) as the test environment to test the time and position accuracy of the BTM, due to the limitations of the ATP itself and the lack of necessary event synchronization mechanisms with the onboard simulation system, it is clearly impossible to avoid information errors between the ATP decision and the onboard simulation system, as well as errors from the speed sensor or simulated speed sensor. Furthermore, the scripts controlling the simulated transponder in the onboard simulation system typically use a Windows system development environment to control the simulated signal transmitting device; errors arising from the non-real-time nature of the Windows system development environment cannot be avoided.

[0033] Therefore, one embodiment of this disclosure provides a test apparatus for a transponder information receiving unit (BTM). Figure 3 This is a schematic diagram and field configuration diagram of the BTM testing device of this disclosure, wherein the part within the dashed box represents a portion of the BTM testing device of this disclosure, such as... Figure 3 As shown, the BTM test device includes a controller and logic gate circuits;

[0034] The controller is configured to send trigger mileage information and basic time location information to the logic gate circuit according to the test command; and to obtain first time mileage information and second time mileage information from the logic gate circuit, and report the first time mileage information and the second time mileage information.

[0035] The logic gate circuit is configured to send a trigger signal to the simulated transponder according to the trigger mileage information, and send the basic time and location information to the BTM under test; and receive the first time and mileage information of the transponder reported by the BTM, and calculate the second time and mileage information of the transponder according to the feedback signal from the simulated transponder.

[0036] Among them, the above time and mileage have a one-to-one correspondence when the speed is a set value. The above time and mileage information can be expressed by both time and mileage, or by time or mileage.

[0037] The first time-mileage information is the time and location information calculated by the BTM based on the transponder signal;

[0038] The controller can be a digital signal processor (DSP).

[0039] The logic gate circuit can be a Field Programmable Gate Array (FPGA);

[0040] The simulated transponder is a device that generates a simulated signal with electrical characteristics that are basically consistent with those of a real transponder signal through a series of instruments and equipment.

[0041] The BTM testing device in this embodiment performs testing through a precise clock system, eliminating the need for peripheral equipment (such as speed sensors). This avoids the impact of peripheral equipment on testing accuracy and also avoids the influence of factors such as the train's operating status on testing accuracy.

[0042] This embodiment of the BTM testing device, on the one hand, can simulate on-board ATP equipment to provide basic time and position information for BTM products. On the other hand, through logic gate circuits, it processes highly real-time related operations such as trigger signal transmission, feedback signal reception, and calculation of the time and position information of the simulated transponder center, and completes a scheme combining synchronous triggering and feedback acquisition with the simulated transponder. This enables embedded time and position synchronization, minimizes the influence of the testing device itself on the measurement results, and realizes a BTM testing device with high measurement accuracy and accurate test results.

[0043] In one example of this embodiment, when the logic gate circuit receives the first time mileage information reported by the BTM, it also receives the transponder message reported by the BTM.

[0044] In an exemplary embodiment of this disclosure, the test command includes the basic time and location information, train speed, and trigger mileage information;

[0045] The logic gate circuit periodically sends the basic time and location information to the BTM, and can also simultaneously receive the transponder messages and time and location information sent by the BTM, and forward them to the host computer test management system for further judgment.

[0046] The logic gate circuit sends a trigger signal to the simulation transponder based on the trigger mileage information, including: updating the current mileage in real time according to the train speed after the test starts, and sending the trigger signal when the current mileage is equal to any one of the trigger mileages.

[0047] In an exemplary embodiment of this disclosure, the feedback signal is sent by the simulated transponder to the logic gate circuit at the start of sending the response signal after receiving the trigger signal.

[0048] In this embodiment, the feedback signal received by the logic gate circuit is sent to the logic gate circuit at the actual start time of the simulated transponder sending the response signal. Therefore, the logic gate circuit can accurately know the delay through this feedback signal, obtain the actual start time time-mileage data of the response signal based on the feedback signal, calculate the accurate time-mileage information, and use the accurate time-mileage information to evaluate the time-mileage information calculated by the BTM device in order to determine the performance of the BTM device.

[0049] In any embodiment of this disclosure, for the BTM being tested, the basic time and location information and the train speed are parameters during the train's operation. These parameters are generated by the BTM testing device of this disclosure and are used to simulate the parameters during train operation.

