A dark current testing device and testing method

Abstract

The application discloses a dark current testing device and a testing method. The dark current testing device comprises a power supply device and an auxiliary device; wherein the auxiliary device is connected to the first end of the power supply device and the first end of a sample to be tested, and the second end of the power supply device is electrically connected to the second end of the sample to be tested; the auxiliary device comprises a first switch, a second switch, a third switch, a fourth switch, an impedance module and a current detection module. Through the testing device, the following can be realized: the on-off sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path are controlled by controlling the closing or opening of the first switch, the second switch, the third switch and the fourth switch, so as to avoid the occurrence of peak current when the dark current is tested, to avoid affecting the testing precision and damaging the testing device, and by setting the impedance module, the occurrence of the peak current can be further reduced, and the testing precision of the dark current is further improved, so that the accurate testing of the dark current is realized.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of testing, in particular to a dark current testing device and testing method. BACKGROUND

[0002] The working energy of electronic components used in new energy vehicles is derived from the vehicle battery. Therefore, in order to reduce the consumption of the vehicle battery power, in addition to the necessary working state power consumption, the power consumption during vehicle parking time, i.e. the vehicle dark current, should also be considered. The so-called dark current refers to the current flowing when the ignition switch is in the off position (vehicle non-working state). Because some electrical equipment needs long-term power supply in order to maintain data memory function and some anti-theft sensors, in order to ensure all-weather monitoring function, long-term power supply is necessary. Because of the existence of these dark currents and the natural discharge of the battery, long-term parking of the vehicle will easily cause the battery capacity to be insufficient, thereby causing the vehicle to be unable to start, so the dark current of each electronic component on the vehicle must be strictly limited. Therefore, it is necessary to test the dark current of the developed and designed vehicle electronic component product.

[0003] The existing dark current testing method mainly uses a digital multimeter for direct detection, but during testing the current, the current range circuit of the digital multimeter is often broken, which on the one hand causes inaccurate testing, and on the other hand damages the device. SUMMARY

[0004] The present application provides a dark current testing device and testing method, which avoids the influence of peak current on testing accuracy and damage to testing devices during dark current testing, and realizes accurate testing of dark current.

[0005] According to an aspect of the present application, a dark current testing device is provided, which comprises a power supply device and an auxiliary device; wherein the auxiliary device is connected to the first end of the power supply device and the first end of a sample to be tested, and the second end of the power supply device is electrically connected to the second end of the sample to be tested.

[0006] The auxiliary device comprises a first switch, a second switch, a third switch, a fourth switch, an impedance module and a current detection module.

[0007] The first switch is connected between the first end of the power supply device and the first end of the sample to be tested, and is used to form a first path; the second switch is connected between the first end of the power supply device and the first end of the sample to be tested, and is used to form a second path; the first end of the third switch is electrically connected with the first end of the power supply device, the second end of the third switch is electrically connected with the current detection module, and the current detection module is electrically connected with the first end of the sample to be tested, and is used to form a third path; the first end of the fourth switch is electrically connected with the first end of the power supply device, the second end of the fourth switch is electrically connected with the first end of the impedance module, and the second end of the impedance module is electrically connected with the second end of the third switch and the current detection module respectively, and is used to form a fourth path.

[0008] The closing or opening of the first switch, the second switch, the third switch and the fourth switch controls the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, so as to control the power-on start, the entering into the sleep state and the dark current test of the sample to be tested.

[0009] Optionally, the closing or opening of the first switch, the second switch, the third switch and the fourth switch controls the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, so as to control the dark current test of the sample to be tested, including:

[0010] When the first switch, the third switch and the fourth switch are opened and the second switch is closed, the sample to be tested enters into the sleep state, the fourth switch is closed to control the second path and the fourth path to be conducted simultaneously, then the second switch is opened to control the second path to be disconnected, then the third switch is closed to control the third path and the fourth path to be conducted simultaneously, and finally the fourth switch is opened to test the dark current of the sample to be tested through the third path.

[0011] Optionally, the closing or opening of the first switch, the second switch, the third switch and the fourth switch controls the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, so as to control the power-on start of the sample to be tested, including:

[0012] The first switch and the second switch are closed, and the third switch and the fourth switch are opened, to control the first path and the second path to be conducted and the third path and the fourth path to be disconnected, so as to control the power-on start of the sample to be tested.

