Photoelectric element overload test device under high-speed impact and damage assessment method thereof

Abstract

The present application proposes a device for testing an overload of an optoelectronic component under high-speed impact and a damage assessment method thereof, wherein the test device comprises a test body having a first shell body, wherein the first shell body has a partition assembly and optoelectronic components and a first load measurement assembly arranged on both sides of the partition assembly; and further comprises a load acquisition assembly electrically connected to the first load measurement assembly; when in use, a high-speed impact force acts on the first shell body, and then the impact force is transmitted to the optoelectronic components and the first load measurement assembly through the partition assembly, and the load size acting on the optoelectronic components measured by the first load measurement assembly is obtained through the load acquisition assembly; after the impact, the optoelectronic components are taken out and detected on the damage detection assembly to obtain the damage condition, and the load size acting on the optoelectronic components obtained according to the first load measurement assembly is obtained, and the corresponding relationship between the load and the damage is obtained, so as to provide a reference for the selection of optoelectronic components of the guidance system and the implementation of anti-overload design.

Description

Technical Field

[0001] The present application relates to the technical field of optoelectronic components, and in particular to an overload test device for optoelectronic components under high-speed impact and a damage assessment method thereof. Background Art

[0002] With the development of science and technology, especially the rapid development of microelectronics and optoelectronics, the guidance process of ammunition has been greatly promoted. However, there will be a huge impact load during the launch of ammunition. Under such extreme conditions, if the guidance system is not unloaded, it will have an adverse effect on various optoelectronic components of the guidance system. In severe cases, the optoelectronic components will fail and cannot work normally. Therefore, the establishment of an optoelectronic component damage assessment device provides a very important reference for selecting appropriate optoelectronic components for the guidance system and implementing anti-overload design. Summary of the invention

[0003] In view of the above-mentioned defects or deficiencies in the prior art, the present application aims to provide a photoelectric element overload test device under high-speed impact and a damage assessment method thereof.

[0004] In a first aspect, the present application provides a device for testing an overload of a photoelectric element under high-speed impact, comprising a test body, a load acquisition component, and a damage detection component;

[0005] The test body comprises:

[0006] A first shell body, wherein the first shell body has a first space therein and one end of the first shell body has a first opening;

[0007] A partition component, the partition component is arranged in the middle of the first space, and its two ends are connected to the inner wall of the first shell body, and the partition component divides the first space into a second space and a third space connected to the first opening; the second space is used to place the optoelectronic components, and the optoelectronic components are arranged in the middle of the partition component;

[0008] a first load measuring assembly, which is disposed in the third space, is arranged at one end of the partition assembly away from the optoelectronic component, and is coaxially arranged with the optoelectronic component; when the outer wall of the first housing body close to the first load measuring assembly is subjected to a high-speed impact, the first load measuring assembly is used to measure the impact load transmitted to the optoelectronic component;

[0009] The load acquisition component is disposed outside the first housing body and is electrically connected to the first load measurement component, and the load acquisition component is used to acquire the load measured by the first load measurement component;

[0010] The damage detection component is used to obtain the damage condition of the optoelectronic component after being impacted.

[0011] The technical solution provided in the embodiment of the present application also includes:

[0012] A test cavity, wherein the test cavity has a first cavity;

[0013] An end cover body, the end cover body is arranged in the first cavity, and includes a left end cover and a right end cover distributed along a first direction; the left end cover and the right end cover are both provided with a first groove on the sides close to each other, and a fourth space is formed between the two first grooves;

[0014] A second shell body, the second shell body is placed in the fourth space, and its two ends are respectively connected to the left end cover and the right end cover, and a fifth space and a sixth space are distributed in the second shell body along the first direction; the test body is arranged in the fifth space, and its outer wall is in close contact with the inner wall of the second shell body;

[0015] A second load measurement assembly, the second load measurement assembly is arranged in the sixth space, arranged in the middle of the left end cover, and arranged coaxially with the test body;

[0016] An impact shell, wherein the impact shell is arranged on the side of the left end cover away from the right end cover, and the outer wall of the impact shell is in close contact with the inner wall of the test cavity;

[0017] A pneumatic drive assembly is used to drive the left end cover where the impact shell is located to move away from the right end cover to apply a high-speed impact force.

[0018] According to the technical solution provided in the embodiment of the present application, a first buffer assembly is provided between the left end cover and the impact shell.

[0019] According to the technical solution provided in the embodiment of the present application, a second buffer assembly is provided between the outer wall of the first shell body and the inner wall of the second shell body.

[0020] According to the technical solution provided in the embodiment of the present application, the outer shell of the test cavity is provided with a silencer assembly.

[0021] According to the technical solution provided in the embodiment of the present application, a third buffer assembly is provided between the end of the right end cover away from the left end cover and the inner wall of the first cavity.