[0050] In any embodiment of this disclosure, such as Figure 3 As shown, the response message is transmitted from the simulated signal transmitting antenna to the BTM antenna via spatial magnetic field coupling, and then transmitted to the BTM device. Additionally, the "pulse signal" characterizing the transponder signal is generated within the internal circuitry of the BTM device and is used to assist in logic calculations and judgments.

[0051] In an exemplary embodiment of this disclosure, the test command further includes information about a test scenario, which includes a test scenario for a single transponder and a test scenario for a group of transponders;

[0052] The controller is also configured to send information about the test scenario to the logic gate circuit;

[0053] In the test scenario of a single transponder, the simulated transponder generates and sends a single response signal waveform after receiving a trigger signal. In the test scenario of a transponder group, the simulated transponder generates and sends multiple response signal waveforms after receiving a trigger signal. The interval between adjacent response signal waveforms is set according to the distance between adjacent transponders and the train speed in the current test settings. Specifically, the interval between adjacent response signal waveforms can be reflected in the configured waveform file, or the FPGA can send the test scenario indication signal to the simulated transponder, and the simulated transponder generates adjacent response signal waveforms according to the test scenario information in the indication signal.

[0054] In one example of this embodiment, Figure 4This disclosure presents a logic diagram of the FPGA of the BTM test device calculating the actual time and location information of the transponder based on the feedback signal of the simulated transponder. Referring to the diagram, it can be seen that the BTM test device of this disclosure generates a start signal when the predetermined time is reached. The simulated transponder receives the trigger signal and sends a feedback signal to the BTM test device (FPGA) at the start of sending the response signal. Thus, the time and mileage data at the start time can be obtained based on the feedback signal, and the center time and center mileage of the simulated transponder signal can be calculated.

[0055] In one example of this embodiment, in a test scenario with a single transponder, the second time-mileage information includes the second time information and the second mileage information of the single transponder;

[0056] The logic gate circuit calculates the second time mileage information of the transponder based on the feedback signal from the simulated transponder, including:

[0057] Based on the feedback signal, obtain the start time T0 and start time mileage L0 of the single transponder's response signal in the test scenario of a single transponder;

[0058] The second time information and second mileage information of the individual transponder response signal are calculated using the following formula:

[0059] Second time information = T0 + T / 2;

[0060] Second mileage information = L0 + V*T / 2;

[0061] Where T is the set duration of a single response signal, and V is the set train speed.

[0062] In one example of this embodiment, in a test scenario of a transponder group, the second time mileage information includes the second time information and second mileage information of N transponders, where N is an integer greater than or equal to 2;

[0063] The logic gate circuit calculates the second time mileage information of the transponder based on the feedback signal from the simulated transponder, including:

[0064] Based on the feedback signal, obtain the start time T0 and start time mileage L0 of the first transponder response signal in the test scenario of the transponder group;

[0065] The second time information T of the response signal of the nth transponder in the transponder group is calculated according to the following formula. n Second mileage information L n :

[0066] T n =T0 + T / 2 + (n-1)·S / V;

[0067] L n =L0 + V*T / 2 + (n-1)·S;

[0068] Where T is the set duration of a single response signal, V is the set train speed, and S is the set distance between adjacent transponders in the transponder group (which can be represented by the distance between the physical centers of adjacent transponders).

[0069] In this embodiment, after the FPGA part of the BTM test device of this disclosure calculates the time and location information (second time mileage information) of the simulated transponder center, it caches the calculated time and location information for the DSP to query and read.

[0070] From the above embodiments and Figure 3 , Figure 4 As can be seen, the FPGA mainly includes two functions: first, generating the TRIG_S1 signal of the trigger signal source; second, detecting the RSG_S2 signal output by the waveform generator, determining the test scenario, and calculating the center time (i.e., the second time information) and center mileage (i.e., the second time information). If it is a test scenario for a transponder group, it provides the time and mileage information of the start edge of the RSG_S2 signal.

[0071] In one example of this embodiment, the controller can be a DSP, which may include a Lab Time Odometer Module (LTOM) for receiving command frames sent by the host computer test management system (LTMS) and processing different command frames. Figure 5 The following is a flowchart of the DSP software operation of the BTM test device disclosed herein. The operation flow of the DSP software may include the following steps:

[0072] Step S501: Call the setFrequencyReg function to set the system frequency.