[0013] Optionally, the closing or opening of the first switch, the second switch, the third switch and the fourth switch controls the on-off sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, so as to control the DUT to enter the sleep state, comprising:

[0014] When the first switch and the second switch are closed, and the third switch and the fourth switch are opened, the first switch is opened to control the DUT to enter the sleep state.

[0015] Optionally, the impedance module is a resistive element.

[0016] Optionally, the resistive element is a pin resistor.

[0017] Optionally, the current detection module is an ammeter.

[0018] Optionally, the first switch, the second switch, the third switch and the fourth switch are jumpers.

[0019] According to another aspect of the present application, there is provided a test method of the dark current test device according to the first aspect, comprising:

[0020] The closing or opening of the first switch, the second switch, the third switch and the fourth switch controls the on-off sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, so as to control the DUT to enter the sleep state, comprising:

[0021] Optionally, the closing or opening of the first switch, the second switch, the third switch and the fourth switch controls the on-off sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, so as to control the DUT to enter the sleep state, comprising:

[0022] When the first switch, the third switch and the fourth switch are opened, and the second switch is closed, the DUT enters the sleep state, the fourth switch is first closed to control the second path and the fourth path to be simultaneously conducted, then the second switch is opened to control the second path to be opened, then the third switch is closed to control the third path and the fourth path to be simultaneously conducted, and finally the fourth switch is opened to perform the dark current test on the DUT through the third path.

[0023] The technical scheme of the embodiment of the present application provides a dark current testing device and a testing method, the dark current testing device comprises: a power supply device and an auxiliary device; wherein the auxiliary device is connected between the first end of the power supply device and the first end of a sample to be tested, and the second end of the power supply device is electrically connected with the second end of the sample to be tested; the auxiliary device comprises: a first switch, a second switch, a third switch, a fourth switch, an impedance module and a current detection module; wherein the first switch is connected between the first end of the power supply device and the first end of the sample to be tested, and is used for forming a first path; the second switch is connected between the first end of the power supply device and the first end of the sample to be tested, and is used for forming a second path; the first end of the third switch is electrically connected with the first end of the power supply device, the second end of the third switch is electrically connected with the current detection module, the current detection module is electrically connected with the first end of the sample to be tested, and is used for forming a third path; the first end of the fourth switch is electrically connected with the first end of the power supply device, the second end of the fourth switch is electrically connected with the first end of the impedance module, and the second end of the impedance module is respectively electrically connected with the second end of the third switch and the current detection module, and is used for forming a fourth path; the closing or opening of the first switch, the second switch, the third switch and the fourth switch controls the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, so as to control the power-on start of the sample to be tested, the entering of the sleep state and the dark current testing. Therefore, by controlling the closing or opening of the first switch, the second switch, the third switch and the fourth switch to control the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, the occurrence of the peak current during the dark current testing can be avoided, the test precision is affected and the test device is damaged, and by setting the impedance module, the occurrence of the peak current can be further reduced, the test precision of the dark current is further improved, and the accurate test of the dark current is realized.

[0024] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present application, nor is it used to limit the scope of the present application. Other features of the present application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0025] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creating laborious work.

[0026] Figure 1 The structural block diagram of the dark current testing device provided in the embodiment of the present application is shown in the figure;

[0027] Figure 2is a structural schematic view of a dark current test device provided in an embodiment of the present application;

[0028] Figure 3 is a structural schematic view of a control panel of a dark current test device provided in an embodiment of the present application;

[0029] Figure 4 is a flow chart of a test method of a dark current test device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0030] In order to make the personnel in the art better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by the person of ordinary skill in the art without creative labor should belong to the scope of protection of the present application.

[0031] It should be noted that the terms "first", "second", and the like in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not have to be used to describe a specific order or sequence. It should be understood that the data used in this way can be exchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units does not have to be limited to those steps or units clearly listed, but can include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0032] With the continuous rise of oil prices, energy and environmental problems are becoming increasingly prominent, and new energy vehicles will undoubtedly become the development direction of future vehicles.

[0033] The working energy of electronic components used in new energy vehicles is derived from the vehicle battery. Therefore, in order to reduce the consumption of the vehicle battery, in addition to the necessary working state power consumption, the power consumption during the parking time of the vehicle, i.e. the dark current of the vehicle, is also considered. The so-called dark current refers to the current flowing when the ignition switch is in the off position (no working state of the vehicle). Because some electrical equipment needs long-term power supply in order to maintain the data memory function and some anti-theft sensors need long-term power supply in order to ensure all-weather monitoring function, the vehicle is prone to have insufficient battery capacity due to the existence of these dark currents and the natural discharge of the battery, thereby causing the vehicle to be unable to start. Therefore, the dark current of each electronic component on the vehicle must be strictly limited. Therefore, it is necessary to test the dark current of the developed and designed electronic component product.

