Chip function verification system and method

Abstract

The application relates to the technical field of chip function verification, and discloses a chip function verification system and method, which comprises a measured chip, an adjustable circuit module, a function monitoring circuit module used for monitoring the function running state of the measured chip, and a power supply system module used for supplying power for the measured chip and the adjustable circuit module; the power supply system module is connected with the adjustable circuit module and the measured chip respectively; the measured chip is connected with the adjustable circuit module; and the function monitoring circuit module is connected with the adjustable circuit module to obtain the function running state of the measured chip under the adjustable circuit module. The chip function verification system provided by the application can provide multiple loads for single chip function verification, and can guarantee the sufficiency of chip function verification.

Description

TECHNICAL FIELD

[0001] The present application relates to the chip function verification technical field, and particularly relates to a chip function verification system and method. BACKGROUND

[0002] After the normal production of the chip, in order to fill the gap of insufficient simulation and design verification in the early stage of chip design, the functions of the software and hardware of the chip need to be verified by loading actual function loads. The traditional verification method of the development board is to verify a single chip function with only one load. For example, a chip with CAN communication function is verified, and the traditional method only designs a CAN bus load transceiver for function verification.

[0003] At present, the chip meeting the requirements of the automotive industry needs higher reliability. At present, the function verification method for the automotive chip is mainly single load, that is, a single function of a chip is verified with only one specific load, which is easy to cause the problem of insufficient chip function verification. At the same time, different use cases of users will also cause compatibility problems of the chip. SUMMARY

[0004] In order to solve the problem of insufficient chip function verification in the prior art, the present application provides a chip function verification system and method.

[0005] The technical content of the present application is as follows:

[0006] A chip function verification system comprises:

[0007] a measured chip, an adjustable circuit module, a function monitoring circuit module for monitoring the function running state of the measured chip, and a power supply system module for supplying power to the measured chip and the adjustable circuit module, the power supply system module is connected with the adjustable circuit module and the measured chip respectively, the measured chip is connected with the adjustable circuit module, and the function monitoring circuit module is connected with the adjustable circuit module to obtain the function running state of the measured chip under the adjustable circuit module.

[0008] Further, the adjustable circuit module comprises a plurality of selectable load / function circuit units.

[0009] Further, a channel selection switch is further included, which is arranged on the connection path between the adjustable circuit module and the measured chip to switch the connection between different selectable load / function circuit units and the measured chip.

[0010] Further, a switch control circuit module is further included, which is connected with the channel selection switch to control the start of the channel selection switch.

[0011] Further, the measured chip comprises at least one function set unit, and the function set unit is connected with the adjustable circuit module through a channel selection switch.

[0012] Further, the measured chip is provided with a software control unit, and the software control unit is used to integrate different functions of the measured chip on the function set unit.

[0013] Further, the adjustable circuit module comprises at least one, and the selectable load / function circuit unit on the adjustable circuit module is connected with the function set unit through the channel selection switch.

[0014] Further, the function set unit comprises but is not limited to the integration of the driving circuit function, the interface circuit function, the signal circuit function, the acquisition circuit function, the decoding and encoding circuit function or the communication circuit function of the measured chip.

[0015] Further, the selectable load / function circuit unit comprises but is not limited to the resistance load, the capacitance load, the inductance load, the driving circuit load, the display load or the audio load.

[0016] The application further provides a chip function verification method, comprising the chip function verification system in any one of the above, and comprising the following steps:

[0017] The function verification program of the measured chip is started on the chip function verification system;

[0018] The function set unit of the measured chip is run;

[0019] The switch control circuit module controls the channel selection switch to be started to connect different selectable load / function circuit units in a polling mode to verify the function of the function set unit of the measured chip;

[0020] The function monitoring circuit module acquires the function running state of the measured chip under the selectable load / function circuit unit through the adjustable circuit module;

[0021] If the function monitoring circuit module monitors that the function running state of the measured chip under the selectable load / function circuit unit is normal, the next selectable load / function circuit unit is loaded to verify the function of the measured chip, if the function monitoring circuit module monitors that the function running state of the measured chip under the selectable load / function circuit unit is abnormal, an alarm is given and a fault is recorded, and then the next selectable load / function circuit unit is loaded to verify the function of the measured chip, until the polling is finished.

[0022] The application has at least the following beneficial effects:

[0023] (1) The chip function verification system provided by the application provides multiple loads for single chip function verification, ensuring the sufficiency of chip function verification;

[0024] (2) The multiple loads have adjustability, and different loads can be selected for chip function verification.

