A gate structure for ATE spring probe pre-assembly

Abstract

The application relates to the technical field of precision instruments and semiconductor manufacturing equipment, in particular to a gate structure for ATE spring probe pre-assembly; the gate structure for ATE spring probe pre-assembly comprises, from top to bottom, an upper turntable, an upper gate fixed disc, a middle turntable, a lower gate fixed disc, a lower fixed disc and a total gate turntable; the upper turntable and the middle turntable are sequentially provided with a needle tube blanking hole, a needle tail blanking hole, a spring blanking hole and a needle head blanking hole; the needle tube blanking hole, the needle tail blanking hole, the spring blanking hole and the needle head blanking hole are located on the same circumference; the application can realize automatic alignment of the needle head, the spring and the needle tail and loading into the needle tube to complete pre-assembly, greatly shortens the alignment time and improves the pre-assembly efficiency; and through the structural design of the upper turntable, the upper gate fixed disc, the middle turntable, the lower gate fixed disc, the lower fixed disc and the total gate turntable, the logical realization of opening and closing of the upper gate, the lower gate and the total gate is completed; and a parameter design method is provided.

Description

Technical Field

[0001] This invention relates to the field of precision instruments and semiconductor manufacturing equipment technology, and specifically to a gate structure for ATE spring probe pre-assembly. Background Technology

[0002] Before packaging, bare dies must be tested. The testing method involves placing the bare die in a test socket, with the ATE spring probes at the bottom of the test socket contacting the pads or bumps of the bare die. The ATE spring probes are used to establish an electrical connection between the Automatic Test Equipment (ATE) and the bare die. By programming the bare die and reading the program, the quality of the bare die can be determined.

[0003] To ensure effective electrical connection between the ATE and the bare core, the ATE spring probe is often designed with an elastic structure. The most common structure is as follows: Figure 1 As shown, the device includes a needle tube 1-1, a needle tail 1-2, a spring 1-3, and a needle tip 1-4. The needle tail 1-2 is inserted into the needle tube 1-1 and extends from the bottom of the needle tube 1-1. The spring 1-3 is also inserted into the needle tube 1-1 and is located above the needle tail 1-2. Similarly, the needle tip 1-4 is inserted into the needle tube 1-1 and is located above the spring 1-3. Inserting the needle tail 1-2, spring 1-3, and needle tip 1-4 into the needle tube 1-1 completes the pre-assembly of the ATE spring probe. The bottom of the needle tip 1-4 is designed with a groove. After the pre-assembly is completed, the needle tube 1-1 is hammered into the groove on a special device to fix the needle tip 1-4 relative to the needle tube 1-1 and to allow the needle tail 1-2 to move relative to the needle tube 1-1.

[0004] ATE spring probe assembly is a very narrow segment of the semiconductor industry chain, with only a handful of companies involved, resulting in relatively slow development of supporting equipment. Currently, ATE spring probe pre-assembly is still done manually, with assembly workers using tweezers to align the needle tail 1-2, spring 1-3, and needle tip 1-4 with the needle tube 1-1 and insert them. Because the ATE spring probe is extremely small, with a total length of only about 3.3mm and a diameter of only 0.3mm for the needle tube 1-1, this size exceeds the range of normal physiological hand tremors, posing significant difficulties for alignment and insertion, and severely reducing assembly efficiency.

[0005] A single test socket may contain anywhere from dozens to hundreds or even thousands of ATE spring probes. If the assembly efficiency of each ATE spring probe is low, it will inevitably reduce the overall manufacturing efficiency of the test socket and increase labor costs. To solve this problem, it is necessary to develop an ATE spring probe pre-assembly device; however, no similar products have yet appeared on the market. Summary of the Invention

[0006] In view of the above technical needs, the present application designs an ATE spring probe semi-automatic pre-assembly device, through the logical design of the opening and closing of the upper gate, the lower gate and the total gate, the needle, the spring and the needle tail can be automatically aligned and assembled into the needle tube, the pre-assembly is completed, the labor cost is saved, the alignment time is greatly shortened, and the pre-assembly efficiency is improved; and through the structural design of the upper turntable, the upper gate fixed disc, the middle turntable, the lower gate fixed disc, the lower fixed disc and the total gate turntable, the logical realization of the opening and closing of the upper gate, the lower gate and the total gate is completed; and a parameter design method is also provided, which provides a theoretical basis for the optimization of the structure parameters of the gate under different technical parameters.