[0073] Step S502: Call the Dslinit function to perform system initialization.

[0074] Step S503: Perform various self-checks.

[0075] Step S504: Initialize the main structure.

[0076] Step S505: Register the interrupt callback function CycleCheckRAMandCPU.

[0077] Step S506: Start the Start while(1) main loop and periodically execute steps S407 to S407.

[0078] In step S507, T4_LTMS_process communicates with the LTMS-T4 interface and periodically monitors the data received by the T4 interface.

[0079] Step S508: Inner_Com_Process reads data from the FPGA interface and communicates with the FPGA.

[0080] Step S509: Perform periodic flashing of the LED using Run_Normal_FlashLed.

[0081] Step S510: Check whether the FPGA is faulty by checking Is_FPGA_Err.

[0082] In another example of this embodiment, the flowchart of the communication between the DSP and FPGA of the BTM test device of this disclosure can be referred to. Figure 6 This may include the following steps:

[0083] Step S611: Periodically query the DSP trigger cache queue to see if there is any trigger mileage information issued by LTMS. If it exists, proceed to step S612.

[0084] Step S612: Take a piece of data from the buffer queue and write it to the FPGA.

[0085] Step S621: Periodically query the FPGA cache queue for events fed back by the simulation transponder. The event refers to the time mileage information calculated by the FPGA. If it exists, proceed to step S622.

[0086] Step S622: Determine whether the event in the FPGA buffer queue is a single responder event or a responder group event. If it is a single responder event, proceed to step S623; if it is a responder group event, proceed to step S624.

[0087] In step S623, a single responder event is directly enqueued and awaits LTMS query.

[0088] In step S624, for transponder group events, eight event values ​​corresponding to different speeds are calculated again and queued into eight events for LTMS query. The eight event values ​​corresponding to different speeds refer to the following: during transponder group scenario testing, different speed scenarios (such as 180km / h, 300km / h, and 500km / h) are tested. When the set speed is 180km / h, the eight event values ​​corresponding to the speed of 180km / h are calculated; when the set speed is 300km / h, the eight event values ​​corresponding to the speed of 300km / h are calculated, and so on.

[0089] In the above embodiments, the DSP part of the BTM test device of this disclosure obtains information such as test scenario, train speed, and trigger mileage information (i.e., preset trigger position) from the test command, and triggers the S1 interface according to the trigger position command of the FPGA, and receives the feedback signal of the S2 interface through the FPGA. The software sequentially reads the time mileage information of the feedback signal calculated by the FPGA, responds to the query of LTMS and reports the time mileage information to LTMS in sequence, and periodically sends time mileage frames to the BTM.

[0090] In addition, the DSP software can monitor the fault status of the FPGA in real time to prevent abnormalities in the FPGA from going undetected during operation and affecting the next test.

[0091] In an exemplary embodiment of this disclosure, the BTM testing apparatus further includes a host computer test management system (LTMS).

[0092] The LTMS is configured to issue the test command; and receive the first time-mileage information and the second time-mileage information, calculate the difference between the first time-mileage information and the second time-mileage information, and determine whether the BTM is qualified based on the difference and a preset error threshold.

[0093] In one example of this embodiment, the first time-mileage information includes the first time information and the first mileage information of the transponder;

[0094] The difference between the first time mileage information and the second time mileage information is calculated. The BTM is judged to be qualified based on the difference and a preset error threshold. Specifically, the difference between the first time information and the second time information can be compared with a preset time information error threshold, and / or the difference between the first mileage information and the second mileage information can be compared with a preset mileage information error threshold. If both are qualified, the BTM is qualified, or if either one is qualified, the BTM is qualified.

[0095] Furthermore, the LTMS can interact with the test operator through a graphical human-machine interface to customize, control, and monitor the test process. The test command information issued by the LTMS software may also include test start information and the number of test sequences.

[0096] In this embodiment, the LTMS can determine whether the BTM is qualified based on the error between the first time mileage information (the time and position information of the transponder signal calculated by the BTM) and the second time mileage information (the time and position information calculated by the logic gate circuit).

[0097] In an exemplary embodiment of this disclosure, the communication process between the DSP and LTMS in the BTM test apparatus can be referred to... Figure 7 This may include the following steps:

[0098] Step S701: Read serial port data.

