Appearance defect detection algorithm parameter setting method and device, and electronic equipment

Abstract

This invention discloses a method, apparatus, and electronic device for setting parameters of an appearance defect detection algorithm. The method includes: setting parameters for the appearance defect type of a laser chip to be detected; setting parameters for the segmentation method and detection method of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; setting parameters for the detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters for the detection surface; and setting parameters for locating the detection surface of the laser chip according to the parameters of the detection surface and the segmentation method. The method for setting appearance defect detection algorithm parameters provided by this invention is not only simple and efficient in its setting logic and easy to adjust, but also adaptable to different types of laser chips, enabling diverse appearance detection and greatly improving the detection efficiency of appearance defects in laser chips.

Description

Technical Field

[0001] This invention relates to the field of laser chip inspection technology, and in particular to a method, apparatus, and electronic device for setting algorithm parameters for appearance defect detection. Background Technology

[0002] The production and packaging of laser chips (Chip on Submount) involves a series of highly complex steps, resulting in various types of damage and defects. Therefore, to ensure optimal laser performance, strict control over the manufacturing process is crucial, such as continuously compressing the linewidth. However, this operation can easily damage and contaminate the laser's cavity surface, creating voids in the solder layer, which significantly impacts the optical performance and stability of the laser chip. Furthermore, some defects pose significant risks to the laser chip, greatly affecting its physical properties.

[0003] Currently, after laser chips are manufactured, defects are mainly determined through image acquisition, image recognition, data extraction, and data matching. However, these defect detection algorithms are complex and cannot accurately detect external defects in different types of laser chips, significantly reducing the efficiency of laser chip appearance defect detection. Summary of the Invention

[0004] To address the shortcomings of existing technologies, this invention provides a method, apparatus, and electronic device for setting parameters of an appearance defect detection algorithm, aiming to solve the technical problem of low efficiency in appearance defect detection of laser chips in existing technologies.

[0005] To address the aforementioned problems, in a first aspect, embodiments of the present invention provide a method for setting parameters of an appearance defect detection algorithm, comprising:

[0006] Set the parameters for the type of appearance defect of the laser chip to be inspected;

[0007] The parameters of the segmentation method and the detection method of the appearance image of the laser chip are set according to the appearance defect type and the detection surface of the laser chip.

[0008] The parameters of the detection surface of the laser chip are set according to the chip type of the laser chip, and the standard parameters of the detection surface are imported.

[0009] The parameters of the detection surface of the laser chip are set according to the parameters of the detection surface and the parameters of the segmentation method.

[0010] Secondly, embodiments of the present invention provide a device for setting parameters of an appearance defect detection algorithm, comprising:

[0011] The first setting unit is used to set parameters for the type of appearance defect of the laser chip to be detected;

[0012] The second setting unit is used to set the segmentation method and detection method parameters of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip;

[0013] The third setting unit is used to set the parameters of the detection surface of the laser chip according to the chip type of the laser chip, and import the standard parameters of the detection surface;

[0014] The fourth setting unit is used to set the parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation method.

[0015] Thirdly, embodiments of the present invention provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the method for setting parameters of the appearance defect detection algorithm as described in the first aspect above.

[0016] Fourthly, embodiments of the present invention also provide a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, which, when executed by a processor, causes the processor to execute the method for setting parameters of the appearance defect detection algorithm described in the first aspect.

[0017] This invention provides a method, apparatus, and electronic device for setting parameters of an appearance defect detection algorithm. The method involves setting parameters for the appearance defect type of the laser chip to be detected, and then setting parameters for the segmentation and detection methods of the laser chip's appearance image based on the appearance defect type. Next, the chip type of the laser chip is determined, and parameters for the detection surface of the laser chip are set according to the chip type, importing standard parameters for the detection surface. Finally, parameters for locating the detection surface of the laser chip are set based on the parameters of the detection surface and the segmentation method, thus completing the setting of the appearance defect detection algorithm parameters. The method for setting appearance defect detection algorithm parameters provided by this invention is not only simple and efficient in its setting logic and easy to adjust, but also adaptable to different types of laser chips, enabling diverse appearance detection and greatly improving the detection efficiency of appearance defects in laser chips. Attached Figure Description