[0007] The purpose of the present application is achieved as follows:

[0008] A gate structure for ATE spring probe pre-assembly comprises, from top to bottom, an upper turntable, an upper gate fixed disc, a middle turntable, a lower gate fixed disc, a lower fixed disc and a total gate turntable; the upper turntable, the upper gate fixed disc, the middle turntable and the lower gate fixed disc form a blanking turntable, and the lower fixed disc and the total gate turntable form an assembly mechanism.

[0009] The upper turntable and the middle turntable are sequentially provided with a needle tube blanking hole, a needle tail blanking hole, a spring blanking hole and a needle head blanking hole in the reverse direction of rotation; the needle tube blanking hole, the needle tail blanking hole, the spring blanking hole and the needle head blanking hole are located on the same circumference and have the same spacing;

[0010] The needle tube blanking holes on the upper turntable and the middle turntable are coaxially arranged,

[0011] The needle tail blanking holes on the upper turntable and the middle turntable are coaxially arranged,

[0012] The spring blanking holes on the upper turntable and the middle turntable are coaxially arranged,

[0013] The needle head blanking holes on the upper turntable and the middle turntable are coaxially arranged,

[0014] The upper turntable, the middle turntable and the total gate turntable are synchronously and intermittently rotated;

[0015] The upper turntable is provided with a V counterbore, the lower gate fixed disc is provided with a through hole, and the total gate turntable is provided with a through hole.

[0016] The gate structure for ATE spring probe pre-assembly described above, the distance from the upper gate fixed disc to the top of the V counterbore is less than the height of the material, and the material is a needle tube, a needle tail, a spring or a needle head.

[0017] The gate structure for pre-assembly of ATE spring probes comprises an upper disc, a middle disc and a total gate disc, and the disc surfaces of the upper disc, the middle disc and the total gate disc are divided into a plurality of identical sector periods, each of which is provided with needle tube blanking holes, needle tail blanking holes, spring blanking holes, needle head blanking holes, a first default station, a second default station and a third default station at equal intervals; the through hole on the total gate disc is located at the first default station; the upper gate fixed disc, the lower gate fixed disc and the lower fixed disc are all provided with blanking holes, and the through hole on the upper gate fixed disc and the through hole on the lower gate fixed disc are separated by one station in the rotating direction, and the through hole on the lower gate fixed disc and the through hole on the lower fixed disc are coaxially arranged.

[0018] Further, the diameters of the upper disc, the middle disc and the total gate disc are d1, and the diameters of the upper gate fixed disc, the lower gate fixed disc and the lower fixed disc are d2, and d1 is greater than d2, and each station of the upper disc, the middle disc and the total gate disc is provided with a notch at the circumferential periphery, and the depth of the notch is less than d1 / 2-d2 / 2, and the assembly mechanism further comprises an auxiliary disc, and the auxiliary disc is provided with an extending end, and when the extending end enters the notch, the upper disc, the middle disc and the total gate disc rotate, and when the extending end leaves the notch, the upper disc, the middle disc and the total gate disc are stationary, and the extending end alternately enters and leaves the notch, so that the upper disc, the middle disc and the total gate disc are synchronously and intermittently rotated.

[0019] Further, according to the number n of the sector periods contained in the upper disc, the central angles between adjacent two of the needle tube blanking holes, the needle tail blanking holes, the spring blanking holes, the needle head blanking holes, the first default station, the second default station and the third default station are 2π / n / 7, and according to the time T required for assembling one ATE spring probe, the rotating period of the auxiliary wheel is T / 7, and according to the time t that the upper disc, the middle disc and the total gate disc stay at each station, the central angle corresponding to the contact range of the auxiliary wheel with the upper disc, the middle disc or the total gate disc is 14πt / T.