[0034] Based on the supplier of the development of the automotive electronic component, the dark current test is usually that when the electronic product is in the normal working state, the product is controlled to enter the sleep state through the software. At this time, the current on the positive and negative supply circuit is measured, which is the dark current value of the product. For the convenience of measurement, a digital multimeter is generally directly connected for detection, but when testing the current, the digital multimeter is often disconnected in the current range. Through detection and analysis, it is found that the fuse of the mA range of the digital multimeter is blown. The reasons for the blowing are as follows: 1. After the electronic component enters the sleep state, when the digital multimeter is connected in series in the circuit loop, the supply circuit is disconnected at this time. After the digital multimeter is completely connected, the circuit loop is connected, the electronic component will perform power-on reset self-checking or the potential impact of the capacitor device at the start time, i.e. the peak current, when the wake-up signal cannot be detected, it enters the steady sleep state instantaneously. But in the moment of the impact of the peak current on the electronic component, although the time is very short, the impact current is enough to blow the mA range of the digital multimeter. 2. Before the electronic component is powered on, the current is greater than the test range of the dark current, and the digital multimeter will be blown due to the exceeding of the measurement range. If the A range is used, the measurement range will be too large, and the dark current value cannot be directly measured. At this time, when the range is switched, the circuit will be disconnected for a short time, and the first blowing condition will occur. 3. The detection device with a filter circuit is used, such as a desktop multimeter and a high-precision power input and output module. However, this scheme is not suitable for testing outside or for maintenance.

[0035] Therefore, the embodiment of the present application provides a dark current test device and a test method, so as to avoid the impact of the peak current on the test precision and the loss of the test device when the dark current test is performed, and to realize the accurate test of the dark current.

[0036] Figure 1 The structure block diagram of the dark current test device provided in the embodiment of the present application is shown in FIG. 1. Figure 1The dark current testing device comprises a power supply device 100 and an auxiliary device 200; the auxiliary device 200 is connected between the first end of the power supply device 100 and the first end of a sample piece 300 to be tested, and the second end of the power supply device 100 is electrically connected with the second end of the sample piece 300 to be tested; the auxiliary device 200 comprises a first switch S1, a second switch S2, a third switch S3, a fourth switch S4, an impedance module 201 and a current detection module 202; the first switch S1 is connected between the first end of the power supply device 100 and the first end of the sample piece 300 to be tested, and is used for forming a first path L1; the second switch S2 is connected between the first end of the power supply device 100 and the first end of the sample piece 300 to be tested, and is used for forming a second path L2; the first end of the third switch S3 is electrically connected with the first end of the power supply device 100, the second end of the third switch S3 is electrically connected with the current detection module 202, the current detection module 202 is electrically connected with the first end of the sample piece 300 to be tested, and is used for forming a third path L3; the first end of the fourth switch S4 is electrically connected with the first end of the power supply device 100, the second end of the fourth switch S4 is electrically connected with the first end of the impedance module 201, the second end of the impedance module 201 is respectively electrically connected with the second end of the third switch S3 and the current detection module 202, and is used for forming a fourth path L4; the closing or opening of the first switch S1, the second switch S2, the third switch S3 and the fourth switch S4 controls the conduction sequence and the number of simultaneous conduction of the first path L1, the second path L2, the third path L3 and the fourth path L4, so as to control the power-on start, the entering into the sleep state and the dark current test of the sample piece 300 to be tested.

[0037] The power supply device 100 can be a power supply module provided by the automobile itself or an external power supply module, and the specific setting can be made according to the actual situation, which is not limited here.

[0038] The first end of the power supply device 100 can be a positive end or a negative end, and correspondingly, the second end of the power supply device 100 can be a negative end or a positive end. The specific setting can be made according to the actual situation, which is not limited here.

[0039] The sample piece 300 to be tested refers to various devices that need to be tested for dark current, such as automobile electronic components and simulated automobile electronic components.