[0022] The technical solution provided in the embodiment of the present application also includes:

[0023] A drop body, the test body is provided on the drop body, the axis direction of the test body is the second direction, and the first opening is located away from the drop body;

[0024] An electric drive assembly is used to drive the drop body to rise to a preset height along the second direction; after reaching the preset height, under the action of gravity, the drop body drives the test body to fall.

[0025] According to the technical solution provided in the embodiment of the present application, a load amplification component is provided on the drop body, and the test body is provided on the side of the load amplification component away from the drop body.

[0026] According to the technical solution provided in the embodiment of the present application, a mounting block is provided on the load amplification component, the test body is installed on the mounting block away from the side of the load amplification component, and a third load measurement component is also provided on the mounting block, and the third load measurement component is arranged on one side of the test body.

[0027] In a second aspect, the present application proposes a damage assessment method for a photoelectric element overload test device under high-speed impact as described above, comprising the following steps:

[0028] S100, installing the optoelectronic components into the test body;

[0029] S101, applying a high-speed impact force to the test body;

[0030] S102, obtaining, by the load acquisition component, a load value measured by the first load measurement component, that is, a first load value;

[0031] S103, taking out the optoelectronic components and observing the damage of the optoelectronic components;

[0032] S104. Repeat steps S100-S103 to obtain a damage correspondence table; the damage correspondence table includes the first load value and the corresponding damage condition.

[0033] In summary, the present application proposes a photoelectric component overload test device under high-speed impact, which comprises a test body having a first shell body, a partition assembly and photoelectric components and a first load measurement assembly arranged on both sides of the partition assembly. When the first shell body is subjected to a high-speed impact, the first load measurement assembly is used to measure the impact load transmitted to the photoelectric components. The device also comprises a load acquisition assembly electrically connected to the first load measurement assembly, which is used to obtain the load measured by the first load measurement assembly. When in use, a high-speed impact force acts on the first shell body, and the impact force is then transmitted to the photoelectric components and the first load measurement assembly through the partition assembly, and the load acquisition assembly obtains the size of the load acting on the photoelectric components measured by the first load measurement assembly.

[0034] After the impact, the optoelectronic components are taken out and tested on the damage detection component to obtain the damage condition, and the load size acting on the optoelectronic components is obtained according to the first load measurement component, and the corresponding relationship between the load and the damage is obtained, which provides a reference for the selection of optoelectronic components of the guidance system and the implementation of anti-overload design. In addition, the present application avoids applying high-speed impact force directly to the optoelectronic components by setting a shell outside the optoelectronic components and applying high-speed impact force on the shell, avoiding multiple damage to the optoelectronic components during the test process and avoiding waste. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 A schematic diagram of the structure of the test body provided in the embodiment of the present application;

[0036] Figure 2 A schematic diagram of the structure of the test device provided for application Example 1;

[0037] Figure 3 for Figure 2 A partial enlarged view of middle A;

[0038] Figure 4 A schematic diagram of the structure of the test device provided in Example 2 of the present application;

[0039] Figure 5 This is a flow chart of the damage assessment method for the test device provided in Example 3 of the present application.

[0040] 1. Test body; 11. First shell body; 12. First opening; 13. Partition assembly; 14. Second space; 15. Third space; 16. First load measurement assembly; 17. Lens base; 18. Buffer pad; 2. Optoelectronic components; 3. Test cavity; 31. First cavity; 41. Left end cover; 42. Right end cover; 43. Fourth space; 44. Second shell body; 441. Fifth space; 442. Sixth space; 5. Second load Measuring assembly; 6, impact shell; 61, piston; 62, air source; 63, inflation valve; 71, first buffer assembly; 72, second buffer assembly; 73, third buffer assembly; 8, silencer assembly; 9, drop body; 91, lower pressure plate; 92, upper pressure plate; 100, test base; 101, drive rod; 102, pneumatic clamp; 103, guide rod; 200, load amplification assembly; 300, mounting block; 400, third load measurement assembly. DETAILED DESCRIPTION

[0041] The present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the relevant invention, rather than to limit the invention. It is also necessary to explain that, for ease of description, only the parts related to the invention are shown in the accompanying drawings.