[0020] The beneficial effects of the present application are as follows:

[0021] Firstly, aiming at the problem of difficult alignment and loading and low efficiency caused by physiological tremor of hands in the manual pre-assembly process of ATE spring probes, the present application designs a semi-automatic pre-assembly device for ATE spring probes, which can realize automatic alignment and loading of the needle head, the spring and the needle tail into the needle tube through the logical design of opening and closing of the upper gate, the lower gate and the total gate, complete the pre-assembly, save the labor cost, and realize strict alignment of the needle head, the spring and the needle tail with the needle tube through the mechanical structure limitation, solve the problem of low alignment and assembly efficiency caused by physiological tremor of hands exceeding assembly precision in the current manual assembly process, thus greatly shorten the alignment time and improve the pre-assembly efficiency.

[0022] Secondly, the application also provides a gate structure for ATE spring probe pre-assembly, through the structural design of the upper turntable, the upper gate fixed disc, the middle turntable, the lower gate fixed disc, the lower fixed disc and the total gate turntable, the logic implementation of the opening and closing of the upper gate, the lower gate and the total gate is completed.

[0023] Thirdly, the application not only provides a gate structure for ATE spring probe pre-assembly, but also provides a parameter design method, which provides a theoretical basis for the parameter optimization of the gate structure under different technical parameters. BRIEF DESCRIPTION OF DRAWINGS

[0024] Figure 1 is a structural schematic diagram of ATE spring probe.

[0025] Figure 2 is a top view of the blanking turntable.

[0026] Figure 3 is a schematic diagram of the relative positions of the blanking turntable and the assembly mechanism.

[0027] Figure 4 is a schematic diagram of the material in the V-shaped hole.

[0028] Figure 5 is a working timing diagram of the upper gate and the lower gate.

[0029] Figure 6 is a working timing diagram of the upper turntable, the upper gate fixed disc, the middle turntable and the lower gate fixed disc.

[0030] Figure 7 is an assembly process flow chart of ATE spring probe 1.

[0031] Figure 8 is a structural schematic diagram of realizing the synchronous intermittent rotation of the upper turntable, the middle turntable and the total gate turntable.

[0032] In the figure: 1 ATE spring probe, 1-1 needle tube, 1-2 needle tail, 1-3 spring, 1-4 needle head, 2 blanking turntable, 2-1 needle tube blanking hole, 2-2 needle tail blanking hole, 2-3 spring blanking hole, 2-4 needle head blanking hole, 3 assembly mechanism, 4 upper gate, 5 lower gate, 6 total gate, 7-1 upper turntable, 7-2 upper gate fixed disc, 7-3 middle turntable, 7-4 lower gate fixed disc, 7-5 lower fixed disc, 7-6 total gate turntable, 8 auxiliary disc, 9 extended end. DETAILED DESCRIPTION

[0033] The specific embodiment of the application will be described in further detail below with reference to the accompanying drawings.

[0034] Method one

[0035] The following is a specific embodiment of the ATE spring probe semi-automatic pre-assembly device of the application.

[0036] The ATE spring probe semi-automatic pre-assembly device in the embodiment is used for assembling an ATE spring probe 1, and the ATE spring probe 1 comprises a needle tube 1-1, a needle tail 1-2, a spring 1-3 and a needle head 1-4, as shown in the figure. Figure 1

[0037] The ATE spring probe semi-automatic pre-assembly device comprises a blanking turntable 2 and an assembly mechanism 3.

[0038] The blanking turntable 2 is divided into a plurality of sector periods, and a needle tube blanking hole 2-1, a needle tail blanking hole 2-2, a spring blanking hole 2-3 and a needle head blanking hole 2-4 are sequentially arranged in the circumferential direction in each sector period, and the needle tube blanking hole 2-1, the needle tail blanking hole 2-2, the spring blanking hole 2-3 and the needle head blanking hole 2-4 are provided with upper gates 4 and lower gates 5; in this embodiment, the blanking turntable 2 is divided into two sector periods as an example, and a top view is shown in the figure. Figure 2 Figure 2 It should be noted that the positions of the needle tube blanking hole 2-1, the needle tail blanking hole 2-2, the spring blanking hole 2-3 and the needle head blanking hole 2-4 in the figure are only schematic representations and do not represent the actual relative positions.