[0040] The closing or opening of the first switch S1, the second switch S2, the third switch S3 and the fourth switch S4 can be controlled by setting a controller, or can be controlled manually or by other control methods. The specific setting can be made according to the actual situation, which is not limited here.

[0041] The impedance module 201 is used to prevent excessive current and reduce the peak current that may occur to avoid burning the current detection module 202 when only the fourth path L4 is turned on (i.e. the switches of other paths are turned off and only the fourth switch S4 is closed).

[0042] The current detection module 202 is used to detect the dark current. The current detection module 202 can be a current sensor, an ammeter or the like. The specific setting can be made according to the actual situation, which is not specifically limited here.

[0043] In the technical solution of the embodiment, the implementation process of the dark current testing device is as follows: Figure 1 The dark current testing device is electrically connected with the to-be-tested sample 300 that needs to be tested for dark current, that is, the auxiliary device 200 is connected between the first end of the power supply device 100 and the first end of the to-be-tested sample 300, and the second end of the power supply device 100 is electrically connected with the second end of the to-be-tested sample 300. By controlling the closing or opening of the first switch S1, the second switch S2, the third switch S3 and the fourth switch S4 to control the conduction sequence and the number of simultaneous conduction of the first path L1, the second path L2, the third path L3 and the fourth path L4, the to-be-tested sample 300 is controlled to be powered on first, then enter the sleep state, and finally the dark current is tested in the sleep state. Therefore, by controlling the conduction sequence and the number of simultaneous conduction of the first path L1, the second path L2, the third path L3 and the fourth path L4, the peak current can be avoided, thereby improving the testing accuracy of the dark current. And by setting the impedance module 201 in the fourth path L4, the current can be prevented from being too large when only the fourth path L4 is turned on (i.e. the switches of other paths are turned off and only the fourth switch S4 is closed), the peak current that may occur is reduced to avoid burning the current detection module 202, thereby further ensuring the accurate testing of the dark current.

[0044] It should be noted that the testing device provided by the embodiment of the present application can test the dark current of the to-be-tested sample before or after it is shipped.

[0045] The technical scheme of the embodiment provides a dark current testing device, which comprises a power supply device and an auxiliary device; the auxiliary device is connected between the first end of the power supply device and the first end of a sample to be tested, and the second end of the power supply device is electrically connected with the second end of the sample to be tested; the auxiliary device comprises a first switch, a second switch, a third switch, a fourth switch, an impedance module and a current detection module; the first switch is connected between the first end of the power supply device and the first end of the sample to be tested, and is used for forming a first path; the second switch is connected between the first end of the power supply device and the first end of the sample to be tested, and is used for forming a second path; the first end of the third switch is electrically connected with the first end of the power supply device, the second end of the third switch is electrically connected with the current detection module, the current detection module is electrically connected with the first end of the sample to be tested, and is used for forming a third path; the first end of the fourth switch is electrically connected with the first end of the power supply device, the second end of the fourth switch is electrically connected with the first end of the impedance module, and the second end of the impedance module is respectively electrically connected with the second end of the third switch and the current detection module, and is used for forming a fourth path; the closing or opening of the first switch, the second switch, the third switch and the fourth switch controls the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, so as to control the power-on start, the entering of the sleep state and the dark current test of the sample to be tested. Therefore, by controlling the closing or opening of the first switch, the second switch, the third switch and the fourth switch to control the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, the occurrence of the peak current during the dark current test can be avoided, the test precision is not affected, and the test device is not damaged. By arranging the impedance module, the occurrence of the peak current can be further reduced, the test precision of the dark current is further improved, and the accurate test of the dark current is realized.

[0046] On the basis of the above-mentioned technical scheme, optionally, the closing or opening of the first switch S1, the second switch S2, the third switch S3 and the fourth switch S3 controls the conduction sequence and the number of simultaneous conduction of the first path L1, the second path L2, the third path L3 and the fourth path L4, so as to control the power-on start of the sample to be tested 300, which comprises that the first switch S1 and the second switch S2 are closed, and the third switch S3 and the fourth switch S4 are opened, the first path L1 and the second path L2 are controlled to be conducted, and the third path L3 and the fourth path L4 are controlled to be disconnected, so as to control the power-on start of the sample to be tested 300.

[0047] The second path L2 is used to provide long electricity when conducted, that is, to provide a commonly used working voltage, such as 12V voltage. The first path L1 is used to detect the voltage of the sample to be tested 300. If the voltage is detected, it indicates that the sample to be tested 300 is started, otherwise it indicates that the sample to be tested 300 is in sleep state.

