A chip detection component

Abstract

The present invention relates to the technical field of chip sorting and testing equipment, and proposes a chip testing component, the testing component includes a testing bracket that is lifted and arranged on the frame and a testing head that is arranged on the testing bracket, the testing head has a probe that contacts the chip to be tested, and also includes a suction nozzle that is arranged at the center of the testing head and an insulating sleeve that is sleeved on the probe, the suction nozzle is lifted and arranged at the center of the testing head. Through the above technical solution, the problem of discharge between pins during chip sorting and testing in the prior art, resulting in loss and unstable safety, is solved.

Description

[0001] This application is a divisional application of application number 2022110416041, application date August 29, 2022, invention name “A chip double sorting and detection device” Technical Field

[0002] The present invention relates to the technical field of chip sorting and testing equipment, and in particular to a chip testing component. Background Art

[0003] As the Internet, electronic communications and various electronic consumer products occupy every corner of people's lives, the semiconductor industry, which lays the foundation for all of this, has undoubtedly become a top priority in the country's scientific and technological development. After the semiconductor devices used in large quantities in the microelectronics industry are manufactured, they need to be tested and sorted to remove the parts with quality problems in the chips, thereby ensuring that the chips can be used in various electronic devices.

[0004] In the prior art, when chips are sorted and tested, equipment that sorts and then tests or tests and then sorts is often used. Testing and sorting are separated, and the sorting criteria are mostly based on appearance to remove inferior chips. Testing mostly uses electrical connection of the chip pins to obtain test data to determine whether the chip has internal defects. During the testing process, due to the close distance between the pins, discharge may occur, causing damage to the chip. However, the prior art equipment does not organically combine sorting with quality, and does not perform both testing and sorting from a quality perspective. Therefore, the testing safety in the prior art is unstable, testing impairment is prone to occur, and sorting standards are lacking. Based on the above problems, there is an urgent need for a chip testing and sorting equipment. Summary of the invention

[0005] The present invention provides a chip detection component, which solves the problems of damage and unstable safety caused by discharge between pins during chip sorting and detection in the prior art.

[0006] The technical solution of the present invention is as follows:

[0007] A chip double-type sorting and detection device includes a frame and a detection component arranged on the frame, and also includes a detection station, wherein the detection station is located below the detection component and is used to place a chip tray. The detection component includes a detection bracket that is lifted and lowered on the frame and a detection head that is arranged on the detection bracket, wherein the detection head has a probe that contacts the chip to be detected, and also includes a suction nozzle arranged at the center of the detection head and an insulating sleeve that is sleeved on the probe, wherein the suction nozzle is lifted and lowered at the center of the detection head.

[0008] It also includes a tray suction head, a correction station and a correction component, wherein the tray suction head is lifted and lowered on the detection bracket, the correction station is used to place the chip tray, the correction component includes a correction bracket lifted and lowered on the frame and a support frame provided on the correction bracket, a pin sleeve is provided in the support frame, the pin sleeve is movably provided in the support frame, and also includes a correction pressure block, the correction pressure block is lifted and lowered on the correction bracket, the correction pressure block has a correction hole, and one end of the pin sleeve corresponds to the correction hole.

[0009] It also includes a support rod, which is arranged in the support frame. There are at least two support rods, and there are multiple pin sleeves and correction holes. The middle part of the pin sleeve is ball-hinged with the support rod.

[0010] The end of the pin sleeve away from the correction block is a tapered opening, the end of the correction hole close to the pin sleeve is a tapered hole, and the end of the pin sleeve close to the correction hole has the same inner diameter as the correction hole.

[0011] The correction station includes a positioning plate and a locking plate. The positioning plate has a right-angle positioning edge. The inner side of the positioning plate abuts against the chip tray. The locking plates are divided into two pieces. The locking plates are movably arranged on the frame. The moving directions of the two locking plates are perpendicular to each other.

[0012] It also includes a loading station, which includes a loading pallet, a loading guard plate and a loading lifting device. The loading guard plate is divided into several pieces, and several of the loading guard plates are perpendicular to the loading pallet. The loading guard plate and the loading pallet form a material receiving space, and the loading pallet is connected to the telescopic end of the loading lifting device.

