Method and device for testing response time of reactor protection system protection signals

Abstract

The application relates to a method and device for testing the response time of a reactor protection system protection signal, computer equipment, a storage medium and a computer program product. The method comprises the following steps: inputting an analog power signal into an analog protection cabinet in the reactor protection system, recording the input time, and obtaining an on-off signal of the analog power signal; outputting a logic setting instruction to a logic protection simulator in the reactor protection system; receiving feedback of the setting logic of a test channel and a non-test channel, when the setting logic of the test channel and the non-test channel meets preset response test logic, inputting the on-off signal into the test channel of a logic protection cabinet in the reactor protection system, and outputting a protection action signal to a signal collector in the reactor protection system; outputting a signal output instruction to the signal collector; acquiring a protection action signal trigger time, and obtaining a total response time. The method can efficiently test the response time of the reactor protection system protection signal.

Description

Technical Field

[0001] This application relates to the field of nuclear power technology, and in particular to a method, apparatus, computer equipment, storage medium, and computer program product for testing the response time of protection signals in a reactor protection system. Background Technology

[0002] A reactor protection system is a system that generates protection signals, consisting of all electrical and mechanical components and wiring (from sensors to the inputs of actuators). It primarily protects the integrity of the three nuclear safety barriers (fuel cladding, primary circuit pressure boundary, and containment). When reactor operating parameters (temperature, pressure, water level, flow rate, etc.) reach thresholds that threaten the integrity of these three barriers, the protection system triggers an emergency reactor shutdown and activates dedicated safety facilities. Therefore, as a critical system in the nuclear power field, the reactor protection system requires monitoring of its response time to trigger an emergency reactor shutdown and activate dedicated safety facilities.

[0003] In traditional technology, testing generally refers to testing the sum of the response times of the analog and logic parts of the protection signals in the reactor protection system. The analog part includes process instrument cabinets and nuclear instrument cabinets, while the logic part includes logic protection cabinets. The specific testing method involves injecting different signals into the process instrument cabinets or nuclear instrument cabinets using devices such as transmitters or RTD probes, and using a recorder to record the time from the injection of each signal into the protection cabinets and the output of the analog part of the reactor protection system until the nuclear power system protection action is triggered. However, this method generally takes two to three months to complete the testing of each signal, which is extremely inefficient. Summary of the Invention

[0004] Therefore, it is necessary to provide an efficient method, apparatus, computer equipment, computer-readable storage medium, and computer program product for testing the response time of protection signals in a reactor protection system, in order to address the aforementioned technical problems.

[0005] In a first aspect, this application provides a method for testing the response time of a reactor protection system's protection signal, the method comprising:

[0006] The analog power signal is input to the analog protection cabinet of the reactor protection system, the input time is recorded, and the threshold range of the analog power signal is judged to obtain the switching signal of the analog power signal.

[0007] The logic setting command corresponding to the switch signal is output to the logic protection simulator in the reactor protection system. The logic setting command is used to control the logic protection simulator to set the logic of the test channel and non-test channel of the logic protection cabinet.

[0008] The system receives the setting logic of the test channel and non-test channel from the logic protection simulator. When the setting logic of the test channel and non-test channel meets the preset response test logic, the system inputs the switch signal to the test channel of the logic protection cabinet in the reactor protection system and outputs the protection action signal to the signal acquisition device in the reactor protection system.

[0009] The output signal output command is sent to the signal acquisition device, and the signal output command is used to control the signal acquisition device to output the protection action signal;

[0010] The trigger time of the protection action signal is obtained, and the total response time is obtained by combining the input time with the trigger time of the protection action signal.

[0011] In one embodiment, before determining the threshold range of the simulated power signal to obtain the switching signal of the simulated power signal, the method further includes:

[0012] The analog power signal is filtered.

[0013] In one embodiment, determining the threshold range of the analog power signal to obtain the switching signal of the analog power signal includes:

[0014] The threshold range of the simulated power signal is determined;

[0015] When the simulated power signal is greater than a preset signal threshold range, a low-level signal is obtained;

[0016] A high-level signal is obtained when the simulated power signal is not greater than a preset signal threshold range;

[0017] Based on the low-level signal and the high-level signal, the switching signal of the analog power signal is obtained.

[0018] In one embodiment, before outputting the logic setting instruction corresponding to the switch signal to the logic protection simulator in the reactor protection system, the method further includes:

[0019] An initialization command is output to the logic protection simulator in the reactor protection system. The initialization command is used to set the test channel and the non-test channel of the logic protection cabinet to the initial state.