[0018] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings used in the following description of the embodiments will be briefly introduced. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 A flowchart illustrating the method for setting parameters of the appearance defect detection algorithm provided in this embodiment of the invention;

[0020] Figure 2 Another flowchart illustrating the method for setting parameters of the appearance defect detection algorithm provided in this embodiment of the invention;

[0021] Figure 3 Another flowchart illustrating the method for setting parameters of the appearance defect detection algorithm provided in this embodiment of the invention;

[0022] Figure 4 Another flowchart illustrating the method for setting parameters of the appearance defect detection algorithm provided in this embodiment of the invention;

[0023] Figure 5 Another flowchart illustrating the method for setting parameters of the appearance defect detection algorithm provided in this embodiment of the invention;

[0024] Figure 6 Another flowchart illustrating the method for setting parameters of the appearance defect detection algorithm provided in this embodiment of the invention;

[0025] Figure 7 A schematic block diagram of a device for setting parameters of an appearance defect detection algorithm provided in an embodiment of the present invention;

[0026] Figure 8 A schematic block diagram of an electronic device provided in an embodiment of the present invention. Detailed Implementation

[0027] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0028] It should be understood that, when used in this specification and the appended claims, the terms "comprising" and "including" indicate the presence of the described features, integrals, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integrals, steps, operations, elements, components and / or collections thereof.

[0029] It should also be understood that the terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the invention. As used in this specification and the appended claims, the singular forms “a,” “an,” and “the” are intended to include the plural forms unless the context clearly indicates otherwise.

[0030] It should also be further understood that the term "and / or" as used in this specification and the appended claims refers to any combination of one or more of the associated listed items and all possible combinations, and includes such combinations.

[0031] The method for setting appearance defect detection algorithm parameters described in this embodiment of the invention is applied to a terminal device. This method is executed through application software installed on the terminal device. The terminal device can be an electronic device such as a desktop computer, laptop computer, tablet computer, or mobile phone.

[0032] It should be noted that the application scenarios of the above embodiments are merely examples. The services and scenarios described in the embodiments of the present invention are for the purpose of more clearly illustrating the technical solutions of the embodiments of this application, and do not constitute a limitation on the technical solutions provided by the embodiments of this application. As those skilled in the art will know, with the evolution of systems and the emergence of new business scenarios, the technical solutions provided by the embodiments of this application are also applicable to similar technical problems. Detailed descriptions will follow.

[0033] It should be noted that the order of description of the following embodiments is not intended to limit the preferred order of the embodiments. The method for setting the parameters of the appearance defect detection algorithm is described in detail below.

[0034] Please see Figure 1 , Figure 1 This is a flowchart illustrating the method for setting parameters of the appearance defect detection algorithm provided in an embodiment of the present invention.

[0035] like Figure 1 As shown, the method includes the following steps S110 to S140.

[0036] S110, Set the parameters for the appearance defect type of the laser chip to be detected.

[0037] In this embodiment, the parameters for the appearance defect type include the defect name and the defect identifier. The defect name includes dirt, white streaks, discoloration, etc. Dirt includes black dirt and white dirt. The defect identifier is the symbol when the appearance defect of the laser chip at the detection point matches the set defect name. The defect identifier can be identified by symbols such as English letters. That is to say, each defect name corresponds to one defect identifier.

[0038] In other embodiments of the invention, such as Figure 2 As shown, step S110 includes steps S111 and S112.

[0039] S111. If the appearance defect type of the laser chip does not exist in the terminal, add the defect name and defect identifier of the appearance defect type of the laser chip.

[0040] S112. If there is an appearance defect type in the terminal that does not match the laser chip, delete the defect name and defect identifier of the appearance defect type that does not match the laser chip.

[0041] Specifically, terminals typically have pre-set parameters for different types of appearance defects. However, different types of laser chips require different types of appearance defects to be detected; in other words, different types of laser chips have different appearance defect types. Therefore, if the terminal does not have the appearance defect type for the laser chip to be detected, it is necessary to add the parameter for that appearance defect type, specifically by adding the defect name and defect identifier. If the terminal has an appearance defect type that does not match the laser chip to be detected, it is necessary to delete the parameter for that incompatible appearance defect type, specifically by deleting the defect name and defect identifier.