[0042] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0043] Example 1

[0044] As the technical problem mentioned in the background technology, the present application proposes a photoelectric element overload test device under high-speed impact, including a test body 1, a load acquisition component and a damage detection component;

[0045] The test body 1 comprises:

[0046] A first shell body 11, wherein the first shell body 11 has a first space therein and a first opening 12 at one end thereof;

[0047] A partition component 13, the partition component 13 is arranged in the middle of the first space, and its two ends are connected to the inner wall of the first housing body 11, the partition component 13 divides the first space into a second space 14 and a third space 15 connected to the first opening 12; the second space 14 is used to place the optoelectronic component 2, and the optoelectronic component 2 is arranged in the middle of the partition component 13;

[0048] a first load measuring component 16, which is disposed in the third space 15, is arranged at one end of the partition component 13 away from the optoelectronic component 2, and is coaxially arranged with the optoelectronic component 2; when the outer wall of the first housing body 11 close to the first load measuring component 16 is subjected to a high-speed impact, the first load measuring component 16 is used to measure the impact load transmitted to the optoelectronic component 2;

[0049] The load acquisition component is disposed outside the first housing body 11 and is electrically connected to the first load measurement component 16 . The load acquisition component is used to acquire the load measured by the first load measurement component 16 .

[0050] The damage detection component is used to obtain the damage condition of the optoelectronic component 2 after being impacted.

[0051] Please refer to Figure 1As shown, the first housing body 11 is a hollow cylindrical type, the partition component 13 is a circular baffle, optionally, the partition component 13 and the inner wall of the first housing body 11 are connected by screwing, the partition component 13 is provided with a lens base 17 near the first opening 12, the optoelectronic component 2 is provided in the middle of the lens base 17, optionally, the size of the optoelectronic component 2 is 32*32*21mm, the size of the lens base 17 is Φ46*10mm, the first load measurement component 16 is an acceleration sensor, the load The acquisition component is an oscilloscope, and a threading hole is provided on the test body 1. The wire of the acceleration sensor is connected to the oscilloscope arranged outside the test body 1 through the threading hole; when the first shell body 11 is subjected to a high-speed impact force, the impact force passes through the first shell body 11 and the partition component 13 to the first load measurement component 16. Since the first load measurement component 16 and the optoelectronic component 2 are coaxially arranged on both sides of the partition component 13, the load measured by the first load measurement component 16 can be used to characterize the load on the optoelectronic component 2.

[0052] In addition, the inner walls of the second space 14 and the third space 15 are provided with a buffer pad 18, which is sleeved in the ring and sleeved outside the partition component 13. The outer circle size of the buffer pad 18 is Φ46mm, the inner circle size is Φ26mm, and the thickness is 23mm. According to the sizes of the optoelectronic component 2, the lens base 17, the buffer pad 18, etc., the size of the first housing body 11 is designed to be Φ52mm*66mm, and the wall thickness is 3mm. The buffer pad 18 is used to prevent the load transmitted to the first load measurement component 16 and the optoelectronic component 2 from being too large, causing damage to the first load measurement component 16 and the optoelectronic component 2.

[0053] When the acceleration sensor transmits the load to the oscilloscope, the operator can obtain the amplitude and pulse width of the load by operating the oscilloscope, and take out the impacted optoelectronic component 2 from the first opening 12 to the damage detection component for damage inspection. Optionally, the damage detection component is a metallographic analysis microscope, through which the microscopic image of the optoelectronic component 2 can be viewed, and whether microcracks are generated inside the optoelectronic component 2, the direction of crack extension, and port characteristics, etc. can be analyzed. Therefore, according to the load size obtained by the load acquisition component and the damage obtained by the damage detection component, the corresponding relationship between load and damage can be obtained, providing a reference for the guidance system to implement load reduction. In addition, the present application sets the first shell body 11 outside the optoelectronic component 2, and applies a high-speed impact force on the first shell body 11, instead of applying a high-speed impact force on the optoelectronic component 2, so as to avoid multiple damages to the optoelectronic component 2 during the test process and avoid waste.

[0054] In a preferred embodiment, the testing device further comprises:

[0055] A test cavity 3, wherein the test cavity has a first cavity 31;

[0056] An end cover body, which is disposed in the first cavity 31 and includes a left end cover 41 and a right end cover 42 distributed along a first direction; first grooves are provided on the sides of the left end cover 41 and the right end cover 42 close to each other, and a fourth space 43 is formed between the two first grooves;

[0057] A second shell body 44, the second shell body 44 is placed in the fourth space 43, and its two ends are connected to the left end cover 41 and the right end cover 43 respectively. A fifth space 441 and a sixth space 442 are arranged in the second shell body 44 along the first direction; the test body 1 is arranged in the fifth space 441, and its outer wall is in close contact with the inner wall of the second shell body 44;

[0058] A second load measuring assembly 5, the second load measuring assembly 5 is disposed in the sixth space 442 and is electrically connected to the load acquisition assembly, the second load measuring assembly 5 is disposed in the middle of the left end cover 41 and is coaxially disposed with the test body 1;

[0059] The impact shell 6 is arranged on the side of the left end cover 41 away from the right end cover 42, and its outer wall is closely attached to the inner wall of the first cavity 31;

[0060] A pneumatic drive assembly is used to drive the left end cover 41 where the impact shell 6 is located to exert a high-speed impact force away from the right end cover 42.