[0020] In one embodiment, the step of outputting the logic setting instruction corresponding to the switching signal to the logic protection simulator in the reactor protection system includes:

[0021] Obtain the test channel, non-test channel, and preset response test logic corresponding to the switch signal in the logic protection cabinet;

[0022] Based on the test channel, the non-test channel, and the preset response test logic, obtain the response test logic corresponding to the switch signal;

[0023] Based on the response test logic, the logic setting command is output to the logic protection simulator in the reactor protection system.

[0024] In one embodiment, it further includes:

[0025] Acquire various analog power signals;

[0026] Based on the simulated power signals, output the protection action signals to the signal acquisition unit in the reactor protection system;

[0027] Identify the protection action signals that do not need to be monitored and the protection action signals that need to be monitored from among the various protection action signals;

[0028] The signal monitoring command is output to the signal acquisition device, which controls the signal acquisition device to place the protection action signal that does not need to be monitored in the locked position and to monitor the protection action signal that needs to be monitored.

[0029] Secondly, this application also provides a testing device for the response time of a reactor protection system protection signal, the device comprising:

[0030] The analog protection module is used to input analog power signals into the analog protection cabinet of the reactor protection system, record the input time, and determine the threshold range of the analog power signals to obtain the switching signals of the analog power signals.

[0031] The logic protection module is used to output the logic setting instructions corresponding to the switch signals to the logic protection simulator in the reactor protection system. The logic setting instructions are used to control the logic protection simulator to set the logic of the test channel and non-test channel of the logic protection cabinet.

[0032] The signal acquisition module is used to receive the setting logic of the test channel and the non-test channel fed back by the logic protection simulator. When the setting logic of the test channel and the non-test channel meets the preset response test logic, the switch signal is input to the test channel of the logic protection cabinet in the reactor protection system, and the protection action signal is output to the signal acquisition device in the reactor protection system.

[0033] The signal triggering module is used to output a signal output command to the signal acquisition device, and the signal output command is used to control the signal acquisition device to output the protection action signal;

[0034] The response time calculation module is used to obtain the protection action signal trigger time and combine the input time with the protection action signal trigger time to obtain the total response time.

[0035] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the above-described method:

[0036] The analog power signal is input to the analog protection cabinet of the reactor protection system, the input time is recorded, and the threshold range of the analog power signal is judged to obtain the switching signal of the analog power signal.

[0037] The logic setting command corresponding to the switch signal is output to the logic protection simulator in the reactor protection system. The logic setting command is used to control the logic protection simulator to set the logic of the test channel and non-test channel of the logic protection cabinet.

[0038] The system receives the setting logic of the test channel and non-test channel from the logic protection simulator. When the setting logic of the test channel and non-test channel meets the preset response test logic, the system inputs the switch signal to the test channel of the logic protection cabinet in the reactor protection system and outputs the protection action signal to the signal acquisition device in the reactor protection system.

[0039] The output signal output command is sent to the signal acquisition device, and the signal output command is used to control the signal acquisition device to output the protection action signal;

[0040] The trigger time of the protection action signal is obtained, and the total response time is obtained by combining the input time with the trigger time of the protection action signal.

[0041] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the above-described method:

[0042] The analog power signal is input to the analog protection cabinet of the reactor protection system, the input time is recorded, and the threshold range of the analog power signal is judged to obtain the switching signal of the analog power signal.

[0043] The logic setting command corresponding to the switch signal is output to the logic protection simulator in the reactor protection system. The logic setting command is used to control the logic protection simulator to set the logic of the test channel and non-test channel of the logic protection cabinet.

[0044] The system receives the setting logic of the test channel and non-test channel from the logic protection simulator. When the setting logic of the test channel and non-test channel meets the preset response test logic, the system inputs the switch signal to the test channel of the logic protection cabinet in the reactor protection system and outputs the protection action signal to the signal acquisition device in the reactor protection system.

[0045] The output signal output command is sent to the signal acquisition device, and the signal output command is used to control the signal acquisition device to output the protection action signal;

[0046] The trigger time of the protection action signal is obtained, and the total response time is obtained by combining the input time with the trigger time of the protection action signal.

[0047] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of the above-described method:

[0048] The analog power signal is input to the analog protection cabinet of the reactor protection system, the input time is recorded, and the threshold range of the analog power signal is judged to obtain the switching signal of the analog power signal.

[0049] The logic setting command corresponding to the switch signal is output to the logic protection simulator in the reactor protection system. The logic setting command is used to control the logic protection simulator to set the logic of the test channel and non-test channel of the logic protection cabinet.

[0050] The system receives the setting logic of the test channel and non-test channel from the logic protection simulator. When the setting logic of the test channel and non-test channel meets the preset response test logic, the system inputs the switch signal to the test channel of the logic protection cabinet in the reactor protection system and outputs the protection action signal to the signal acquisition device in the reactor protection system.