[0048] Specifically, before the power supply device 100 supplies power, the first switch S1 and the second switch S2 are set to be closed, and the third switch S3 and the fourth switch S4 are set to be open. When the power supply device 100 normally supplies power, the first path L1 and the second path L2 are conducted (the third path L3 and the fourth path L4 are open), and the first path L1 is conducted to detect the wake-up voltage, so that the sample under test 300 enters the working state. At this time, the current passes through the second switch S2 to form a path to the sample under test 300, that is, the power-on start of the sample under test 300 is realized.

[0049] Alternatively, the closing or opening of the first switch S1, the second switch S2, the third switch S3 and the fourth switch S4 controls the conduction sequence and the number of simultaneous conduction of the first path L1, the second path L2, the third path L3 and the fourth path L4, so as to control the sample under test 300 to enter the sleep state, including: when the first switch S1 and the second switch S2 are closed, and the third switch S3 and the fourth switch S4 are open, the first switch S1 is opened, so as to control the sample under test 300 to enter the sleep state.

[0050] In order to control the sample under test 300 to be in the sleep state for subsequent dark current test. Specifically, when the sample under test 300 is in normal working, that is, when the first switch S1 and the second switch S2 are closed, and the third switch S3 and the fourth switch S4 are open, the first switch S1 is opened, so that the first path L1 is disconnected, and at this time the first path L1 does not detect the wake-up voltage, and the sample under test 300 enters the sleep state.

[0051] Alternatively, the closing or opening of the first switch S1, the second switch S2, the third switch S3 and the fourth switch S4 controls the conduction sequence and the number of simultaneous conduction of the first path L1, the second path L2, the third path L3 and the fourth path L4, so as to control the sample under test 300 to enter the sleep state, including: when the first switch S1, the third switch S3 and the fourth switch S4 are open, and the second switch S2 is closed, the sample under test 300 enters the sleep state, the fourth switch S4 is closed to control the second path L2 and the fourth path L4 to be conducted at the same time; then, the second switch S2 is opened to control the second path L2 to be disconnected; then, the third switch S3 is closed to control the third path L3 and the fourth path L4 to be conducted at the same time; finally, the fourth switch S4 is opened to test the dark current of the sample under test 300 through the third path L3.

[0052] Specifically, when the first switch S1, the third switch S3 and the fourth switch S4 are turned off and the second switch S2 is turned on, and the sample piece 300 enters the dormant state, only the second path L2 is turned on at this time. After the sample piece 300 enters the dormant state, the test of the dark current is started. First, the fourth switch S4 is controlled to be turned on, so that the fourth path L4 is turned on. At this time, the second path L2 and the fourth path L4 are turned on at the same time to form two paths, which can ensure that the sample piece 300 is always one path, so as to avoid the occurrence of sharp current and avoid burning the current detection module 202. Then, the second switch S2 is controlled to be turned off, that is, the second path L2 is turned off. At this time, the second path L2 is turned off, so that only the fourth path L4 is turned on in the whole circuit. The impedance module 201 arranged in the fourth path L4 can be used to prevent the current from being too large and reduce the sharp current that may occur to avoid burning the current detection module 202. Secondly, the third switch S3 is controlled to be turned on, so that the third path L3 is turned on. At this time, the third path L3 and the fourth path L4 are turned on at the same time to form two paths again, so as to avoid the generation of sharp current to affect the current detection of the current detection module 202. Finally, the fourth switch S4 is controlled to be turned off, so that only the third path L3 is turned on to detect the dark current. Since the two paths are formed twice and the impedance module is arranged in the switching process of the two times of forming the two paths, the current passing through the third path at this time is only the dark current without the influence of the sharp current, so that the current detection module 202 can detect the actual dark current, thereby improving the detection accuracy of the dark current. At the same time, the device can also play a role in protecting the current detection device.

[0053] Figure 2 is a structural schematic diagram of a dark current test device provided in an embodiment of the present application. Optionally, the impedance module is a resistive element. For example, the impedance module can be a resistive element R0 as shown in the figure. The resistance value of the resistive element R0 can be set according to actual conditions, which is not specifically limited here. Figure 2

[0054] Optionally, the resistive element is a pin resistor.

[0055] Optionally, the resistive element is a pin resistor.