[0039] The assembly mechanism 3 is in a cylindrical structure, and the bottom of the cylindrical structure is provided with a total gate 6.

[0040] A schematic view of the relative positions of the blanking turntable 2 and the assembly mechanism 3 is shown in the figure. Figure 3

[0041] Mode two

[0042] The following is a specific embodiment of the ATE spring probe semi-automatic pre-assembly device.

[0043] The ATE spring probe semi-automatic pre-assembly device in the embodiment is further limited on the basis of mode one: the needle tube blanking hole 2-1, the needle tail blanking hole 2-2, the spring blanking hole 2-3 and the needle head blanking hole 2-4 are all V countersunk holes, the distance from the upper gate 4 to the top of the V countersunk hole is less than the height of the material, and the material is the needle tube 1-1, the needle tail 1-2, the spring 1-3 or the needle head 1-4, as shown in the figure. Figure 4

[0044] The design of the V countersunk hole makes it easy for the material to enter the needle tube blanking hole 2-1, the needle tail blanking hole 2-2, the spring blanking hole 2-3 or the needle head blanking hole 2-4; the distance from the upper gate 4 to the top of the V countersunk hole is less than the height of the material, so that the reversed material can be easily taken out and placed again.

[0045] Mode three

[0046] ​​​​The following is a specific embodiment of the ATE spring probe semi-automatic pre-assembly device of the present application.

[0047] The ATE spring probe semi-automatic pre-assembly device in this embodiment is further limited based on mode one, and the working steps of the upper gate 4 and the lower gate 5 are as follows:

[0048] Step a, the upper gate 4 is closed, the lower gate 5 is closed, and the material is located above the upper gate 4;

[0049] Step b, the upper gate 4 is opened, the lower gate 5 is closed, and the material enters above the lower gate 5 through the upper gate 4;

[0050] Step c, the upper gate 4 is closed, the lower gate 5 is closed, and the material is located between the upper gate 4 and the lower gate 5;

[0051] Step d, the upper gate 4 is closed, the lower gate 5 is opened, and the material enters the assembly mechanism 3 through the lower gate 5.

[0052] Taking the material as a needle tube 1-1 as an example, the four steps are as shown in Figure 5 .

[0053] Mode four

[0054] The following is a specific embodiment of the ATE spring probe semi-automatic pre-assembly device of the present application.

[0055] The ATE spring probe semi-automatic pre-assembly device in this embodiment is further limited based on mode three, and after step b is completed, the material is placed on the upper gate 4; specifically:

[0056] The needle tube 1-1 is placed in the needle tube unloading hole 2-1 of the unloading turntable 2;

[0057] The needle tail 1-2 is placed in the needle tail unloading hole 2-2 of the unloading turntable 2;

[0058] The spring 1-3 is placed in the spring unloading hole 2-3 of the unloading turntable 2;

[0059] The needle head 1-4 is placed in the needle head unloading hole 2-4 of the unloading turntable 2.

[0060] Mode five

[0061] The following is a specific embodiment of the ATE spring probe semi-automatic pre-assembly device of the present application.

[0062] The ATE spring probe semi-automatic pre-assembly device in the specific embodiment is further limited based on mode three, that is, the upper gate 4 and the lower gate 5 in the needle tube blanking hole 2-1, the needle tail blanking hole 2-2, the spring blanking hole 2-3 and the needle head blanking hole 2-4 sequentially experience timing a, timing b, timing c and timing d, the needle tube 1-1, the needle tail 1-2, the spring 1-3 and the needle head 1-4 sequentially enter the assembly mechanism 3, the needle head 1-4, the spring 1-3 and the needle tail 1-2 are automatically loaded into the needle tube 1-1 in sequence, pre-assembly is completed, and the lower gate 5 is opened after the pre-assembly is completed.