[0042] It should be noted that this application can simultaneously detect multiple types of appearance defects in the laser chip, or it can detect only one type of appearance defect. The specific choice can be made according to the actual application, and this embodiment does not impose any specific limitations.

[0043] S120. Set the segmentation method and detection method parameters of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip.

[0044] Specifically, this application detects appearance defects in laser chips by acquiring images of the laser chip's appearance and then processing these images. The application primarily detects the front, bottom, HR (high reflectivity) surface, and AR (anti-reflection) surface of the laser chip. Therefore, the appearance detection type, segmentation method, and detection method differ for each surface of the laser chip. By setting the parameters for the appearance defect type of the laser chip to be detected, the segmentation method and detection method for each surface of the laser chip can be set, thereby enabling defect detection on each surface of the laser chip.

[0045] In other embodiments of the invention, such as Figure 3 As shown, step S120 includes steps S121 and S122.

[0046] S121. If the segmentation method is threshold segmentation, set the color space of the threshold segmentation, the first segmentation threshold, and the color of the abnormal region according to the detection surface;

[0047] S122. Set the first defect criterion for threshold segmentation according to the appearance defect type.

[0048] In this embodiment, the appearance images of different detection surfaces on the laser chip are segmented in different ways, and threshold segmentation is included in the segmentation. Specifically, threshold segmentation is used to segment and detect defects in the appearance images corresponding to the AR and HR surfaces of the laser chip. Threshold segmentation isolates faults into black or white based on the clarity of imaging in different color spaces, thereby enabling the detection of defects in the detection surfaces.

[0049] The threshold segmentation parameters include color space, first segmentation threshold, color of abnormal regions, and first defect standard. The color space includes luminance space, green space, and gray space; different color spaces correspond to different first segmentation thresholds, abnormal region colors, and first defect standards. After determining the detection surface of the laser chip, the color space, first segmentation threshold, and abnormal region colors for threshold segmentation of the surface's appearance image can be set based on the surface's color. Simultaneously, the first defect standard for threshold segmentation can be determined based on the external defect detection type corresponding to the detection surface. Specifically, the first segmentation threshold is the threshold for pixel segmentation of the appearance image; the abnormal region color can be white or black; the first defect standard includes the maximum and minimum values ​​of defect width and height, as well as the maximum allowed number of defects and the minimum defect size.

[0050] In other embodiments of the invention, such as Figure 4 As shown, step S120 also includes steps S123 and S124.

[0051] S123. If the segmentation method is color segmentation, set the second segmentation threshold of the color segmentation and the color of the abnormal area according to the detection surface;

[0052] S124. Set the second defect standard for color segmentation according to the appearance defect type.

[0053] In this embodiment, the segmentation method for the appearance image of the detection surface also includes color segmentation, which is specifically used to segment and detect the appearance images corresponding to the front and bottom surfaces of the laser chip. Compared with threshold segmentation, color segmentation removes the color space and directly uses the color of the laser chip itself to segment and detect defects in the laser chip. The parameters of color segmentation include a second segmentation threshold, the color of the abnormal area, and a second defect standard. The second defect standard of color segmentation can be determined according to the external defect detection type corresponding to the detection surface.

[0054] Specifically, the second segmentation threshold includes thresholds for color hue, color saturation, and color brightness. By setting the second segmentation threshold for color segmentation, the front and bottom surfaces of the chip can be better located, while also improving the edge detection rate and reducing over-kill. The color of the abnormal area can be white or black. The second defect standard includes the maximum and minimum values ​​of the defect width and height. Meanwhile, the first defect standard also includes the maximum number of defects allowed and the minimum size of the defect.

[0055] In other embodiments of the invention, such as Figure 5 As shown, step S120 also includes steps S125, S126 and S127.

[0056] S125. Set the third defect standard for the detection method of the appearance image of the laser chip according to the appearance defect detection type;

[0057] S126. If the detection method is white line detection, set the first algorithm threshold for white line detection;

[0058] S127. If the detection method is heterochromatic detection, set the region expansion parameter for white line detection and the second algorithm threshold.