[0051] The output signal output command is sent to the signal acquisition device, and the signal output command is used to control the signal acquisition device to output the protection action signal;

[0052] The trigger time of the protection action signal is obtained, and the total response time is obtained by combining the input time with the trigger time of the protection action signal.

[0053] The aforementioned test method, apparatus, computer equipment, storage medium, and computer program product for the response time of reactor protection system protection signals employs a logic protection simulator to configure the logic of the test and non-test channels of the logic protection cabinet. This simulates the channel logic that conforms to the response test logic of the reactor protection system. The switch signals obtained from the simulated protection cabinet are input to the test channels of the logic protection cabinet to efficiently output the protection action signal and enable the protection action signal to be triggered. Thus, the total response time of the protection signal during the test can be efficiently obtained by combining the input time of the simulated power signal. Attached Figure Description

[0054] Figure 1 This is an application environment diagram of a test method for the response time of a reactor protection system protection signal in one embodiment;

[0055] Figure 2 This is a flowchart illustrating a method for testing the response time of a reactor protection system protection signal in one embodiment.

[0056] Figure 3 This is a schematic diagram illustrating the structural principle of a simple card in a specific application example.

[0057] Figure 4 This is a flowchart illustrating a method for testing the response time of a reactor protection system protection signal in another embodiment.

[0058] Figure 5 The logic diagram for setting the channel status of the logic protection cabinet by the logic protection simulator in another specific application example;

[0059] Figure 6 This is a schematic diagram of the connection structure between the logic protection simulator and the logic protection cabinet in yet another specific application example.

[0060] Figure 7 This is a schematic diagram of the specific structure of a signal acquisition device in yet another concrete application example;

[0061] Figure 8 This is a structural block diagram of a test device for the response time of a reactor protection system protection signal in one embodiment;

[0062] Figure 9 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0063] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0064] The test method for the response time of the protection signal of the reactor protection system provided in this application embodiment can be applied to application environments in which a reactor protection system exists, such as... Figure 1 As shown, the test equipment 102 is communicatively connected to the reactor protection system 104. The reactor protection system 104 includes a simulation protection cabinet 106, a logic protection cabinet 109, a logic protection simulator 112, and a signal acquisition unit 115. The simulation protection cabinet 106 further includes a process instrument cabinet 107 and a nuclear instrument cabinet 108. The test equipment 102 tests the protection signal response time of the reactor protection system 104. In some embodiments, the application environment may also involve a server capable of communicating with the reactor protection system, using the server to test the protection signal response time of the reactor protection system. In other embodiments, the application environment may also involve both a terminal and a server, with the terminal communicating with the server via a network. The terminal can send test commands to the server to test the protection signal response time of the reactor protection system; alternatively, the terminal can send control commands to the server, which then sends these test commands to the test equipment of the reactor protection system for testing the protection signal response time. A data storage system can store the data that the server needs to process. Data storage systems can be integrated on servers, or they can be placed in the cloud or on other network servers.

[0065] When testing the response time of the protection signal of the reactor protection system 104, the test equipment 102 or server can perform the following test: input a simulated power signal into the simulated protection cabinet 106 of the reactor protection system, record the input time, and determine the threshold range of the simulated power signal to obtain the switch signal of the simulated power signal; output the logic setting command corresponding to the switch signal to the logic protection simulator 112 of the reactor protection system. The logic setting command is used to control the logic protection simulator 112 to perform logic settings on the test channel and non-test channel of the logic protection cabinet 109; receive... The logic protection simulator 112 provides feedback on the setting logic of the test channel and the non-test channel. When the setting logic of the test channel and the non-test channel meets the preset response test logic, it inputs the switch signal to the test channel of the logic protection cabinet 109 in the reactor protection system and outputs the protection action signal to the signal acquisition device 115 in the reactor protection system; it outputs the signal output command to the signal acquisition device 115, which is used to control the signal acquisition device 115 to output the protection action signal; it obtains the protection action signal trigger time and combines the input time with the protection action signal trigger time to obtain the total response time.

[0066] In one embodiment, such as Figure 2 As shown, a test method for the response time of a reactor protection system protection signal is provided, and this method is applied to... Figure 1 Taking the testing equipment in the example, the following steps are included:

[0067] S100 inputs the analog power signal to the analog protection cabinet in the reactor protection system, records the input time, and performs threshold range judgment on the analog power signal to obtain the switching signal of the analog power signal.