[0061] Please refer to Figure 1-3 As shown, the test cavity 3 is a hollow cylindrical gun barrel, and the first direction is the axial direction of the gun barrel. Figure 3 In the left-right direction shown, the right end of the test cavity 3 is closed, and the end cover body is arranged near the right end of the test cavity 3. Optionally, the left end cover 41 and the right end cover 42 have the same structure and are symmetrically arranged. The left end cover 41 and the right end cover 42 are frustum structures, and the bottom surfaces with larger radii are close to each other. The outer walls of the ends of the left end cover 41 and the right end cover 42 close to each other are tightly attached to the inner wall of the test cavity 3, the cross-section of the first groove is circular, and the outer shape of the second shell body 44 is cylindrical.

[0062] In this embodiment, an air cannon is used to apply a high-speed impact force to the test body 1. The test cavity 3 includes a first portion extending in the left-right direction and a second portion extending in the vertical direction. A piston 61 is provided in the second portion. The outer wall of the piston 61 is in close contact with the inner wall of the second portion. A first air chamber is formed between the piston 61 and the side of the impact shell 6 away from the left end cover, and a second air chamber is formed between the side of the piston 61 away from the impact shell 6 and the inner wall of the second portion. An air source 62 and an air charging valve 63 connected to the air source 62 are provided outside the test cavity 3. The air charging valve 63 is connected to the second air chamber. The second air chamber is inflated through the air charging valve 63. The air pressure of the second air chamber is greater than the air pressure of the first air chamber, driving the piston 61 to move toward the side close to the impact shell 6, so that the impact shell 6 moves at high speed along the first direction toward the direction close to the left end cover 41 under the action of the air pressure of the first air chamber.

[0063] Optionally, the second load measurement component 5 is the same as the first load measurement component 16, which is an acceleration sensor, and both are connected to the oscilloscope, through which the load size measured by the second load measurement component 5 can be obtained; when the impact shell 6 is subjected to a high-speed impact force, it first acts on the left end cover 41, and the second load measurement component 5 arranged on the left end cover 41 can measure the size of the load, and the impact force is transmitted to the first load measurement component 16 and the optoelectronic component 2 through the second shell body 44, the first shell body 11 and the partition component 13.

[0064] During the test, the optoelectronic component 2 may not be placed in for impact first. By setting the pressure of the pneumatic drive assembly, the impact force applied to the left end cover 41 can be changed until the load amplitude and pulse width transmitted by the second load measurement assembly 5 obtained by the oscilloscope are close to the expected set value, and then the optoelectronic component 2 is installed and the impact test is performed again. In this way, the pressure is adjusted by the load size obtained by the second load measurement assembly 5, so as to determine the test plan with the optoelectronic component 2 installed, avoiding the damage of the optoelectronic component 2 and the acceleration sensor caused by directly applying an impact force without any basis to the test body 1, thereby improving the utilization rate of the optoelectronic component 2.

[0065] In a preferred embodiment, a first buffer assembly 71 is provided between the left end cover 41 and the impact shell 6 .

[0066] Please refer to Figure 1 As shown, optionally, the first buffer component 71 is a wool felt pad. When the pneumatic drive component drives the impact shell 6 to move, it first acts on the first buffer component 71 and then acts on the left end cover 41. By setting the thickness of the first buffer component 71, the second load measurement component 5 can also be adjusted to measure the size of the impact load on the left end cover 41; therefore, the present application can adjust the size of the load acting on the left end cover 41 in two ways: by adjusting the pressure and the thickness of the wool felt pad. The greater the pressure, the greater the load amplitude and the narrower the pulse width; the thicker the wool felt pad, the smaller the load amplitude and the wider the pulse width; generally, if the amplitude of the load measured by the second load measurement component 5 is significantly different from the expected value, first adjust the pressure and then adjust the thickness of the wool felt pad. When the difference is not large, adjust it by changing the thickness of the wool felt pad.

[0067] In addition, the inner wall of the test cavity 3 is mirror-finished, so when the impact shell 6, the end cover body, and the first buffer assembly 71 move in the first cavity 31, the friction force with the inner wall of the test cavity 3 will not affect the load size.

[0068] In a preferred embodiment, a second buffer assembly 72 is provided between the outer wall of the first shell body 1 and the inner wall of the second shell body 44 .