[0059] In this embodiment, the third defect standard includes the maximum and minimum values ​​of the defect width and height, while the first defect standard also includes the maximum number of allowed defects and the minimum size of the defect. After setting the parameters of the third defect standard, the specific parameters of the corresponding detection method can be set. The detection methods mentioned in this application include white line detection and color difference detection. When the detection method is white line detection, a first algorithm threshold for white line detection is set; when the detection method is color difference detection, a region expansion parameter and a second algorithm threshold for white line detection are set. The range of the first and second algorithm thresholds is between 0 and 1. The region expansion parameters include a left expansion parameter, a right expansion parameter, an upward expansion parameter, and a downward expansion parameter. The unit of the region expansion parameter is pixels, which can be negative pixels.

[0060] S130. Set the parameters of the detection surface of the laser chip according to the chip type of the laser chip, and import the standard parameters of the detection surface.

[0061] Specifically, when using an appearance defect detection algorithm to detect appearance defects in a laser chip, this application also requires setting parameters for the detection surfaces of the laser chip in the algorithm. The detection surfaces of the laser chip include the front surface, bottom surface, HR surface, and AR surface. The parameters for the front surface include the width, width tolerance, height, height tolerance, and chip tilt angle. The parameters for the bottom surface include the width, width tolerance, height, height tolerance, and chip tilt angle. The parameters for the AR surface include the width, width tolerance, height, height tolerance, chip tilt angle, etching groove width, etching groove width tolerance, etching groove height, etching groove height tolerance, etching groove spacing, critical area width, critical area height, critical area leftward offset, and critical area upward offset. The parameters for the HR surface include the width, width tolerance, height, height tolerance, chip tilt angle, etching groove width, etching groove width tolerance, etching groove height, etching groove height tolerance, etching groove spacing, critical area width, critical area height, critical area leftward offset, and critical area upward offset.

[0062] S140. Set the parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation method.

[0063] In this embodiment, different appearance images of the detection surfaces correspond to different segmentation methods and different positioning methods. After determining the detection surface of the laser chip that needs to be inspected for appearance defects and the segmentation method of the appearance image of the detection surface, the parameters for positioning the detection surface in the appearance image can be set. Among them, the methods for positioning the detection surface of the laser chip include contour positioning and surface positioning.

[0064] In other embodiments of the invention, such as Figure 6 As shown, step S140 includes steps S141, S142, S143, and S144.

[0065] S141. If contour positioning is used to locate the detection surface of the laser chip, the etch groove range and critical area range in the contour of the appearance image of the laser chip are set according to the detection surface; wherein, the detection surface includes the AR surface and HR surface of the laser chip;

[0066] S142. Set the color space and offset compensation value of the upper and lower edges of the outline of the laser chip's appearance image;

[0067] S143. If the detection surface of the laser chip is used for surface positioning, the third segmentation threshold of the appearance image of the laser chip and the color of the abnormal area are set according to the detection surface; wherein, the detection surface includes the front and bottom surfaces of the laser chip;

[0068] S144. Set the brightness compensation value of the detection surface of the laser chip.

[0069] In this embodiment, different detection surfaces are positioned using different methods. The HR and AR surfaces of the laser chip are positioned using contour positioning, while the front and bottom surfaces of the laser chip are positioned using surface positioning. The parameters for contour positioning of the laser chip's detection surfaces include the etching range, critical region range, color space of the upper and lower edges of the contour in the corresponding appearance image, and offset compensation values. The detection surfaces include the AR and HR surfaces of the laser chip. The etching range in the contour of the appearance image corresponding to the detection surface includes the etching groove width, etching groove width tolerance, etching groove height, etching groove height tolerance, and etching groove spacing, which can be obtained from the parameters of the corresponding detection surface. The critical region range includes the critical region width and critical region height, which can also be obtained from the parameters of the corresponding detection surface. The color space of the upper and lower edges of the contour and the offset compensation values ​​are determined based on the threshold-segmented color space. The parameters of the detection surface of the laser chip with surface positioning include the third segmentation threshold of the appearance image corresponding to the detection surface, the color of the abnormal area, and the brightness compensation value. The third segmentation threshold includes the thresholds for color hue, color saturation, and color brightness. The color of the abnormal area can be black or white, and the brightness compensation value of the detection surface of the laser chip can be set according to the color of the detection surface.