[0068] The simulated power signals refer to simulated current, resistance, and frequency power signals. In this application, a signal generator is used to replace traditional electronic devices such as transmitters and RTD probes in the testing process to output simulated power signals. For example, a standard 4mA to 20mA signal can be injected to replace a transmitter; a resistance signal can be injected to replace an RTD probe; a frequency signal can be injected to replace a speed probe; and pulse and micro-current signals can be injected to replace nuclear instruments. The testing equipment acquires the simulated power signals based on the output of the signal generator. The reactor protection system refers to all electrical and mechanical components and circuits from sensitive elements to safety drive systems and auxiliary facilities of the safety system. It generates signals related to the protection task to protect the integrity of the three nuclear safety barriers (i.e., fuel cladding, primary loop pressure boundary, and containment). When operating parameters reach thresholds that endanger the three barriers, the reactor is shut down urgently, and dedicated safety facilities are activated if necessary. The simulated protection cabinet refers to a cabinet capable of performing simulated signal processing, including process instrument cabinets and nuclear instrument cabinets. Switching signals refer to the acquisition and output of discontinuous signals, which have two states: 1 and 0.

[0069] Specifically, the test equipment inputs the analog power signal generated by the signal generator into the analog protection cabinet of the reactor protection system and records the time of input into the analog protection cabinet of the reactor protection system. This time is used as the start time of the test. After input into the analog protection cabinet of the reactor protection system, the analog power signal is judged for threshold range, thereby generating the switching signal of the analog power signal.

[0070] Furthermore, the simulated protection cabinet is divided into four protection groups. The test equipment inputs multiple simulated power signals generated by the signal generator to different protection groups within the simulated protection cabinet. A specific method for this could be: designing an easy-to-install, simple card, such as... Figure 3As shown, when bypassing the transmitter or other electronic device input signal, a designed card can be used to switch to the signal generator input. For example, if the signal generator is to replace a transmitter whose output signal is current, the TYPE3 card can be used for switching. Additionally, if the signal generator is to replace a resistance temperature detector (RTD) probe, the TYPE2 card can be used for switching. For signals such as main pump speed and nuclear instrument signals, these signals are connected to the cabinet via standard BNC and HN connectors. Therefore, during testing, the connection to the cabinet is also via BNC and HN connectors. The TYPE2 / TYPE3 cards are the same size as other Bailey 9020 cards in the protection group, and their interfaces are the same as those of the test switch cards, facilitating installation. A switch on the panel allows analog electronic signals to be injected into the analog protection cabinet through the test injection port on the panel when switched to the "T" position.

[0071] S200 outputs logic setting instructions corresponding to switch signals to the logic protection simulator in the reactor protection system. The logic setting instructions are used to control the logic protection simulator to set the logic for the test channels and non-test channels of the logic protection cabinet.

[0072] The logic protection cabinet refers to a cabinet capable of performing logical judgments. The logic protection simulator connects to the logic protection cabinet and can control the opening and triggering of channels within the cabinet. A test channel refers to the channel currently used to test the simulated power signal. A non-test channel refers to a channel through which the simulated power signal to be tested does not flow.

[0073] Specifically, the logic protection cabinet is divided into columns A and B. The logic protection simulator is connected to the logic protection cabinet. At this time, the test equipment outputs logic setting instructions to the logic protection simulator in the reactor protection system. The logic setting instructions are used to control the logic protection simulator to perform logic settings on both the test channels and non-test channels of the logic protection cabinet, and the logic setting results are fed back to the test equipment.

[0074] The S300 receives the setting logic of the test channel and non-test channel from the logic protection simulator. When the setting logic of the test channel and non-test channel meets the preset response test logic, it inputs the switch signal to the test channel of the logic protection cabinet in the reactor protection system and outputs the protection action signal to the signal acquisition device in the reactor protection system.

[0075] Specifically, the logic protection simulator sets the logic for the test channel and non-test channel according to the logic setting instructions and feeds the setting logic back to the test equipment. The test equipment receives the setting logic of the test channel and non-test channel fed back by the logic protection simulator. When the setting logic of the test channel and non-test channel meets the preset response test logic, which is the response test logic that enables the protection action signal to be output normally, the switch signal is input to the test channel of the logic protection cabinet in the reactor protection system. At this time, the protection action signal can be output to the signal acquisition device in the reactor protection system.

[0076] S400 outputs a signal trigger command to the signal acquisition unit. The signal trigger command is used to control the signal acquisition unit to respond to the protection action signal.

[0077] Among them, the signal acquisition device refers to the device that collects various protection action signals output by the logic protection cabinet.