[0099] Step S702: Verify the frame header and frame footer.

[0100] Step S703: After receiving valid data via the serial port, determine the data length. If the received command frame is valid, parse the corresponding communication protocol, determine the type of the command frame (control command, status request, speed setting, or trigger position setting), and perform the corresponding operation based on the type of the command frame.

[0101] When the command frame is a control command, the command frame is parsed and operations such as switching the response environment (switching the test mode), resetting parameters (i.e., resetting the time mileage), relay control, and clearing FPGA marker events are performed.

[0102] When the command frame is a status request, parse the request frame, respond with the current time mileage, retrieve the transponder center time mileage from the queue and respond;

[0103] When the command frame is for speed setting, parse the command frame and respond with speed setting, time setting, and mileage setting;

[0104] When the command frame sets a trigger position, the command frame is parsed and the received trigger positions are enqueued one by one.

[0105] Step S704: After updating the speed in frame V2, resume the speed setting frame command.

[0106] Step S705: When the mode is idle, clear all markers.

[0107] In an exemplary embodiment of this disclosure, the communication interface between the logic gate circuit and the BTM under test includes a test interface and a simulated ATP interface.

[0108] The test interface can refer to the standard-defined V interface, the physical interface can be RS422 / 485, and the program can be developed according to the V interface communication protocol; the simulated ATP interface can be a simulated ATP, including ATP with PB communication mode, ATP with RS422 communication mode, etc., used to simulate the communication between real ATP devices and BTM.

[0109] In this embodiment, the logic gate circuit can complete the configuration and transmission / reception control of the underlying communication channels with each interactive part, including RS422 / 485 and PB communication with the host computer test management system LTMS, BTM equipment, etc., and communication with the DSP bus, etc.

[0110] The communication interface between the logic gate circuit and the BTM under test in this embodiment includes a test interface and a simulated ATP interface. It can not only communicate with the BTM test system through the test interface to complete the measurement of time and position accuracy under the test environment, but also embed the real ATP communication protocol into the test process through the simulated ATP interface. This allows the BTM device to work under the real communication protocol branch as much as possible, and complete the measurement of time and position accuracy under the real ATP communication interface mode. This reduces unnecessary errors and uncertainties caused by communication protocol conversion or the addition of communication adapters, and further improves the accuracy of the test results of the BTM test device disclosed in this invention.

[0111] In an exemplary embodiment of this disclosure, the BTM testing device further includes a power supply section for supplying power to the BTM testing device. The power supply section includes a 24V power supply and a 24V-5V conversion chip. The 24V power supply powers the digital logic section, including: the 24V power supply powers the DSP and FPGA via a multi-channel power chip; a power monitoring chip monitors the input voltage of the FPGA and DSP, and supplies power only after the requirements are met. Power to the DSP must first be supplied to the core before powering the I / O, to meet usage requirements. The 5V power supply powers the chips that provide relevant communication interfaces.

[0112] This disclosure also provides an embodiment of a transponder information receiving unit (BTM) testing system, see [link to relevant documentation]. Figure 8 It includes a simulated transponder, a BTM under test, and a BTM testing apparatus as described in any embodiment of this disclosure.

[0113] The BTM testing system implemented in this paper embeds the time and location synchronization test into the actual BTM and ATP communication protocol. This allows the BTM to run under the actual ATP communication logic branch during the test, reducing errors and uncertainties caused by communication protocol conversion or the addition of communication adapters.

[0114] This disclosure also provides an embodiment of a BTM (Browser Transponder Information Receiving Unit) testing method, applicable to the BTM testing apparatus described in any embodiment of this disclosure, such as... Figure 9 As shown, the BTM testing method can be performed according to the following steps:

[0115] Step S901: The controller sends trigger mileage information and basic time and position information to the logic gate circuit according to the test command;

[0116] Step S902: The logic gate circuit sends a trigger signal to the simulated transponder according to the trigger mileage information, and periodically sends the basic time and position information to the BTM under test.

[0117] In step S903, the logic gate circuit receives the first time mileage information of the transponder reported by the BTM; and receives the feedback signal of the simulated transponder, and calculates the second time mileage information of the transponder based on the feedback signal;

[0118] In step S904, the controller obtains the first time-mileage information and the second time-mileage information from the logic gate circuit and reports them.