[0070] In other embodiments of the invention, after step S140, the method further includes the step of: performing appearance defect detection on the laser chip according to the appearance defect detection algorithm after parameter settings.

[0071] In this embodiment, after the parameters of the laser chip appearance defect detection algorithm are set, the laser chip can be placed in the image acquisition mechanism to acquire appearance images. Then, the acquired appearance images are processed using the appearance defect detection algorithm with the above-mentioned parameter settings, so that defects on each side of the laser chip can be detected.

[0072] In the method for setting parameters of the appearance defect detection algorithm provided in this embodiment of the invention, parameters for the appearance defect type of the laser chip to be detected are set; parameters for the segmentation method and detection method of the appearance image of the laser chip are set according to the appearance defect type and the detection surface of the laser chip; parameters for the detection surface of the laser chip are set according to the chip type of the laser chip, and standard parameters for the detection surface are imported; parameters for locating the detection surface of the laser chip are set according to the parameters of the detection surface and the parameters of the segmentation method. The method for setting parameters of the appearance defect detection algorithm provided by this invention is not only simple and efficient in setting logic and easy to adjust, but also adaptable to different types of laser chips, enabling diversified appearance detection and greatly improving the detection efficiency of appearance defects of laser chips.

[0073] This invention also provides a device 100 for setting parameters of an appearance defect detection algorithm, which is used to execute any of the aforementioned methods for setting parameters of an appearance defect detection algorithm.

[0074] Specifically, please refer to Figure 7 , Figure 7 This is a schematic block diagram of the device 100 for setting parameters of the appearance defect detection algorithm provided in an embodiment of the present invention.

[0075] like Figure 7 As shown, the device 100 for setting parameters of the appearance defect detection algorithm includes: a first setting unit 110, a second setting unit 120, a third setting unit 130 and a fourth setting unit 140.

[0076] The first setting unit 110 is used to set parameters for the appearance defect type of the laser chip to be detected;

[0077] The second setting unit 120 is used to set the segmentation method and detection method parameters of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip.

[0078] The third setting unit 130 is used to set the parameters of the detection surface of the laser chip according to the chip type of the laser chip, and import the standard parameters of the detection surface.

[0079] The fourth setting unit 140 is used to set the parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation method.

[0080] The appearance defect detection algorithm parameter setting device 100 provided in this embodiment of the invention is used to perform the above-mentioned setting of parameters for the appearance defect type of the laser chip to be detected; setting parameters for the segmentation method and detection method of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; setting parameters for the detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters of the detection surface; and setting parameters for locating the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation method.

[0081] It should be noted that those skilled in the art can clearly understand that the specific implementation process of the above-mentioned appearance defect detection algorithm parameter setting device 100 and each unit can be referred to the corresponding description in the foregoing method embodiments. For the sake of convenience and brevity, it will not be repeated here.

[0082] The aforementioned device for setting the parameters of the appearance defect detection algorithm can be implemented as a computer program, which can, for example... Figure 8It runs on the electronic device shown.

[0083] Please see Figure 8 , Figure 8 This is a schematic block diagram of an electronic device provided in an embodiment of the present invention.

[0084] See Figure 8 The device 500 includes a processor 502, a memory, and a network interface 505 connected via a system bus 501, wherein the memory may include a storage medium 503 and internal memory 504.

[0085] The storage medium 503 may store the operating system 5031 and the computer program 5032. When the computer program 5032 is executed, it enables the processor 502 to execute the method for setting the parameters of the appearance defect detection algorithm.

[0086] The processor 502 provides computing and control capabilities to support the operation of the entire device 500.

[0087] The internal memory 504 provides an environment for the operation of the computer program 5032 in the non-volatile storage medium 503. When the computer program 5032 is executed by the processor 502, the processor 502 can execute the method for setting the parameters of the appearance defect detection algorithm.

[0088] This network interface 505 is used for network communication, such as providing data transmission. Those skilled in the art will understand that... Figure 8 The structure shown is merely a block diagram of a portion of the structure related to the present invention and does not constitute a limitation on the device 500 to which the present invention is applied. The specific device 500 may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0089] The processor 502 is used to run a computer program 5032 stored in the memory to perform the following functions: setting parameters for the appearance defect type of the laser chip to be detected; setting parameters for the segmentation method and detection method of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; setting parameters for the detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters for the detection surface; setting parameters for locating the detection surface of the laser chip according to the parameters of the detection surface and the segmentation method.