[0078] Specifically, the test equipment outputs signals and commands to the signal acquisition unit. The signal acquisition unit then outputs the acquired protection action signals to various actuators according to the signal output commands, so that the protection action signals can be triggered to implement protection actions.

[0079] S500 obtains the protection action signal trigger time and combines the input time with the protection action signal trigger time to obtain the total response time.

[0080] Specifically, the total response time of the reactor protection system protection signal refers to the time from the injection of the signal into the simulated protection cabinet to the generation and triggering of the protection action signal. Therefore, the final total response time can be obtained by the input time recorded when the simulated power signal is input into the simulated protection cabinet of the reactor protection system, and the trigger time of the protection action signal obtained after the signal output command control signal acquisition device outputs the protection action signal.

[0081] In the above-mentioned test method for the response time of the reactor protection system protection signal, a logic protection simulator is used to set the logic of the test channel and non-test channel of the logic protection cabinet, simulate the channel logic that conforms to the response test logic of the reactor protection system, and input the switch signal obtained from the simulated protection cabinet to the test channel of the logic protection cabinet to efficiently output the protection action signal and enable the protection action signal to be triggered. Thus, the total response time of the protection signal during the test can be efficiently obtained by combining the input time of the simulated power signal.

[0082] In one embodiment, before determining the threshold range of the analog power signal to obtain the switching signal of the analog power signal, the method further includes:

[0083] Filter the analog power signal.

[0084] Specifically, when the analog power signal is input to the analog protection cabinet of the reactor protection system, the analog power signal needs to be filtered to obtain an analog power signal with abnormal noise signals removed, and then the threshold range of the filtered analog power signal is determined.

[0085] In this embodiment, by filtering the analog power signal, an analog power signal with abnormal noise signals removed can be obtained, making the process of determining the threshold range of the filtered analog power signal more efficient.

[0086] In one embodiment, determining the threshold range of the analog power signal to obtain the switching signal of the analog power signal includes:

[0087] Threshold range determination is performed on analog power signals.

[0088] Specifically, a preset signal threshold range is obtained. Based on the preset signal threshold range, the threshold range of the analog power signal can be judged to obtain the threshold range judgment result. The threshold range judgment result can be that the analog power signal is greater than the preset signal threshold range or that the analog power signal is not greater than the preset signal threshold range.

[0089] A low-level signal is obtained when the simulated power signal exceeds the preset signal threshold range.

[0090] Specifically, when the result of the threshold range determination is that the analog power signal is greater than the preset signal threshold range, the analog power signal does not meet the preset signal threshold range. At this time, it is considered that the analog power signal is not the signal required by this application, and it is converted into a low-level signal. Therefore, a low-level signal can be obtained based on the analog power signal that is greater than the preset signal threshold range.

[0091] A high-level signal is obtained when the simulated power signal is not greater than the preset signal threshold range.

[0092] Specifically, when the threshold range determination result is that the analog power signal is not greater than the preset signal threshold range, the analog power signal meets the preset signal threshold range. At this time, the analog power signal is considered to be the signal we need, and it is converted into a high-level signal. Therefore, a high-level signal can be obtained based on the analog power signal that is not greater than the preset signal threshold range.

[0093] Based on low-level and high-level signals, the switching signals of analog power signals are obtained.

[0094] Specifically, a low-level signal can be obtained based on an analog power signal that is greater than a preset signal threshold range, and a high-level signal can be obtained based on an analog power signal that is not greater than a preset signal threshold range. Therefore, for an analog power signal, by combining the obtained low-level signal and high-level signal, the final switching signal of the analog power signal can be obtained.

[0095] In this embodiment, a low-level signal is obtained when the simulated power signal is greater than the preset signal threshold range, and a high-level signal is obtained when the simulated power signal is not greater than the preset signal threshold range. Signals that do not meet the preset signal threshold range can be removed.

[0096] In one embodiment, before the logic setting instruction corresponding to the output switch signal is sent to the logic protection simulator in the reactor protection system, the method further includes:

[0097] Output initialization commands to the logic protection simulator in the reactor protection system. The initialization commands are used to set the test channels and non-test channels of the logic protection cabinet to their initial states.

[0098] Specifically, the logic protection simulator is connected to the logic protection cabinet to control the channel status within the cabinet. Since the signal generator can output various analog power signals during testing, and all of these signals need to be tested, each signal must pass through the logic protection cabinet and output various protection action signals. To ensure the logic protection cabinet can perform logic tests on each signal individually, the testing equipment outputs an initialization command to the logic protection simulator in the reactor protection system before each signal is logically tested within the cabinet. This allows the logic protection simulator to control and set both the test channels and non-test channels of the logic protection cabinet to their initial state—that is, a state without logic settings.