[0069] Please refer to Figure 2-3As shown, the second shell body 44 is a hollow cylinder with a circular partition plate in the middle, the partition plate divides the interior of the second shell body into a sixth space 442 on the left and a fifth space 441 on the right, a circle of bosses is provided inside the second shell body 44 of the fifth space 441, a seventh space is formed between the bosses and the right end cover 42, the test body 1 is arranged in the seventh space, the first shell body 11 of the test body 1 has a first side wall corresponding to the first opening 12, and a second side wall connecting the first side wall and the first opening 12, the first side wall abuts against the boss near the right end cover 42, and the second side wall abuts against the inner wall of the second shell body 44; the second buffer component 72 is a rubber pad, the rubber pad includes a transverse portion provided between the second side wall and the inner wall of the second shell body 44, and a vertical portion provided between the boss and the first side wall; the second buffer component 72 can prevent the second shell body 44 and the first shell body 11 from rigid collision under high-speed impact, and at the same time play a fastening role to reduce vibration.

[0070] In a preferred embodiment, a third buffer component 73 is provided between the end of the right end cover 43 away from the left end cover 42 and the inner wall of the first cavity 31. Optionally, the third buffer component 73 is a buffer felt pad, which is used to prevent a rigid collision between the right end cover 43 and the inner wall of the first cavity 31.

[0071] In a preferred embodiment, the test chamber 3 is provided with a silencer assembly 8 on its outer shell.

[0072] Please refer to Figure 1 As shown, the silencer assembly 8 is placed on the side of the first buffer assembly 71 close to the impact shell 6. Optionally, the silencer assembly 8 is a resistive silencer with a porous sound-absorbing material inside. The sound energy is converted into heat energy and consumed by friction in the pores of the porous material, thereby weakening the sound waves passing through the silencer.

[0073] Example 2

[0074] The same points as those in Example 1 are not described in detail, except that: the testing device further includes:

[0075] A drop body 9, on which the test body 1 is disposed, the axis direction of the test body 1 is the second direction, and the first opening 12 is located away from the drop body 9;

[0076] The electric drive assembly is used to drive the drop body 9 to rise to a preset height along the second direction; after reaching the preset height, under the action of gravity, the drop body 9 drives the test body 1 to fall.

[0077] Please refer to Figure 4 As shown, this embodiment is different from Embodiment 1. Embodiment 1 is an air cannon test device, while this embodiment is a drop test device. The second direction is a vertical direction. The first opening is at the top. A lower pressure plate 91 is provided at the bottom of the first shell body 11, and an upper pressure plate 92 is provided at the top to close the first opening. The upper pressure plate 92 and the lower pressure plate 91 are connected by bolts provided at the four corners.

[0078] The testing device also includes a test base 100 arranged on the test bench, and the electric drive assembly includes two driving rods 101 arranged on the test base in a horizontal direction. A lifting slider is provided on the driving rod 101. Optionally, the lifting slider can be lifted and lowered by a screw structure, or by other methods, which will not be repeated here; the falling body 9 is placed between the two driving rods 101, and pneumatic clamps 102 are provided at both ends close to the driving rods 101. A second groove is provided at the bottom of the pneumatic clamp 102, and the lifting slider can be embedded in the second groove; in addition, the falling body 9 is respectively provided with a first through hole on the side close to the pneumatic clamp 102, and two guide rods 103 passing through the first through hole are provided on the test base 100.

[0079] When the lifting slider rises, the lifting slider is embedded in the second groove and drives the drop body 9 to drive the test body 1 to rise. When it rises to a preset height, the pneumatic clamp 102 clamps the drive rod 101, and the lifting slider descends to the initial position. The pneumatic clamp 102 releases the drive rod 101, and the test base 100 falls freely. The test base 100 applies an upward impact force to the test body 1; the impact force is transmitted to the partition assembly 13 through the drop body 9 and the lower pressure plate 91, and then transmitted to the optoelectronic component 2 and the first load measurement assembly 16. The first load measurement assembly 16 is electrically connected to the load acquisition assembly to transmit the impact load value on the optoelectronic component 2 to the load acquisition assembly; after the impact test, the upper pressure plate 92 is disassembled, the optoelectronic component 2 is taken out of the test body 1, and then observed on the damage detection assembly to obtain the damage condition after the drop test. The load on the optoelectronic component 2 can be changed by changing the height of the lifting slider.

[0080] In a preferred embodiment, a load amplification component 200 is disposed on the drop body 9 , and the test body 1 is disposed on the side of the load amplification component 200 away from the drop body 9 .

[0081] Please refer to Figure 4As shown, in certain specific scenarios, due to the limited heights of the driving rod 101 and the guide rod 103, the impact force of the free fall on the falling body 9 is limited. By setting the load amplification component 200, the impact force is amplified. Optionally, the load amplification component 200 can be an impact amplifier.

[0082] In a preferred embodiment, a mounting block 300 is provided on the load amplification component 200, and the test body 1 is installed on the mounting block 200 away from the load amplification component 200. A third load measurement component 400 is also provided on the mounting block 300, and the third load measurement component 400 is arranged on one side of the test body 1.