[0090] In one embodiment, when the processor 502 implements the parameter for setting the appearance defect type of the laser chip to be detected, it specifically implements the following steps: if the appearance defect type of the laser chip does not exist in the terminal, the defect name and defect identifier of the appearance defect type of the laser chip are added; if the appearance defect type that does not match the laser chip exists in the terminal, the defect name and defect identifier of the appearance defect type that does not match the laser chip are deleted.

[0091] In one embodiment, when the processor 502 implements the parameters for setting the segmentation method of the appearance image of the laser chip, it specifically implements the following steps: if the segmentation method is threshold segmentation, the processor 502 sets the color space, the first segmentation threshold, and the color of the abnormal area of ​​the threshold segmentation according to the detection surface; and sets the first defect standard of the threshold segmentation according to the appearance defect type.

[0092] In one embodiment, when the processor 502 implements the parameters for setting the segmentation method of the appearance image of the laser chip, it specifically implements the following steps: if the segmentation method is color segmentation, it sets the second segmentation threshold of the color segmentation and the color of the abnormal area according to the detection surface; and it sets the second defect standard of the color segmentation according to the appearance defect type.

[0093] In one embodiment, when the processor 502 sets the parameters for the detection method of the appearance image of the laser chip, it specifically implements the following steps: setting a third defect standard for the detection method of the appearance image of the laser chip according to the appearance defect detection type; if the detection method is white line detection, setting a first algorithm threshold for the white line detection; if the detection method is color difference detection, setting the region expansion parameter and the second algorithm threshold for the white line detection.

[0094] In one embodiment, when the processor 502 sets the parameters for locating the detection surface of the laser chip based on the parameters of the detection surface and the parameters of the segmentation method, it specifically implements the following steps: If contour positioning is used to locate the detection surface of the laser chip, the etched groove range and critical area range in the contour of the appearance image of the laser chip are set according to the detection surface; wherein, the detection surface includes the AR surface and HR surface of the laser chip; the color space and offset compensation value of the upper and lower edges of the contour of the appearance image of the laser chip are set; if surface positioning is used to locate the detection surface of the laser chip, the third segmentation threshold and the color of the abnormal area of ​​the appearance image of the laser chip are set according to the detection surface; wherein, the detection surface includes the front and bottom surfaces of the laser chip; the brightness compensation value for locating the detection surface of the laser chip is set.

[0095] In one embodiment, after the processor 502 sets the parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation method, it specifically implements the following steps: performing appearance defect detection on the laser chip according to the appearance defect detection algorithm after parameter setting.

[0096] Those skilled in the art will understand that Figure 8 The embodiments of device 500 shown do not constitute a limitation on the specific configuration of device 500. In other embodiments, device 500 may include more or fewer components than shown, or combine certain components, or have different component arrangements. For example, in some embodiments, device 500 may include only a memory and processor 502. In such embodiments, the structure and function of the memory and processor 502 are similar to those shown. Figure 8 The embodiments shown are consistent and will not be repeated here.

[0097] It should be understood that, in this embodiment of the invention, the processor 502 may be a Central Processing Unit (CPU), or it may be other general-purpose processors 502, digital signal processors 502 (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor 502 may be a microprocessor 502, or it may be any conventional processor 502, etc.

[0098] In another embodiment of the present invention, a computer storage medium is also provided. This storage medium can be a non-volatile computer-readable storage medium or a volatile storage medium. The storage medium stores a computer program 5032, which, when executed by a processor 502, performs the following steps: setting parameters for the appearance defect type of the laser chip to be detected; setting parameters for the segmentation method and detection method of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; setting parameters for the detection surface of the laser chip according to the chip type of the laser chip, and importing standard parameters for the detection surface; setting parameters for locating the detection surface of the laser chip according to the parameters of the detection surface and the segmentation method.