[0099] In this embodiment, by outputting initialization commands to the logic protection simulator in the reactor protection system, the test channels and non-test channels of the logic protection cabinet are set to their initial states, which ensures that logic tests are performed on multiple signals one by one.

[0100] In one embodiment, such as Figure 4 As shown, S200 includes:

[0101] S220: Obtain the test channel, non-test channel, and preset response test logic corresponding to the switch signals in the logic protection cabinet.

[0102] Specifically, the logic protection cabinet contains multiple channels. One channel is selected as the test channel corresponding to the switch signal, while the others are used as non-test channels corresponding to the switch signal.

[0103] The preset response test logic is the test logic that the test channel and non-test channel should have. It can be a 2 out of 3 or a 2 out of 4 logic. The 2 out of 3 means that if two or more of the three channels meet the condition, the output will be 1. The 2 out of 4 means that if two or more of the four channels meet the condition, the output will be 1. The preset response test logic is the corresponding preset response logic for the switch signal of the simulated power signal obtained by the test equipment.

[0104] S240 obtains the response test logic corresponding to the switch signal based on the test channel, non-test channel, and preset response test logic.

[0105] Specifically, after obtaining the test channel and non-test channel corresponding to the switch signal, the response test logic corresponding to the switch signal can be obtained according to the preset response test logic, that is, the response test logic that the test channel and non-test channel corresponding to the switch signal need to meet.

[0106] S260, based on the response test logic, outputs logic setting instructions to the logic protection simulator in the reactor protection system.

[0107] Specifically, in order to output protection action signals, it is necessary to configure the logic protection cabinet according to the response test logic. Based on the obtained response test logic, the setting logic of the test channel and non-test channel corresponding to the switch signal can be obtained, thereby outputting the corresponding logic setting instructions to the logic protection simulator in the reactor protection system, opening the test channel of the logic protection simulator, and setting the logic of the non-test channel to trigger.

[0108] Taking the test of the response time of the voltage regulator when the high pressure signal trips as an example, as shown in Table 1 below, the multiple simulated power signals are RCP005MP, RCP013MP, and RCP006MP. When testing RCP005MP, the channel through which RCP005MP passes is taken as the test channel, and the channels through which the other signals pass are taken as non-test channels. The logic protection simulator is used to open the channel where RCP005MP is located and trigger the channel through which RCP006MP passes to a low level. A step signal of a certain amplitude is injected into the test terminal of RCP005MP. After satisfying the three-out-of-two logic, the output terminal can receive the trip signal, that is, the protection action signal can be obtained.

[0109] Table 1. Test Results of Response Time of High Pressure Signal Tripping from the Voltage Regulator

[0110]

[0111] Furthermore, the logic protection simulator sets the channel status of the logic protection cabinet using the following logic schematic: Figure 5As shown, an analog switch is installed on the setting panel. When the switch is set to the "N" position, the upstream signal of the protection group is enabled; when the switch is set to the "0" position, the electrical 0 signal is enabled; and when the switch is set to the "1" position, the electrical 1 signal is enabled. Setting the channel status is for triggering non-test channels and enabling test channels. Setting it to "N" indicates an open channel, setting it to "0" indicates signal triggering, and setting it to "1" indicates no signal triggering.

[0112] To ensure simultaneous testing of reactor protection system A / B sections, four logic protection simulators were used on-site. Two were used for the reactor shutdown section, and the other two were used for a dedicated section. The connection between the logic protection simulators and the logic protection cabinet used a test interface, such as... Figure 6 As shown.

[0113] In this embodiment, by obtaining the response test logic corresponding to the switch signal and outputting the logic setting instruction to the logic protection simulator in the reactor protection system, the logic protection simulator can ensure that the logic protection cabinet meets the conditions for outputting protection action signals, thereby outputting protection action signals normally.

[0114] In one embodiment, it also includes:

[0115] Acquire each analog power signal; based on each analog power signal, output each protection action signal to the signal acquisition unit in the reactor protection system.

[0116] Specifically, the signal generator can replace electronic devices such as transmitters and RTD probes to sequentially output various analog power signals. Based on each analog power signal, it is input to the analog protection cabinet in the reactor protection system, records the input time of each analog power signal, and performs threshold range judgment on each analog power signal to obtain the switching signal of each analog power signal. Each switching signal is input to the test channel of the logic protection cabinet in the reactor protection system, and outputs logic setting instructions to the logic protection simulator in the reactor protection system. The logic setting instructions are used to control the logic protection simulator to set the logic of the non-test channels of the logic protection cabinet. The generator receives the setting logic of the non-test channels from the logic protection simulator. When the switching signal of the test channel and the setting logic of the corresponding non-test channel meet the preset response test logic, it outputs each protection action signal to the signal acquisition unit in the reactor protection system.