[0056] Optionally, the current detection module is an ammeter.

[0057] Optionally, the current detection module is an ammeter. Figure 2

[0058] ​​Optionally, the first switch S1, the second switch S2, the third switch S3 and the fourth switch S4 are jump switch.

[0059] The first switch S1, the second switch S2, the third switch S3 and the fourth switch S4 can also be other forms of switches, such as electrically controlled switches, manually controlled switches, etc. The specific setting can be made according to the actual situation, and again, no specific limitation is made.

[0060] Figure 3 is a structural schematic diagram of a control panel of a dark current testing device provided in an embodiment of the present application. Referring to Figure 3 , the power supply interface (such as the positive electrode interface) K1 of the power supply device, the first switch S1, the second switch S2, the third switch S3, the fourth switch S4, the first passage KL15 voltage connection inlet K2, the second passage KL30 power supply connection inlet K3, the positive electrode interface A_I of the ammeter, the negative electrode interface A_O of the ammeter and the display screen A0 of the ammeter can all be arranged on the control panel 400, so that the operator can conveniently perform the dark current testing operation. The control panel can be an insulating plate.

[0061] Figure 4 is a flow chart of a testing method of a dark current testing device provided in an embodiment of the present application. The present application provides a testing method of a dark current testing device, referring to Figure 4 , the testing method comprises the following steps:

[0062] S110, the on-off sequence and the number of simultaneous conduction of the first passage, the second passage, the third passage and the fourth passage are controlled by the closing or opening of the first switch, the second switch, the third switch and the fourth switch, so as to control the power-on start, the entering into the sleep state and the dark current testing of the sample to be tested.

[0063] The dark current testing device comprises a power supply device and an auxiliary device; the auxiliary device is connected between the first end of the power supply device and the first end of the sample to be tested, and the second end of the power supply device is electrically connected with the second end of the sample to be tested; the auxiliary device comprises a first switch, a second switch, a third switch, a fourth switch, an impedance module and a current detection module; the first switch is connected between the first end of the power supply device and the first end of the sample to be tested, and is used for forming a first passage; the second switch is connected between the first end of the power supply device and the first end of the sample to be tested, and is used for forming a second passage; the first end of the third switch is electrically connected with the first end of the power supply device, the second end of the third switch is electrically connected with the current detection module, the current detection module is electrically connected with the first end of the sample to be tested, and is used for forming a third passage; the first end of the fourth switch is electrically connected with the first end of the power supply device, the second end of the fourth switch is electrically connected with the first end of the impedance module, the second end of the impedance module is respectively electrically connected with the second end of the third switch and the current detection module, and is used for forming a fourth passage.

[0064] The technical scheme of the embodiment provides a test method of the dark current test device, which comprises: controlling the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path by closing or opening the first switch, the second switch, the third switch and the fourth switch, so as to control the power-on start, the entering into the sleep state and the dark current test of the sample to be tested. It can be known that, by controlling the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path by closing or opening the first switch, the second switch, the third switch and the fourth switch, the occurrence of the peak current during the dark current test can be avoided, the test precision is affected and the test device is damaged, and by setting the impedance module, the occurrence of the peak current can be further reduced, the test precision of the dark current is further improved, and the accurate test of the dark current is realized.

[0065] Optionally, the dark current test of the sample to be tested by controlling the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path by closing or opening the first switch, the second switch, the third switch and the fourth switch comprises: when the first switch, the third switch and the fourth switch are opened and the second switch is closed and the sample to be tested enters into the sleep state, the fourth switch is first controlled to be closed, so as to control the second path and the fourth path to be simultaneously conducted; then, the second switch is controlled to be opened, so as to control the second path to be opened; then, the third switch is controlled to be closed, so as to control the third path and the fourth path to be simultaneously conducted; finally, the fourth switch is controlled to be opened, so as to test the dark current of the sample to be tested through the third path.