[0099] In one embodiment, when the processor executes the program instructions to implement the parameter setting of the appearance defect type of the laser chip to be detected, it specifically implements the following steps: if the appearance defect type of the laser chip does not exist in the terminal, the defect name and defect identifier of the appearance defect type of the laser chip are added; if the appearance defect type that does not match the laser chip exists in the terminal, the defect name and defect identifier of the appearance defect type that does not match the laser chip are deleted.

[0100] In one embodiment, when the processor executes the program instructions to set the parameters of the segmentation method for the appearance image of the laser chip, it specifically implements the following steps: if the segmentation method is threshold segmentation, the color space, the first segmentation threshold, and the color of the abnormal area of ​​the threshold segmentation are set according to the detection surface; the first defect standard of the threshold segmentation is set according to the appearance defect type.

[0101] In one embodiment, when the processor executes the program instructions to set the parameters of the segmentation method for the appearance image of the laser chip, it specifically implements the following steps: if the segmentation method is color segmentation, the second segmentation threshold and the color of the abnormal area are set according to the detection surface; the second defect standard of the color segmentation is set according to the appearance defect type.

[0102] In one embodiment, when the processor executes the program instructions to set the parameters of the detection method for the appearance image of the laser chip, it specifically implements the following steps: setting a third defect standard for the detection method of the appearance image of the laser chip according to the appearance defect detection type; if the detection method is white line detection, setting a first algorithm threshold for the white line detection; if the detection method is color difference detection, setting the region expansion parameter and the second algorithm threshold for the white line detection.

[0103] In one embodiment, when the processor executes the program instructions to set the parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation method, it specifically implements the following steps: If contour positioning is used to locate the detection surface of the laser chip, the etched groove range and critical area range in the contour of the appearance image of the laser chip are set according to the detection surface; wherein, the detection surface includes the AR surface and HR surface of the laser chip; the color space and offset compensation value of the upper and lower edges of the contour of the appearance image of the laser chip are set; if surface positioning is used to locate the detection surface of the laser chip, the third segmentation threshold and the color of the abnormal area of ​​the appearance image of the laser chip are set according to the detection surface; wherein, the detection surface includes the front and bottom surfaces of the laser chip; the brightness compensation value of the detection surface for locating the laser chip is set.

[0104] In one embodiment, after the processor executes the program instructions to set the parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation method, it specifically implements the following steps: performing appearance defect detection on the laser chip according to the appearance defect detection algorithm after parameter setting.

[0105] Those skilled in the art will readily understand that, for the sake of convenience and brevity, the specific working processes of the devices, apparatuses, and units described above can be referred to the corresponding processes in the foregoing method embodiments, and will not be repeated here. Those skilled in the art will recognize that the units and algorithm steps of the various examples described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of both. To clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described in terms of function in the foregoing description. Whether these functions are implemented in hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this invention.

[0106] In the embodiments provided by this invention, it should be understood that the disclosed devices, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. Units with the same function may be grouped into one unit. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. In addition, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection through some interfaces, devices, or units, or it may be an electrical, mechanical, or other form of connection.

[0107] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of the embodiments of the present invention, depending on actual needs.

[0108] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0109] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a device 500 (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), magnetic disks, or optical disks.

[0110] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in the present invention, and these modifications or substitutions should all be covered within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method for setting parameters of an appearance defect detection algorithm, characterized in that, include: Set the parameters for the type of appearance defect of the laser chip to be inspected; The parameters of the segmentation method and the detection method of the laser chip's appearance image are set according to the type of appearance defect and the detection surface of the laser chip; the detection surface includes the AR surface and HR surface of the laser chip, as well as the front and bottom surfaces of the laser chip; The segmentation method includes threshold segmentation, which is used to segment and detect defects in the appearance images corresponding to the AR and HR surfaces of the laser chip. The segmentation method also includes color segmentation, which is used to segment and detect the appearance images corresponding to the front and bottom surfaces of the laser chip. The parameters of the detection surface of the laser chip are set according to the chip type of the laser chip, and the standard parameters of the detection surface are imported. The parameters of the detection surface of the laser chip are set according to the parameters of the detection surface and the parameters of the segmentation method; different detection surface appearance images correspond to different positioning methods. The HR surface and AR surface of the laser chip are positioned by contour positioning, and the front and bottom surfaces of the laser chip are positioned by surface positioning. If the detection surface of the laser chip is located using contour positioning, the etch groove range and critical area range in the contour of the laser chip's appearance image are set according to the detection surface; Set the color space and offset compensation value of the upper and lower edges of the outline of the laser chip's appearance image; If the detection surface of the laser chip is located using surface positioning, the third segmentation threshold of the appearance image of the laser chip and the color of the abnormal area are set according to the detection surface; Set the brightness compensation value for the detection surface of the laser chip.