[0117] Identify the protection action signals that do not need to be monitored and the protection action signals that need to be monitored among the various protection action signals.

[0118] Specifically, the signal acquisition device contains various protection action signals. Since the response time of different protection signals is tested differently, when testing the response time of the protection signals, it is necessary to identify the protection action signals that do not need to be monitored and the protection action signals that need to be monitored.

[0119] The signal monitoring command is output to the signal acquisition device. The signal monitoring command is used to control the signal acquisition device to put the protection action signals that do not need to be monitored in the locked position, and to monitor the protection action signals that need to be monitored.

[0120] Specifically, the specific structure of the signal acquisition device is as follows: Figure 7 As shown, the signal acquisition unit contains a junction box, which sends various protection action signals to a junction box. These signals are all normally open contacts, which are connected in series in the junction box. Each signal is equipped with a lockout switch. The test equipment outputs a signal monitoring command to the signal acquisition unit, which places the identified protection action signals that do not need to be monitored in the lockout position, thereby shielding them.

[0121] In this embodiment, by identifying the protection action signals that do not need to be monitored and the protection action signals that need to be monitored among the various protection action signals, it is possible to monitor the protection action signals that need to be monitored in different test stages, which is efficient and convenient.

[0122] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0123] Based on the same inventive concept, this application also provides a test apparatus for the reactor protection system protection signal response time to implement the test method for the reactor protection system protection signal response time described above. The solution provided by this apparatus is similar to the solution described in the above method. Therefore, the specific limitations of one or more test apparatus embodiments for the reactor protection system protection signal response time provided below can be found in the limitations of the test method for the reactor protection system protection signal response time described above, and will not be repeated here.

[0124] In one embodiment, such as Figure 8 As shown, a test device for the response time of a reactor protection system protection signal is provided, comprising: an analog protection module 100, a logic protection module 200, a signal acquisition module 300, a signal triggering module 400, and a response time calculation module 500, wherein:

[0125] The analog protection module 100 is used to input analog power signals into the analog protection cabinet of the reactor protection system, record the input time, and determine the threshold range of the analog power signals to obtain the switching signals of the analog power signals.

[0126] The logic protection module 200 is used to output logic setting instructions corresponding to switch signals to the logic protection simulator in the reactor protection system. The logic setting instructions are used to control the logic protection simulator to set the logic of the test channel and non-test channel of the logic protection cabinet.

[0127] The signal acquisition module 300 is used to receive the setting logic of the test channel and non-test channel from the logic protection simulator. When the setting logic of the test channel and non-test channel meets the preset response test logic, the switch signal is input to the test channel of the logic protection cabinet in the reactor protection system, and the protection action signal is output to the signal acquisition device in the reactor protection system.

[0128] The signal triggering module 400 is used to output signal output commands to the signal acquisition device. The signal output commands are used to control the signal acquisition device to output protection action signals.

[0129] The response time calculation module 500 is used to obtain the trigger time of the protection action signal and combine the input time with the trigger time of the protection action signal to obtain the total response time.

[0130] In one embodiment, a filtering module is also included, which is used to filter the analog power signal.

[0131] In one embodiment, the analog protection module 100 is further configured to determine the threshold range of the analog power signal; when the analog power signal is greater than the preset signal threshold range, a low-level signal is obtained; when the analog power signal is not greater than the preset signal threshold range, a high-level signal is obtained; and based on the low-level signal and the high-level signal, a switching signal of the analog power signal is obtained.

[0132] In one embodiment, a channel initialization module is also included. The channel initialization module is used to output initialization instructions to the logic protection simulator in the reactor protection system. The initialization instructions are used to set the test channels and non-test channels of the logic protection cabinet to the initial state.

[0133] In one embodiment, the logic protection module 200 is further configured to acquire the test channel, non-test channel, and preset response test logic corresponding to the switch signal in the logic protection cabinet; acquire the response test logic corresponding to the switch signal based on the test channel, non-test channel, and preset response test logic; and output a logic setting instruction to the logic protection simulator in the reactor protection system based on the response test logic.

[0134] In one embodiment, the system further includes a signal monitoring module that acquires each analog power signal; outputs each protection action signal to a signal acquisition unit in the reactor protection system based on each analog power signal; identifies protection action signals that do not need to be monitored and protection action signals that need to be monitored; and outputs a signal monitoring command to the signal acquisition unit, the signal monitoring command being used to control the signal acquisition unit to place the protection action signals that do not need to be monitored in a locked position and to monitor the protection action signals that need to be monitored.