[0119] In an exemplary embodiment of this disclosure, the test command includes the basic time and location information, train speed, and trigger mileage information;

[0120] The logic gate circuit periodically sends the basic time position information to the BTM;

[0121] The logic gate circuit sends a trigger signal to the simulation transponder according to the trigger mileage information, including: updating the current mileage in real time according to the train speed after the test starts, and sending a trigger signal when the current mileage is equal to any one of the trigger mileages;

[0122] Before receiving the feedback signal from the simulated transponder, the method further includes: after receiving the trigger signal, the simulated transponder sends a feedback signal to the logic gate circuit at the start of sending the response signal.

[0123] In an exemplary embodiment of this disclosure, the test command further includes information about a test scenario, which includes a test scenario for a single transponder and a test scenario for a group of transponders;

[0124] The method further includes: the controller sending information about the test scenario to the logic gate circuit;

[0125] In a single transponder test scenario, after receiving a trigger signal, the simulated transponder generates and sends a single response signal waveform; the second time-mileage information includes the transponder's second time information and second mileage information, and calculating the transponder's second time-mileage information based on the feedback signal includes:

[0126] Based on the feedback signal, obtain the start time T0 and start time mileage L0 of the single transponder's response signal in the test scenario of a single transponder;

[0127] The second time information and second mileage information of the individual transponder response signal are calculated using the following formula:

[0128] Second time information = T0 + T / 2;

[0129] Second mileage information = L0 + V*T / 2;

[0130] Where T is the set duration of a single response signal, and V is the set train speed;

[0131] In the test scenario of the transponder group, after receiving the trigger signal, the simulated transponder generates and sends multiple response signal waveforms. The interval between adjacent response signal waveforms is set according to the distance between adjacent transponders and the train speed in the current test setting. The second time mileage information includes the second time information and second mileage information of N transponders, where N is an integer greater than or equal to 2. The calculation of the second time mileage information of the transponder based on the feedback signal includes:

[0132] Based on the feedback signal, obtain the start time T0 and start time mileage L0 of the first transponder response signal in the test scenario of the transponder group;

[0133] The second time information T of the response signal of the nth transponder in the transponder group is calculated according to the following formula. n Second mileage information L n :

[0134] T n =T0 + T / 2 + (n-1)·S / V;

[0135] L n =L0 + V*T / 2 + (n-1)·S;

[0136] Where T is the set duration of a single response signal, V is the set train speed, and S is the set distance between adjacent transponders in the transponder group.

[0137] The logic gate circuit can be a Field Programmable Gate Array (FPGA). FPGA is mainly used for processing with high real-time requirements, such as trigger signal transmission, feedback signal reception, and calculation of the time and position information of the simulated transponder center.

[0138] In an exemplary embodiment of this disclosure, the BTM testing apparatus further includes a host computer test management system (LTMS).

[0139] After obtaining and reporting the first time-mileage information and the second time-mileage information, the method further includes:

[0140] The LTMS receives the first time-mileage information and the second time-mileage information, calculates the difference between the first time-mileage information and the second time-mileage information, and determines whether the BTM is qualified based on the difference and a preset error threshold.

[0141] This embodiment of the BTM testing device, system, and method, on the one hand, can simulate onboard ATP equipment, periodically providing basic time and position information to the BTM product; on the other hand, it utilizes the real-time signal processing capability of the FPGA chip to handle highly real-time operations such as trigger signal transmission, feedback signal reception, and calculation of the simulated transponder's center time and position information, completing a combined scheme of synchronous triggering and feedback acquisition with the simulated transponder. Ultimately, it can achieve embedded time and position synchronization based on DSP and FPGA. Compared to onboard ATP, this embodiment of the BTM testing device does not require peripheral equipment (such as speed sensors) to provide information, thus avoiding the influence of speed sensors, train operating status, and other factors on testing accuracy. It achieves high measurement accuracy, more accurate test results, and minimizes the influence of the testing system itself on the measurement results.