[0025] (3) The multiple loads have different electrical performance parameters, and can be used for chip compatibility verification. BRIEF DESCRIPTION OF DRAWINGS

[0026] Figure 1 The structure flowchart of the chip function verification system provided by the application is shown.

[0027] Figure 2 The implementation flowchart of the chip function verification method provided by the application is shown. DETAILED DESCRIPTION

[0028] To make the purpose, technical solutions and advantages of the embodiments of the application clearer, the technical solutions in the embodiments of the application will be described clearly and completely below with reference to the drawings in the embodiments of the application. Obviously, the described embodiments are some embodiments of the application, rather than all the embodiments of the application. Based on the embodiments in the application, all other embodiments obtained by those skilled in the art without creative labor fall within the protection scope of the application.

[0029] In combination with Figures 1-2 the drawings, the application provides a chip function verification system, which comprises:

[0030] a measured chip, an adjustable circuit module, a function monitoring circuit module for monitoring the function running state of the measured chip, and a power system module for supplying power to the measured chip and the adjustable circuit module, wherein the power system module is connected with the adjustable circuit module and the measured chip respectively, the measured chip is connected with the adjustable circuit module, and the function monitoring circuit module is connected with the adjustable circuit module to obtain the function running state of the measured chip under the adjustable circuit module.

[0031] The power system module is a power system composed of electronic components or chip groups meeting the automotive electronics (AECQ100) requirements, and provides power for the measured chip and the adjustable circuit module. The power provided by the power system module includes but is not limited to the following specifications: 48V power supply, 24V power supply, 12V power supply, 9V power supply, 5V power supply, 3.3V power supply, 3V power supply, 2.5V power supply, 1.8V power supply, 1.2 power supply, 1.1V power supply, 0.9V power supply, 0.8V power supply, etc.

[0032] The function monitoring circuit module is used for monitoring the application function of the measured chip, so as to determine whether the function of the measured chip is normal under different loads.

[0033] Further, the adjustable circuit module includes a plurality of groups of selectable load / function circuit units.

[0034] Further, the channel selection switch is arranged on a connection path between the adjustable circuit module and the measured chip, so as to switch the connection between different selectable load / function circuit units and the measured chip.

[0035] Further, the switch control circuit module is connected with the channel selection switch, so as to control the starting of the channel selection switch.

[0036] Further, the measured chip includes at least one function set unit, and the function set unit is connected with the adjustable circuit module through the channel selection switch.

[0037] The channel selection switch is responsible for switching different functional loads, including but not limited to a circuit composed of related relay devices, MOS switch devices, multi-selection switches and the like.

[0038] Further, the measured chip is provided with a software control unit, and the software control unit is used for integrating different functions of the measured chip on the function set unit.

[0039] The measured chip provides a function set of various circuits. Figure 1 As shown in the figure, the measured chip is provided with three function set units, namely a function set A unit, a function set B unit and a function set C unit. The measured chip includes a chip with software function and a chip without software function. Whether the measured chip contains software function is realized by arranging a software control unit on the measured chip. The software control unit contains control codes, which are special software codes specially prepared for the chip itself to complete the function set.

[0040] Further, the adjustable circuit module includes at least one, and the selectable load / function circuit unit on the adjustable circuit module is connected with the function set unit through the channel selection switch.

[0041] Further, the function set unit includes but is not limited to the integration of the driving circuit function, the interface circuit function, the signal circuit function, the acquisition circuit function, the decoding and encoding circuit function or the communication circuit function of the measured chip.

[0042] Further, the optional load / function circuit unit includes, but is not limited to, a resistance load, a capacitance load, an inductance load, a driving circuit load, a display load or an audio load.

[0043] The adjustable circuit module is arranged according to a corresponding function set unit, each function set unit corresponds to an adjustable circuit module, and each adjustable circuit module includes a plurality of optional load / function circuit units.

[0044] The optional load / function circuit A1 unit is a set of load circuits or function circuits provided for matching the functions of a measured chip, has the same function as the optional load / function circuit A2 unit to the An unit, but has different electrical properties, technical parameters and other indexes.

[0045] The optional load / function circuit B1 unit is a set of load circuits or function circuits provided for matching the functions of a measured chip, has the same function as the optional load / function circuit B2 unit to the Bn unit, and has the same meaning as the optional load / function circuit A1 unit.