[0083] Please refer to Figure 4 As shown, the falling body 9 is provided with the load amplification component 200, the load amplification component 200 is provided with the mounting block 300, the mounting block 300 is provided with the lower pressure plate 91, optionally, the third load measurement component 400 is the same as the first load measurement component 16 and the second load measurement component 5, both are acceleration sensors, the third load measurement component 400 is electrically connected to the oscilloscope, when the falling body 9 drives the test body 1 to fall and is impacted, the load size on the mounting block 300 can be obtained through the oscilloscope.

[0084] During the test, the optoelectronic component 2 is not placed in the test body 1 at first. The load size measured by the third load measuring assembly 400 at different heights is obtained by setting the rising height of the lifting slider. The lifting height is changed according to the expected load size. After the test height is determined, the optoelectronic component 2 is installed in the test body 1 for testing. This test method first obtains the expected load size through the third load measuring assembly 400, and then installs the optoelectronic component 2 for a drop test, thereby avoiding damage to the optoelectronic component 2 caused by excessive impact and avoiding waste.

[0085] Generally, when the pulse width before load reduction, i.e., the pulse width measured by the second load measurement component or the third load measurement component, is greater than 100us, the air cannon device of Example 1 is used for testing; when the pulse width is less than or equal to 100us, the drop test device of this embodiment is used for testing.

[0086] Example 3

[0087] Based on Example 1, the present application provides a damage assessment method for an optoelectronic component overload test device under high-speed impact, such as Figure 5 As shown, the following steps are included:

[0088] S100, installing the optoelectronic component 2 into the test body 1;

[0089] S101, applying a high-speed impact force to the test body 1;

[0090] S102, obtaining, by the load acquisition component, a load value measured by the first load measurement component 16, that is, a first load value;

[0091] S103, taking out the optoelectronic component 2, and observing the damage of the optoelectronic component 2; observing the damage of the optoelectronic component after the impact through the metallographic analysis microscope, generally, the damage is as shown in Table 1:

[0092] Table-1

[0093]

[0094] S104. Repeat steps S100-S103 to obtain a damage correspondence table; the damage correspondence table includes the first load value and the corresponding damage condition.

[0095] The above steps can be implemented by the air cannon test device described in Example 1 and the drop test device described in Example 2 respectively;

[0096] When the test device is the air cannon test device described in Example 1, the following steps are also included before step S100:

[0097] S200, setting a first expected load sequence, where the first expected load sequence includes a plurality of first expected load information, where the first expected load information includes an expected load value and a preset pressure value and a preset thickness value corresponding thereto;

[0098] S201, assembling the measuring device, wherein the thickness of the first buffer component 71 is the preset thickness value;

[0099] S202, driving the impact shell 6 at the preset pressure value, so that the impact shell 6 impacts the left end cover 41 through the first buffer assembly 71;

[0100] S203, obtaining the load value measured by the second load measuring component 16 through the load acquisition component, and recording it as a second load value;

[0101] S204, determine whether the difference between the second load value and the expected load value corresponding to the preset pressure value and the preset thickness value is less than the first threshold value, if not, execute steps S205-S207, if yes, execute step S208; wherein, the first threshold value includes an amplitude threshold value and a pulse width threshold value, when adjusting the pressure value of the pneumatic drive component and the thickness value of the first buffer component, it is necessary to satisfy that the difference between the amplitude measured by the second load measurement component and the expected amplitude is less than the amplitude threshold value and the difference between the measured pulse width and the expected pulse width is less than the pulse width threshold value; the greater the pressure, the greater the load amplitude, the narrower the pulse width, the thicker the wool felt pad, the smaller the load amplitude, and the wider the pulse width; generally, if the amplitude of the load measured by the second load measurement component 5 is significantly different from the expected value, first adjust the pressure and then adjust the thickness of the wool felt pad. If the difference is not large, adjust it by changing the thickness of the wool felt pad;

[0102] S205, modifying the preset pressure value to be the first pressure value, and the preset thickness value to be the first thickness value;

[0103] S206, assembling the test device without installing optoelectronic components; wherein the thickness value of the first buffer component 71 is the first thickness value;

[0104] S207, executing steps S202-S204 with the first pressure value until the difference between the second load value and the expected load value is less than a first threshold value, thereby obtaining a target pressure value and a target thickness value;

[0105] S208, setting the preset pressure value as the target pressure value, and setting the preset thickness value as the target thickness value;

[0106] S209, traverse the first expected load sequence, and repeat steps S201-S204 to obtain a first load reduction test sequence, wherein the first load reduction test sequence includes the expected load value, and a target pressure value and a target thickness value corresponding to the expected load value.

[0107] Part of the data of the first load reduction test sequence is shown in Table 2:

[0108] Table-2

[0109]

[0110] Steps S100-S104 are performed with the target pressure value and the target thickness value, that is, the test body 1 with the optoelectronic component 2 installed is subjected to an impact test according to Table 1 to obtain a first damage correspondence table when an air cannon test device is used.