[0013] It also includes a qualified workstation, which includes a discharge pallet, a discharge guard plate and a discharge lifting device. The discharge guard plate is composed of several pieces, and several of the discharge guard plates are perpendicular to the discharge pallet. The discharge guard plate and the discharge pallet form a material-bearing space, and the discharge pallet is connected to the telescopic end of the discharge lifting device.

[0014] It also includes a rejection station, which includes a slide rail and a conveying plate arranged on the slide rail. The conveying plate is slidably arranged on the slide rail. The conveying plate is used to place a chip tray. It also includes a rotating screw rotatably arranged on the frame, and the rotating screw is threadedly connected to the conveying plate.

[0015] It also includes a transverse screw, a longitudinal screw, a longitudinal bracket and a transverse back plate. The longitudinal screw is rotatably set on the frame, the longitudinal bracket is threadedly connected to the longitudinal screw, the transverse screw is rotatably set on the longitudinal bracket, the transverse back plate is threadedly connected to the transverse screw, and the detection component and the correction component are both lifted and lowered on the transverse back plate by means of a telescopic device.

[0016] The tray suction head, the correction pressing block and the suction nozzle are all lifted and lowered by means of a telescopic device.

[0017] The working principle and beneficial effects of the present invention are:

[0018] The present invention discloses a chip detection component, which is the same as the detection equipment in the prior art and also has a detection component and a detection station. At the same time, a chip tray is placed on the detection station. The chip tray is a tray with many small grids, and the middle part is a flat grabbing position for easy adsorption. During detection, the detection equipment of the present invention abuts the pins of the chip through the probe installed on the detection head to achieve electrical connection so as to detect various parameters of the electrical performance of the chip, thereby detecting whether it is qualified. The difference between the present application and the prior art is that an insulating sleeve is used to be sleeved on the probe. Then, when the detection head is lifted and moved to the chip pin, the insulating sleeve can The pins and probes are protected, and each pin and probe has its own independent space, thereby avoiding the discharge effect between the pins that causes chip detection damage. At the same time, the central part of the detection head is also equipped with a suction nozzle for lifting. When the detection is qualified, the suction nozzle remains in the lifted state, and the chip remains in the chip tray and is regarded as a qualified good product. When the detection is abnormal, the suction nozzle located in the center of the detection head can descend and adsorb the chip, thereby removing the unqualified products and realizing sorting. Through this technical solution, the present invention can solve the problems of discharge between pins causing damage and unstable safety during chip sorting and detection in the prior art. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0020] Figure 1 This is an axonometric schematic diagram of the structure of the present invention;

[0021] Figure 2 for Figure 1 A partial enlarged view of the middle A;

[0022] Figure 3 for Figure 1 A partial enlarged view of point B in the middle;

[0023] Figure 4 It is a top view of the structure of the present invention;

[0024] Figure 5This is a schematic diagram of the axonometric structure of the detection component and the correction component of the present invention;

[0025] Figure 6 It is a top view of the detection component and correction component structure of the present invention;

[0026] Figure 7 for Figure 6 Cross-sectional view along CC direction;

[0027] Figure 8 for Figure 6 The cross-sectional view along the DD direction;

[0028] Fig. 9 for Figure 7 A partial enlarged view of point E in the middle;

[0029] Fig.10 for Figure 8 A partial enlarged view of the F in the middle;

[0030] In the figure: 1. frame, 2. detection station, 3. detection bracket, 4. detection head, 5. probe, 6. suction nozzle, 7. insulating sleeve, 8. tray suction head, 9. correction station, 10. correction bracket, 11. support frame, 12. pin sleeve, 13. correction block, 14. correction hole, 15. support rod, 16. positioning plate, 17. locking plate, 18. loading station, 19. loading pallet, 20. loading guard plate, 21. loading lifting device, 22. qualified station, 23. discharge pallet, 24. discharge guard plate, 25. discharge lifting device, 26. rejection station, 27. slide rail, 28. conveyor plate, 29. rotating screw, 30. transverse screw, 31. longitudinal screw, 32. longitudinal bracket, 33. transverse back plate. DETAILED DESCRIPTION