[0046] The optional load / function circuit C1 unit is a set of load circuits or function circuits provided for matching the functions of a measured chip, has the same function as the optional load / function circuit C2 unit to the Cn unit, and has the same meaning as the optional load / function circuit A1 unit.

[0047] The load referred to in the application is a set of additional chips or circuits that can be driven by the chip to jointly complete the same function, such as can communication, in which the measured chip provides a signal for driving, and the transceiver performs protocol analysis and signal amplification on the communication signal, and the transceiver at this time is the load.

[0048] The application further provides a chip function verification method, comprising the chip function verification system of any one of the above, and comprising the following steps:

[0049] The function verification program of the measured chip is started by power-on of the chip function verification system;

[0050] The function set unit of the measured chip is run;

[0051] The switch control circuit module controls the channel selection switch to start and connect different selectable load / function circuit units in a polling mode to perform function verification on the function set unit of the measured chip;

[0052] The function monitoring circuit module acquires the function running state of the measured chip under the selectable load / function circuit unit through the adjustable circuit module;

[0053] If the function monitoring circuit module monitors that the function running state of the measured chip under the selectable load / function circuit unit is normal, the next selectable load / function circuit unit is loaded to perform function verification on the measured chip; if the function monitoring circuit module monitors that the function running state of the measured chip under the selectable load / function circuit unit is abnormal, an alarm is given and the fault is recorded, and then the next selectable load / function circuit unit is loaded to perform function verification on the measured chip, until the polling is completed.

[0054] The application realizes that a single chip function verification can be verified by using multiple loads, and ensures the sufficiency of chip function verification.

[0055] The above is only an embodiment of the application, and does not limit the patent scope of the application, and any equivalent structure or equivalent flow transformation using the content of the specification and drawings, or direct or indirect application in other related technical fields, are also included in the patent protection scope of the application.

Claims

1. A chip function verification system, characterized by: include: A chip under test, an adjustable circuit module, a function monitoring circuit module for monitoring the functional operation status of the chip under test, and a power supply system module for supplying power to the chip under test and the adjustable circuit module, wherein the power supply system module is respectively connected to the adjustable circuit module and the chip under test, the chip under test is connected to the adjustable circuit module, and the function monitoring circuit module is connected to the adjustable circuit module to obtain the functional operation status of the chip under test when the adjustable circuit module is installed; Also included is a channel selection switch, which is provided on a connection path between the adjustable circuit module and the chip under test to switch connections between different selectable load / functional circuit units and the chip under test; Also included is a switch control circuit module, the switch control circuit module is connected to the channel selection switch to control the activation of the channel selection switch; The chip under test includes at least one function collection unit, and the function collection unit is connected to the adjustable circuit module through a channel selection switch; The chip under test is provided with a software control unit, and the software control unit is used to integrate different functions of the chip under test into the function collection unit; The adjustable circuit module comprises at least one, and the selectable load / function circuit unit on the adjustable circuit module is connected to the function collection unit via a channel selection switch; The optional load / functional circuit unit includes but is not limited to a resistive load, a capacitive load, an inductive load, a driving circuit load, a display load or an audio load.

2. A chip function verification system according to claim 1, characterized in that: The adjustable circuit module includes a plurality of groups of selectable load / function circuit units.

3. The chip function verification system according to claim 1, characterized in that: The functional aggregation unit includes but is not limited to the integration of the driving circuit function, interface circuit function, signal circuit function, acquisition circuit function, decoding and encoding circuit function or communication circuit function of the chip under test.

4. A chip function verification method, comprising the chip function verification system according to any one of claims 1 to 3, characterized in that: The following steps are involved: Power on the chip function verification system to start the function verification program of the chip under test; The functional set unit of the chip under test is operated; The switch control circuit module controls the channel selection switch to start connecting different selectable loads / functional circuit units in a polling manner to perform functional verification on the functional set units of the chip under test; The function monitoring circuit module obtains the functional operation status of the chip under test equipped with the selectable load / functional circuit unit through the adjustable circuit module; If the function monitoring circuit module detects that the functional operation status of the chip under test equipped with the optional load / functional circuit unit is normal, the next optional load / functional circuit unit is installed to perform functional verification on the chip under test. If the function monitoring circuit module detects that the functional operation status of the chip under test equipped with the optional load / functional circuit unit is abnormal, an alarm is issued and the fault is recorded, and the next optional load / functional circuit unit is continued to be installed to perform functional verification on the chip under test until the polling is completed.

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