[0111] Among them, some data of the correspondence table between the expected load value and the load value before load reduction and the load value after load reduction are shown in Table 3. The expected load value before load reduction is the value received by the load acquisition component from the second load measurement component 5, and the load value after load reduction is the value received by the load acquisition component from the first load measurement component 16.

[0112] Table-3

[0113]

[0114]

[0115] Part of the data of the first damage table obtained by the air cannon testing device is shown in Table 4, wherein the first load value is the load value after load reduction, which is measured by the first load measurement component 16.

[0116] Table-4

[0117]

[0118] Furthermore, when the impact shell 6 impacts the left end cover 41, the left end cover 41 and the second housing body 44 will generate axial vibration, and the axial vibration will affect the load actually acting on the optoelectronic component 2. Therefore, it is necessary to filter the measured value of the first load measurement component 16 to eliminate the influence of the axial vibration. The method for eliminating the influence of the axial vibration is as follows:

[0119] S301, establishing a shell model, wherein the shell model includes the end cover body and the second shell body 44;

[0120] S302, performing modal analysis on the shell model;

[0121] S303, obtaining a first natural frequency that generates axial vibration;

[0122] S304, selecting a frequency far away from the natural frequency as a second natural frequency;

[0123] S305 , filtering the load measured by the first load measurement component 16 at the second natural frequency.

[0124] Among them, a geometric model consistent with the test device is established on the simulation software, which is the shell model, and the corresponding material model and its parameters are selected for each component, and the corresponding contact surface and contact method are set for the shell model; the geometric model is modally analyzed on the simulation software, and when the geometric model is observed to be axially twisted, the natural frequency at this time is obtained by the simulation software, that is, the first natural frequency. The first natural frequency read in this embodiment is 8.3KHZ; the frequency far away from 8.3KHZ is selected as 500KHZ, which is the second natural frequency; optionally, the measured value of the first load measurement component obtained by the oscilloscope is filtered by MATLAB software. When filtering, the natural frequency is selected as the second natural frequency. Since the difference between the second natural frequency and the first natural frequency is large, the risk of generating axial vibration is avoided. The first peak of the filtered filter curve is obtained, and the horizontal coordinate of this filter curve is time and the vertical coordinate is acceleration. The first peak is the acceleration of the initial contact with the optoelectronic component, and the first peak is the final reference value provided by the guidance system.

[0125] When the test device is the drop test device described in Example 2, the following steps are also included before step S100:

[0126] S400, setting a second expected load sequence, where the second expected load sequence includes a plurality of second expected load information, where the second expected load information includes an expected load value and a preset height value corresponding thereto;

[0127] S401, assembling the test device, without installing the optoelectronic component 2;

[0128] S402, driving the drop body 9 to drive the test body 1 to rise at the preset height value, and the pneumatic clamp 102 holds the driving rod;

[0129] S403, the pneumatic clamp 102 releases the driving rod 101, and the falling body 9 drives the test body 1 to fall freely;

[0130] S404, obtaining the load magnitude of the third load measurement component 400, recorded as a third load value;

[0131] S405, determining whether the difference between the third load value and the expected load value is less than a second threshold value, if so, executing steps S406-410, if not, executing step S411;

[0132] S406, correcting the preset height value to a first height value;

[0133] S407, repeatedly executing steps S402-S405 with the first height value until the difference between the third load value and the expected load value is less than the second threshold value, and obtaining a target height value;

[0134] S408, traversing the second expected load sequence, and repeatedly executing steps S401-S405 to obtain a second load reduction test sequence, wherein the second load reduction test sequence includes the expected load value and a target height value corresponding to the expected load value.

[0135] Part of the data of the second load reduction test sequence is shown in Table 5:

[0136] Table-5

[0137]

[0138] Steps S100-S104 are executed with the target height value, that is, an impact test is performed on the test body 1 equipped with the optoelectronic component 2 according to Table 3 to obtain a second damage correspondence table when the drop test device is used; it is also necessary to filter the data obtained by the drop test device, and the processing method is the same as that of the air cannon test device, which will not be repeated here.

[0139] Among them, some data of the correspondence table between the expected load value and the load value before load reduction and the load value after load reduction are shown in Table 6. The expected load value before load reduction is the value received by the load acquisition component from the third load measurement component 400, and the load value after load reduction is the value received by the load acquisition component from the first load measurement component 16.

[0140] Table-6

[0141]

[0142] Part of the data of the second damage table obtained by the drop test device is shown in Table 7, wherein the first load value is the load value after load reduction, which is measured by the first load measurement component 16.