[0031] The following will be combined with the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0032] like Figures 1 to 10As shown, this embodiment proposes a chip double-type sorting and detection device, including a frame 1 and a detection component arranged on the frame 1, and also includes a detection station 2, wherein the detection station 2 is located below the detection component, and the detection station 2 is used to place a chip tray. The detection component includes a detection bracket 3 which is lifted and arranged on the frame 1 and a detection head 4 which is arranged on the detection bracket 3, wherein the detection head 4 has a probe 5 which contacts the chip to be detected, and also includes a suction nozzle 6 which is arranged at the center of the detection head 4 and an insulating sleeve 7 which is sleeved on the probe 5, and the suction nozzle 6 is lifted and arranged at the center of the detection head 4.

[0033] In the present embodiment, a chip double sorting and testing device is disclosed. Like the testing equipment in the prior art, it also has a testing component and a testing station 2. The testing station 2 is located below the testing component. At the same time, a chip tray is placed on the testing station 2. The chip tray is a tray with many small grids, and the middle part is a flat grabbing position for easy adsorption. During the testing, the testing equipment in the present invention contacts the pins of the chip through the probe 5 installed on the testing head 4 to achieve electrical connection, thereby detecting various parameters of the electrical performance of the chip to detect whether it is qualified. The testing head 4 is on the testing bracket 3, and the testing bracket 3 is arranged on the frame 1. At the same time, it can be lifted and lowered by means of a sliding device, thereby driving the testing head 4 to approach or move away from the chip. The difference between the present application and the prior art is An insulating sleeve 7 is used to sleeve the probe 5. Then, when the detection head 4 is lifted and moved to the chip pin, the insulating sleeve 7 can protect the pin and the probe 5. Each pin and the probe 5 have their own independent space, thereby avoiding the discharge effect between the pins and causing chip detection damage. At the same time, the central part of the detection head 4 is also provided with a suction nozzle 6 for lifting. When the detection is qualified, the suction nozzle 6 remains in the lifted state, and the chip remains in the chip tray and is regarded as a qualified good product. When the detection is abnormal, the suction nozzle located at the center of the detection head 4 can descend and adsorb the chip, thereby removing the unqualified products and realizing sorting. Through this technical solution, the present invention can solve the problems of discharge between pins causing damage and unstable safety during chip sorting and detection in the prior art.

[0034] It also includes a tray suction head 8, a correction station 9 and a correction component. The tray suction head 8 is lifted and lowered on the detection bracket 3. The correction station 9 is used to place the chip tray. The correction component includes a correction bracket 10 lifted and lowered on the frame 1 and a support frame 11 arranged on the correction bracket 10. A pin sleeve 12 is arranged in the support frame 11. The pin sleeve 12 is movably arranged in the support frame 11. It also includes a correction pressure block 13. The correction pressure block 13 is lifted and lowered on the correction bracket 10. The correction pressure block 13 has a correction hole 14. One end of the pin sleeve 12 corresponds to the correction hole 14.

[0035] In this embodiment, a tray suction head 8 is also installed on the detection bracket 3. The central part of the chip tray is a flat adsorption surface. If the chip tray needs to be movable, the tray suction head 8 installed on the detection bracket 3 can drive the chip tray to move and realize the overall movement. Based on the detection of the above embodiment, the present invention further designs a correction station 9 and a correction component, wherein the correction station 9 is very similar to the detection station 2, and both can place the chip tray. The correction station 9 is below the correction component, wherein the installation base of the correction component is the correction bracket 10, and the correction bracket 10 is also installed on the frame 1 by lifting. A support frame 11 is installed below the correction bracket 10. The size of the support frame 11 is close to the outer contour of the chip, and the support frame 11 can buckle the chip. Inside the support frame 11, a pin sleeve 12 is movably installed. The pin sleeve 12 has the freedom to rotate at multiple angles. The pins of the chip will be skewed, and in this case, accurate alignment and detection cannot be performed. Even if alignment is achieved, poor contact may cause detection failure, or even pin breakage is unknown. Therefore, at the correction station 9, no matter what angle the pin is skewed to, the movably installed pin sleeve 12 can insert the pin. Then, a correction pressure block 13 is also set up in the support frame 11. A correction hole 14 corresponding to the pin sleeve 12 is provided on the correction pressure block 13. When the pressure block is pressed down, the pin sleeve 12 can be restricted to the correction hole 14. With the help of axial restriction, the pin is adjusted to the standard position to achieve correction.