2. The method for setting parameters of the appearance defect detection algorithm according to claim 1, characterized in that, The parameters for setting the appearance defect type of the laser chip to be detected include: If the laser chip does not have the appearance defect type in the terminal, add the defect name and defect identifier of the laser chip appearance defect type; If there is an appearance defect type in the terminal that does not match the laser chip, delete the defect name and defect identifier of the appearance defect type that does not match the laser chip.

3. The method for setting parameters of the appearance defect detection algorithm according to claim 1, characterized in that, The parameters for setting the segmentation method of the appearance image of the laser chip specifically include: If the segmentation method is threshold segmentation, the color space of the threshold segmentation, the first segmentation threshold, and the color of the abnormal region are set according to the detection surface; The first defect criterion for threshold segmentation is set according to the type of appearance defect.

4. The method for setting parameters of the appearance defect detection algorithm according to claim 1, characterized in that, The parameters for setting the segmentation method of the appearance image of the laser chip specifically include: If the segmentation method is color segmentation, the second segmentation threshold and the color of the abnormal area are set according to the detection surface; The second defect criterion for color segmentation is set according to the type of appearance defect.

5. The method for setting parameters of the appearance defect detection algorithm according to claim 1, characterized in that, The parameters for setting the detection method of the appearance image of the laser chip specifically include: The third defect standard is set according to the appearance defect detection type of the laser chip to determine the appearance image detection method; If the detection method is white line detection, set the first algorithm threshold for white line detection; If the detection method is heterochromatic detection, set the region expansion parameter for white line detection and the second algorithm threshold.

6. The method for setting parameters of the appearance defect detection algorithm according to claim 1, characterized in that, After setting the parameters for positioning the detection surface of the laser chip based on the parameters of the detection surface and the parameters of the segmentation method, the method further includes: The laser chip is subjected to appearance defect detection based on the appearance defect detection algorithm after parameter settings.

7. A device for setting parameters of an appearance defect detection algorithm, characterized in that, include: The first setting unit is used to set parameters for the type of appearance defect of the laser chip to be detected; The second setting unit is used to set the segmentation method and detection method parameters of the appearance image of the laser chip according to the appearance defect type and the detection surface of the laser chip; the detection surface includes the AR surface and HR surface of the laser chip, as well as the front and bottom surfaces of the laser chip; wherein, the segmentation method includes threshold segmentation, used to segment and detect defects in the appearance image corresponding to the AR surface and HR surface of the laser chip, and the segmentation method also includes color segmentation, used to segment and detect the appearance image corresponding to the front and bottom surfaces of the laser chip; The third setting unit is used to set the parameters of the detection surface of the laser chip according to the chip type of the laser chip, and import the standard parameters of the detection surface; The fourth setting unit is used to set the parameters of the detection surface of the laser chip according to the parameters of the detection surface and the parameters of the segmentation method; different appearance images of the detection surface correspond to different positioning methods; the HR surface and AR surface of the laser chip are positioned by contour positioning, and the front and bottom surfaces of the laser chip are positioned by surface positioning. The fourth setting unit is further configured to, when using contour positioning of the detection surface of the laser chip, set the etch groove range and key area range in the contour of the appearance image of the laser chip according to the detection surface; set the color space and offset compensation value of the upper and lower edges of the contour of the appearance image of the laser chip; when using surface positioning of the detection surface of the laser chip, set the third segmentation threshold and the color of the abnormal area of ​​the appearance image of the laser chip according to the detection surface; and set the brightness compensation value of the detection surface for positioning the laser chip.

8. An electronic device, characterized in that, It includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the method for setting the parameters of the appearance defect detection algorithm as described in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the method for setting parameters of the appearance defect detection algorithm as described in any one of claims 1 to 6.

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