[0143] Table-7

[0144]

[0145] In summary, some data of the partial damage correspondence table of the air cannon test device and the drop test device are shown in Table 8:

[0146] Table-8

[0147] Test No. Amplitude after load reduction / g Pulse width after load reduction / us Damage level 1 6000 200 none 2 6500 240 none 3 7000g 340 slight 4 10000g 330 slight 5 17000 180 light 6 30000 160 middle 7 29000 130 Heavy 8 18000g 360 Slightly heavier

[0148] Among them, the amplitude after load reduction and the amplitude before load reduction in Table 8 are obtained through the first load measurement component 16. The damage correspondence table can provide a reference for the guidance system to implement anti-overload design before the optoelectronic components and the guidance system to select the type of optoelectronic components.

[0149] The above description is only a preferred embodiment of the present application and an explanation of the technical principles used. Those skilled in the art should understand that the scope of the invention involved in the present application is not limited to the technical solution formed by a specific combination of the above technical features, but should also cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the inventive concept. For example, the above features are replaced with (but not limited to) technical features with similar functions disclosed in the present application.

Claims

1. A photoelectric element overload test device under high-speed impact, characterized in that: It includes a test body, a load acquisition component, and a damage detection component; The test body (1) comprises: A first shell body (11), wherein the first shell body (11) has a first space therein and one end of the first shell body has a first opening (12); a partition component (13), the partition component (13) being arranged in the middle of the first space, with two ends thereof being connected to the inner wall of the first housing body (11), the partition component (13) dividing the first space into a second space (14) communicating with the first opening (12) and a third space (15); the second space (14) being used for accommodating the optoelectronic component (2), the optoelectronic component (2) being arranged in the middle of the partition component (13); a first load measuring component (16), the first load measuring component (16) being disposed in the third space (15), being arranged at an end of the partition component (13) away from the optoelectronic component (2), and being coaxially arranged with the optoelectronic component (2); when the outer wall of the first housing body (11) close to the first load measuring component (16) is subjected to a high-speed impact, the first load measuring component (16) is used to measure the impact load transmitted to the optoelectronic component (2); The load acquisition component is arranged outside the first housing body (11) and is electrically connected to the first load measurement component, and the load acquisition component is used to acquire the load measured by the first load measurement component (16); The damage detection component is used to obtain the damage condition of the optoelectronic component (2) after being impacted; Also includes: A test cavity (3), wherein the test cavity (3) has a first cavity (31); an end cover body, the end cover body being arranged in the first cavity (31), and comprising a left end cover (41) and a right end cover (42) distributed along a first direction; the left end cover (41) and the right end cover (42) are both provided with a first groove on their mutually adjacent sides, and a fourth space (43) is formed between the two first grooves; a second shell body (44), the second shell body (44) being disposed in the fourth space (43), and having two ends connected to the left end cover (41) and the right end cover (42) respectively; a fifth space (441) and a sixth space (442) being arranged in the second shell body (44) along the first direction; the test body (1) being disposed in the fifth space (441), and having an outer wall thereof in close contact with an inner wall of the second shell body (44); a second load measurement assembly (5), the second load measurement assembly (5) being arranged in the sixth space (442), in the middle of the left end cover (41), and being coaxially arranged with the test body (1); An impact shell (6), the impact shell (6) being arranged on the left end cover (41) away from the right end cover (42), with its outer wall closely attached to the inner wall of the first cavity (31); A pneumatic drive assembly is used to drive the left end cover (41) where the impact shell (6) is located to exert a high-speed impact force away from the right end cover (42).

2. The photoelectric element overload test device under high-speed impact according to claim 1, characterized in that: A first buffer assembly (71) is provided between the left end cover (41) and the impact shell (6).

3. The photoelectric element overload test device under high-speed impact according to claim 1, characterized in that: A second buffer assembly (72) is provided between the outer wall of the first shell body (11) and the inner wall of the second shell body (44).

4. The photoelectric element overload test device under high-speed impact according to claim 1, characterized in that: The outer shell of the test cavity (3) is provided with a silencer component (8).

5. The photoelectric element overload test device under high-speed impact according to claim 1, characterized in that: A third buffer assembly (73) is provided between the end of the right end cover (43) away from the left end cover (42) and the inner wall of the first cavity (31).

6. A damage assessment method for a photoelectric element overload test device under high-speed impact as claimed in any one of claims 1 to 5, characterized in that: The steps include: S100, installing the optoelectronic component (2) into the test body (1); S101, applying a high-speed impact force to the test body (1); S102, obtaining, by means of the load acquisition component, a load value measured by the first load measurement component (16), namely, a first load value; S103, taking out the optoelectronic component (2), and observing the damage of the optoelectronic component (2); S104. Repeat steps S100-S103 to obtain a damage correspondence table; the damage correspondence table includes the first load value and the corresponding damage condition.

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