[0036] It also includes a support rod 15, which is arranged in the support frame 11. There are at least two support rods 15, and there are multiple pin sleeves 12 and correction holes 14. The middle part of the pin sleeve 12 is ball-hinged with the support rod 15.

[0037] In this embodiment, support rods 15 are installed in the support frame 11. There are two support rods 15. The support rods 15 are arranged in parallel, corresponding to the two parallel rows of pins on the chip. The pin sleeve 12 is ball-hinged with the support rods 15. By adopting the ball-hinged method, the pin sleeve 12 can achieve multi-angle changes, thereby adapting to the situation where the chip pins are skewed and improving the adaptability of correction.

[0038] The end of the pin sleeve 12 away from the correction block 13 is a tapered opening, the end of the correction hole 14 close to the pin sleeve 12 is a tapered hole, and the end of the pin sleeve 12 close to the correction hole 14 has the same inner diameter as the correction hole 14 .

[0039] In this embodiment, the pin sleeve 12 should be able to insert the crooked pin into the pin sleeve 12. On the one hand, the pin sleeve 12 adopts a ball-hinged movable mode, which can improve the stability of pin insertion. In addition, one end of the pin sleeve 12 is a tapered mouth, which can further improve the stability of pin insertion. The tapered mouth guides and guides the pin. The bottom of the correction hole 14 is also a tapered hole, which guides and guides the pin sleeve 12. The correction gradually becomes the same as the inner diameter of the pin sleeve 12. The correction hole 14 limits the position of the pin sleeve 12 and indirectly corrects the pin, so that the pins of the chip are restored to the standard position for detection.

[0040] The correction station 9 includes a positioning plate 16 and a locking plate 17. The positioning plate 16 has a right-angle positioning edge. The inner side of the positioning plate 16 abuts against the chip tray. The locking plates 17 are in two pieces. The locking plates 17 are movably arranged on the frame 1. The moving directions of the two locking plates 17 are perpendicular to each other.

[0041] In this embodiment, the correction station 9 adopts the form of a combination of a positioning plate 16 and a locking plate 17 to position and clamp the chip tray placed thereon, so that more accurate and effective correction work can be performed. The positioning plate 16 is a right-angled angle plate, and the inner side of the positioning plate 16 abuts against the tray to fix the position. The locking plate 17 consists of two pieces, which are slidably set on the frame 1. After moving, the tray is locked, thereby starting the positioning and locking of the chip tray on the correction station 9.

[0042] It also includes a loading station 18, which includes a loading pallet 19, a loading guard plate 20 and a loading lifting device 21. The loading guard plate 20 is divided into several pieces, and several of the loading guard plates 20 are perpendicular to the loading pallet 19. The loading guard plate 20 and the loading pallet 19 form a material receiving space, and the loading pallet 19 is connected to the telescopic end of the loading lifting device 21.

[0043] It also includes a qualified workstation 22, which includes a discharge pallet 23, a discharge guard plate 24 and a discharge lifting device 25. The discharge guard plate 24 is composed of several pieces, and several of the discharge guard plates 24 are perpendicular to the discharge pallet 23. The discharge guard plate 24 and the discharge pallet 23 form a material-bearing space, and the discharge pallet 23 is connected to the telescopic end of the discharge lifting device 25.

[0044] In this embodiment, the designs of the loading station 18 and the qualified station 22 are basically the same, both of which are in the form of a pallet, a guard plate and a lifting device. The guard plate is in the form of a surrounding, and the pallet is connected to the telescopic end of the lifting device. The lifting device can use a cylinder in this embodiment. In addition, the guard plate around the pallet can effectively protect the stability of the chip tray lifting. In this embodiment, the composition of each loading station 18 and the qualified station 22 is constructed to match the loading and unloading, and the specific position relationship is as described above.