[0063] Mode six

[0064] The following is a specific embodiment of the gate structure for ATE spring probe pre-assembly.

[0065] The gate structure for ATE spring probe pre-assembly in the specific embodiment is used to realize the blanking turntable 2 and the assembly mechanism 3, which sequentially include the upper turntable 7-1, the upper gate fixed disc 7-2, the middle turntable 7-3, the lower gate fixed disc 7-4, the lower fixed disc 7-5 and the total gate turntable 7-6 from top to bottom; the through hole on the upper gate fixed disc 7-2 is the upper gate 4, the through hole on the lower gate fixed disc 7-4 is the lower gate 5, the upper turntable 7-1, the upper gate fixed disc 7-2, the middle turntable 7-3 and the lower gate fixed disc 7-4 constitute the blanking turntable 2, the lower fixed disc 7-5 and the total gate turntable 7-6 constitute the assembly mechanism 3, and the through hole on the total gate turntable 7-6 is the total gate 6; at this time, Figure 5 the working timing diagram of the upper gate and the lower gate shown becomes Figure 6 ;

[0066] The upper turntable 7-1 and the middle turntable 7-3 are sequentially provided with the needle tube blanking hole 2-1, the needle tail blanking hole 2-2, the spring blanking hole 2-3 and the needle head blanking hole 2-4 in the reverse direction of rotation;

[0067] The needle tube blanking hole 2-1 on the upper turntable 7-1 and the middle turntable 7-3 is coaxially arranged,

[0068] The needle tail blanking hole 2-2 on the upper turntable 7-1 and the middle turntable 7-3 is coaxially arranged,

[0069] The spring blanking hole 2-3 on the upper turntable 7-1 and the middle turntable 7-3 is coaxially arranged,

[0070] The needle head blanking hole 2-4 on the upper turntable 7-1 and the middle turntable 7-3 is coaxially arranged,

[0071] The upper turntable 7-1, the middle turntable 7-3 and the total gate turntable 7-6 are synchronously and intermittently rotated.

[0072] The upper rotating disc 7-1 is provided with a V-shaped recess, the lower gate fixing disc 7-4 is provided with a through hole, and the total gate rotating disc 7-6 is provided with a through hole.

[0073] Mode seven

[0074] The following is a specific embodiment of the gate structure for pre-assembly of the ATE spring probe of the present application.

[0075] The gate structure for pre-assembly of the ATE spring probe in this specific embodiment, on the basis of mode six, is further limited in that the distance from the upper gate fixing disc 7-2 to the top of the V-shaped recess is less than the height of the material, which is the needle tube 1-1, the needle tail 1-2, the spring 1-3 or the needle head 1-4.

[0076] Mode eight

[0077] The following is a specific embodiment of the gate structure for pre-assembly of the ATE spring probe of the present application.

[0078] The gate structure for pre-assembly of the ATE spring probe in this specific embodiment, on the basis of mode six, is further limited in that the disc surfaces of the upper rotating disc 7-1, the middle rotating disc 7-3 and the total gate rotating disc 7-6 are divided into multiple identical sector periods, and each sector period is equally spaced with a needle tube blanking hole 2-1, a needle tail blanking hole 2-2, a spring blanking hole 2-3, a needle head blanking hole 2-4, a first default station, a second default station and a third default station; the through hole on the total gate rotating disc 7-6 is located at the first default station; the upper gate fixing disc 7-2, the lower gate fixing disc 7-4 and the lower fixing disc 7-5 are all provided with blanking holes, and the through hole on the upper gate fixing disc 7-2 and the through hole on the lower gate fixing disc 7-4 are separated by one station in the rotating direction, and the through hole on the lower gate fixing disc 7-4 and the through hole on the lower fixing disc 7-5 are coaxially arranged.

[0079] In the above structure, the assembly process flow chart of the ATE spring probe 1 is as shown in Figure 7 In Figure 7 ,.