[0142] In one or more exemplary embodiments described above, the described functionality may be implemented in hardware, software, firmware, or any combination thereof. If implemented in software, the functionality may be stored as one or more instructions or code on or transmitted via a computer-readable medium and executed by a hardware-based processing unit. The computer-readable medium may comprise a computer-readable storage medium corresponding to a tangible medium, such as a data storage medium, or a communication medium comprising any medium facilitating the transfer of a computer program from one place to another, such as according to a communication protocol. In this manner, the computer-readable medium may generally correspond to a non-transitory tangible computer-readable storage medium or a communication medium, such as a signal or carrier wave. The data storage medium may be any available medium accessible by one or more computers or one or more processors to retrieve instructions, code, and / or data structures for implementing the techniques described in this disclosure. Computer program products may comprise computer-readable media.

[0143] For example, and not as a limitation, such computer-readable storage media may include RAM, ROM, EEPROM, CD-ROM or other optical disc storage devices, magnetic disk storage devices or other magnetic storage devices, flash memory, or any other medium that can be used to store desired program code in the form of instructions or data structures and is accessible by a computer. Furthermore, any connection may also be referred to as a computer-readable medium. For example, if instructions are transmitted from a website, server, or other remote source using coaxial cable, fiber optic cable, twisted pair, digital subscriber line (DSL), or wireless technologies such as infrared, radio, and microwave, then coaxial cable, fiber optic cable, twisted pair, DSL, or wireless technologies such as infrared, radio, and microwave are included in the definition of medium. However, it should be understood that computer-readable storage media and data storage media do not include connections, carrier waves, signals, or other transient media, but rather refer to non-transient tangible storage media. As used herein, disks and optical discs include compact optical discs (CDs), laser discs, optical discs, digital versatile discs (DVDs), floppy disks, or Blu-ray discs, where disks typically reproduce data magnetically, while optical discs use lasers to reproduce data optically. The combinations described above should also be included within the scope of computer-readable media. While the embodiments disclosed herein are as described above, the content is merely for the purpose of understanding this disclosure and is not intended to limit this disclosure. Any person skilled in the art to which this disclosure pertains may make any modifications and changes in the form and details of the implementation without departing from the spirit and scope disclosed herein; however, the scope of patent protection of this disclosure shall still be defined by the appended claims.

Claims

1. A transponder information receiving unit (BTM) testing device, characterized in that, Includes controllers, logic gates, and a host computer-based test and management system (LTMS); The controller is configured to send trigger mileage information, basic time and location information, and test scenario information to the logic gate circuit according to the test command. And, obtain the first time mileage information and the second time mileage information from the logic gate circuit, and report the first time mileage information and the second time mileage information; The logic gate circuit is configured to send a trigger signal to the simulated transponder according to the trigger mileage information, and send the basic time and location information to the BTM under test; and receive the first time mileage information of the transponder reported by the BTM, and calculate the second time mileage information of the transponder according to the feedback signal from the simulated transponder. The LTMS is configured to issue the test command, which includes the basic time and location information, the triggered mileage information, and the test scenario information. And, receive the first time mileage information and the second time mileage information, calculate the difference between the first time mileage information and the second time mileage information, and determine whether the BTM is qualified based on the difference and a preset error threshold; The test scenarios include test scenarios for a single transponder and test scenarios for a group of transponders; In a single transponder test scenario, the second time-mileage information includes the second time information and the second mileage information of the single transponder; calculating the second time-mileage information of the transponder based on the feedback signal from the simulated transponder includes: obtaining the start time T0 and start time mileage L0 of the single transponder response signal in the single transponder test scenario based on the feedback signal; calculating the second time information and the second mileage information of the single transponder response signal according to the following formulas: second time information = T0 + T / 2; second mileage information = L0 + V * T / 2; where T is the set duration of the single response signal and V is the set train speed; In the test scenario of a transponder group, the second time-mileage information includes the second time information and second mileage information of N transponders, where N is an integer greater than or equal to 2. The logic gate circuit calculates the second time-mileage information of the transponder based on the feedback signal from the simulated transponder, including: obtaining the start time T0 and start time mileage L0 of the first transponder's response signal in the test scenario of the transponder group based on the feedback signal; and calculating the second time information T of the nth transponder's response signal in the transponder group according to the following formula. n Second mileage information L n :T n = T0 + T / 2 + (n-1)•S / V;L n = L0 + V * T / 2 + (n-1)•S; where T is the set duration of a single response signal, V is the set train speed, and S is the set distance between adjacent transponders in the transponder group.