[0045] It also includes a rejection station 26, which includes a slide rail 27 and a conveyor plate 28 arranged on the slide rail 27, and the conveyor plate 28 is slidably arranged on the slide rail 27. The conveyor plate 28 is used to place a chip tray, and also includes a rotating screw 29 rotatably arranged on the frame 1, and the rotating screw is threadedly connected to the conveyor plate 28.

[0046] In this embodiment, the correction station 9 corrects the chips that fail the preliminary inspection and then conducts another inspection, that is, a double inspection. The unqualified chip products will be adsorbed by the adsorption head in the middle of the inspection head 4 and moved to the chip tray on the conveyor tray 28. The conveyor tray 28 rotates with the help of a rotating screw and moves along the slide rail 27 on the frame 1 to remove the unqualified chip tray, thereby achieving the effect of sorting based on quality.

[0047] It also includes a transverse screw 30, a longitudinal screw 31, a longitudinal bracket 32 ​​and a transverse back plate 33. The longitudinal screw 31 is rotatably set on the frame 1, the longitudinal bracket 32 ​​is threadedly connected to the longitudinal screw 31, the transverse screw 30 is rotatably set on the longitudinal bracket 32, the transverse back plate 33 is threadedly connected to the transverse screw 30, and the detection component and the correction component are both lifted and lowered on the transverse back plate 33 by means of a telescopic device.

[0048] In this embodiment, there are a loading station 18, an inspection station 2, a correction station 9, a qualified station 22, and a rejection station 26 on the frame 1. The inspection components and the correction components are moved between these stations by the longitudinal movement screw 31 to drive the longitudinal movement bracket 32 ​​to move. The transverse movement screw 30 installed on the longitudinal movement bracket 32 ​​drives the transverse movement backboard 33 to move. The inspection and correction components are all on the transverse movement backboard 33, thereby achieving comprehensive coverage of inspection, correction, and transportation of the entire frame 1.

[0049] The tray suction head 8, the correction pressing block 13 and the suction nozzle 6 are all lifted and lowered by means of a telescopic device.

[0050] In this embodiment, the lifting tray suction head 8, the correction pressure block 13 and the suction nozzle 6 are all driven by a telescopic device. The telescopic device in this application can use a cylinder, but it is not limited to this type of telescopic device. Any device that can meet the telescopic action can be used.

[0051] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A chip detection component, It is characterized in that The detection assembly comprises a detection bracket (3) and a detection head (4) arranged on the detection bracket (3), the detection head (4) having a probe (5) in contact with the chip to be detected, and further comprising a suction nozzle (6) arranged at the center of the detection head (4) and an insulating sleeve (7) sleeved on the probe (5), the suction nozzle (6) being arranged to be lifted and lowered at the center of the detection head (4), It also includes a tray suction head (8), a correction station (9) and a correction component, wherein the tray suction head (8) is arranged on the detection bracket (3) in a lifting manner, the correction station (9) is used to place the chip tray, the correction component includes a correction bracket (10) arranged on the frame (1) in a lifting manner and a support frame (11) arranged on the correction bracket (10), a pin sleeve (12) is arranged in the support frame (11), and the pin sleeve (12) is movably arranged in the support frame (11), and also includes a correction pressure block (13), the correction pressure block (13) is arranged on the correction bracket (10) in a lifting manner, the correction pressure block (13) has a correction hole (14), and one end of the pin sleeve (12) corresponds to the correction hole (14). It also comprises a support rod (15), wherein the support rod (15) is arranged in the support frame (11), the support rod (15) is at least two, the pin sleeve (12) and the correction hole (14) are both multiple, the middle part of the pin sleeve (12) is ball-jointed with the support rod (15), the end of the pin sleeve (12) away from the correction pressure block (13) is a tapered opening, the end of the correction hole (14) close to the pin sleeve (12) is a tapered hole, and the end of the pin sleeve (12) close to the correction hole (14) has the same inner diameter as the correction hole (14).

2. The chip detection component according to claim 1, It is characterized in that The tray suction head (8), the correction pressure block (13) and the suction nozzle (6) are all lifted and lowered by means of a telescopic device.

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