[0080] Mode nine

[0081] The following is a specific embodiment of the gate structure for pre-assembly of the ATE spring probe of the present application.

[0082] The gate structure for pre-assembly of ATE spring probes in the specific embodiment is further limited based on mode eight, that is, the diameters of the upper turntable 7-1, the middle turntable 7-3 and the total gate turntable 7-6 are all d1, the diameters of the upper gate fixed disc 7-2, the lower gate fixed disc 7-4 and the lower fixed disc 7-5 are all d2, d1 is greater than d2, and the circumferential periphery of each station of the upper turntable 7-1, the middle turntable 7-3 and the total gate turntable 7-6 is provided with a notch, the depth of the notch is less than d1 / 2-d2 / 2, the assembly mechanism 3 further comprises an auxiliary disc 8, the auxiliary disc 8 is provided with an extended end 9, when the extended end 9 enters the notch, the upper turntable 7-1, the middle turntable 7-3 and the total gate turntable 7-6 rotate, when the extended end 9 leaves the notch, the upper turntable 7-1, the middle turntable 7-3 and the total gate turntable 7-6 are stationary, the extended end 9 alternately enters and leaves the notch, so that the upper turntable 7-1, the middle turntable 7-3 and the total gate turntable 7-6 rotate intermittently and synchronously.

[0083] The structure diagram for realizing the intermittent and synchronous rotation of the upper turntable 7-1, the middle turntable 7-3 and the total gate turntable 7-6 is shown in Figure 8 , in which the positions of the needle tube blanking hole 2-1, the needle tail blanking hole 2-2, the spring blanking hole 2-3 and the needle head blanking hole 2-4 are also only schematically represented, and do not represent the real relative positions, and the real relative positions are shown in Figure 8 . Figure 7

[0084] Mode ten

[0085] The following is a specific embodiment of the gate structure for pre-assembly of ATE spring probes.

[0086] The gate structure for pre-assembly of ATE spring probes in the specific embodiment is further limited based on mode nine, that is, according to the number n of the sector cycles contained in the upper turntable 7-1, the central angles between two adjacent ones of the needle tube blanking hole 2-1, the needle tail blanking hole 2-2, the spring blanking hole 2-3, the needle head blanking hole 2-4, the first default station, the second default station and the third default station are 2π / n / 7, according to the time T required for assembling one ATE spring probe, the rotation period of the auxiliary wheel is T / 7, according to the time t for which the upper turntable 7-1, the middle turntable 7-3 and the total gate turntable 7-6 stay at each station, the central angle corresponding to the contact range of the auxiliary wheel with the upper turntable 7-1, the middle turntable 7-3 or the total gate turntable 7-6 is 14πt / T.

[0087] This mode provides a parameter design method for each key component, and provides a theoretical basis for parameter optimization of the gate structure under different technical parameters.

[0088] ​It should be noted that the above only illustrates the specific embodiments of the present application and is not intended to limit the present application. The present application can have various modifications and changes for those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

[0089] It should also be noted that the technical features listed in the above specific embodiments can be arranged and combined, and those skilled in the art can exhaust all the results of each arrangement and combination according to the arrangement and combination mathematical knowledge learned in high school. All the results of the arrangement and combination should be understood as disclosed by the present application.