[0066] Specifically, when the first switch, the third switch and the fourth switch are turned off, and the second switch is turned on, and the sample under test enters the dormant state, only the second path is turned on at this time. After the sample under test enters the dormant state, the dark current test is started. First, the fourth switch is turned on so that the fourth path is turned on, at this time the second path and the fourth path are turned on at the same time to form two paths, which can ensure that the sample under test is always one path, and can avoid the occurrence of sharp current and avoid burning out the current detection module. Then, the second switch is turned off, that is, the second path is turned off. At this time, the second path is turned off so that the entire circuit has only one path, the fourth path, and by setting the impedance module in the fourth path, the current can be prevented from being too large, and the sharp current that may occur can be reduced to avoid burning out the current detection module. Secondly, the third switch is turned on so that the third path is turned on, at this time the third path and the fourth path are turned on at the same time to form two paths again, which can avoid the generation of sharp current to affect the current detection of the current detection module. Finally, the fourth switch is turned off, and after the fourth path is turned off, only the third path is turned on to detect the dark current. Since the impedance module is set during the switching process of forming two paths twice, the current passing through the third path at this time is only the dark current, and there is no influence of the sharp current, so that the current detection module can detect the actual dark current, thereby improving the detection accuracy of the dark current, and the device can also protect the current detection device.

[0067] It should be understood that the various forms of flow shown above can be reordered, added to, or deleted from. For example, the steps described in the present application can be executed in parallel, in sequence, or in different orders, as long as the desired results of the technical solutions of the present application can be achieved, and the present application is not limited herein.

[0068] The above detailed description does not constitute a limitation on the protection scope of the present application. Those skilled in the art should understand that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present application shall be included in the protection scope of the present application.

Claims

1. A dark current testing apparatus, characterized by, The utility model relates to a kind of auxiliary device and power supply equipment, including: Power supply equipment and auxiliary device;Wherein, the auxiliary device is connected in the first end of the power supply equipment and the first end of the sample to be measured, and the second end of the power supply equipment is electrically connected with the second end of the sample to be measured; The auxiliary device includes: first switch, second switch, third switch, fourth switch, impedance module and current detection module;Wherein, the current detection module is ammeter; Wherein, the first switch is connected between the first end of the power supply equipment and the first end of the sample to be measured, for forming first path;The second switch is connected between the first end of the power supply equipment and the first end of the sample to be measured, for forming second path;The first end of the third switch is electrically connected with the first end of the power supply equipment, and the second end of the third switch is electrically connected with the current detection module, and the current detection module is electrically connected with the first end of the sample to be measured, for forming third path;The first end of the fourth switch is electrically connected with the first end of the power supply equipment, and the second end of the fourth switch is electrically connected with the first end of the impedance module, and the second end of the impedance module is electrically connected with the second end of the third switch and the current detection module respectively, for forming fourth path; The closure or disconnection of the first switch, the second switch, the third switch and the fourth switch controls the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, to control the power-on start, enter the sleep state and dark current test of the sample to be measured; When the first switch, the third switch and the fourth switch are disconnected, and the second switch is closed, the sample to be measured enters the sleep state, the fourth switch is closed to control the second path and the fourth path to be conducted simultaneously;Then, the second switch is disconnected to control the second path to be disconnected;After that, the third switch is closed to control the third path and the fourth path to be conducted simultaneously;Finally, the fourth switch is disconnected to test the dark current of the sample to be measured through the third path.

2. The dark current testing apparatus of claim 1, wherein The closure or disconnection of the first switch, the second switch, the third switch and the fourth switch controls the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, to control the power-on start of the sample to be measured, including: The first switch and the second switch are closed, and the third switch and the fourth switch are disconnected, to control the first path and the second path to be conducted, and the third path and the fourth path to be disconnected, to control the power-on start of the sample to be measured.

3. The dark current testing apparatus of claim 1, wherein The closure or disconnection of the first switch, the second switch, the third switch and the fourth switch controls the conduction sequence and the number of simultaneous conduction of the first path, the second path, the third path and the fourth path, to control the sample to be measured to enter the sleep state, including: When the first switch and the second switch are closed, and the third switch and the fourth switch are disconnected, the first switch is disconnected to control the sample to be measured to enter the sleep state.

4. The dark current testing apparatus of claim 1, wherein The impedance module is a resistive element.

5. The dark current testing apparatus of claim 4, wherein The resistive element is a pin resistor.

6. The dark current testing apparatus of claim 1, wherein The first switch, the second switch, the third switch and the fourth switch are jump switch.

7. A method of testing a dark current test device as claimed in any one of claims 1 to 6, wherein the method comprises: applying a voltage to the test device; and measuring the current flowing through the test device. 7 Comprise: The first switch, the second switch, the third switch and the fourth switch are jump switch.

8. The test method of the dark current test apparatus according to claim 7, wherein The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third switch and the fourth switch are jump switch. The first switch, the second switch, the third

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