2. The BTM testing device according to claim 1, characterized in that: The test command also includes train speed; The logic gate circuit periodically sends the basic time and position information to the BTM; The logic gate circuit sends a trigger signal to the simulation transponder based on the trigger mileage information, including: updating the current mileage in real time according to the train speed after the test starts, and sending the trigger signal when the current mileage is equal to any one of the trigger mileages.

3. The BTM testing device according to claim 2, characterized in that: The feedback signal is sent by the simulated transponder to the logic gate circuit at the start of sending the response signal after receiving the trigger signal.

4. The BTM testing device according to claim 2, characterized in that: In a single transponder test scenario, the simulated transponder generates and sends a single response signal waveform after receiving a trigger signal; in a transponder group test scenario, the simulated transponder generates and sends multiple response signal waveforms after receiving a trigger signal, with the interval between adjacent response signal waveforms set according to the distance between adjacent transponders and the train speed in the current test setting.

5. The BTM testing device according to claim 1, characterized in that: The communication interface between the logic gate circuit and the BTM under test includes a test interface and a simulation ATP interface; The controller is a digital signal processor (DSP), and the logic gate circuit is a field-programmable gate array (FPGA).

6. A BTM (Browser Transponder Information Receiving Unit) testing system, characterized in that, It includes a simulated transponder, the BTM under test, and the BTM testing apparatus as described in any one of claims 1 to 5.

7. A method for testing a transponder information receiving unit (BTM), applied to the BTM testing apparatus as described in any one of claims 1 to 5, the BTM testing method comprising: The LTMS issues a test command, which includes the basic time and location information, the triggered mileage information, and the test scenario information. The controller sends trigger mileage information, basic time and location information, and test scenario information to the logic gate circuit according to the test command. The logic gate circuit sends a trigger signal to the simulated transponder according to the trigger mileage information, and periodically sends the basic time and position information to the BTM under test; The logic gate circuit receives the first time mileage information reported by the transponder from the BTM; The test scenario includes receiving feedback signals from the simulated transponder and calculating the second time-mileage information of the transponder based on the feedback signals. The test scenario includes a test scenario for a single transponder and a test scenario for a group of transponders. In the test scenario for a single transponder, the simulated transponder generates a single response signal waveform and sends it after receiving a trigger signal. The second time-mileage information includes the second time information and the second mileage information of the transponder. Calculating the second time-mileage information of the transponder based on the feedback signals includes: obtaining the start time T0 and start time mileage L0 of the single transponder response signal in the single transponder test scenario based on the feedback signals; and calculating the second time information and the second mileage information of the single transponder response signal using the following formulas: Second time information = T0 + T / 2; Second mileage information = L0 + V * T / 2; where T is the set duration of a single response signal, and V is the set train speed; in the test scenario of the transponder group, after the simulated transponder receives the trigger signal, it generates multiple response signal waveforms and sends them. The interval between adjacent response signal waveforms is set according to the distance between adjacent transponders and the train speed in the current test setting; the second time mileage information includes the second time information and second mileage information of N transponders, where N is an integer greater than or equal to 2. The step of calculating the second time mileage information of the transponder based on the feedback signal includes: obtaining the start time T0 and start time mileage L0 of the first transponder response signal in the test scenario of the transponder group according to the feedback signal; calculating the second time information T of the nth transponder response signal in the transponder group according to the following formula. n Second mileage information L n :T n = T0 + T / 2 + (n-1)•S / V;L n = L0 + V * T / 2 + (n-1)•S; where T is the set duration of a single response signal, V is the set train speed, and S is the set distance between adjacent transponders in the transponder group; The controller obtains the first time-mileage information and the second time-mileage information from the logic gate circuit and reports them; The LTMS receives the first time-mileage information and the second time-mileage information, calculates the difference between the first time-mileage information and the second time-mileage information, and determines whether the BTM is qualified based on the difference and a preset error threshold.

8. The method according to claim 7, characterized in that: The test command also includes train speed; The logic gate circuit periodically sends the basic time and position information to the BTM; The logic gate circuit sends a trigger signal to the simulation transponder according to the trigger mileage information, including: updating the current mileage in real time according to the train speed after the test starts, and sending a trigger signal when the current mileage is equal to any one of the trigger mileages; Before receiving the feedback signal from the simulated transponder, the method further includes: after receiving the trigger signal, the simulated transponder sends a feedback signal to the logic gate circuit at the start of sending the response signal.

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