Claims

1. A gate structure for pre-assembly of ATE spring probes, characterized in that, From top to bottom, it includes an upper turntable (7-1), an upper gate fixing plate (7-2), a middle turntable (7-3), a lower gate fixing plate (7-4), a lower fixing plate (7-5), and a main gate turntable (7-6); the upper turntable (7-1), the upper gate fixing plate (7-2), the middle turntable (7-3), and the lower gate fixing plate (7-4) form a feeding turntable (2), and the lower fixing plate (7-5) and the main gate turntable (7-6) form an assembly mechanism (3); The upper turntable (7-1) and the middle turntable (7-3) are provided with needle tube feeding holes (2-1), needle tail feeding holes (2-2), spring feeding holes (2-3) and needle head feeding holes (2-4) in the opposite direction of rotation; the needle tube feeding holes (2-1), needle tail feeding holes (2-2), spring feeding holes (2-3) and needle head feeding holes (2-4) are located on the same circumference and are spaced at the same distance; The needle tube feeding holes (2-1) on the upper turntable (7-1) and the middle turntable (7-3) are coaxially arranged. The needle tail feeding holes (2-2) on the upper turntable (7-1) and the middle turntable (7-3) are coaxially arranged. The spring feed holes (2-3) on the upper turntable (7-1) and the middle turntable (7-3) are coaxially arranged. The needle feeding holes (2-4) on the upper turntable (7-1) and the middle turntable (7-3) are coaxially arranged. The upper turntable (7-1), the middle turntable (7-3), and the main gate turntable (7-6) rotate synchronously and intermittently; The upper turntable (7-1) is provided with a V-shaped countersunk hole, the lower gate fixing plate (7-4) has a through hole, and the main gate turntable (7-6) has a through hole; The upper gate fixing plate (7-2), lower gate fixing plate (7-4) and lower fixing plate (7-5) are all provided with through holes. The through holes on the gate fixing plate (7-2) and the lower gate fixing plate (7-4) are separated by one station along the rotation direction. The through holes on the lower gate fixing plate (7-4) and the lower fixing plate (7-5) are coaxially arranged.

2. The gate structure for pre-assembly of ATE spring probes according to claim 1, characterized in that, The distance from the upper gate fixing plate (7-2) to the top of the V-shaped counterhole is less than the height of the material, and the material is a needle tube (1-1), a needle tail (1-2), a spring (1-3), or a needle tip (1-4).

3. The gate structure for pre-assembly of ATE spring probes according to claim 1, characterized in that, The surfaces of the upper turntable (7-1), the middle turntable (7-3), and the main gate turntable (7-6) are divided into multiple identical sector-shaped cycles. Each sector-shaped cycle is equally spaced with needle tube feeding holes (2-1), needle tail feeding holes (2-2), spring feeding holes (2-3), needle head feeding holes (2-4), a first default station, a second default station, and a third default station. The through hole on the main gate turntable (7-6) is located at the first default station.

4. The gate structure for pre-assembly of ATE spring probes according to claim 3, characterized in that, The diameters of the upper turntable (7-1), the middle turntable (7-3), and the main gate turntable (7-6) are all d1, and the diameters of the upper gate fixing plate (7-2), the lower gate fixing plate (7-4), and the lower fixing plate (7-5) are all d2, with d1 being greater than d2. Furthermore, each station of the upper turntable (7-1), the middle turntable (7-3), and the main gate turntable (7-6) has a notch on its outer circumference, the depth of which is less than d1 / 2 - d2 / 2. The assembly mechanism (3) also includes... An auxiliary disk (8) is provided with an extension end (9). When the extension end (9) enters the opening, the upper turntable (7-1), the middle turntable (7-3), and the main gate turntable (7-6) rotate. When the extension end (9) leaves the opening, the upper turntable (7-1), the middle turntable (7-3), and the main gate turntable (7-6) remain stationary. The extension end (9) alternately enters and leaves the opening, so that the upper turntable (7-1), the middle turntable (7-3), and the main gate turntable (7-6) rotate synchronously and intermittently.

5. A gate structure for pre-assembly of an ATE spring probe according to claim 4, characterized in that, Based on the number n of the fan-shaped cycles contained in the upper turntable (7-1), the needle tube feeding hole (2-1), needle tail feeding hole (2-2), spring feeding hole (2-3), needle head feeding hole (2-4) are obtained. The central angle between two adjacent stations in the first default station, the second default station, and the third default station is 2π / n / 7. Based on the time required to assemble an ATE spring probe as T, the rotation cycle of the auxiliary wheel is obtained as T / 7. Based on the dwell time t of the upper turntable (7-1), the middle turntable (7-3), and the main gate turntable (7-6) at each station, the central angle corresponding to the contact range between the auxiliary wheel and the upper turntable (7-1), the middle turntable (7-3), or the main gate turntable (7-6) is obtained as 14πt / T.

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