[0135] Each module in the aforementioned reactor protection system protection signal response time testing device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device, or stored in the computer device's memory as software, so that the processor can call and execute the corresponding operations of each module.

[0136] In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 9 As shown, this computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides the environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The database stores analog power signal data. The I / O interfaces are used for exchanging information between the processor and external devices. The communication interface is used for communication with external terminals via a network connection. When executed by the processor, the computer program implements a method for testing the response time of protection signals in a reactor protection system.

[0137] Those skilled in the art will understand that Figure 9The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0138] In one embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above method embodiments.

[0139] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above method embodiments.

[0140] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above method embodiments.

[0141] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0142] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0143] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for testing the response time of a reactor protection system's protection signal, characterized in that, The method includes: The analog power signal is input to the analog protection cabinet of the reactor protection system, the input time is recorded, and the threshold range of the analog power signal is judged to obtain the switching signal of the analog power signal. The logic setting instruction corresponding to the switch signal is output to the logic protection simulator in the reactor protection system. The logic setting instruction is used to control the logic protection simulator to set the logic of the test channel and non-test channel of the logic protection cabinet in the reactor protection system. The system receives the setting logic of the test channel and non-test channel from the logic protection simulator. When the setting logic of the test channel and non-test channel meets the preset response test logic, the system inputs the switch signal to the test channel of the logic protection cabinet in the reactor protection system and outputs the protection action signal to the signal acquisition device in the reactor protection system. The output signal output command is sent to the signal acquisition device, and the signal output command is used to control the signal acquisition device to output the protection action signal; The trigger time of the protection action signal is obtained, and the total response time is obtained by combining the input time with the trigger time of the protection action signal.

2. The method according to claim 1, characterized in that, Before determining the threshold range of the analog power signal to obtain the switching signal of the analog power signal, the method further includes: The analog power signal is filtered.

3. The method according to claim 1, characterized in that, The step of determining the threshold range of the simulated power signal to obtain the switching signal of the simulated power signal includes: The threshold range of the simulated power signal is determined; When the simulated power signal is greater than a preset signal threshold range, a low-level signal is obtained; A high-level signal is obtained when the simulated power signal is not greater than a preset signal threshold range; Based on the low-level signal and the high-level signal, the switching signal of the analog power signal is obtained.

4. The method according to claim 1, characterized in that, Before outputting the logic setting command corresponding to the switch signal to the logic protection simulator in the reactor protection system, the method further includes: An initialization command is output to the logic protection simulator in the reactor protection system. The initialization command is used to set the test channel and the non-test channel of the logic protection cabinet to the initial state.

5. The method according to claim 1, characterized in that, The step of outputting the logic setting command corresponding to the switch signal to the logic protection simulator in the reactor protection system includes: Obtain the test channel, non-test channel, and preset response test logic corresponding to the switch signal in the logic protection cabinet; Based on the test channel, the non-test channel, and the preset response test logic, obtain the response test logic corresponding to the switch signal; Based on the response test logic, the logic setting command is output to the logic protection simulator in the reactor protection system.

6. The method according to claim 1, characterized in that, Also includes: Acquire various analog power signals; Based on the simulated power signals, output the protection action signals to the signal acquisition unit in the reactor protection system; Identify the protection action signals that do not need to be monitored and the protection action signals that need to be monitored from among the various protection action signals; The signal monitoring command is output to the signal acquisition device, which controls the signal acquisition device to place the protection action signal that does not need to be monitored in the locked position and to monitor the protection action signal that needs to be monitored.

7. A testing device for the response time of a reactor protection system protection signal, characterized in that, The device includes: The analog protection module is used to input analog power signals into the analog protection cabinet of the reactor protection system, record the input time, and determine the threshold range of the analog power signals to obtain the switching signals of the analog power signals. The logic protection module is used to output the logic setting instructions corresponding to the switch signals to the logic protection simulator in the reactor protection system. The logic setting instructions are used to control the logic protection simulator to set the logic of the test channel and non-test channel of the logic protection cabinet in the reactor protection system. The signal acquisition module is used to receive the setting logic of the test channel and the non-test channel fed back by the logic protection simulator. When the setting logic of the test channel and the non-test channel meets the preset response test logic, the switch signal is input to the test channel of the logic protection cabinet in the reactor protection system, and the protection action signal is output to the signal acquisition device in the reactor protection system. The signal triggering module is used to output a signal output command to the signal acquisition device, and the signal output command is used to control the signal acquisition device to output the protection action signal; The response time calculation module is used to obtain the protection action signal trigger time and combine the input time with the protection action signal trigger time to obtain the total response time.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

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